1
®
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 |Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2004, 2005, 2007. All Rights Reserved
All other trademarks mentioned are the property of their respective owners.
ISL6537A
ACPI Regulator/Controller for
Dual Channel DDR Memory Systems
The ISL6537A provides a complete ACPI compliant power
solution for up to 4 DIMM dual channel DDR/DDR2 Memory
systems. Included are both a synchronous buck controller to
supply VDDQ during S0/S1 and S3 states. During S0/S1 state,
a fully integrated sink-source regulator generates an accurate
(VDDQ/2) high current VTT voltage without the need for a
negative supply. A buf fered version of the VDDQ/2 reference is
provided as VREF. A second PWM controller, which requires
external MOSFET drivers, is available for regulation of the
GMCH Core voltage. An LDO controller is also integrated for
the CPU VTT termination voltage regulation and the DAC.
The switching PWM controller drives two N-Channel
MOSFETs in a synchronous-rectified buck converter
topology. The synchronous buck converter uses voltage-
mode control with fast transient response. The switching
regulator prov i d es a ma xi mu m static regula ti on to le ra n c e of
±2% over line, load, and temperatur e ranges. The output is
user-adjustable by means of external resistors down to 0.8V.
An integrated soft-start feature brings all outputs into
regulation in a controlled manner when returning to S0/S1
state from any sleep state. During S0 the VIDPGD signal
indicates that the GMCH and CPU VTT termination voltage
is within spec and operational.
All outputs, except VDAC, have un dervoltage protection.
The switching regulator also has overvoltage and
overcurrent protection. Thermal shutdown is integrated.
Pinout ISL6537A (6X6 QFN)
TOP VIEW
Features
Generates 5 Regulated Voltages
- Synchronous Buck PWM Controller for DDR VDDQ
- 3A Inte grated Sink/Source Linear Regulator with
Accurate VDDQ/2 Divider Reference for DDR VTT
- PWM Regulator for GMCH Core
- LDO Regulator for CPU/GMCH VTT Termination
- LDO Regulator for DAC
ACPI Compliant Sleep State Control
Glitch-Free Transitions During State Changes
Integrated VREF Buffer
•V
DDQ PWM Controller Drives Low Cost N-Channel
MOSFETs
250kHz Constant Frequency Operation
- Both PWM Controllers are Phase Shifted 180°
Tight Output Voltage Regulation
- All Outputs: ±2% Over Temperature
Fully-Adjustable Outputs with Wide Voltage Range: Down
to 0.8V Supports DDR and DDR2 Specifications
Simple Single-Loop Voltage-Mode PWM Control Design
Fast PWM Converter Transient Response
Under and Overvoltage Monitoring
OCP on th e VDDQ Switching Regulator
Integrated Thermal Shutdown Protection
Pb-Free Plus Anneal Available (RoHS Compliant)
Applications
Single and Dual Channel DDR Memory Power Systems in
ACPI Compliant PCs
Graphics Cards - GPU and Memory Supp lies
ASIC Power Supplies
Embedded Processor and I/O Supplies
DSP Supplies
5VSBY
S3#
P12V
GND
DDR_VTT
DDR_VTT
VDDQ
DRIVE3
FB3
PWM4
FB4
COMP4
COMP
FB
LGATE
GND
UGATE
BOOT
PHASE
S5#
OCSET
VDDQ
DDR_VTTSNS
DRIVE2
FB2
VIDPGD
VREF_OUT
VREF_IN
1
2
3
4
5
6
7
21
20
28 27 26 25 24 23 22
89
GND
29
19
18
17
16
15
10 11 12 13 14
Data Sheet July 18, 2007 FN9143.5
2FN9143.5
Ordering Information
PART NUMBER PART MARKING TEMPERATURE
RANGE (°C) PACKAGE PKG.
DWG. #
ISL6537ACR ISL6537ACR 0 to +70 28 Ld 6x6 QFN L28.6x6
ISL6537ACRZ (Note) ISL6537ACRZ 0 to +70 28 Ld 6x6 QFN (Pb-free) L28.6x6
ISL6537ACRZA (Note) ISL6537ACRZ 0 to +70 28 Ld 6x6 QFN (Pb-free) L28.6x6
*Add “-T” suffix to part number for tape and reel packaging.
NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate
termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL
classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
ISL6537A
3FN9143.5
Block Diagram
EA1
PWM
UGATE
VTT(2)
VTTSNS
250kHz
FB COMP
VTT
LGATE
P12V
VREF_IN
VDDQ(2)
VIDPGD
REG
S5#S3#
5VSBY
BOOT
VREF_OUT
EA3
PHASE
20µA
OCSET
OC
COMP
GND(2)
RU
RL
P12V
PWM4
P12V
FB4
COMP4
DRIVE2
FB2
DRIVE3
FB3
EA2
EA4
5VSBY
UV/OV
UV
UV/OV
FAULT
S3
GND PAD
OSCILLATOR
POR
180°
PHASE
SHIFT
UV
VOLTAGE
REFERENCE
0.800V
0.680V (-15%)
0.920V (+15%)
SOFTSTART & ENABLE A
SOFTSTART & ENABLE B
SOFTSTART & ENABLE C
MONITOR AND CONTROL
ENABLE DDR_VTT
EA1 ACTIVE
IN S3
ENABLE VIDPGD
ISL6537A
4FN9143.5
Simplified Power System Diagram
Typical Application
PWM
5VSBY
VTT
ISL6537A
CONTROLLER
REGULATOR
12V
VREF
VTT
+
SLEEP
STATE
LOGIC
SLP_S3
SLP_S5
Q5
+
3V3ATX
VDDQ
Q1
5VDUAL
Q2 +
VTT_GMCH/CPU
LINEAR
CONTROLLER
VGMCH
Q4
Q3
LINEAR
CONTROLLER
Q6
+VDAC
INTERSIL
FET DRIVER
PWM
CONTROLLER
+
3V3ATX
5VSBY
ISL6537A
FB4
GND
VGMCH
5VSBY
P12V
SLP_S5
SLP_S3
S5#
S3#
12V
ATX3V3
DRIVE2
FB2
VTT_GMCH/CPU
VIDPGD
PWM4
COMP4
INTERSIL
FET DRIVER
DRIVE3
FB3
VDAC
UGATE
FB
COMP
LGATE
DDR_VTT(x2) VTT_DDR
VREF_IN
VREF_OUT
DDR_VTTSNS
VDDQ_DDR
+
5VDUAL
OCSET
PHASE
VREF
DDR_VDDQ(x2)
BOOT
Q2
Q1
Q3
Q4
Q5
Q6
ROCSET
R1
R2
C1
C2 R3 C3
R4
R5
C5
R6
C6
R7
C7 R8
R9 R10
R9
R12
R11
3VDUAL
DBOOT
CBOOT
ATX3V3
ISL6537A
5FN9143.5
Absolute Maximum Ratings Thermal Information
5VSBY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .GND - 0.3V to +7V
P12V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .GND - 0.3V to +14V
Absolute Boot Voltage, VBOOT . . . . . . . . . . . . . . . . . . . . . . . +15.0V
Upper Driver Supply Voltage, VBOOT - VPHASE . . . . . . . .7.0V (DC)
8.0V (<10ns Pulse Width, 10μJ)
All other Pins . . . . . . . . . . . . . . . . . . . . GND - 0.3V to 5VCC + 0.3V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Class 2
Recommended Operating Conditions
Supply Voltage on 5VSBY . . . . . . . . . . . . . . . . . . . . . . . . +5V ±10%
Supply Voltage on P12V . . . . . . . . . . . . . . . . . . . . . . . . +12V ±10%
Ambient Temperature Range. . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Junction Temperature Range. . . . . . . . . . . . . . . . . . . 0°C to +125°C
Thermal Resistance (Typical, Notes 1, 2) θJA (°C/W) θJC (°C/W)
QFN Package . . . . . . . . . . . . . . . . . . . 32 5
Maximum Junction Temperature (Plastic Package) . . . . . . +150°C
Maximum Storage Temperature Range. . . . . . . . . -65°C to +150°C
Pb-free reflow profile . . . . . . . . . . . . . . . . . . . . . . . . . .see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTES:
1. θJA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
Tech Brief TB379.
2. For θJC, the “case temp” location is the center of the exposed metal pad on the package underside.
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted. Refer to Block and Simplified Power System
Diagrams and Typical Application Schematics
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
5VSBY SUPPLY CURRENT
Nominal Supply Current ICC_S0 S3# and S5# HIGH, UGATE/LGATE Open 5.5 7.0 8.0 mA
ICC_S5 S5# LOW , S3# Don’t Care, UGATE/LGATE Open - 700 850 μA
POWER-ON RESET
Rising 5VSBY POR Threshold 4.10 - 4.45 V
Falling 5VSBY POR Threshold 3.60 - 3.95 V
Rising P12V POR Threshold 10.0 - 10.5 V
Falling P12V POR Threshold 8.80 - 9.75 V
OSCILLATOR AND SOFT-START
PWM Frequency fOSC 220 250 280 kHz
Ramp Amplitude ΔVOSC -1.5- V
Soft-Start Interval tSS 6.5 8.2 9.5 ms
REFERENCE VOLTAGE
Reference Vo ltage VREF -0.800- V
System Accuracy -2.0 - +2.0 %
VDDQ AND VGMCH PWM CONTROLLER ERROR AMPLIFIERS
DC Gain (Note 3) - 80 - dB
Gain-Bandwidth Product GBWP (Note 3) 15 - - MHz
Slew Rate SR (Note 3) - 6 - V/μs
CONTROL I/O (S3#, S5#)
LOW Level Input Threshold 0.75 - - V
HIGH Level Input Threshold --2.2V
ISL6537A
6FN9143.5
Functional Pin Description
5VSBY (Pin 1)
5VSBY is the bias supply of the ISL6537A. It is typically
connected to the 5V standby rail of an ATX power supply.
During S4/S5 sleep states the ISL6537A enters a reduced
power mode and draws less than 1mA (ICC_S5) from the
5VSBY supply. The supply to 5VSBY should be locally
bypassed using a 0.1μF capacitor.
P12V (Pin 3)
The VTT regulation circuit and the Linear Drivers are
powered by P12V. P12V is not required during S3/S4/S5
operation. P12V is typically connected to the +12V rail of an
ATX power supply.
GND (Pins 4, 27, 29)
The GND terminals of the ISL6537A provide the return path
for the VTT LDO, and switching MOSFET gate drivers. High
PWM CONTROLLER GATE DRIVERS
UGATE and LGATE Source IGATE --0.8- A
UGATE and LGATE Sink IGATE -0.8- A
VTT REGULATOR
Upper Divider Impedance RU-2.5- kΩ
Lower Divider Impedance RL-2.5- kΩ
VREF_OUT Buffer Source Current IVREF_OUT --2mA
Maximum VTT Load Current IVTT_MAX Periodic load applied with 30% duty cycle and
10ms period using ISL6537A_6506EVAL1
evaluation board (see Application Note AN1 124)
-3 - 3 A
LINEAR REGULATORS
DC Gain (Note 3) - 80 - dB
Gain Bandwidth Product GBWP (Note 3) 15 - - MHz
Slew Rate SR (Note 3) - 6 - V/μs
DRIVEn High Output Voltage DRIVEn Unloaded 9.75 10.0 - V
DRIVEn Low Output Voltage -0.160.50 V
DRIVEn High Output Source Current VFB = 770mV, VDRIVEn = 0V - 1.7 - mA
DRIVEn Low Output Sink Current VFB = 830mV, VDRIVEn = 10V - 1.20 - mA
VIDPGD
VTT_GMCH/CPU Rising Threshold S0 .725 .740 - V
VTT_GMCH/CPU Falling Threshold S0 - 0.700 0.715 V
PROTECTION
OCSET Current Source IOCSET 18 20 22 μA
VTT_DDR Current Limit (Note 3) -3.3 - 3.3 A
VDDQ OV Level VFB/VREF S0/S3 - 115 - %
VDDQ UV Level VFB/VREF S0/S3 - 75 - %
VTT_DDR OV Level VTT/VVREF_IN S0 - 115 - %
VTT_DDR UV Level VTT/VVREF_IN S0 - 85 - %
VGMCH UV Level VFB4/VREF S0 - 75 - %
VTT_GMCH/CPU UV Level VFB2/VREF S0 - 75 - %
Thermal Shutdown Limit TSD (Note 3) - 140 - °C
NOTE:
3. Limits should be considered typical and are not production tested
Electrical Specifications Recommended Operating Conditions, Unless Otherwise Noted. Refer to Block and Simplified Power System
Diagrams and Typical Application Schematics (Continued)
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
ISL6537A
7FN9143.5
ground currents are conducted directly through the exposed
paddle of the QFN package which must be electrically
connected to the ground plane through a path as low in
inductance as possible.
UGATE (Pin 26)
Connect this pin to the upper MOSFET’s gate. This pin
provides the PWM-controlled gate drive for the upper
MOSFET. This pin is also monitored by the adaptive shoot-
through protection circuitry to determine when the upper
MOSFET has turned off. Do not insert any circuitry between
this pin and the gate of the upper MOSFET, as it may
interfere with the internal adaptive shoot-th r ough protection
circuitry and render it ineffective.
LGATE (Pin 28)
Connect this pin to the lower MOSFET’s gate. This pin
provides the PWM-controlled gate drive for the lower
MOSFET. This pin is also monitored by the adaptive shoot-
through protection circuitry to determine when the lower
MOSFET has turned off. Do not insert any circuitry between
this pin and the gate of the lower MOSFET, as it may
interfere with the internal adaptive shoot-th r ough protection
circuitry and render it ineffective.
FB (Pin 15) and COMP (Pin 16)
The VDDQ switching regulator employs a single voltage
control loop. FB is the negative input to the voltage loop error
amplifier. The VDDQ output voltage is set by an external
resistor divider connected to FB. With a properly selected
divider, VDDQ can be set to any vo ltage between the power
rail (reduced by converter losses) and the 0.8V reference.
Loop compensation is achieved by connecting an AC
network across COMP and FB.
The FB pin is also monitored for under and overvoltage
events.
PHASE (Pin 24)
Connect this pin to the upper MOSFET’s source. This pin is
used to monitor the voltage drop across the upper MOSFET
for overcurrent protection.
OCSET (Pin 22)
Connect a resistor (ROCSET) from this pin to the drain of the
upper MOSFET. ROCSET, an internal 20μA current source
(IOCSET), and the upper MOSFET on-resistance (rDS(ON))
set the conver ter overcurren t (OC) trip point according to t he
following equation:
An overcurrent trip cycles the soft-start function.
VDDQ (Pins 7, 8)
The VDDQ pins should be connected externally together to
the regulated VDDQ outpu t. During S0/S1 states, the VDDQ
pins serve as inputs to the VTT regulator and to the VTT
Reference precision divider.
DDR_VTT (Pins 5, 6)
The DDR_VTT pins should be connected externally
together. During S0/S1 states, the DDR_VTT pins se rve as
the outputs of the VTT linear regulator. During S3 state, the
VTT regulator is disabled.
DDR_VTTSNS (Pin 9)
VTTSNS is used as the feedback for control of the VTT linear
regulator. Connect th is pin to the VTT output at the physical
point of desired regulation.
VREF_OUT (Pin 13)
VREF_OUT is a buff ered version of VTT and also acts as the
reference vol tage for the VTT linear regulator. It is
recommended that a minimum capacitance of 0.1μF is
connected between VDDQ and VREF_OUT and also
between VREF_OUT and ground for proper operation.
VREF_IN (Pin 14)
A capacitor, CSS, connected between VREF_IN and ground
is required. This capacitor and the parallel combination of
the Upper and Lower Divider Impeda nce (RU||RL), sets the
time constant for the start up ramp when transitioning from
S3/S4/S5 to S0/S1/S2.
The minimum value for CSS can be fo und through the
following equation:
The calculated capacitance, CSS, will charge the output
capacitor bank on the VTT rail in a controlled manner without
reaching the current limit of the VTT LDO.
BOOT (Pin 25)
This pin provides ground referenced bias voltage to the
upper MOSFET driver . A bootstrap circuit is used to create a
voltage suitable to drive a logic-level N-channel MOSFET.
PWM4 (Pin 19)
This pin provides the PWM output for the GMCH core
switching regulator. Connect this pin to the PWM input of an
Intersil MOSFET driver.
FB4 (Pin 19) and COMP4 (Pin 17)
The GMCH core switching regulator employs a single
voltage control loop. FB4 is the negative input to the voltage
loop error amplifier. The GMCH core output voltage is set by
an external resistor divider connected to FB4. With a
properly selected divider , VGMCH can be set to any voltage
between the power rail (reduced by converter losses) and
the 0.8V reference. Loop compensation is achieved by
connecting an AC network across COMP4 and FB4.
The FB4 pin is also monitored for undervoltage events.
IPEAK IOCSETxROCSET
rDS ON()
-------------------------------------------------=(EQ. 1)
CSS CVTTOUT VDDQ
10 2A RURL
||
⋅⋅
------------------------------------------------
>(EQ. 2)
ISL6537A
8FN9143.5
FB2 (Pin 18)
Connect the output of the VTT_GMCH/CPU linear regulator to
this pin through a properly sized resistor divider . The voltage
at this pin is regulated to 0.8V. This pin is monitored for
undervoltage events.
DRIVE2 (Pin 10)
This pin provides the gate voltage for the VTT_GMCH/CPU
linear regulator pass transistor. Connect this pin to the gate
terminal of an external N-Channel MOSFET transistor.
FB3 (Pin 18)
Connect the output of the DAC linear regulator to this pin
through a properly sized resistor divider. The voltage at this
pin is regul a ted to 0.8V.
DRIVE3 (Pin 10)
This pin provides the gate voltage for the DAC linear
regulator pass transistor. Connect this pin to the gate
terminal of an external N-Channel MOSFET transistor.
VIDPGD (Pin 12)
The VIDPGD pin is an open-drain logic output that changes
to a logic lo w if the VTT_GMCH/CPU linear regul ator is out of
regulation in S0/S1/S2 state. VIDPGD will always be low in
any state other than S0/S1/S2.
SLP_S5# (Pin 23)
This pin accepts the SLP_S5# sleep state signal.
SLP_S3# (Pin 2)
This pin accepts the SLP_S3# sleep state signal.
Functional Description
Overview
The ISL6537A provides complete control, drive, protection
and ACPI compliance for regulator powering DDR memory
systems and the GMCH core and GMCH/CPU termination
rails. It is primarily designed for computer applications
powered from an ATX power supply.
A 250kHz Synchronous Buck Regulator with a precision
0.8V reference provides the proper Core voltage to the
system memory of the computer. An internal LDO regulator
with the ability to both sink and source current and an
externally available buffered reference that tracks the VDDQ
output by 50% provides the VTT termination voltage.
A second 250kHz PWM Buck regulator, which requires an
external MOSFET driver, provides the GMCH core voltage.
This PWM regulator is +180° out of phase with the PWM
regulator used for the Memory core. Two additional LDO
controllers are included, one for the regulation of the
GMCH/CPU termination rail and the second for the DAC.
ACPI compliance is realized through the SL P_S3 and
SLP_S5 sleep signals and through monitorin g of the 12 V
ATX bus.
Initialization
The ISL6537A automati cally initializes upon receipt of input
power. Special sequencing of the input supplies is not
necessary. The Power-On Reset (POR) function continually
monitors the input bias supply voltages. The POR monitors
the bias voltage at the 5VSBY and P12V pins. The POR
function initiates soft-start operation after the bias supply
voltages exceed their POR thresholds.
ACPI State Transitio ns
Figure 1 shows how the individual regulators are controlled
during all state transitions. All references to timing in this
section are in reference to Figure 1.
Cold Start (S4/S5 to S0 Transition)
At the onset of a mechanical start, time t0 in Figure 1, the
ISL6537A receives its bias voltage from the 5V Standby bus
(5VSBY). Once the 5VSBY rail has exceeded the POR
threshold, the ISL6537A will remain in an internal S5 state
until both the SLP_S3 and SLP_S5 signal have transitioned
high and the 12V POR threshold has been exceeded by the
+12V rail from the ATX, which occurs at time t1.
Once all of these conditions are met, the PWM error
amplifiers will first be reset by internally shorting the COMP
pins to the respective FB pins. This reset lasts for three soft-
start cycles, which is typically 24ms (one soft-start cycle is
typically 8.2ms). The digital soft-start sequence will then
begin. Each regulator is enabled and soft-started according
to a preset sequence.
At time t2, the 3 soft-start cycle reset has ended and the
VDDQ_DDR rail is digitally soft-started.
The digital soft-start for both PWM regulators is accomplished
by clamping the error amplifier reference input to a level
proportional to the internal digital soft-start voltage. As the sof t-
start voltage slews up, the PWM comparator generates PHASE
pulses of increasing width that charge the output capacitor(s).
This method provides a rapid and controlled output voltage rise.
The linear regulators, with the exception of the internal
VTT_DDR LDO, are soft-started in a similar manner. The
error amplifier reference is clamped to the internal digital
soft-start voltage. As the soft-start voltage ramps up, the
respective DRIVE pin voltages increase, thus enhancing the
N-MOSFETs and charging the output capacitors in a
controlled manner.
At time t3, the VDDQ_DDR rail is in regulation and th e
VGMCH rail is soft-started. At time t4, the VGMCH rail is in
regulation and the VTT_GMCH/CPU and the DAC linear
regulators are soft-started. At time t5, the VTT_GMCH/CPU
rail and DAC rails are in regulation and the VTT_DDR internal
regulator is soft-started.
The VTT_DDR LDO soft-starts in a manner unlike the other
regulators. When the VTT_DDR regulator is disabled, the
reference is internally shorted to the VTT_DDR output. This
ISL6537A
9FN9143.5
FIGURE 1. ISL6537A TIMING DIAGRAM
SLP_S3#
SLP_S5#
12V
VDDQ_DDR
12V
0V
0V
POR
VDAC
t0
VGMCH
0V
VTT_GMCH/CPU
0V
VIDPGD
t1t2t3t4t5t6t7t8t9t11 t12 t13 t14 t15
0V
t10
VTT_DDR
0V
VDDQ_DDR
(3 SOFTSTART CYCLES) (3 SOFTSTART CYCLES)
VTT_DDR FLOATING
VTT_DDR Soft-Start Rise Time Dependent Upon Capacitor On VREF_IN Pin
ISL6537A
10 FN9143.5
allows the termination voltage to float during the S3 sleep
state. When the ISL6537A enables the VTT_DDR regulator
or enters S0 state from a sleep state, this short is released
and the internal divide down resistors which set the
VTT_DDR voltage to 50% of VDDQ_DDR will provide a
controlled voltage rise on the capacitor that is tied to the
VREF_IN pin. The voltage on this capacitor is the reference
for the VTT_DDR regulator and the output will track it as it
settles to 50% of the VDDQ voltage. The combination of the
internal resistors and the VREF_IN cap acitor will determine
the rise time of th e VTT_DDR regulator (see the Functional
Pin Description section for proper sizing of the VREF_IN
capacitor).
At time t6, a full sof t-start cycle has passed from the time that
the VTT_DDR regulator was enabled. At this time the
VIDPGD comparator is enabled. Once enabled if the
VTT_GMCH/CPU output is within regulation, the VIDPGD pin
will be forced to a high impedance state.
Active to Sleep (S0 to S3 Transition)
When SLP_S3 goes LOW with SLP_S5 still HIGH, the
ISL6537A will disable all the regulators except for the VDDQ
regulator, which is continually supplied by the 5VDUAL rail.
VIDPGD will also transition LOW . When VTT is disabled, the
internal reference for the VTT regulator is internally shorted
to the VTT rail. This allows the VTT rail to float. When
floating, the voltage on the VTT rail will depend on the
leakage characteristics of the memory and MCH I/O pins. It
is important to note that the VTT rail may not bleed down to
0V. Figure 1 shows how the individual regulators are
affected by the S3 state at time t7.
Sleep to Active (S3 to S0 Transition)
When SLP_S3 transitions from LOW to HIGH with SLP_S5
held HIGH and after the 12V rail exceeds POR, the
ISL6537A will initiate the soft-start sequence. This sequence
is very similar to the mechanical start soft-start sequencing.
The transition from S3 to S0 is repr esented in Figure 1
between times t8 and t14.
At time t8, the SLP_S3 signal transitions HIGH. This enables
the ATX, which brings up the 12V rail. At time t9, the 12V rail
has exceeded the POR threshold and the ISL6537A enters a
reset mode that lasts for 3 sof t-sta rt cycles. At time t10, t he 3
soft-start cycle reset is ended and the ind ividual regulators
are enabled and soft-started in the same sequence as the
mechanical cold start sequence, with the exception that the
VDDQ regulator is already enabled and in regulation.
Active to Shutdown (S0 to S5 Transition)
When the system transitions from active, S0, state to
shutdown, S4/S5, state, the ISL6537A IC disables all
regulators and forces the VIDPGD pin LOW. This transition
is represented on Figure 1 at time t 15.
Fault Protection
The ISL6537A monitors the VDDQ regulator for under and
overvoltage eve nts. The V DDQ regulator also has overcurre nt
protection. The internal VTT_DDR LDO regulator is monitored
for under and overvoltage event s. All other regulators, with the
exception of the DAC LDO, are monitored for undervolt age
events.
An overvoltage event on either the VDDQ or VTT_DDR
regulator will cause an immediate shutdown of all regulators.
This can only be cleared by toggling the SLP_S5 signal such
that the system enters the S5 sleep state and then
transitions back to the active, S0, state.
If a regulator experiences any other fault condition (an
undervoltage or an overcurrent on VDDQ), then that
regulator, and only that regulator, will be disabled and an
internal fault counter will be incremented by 1. If the disabled
regulator is used as the input for another regulator, then that
cascoded regulator will also experience a fault condition due
to a loss of input. The cascoded regulator will be disabled
and the fault counter incremented by 1.
At every fault occurrence, the internal fault counter is
incremented by 1 and an internal F ault Reset Counter is
cleared to zero. The Fault Reset Counter will increment once
for every clock cycle (1 clock cycle is typically 1/250kHz, or
4μs). If the Fault Reset Counter reaches a count of 16384
before another fault occurs, then the Fault Counter is
cleared to 0. If a fault occurs prior to the Fault Reset Counter
reaching a count of 16384, then the Fault Reset Counter is
set back to zero.
The ISL6537A will immediately shut down whe n the Fault
Counter reaches a count of 4 when the system is restarting
from an S5 state into the active, or S0, state. The ISL6537A
will immediately shut down when the Fault Coun ter reaches
a count of 5 at any other time.
The 16384 counts that are required to reset the Fault Reset
Counter represent 8 soft-st art cycles, as one sof t-st art cycle is
2048 clock cycles. This allows the ISL6537A to attempt at least
one full soft-start sequence to restart the faulted regulators.
When attempting to restart a faulted regulator, the ISL6537A
will follow the preset start up sequencing. If a regulator is
already in regulation, then it will not be affected by the start
up sequencing.
VDDQ Overcurrent Protection
The overcurrent function protects the sw itching converter from
a shorted output by using the upper MOSFET on-resistance,
rDS(ON), to monito r the current. Thi s method enhan ces the
converter’s efficiency and reduces cost by eliminating a
current sensing resistor.
The overcurrent function cycles the sof t-st art fu nction in a
hiccup mode to provide fault protection. A resistor (ROCSET)
programs the overcurrent trip level (see Typical Application
ISL6537A
11 FN9143.5
diagrams on page 4). An internal 20 μA (typical) current sink
develops a voltage across ROCSET that is referenced to the
converter input volt age. When the vo lt age across the upper
MOSFET (also referenced to the converter input volt age)
exceeds the voltage across ROCSET, the overcurrent function
initiates a soft-st art seque nce. The initia ti on of sof t-st art may
affect other regu lators. The V TT_DDR regulator is directly
affected as it receives it s reference and input fro m VDDQ.
The overcurrent function will trip at a peak inductor current
(IPEAK) determined by:
where IOCSET is the internal OCSET current source (20μA
typical). The OC trip point varies mainly due to the MOSFET
rDS(ON) variations. To avoid ov ercurrent tripping i n th e
normal operating load range, find the ROCSET resistor from
the equation above with:
1. The maximum rDS(ON) at the highest junction
temperature.
2. The minimum IOCSET from the specification table.
3. Determine IPEAK for ,
where ΔI is the output inductor ripple current.
For an equation for the ripple current see the section under
component guidelines titled ‘Output Inductor Selection’.
A small ceramic capacitor should be placed in parallel with
R
OCSET
to smooth the voltage across
R
OCSET
in the
presence of switching noise on the input voltage.
Thermal Protection (S0/S3 State)
If the ISL6537A IC junction temp erature reaches a nominal
temperature of +140°C, all regulators will be disabled. The
ISL6537A will not re-enable the outp uts until the junction
temperature drops below +110°C a n d either the bias volt age
is toggled in order to initiate a POR or the SLP_S5 signal is
forced LOW and then back to HIGH.
Shoot-Through Protec tion
A shoot-throu g h co nd i ti o n occurs when both the upper and
lower MOSFETs are turned on simultaneously, effectively
shorting the input voltage to ground. To protect from a shoot-
through condition, the ISL6537A incorporates specialized
circuitry on the VDDQ regulator which insures that
complementary MOSFETs are not ON simultaneously.
The adaptive shoot-through protection utilized by the VDDQ
regulator looks at the lower gate drive pin, LGATE, and the
upper gate drive pin, UGATE, to determine whether a
MOSFET is ON or OFF. If the voltage from UGATE or from
LGATE to GND is less than 0.8V, then the respective
MOSFET is defined as being OFF and the other MOSFET is
allowed to turned ON. This meth od allows the VDDQ
regulator to both source and sink current.
Since the voltage of the MOSFET gates are being measured
to determine the state of the MOSFET, the designer is
encouraged to consider the repercussions of intro ducing
external components between the gate drivers and their
respective MOSFET gates before actually imple m enting
such measures. Doing so may interfere with the shoot-
through protection.
Application Guidelines
Layout Considerations
Layout is very important in high frequency switching
converter design. With power devices switching efficiently at
250kHz, the resulting current transitions from one device to
another cause voltage spikes across the interconne cting
impedances and parasitic circuit elements. These voltage
spikes can degrade efficiency, radiate noise into the circuit,
and lead to device overvoltage stress. Careful component
layout and printed circuit bo ard design minimizes these
voltage spikes.
As an example, consider the turn-off transition of the control
MOSFET. Prior to turn-off, the MOSFET is carrying the full
load current. During turn-off, current stops flowing in the
MOSFET and is picked up by the lowe r MOSFET. Any
parasitic inductance in the switched current path generates a
large voltage spike during the switching interval. Careful
component selection, tight layout of the critical components,
and short, wide traces minimizes the magnitude of voltage
spikes.
There are two sets of critical components in the ISL6537A
switching converter . The switching components are the most
critical because they switch large amounts of energy, and
therefore tend to generate large amounts of noise. Next are
the small signal components which connect to sensitive
nodes or supply critical bypass current and signal coupling.
A multi-layer printed circuit board is recommended. Figure 2
shows the connections of the critical components in the
converter. Note that capacitors CIN and COUT could each
represent numerous physical capacitors. Dedicate one solid
layer, usually a middle layer of the PC board, for a ground
plane and make all critical component ground connections
with vias to this layer. Dedicate another solid layer as a
power plane and break this plane into smaller islands of
common voltage levels. Keep the metal runs from the
PHASE terminals to the output inductor short. The power
plane should support the input power and output power
nodes. Use copper filled polygons on the top and bottom
circuit layers for the phase nodes. Use the remaining printed
circuit layers for small signal wiring. The wiring traces from
the GATE pins to the MOSFET gates should be kept short
and wide enough to easily handle the 1A of drive current.
In order to dissipate heat generated by the internal VTT
LDO, the ground pad, pin 29, should be connected to the
internal ground plane through at least four vias. This allows
IPEAK IOCSET x ROCSET
rDS ON()
-----------------------------------------------------= (EQ. 3)
IPEAK IOUT MAX()
ΔI()
2
----------
+>
ISL6537A
12 FN9143.5
the heat to move away from the IC and also ties the pad to
the ground plane through a low imped ance path.
The switching components should be placed close to the
ISL6537A first. Minimize the length of the connections
between the input capacitors, CIN, and the power switches
by placing them nearby. Position both the ceramic and bulk
input capacitors as close to the upper MOSFET drain as
possible. Position the output inductor and output capacitors
between the upper and low er MOSFETs and the load.
The critical small sign al components include any bypass
capacitors, feedback components, and compensation
components. Place the PWM converter compensation
components close to the FB and COMP pins. The feedback
resistors should be located as close as po ssible to the FB
pin with vias tied straight to the ground pla ne as required.
Feedback Compensation - PWM Buck Converters
Figure 3 highlights the voltage-mode control loop for a
synchronous-rectified buck converter. The output voltage
(VOUT) is regulated to the Reference voltage level. The error
amplifier output (VE/A) is compared with the oscillator (OSC)
triangular wave to provide a pulse-w idth modulated (PWM)
wave with an amplitude of VIN at the PHASE node. The
PWM wave is smoothed by the output filter (LO and CO).
VDDQ
5VSBY
ISLAND ON POWER PLANE LAYER
ISLAND ON CIRCUIT AND/OR POWER PLANE LAYER
L1
COUT1
CIN
5VDUAL
KEY
COMP
ISL6537A
UGATE
R4
R2
CBP
FB
DRIVE3
5VSBY
FIGURE 2. PRINTED CIRCUIT BOARD POWER PLANES
AND ISLANDS
R1
VDAC
FB3
C2
VIA CONNECTION TO GROUND PLANE
COUT5
LOAD
LOAD
Q1
R11
R12
PHASE
R3
C3
C1
Q2
12VATX
CBP
GNDP
P12V
Q3
LGATE
VDDQ(2)
VTT(2)
COUT2
LOAD
VDDQ
VTT
GND PAD
VGMCH
L2
COUT3
CIN
3.3VATX
COMP4
PWM4
R8
R6
FB4
R5
C6
LOAD
Q1
R7
C7
C5
Q2
MOSFET
DRIVER
DRIVE2 VTT_GMCH/CPU
FB2
COUT4
LOAD
R9
R10
Q3
3.3VATX
FIGURE 3. VOL T AGE-MODE BUCK CONVERTER
COMPENSATION DESIGN AND OUTPUT
VOLTAGE SELECTION
VDDQ
REFERENCE
LO
CO
ESR
VIN
ΔVOSC
ERROR
AMP
PWM
DRIVER
(PARASITIC)
ZFB
+
-
REFERENCE
R1
R3
R2C3
C1
C2
COMP
VDDQ
FB
ZFB
ISL6537A
ZIN
COMPARATOR
DRIVER
DETAILED COMPENSATION COMPONENTS
PHASE
VE/A
+
-
+
-ZIN
OSC
R4
VDDQ 0.8 1 R1
R4
-------+
⎝⎠
⎜⎟
⎛⎞
×=
ISL6537A
13 FN9143.5
The modulator transfer function is the small-signal transfe r
function of VOUT/VE/A. This function is dominated by a DC
Gain and the output filter (LO and CO), with a double pole
break frequency at FLC and a zero at FESR. The DC Gain of
the modulator is simply the input voltage (VIN) divided by the
peak-to-peak oscillator voltage ΔVOSC.
Modulator Break Frequency Equations
The compensation network consists of the error amplifier
(internal to the ISL6537A) and the impedance networks ZIN
and ZFB. The goal of the compensation network is to provide
a closed loop transfer function with the highest 0dB crossing
frequency (f0dB) and adequate phase margin. Phase margin
is the difference between the closed loop phase at f0dB and
180 degrees. The equations below relate the compensation
network’s poles, zeros and gain to the components (R1, R2,
R3, C1, C2, and C3) in Figure 3. Use these guidelines for
locating the poles and zeros of the compensation network:
1. Pick Gain (R2/R1) for desired converter bandwidth.
2. Place 1ST Zero Below Filter’s Double Pole (~75% FLC).
3. Place 2ND Zero at Filter’s Double Pole.
4. Place 1ST Pole at the ESR Zero.
5. Place 2ND Pole at Half the Switching Frequency.
6. Check Gain against Error Amplifier’s Open-Loop Gain.
7. Estimate Phase Margin - Repeat if Necessary.
Compensation Break Frequen cy Equations
Figure 4 shows an asymptotic plot of the DC/DC converter’s
gain vs. frequency. The actual Modulator Gain ha s a high gain
peak due to the high Q factor of the output filter and is not
shown in Figure 4. Using the above gu idelines sho uld give a
Compensation Gain simi lar to the curve plotted . The open
loop error amplifier gain bo unds the comp ensation gain.
Check the compensation gain at FP2 with the cap abilities of
the error amplifier. The Closed Loop Gain is constructed on
the graph of Figure 4 by adding the Modulator Gain (i n dB) to
the Compensation Gain (in dB). This is equivalent to
multiplying the modulator transfer function to the
compensation transfer function and plotting the gain.
The compensation gain uses external impedance networks
ZFB and ZIN to provide a stable, high bandwidth (BW) overall
loop. A stable control loop has a gain crossing with
-20dB/decade slope and a phase margin greater than 45
degrees. Include worst case component variations when
determining phase margin.
Output Voltage Selection
The output volt age of all the exte rn al voltage regulators can
be programmed to any level between their individual inp ut
voltage and the in tern al re ference , 0.8V. An external resistor
divider is used to scale the output volt ag e relative to the
reference voltage and feed it ba ck to th e inverting input of the
error amplifier, refer to the Typical Application on page 4.
The output voltage programming resistor will depend on the
value chosen for the feedback resistor and the desired
output voltage of the particular regulator.
If the output voltage desired is 0.8V, simply route the output
voltage back to the respective FB pin through the feedback
resistor and do not populate the output voltage programming
resistor.
The output voltage for the internal VTT_DDR linear regulator
is set internal to the ISL6537A to track the VDDQ voltage by
50%. There is no need for external programming re sistors.
FLC 1
2π x LO x CO
-------------------------------------------= FESR 1
2π x ESR x CO
--------------------------------------------= (EQ. 4)
FZ1 1
2π x R2 x C1
------------------------------------=
FZ2 1
2π x R1R3
+() x C3
-------------------------------------------------------=
FP1 1
2π x R2 x C1 x C2
C1C2
+
----------------------
⎝⎠
⎜⎟
⎛⎞
---------------------------------------------------------=
FP2 1
2π x R3 x C3
------------------------------------=(EQ. 5)
100
80
60
40
20
0
-20
-40
-60
FP1
FZ2
10M1M100K10K1K10010
OPEN LOOP
ERROR AMP GAIN
FZ1 FP2
20LOG
FLC FESR
COMPENSATION
GAIN (dB)
FREQUENCY (Hz)
GAIN
20LOG
(VIN/ΔVOSC)
MODULATOR
GAIN
(R2/R1)
FIGURE 4. ASYMPTOTIC BODE PLOT OF CONVERTER GAIN
CLOSED LOOP
GAIN
R4 R1 0.8V×
VDDQ 0.8V
-----------------------------------=
R8 R5 0.8V×
VGMCH 0.8V
----------------------------------------=
R10 R9 0.8V×
Vxxxxxxxxxxxx 0.8V
-----------------------------------------------------------=
R12 R11 0.8V×
VDAC 0.8V
----------------------------------=
TT_GMCH/CPU
(EQ. 6)
ISL6537A
14 FN9143.5
Component Selection Guidelines
Output Capacitor Selection - PWM Buck Converter
An output capacitor is required to filter the inductor current
and supply the load transient current. The filtering
requirements are a function of the switching frequency and
the ripple current. The load transient requirements are a
function of the slew rate (di/dt) and the magnitude of the
transient load current. These requirements are generally met
with a mix of capacitors and careful layou t.
DDR memory systems are capable of producing transient
load rates above 1A/ns. High frequency capacitors initially
supply the transient and slow the current load rate seen by th e
bulk capaci tors. Th e bulk filter cap acitor val ues are generall y
determined by the ESR (Effective Series Resistance) and
voltage ra ting requirement s ra th er than actual capacitance
requirements.
High frequency decoupling capacitors sho uld be placed as
close to the power pins of the load as physically possible. Be
careful not to add inductance in the circuit board wiring that
could cancel the usefulness of these low inductance
components. Consult with the manufact urer of the load on
specific decoupling requirements.
Use only specialized low-ESR cap acitors intended for
switching-regulator applications fo r the bulk capacitors. The
bulk capa cito r’s ESR will determine the outpu t ripp le voltage
and the initial volt age drop af ter a high slew-rate tra nsient. An
aluminum electrolytic capa citor’s ESR value is related to the
case size with lower ESR available in larger case sizes.
However, the Equivalent Series Inductance (ESL) of these
capacitors increases with case size and can reduce the
usefulness of the cap acitor to high slew-rate transient loadi ng.
Unfortunately, ESL is not a specified pa rameter. Work with
your capacitor supplier and measure the capacitor’s
impedance with frequency to select a suitable component. In
most cases, multiple electrolytic capacitors of smal l case siz e
perform better than a single larg e ca se cap acitor.
Output Capacitor Selection - LDO Regulators
The output capacitors used in LDO regulators are used to
provide dynamic load current. The amount of capacitance
and type of capacitor should be chosen with this criteria in
mind.
Output Inductor Selection
The output inductor is selected to meet the output voltage
ripple requirements and minimize the converter’s response
time to the load transient. The inductor value determines the
converter’s ripple current and the ripple voltage is a function
of the ripple current. The ripple voltage and current are
approximated by the following equations:
Increasing the value of inductance reduces the ripple current
and voltage. However, the large inductance values reduce
the converter’s response time to a load transient.
One of the parameters limiting the converter ’s response to
a load transient is the time required to change the inductor
current. Given a sufficiently fast control loop design, the
ISL6537A will p r o v i de e ithe r 0 % or 100% d u t y cy c l e in
response to a load transient. The response time is the time
required to slew the inductor current from an initial current
value to the transient current level. During this interval the
difference between the inductor current and the transient
current level must be supplied by the output capacitor.
Minimizing the response time can minimize the output
capacitance required.
The response time to a transient is different for the
application of load and the removal of load. The following
equations give the approximate response time interval for
application and removal of a transie nt load:
where: ITRAN is the transient load current ste p, tRISE is the
response time to the application of load, and tFALL is the
response time to the removal of load. The worst case
response time can be either at the application or removal of
load. Be sure to check both of these equations at the
minimum and ma ximum output levels for the worst case
response time.
Input Capacitor Selection - PWM Buck Converter
Use a mix of input bypass capacitors to control the voltage
overshoot across the MOSFETs. Use small ceramic
capacitors for high frequency decoupling and bulk capacitors
to supply the current needed ea ch time the upper MOSFET
turns on. Place the small ceramic cap acitors physically close
to the MOSFETs and between the drain of upper MOSFET
and the source of lower MOSFET.
The important parameters for the bulk input capacitance are
the voltage rating and the RMS current rating. For reliable
operation, select bulk capacitors with voltage and current
ratings above the maximum input voltage and largest RMS
current required by the circuit. Their voltage rating should be
at least 1.25 times greater than the maximum in put voltage,
while a voltage rating of 1.5 times is a conservative
guideline. For most cases, the RMS current rating
requirement for the input capacitor of a buck regulat or is
approximately 1/2 the DC load current.
The maximum RMS current required by the regulator may be
closely approximated through the following equatio n:
ΔI=VIN - VOUT
Fs x L
VOUT
VIN
ΔVOUT =ΔI x ESR
x(EQ. 7)
tRISE = L x ITRAN
VIN - VOUT
tFALL = L x ITRAN
VOUT
(EQ. 8)
IRMSMAX
VOUT
VIN
--------------IOUTMAX21
12
------ VIN VOUT
Lf
s
×
----------------------------- VOUT
VIN
--------------
×
⎝⎠
⎛⎞
2
×+
⎝⎠
⎛⎞
×=
(EQ. 9)
ISL6537A
15 FN9143.5
For a through hole design, several electrolytic capacitors
may be needed. For surface mount designs, solid tantalum
capacitors can be used, but caution must be exercised with
regard to the capacitor surge current rating. These
capacitors must be capable of handling the surge-current at
power-up. Some capacitor series available from reputable
manufacturers are surge current tested.
MOSFET Selection - PWM Buck Converter
The ISL6537A requires 2 N-Chan nel power MOSFETs for
switching power and a third MOSFET to block backfeed from
VDDQ to the Input in S3 Mode. These should be selected
based upon rDS(ON), gate supply requirements, and thermal
management requirements.
In high-current applications, the MOSFET power dissipation,
package selection and heatsink are the dominant design
factors. The power dissipation includes two loss
components; conduction loss and switching loss. The
conduction losses are the largest componen t of power
dissipation for both the upper and the lower MOSFETs.
These losses are distributed betwee n the two MOSFETs
according to duty factor. The switching losses seen when
sourcing current will be different from the switching losses
seen when sinking current. When sourcing current, the
upper MOSFET realizes most of the switching losses. The
lower switch realizes most of the switching losses when the
converter is sinking current (see the equations below).
These equations assume linear voltage-current transitions
and do not adequately model power loss due the reverse-
recovery of the upper and lower MOSFET’s body diode. The
gate-charge losses are dissipated in part by the ISL6537A
and do not significantly heat the MOSFETs. However, large
gate-charge increases the switching interval, tSW which
increases the MOSFET switching losses. Ensure that both
MOSFETs are within their maximum junction temperature at
high ambient temperature by calculating the temperature
rise according to package thermal-resistance specifications.
A separate heatsink may be necessary depending upon
MOSFET power , package type, ambient temperature and air
flow.
MOSFET Selection - LDO
The main criteria for selection of the linear regulator pass
transistor is package selection for efficient removal of heat.
Select a package and heatsink that maintains the junction
temperature below the rating with a maximum expected
ambient temperature.
The power dissipated in the linear regulato r is:
where IO is the maximum output current and VOUT is the
nominal output voltage of the linear regulator.
PLOWER = Io2 x rDS(ON) x (1 - D)
Where: D is the duty cycle = VOUT/VIN,
tSW is the combined switch ON and OFF time, and
fs is the switching frequency.
Approximate Losses while Sourcing current
Approximate Losses while Sinking current
PLOWER Io2rDS ON()
×1D()×1
2
---IoVIN
×tSW fs
××+=
PUPPER Io2rDS ON()
×D×1
2
---IoVIN
×tSW fs
××+=
PUPPER = Io2 x rDS(ON) x D (EQ. 10)
PLINEAR IOVIN VOUT
()× (EQ. 11)
ISL6537A
16
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No lice nse is gran t ed by i mpli catio n or other wise u nder an y p a tent or patent rights of Intersil or its subsidiari es.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN9143.5
ISL6537A
Quad Flat No-Lead Plastic Package (QFN)
Micro Lead Frame Plastic Package (MLFP)
L28.6x6
28 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE
(COMPLIANT TO JEDEC MO-220VJJC ISSUE C)
SYMBOL
MILLIMETERS
NOTESMIN NOMINAL MAX
A 0.80 0.90 1.00 -
A1 - - 0.05 -
A2 - - 1.00 9
A3 0.20 REF 9
b 0.23 0.28 0.35 5, 8
D 6.00 BSC -
D1 5.75 BSC 9
D2 3.95 4.10 4.25 7, 8
E 6.00 BSC -
E1 5.75 BSC 9
E2 3.95 4.10 4.25 7, 8
e 0.65 BSC -
k0.25 - - -
L 0.35 0.60 0.75 8
L1 - - 0.15 10
N282
Nd 7 3
Ne 7 3
P- -0.609
θ--129
Rev. 1 10/02
NOTES:
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.
2. N is the number of terminals.
3. Nd and Ne refer to the number of terminals on each D and E.
4. All dimensions are in millimeters. Angles are in degrees.
5. Dimension b applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
6. The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
7. Dimensions D2 and E2 are for the exposed pads which provide
improved electrical and thermal performance.
8. Nominal dimensions are provided to assist with PCB Land Pattern
Design efforts, see Intersil Technical Brief TB389.
9. Features and dimensions A2, A3, D1, E1, P & θ are present when
Anvil singulation method is used and not present for saw
singulation.
10. Depending on the method of lead termination at the edge of the
package, a maximum 0.15mm pull back (L1) maybe present. L
minus L1 to be equal to or greater than 0.3mm.