© 2006 Device Engineering Inc. Page 1 of 17 DS-MW-01016-01 Rev D
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Features
Two Receivers and One Transmitter
Industry Standard Pin for Pin Replacement Part
Wraparound Self-Test mode
Word length can be configured for 25 bit or 32 bits operation
Parity Status and generation of Receive and Transmit Words
8 Word Transmitter buffer
Low Power CMOS
Supports multiple ARINC protocols: 429, 571, 575, 706
Available in extended (-55/+85°C) and Military (-55/+125°C) temperature ranges
Available in MLPQ, QFP, PLCC, LCC, PDIP and CDIP packages
General Description:
The DEI1016 provides an interface between a standard avionics type serial digital data bus and a 16-bit-wide digital data bus. The
interface circuit consists of a single channel transmitter with an 8X32 bit buffer, two independent receive channels, and a host
programmable control register to select operating options. The two receiver channels operate identically, each providing a direct
electrical interface to an ARINC data bus.
The transmitter circuit contains an 8 word by 32 bit buffer memory and control logic which allows the host to write a block of data
into the transmitter. The block of data is transmitted automatically by enabling the transmitter with no further attention by the host
computer. Data is transmitted in TTL format on the D0(A)/D0(B) output pins. The signal format is compatible with DEI’s extensive
line of ARINC 429 Line drivers for easy connection to the ARINC data bus.
DEI1016/DEI1016A/DEI1016B
/DEI1016C ARINC 429
Transceiver Family
385 East Alamo Drive
Chandler, AZ 85225
Phone: (480) 303-0822
Fax: (480) 303-0824
E-mail: info@deiaz.com
Device
Engineering
Incorporated
Control
Register
TX FIFO
8 Words X 32 Bits
Receive
Decoder
Receive
Decoder
Transmit
Encoder
ARINC 429
Receive 0
ARINC 429
Receive 1
Self Test Data
ARINC 429
Transmit
DATA BUS
Host
Interface
/DR1, /DR2
TXR
/OE1, /OE2
/LD1, /LD2
ENTX
/LDCW
/DBCEN
/MR
32
32
32
32
16
16
Figure 1: DEI1016 Block Diagram
© 2006 Device Engineering Inc. Page 2 of 17 DS-MW-01016-01 Rev D
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Table 1: DEI 1016 Absolute Maximum Ratings
PARAMETER SYMBOL MIN MAX UNITS
Supply Voltage VDD -0.5 +7.0 V
DC Input Voltage (except pins DI1(A,B) and DI2(A,B)) VIN -0.6 VCC + 0.6 V
Voltage at pins DI1(A,B) and DI2(A,B) VIN ±29 V
Clamp diode current, any pin except DI inputs ±25 mA
DC Output Current per pin ±25 mA
DCV or GND current per pin ±50 mA
Storage Temperature TSTG -65 +150
°C
Junction Temperature, operating TJmax +145
°C
Lead Temperature (soldering, 10 sec) TLead +275
°C
1MCK Clock Frequency 1.16 MHz
Table 2: DEI 1016 DC Electrical Characteristics
Unless noted, operating conditions: VDD = 5V ± 10%, Extended Temp Devices: Ta = -55ºC to +85ºC, Military Temp Devices: Ta = -55ºC
to +125ºC
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
ARINC LINE INPUTS
Logic 1 Input Voltage VIH V
DIFF DI(A) and DI(B) 6.5 10 13 V
Logic 0 Input Voltage VIL V
DIFF DI(A) and DI(B) -6.5 -10 -13 V
N
ull Input Voltage VNUL V
DIFF DI(A) and DI(B) -2.5 0 +2.5 V
Common Mode Voltage VCM -5 +5 V
Differential Input Impedance RI 12 k
Input Impedance to VDD R
H 12 k
Input Impedance to GND RG 12 k
Differential Input Capacitance CI 20 pF
Input Capacitance to VDD C
H 20 pF
Input Capacitance to GND CG 20 pF
LOGIC INPUTS (including bi-directional)
Low Level Input Voltage VIL 0.8 V
High Level Input Voltage VIH 2.0 V
Input Leakage Current IIN V
IN = GND to VDD -10
+10 µA
Input Capacitance CIN 15 pF
LOGIC OUTPUTS (including bi-directional)
High Level Output Voltage VOH IOH = 20µA (CMOS)
IOH = 6mA (TTL)
VDD – 0.1
2.7
V
Low Level Output Voltage VOL IOL = 20µA (CMOS)
IOL = 6mA (TTL)
0.1
0.4
V
POWER SUPPLY INPUT
Supply Current IDD 1MCK = 1MHz 5 10 mA
Supply Voltage VDD 4.5 5 5.5 VDC
© 2006 Device Engineering Inc. Page 3 of 17 DS-MW-01016-01 Rev D
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Table 3: DEI 1016 AC Electrical Characteristics
PARAMETER SYMBOL
Data Rate
100kbps
Data Rate
12.5kbps
MIN MAX MIN MAX UNITS
1MCK Frequency f1MCK 1.01 1.01 MHz
1MCK Duty Cycle CKDC 40 60 40 60 %
1MCK Rise/Fall Time TCRF 10 10 ns
Master Reset Pulse Width TMR 200 200 ns
Transmitter Data Rate (1MCK = 1MHz) TDR 99 101 12.4 12.6 kbps
Receiver Data Rate (1MCK = 1MHz),(DATA = 50% BIT/
50% NULL TIME)
RDR 95 105 8.0 14.5 kbps
Table 4: Pin Definitions
SYMBOL DEFINITION
VDD Power Input. +5VDC ±10%
GND Power Return and Signal Ground.
DI1(A) ARINC 429 Input. Receiver Channel 1, “A” input
DI1(B) ARINC 429 Input. Receiver Channel 1, “B” input
DI2(A) ARINC 429 Input. Receiver Channel 2, “A” input
DI2(B) ARINC 429 Input. Receiver Channel 2, “B” input
/DR1 Logic Output. Data Ready, Receiver 1. A Low output indicates valid data in receiver 1.
/DR2 Logic Output. Data Ready, Receiver 2. A Low output indicates valid data in receiver 2.
SEL Logic Input. Receiver word select. A Low input selects receiver Word 1; Hi selects Word 2 to be read on D[15:0] port.
/OE1 Logic Input. Receiver 1 Output Enable. A Low input enables the D[15:0] port to output Receiver 1 data. Word 1 or
Word 2 will be output as determined by the SEL input.
/OE2 Logic Input. Receiver 2 Output Enable. A Low input enables the D[15:0] port to output Receiver 2 data. Word 1 or
Word 2 will be output as determined by the SEL input.
D[15:0] Logic Input / Tri-state Output. This 16-bit bi-directional data port is the uP data interface. Receiver data is read from
this port. Control Register and Transmitter FIFO data is written into this port.
/LD1 Logic Input. Load Transmitter Word 1. A Low input pulse loads Word 1 into the Transmitter FIFO from D[15:0].
/LD2 Logic Input. Load Transmitter Word 2. A Low input pulse loads Word 2 into the Transmitter FIFO from D[15:0].
TXR Logic Output. Transmitter Ready. A Hi output indicates the Transmitter FIFO is empty and ready to accept new data.
DO(A) Logic Output. Transmitter serial data ‘A’ output. This is a return-to-zero format signal which will normally feed an
ARINC 429 Line Driver IC. A Hi output indicates the Transmitter data bit is a 1. The signal returns to zero for
second half of bit time.
DO(B) Logic Output. Transmitter serial data ‘B’ output. This is a return-to-zero format signal which will normally feed an
ARINC 429 Line Driver IC. A Hi output indicates the Transmitter data bit is a 0. The signal returns to zero for
second half of bit time.
ENTX Logic Input. Enable Transmitter. A Hi input enables the Transmitter to send data from the Transmitter FIFO. This
must be Low while writing data into Transmitter FIFO. Transmitter memory is cleared by high-to-low transition.
/LDCW Logic Input. Load Control Register. A Low input pulse loads the Control Register from D[15:0].
1MCK Logic Input. External Clock. Master clock used by both the Receivers and Transmitter. The 1MHz rate is a X10 clock
for the HI data rate (100 kbps), and a X80 clock for LO data rate (12.5 kbps).
TXCK Logic Output. Transmitter Clock. This outputs a clock frequency equal to the transmit data rate. The clock is always
enabled and in phase with the data. The output is Hi during the first half of the data bit time.
/MR Logic Input. Master Reset. A Lo input resets the Transmitter FIFO, bit counters, word counter, gap timers, /DRx, and
TXR. The Control Register is not affected. Used on power up and system reset.
/DBCEN Logic Input with internal pull up to VDD. Data Bit Control Enable. A Low input enables the transmitter parity bit
control function as defined by control register bit 4 (PAREN). A Hi input forces transmitter parity bit insertion
regardless of PAREN value. The pin is normally left open or tied to ground.
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Table 6: DEI1016 Control Word
N
AME DATA BIT DESCRIPTION
PAREN D4
Transmitter Parity Enable. Enables parity bit insertion into transmitter data bit 32. Parity is always
inserted if /DBCEN is open or HI. If /DBCEN is LO, Logic “0” on PAREN inserts data on bit 32, and
Logic “1” on PAREN inserts parity on bit 32.
/SLFTST1 D5
Self Test Enable. Logic “0” enables a “wrap around” test mode which internally connects the transmitter
outputs to both receiver inputs, bypassing the receiver front end. The test data is inverted before going
into receiver 2 so that its data is the complement of that received by receiver 1. The transmitter output is
active during test mode.
SDEN12 D6
S/D Code Check Enable for receiver 1. Logic “1” enables the Source/Destination Decoder for receiver 1.
X1, Y12 D7, D8
S/D compare code RX1. If the receiver 1 S/D code check is enabled (SDENB1=1), then incoming
receiver data S/D fields will be compared to X1, Y1. If they match, the word will be accepted by receiver
1; if not, it will be ignored. X1 (D7) is compared to serial data bit 9, Y1 (D8) is compared to serial data
bit 10.
SDEN22 D9
S/D Code Check Enable for receiver 1. Logic “1” enables the Source/Destination Decoder for receiver 1.
X2, Y22 D10, D11
S/D compare code RX2. If the receiver 2 S/D code check is enabled (SDENB2=1), then incoming
receiver data S/D fields will be compared to X2, Y2. If they match, the word will be accepted by receiver
2; if not, it will be ignored. X2 (D10) is compared to serial data bit 9, Y2 (D11) is compared to serial
data bit 10.
PARCK D12
Parity Check Enable. Logic “1” inverts the transmitter parity bit for test of parity circuits. Logic “0”
selects normal odd parity; logic “1” selects even parity.
TXSEL3 D13
Transmitter Data Rate Select. Logic “0” sets the transmitter to the HI data rate. HI rate is equal to the
clock rate divided 10. Logic “1” sets the transmitter to the LO data rate. LO rate is equal to the clock rate
divided by 80.
RCVSEL4 D14
Receiver Data Rate Select. Logic “0” sets both receivers to accept the HI data rate. The nominal HI data
rate is the input clock divided by 10. Logic “1” sets both receivers to the LO data rate. The nominal LO
data rate is the input clock divided by 80.
WLSEL5 D15
Word Length Select. Logic “0” sets the transmitter and receivers to a 32 bit word format. Logic ”1” sets
them to a 25 bit word format.
NOT USED D0-D3 When writing to the control register, the four “not used bits” are “don’t care” bits. These four bits will no
t
be used on the chip.
NOTES
1) The test mode should always conclude with ten null’s. This step prevents both receivers from accepting invalid data.
2) SDENBn, Xn & Yn should be changed within 20 bit times after /DRn goes low and the bit stream has been read, or within 30 bit times after a
master reset has been removed.
3) TXSEL should only be changed during the time that TXR is high or Master Reset is low.
4) RCVSEL should be changed only during a Master Reset pulse. If changed at any other time, then the next bit stream from both Receiver 1 and
Receiver 2 should be ignored.
5) When the control word is written the effect of the WLSEL bit will take effect immediately on the first complete ARINC word received or
transmitted following the control word write operation.
Functional Description:
The DEI 1016 supports a number of various options
which are selected by data written into the control
register. Data is written into the control register from the
16-bit data bus when the /LDCW signal is pulsed to a
logic “0”. The twelve control bits control the following
functions:
1) Word Length (32 or 25 bits)
2) Transmitter bit 32 (Parity or Data)
3) Wrap around self test.
4) Source Destination code checking of received data.
5) Transmitter parity (even or odd)
6) Transmitter and Receiver data rate (100 or 12.5 kbps)
Table 5: Control Register Format
BIT SYMBOL BIT SYMBOL
D15 (MSB) WLSEL D7 X1
D14 RCVSEL D6 SDENB1
D13 TXSEL D5 /SLFTST
D12 PARCK D4 PAREN
D11 Y2 D3
N
OT USED
D10 X2 D2
N
OT USED
D9 SDENB2 D1
N
OT USED
D8 Y1 D0
N
OT USED
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Data Format:
The ARINC serial data is shuffled and formatted into two 16 bit words (WORD1 and WORD2) used by the bi-directional data bus
interface. Figure 2 shows the mapping between the 32 bit ARINC serial data and the two data words. Figure 3 describes the mapping
for the 25 bit serial word used when control register bit WLSEL is set to logic “1”.
Figure 2: Mapping of Serial Data to/from Word 1 and Word 2 in 32 bit format.
Figure 2: Mapping of Serial Data to/from Word 1 and Word 2 in 25 bit format.
29 262728 123432 31 30 22 19202125 24 23 15 12131418 17 16 8 56711 10 9
123415 121314 08 56711 10 9 123415 121314 08 56711 10 9
PARITY
SSM
SIGN
DATA
MSB
LSB
S/D
or
DATA
LABEL
LSB
MSB
SIGN
DATA
MSB
DATA
LSB
S/D
or
DATA
SSM
PARITY
LABEL
LSB
MSB
Word 2 Format Word 1 Format
BIT
FUNCTION
BIT
FUNCTION
32 Bit ARINC Serial Data Format (Bit 1 is Transmitted First)
123422 19202125 24 23 15 12131418 17 16 8 56711 10 9
123415 121314 08 56711 10 9 123415 121314 08 56711 10 9
PARITY
DATA
MSB
LSB
LABEL
LSB
MSB
DATA
MSB
NOT USED
PARITY
LABEL
LSB
MSB
Word 2 Format Word 1 Format
BIT
FUNCTION
BIT
FUNCTION
25 Bit ARINC Serial Data Format (Bit 1 is Transmitted First)
LSB
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Receiver Operation:
Since the receivers function identically, only one will be
discussed in detail. The receiver consists of the following
circuits.
Line Receiver
The front end of the Line Receiver functions as a voltage
level translator. It transforms the ±10 volt differential
ARINC data signals into 5 Volt internal logic levels. The
line receivers are protected against shorts to ±29 Volts and
p
rovides common mode voltage rejection. The outputs of
the Line Receiver are one of two inputs to the Self-Test
Data Selector. The other input to the Data Selector is the
self-test signal from the transmitter section. The self-test
signals are inverted going into Receiver 2. The data
selector is controled by Control Register bit D5 (SLFTST).
the received word has an odd number of 1’s (no error). Logic
“1” indicates the received word has an even number of 1’s (error
condition). If the data format has data in bit 32 instead of parity,
the user software must calculate the value of the 32nd bit. If
Word 1 and Word 2 together have an even number of 1’s, then
data bit 32 is a logic “1”. Otherwise, it is a logic “0”.
Data Access
To access the receiver data, the user sets the receiver data select
input (SEL) to a logic “0” and pulses the output enable (/OEn)
line with a logic “0”. This causes Data Word 1 to be placed on
the 16 bit data bus. To read Word 2, the user sets the data select
input (SEL) to a logic “1” and pulses the output enable (/OEn)
low to place Word 2 on the data bus. When both Word 1 and
Word 2 have been read, DRn will be reset. This reset is
triggered by the leading edge of the final /OEn pulse.
If a new data word is received before the previous data has been
read from the receiver buffer (as indicated by the /DRn signal
flip-flop), the receive buffer will not be over written by the new
data. The new data will remain in the shift register until either
the /DRn signal is reset and it can be written into the receive
b
uffer or it is overwritten by the next incoming data word. Data
in the shift register will be overwritten by new incoming data,
while data that has been latched into the receive buffer can not
be overwritten.
Data Error Conditions
If the receiver input data word string is broken before the entire
data word is received, the receiver will reset and ignore the
partially received data word.
If the receiver input data word string is not properly framed with
at least 1 null bit before the word and 1 null bit after the word,
the receiver will reset and ignore the improperly framed data
word.
Transmitter Operation:
The transmitter section consists of an 8 word by 32 bit FIFO, parity
generator, transmitter word gap timer, and a TTL output circuit.
FIFO Buffer
The 8x32 buffer memory allows the user to load up to 8 words into
the transmitter, enable it, and then ignore it while the transmitter
ships out the data without further attention. Data is loaded into the
buffer by pulsing /LD1 to load the first 16 bits (WORD 1) from the
data bus, and pulsing /LD2 to load WORD 2. /LD1 must always
precede /LD2. The transmitter must always be disabled while
loading the buffer (ENTX = logic "0").
If the buffer is full and new data is pulsed with /LD1 and /LD2, the
last 32 bit word in the buffer will be overwritten. Data will remain
in the buffer until ENTX is pulsed to a logic “1”, which will activate
the FIFO clock and data is shifted out serially to the transmitter
driver.
Figure 4: Line Receiver Block Diagram
Incoming Data
The incoming data (either self test or ARINC) is triple
sampled by the word gap timer to generate a data clock.
The start of each bit is first detected and then verified two
receive-clock cycles later. The receive clock is 1MHz for
HI speed and 125 KHz for LO speed operation and is
generated by the Receiver/Transmitter timing circuit. The
receive clock is ten times the normal data rate to ensure no
data ambiguity.
Data Clock
The derived data clock then shifts the data down a 32 bit
long Data Shift Register. The data word length is
selectable for either 25 or 32 bits long by Control Register
Bit WLSEL. As soon as the data word is completely
received, an internal signal is generated by the word gap
timer circuit to enable loading data into the 32 bit receive
buffer latch.
S/D Decoder
The Source/Destination decoder compares the user set code
(X and Y) with bits 9 and 10 of the data word. The decoder
can be enabled and disabled by the SDENB bit of the
Control Register. If the two codes are matched, a signal is
generated to latch in the received data into the receiver
b
uffer. Otherwise the data word is ignored and not latched
into the receive buffer. If the data is latched, the data ready
flag (/DRn) is set to indicate to the user that a valid data
word is ready to be read.
Parity Control
The parity of the incoming message is checked when either
word of the receiver is read. Lo
g
ic “0” indicates
Self-Test
Data Selector
SLFTST
DO(A)
DI1(A)
DI1(B)
Comparator
To
Receive
Decoder
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FIFO Buffer (continued)
The buffer data is transmitted until the last word in the buffer is
shifted out. At this time a transmitter ready signal (TXR) is set to a
logic “1” indicating that the buffer is empty and ready to receive up
to eight more data words. Writing into the buffer memory is
disabled when ENTX is set to logic “1”.
Transmitter Ready Signal (TXR)
The transmitter ready flag (TXR) is set to logic “0” with the first
occurrence of an /LD2 pulse to indicate that the buffer is not
empty.
Output Register
The output register is designed such that it can shift out a word of
25 bits or 32 bits. The length is controlled by control register bit
"WLSEL".
TX Word Gap Timer
The TX word gap timer circuit inserts a 4 bit time gap between
words. This gives a minimum requirement of a 29 bit time or a 36
bit time for each word transmission. The 4 bit time gap is also
automatically maintained when the next new block of data is
loaded into the buffer, which may take less than one bit time.
Parity Generator
The parity generator calculates either odd or even parity as
specified by control register bit "PARCK". Odd parity is normally
used; even parity is available to test the receiver parity check
circuit. Odd parity means that there is an odd number of 1's in the
25 or 32 bit serial word. Bit 8 of word one is replaced with a parity
bit if parity is selected by the control register bit "PAREN" and the
/DBCEN pin. Otherwise, bit 8 is passed through as data.
Transmitter Output
The transmitter driver outputs three TTL compatible signals: 1)
DO(A), 2) DO(B), and 3) TXCLK. DO(A) and DO(B) are the
transmitter data in two rail, return-to-zero format. DO(A) indicates
a logic "1" data bit by going to a "1" for the 1st half of a bit time,
then returning to "0" for the 2nd half; DO(B) remains at "0" for the
whole bit time. In the same fashion, DO(B) indicates a logic "0"
data bit by pulsing HI while DO(A) remains LO. A null bit is
indicated when both signals remain LO. It is illegal for both signals
to be logic "1". The TXCLK is a free running clock signal of 50%
duty cycle and in phase with transmitter data. The clock will
always be logic "1" during the first half of a bit time.
Power-Up Reset
An internal power-up reset circuit prevents erroneous data
transmission before an external master reset has been applied.
25-bit Word Operation:
The TRANSCEIVER implements a 25 bit word format which may
be used in non-ARINC applications to enhance data transfer rate.
The format is a simplified version of the 32 bit ARINC word and is
described in Figure 3. It consists of an 8 bit label, a 16 bit data
word, and a parity bit. The parity bit can optionally be replaced
with a 17th data bit. The Source/Destination code checking option
can be enabled in either receiver. It will operate on bits 9 and 10 of
the 25 bit word.
Self-Test Operation:
By selecting the control register bit (/SLFTST) self test option,
the user may perform a functional test of the TRANSCEIVER
and support circuitry. The user can write data into the
transmitter and it will be internally wrapped around into both
receivers. The user can then verify reception and integrity of
the data. The receiver line interface and the user's line drivers
will not be tested.
By setting the transmitter to use even parity, the user can test
the receiver's parity circuit operation.
Power-up reset and Master Reset:
The user must apply an active Lo pulse to the Master Reset pin
(/MR) after power up or upon system reset. Preceding the
master reset at power-up an internal power-up reset occurs
which will clear the transmitter such that no erroneous serial
data stream will be transmitted before master reset. Receivers,
control register, and internal control logic are reset by master
reset.
After resetting the device, the user must program the control
register before beginning normal operation. The control
register may be reprogrammed without additional reset pulses.
Processor Interface:
Figure 7 shows a typical reset and initialization sequence. The
user must pulse the /MR pin low to reset the device. To load
the Control Register from the data bus, the /LDCW pin is
pulsed low while the desired control data is applied on the data
bus.
Figure 5 shows a typical transmitter loading sequence. It
begins with the transmitter completing transmission of the
previous data block. The TXR flag goes HI to notify the user
that data may be loaded into the buffer. The user sets ENTX to
LO to disable the Transmitter and proceeds to load a total of
six ARINC words into the buffer. (Note that up to eight words
could have been loaded). The user then enables the transmitter
by setting ENTX to a logic "1" and the transmitter begins it's
sequence of sending out data words. Although not shown in the
figure, the transmitter loading sequence can be interrupted by
receiver reading cycle with no interference between the two
operations.
Figure 6 shows a typical receiver reading sequence. Both
receivers notify the user of valid data ready by setting their
respective /DRn lines to logic "0". The user responds by first
reading the two data words from Receiver 1 and then from
Receiver 2. The SEL line is normally a system address line and
may assume any state, but must be valid when the /OEn line is
pulsed low.
© 2006 Device Engineering Inc. Page 8 of 17 DS-MW-01016-01 Rev D
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Figure 5: Typical Transmitter Load Sequence
Figure 6: Typical Receiver Read Sequence
Transmitter Ready
(TXR)
Enable Transmitter
(ENTX)
Load Word 1
(/LD1)
Load Word 2
(/LD2)
Data Bus
(D0 - D15)
Transmitter Data
(DO(A)/DO(B))
(W1) (W2) (W1) (W2) (W1) (W2) (W1) (W2) (W1) (W2) (W1) (W2)
Word 8
TX Starts First Word
User Enables TX
User Loads 6th Word
User Loads 5th Word
User Loads 4th Word
User Loads 3rd Word
User Loads 2nd Word
TXR low indicates TX not Empty
User Loads 1st Word
User Disables TX
TXR HIGH indicates TX is empty and
user may load data
TXR transmitts last word from buffer
Word 1
Data Ready 1
(/DR1)
Data Ready 2
(/DR2)
Data Enable 1
(/OE1)
Data Enable 2
(/OE2)
Receiver Select
(SEL)
XXXXXXXXXXXXXXXX XXX XXX
XXXXXXX XXXXXXXXXXXXXXXXXXXXXXX
Word 1 Word 2 Word 1 Word 2
Data Bus (out)
(D0 - D15)
DR2 HIGH indicates
RX2 is empty
User Reads Word 1 and
Word 2 from RX2
DR1 HIGH indicates RX1
is Empty
User reads Word 1 and Word
2 from RX1
DR2 LOW indicates reception
of valid data from RX2
DR1 LOW indicates RX1 is
empty
© 2006 Device Engineering Inc. Page 9 of 17 DS-MW-01016-01 Rev D
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Valid Data
MR
LDCW
D[15:0]
tMR tPWLD
tSDW tHDW
Figure 7: Reset and Initialization Sequence
tHSEL
tDOEDR
tOEOE
tDDROE tPWOE
tSSEL
ARINC DATA BIT 31 BIT 32
Word 1 Valid Word 2 Valid
tDDRN
/DR1, /DR2
/OE1, /OE2
SEL
D[15:0]
tDDR tDTS
Figure 8: Receiver Read Operation and Timing
Figure 9: Transmitter Write Operation and Timing
© 2006 Device Engineering Inc. Page 10 of 17 DS-MW-01016-01 Rev D
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Figure 10: Transmitter Timing Diagram
Table 7: DEI 1016 AC Timing Characteristics
PARAMETER SYMBOL
Data Rate
100kbps
Data Rate
12.5kbps
MIN MAX MIN MAX UNITS
WRITE CYCLE TIMING
/LD1, /LD2 and /LDCW Pulse Width tPWLD 130 130 ns
Delay between consecutive Load Pulses tLL 0 0 ns
Data to /LD Set-Up Time tSDW 110 110 ns
Data to /LD Hold Time tHDW 0 0 ns
Delay /LD2 to TXR tDTXR 840 840 ns
READ CYCLE TIMING
Delay, Bit 32/25 in to /DR tDDRN 16 128
µs
Delay, /DRn to /OEn tDDROE 0 0 ns
/OE1 or /OE2 Pulse Width tPWOE 200 200 ns
Delay between consecutive /OE pulses tOEOE 50 50 ns
Delay, 2nd /OE to /DRn tDOEDR 200 200 ns
SEL to /OE to valid data tSSEL 20 20 ns
SEL to /OE hold time tHSEL 20 20 ns
Delay /OE to valid data tDDR 200 200 ns
SEL to /OE to data HI-Z tDTS 10 50 10 50 ns
TRANSMITTER TIMING
Delay, ENTX to output data1 tDTD 25 200
µs
Output Data null time tNUL 4.95 5.05 39.6 40.4 µs
Output data bit time tBIT 4.95 5.05 39.6 40.4
µs
Data skew between TXCK () and DO () tSKTX 0
±50 0 ±50 ns
Data word gap time tGAP 39.6 40.4 316.8 323.2
µs
Delay, end of TX Word to TXR tDTXR 50 50 ns
Delay, TXR to ENTX tDENTX 0 0 ns
1. This applies only when there has been a 4-bit null since the end of the transmitted data.
© 2006 Device Engineering Inc. Page 11 of 17 DS-MW-01016-01 Rev D
1/15/07
Figure 11: Terminal Connections
Serial Interface:
The DEI1016 consists of two receive channels and one
transmit channel. Each receive channel operates
independently of each other and the transmitter. The
receive data is asynchronous to the transmitter data and
can also be at a different data rate than the transmitter.
Transmitter
The transmitter clock is free running and in phase with
the transmitter data. The transmitter data (DO(A) and
DO(B)) are TTL level signals. There are always at least
4 null bits between data words. An external ARINC line
driver is required to interface the transmitter to the
ARINC serial data bus. See ARINC 429 LINE
DRIVERS below.
Receiver
The receiver signals (DI(A) and DI(B)) are differential, bipolar,
return-to-zero logic signals. The ARINC channels can be
connected directly to the receiver with no external components.
ARINC 429 Line Driver
Device Engineering offers a complete line of ARINC line
drivers ICs that support the ARINC 429, 571, and 575
standards. Refer to DEI website at: http://www.deiaz.com.
34
35
36
37
38
39
40
40L DIP
Plastic
or
Ceramic
33
/LDCW
N/C
N/C
1MCK
TXCK
/MR
/DBCEN
26
27
28
29
30
31
32
25
D1
D0
/LD1
/LD2
TXR
DO(A)
DO(B)
24
23
D3
7
6
5
4
3
2
1
8
15
14
13
12
11
10
9
16
17
18
/DR2
/DR1
DI2(B)
DI2(A)
DI1(B)
DI1(A)
D4
D11
D12
D13
D14
D15
/OE2
/OE1
D9
19
20
V
DD
D7 22
21
D5
GND
SEL
D10
D8
D6
D2
ENTX
32144
35
34
33
32
31
30
29
24232221201918
17
16
15
14
13
12
11
65 4
DI1(B)
DI1(A)
/DBCEN
DI2(A)
DI2(B)
GND
N/C N/C
D10
D9
D8
D7
D6
DO(B)
DO(A)
D1
D0
/LD1
/OE1
D15
D14
D12
D11
/OE2
TXR
/LD2
D13
44L
PLCC
&
CLCC
N/C
N/C
/LDCW
ENTX
VDD
TXCK
1MCK
N/C
10
9
8
7
N/C
/DR2
SEL
/DR1
28272625
D2
D5
D4
D3
39
38
37
36
43 42 41 40
/MR
41 40 39 38
29
28
27
26
25
24
23
18171615141312
11
10
9
8
7
6
5
44 43 42
DI1(B)
DI1(A)
/DBCEN
DI2(A)
DI2(B)
GND
N/C N/C
D10
D9
D8
D7
D6
DO(B)
DO(A)
D1
D0
/LD1
/OE1
D15
D14
D12
D11
/OE2
TXR
/LD2
D13
44L
PQFP
&
MLPQ
N/C
N/C
/LDCW
ENTX
VDD
TXCK
1MCK
N/C
4
3
2
1
N/C
/DR2
SEL
/DR1
22212019
D2
D5
D4
D3
33
32
31
30
37 36 35 34
/MR
© 2006 Device Engineering Inc. Page 12 of 17 DS-MW-01016-01 Rev D
1/15/07
f
Figure 12 Typical Transceiver/Line Driver Interconnect Configuration
Table 8: DEI1016 Ordering Information
DEI PART NUMBER (2) MARKING (1) PACKAGE
See Table 10
TEMP RANGE PROCESSING
See Table 9
DEI1016
DEI1016
40 SBDIP
-55 / +125 °C CERAMIC BURN-IN
100% TEST
DEI1016-DMB DEI1016-DMB
40 SBDIP -55 / +125 °C CERAMIC BURN-IN
SAMPLE TEST
DEI1016A DEI1016A
44 PQFP -55 / +85 °C PLASTIC STANDARD
DEI1016A-G DEI1016A
E3 (1)
44 PQFP G -55 / +85 °C PLASTIC STANDARD
DEI1016B DEI1016B 44 PLCC -55 / +85 °C PLASTIC STANDARD
DEI1016B-G DEI1016B
E3 (1)
44 PLCC G -55 / +85 °C PLASTIC STANDARD
DEI1016C DEI1016C 40 PDIP -55 / +85 °C PLASTIC STANDARD
DEI1016-QMS DEI1016-QMS 44 PQFP -55 / +125 °C PLASTIC STANDARD
DEI1016-QMS -G DEI1016-QMS
E3 (1)
44 PQFP G -55 / +125 °C PLASTIC STANDARD
DEI1016-PMS DEI1016-PMS 44 PLCC -55 / +125 °C PLASTIC STANDARD
DEI1016-PMS-G DEI1016-PMS
E3 (1)
44 PLCC G -55 / +125 °C PLASTIC STANDARD
DEI1016-EES DEI1016-EES 44 CLCC -55 / +85 °C CERAMIC
SAMPLE TEST
DEI1016-EMS DEI1016-EMS 44 CLCC -55 / +125 °C CERAMIC
SAMPLE TEST
DEI1016-EMB DEI1016-EMB 44 CLCC -55 / +125 °C CERAMIC BURN-IN
© 2006 Device Engineering Inc. Page 13 of 17 DS-MW-01016-01 Rev D
1/15/07
Table 8: DEI1016 Ordering Information
DEI PART NUMBER (2) MARKING (1) PACKAGE
See Table 10
TEMP RANGE PROCESSING
See Table 9
SAMPLE TEST
DEI1016-MES
DEI1016-MES-G
DEI1016-MES
E4 (1)
44 MLPQ G -55 / +85 °C PLASTIC STANDARD
DEI1016-MMS
DEI1016-MMS-G
DEI1016-MMS
E4 (1)
44 MLPQ G -55 / +125 °C PLASTIC STANDARD
otes:
1. All packages marked with Lot Code and Date Code. “E3” or “E4” after Date Code denotes Pb Free category.
2. Suffix legend: -XYZ: X = package code, Y = temperature range code, Z = process flow code
Table 9: DEI1016 Screening Process
PLASTIC
STANDARD
-xxS
CERAMIC
SAMPLE TEST
-xxS
CERAMIC
BURN-IN
100% TEST
DEI1016
CERAMIC
BURN-IN
SAMPLE TEST
-xxB
WAFER PROBE
ELECTRICAL TEST
100% HOT
@ +125 °C
100% HOT
@ +125 °C
100% HOT
@ +125 °C
100%
HOT @ +125 °C
THERMAL CYCLE
MIL-STD-883B M1010.4
Condition B
NO 10 Cycles 10 Cycles 10 Cycles
GROSS & FINE LEAK NO YES YES YES
BURN IN
MIL-STD-883B M1015
Condition A
NO NO 96 hrs @ +125 °C 96 hrs @ +125 °C
ELECTRICAL TEST:
ROOM TEMPERATURE 100% 100% 100% 100%
HIGH TEMPERATURE 0.1% AOQL @
+125 °C (MilTemp)
0.1% AOQL @
>+85 °C (ExtTemp)
0.1% AOQL @
+125 °C (MilTemp)
0.1% AOQL @
>+85 °C (ExtTemp)
100% @ +125 °C
(Mil Temp)
0.1% AOQL @
+125 °C (MilTemp)
LOW TEMPERATURE 0.1% AOQL @
-55°C
0.1% AOQL @
-55°C
100% @ -55°C 0.1% AOQL @
-55°C
N
ote: AOQL samples use a Zero Acceptance Number sampling plan per AS9100
© 2006 Device Engineering Inc. Page 14 of 17 DS-MW-01016-01 Rev D
1/15/07
Table 10: DEI1016 Package Characteristics
PACKAGE TYPE PACKAGE
REF
THERMAL
RESIST.
θJC / θJA
(ºC/W)
JEDEC MOISTURE
SENSITIVITY LEVEL
& PEAK BODY TEMP
LEAD FINISH
MATERIAL /
JEDEC Pb-Free
CODE
Pb Free
DESIGNATION
JEDEC
MO
40L CERAMIC SB
DIP 40 SBDIP 15 / 55 HERMETIC Au
e4
Pb Free solder
terminals
MS-015-
CE
40L PLASTIC DIP 40 PDIP 25 / 47 THRU HOLE SnPb Not Pb-free MS-011-
AC
44L PLASTIC QUAD
FLAT PACK 44 PQFP 21 / 65 MSL 2
220ºC SnPb Not Pb-free M0-112-
AA-1
44L PLASTIC QUAD
FLAT PACK, GREEN 44 PQFP G 21 / 65 MSL 3
260ºC
Matte Sn
e3
RoHS Compliant M0-112-
AA-1
44L PLASTIC CHIP
CARRIER
44 PLCC 21 / 46 MSL 3
220ºC SnPb Not Pb-free MS-018-
AC
44L PLASTIC CHIP
CARRIER, GREEN
44 PLCC
G 21 / 46 MSL 2
260ºC
Matte Sn
e3
RoHS Compliant MS-018-
AC
44L CERAMIC
LEADLESS CHIP
CARRIER
44 CLCC - / - HERMETIC Au
e4
Pb Free solder
terminals
-
44L MICRO
LEADFRAME
QUAD, GREEN
44 MLPQ
G - / 30 MSL 3
260ºC
NiPdAu
e4
RoHS Compliant -
© 2006 Device Engineering Inc. Page 15 of 17 DS-MW-01016-01 Rev D
1/15/07
Figure 13: 40 Lead Ceramic Side Braze DIP Mechanical Outline (40 SBDIP)
Figure 14: 44 Lead 13.90mm PQFP Mechanical Outline (44 PQFP)
0.100 TYP
0.180 MAX
0.040 - 0.065
0.015 - .020
0.125 - .200
2.060 MAX
0.008 - .012
.590 - .615
.575 - .605
Lead 1 ID
1
1
1
N
2
NOTES
1. ALL DIMENSIONS IN MILLIMETERS
2. DIMENSIONS SHOWN IN CHART ARE NOMINAL
WITH TOLERANCES AS INDICATED
AB
D
AA
SDS
A-BC
M
ddd
0.17 MAX.
6DP4° STANDOFF
0.20 RAD. TYP.
L
A
.25
b
O
0.30 RAD. TYP.
A
1
3. FOOT LENGTH "L" IS MEASURED AT GAGE PLANE
AT 0.25 ABOVE THE SEATING PLANE.
A
1
10D TYP.
10D TYP.
e
BASIC
P.25
P.25
P.10
P.10
MAX.
O
E
D
1
1
A
A
2
1
b
e
L
E
D
A
TOLS. LEADS
DIMS.
MIN./MAX.
P.05
.25/.50
2.45
44L
10.00
10.00
.88
2.00
.80
.30
0D-7D
13.90
13.90
3.90 mm
ddd .12 NOM.
ccc
MAX.
.10
C
SEATING
PLANE
C
ccc
LEAD COPLANARIT
Y
+.10/-.05
+.15/-.10
FOOTPRINT (BODY +)
N
1
ANOTHER VARIATION OF PIN 1 VISUAL AID
E
D
D
E
1
© 2006 Device Engineering Inc. Page 16 of 17 DS-MW-01016-01 Rev D
1/15/07
Figure 15: 44 Lead PLCC Mechanical Outline
Figure 16: 40 Pin Plastic DIP Mechanical Outline (40 PDIP)
© 2006 Device Engineering Inc. Page 17 of 17 DS-MW-01016-01 Rev D
1/15/07
Figure 17: 44 Lead CLCC Mechanical Outline (44 CLCC)
8.00
BSC
8.00
BSC
12
43
44
1.00
0.80 0.203 REF
0.05 MAX
6.75
6.55
Exp Pad
6.75
6.55
Pin 1 Index
"mouse bite"
1
2
0.650
BSC 0.375
0.275
0.350
0.450
43
Dimensions in mm
Figure 18: 44 Lead 8X8 MLPQ Mechanical Outline (44 MLPQ)
DEI reserves the right to make changes to any products or specifications herein. DEI makes no warranty, representation, or guarantee regarding
suitability of its products for any particular purpose.