2N3700DCSM
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is
believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in
its use. Semelab encourages customers to verify that datasheets are current before placing orders.
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5309
Issue 1
HIGH VOL T AGE, MEDIUM POWER, NPN
DUAL TRANSISTOR IN A
HERMETICALLY SEALED
CERAMIC SURFACE MOUNT PACKAGE
FOR HIGH RELIABILITY APPLICATIONS
FEATURES
• DUAL SILICON PLANAR EPITAXIAL NPN
TRANSISTOR
• HERMETIC CERAMIC SURFACE MOUNT
PACKAGE
• CECC SCREENING OPTIONS
• SPACE QUALITY LEVELS OPTIONS
• HIGH VOLTAGE
APPLICATIONS:
Dual Hermetically sealed surface mount version
of the popular 2N3700 for high reliability/ space
applications requiring small size and low weight
devices.
VCBO Collector – Base Voltage
VCEO Collector – Emitter Voltage (IB= 0)
VEBO Emitter – Base Voltage (IB= 0)
ICCollector Current
PDPer Device Dissipation
PDTotal Device Dissipation
PDDerate above 25°C (Per Device)
(Total)
Rja Ther mal Resistance Junction to Ambient
Tstg Storage Temperature
140V
80V
7V
1A
350mW
525mW
2mW / °C
3mW/°C
240°C/W
–65 to 200°C
MECHANICAL DATA
Dimensions in mm (inches)
ABSOLUTE MAXIMUM RATINGS
(Tcase = 25°C unless otherwise stated)
LCC2 PACKAGE
Underside View
PAD 1 – Collector 1
PAD 2 – Base 1
PAD 3 – Base 2
PAD 4 – Collector 2
PAD 5 – Emitter 2
PAD 6 – Emitter 1
2N3700DCSM
A
2
1
3
4
56
6.22 ± 0.13
(0.245 ± 0.005)
2.54 ± 0.13
(0.10 ± 0.005)
1.65 ± 0.13
(0.065 ± 0.005)
2.29 ± 0.20
(0.09 ± 0.008)
1.27 ± 0.13
(0.05 ± 0.005)
1.40 ± 0.15
(0.055 ± 0.006)
4.32 ± 0.13
(0.170 ± 0.005)
0.64 ± 0.08
(0.025 ± 0.003)
0.23
(0.009)
rad.
A =
2N3700DCSM
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is
believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in
its use. Semelab encourages customers to verify that datasheets are current before placing orders.
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 5309
Issue 1
Parameter Test Conditions Min. Typ. Max. Unit
V
nA
µA
nA
V
V
V
-
-
-
-
-
-
V
V
80
10
10
10
0.2
0.5
1.1
50
90
100 300
50
15
40
140
7
IC=30mA
VCB = 90V
VCB = 90V Tamb = 150°C
VEB = 5V
IC= 150mA IB= 15mA
IC= 500mA IB= 50mA
IC= 150mA IB= 15mA
IC= 0.1mA
IC= 10mA
IC= 150mA
IC= 500mA
IC= 1A
IC= 150mA Tamb = -55°C
IC= 100µA
IE= 100µA
VCEO* Collector Emitter Sustaining Voltage
(IB= 0)
ICBO* Collector Base Cut-off Current
(IE= 0)
IEBO* Emitter Cut-off Current (IC= 0)
VCE(sat)* Collector Emitter Saturation Voltage
VBE(sat)* Base Emitter Saturation Voltage
hFE* DC Current Gain (VCE = 10V)
V(BR)CBO Collector-base Breakdown Voltage
(IE= 0)
V(BR)EBO Emitter-base BreakdownVoltage
(IC= 0)
Parameter Test Conditions Min. Typ. Max. Unit
ELECTRICAL CHARACTERISTICS (per Device) (Tcase = 25°C unless otherwise stated)
fTTransition Frequency
hfe Small Signal Current Gain
CEBO Emitter-base Capacitance
CCBO Collector-base Capacitance
rbbCbcFeedback time constant
IC= 50mA VCE = 10V f = 20MHz
IC= 1mA VCE = 5V f = 1kHz
IC= 0 VEB = 0.5V f = 1MHz
IC= 0 VCB = 10V f = 1MHz
IC= 10mA VCB = 10V f = 4MHz
100
80 400
60
12
25 400
MHz
-
pF
pF
ps
* Pulse test tp = 300µs , δ 1%
DYNAMIC CHARACTERISTICS (Tcase = 25°C unless otherwise stated)