SCOPE: MICROPROCESSOR MONITOR
Device Type Generic Number SMD Number
01 MAX1232MJA/883B 5962-9451401MPA
01 MAX1232MLP/883B 5962-9451401M2C
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
MAXIM SMD
JA P GDIP1-T8 or CDIP2-T8 8 LEAD CERDIP J8
LP 2 CQCC1-N20 20 Pin Ceramic LCC L20
Ab so lute Max imum Ratings
Supply Voltage to Ground (VCC to GND) ................................................... -0.3V to +6V
Maximum Current to any Terminal ......................................................…............... 10mA
__ ______
Input Voltage to ST, TOL, PB RST, TD .......................................... -0.3V to (VCC+0.3V)
Lead Temperature (soldering, 10 seconds) ................................................................ +300°C
Storage Temperature ..........................................................................…..... -65°C to +160 °C
Continuous Power Dissipation ...............................................................................TA=+70°C
8 lead CERDIP(derate 8.0mW/°C above +70°C) ..................................................... 640mW
20 lead LCC(derate 9.1mW/°C above +70°C) ......................................................... 727mW
Junct ion Temperature TJ ....................................................................................…. +150°C
Thermal Resista nce, J unction to Case, ΘJC:
Case Outline 8 lead CERDIP .................................................................... 55°C/W
Case Outline 20 lead LCC ........................................................................ 20°C/W
Thermal Resistance, J unction to Ambient, ΘJA:
Case Outline 8 lead CERDIP .................................................................. 125°C/W
Case Outline 20 lead LCC ...................................................................... 110°C/W
Recommended Operating Conditions.
Ambient Operating Range (TA) .............................................................. -55°C to +125°C
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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TABLE 1 ELECTRICAL TESTS
PARAMETER Symbol CONDITIONS
-55 °C <=TA<= +125°C
VCC=+4.5V to +5.5V
Unless otherwise specified
Group A
Subgroup Device
type Limits
Min
1/
Limits
Max
1/
Units
High Level Input
Voltage,
__ ______
ST and PBRST
VIH NOTE 2 1,2,3 01 2.0 V
Lo w Leve l I n pu t
Voltage,
__ ______
ST and PBRST
VIL 1,2,3 01 0.8 V
Input Leakage
Current TOL and
__
ST p i ns
IIL 1,2,3 01 -1.0 1.0 µA
High Output
Current RST pin IOH VOH=2.4V 1,2,3 01 -1.0 mA
Low Output ___
Current RST
and RST pins
IOL VOL=0.4V 1,2,3 01 2.0 mA
Operating Current ICC Measured with outputs open 1,2,3 01 200 µA
Supply Current,
5% trip-point VCCTP All voltages referenced to ground,
TOL=VCC
1,2,3 01 4.50 4.74 V
Supply Current,
10% trip-point VCCTP All voltages referenced t o ground,
TOL=VCC
1,2,3 01 4.25 4.49 V
Pushbu tton Re set
Input tPB NOTE 3 9,10,11 01 20 ms
Pushbu tton Re set
Delay tPBD NOTE 4 9,10,11 01 1.0 20 ms
Reset Active Time tRST 9,10,11 01 250 1000 ms
__
ST Pulse Width tPW 9,10,11 01 75 ns
__
ST Timeou t Period tTD
TD pin=0V
TD pin=open
TD pin=VCC
9,10,11 01 62.5
250
500
250
1000
2000 ms
Supply___Voltage
Detect RST Low to
RST High
tRPD VCC falling 9,10,11 01 100 ns
Supply___Voltage
Detect RST Open
to RST Low
tRPU VCC rising, tR≤5µs9,10,11 01 250 1000 ms
NOTE 1: The algebraic convention, whereby the most negative value is a minimum and the most positive is a
maximum, is used in this table. Negative current shall be defined as conventional flow out of a device
terminal. ______
NOTE 2: The pushbutton reset input (PB RST)pin is internally pulled up to VCC with an internal impedance
of 40kΩ. ______
NOTE 3: The pushbutton reset inp ut (P B RST)pin must be held lo w for a minimum of 20ms to guarantee reset.
NOTE 4: For Subgroups 10 and 11, if not tested, shall be guaranteed to the limits specified in Table 1.
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Package ORDERING INFORMATION: SMD
8 pin CERDIP MAX1232MJA/883B 5962-9451401MPA
20 pin LCC MAX1232MLP/883B 5962-9451401M2C
TERMINAL CONNECTIONS AND FUNCTION:
NAME FUNCTION J8 20LCC
______
PB RST Pushbutton Reset Input. A debounced active-lo w input
that ignores pulses less than 1ms in duration and is
guaranteed to recognize inputs of 20ms or greater.
12
TD Time Delay Set. The watchdog timebase select input
(tTD=150ms for TD=0V, tTD=600ms for
TD=open, tTD=1.2 sec. for TD=VCC.
25
TOL Tolerance Input. Connect to GND for 5% tolerance or
to VCC for 10% tolerance. 37
GND Ground. 4 10
RST Reset Output (Active High) - goes active:
1. If VCC falls below the selected reset voltage
threshold.______
2. __ If PB RST is forced low.
3. If ST is not strobed within the minimum timeout
period.
4, During power-up
512
___
RST Reset Output (Active Low, Open Drain) - see RST. 6 15
__
ST Strobe Input. Input for watchdog timer. 7 17
VCC The +5V Power-Supply Input 8 20
NC No connect 1,3,4,6,8,9
11,13,14
16,18,19
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QUALITY ASSURAN CE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004 1
Final Electrical Parameters
Method 5005 1*, 2, 3, 9
Group A Test Requirements
Method 5005 1, 2, 3, 9, 10, 11
Group C and D End-Point Electrical Parameters
Method 5005 1
* PDA applies to Subgroup 1 only.
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