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SG PARAMETER SYMBOL TEMP. POWER TEST CONDITIONS MIN MAX UNITS
1 Quiescent Current IQ 25°C ±100V VIN = 0, AV = 100 8.5 mA
1 Input Offset Voltage VOS 25°C ±100V VIN = 0, AV = 100 2 mV
1 Input Offset Voltage VOS 25°C ±15V VIN = 0, AV = 100 3.7 mV
1 Input Offset Voltage VOS 25°C ±150V VIN = 0, AV = 100 3 mV
1 Input Bias Current, +IN +IB 25°C ±100V VIN = 0 50 pA
1 Input Bias Current, –IN –IB 25°C ±100V VIN = 0 50 pA
1 Input Offset Current IOS 25°C ±100V VIN = 0 50 pA
3 Quiescent Current IQ –55°C ±100V VIN = 0, AV = 100 9.5 mA
3 Input Offset Voltage VOS –55°C ±100V VIN = 0, AV = 100 4.4 mV
3 Input Offset Voltage VOS –55°C ±15V VIN = 0, AV = 100 6.1 mV
3 Input Offset Voltage VOS –55°C ±150V VIN = 0, AV = 100 5.4 mV
3 Input Bias Current, +IN +IB –55°C ±100V VIN = 0 50 pA
3 Input BiasCurrent, –IN –IB –55°C ±100V VIN = 0 50 pA
3 Input Offset Current IOS –55°C ±100V VIN = 0 50 pA
2 Quiescent Current IQ 125°C ±100V VIN = 0, AV = 100 11 mA
2 Input Offset Voltage VOS 125°C ±100V VIN = 0, AV = 100 5 mV
2 Input Offset Voltage VOS 125°C ±15V VIN = 0, AV = 100 6.7 mV
2 Input Offset Voltage VOS 125°C ±150V VIN = 0, AV = 100 6 mV
2 Input Bias Current, +IN +IB 125°C ±100V VIN = 0 10 nA
2 Input Bias Current, –IN –IB 125°C ±100V VIN = 0 10 nA
2 Input Offset Current IOS 125°C ±100V VIN = 0 10 nA
4 Output Voltage, IO = 150mA VO 25°C ±31V RL = 100Ω 15 V
4 Output Voltage, IO = 29mA VO 25°C ±150V RL = 5K 145 V
4 Output Voltage, IO = 80mA VO 25°C ± 90V RL = 1K 80 V
4 Current Limits ICL 25°C ±30V RL = 100Ω 75 125 mA
4 Stability/Noise EN 25°C ±100V RL = 5K, AV = 1, CL = 10nF 1 mV
4 Slew Rate SR 25°C ±100V RL = 5K 20 100 V/µs
4 Open Loop Gain AOL 25°C ±100V RL = 5K, F = 10Hz 96 dB
4 Common Mode Rejection CMR 25°C ±32.5V RL = 5K, F = DC, VCM = ±22.5V 90 dB
6 Output Voltage, IO = 100mA VO –55°C ±31V RL =100Ω 10 V
6 Output Voltage, IO = 29mA VO –55°C ±150V RL = 5K 145 V
6 Output Voltage, IO = 70mA VO –55°C ±90V RL = 1K 70 V
6 Stability/Noise EN –55°C ±100V RL = 5K, AV = 1, CL = 10nF 1 mV
6 Slew Rate SR –55°C ±100V RL = 5K 20 100 V/µs
6 Open Loop Gain AOL –55°C ±100V RL = 5K, F = 10Hz 96 dB
6 Common Mode Rejection CMR –55°C ±32.5V RL = 5K, F = DC, VCM = ±22.5V 90 dB
5 Output Voltage, IO = 150mA VO 125°C ±31V RL = 100Ω 15 V
5 Output Voltage, IO = 29mA VO 125°C ±150V RL = 5K 145 V
5 Output Voltage, IO = 80mA VO 125°C ±90V RL = 1K 80 V
5 Stability/Noise EN 125°C ±100V RL = 5K, AV = 1, CL = 10nF 1 mV
5 Slew Rate SR 125°C ±100V RL = 5K 20 100 V/µs
5 Open Loop Gain AOL 125°C ±100V RL = 5K, F = 10Hz 96 dB
5 Common Mode Rejection CMR 125°C ±32.5V RL = 5K, F = DC, VCM = ±22.5V 90 dB
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BURN IN CIRCUIT * These components are used to stabilize device due to poor
high frequency characteristics of burn in board.
** Input signals are calculated to result in internal power dis-
sipation of approximately 2.1W at case temperature = 125°C.
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This data sheet has been carefully checked and is believed to be reliable, however, no responsibility is assumed for possible inaccuracies or omissions. All specifications are subject to change without notice.
PA08MU REV I JULY 2002 © 2002 Apex Microtechnology Corp.