REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 1 of 16
R1LV3216R Series
32Mb Advanced LPSRAM (2M word x 16bit / 4M word x 8bit)
REJ03C0367-0100
Rev.1.00
2009.05.07
Description
The R1LV3216R Series is a family of low voltage 32-Mbit static RAMs organized as 2,097,152-word by
16-bit, fabricated by Renesas’s high -performance 0.15um CMOS an d TFT technologies.
The R1LV3216R Series is suitable for memory applications where a simple interfacing, battery operating
and battery backup are the important design obje ctives.
The R1LV3216R Series is provided in 48-pi n thin small outline package [TSOP (I): 12mm x 20mm with pin
pitch of 0.5mm] and 52-pin micro thin small outline packag e [µTSOP (II): 10.79mm x 10.49mm with pin pitch
of 0.4mm]. It gives the best solution for compaction of mounting area as well as flexibility of wiring pattern of
printed circuit boards.
Features
Single 2.7~ 3.6V power sup ply
Small stand-by current: 4 µA (3.0V, typical)
No clocks, No refresh
All inputs and outputs are TTL compatible.
Easy memory expansion by CS1#, CS2, LB# and UB#
Common Data I/O
Three-state outputs: OR-tie Capability
OE# prevents data contention on the I/O bus
Ordering Information
Type No. Access time Package
R1LV3216RSA-5S% 55 ns
R1LV3216RSA-7S% 70 ns
12mm x 20mm 48-pin plastic TSOP (I)
(normal-bend type) (48P 3R)
R1LV3216RSD-5S% 55 ns
R1LV3216RSD-7S% 70 ns 350 mil 52-pin plastic μ-TSOP (II)
(normal-bend type) (52PTG)
% - Temperature version; see table below
% Temperature Range
R 0 ~ +70 °C
I -40 ~ +85 °C
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 2 of 16
Pin Arrangement
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
A15
A14
A13
A12
A11
A10
A9
A8
A19
CS1#
WE#
NC
NC
Vcc
CS2
NC
A20
A18
A17
A7
A6
A5
A4
A3
A2
A1
A
16
BYTE#
UB#
Vss
LB#
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
NC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
Vss
NC
A0
52-pin
μ
TSOP (II)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A15
A14
A13
A12
A11
A10
A9
A8
A19
A20
WE#
CS2
NC
UB#
LB#
A18
A17
A7
A6
A5
A4
A3
A2
A1
A
16
BYTE#
Vss
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
Vcc
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
Vss
CS1#
A0
48-pin TSOP (I)
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 3 of 16
Pin Description
Pin name Function
Vcc Power supply
Vss Ground
A0 to A20 Address input (word mode)
A-1 to A20 Address input (byte mode)
DQ0 to DQ15 Data input/output
CS1# Chip select 1
CS2 Chip select 2
WE# Write enable
OE# Output enable
LB# Lower byte enable
UB# Upper byte enable
BYTE# Byte control mode enable
NC Non connection
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 4 of 16
Block Diagram
A
0
CS1#
A
1
CS2
LB#
UB#
WE#
OE#
A20
BYTE#
DQ0
DQ1
DQ7
DQ8
DQ9
DQ15
/ A -1
Vcc
Vss
COLUMN DECODER
X
8 / x16
CONTROL
DQ
BUFFER
ADDRESS
BUFFER
ROW
DECODER
MEMORY ARRAY
2M-word x16-bit
or
4M-word x 8-bit
DQ
BUFFER
DAT
A
SELECTOR
SENSE / WRITE AMPLIFIER
CLOCK
GENERATOR
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 5 of 16
Operation Table
CS1# CS2 BYTE# LB# UB# WE# OE# DQ0~7 DQ8~14 DQ15 Operation
H X X X X X X High-Z High-Z High-Z Stand-by
X L X X X X X High-Z High-Z High-Z Stand-by
X X H H H X X High-Z High-Z High-Z Stand-by
L H H L H L X Din High-Z High-Z Write in lower byte
L H H L H H L Dout High-Z High-Z Read in lower byte
L H H L H H H High-Z High-Z High-Z Output disable
L H H H L L X High-Z Din Din Write in upper byte
L H H H L H L High-Z Dout Dout Read in upper byte
L H H H L H H High-Z High-Z High-Z Output disable
L H H L L L X Din Din Din Word write
L H H L L H L Dout Dout Dout Word read
L H H L L H H High-Z High-Z High-Z Output disable
L H L L L L X Din High-Z A-1 Byte write
L H L L L H L Dout High-Z A-1 Byte read
L H L L L H H High-Z High-Z A-1 Output disable
Note 1. H: VIH L:V
IL X: V
IH or VIL
2. When apply BYTE# =“L”, please ass ign L B #=UB#=“L”.
Absolute Maximum Ratings
Parameter Symbol Value unit
Power supply voltage relativ e to Vss Vcc -0.5 to +4.6 V
Terminal voltage on any pin relative to Vss VT -0.5*1 to Vcc+0.3*2 V
Power dissipation PT 0.7 W
R ver. 0 to +70 °C
Operation temperature Topr*3 I ver. -40 to +85 °C
Storage temperature range Tstg -65 to 150 °C
R ver. 0 to +70 °C
Storage temperature range under bias Tbias*3 I ver. -40 to +85 °C
Note 1. –2.0V in case of AC (Pulse width 30ns)
2. Maximum voltage is +4.6V.
3. Ambient temperature range depends on R/I-version. Please see table on page 1.
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 6 of 16
Recommended Operating Conditions
Parameter Symbol Min. Typ. Max. Unit Note
Vcc 2.7 3.0 3.6 V Supply voltage Vss 0 0 0 V
Input high voltage VIH 2.4 -
Vcc+0.2 V
Input low voltage VIL -0.2 - 0.4 V 1
R ver. 0 - +70 °C 2
Ambient temperature range I ver. Ta -40 - +85 °C 2
Note 1. –2.0V in case of AC (Pulse width 30ns)
2. Ambient temperature range depends on R/I-version. Please see table on page 1.
DC Characteristics
Parameter Symbol Min. Typ. Max. Unit Test conditions
Input leakage current | ILI | - - 1 μA Vin = Vss to Vcc
Output leakage current
| ILO | - - 1 μA
BYTE# Vcc -0.2V or BYTE# 0.2V
CS1# =VIH or CS2 =VIL or
OE# =VIH or WE# =VIL or
LB# = UB# =VIH, VI/O =Vss to Vcc
ICC1 - 40*1 55 mA
Min. cycle, duty =100%, II/O = 0mA
BYTE# Vcc -0.2V or BYTE# 0.2V
CS1# =VIL, CS2 =VIH, Others = VIH/VIL
Average operating curre nt
ICC2 - 3*1 8 mA
Cycle =1μs, dut y =100%, II/O = 0mA
BYTE# Vcc -0.2V or BYTE# 0.2V
CS1# 0.2V, CS2 VCC-0.2V,
VIH VCC-0.2V, VIL 0.2V
Standby current ISB - 0.1*1 0.3 mA
BYTE# Vcc -0.2V or BYTE# 0.2V
CS2 =VIL
- 4*1 12 μA ~+25°C
- 7*2 24 μA ~+40°C
- - 50 μA ~+70°C
Standby current
ISB1
- - 80 μA ~+85°C
Vin 0V
BYTE# Vcc -0.2V or
BYTE# 0.2V
(1) 0V CS2 0.2V or
(2) CS1# VCC-0.2V,
CS2 VCC-0.2V or
(3) LB# = UB# VCC-0.2V,
CS1# 0.2V,
CS2 VCC-0.2V
Output high voltage VOH 2.4 - - V
BYTE# Vcc -0.2V or BYTE# 0.2V
IOH = -0.5mA
Output low voltage VOL - - 0.4 V
BYTE# Vcc -0.2V or BYTE# 0.2V
IOL = 2mA
Note 1. Typical parameter indicates the value for the center of distribution at 3.0V (Ta= 25ºC), and not 100% tested.
2. Typical parameter indic ates the value for the center of distribution at 3.0V (Ta= 40ºC), and not 100% tested.
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 7 of 16
Capacitance
(Ta =25°C, f =1MHz)
Parameter Symbol Min. Typ. Max. Unit Test conditions Note
Input capacitance C in - - 10 pF Vin =0V 1
Input / output capacitance C I/O - - 10 pF V
I/O =0V 1
Note1.This parameter is sampled and not 1 00% tested.
AC Characteristics
Test Conditions (Vcc = 2.7 V ~ 3.6V, Ta = 0 ~ +70°C / -40 ~ +85 °C*1)
Input pulse levels: VIL = 0.4V, VIH = 2.4V
Input rise and fall time: 5ns
Input and output timing reference level: 1.4V
Output load: See figures (Including scope and jig)
Note1. Ambient temperature range dep ends on R/I-version. Please see table on page 1.
DQ
1.4V
RL = 500 ohm
CL = 30 pF
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 8 of 16
Read Cycle
R1LV3216R**-5S R1LV3216R**-7S
Parameter Symbol
Min. Max. Min. Max. Unit Note
Read cycle time tRC 55 - 70 - ns
Address access time tAA - 55 - 70 ns
tACS1 - 55 - 70 ns
Chip select access time tACS2 - 55 - 70 ns
Output enable to output valid tOE - 25 - 35 ns
Output hold from address change tOH 10 - 10 - ns
LB#, UB# access time tBA - 55 - 70 ns
tCLZ1 10 - 10 - ns 2,3
Chip select to output in low-Z tCLZ2 10 - 10 - ns 2,3
LB#, UB# enable to low-Z tBLZ 5 - 5 - ns 2,3
Output enable to output in lo w-Z tOLZ 5 - 5 - ns 2,3
tCHZ1 0 20 0 25 ns 1,2,3
Chip deselect to output in high-Z tCHZ2 0 20 0 25 ns 1,2,3
LB#, UB# disable to high-Z tBHZ 0 20 0 25 ns 1,2,3
Output disable to output in high-Z tOHZ 0 20 0 25 ns 1,2,3
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 9 of 16
Write Cycle
R1LV3216R**-5S R1LV3216R**-7S
Parameter Symbol
Min. Max. Min. Max. Unit Note
Write cycle time tWC 55 - 70 - ns
Address valid to end of write tAW 50 - 65 - ns
Chip select to end of write tCW 50 - 65 - ns 5
Write pulse width tWP 40 - 55 - ns 4
LB#, UB# valid to end of write tBW 50 - 65 - ns
Address setup time tAS 0 - 0 - ns 6
Write recovery time tWR 0 - 0 - ns 7
Data to write time overlap tDW 25 - 35 - ns
Data hold from write time tDH 0 - 0 - ns
Output enable from end of write tOW 5 - 5 - ns 2
Output disable to output in high-Z tOHZ 0 20 0 25 ns 1,2
Write to output in high-Z tWHZ 0 20 0 25 ns 1,2
Note1. tCHZ, tOHZ, tWHZ and tBHZ are defined as the time at which the outputs achieve the open circuit con ditions
and are not referred to output voltage leve ls.
2. This parameter is sampled and not 100% tested.
3. At any given temperature and voltage condition, tHZ max is less than tLZ min both for a given device and
from device to device.
4. A write occurs during the overlap of a low CS1#, a high CS2, a low WE# and a low LB# or a low UB#.
A write begins at the latest transition among CS1# going lo w, CS2 going high, WE# going low and LB#
going low or UB# going low .
A write ends at the earliest transition amon g CS1# going high, CS2 going low, WE# going high and LB#
going high or UB# goi ng high. tWP is measure d from the beginning of write to the end of write.
5. tCW is measured from the later of CS1# going lo w or CS2 going high to end of write.
6. tAS is measured the address valid to the beginning of write.
7. tWR is measured from the earliest of CS1# or W E# going high or CS2 going low to the end of write cycle.
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 10 of 16
BYTE# Timing Conditions
R1LV3216R**-5S R1LV3216R**-7S
Parameter Symbol
Min. Max. Min. Max. Unit Note
Byte setup time tBS 5 - 5 - ms
Byte recovery time tBR 5 - 5 - ms
BYTE# Timing Waveforms
CS2
CS1#
BYTE#
tBS tBR
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 11 of 16
Timing Waveforms
Read Cycle*1
Note1. BYTE# Vcc – 0.2V or BYTE# 0.2V
tAA
tBLZ
CS2
CS1#
OE#
A0~20
A -1~20
LB#,UB#
WE#
DQ0~15
DQ0~7
VIH
VIL
tOH
tBA
tBHZ
tCLZ1
tACS1
tCLZ2
tACS2
tOE
tOLZ
tCHZ1
tCHZ2
tOHZ
Valid Data
High impedance
WE# = “H” level
(Word Mode)
(Byte Mode)
tRC
(Word Mode)
(Byte Mode)
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 12 of 16
Write Cycle (1)*1 (WE# CLOCK)
Note1. BYTE# Vcc – 0.2V or BYTE# 0.2V
CS2
CS1#
OE#
A0~20
A -1~20
LB#,UB#
WE#
DQ0~15
DQ0~7
tOH
tBW
tCW
tCW
tOW tOHZ
(Word Mode)
(Byte Mode)
tWC
(Word Mode)
(Byte Mode)
tAW
tAS tWP tWR
tDW tDH
tWHZ
Valid Data
tOLZ
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 13 of 16
Write Cycle (2)*1 (CS1#, CS2 CLOCK)
Note1. BYTE# Vcc – 0.2V or BYTE# 0.2V
CS2
CS1#
OE#
A0~20
A -1~20
LB#,UB#
WE#
DQ0~15
DQ0~7
VIH
VIL
tBW
tCW
tCW
OE# = “H” level
(Word Mode)
(Byte Mode)
tWC
(Word Mode)
(Byte Mode) tAW
Valid Data
tAS tWR
tWR
tDW tDH
tAS
tWP
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 14 of 16
Write Cycle (3)*1 (LB#, UB# CLOCK)
Note1. BYTE# Vcc – 0.2V or BYTE# 0.2V
CS2
CS1#
OE#
A0~20
A -1~20
LB#,UB#
WE#
DQ0~15
DQ0~7
VIH
VIL
tBW
tCW
tCW
OE# = “H” level
(Word Mode)
(Byte Mode)
tWC
(Word Mode)
(Byte Mode)
Valid Data
tAW
tAS
tWP
tWR
tDW tDH
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 15 of 16
Low Vcc Data Retention Characteristics
Parameter Symbol Min. Typ. Max. Unit Test conditions*3
VCC for data retention VDR 2.0 - 3.6 V
Vin 0V
BYTE# Vcc -0.2V or BYTE# 0.2V
(1) 0V CS2 0.2V or
(2) CS1# VCC-0.2V,
CS2 VCC-0.2V or
(3) LB# = UB# VCC-0.2V,
CS1# 0.2V,
CS2 VCC-0.2V
- 4*1 12 μA ~+25°C
- 7*2 24 μA ~+40°C
- - 50 μA ~+70°C
Data retention current ICCDR
- - 80 μA ~+85°C
Vin 0V
BYTE# Vcc -0.2V or
BYTE# 0.2V
(1) 0V CS2 0.2V or
(2) CS1# VCC-0.2V,
CS2 VCC-0.2V or
(3) LB# = UB# VCC-0.2V,
CS1# 0.2V,
CS2 VCC-0.2V
Chip select to data retention time tCDR 0 - - ns
Operation recovery time tR 5 - - ms
See retention waveform.
Note 1. Typical parameter indicates the value for the center of distribution at 3.0V (Ta= 25ºC), and not 100% tested.
2. Typical parameter indic ates the value for the center of distribution at 3.0V (Ta= 40ºC), and not 100% tested.
3. CS2 also controls address buffer, WE# buffer ,CS1# buffer ,OE# buffer ,LB# ,UB# buffer and Din buffer. If
CS2 controls data retention mode, Vin levels (address, WE# ,OE#,CS1#,LB#,UB#,I/O) can be in the high
impedance state. If CS1# controls data retention mode, CS2 must be CS2 Vcc-0.2V or0V CS2 0.2V.
The other input levels (addres s, WE# ,OE#,CS1#,LB#,UB#,I/O) can be in the high impedance state.
R1LV3216R Series
REJ03C0367-0100, Rev.1.00, 2009.05.07
Page 16 of 16
Low Vcc Data Retentio n Timing Waveforms*1
Note1. BYTE# Vcc – 0.2V or BYTE# 0.2V
CS2
CS1#
LB#, UB#
Vcc
Vcc
Vcc
(1) CS1# Controlled
(2) CS2 Controlled
(3) LB#, UB Controlled
tCDR t
R
2.7V 2.7V
2.2V 2.2V
V
DR
tCDR t
R
2.7V 2.7V
2.2V 2.2V
V
DR
tCDR t
R
2.7V 2.7V
0.6V 0.6V
V
DR
CS1# Vcc - 0.2V
0V CS2 0.2V
LB#
,
UB# Vcc - 0.2V
Revision History R1LV3216R Series Data Sheet
Contents of Revision
Rev. Date Page Description
0.01 Mar.24, 2008 - Initial issue: Preliminary Data Sheet
1.00 May 07, 2009 - Finalized
5 Operation Table corrected
6 Error corrected: ISB Test condition CS2=VIH->VIL
Notes:
1. This document is provided for reference purposes only so that Renesas customers may select the appropriate Renesas products for their use. Renesas neither makes
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Colophon .7.2
To our custo mers,
Old Company Name in Catalogs and Other Documents
On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology
Corporation, and Renesas Electronics Corporation took over all the business of both
companies. Therefore, although t he old company name remains in t his docum ent, it is a valid
Renesas Electronics document. We appreciate your understanding.
Renesas Electronics website: http://www.renesas.com
April 1st, 2010
Renesas Electronics Corporation
Issued by: Renesas Electronics Corporation (http://www.renesas.com)
Send any inquiries to http://www.renesas.com/inquiry.
Notice
1. All information included in this document is current as of the date this document is issued. Such information, however, is
subject to change without any prior notice. Before purchasing or using any Renesas Electronics products listed herein, please
confirm the latest product information with a Renesas Electronics sales office. Also, please pay regular and careful attention to
additional and different information to be disclosed by Renesas Electronics such as that disclosed through our website.
2. Renesas Electronics does not assume any liability for infringement of patents, copyrights, or other intellectual property rights
of third parties by or arising from the use of Renesas Electronics products or technical information described in this document.
No license, express, implied or otherwise, is granted hereby under any patents, copyrights or other intellectual property rights
of Renesas Electronics or others.
3. You should not alter, modify, copy, or otherwise misappropriate any Renesas Electronics product, whether in whole or in part.
4. Descriptions of circuits, software and other related information in this document are provided only to illustrate the operation of
semiconductor products and application examples. You are fully responsible for the incorporation of these circuits, software,
and information in the design of your equipment. Renesas Electronics assumes no responsibility for any losses incurred by
you or third parties arising from th e use of these circuits, software, or information.
5. When exporting the products or technology described in this document, you should comply with the applicable export control
laws and regulations and follow the procedures required by such laws and regulations. You should no t use Renesas
Electronics products or the technology described in this document for any purpo se relating to military applications or use by
the military, including but not limited to the development of weapons of mass destruction. Renesas Electronics products and
technology may not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited
under any applicable domestic or foreign laws or regulations.
6. Renesas Electronics has used reasonable care in preparing the information in cluded in this document, but Renesas Electronics
does not warrant that such information is error free. Renesas Electronics assumes no liability whatso ever for any damages
incurred by you resulting from errors in or omissions from the information in cluded herein .
7. Renesas Electronics products are classified accord ing to the following three quality grades: “Standard”, “High Quality”, and
“Specific”. The recommended applications for each Renesas Electronics product depend s on the product’s quality grade, as
indicated below. You must check the quality grade of each Renesas Electronics product before using it in a particular
application. You may not use any Renesas Electronics product for any application categorized as “Specific” without the prior
written consent of Renesas Electronics. Further, you may not use any Renesas Electronics product for any application for
which it is not intended without the prior written consent of Renesas Electronics. Renesas Electronics shall not be in any way
liable for any dama ges or losses incurred by you or third parties arising from the use of any Renesas Electronics product for an
application categorized as “Specific” or fo r which the product is not intended where you have failed to ob tain the prior written
consent of Renesas Electronics. The quality grade of e ach Renesas Electronics product is “Standard” unless otherwise
expressly specified in a Renesas Elect ronics data sheets or data books, etc.
“Standard”: Computers; office equipment; communications equipment; test and measurement equipment; audio and visual
equipment; home electronic appliances; machine t ools; personal electronic equipment; and industr i al ro bots.
“High Quality”: Transportation equipment (automobiles, trains, ships, et c.); traffic control systems; anti-disaster syste ms; anti-
crime systems; safety equipment; and medical equipment not specifically designed for life support.
“Specific”: Aircra ft; aerospace equipment; submersible repeaters; nuclear reactor control systems; medical equipment or
systems for life support (e.g. artificial life support devices or systems), surgical implantations, or healthcare
interven tion (e.g. excision, etc.), and any other applications or purposes th at pose a direct threat to human life.
8. You should use the Renesas Electronics products described in this document within the range specified by Renesas Electronics,
especially with respect to the maximum rating, operating supply voltage range, movement power voltage range, heat radiation
characteristics, installation and other product characteristics. Renesas Electronics shall have no liability for mal functions or
damages arising out of the use of Renesas Electronics products beyond such specified ranges.
9. Although Renesas Electronics endeavors to improve the quality and reliability of its products, semiconductor products have
specific chara cterist ics such as the o ccurren ce of failure at a certai n rate an d malfunct ion s under certai n u se cond ition s. Further,
Renesas Electronics p roducts are not subject to radiation resistance design . Please be sure to implement safety measures to
guard them against the possibility of physical injury, and injury or damage caused by fire in the event of the failure of a
Renesas Electronics product, such as safety design for hardware and software including but no t limited to redundancy, fire
control and malfunction prevention, approp riate treatment for aging degradation or any other appropriate measures. Because
the evaluation of microcomputer software alone is very difficult, please evaluate the safety of the final products or system
manufactured by you.
10. Please contact a Renesas Electroni cs sales office for details as to environmental matters su ch as the environment al
compatibility of each Renesas Electronics product. Please use Renesas Electronics products in compliance with all applicable
laws and regulations that regulate the inclusion or use of controlled substances, including without limitation, the EU RoHS
Directive. Renesas Electronics assumes no liability for damages or losses occurring as a result of your noncompliance with
applicable laws and regulations.
11. This document may not be reproduced or duplicated, in any form, in whole or in part, without prior written consent of Renesas
Electronics.
12. Please contact a Renesas Electronics sales office if you have any questions regarding the information contained in this
document or Renesas Electronics products, or if you have any other inquiries.
(Note 1) “Renesas Electro nics” as used in this document means Renesas Ele ct r onics Corporation and also includes its majority-
owned subsid iaries.
(Note 2) “Renesas Electronics product(s)” means any product developed or manufactured by or for Renesas Electronics.