CY7C342B
Document #: 38-03014 Rev. *A Page 3 of 14
Logic Array Blocks
There are eight logic array blocks in the CY7C342B. Each LAB
consists of a macrocell array containing 16 macrocells, an
expand er produc t term a rray contain ing 32 expanders , and a n
I/O block. The LAB is fed by the programmable interconnect
array an d the d edica ted input bus. All ma croce ll feed back s go
to the macrocell array, the expander array, and the program-
mable interconnect a rray . Exp anders feed themselves and the
macrocell array. All I/O feedbacks go to the programmable
interconnect array so that they may be accessed by macrocells
in other LABs as well as the macrocells in the LAB in which
they are situated.
Externally, the CY7C342B provides eight dedicated inputs,
one of which may be used as a system clock. There are 52 I/O
pins that may be individually configured for input, output, or
bidirectional data flow.
Programmable Interconnect Array
The Programmable Interconnect Array (PIA) solves inter-
connec t limitations by routin g only the sig nals needed by each
logic array block. The inputs to the PIA are the outputs of every
macrocell within the device and the I/O pin feedback of every
pin on the device.
Unlike masked or programmable gate arrays, which induce
variable delay dependent on rou ting, the PIA has a fixed delay.
This el iminates undesired skews among l ogic signals t hat may
cause glitches in internal or external logic. The fixed delay,
regardless of programmable interconnect array configuration,
simplifies design by assuring that internal signal skews or
races are avoided. The result is ease of design implemen-
tation, of ten in a sig nal pass, without the m ultiple in ternal logi c
placem ent and rou ting ite rations require d for a program mabl e
gate array to achieve design timing objectives.
Timing Delays
T iming delays within the CY7C342B may be easily determined
using Warp®, Warp Professional™, or Warp Enterprise™
softwa re by the mo del show n in Figure 1. The CY 7C342B has
fixed internal delays, allowing the user to determine the
worst-case timing delays for any design.
Design Recommendations
Operation of the devices described herein with conditions
above those listed under “Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other
conditions above those indicated in the operational se ctions of
this da t as he et is no t i mp lie d. E x posu r e to abs o lu t e m ax i mum
ratings conditions for extended periods of time may affect
device reliability. The CY7C342B contains circuitry to protect
device pins from high static voltages or electric fields, but
normal precautions should be taken to avoid application of any
voltage higher than the maximum rated voltages.
For proper operation, input and output pins must be
constrained to the range GND < (VIN or VOUT) < VCC. Unused
inputs must always be tied to an appropriate logic level
(either VCC or GND). Each set of VCC and GND pins must
be connected together directly at the device. Power supply
decoupling capacitors of at least 0.2 µF must be c onn e ct ed
between VCC and GND. For the most effective decoupling,
each VCC pin should be separately decoupled to GND
directly at the device. Decoupling capacitors should have
good frequency response, such as mo nolithic cerami c types
have.
LOGIC ARRAY
CONTROLDELAY
tLAC
EXPANDER
DELAY
tEXP
CLOCK
DELAY
tIC
tRD
tCOMB
tLATCH
INPUT
DELAY
tIN
REGISTER
OUTPUT
DELAY
tOD
tXZ
tZX
LOGIC ARRAY
DELAY
tLAD
FEEDBACK
DELAY
tFD
OUTPUT
INPUT
SYSTEM CLOCK DELAY tICS
tRH
tRSU
tPRE
tCLR
PIA
DELAY
tPIA
I/O DELAY
tIO
Figure 1. CY7C342B Internal Timing Model