High Temperature, High Voltage Performance Characteristics GENERAL SPECIFICATIONS ENVIRONMENTAL Working Voltage: C0G 50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k, 15k, 20k X7R 50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k, 15k, 20k, 30k, 40k, 50k X5U 3k, 4k, 5k, 7.5k, 10k, 15k, 20k Temperature Characteristics: C0G 0 + 30 PPM / C from - 55C to + 125C (1) X7R + 15% from - 55C to + 125C X5U + 22%, -56% from -55C to + 85C Capacitance Tolerance: C0G +0.5pF, +1%, +2%, +5%, +10% X7R 5%, 10%, 20%, +80% / -20%, +100% / -0% X5U 5%, 10%, 20%, +80% / -20%, +100% / -0% Construction: Epoxy encapsulated - meets flame test requirements of UL Standard 94V-0. High-temperature solder - meets EIA RS-198, Method 302, Condition B (260C for 10 seconds) Termination Material: Check individual Series: Part Number and Ordering Information for Termination Materials offered in each series. Solderability: MIL-STD 202, Method 208 (Test Method: ANSI/J-STD-002) Test A for through-hole mount and surface mount leaded. Test B for surface mount leadless components. Terminal Strength: MIL-STD 202, Method 208, Condition A (2.3kg or 5 lbs) Resistance to Solvents: MIL-STD 202, Method 215 Resistance to Soldering Heat: MIL-STD 202, Method 210, Test Condition C Vibration: MIL-STD 202, Method 204, Condition D (20g) Shock: MIL-STD 202, Method 213, Condition I (100g) Life Test: MIL-STD 202, Method 108 <200V C0G - 200% rated voltage @ +125C X7R - 200% rated voltage @ +125C >500V C0G - rated voltage @ +125C X7R - rated voltage @ +125C X5U - rated voltage @ +85C Post Test Limits @ 25C are: Capacitance Change: C0G (< 200V) - +3% or 0.25pF, whichever is greater. C0G (> 500V) - +3% or 0.50pF, whichever is greater. X7R - + 20% of initial value (2) Dissipation Factor: C0G - 0.25% maximum X7R & X5U - 3.0% maximum Insulation Resistance: C0G & X7R: 100 gigohm or 1 gigohm x uF, whichever is less. <500V test @ rated voltage, >1kV test @ 500V. ELECTRICAL Capacitance @ 25C: Within specified tolerance and following test conditions per MILSTD 202, Method 305. C0G, X7R & X5U > 100pF with 1.0 vrms @ 1 kHz with 1.0 vrms < 100pF with 1.0 vrms @ 1 MHz with 1.0 vrms Dissipation Factor @ 25C: Same test conditions as capacitance. C0G - 0.15% maximum X7R - 2.5% maximum X5U - 2.5% maximum Insulation Resistance @25C: MIL-STD 202, Method 302 C0G & X7R: 100 gigohm or 1 gigohm x uF, whichever is less. <500V test @ rated voltage, >1kV test @ 500V. X5U: 10 gigohm or 100 megohm x uF, whichever is less. <500V test @ rated voltage, >1kV test @ 500V. Dielectric Withstanding Voltage: MIL-STD 202, Method 301 <200V test @ 250% of rated voltage 500V to 1250V test @ 150% of rated voltage >1251V test @ 120% of rated voltage X5U: 10 gigohm or 100 megohm x uF, whichever is less. <500V test @ rated voltage, >1kV test @ 500V. Moisture Resistance: MIL-STD 202, Method 106 Post Test Limits @ 25C are: Capacitance Change: C0G (< 200V) - +3% or 0.25pF, whichever is greater. C0G (> 500V) - +3% or 0.50pF, whichever is greater. X7R - + 20% of initial value (2) Dissipation Factor: C0G - 0.25% maximum X7R & X5U - 3.0% maximum Insulation Resistance: C0G & X7R: 100 gigohm or 1 gigohm x uF, whichever is less. <500V test @ rated voltage, >1kV test @ 500V. X5U: 10 gigohm or 100 megohm x uF, whichever is less. <500V test @ rated voltage, >1kV test @ 500V. Thermal Shock: MIL-STD 202, Method 107, Condition A C0G & X7R: -55C to 125C X5U: -55C to 85C (1) (2) +53 PPM -30 PPM/ C from +25C to -55C, + 60 PPM below 10pF. X7R & X5U dielectrics exhibit aging characteristics; therefore, it is highly recommended that capacitors be deaged for 2 hours at 150C and stabilized at room temperature for 48 hours before capacitance measurements are made. (c) KEMET Electronics Corporation * PO Box 5928 * Greenville, SC 29606 * www.kemet.com 3