ees AT 2811256 Features Fast Read Access Time - 70 ns Automatic Page Write Operation Internal Address and Data Latches for 64-Bytes Internal Control Timer Fast Write Cycle Times Page Write Cycle Time: 3 ms or 10 ms Maximum 1 to 64-Byte Page Write Operation Low Power Dissipation 80 mA Active Current 3 mA Standby Current Hardware and Software Data Protection DATA Polling for End of Write Detection High Reliability CMOS Technology Endurance: 10 or 10 Cycles Data Retention: 10 Years Single 5V + 10% Supply CMOS and TTL Compatible Inputs and Outputs JEDEC Approved Byte-Wide Pinout Full Military, Commercial, and Industrial Temperature Ranges Description The AT28HC256 is a high-performance Electrically Erasable and Programmable R ead Only Memory. Its 256K of memory is organized as 32,768 words by 8 bits. Manufactured with Atmels advanced nonvolatile CMOS technology, the AT28HC256 offers access times to 70 ns with power dissipation of just 440 mW. When the AT28HC256 is deselected, the standby current is less than 5 mA. : . : continued, Pin Configurations ( ) Pin Name Function TSOP AO-A14 Addresses Top View cE Chip Enable we p an OF >! 28 7 AY og OE Output Enable aa FT 8 6 35 b 7 Vo6 , WE Al3 6 5 24 23 YOs vos WE Write Enable ave Dy 22 F403 Np OO - VO7 Data Inputs/Outputs a7 4 40 19 vo NC No Connect AS 12 WE YOO no AS 13 16 Al pc Don't Connect aa 14 ce CERDIP, PDIP, PGA FLATPACK LCC, PLCC Top View Top View Top View AT A14VCC A13 4/3 4 | a7 | 26 aac as | a7 | a4! WE | ats ai2t/2 A\2 DG WE 5 | 2 | 28 24 | 25 a7 | 3 AS | A12| VCC: Ag | AB AB | 4 7 | 6 22 | 23 le AB | A4 | OE ant a3 17 9 | 8 20 21 A2'| 8 AL | AQ TE | A10 At | 9 pee ELAN 14: 10) 14] 16 | 19 Ao | O0 | AO | GND) VO4 | 107 | oo 12143] 15 | 17 | 18 toe 14151617181920 vO1 | YO2| VO3] 1/05 | VOE GND VO's 12 DC345 GND Note: PLCC package pins 1 and 17 are DON'T CONNECT. AIMmEt 256 (32K x 8) High Speed CMOS EPROM 0007F 2-279AIMEL Description (Continued) The AT28HC256 is accessed like a Static RAM for the read or write cycle without the need for external compo- nents. The device contains a 64-byte page register to al- low writing of up to 64-bytes simultaneously. During a write cycle, the address and 1 to 64-bytes of data are in- ternally latched, freeing the addresses and data bus for other operations. Following the initiation of a write cycle, the device will automatically write the latched data using an internal control timer. The end of a write cycle can be detected by DATA polling of /O7. Once the end of a write cycle has been detected a new access for a read or write can begin. Block Diagram Atmel's 28HC256 has additional features to ensure high quality and manufacturability. The device utilizes internal error correction for extended endurance and improved data retention characteristics. An optional software data protection mechanism is available to guard against inad- vertent writes. The device also includes an extra 64-bytes of E2PROM for device identification or tracking. Veco > DATA INPUTS/OUTPUTS GND > YOO - VO7- AAepaats OE --> > OF Tl OE, CE AND WE DATA LATCH LOGIC _| INPUT/OUTPUT cE -- > _ BUFFERS *} Y DECODER > Y-GATING ADDRESS | + ~ INPUTS | CELL MATRIX | X DECODER Long IDENTIFICATION Absolute Maximum Ratings Temperature Under Bias..........0.0... -55C to +125C Storage Temperature... -65C to +150C Ail input Voltages (including NC Pins) with Respect to Ground ..............0. -0.6V to +6.25V All Output Voltages with Respect to Ground............. -0.6V to Voc + 0.6V Voltage on OE and AQ with Respect to Ground ........... ee -0.6V to +13.5V 2-280 NOTICE: Stresses beyond those listed under Absolute Maxi- mum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indi- cated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. AT28HC256 ques A | St C256 Device Operation READ: The AT28HC256 is accessed like a Static RAM. When CE and OE are low and WE is high, the data stored at the memory location determined by the address pins is asserted on the outputs. The_outputs are put in the high impedance state when either CE or OE is high. This dual- line control gives designers flexibility in preventing bus contention in their system. BYTE WRITE: A low pulse on the WE or CE input with CE or WE low (respectively) and OE high initiates a write cy- cle. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of CE or WE. Once a byte write has been started it will automatically time itself to completion. Once a programming operation has been initiated and for the duration of twc, a read operation will effectively be a poll- ing operation. PAGE WRITE: The page write operation of the AT28HC256 allows 1 to 64-bytes of data to be written into the device during a single internal programming period. A page write operation is initiated in the same manner as a byte write; the first byte written can then be followed by 1 to 63 additional bytes. Each successive byte must be writ- ten within 150 Ls (tac) of the previous byte. If the tatc limit is exceeded the AT28C256 will cease accepting data and commence the internal programming operation. All bytes during a page write operation must reside on the same page as defined by the state of the A6 - A14 inputs. That is, for each WE high to low transition during the page write operation, A6 - A14 must be the same. The AO to AS inputs are used to specify which bytes within the page are to be written. The bytes may be loaded in any order and may be altered within the same load period. Only bytes which are specified for writing will be written; unnecessary cycling of other bytes within the page does not occur, DATA POLLING: The AT28HC256 features DATA Polling to indicate the end of a write cycle. During a byte or page write cycle an attempted read of the last byte written will result in the complement of the written data to be pre- sented on 1/07. Once the write cycle has been completed, true data is valid on all outputs, and the next write cycle may begin. DATA Polling may begin at anytime during the write cycle. TOGGLE BIT: In addition to DATA Polling the AT28HC256 provides another method for determining the end of a write cycle. During the write operation, succes- sive attempts to read data from the device will result in VO6 toggling between one and zero. Once the write has completed, 1/06 will stop toggling and valid data will be read. Testing the toggle bit may begin at any time during the write cycle. ANMEL DATA PROTECTION: If precautions are not taken, inad- vertent writes to any 5-volt-only nonvolatile memory may occur during transition of the host system power supply. Atmel has incorporated both hardware and software fea- tures that will protect the memory against inadvertent writes. HARDWARE PROTECTION: Hardware features protect against inadvertent writes to the AT28HC256 in the follow- ing ways: (a) Vcc sense - if Vcc is below 3.8V (typical) the write function is inhibited; (b) Vcc power-on delay - once Vcc has reached 3.8V the device will automatically time out 5 ms typical) before allowing a write: (c) write inhibit - holding any one of OE low, CE high or WE high inhibits write cycles; (d) noise filter - pulses of less than 15 ns (typi- cal) on the WE or CE inputs will not initiate a write cycle. SOFTWARE DATA PROTECTION: A software controlled data protection feature has been implemented on the AT28HC256. When enabled, the software data protection (SOP), will prevent inadvertent writes. The SDP feature may be enabled or disabled by the user; the AT28HC256 is shipped from Atmel with SDP disabled. SDP is enabled by the host system issuing a series of three write commands; three specific bytes of data are written to three specific addresses (refer to Software Data Protection Algorithm). After writing the 3-byte command sequence and after twc the entire AT28HC256 will be pro- tected against inadvertent write operations. It should be noted, that once protected the host may still perform a byte or page write to the AT28HC256. This is done by pre- ceding the data to be written by the same 3-byte command sequence. Once set, SDP will remain active unless the disable com- mand sequence is issued. Power transitions do not dis- able SDP and SDP will protect the AT28HC256 during power-up and power-down conditions. All command se- quences must conform to the page write timing specifica- tions. It should also be noted that the data in the enable and disable command sequences is not written to the de- vice and the memory addresses used in the sequence may be written with data in either a byte or page write op- eration. After setting SDP, any attempt to write to the device with- out the three byte command sequence will start the inter- nal write timers. No data will be written to the device; how- ever, for the duration of twc, read operations will effec- tively be polling operations. (continued) 2-281AIMEL Device Operation (Continued) DEVICE IDENTIFICATION: An extra 64-bytes of E2PROM memory are available to the user for device identification. By raising A9 to 12V + 0.5V and using ad- dress locations 7FCOH to 7FFFH the additional bytes may be written to or read from in the same manner as the regu- lar memory array. DC and AC Operating Range OPTIONAL CHIP ERASE MODE: The entire device can be erased using a 6-byte software code. Please see Soft- ware Chip Erase application note for details. AT28HC256-70 AT28HC256-90 AT28HC256-12 : Com. ac - 70C oc - 70C 0c - 70C Soreareture (Case) 104: -40C - 85C -40C - 85C -40C - 85C Mil. -55C - 125C -55C - 125C Vcc Power Supply 5V + 10% 5V+10% 5V+10% Operating Modes Mode CE OE WE vO Read Vin Vit Vin Dout Write (2) Vib Vin VIL Din StandbyMWrite Inhibit Vie x x High Z Write Inhibit x x VIH Write inhibit x Vit X Output Disable xX Vin Xx High Z Chip Erase Vit Vy Vie High Z Notes: 1. X can be Vit or Vin. 3. Vu = 12.0V + 0.5V. 2. Refer to AC Programming Waveforms. DC Characteristics Symbol Parameter Condition Min Max Units qui Input Load Current Vin = OV to Vcc + 1V 10 pA lLo Output Leakage Current Vio = OV to Voc 10 pA Isat Vcc Standby Current TTL CE =2.0V to Voc + 1V ATEBHC256-90, 12 3__mA AT28HC256-70 60 mA Isp2 Vcc Standby Current CMOS CE =-3.0V to Vcc + 1V AT28HC256-90, -12 300 LA loc Vcc Active Current f = 5 MHz; louT =O mA 80 mA VIL Input Low Voltage 0.8 Vv Vin Input High Voltage 2.0 Vv VoL Output Low Voltage lo. = 6.0 mA 45 Vv VoH Output High Voltage loH = -4 mA 2.4 Vv 2-282 AT28HC256 equmms AT OSH C256 AC Read Characteristics AT28HC256-70 AT28C256-90 AT28HC256-12 Symbol Parameter Min Max Min Max Min Max Units tacc Address to Output Delay 70 90 120 ns tee) | CE to Output Delay 70 90 120 ns toe @) | OE to Output Delay 0 35 0 40 0 50 ns tor 84) | CE or OE to Output Float 0 35 0 40 0 50 ns Output Hold from OE, CE or toH fags whichever occurred 0 0 0 ns AC Read Waveforms 2: *: ADDRESS <[__ ADDRESS VALID CE tCE tOE -> OE tOH > i tacc > HIGH Z OUTPUT G OUTPUT VALID Notes: 1. CE may be delayed up to tacc - tce after the address 3. tpg is specified from OE or CE whichever occurs first transition without impact on tacc. (CL = 5 pF). 2. OE may be delayed up to tce - toe after the falling 4. This parameter is characterized and is not 100% tested. edge of CE without impact on tce or by tacc - toe after an address change without impact on tacc. Input Test Waveforms and Output Test Load Measurement Level 5.0V 3.0V AC AC 1.8K DRIVING MEASUREMENT PN LEVELS LEVEL 0.0V 100 pF tr, tk< 5ns 13K L , Pin Capacitance (f = 1 MHz, T = 25C) Typ Max Units Conditions Cin 4 6 pF Vin = OV CoutT 8 12 pF VouT = 0V Note: 1. This parameter is characterized and is not 100% tested. ANMEL 228AC Write Characteristics Symbol Parameter Min Max Units tas, toes Address, OE Set-up Time 0 ns taH Address Hold Time 50 ns tcs Chip Select Set-up Time 0 ns tcH Chip Select Hold Time 0 ns twe Write Pulse Width (WE or CE) 100 ns tos Data Set-up Time 50 ns tor, toEH Data, OE Hold Time 0 ns tov Time to Data Valid NR") Note: 1. NR =No Restriction AC Write Waveforms WE Controlled OE _ oe ; tOES tOEH woos > DTP tAS | .tAH LL ce O~~ KK. tCH ~ oo oN _ Mtes7 : WE ee K x