CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
1March 1998
ocument Title
128K x16 bit Super Low Power and Low Voltage Full CMOS Static RAM
Revision History
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
Revision No.
0.0
0.1
1.0
Remark
Advance
Preliminary
Final
History
Design target
Initial draft
- Add KM616FV2000 Family
- Erase KM616FU1000 Family and KM616FS1000 Family supprot
2.3~3.3V operating Vcc.
- Concept change high power version to low low power version
ISB1=10µA(Max)
- Add super low power version with special handling
ISB1=2.0µA(Max)
- Reduce Icc & Icc1
Write : 25mA to 20mA at Vcc=3.6V(Max)
Finalize
- Change datasheet format
- Erase reverse type package
Draft Date
October 2, 1996
December 1, 1996
March 4, 1998
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
2March 1998
128Kx16 bit Super Low Power and Low Voltage Full CMOS Static RAM
GENERAL DESCRIPTION
The KM616FV2000, KM616FS2000 and KM616FR2000
families are fabricated by SAMSUNGs advanced Full
CMOS process technology. The families support various
operating temperature ranges for user flexibility of system
design. The families also support low data retention voltage
for battery back-up operation with low data retention current.
FEATURES
Process Technology : Full CMOS
Organization : 128Kx16
Power Supply Voltage
KM616FV2000 Family : 3.0V ~ 3.6V
KM616FS2000 Family : 2.3V ~ 3.3V
KM616FR2000 Family : 1.8V ~ 2.7V
Low Data Retention Voltage : 1.5V(Min)
Three state output status and TTL Compatible
Package Type : 44-TSOP2-400F
PIN DESCRIPTION
Name Function Name Function
CS Chip Select Input LB Lower Byte(I/O1~8)
OE Output Enable Input UB Upper Byte(I/O9~16)
WE Write Enable Input Vcc Power
A0~A16 Address Inputs Vss Ground
I/O1~I/O16 Data Inputs/Outputs N.C. No Connection
PRODUCT FAMILY
1. The parameter is measured with 30pF test load.
2. Super low power product=2µA with special handling.
Product Family Operating Temperature Vcc Range Speed(ns) Power Dissipation PKG Type
Standby
(ISB1, Max) Operating
(ICC2, Max)
KM616FV2000
Commercial(0~70°C)
3.0~3.6V 701)/85@VCC=3.3±0.3V
10µA2)
80mA
44-TSOP2-
Forward
KM616FS2000 2.3~3.3V 85@VCC=3.0±0.3V 80mA
1201)/150@VCC=2.5±0.2V 50mA
KM616FR2000 1.8~2.7V 3001)@VCC=2.0±0.2V 20mA
KM616FV2000I
Industrial(-40~85°C)
3.0~3.6V 701)/85@VCC=3.3±0.3V 80mA
KM616FS2000I 2.3~3.3V 85@VCC=3.0±0.3V 80mA
1201)/150@VCC=2.5±0.2V 50mA
KM616FR2000I 1.8~2.7V 3001)@VCC=2.0±0.2V 20mA
FUNCTIONAL BLOCK DIAGRAM
A4
A3
A2
A1
A0
CS
I/OI
I/O2
I/O3
I/O4
Vcc
Vss
I/O5
I/O6
I/O7
I/O8
WE
A16
A15
A14
A13
A12
A5
A6
A7
OE
UB
LB
I/O16
I/O15
I/O14
I/O13
Vss
Vcc
I/O12
I/O11
I/O10
I/O9
N.C
A8
A9
A10
A11
N.C
44-TSOP2
Forward
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
Precharge circuit.
Memory array
1024 rows
128×16 columns
I/O Circuit
Column select
Clk gen.
Row
select
A9 A8 A5 A6 A7 A11 A10
A4
A3
A2
A1
A0
A16
A14
A15
I/O1~I/O8
A12
Data
cont
Data
cont
Data
cont
I/O9~I/O16
Vcc
Vss
A13
WE
OE
UB
CS
LB
Control
logic
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
3March 1998
PRODUCT LIST
Commercial Temperature Products(0~70°C) Industrial Temperature Products(-40~85°C)
Part Name Function Part Name Function
KM616FV2000T-7
KM616FV2000T-8
KM616FS2000T-12
KM616FS2000T-15
KM616FR2000T-30
44-TSOP2 F, 70ns, 3.3V, LL
44-TSOP2 F, 85ns, 3.3V, LL
44-TSOP2 F, 120/85ns, 2.5/3.0V, LL
44-TSOP2 F, 150/85ns, 2.5/3.0V, LL
44-TSOP2 F, 300ns, 2.0/2.5V, LL
KM616FV2000TI-7
KM616FV2000TI-8
KM616FS2000TI-12
KM616FS2000TI-15
KM616FR2000TI-30
44-TSOP2 F, 70ns, 3.3V, LL
44-TSOP2 F, 85ns, 3.3V, LL
44-TSOP2 F, 120/85ns, 2.5/3.0V, LL
44-TSOP2 F, 150/85ns, 2.5/3.0V, LL
44-TSOP2 F, 300ns, 2.0/2.5V, LL
ABSOLUTE MAXIMUM RATINGS1)
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VIN/VOUT=-0.2 to 3.9V for KM616FV2000 Family.
3. VCC=-0.2 to 4.6V for KM616FV2000 Family
Item Symbol Ratings Unit Remark
Voltage on any pin relative to Vss VIN,VOUT -0.2 to 3.6V2) V-
Voltage on Vcc supply relative to Vss VCC -0.2 to 4.0V3) V-
Power Dissipation PD1.0 W-
Storage temperature TSTG -55 to 150 °C-
Operating Temperature TA0 to 70 °CKM616FV2000, KM616FS2000, KM616FR2000
-40 to 85 °CKM616FV2000I, KM616FS2000I, KM616FR2000I
Soldering temperature and time TSOLDER 260°C, 5sec (Lead Only) - -
FUNCTIONAL DESCRIPTION
1. X means dont care. (Must be in low or high state)
CS OE WE LB UB I/O1~8 I/O9~16 Mode Power
HX1) X1) X1) X1) High-Z High-Z Deselected Standby
LH H X1) X1) High-Z High-Z Output Disabled Active
LX1) X1) H H High-Z High-Z Output Disabled Active
L L HLHDout High-Z Lower Byte Read Active
L L H H LHigh-Z Dout Upper Byte Read Active
L L HL L Dout Dout Word Read Active
LX1) L L HDin High-Z Lower Byte Write Active
LX1) LHLHigh-Z Din Upper Byte Write Active
LX1) LLL Din Din Word Write Active
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
4March 1998
RECOMMENDED DC OPERATING CONDITIONS1)
Note
1 Commercial Product : TA=0 to 70°C, unless otherwise specified
Industrial Product : TA=-40 to 85°C, unless otherwise specified
2. Overshoot : Vcc + 1.0V in case of pulse width 20ns
3. Undershoot : -1.0V in case of pulse width 20ns
4. Overshoot and undershoot are sampled, not 100% tested.
Item Symbol Product Min Typ Max Unit
Supply voltage Vcc KM616FV2000 Family 3.0 3.3 3.6 V
KM616FS2000 Family 2.3 2.5/3.0 3.3
KM616FR2000 Family 1.8 2.0/2.5 2.7
Ground Vss All Family 0 0 0 V
Input high voltage VIH
KM616FV2000 Family Vcc=3.3±0.3V 2.2
-Vcc+0.22) V
KM616FS2000 Family Vcc=3.0±0.3V 2.2
Vcc=2.5±0.2V 2.0
KM616FR2000 Family Vcc=2.5±0.2V 2.0
Vcc=2.0±0.2V 1.6
Input low voltage VIL All Family -0.23) -0.4 V
CAPACITANCE1) (f=1MHz, TA=25°C)
1. Capacitance is sampled, not 100% tested
Item Symbol Test Condition Min Max Unit
Input capacitance CIN VIN=0V -8pF
Input/Output capacitance CIO VIO=0V -10 pF
DC AND OPERATING CHARACTERISTICS
1. Super low power product=2µA with special handling.
Item Symbol Test Conditions Min Typ Max Unit
Input leakage current ILI VIN=Vss to Vcc -1 -1µA
Output leakage current ILO CS=VIH or OE=VIH or WE=VIL, VIO=Vss to Vcc -1 -1µA
Operating power supply current ICC IIO=0mA, CS=VIL, VIN=VIL or VIH, Read - - 3mA
Average operating current
ICC1 Cycle time=1µs, 100% duty, IIO=0mA,
CS0.2V, VIN0.2V or VINVCC-0.2V Read - - 7mA
Write - - 20
ICC2 Cycle time=Min, 100% duty,
IIO=0mA, CS=VIL, VIN=VIL or VIH
Vcc=3.3V@70ns - - 70 mA
Vcc=2.7V@120ns - - 60
Vcc=2.2V@300ns - - 20
Output low voltage VOL IOL
2.1mA at Vcc=3.0/3.3V - - 0.4 V
0.5mA at Vcc=2.5V - - 0.4
0.33mA at Vcc=2.0V - - 0.4
Output high voltage VOH IOH
-1.0mA at Vcc=3.0/3.3V 2.4 - - V
-0.5mA at Vcc=2.5V 2.0 - -
-0.44mA at Vcc=2.0V 1.6 - -
Standby Current(TTL) ISB CS=VIH, Other inputs=VIL or VIH - - 0.3 mA
Standby Current(CMOS) ISB1 CSVcc-0.2V, Other inputs=0~Vcc - - 101) µA
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
5March 1998
AC OPERATING CONDITIONS
TEST CONDITIONS (Test Load and Test Input/Output Reference)
Input pulse level : 0.4 to 2.2V for Vcc=3.3V, 3.0V, 2.5V
0.4 to 1.8V for Vcc=2.0V
Input rising and falling time : 5ns
Input and output reference voltage : 1.5V for Vcc=3.3V, 3.0V
1.1V for Vcc=2.5V
0.9V for Vcc=2.0V
Output load (See right) : CL=100pF+1TTL
CL=30pF+1TTL
CL1)
1. Including scope and jig capacitance
R23)
R12)
VTM3)
2. R1=3070, R2=3150
3. VTM =2.8V for VCC=3.0/3.3V
=2.3V for VCC=2.5V
=1.8V for VCC=2.0V
AC CHARACTERISTICS (Commercial product :TA=0 to 70°C, Industrial product : TA=-40 to 85°C
KM616FV2000 Family : Vcc=3.0~3.6V, KM616FS2000 Family : Vcc=2.3~3.3V,
KM616FR2000 Family : Vcc=1.8~2.7V)
Parameter List Symbol
Speed Bins
Units
70ns 85ns 120ns 150ns 300ns
Min Max Min Max Min Max Min Max Min Max
Read
Read cycle time tRC 70 -85 -120 -150 -300 -ns
Address access time tAA -70 -85 -120 -150 -300 ns
Chip select to output tCO -70 -85 -120 -150 -300 ns
Output enable to valid output tOE -35 -45 -60 -75 -150 ns
UB, LB Access Time tBA -35 -45 -60 -75 -150 ns
Chip select to low-Z output tLZ 10 -10 -20 -20 -50 -ns
Output enable to low-Z output tOLZ, tBLZ 5-5-20 -20 -30 -ns
Chip disable to high-Z output tHZ 0 25 0 25 0 35 0 40 0 60 ns
Output disable to high-Z output tOHZ, tBHZ 0 25 0 25 0 35 0 40 0 60 ns
Output hold from address change tOH 10 -15 -15 -15 -30 -ns
Write
Write cycle time tWC 70 -85 -120 -150 -300 -ns
Chip select to end of write tCW 60 -70 -100 -120 -300 -ns
Address set-up time tAS 0-0-0-0-0-ns
Address valid to end of write tAW 65 -70 -100 -120 -300 -ns
Write pulse width tWP 55 -60 -80 -100 -200 -ns
UB, LB Valid to End of Write tBW 65 -70 -100 -120 -300 -ns
Write recovery time tWR 0-0-0-0-0-ns
Write to output high-Z tWHZ 0 25 0 25 0 35 0 40 0 60 ns
Data to write time overlap tDW 30 -35 -50 -60 -120 -ns
Data hold from write time tDH 0-0-0-0-0-ns
End write to output low-Z tOW 5-5-5-5-20 -ns
DATA RETENTION CHARACTERISTICS
1. Super low power product=2µA with special handling.
Item Symbol Test Condition Min Typ Max Unit
Vcc for data retention VDR CSVcc-0.2V 1.5 -3.6 V
Data retention current IDR Vcc=3.0V, CSVcc-0.2V - - 101) µA
Data retention set-up time tSDR See data retention waveform 0- - ns
Recovery time tRDR tRC - -
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
6March 1998
Address
Data Out Previous Data Valid Data Valid
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH, UB or/and LB=VIL)
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
Data Valid
High-Z
tRC
CS
Address
UB, LB
OE
Data out
tAA
tRC
tOH
tOH
tAA
tCO
tBA
tOE
tOLZ
tBLZ
tLZ tOHZ
tBHZ
tHZ
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device
interconnection.
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
7March 1998
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)
Address
CS
Data Undefined
UB, LB
WE
Data in
Data out
TIMING WAVEFORM OF WRITE CYCLE(2) (CS Controlled)
Address
CS
Data Valid
UB, LB
WE
Data in
Data out High-Z High-Z
tWC
tCW(2) tWR(4)
tAWtBW
tWP(1)
tAS(3) tDH
tDW
tWHZ tOW
tWC
tCW(2)
tAW tBW
tWP(1)
tDH
tDW
tWR(4)
High-Z High-Z
Data Valid
tAS(3)
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
8March 1998
Address
CS
Data Valid
UB, LB
WE
Data in
Data out High-Z High-Z
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)
NOTES (WRITE CYCLE)
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.
2. tCW is measured from the CS going low to end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end or write to the address change. tWR applied in case a write ends as CS or WE going high.
tWC
tCW(2)
tBW
tWP(1)
tDH
tDW
tWR(4)
tAW
DATA RETENTION WAVE FORM
CS controlled
VCC
3.0/2.7/2.3/1.8V
2.2V
VDR
CS
GND
Data Retention Mode
CSVCC - 0.2V
tSDR tRDR
tAS(3)
CMOS SRAMKM616FV2000, KM616FS2000, KM616FR2000 Family
Revision 1.0
9March 1998
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400F)
Unit : millimeter(inch)
0.002
#1
0.05
#22
#44 #23
0.35±0.10
0.014±0.004 0.80
0.0315
MIN.
0.047
1.20MAX.
0.741
18.81MAX.
18.41±.10
0.725±0.004
11.76±0.20
0.463±0.008
+ 0.10
- 0.05
0.50
+ 0.004
- 0.002
0.15
0.006
0.020
10.16
0.400
0.10
0.004
PACKAGE DIMENSIONS
0~8°
0.45 ~0.75
0.018 ~ 0.030
0.25
( )
0.010
( )
0.805
0.032
( )
MAX
1.00±0.10
0.039±0.004