6.07
MARCH 2000
DSC-2942/7
1
©2000 Integrated Device Technology, Inc.
I/O
Control
Address
Decoder MEMORY
ARRAY
ARBITRATION
INTERRUPT
SEMAPHORE
LOGIC
Address
Decoder
I/O
Control
R/WL
CEL
OEL
BUSYL
A13L
A0L
2942 drw 01
I/O0L-I/O
7L
CEL
OEL
R/WL
SEML
INTLM/S
BUSYR
I/O0R-I/O7R
A13R
A0R
SEMR
INTR
CER
OER
(2)
(1,2) (1,2)
(2)
R/WR
CER
OER
14
14
R/WR
,
IDT70V06S/L
HIGH-SPEED 3.3V
16K x 8 DUAL-PORT
STATIC RAM
Features
True Dual-Ported memory cells which allow simultaneous
reads of the same memory location
High-speed access
Commercial: 15/20/25/35/55ns (max.)
Industrial: 20/25/35/55ns (max.)
Low-power operation
IDT70V06S
Active: 400mW (typ.)
Standby: 3.3mW (typ.)
IDT70V06L
Active: 380mW (typ.)
Standby: 660mW (typ.)
IDT70V06 easily expands data bus width to 16 bits or more
using the Master/Slave select when cascading more than
one device
M/S = VIH for BUSY output flag on Master
M/S = VIL for BUSY input on Slave
Interrupt Flag
On-chip port arbitration logic
Full on-chip hardware support of semaphore signaling
between ports
Fully asynchronous operation from either port
Battery backup operation—2V data retention
TTL-compatible, single 3.3V (±0.3V) power supply
Available in 68-pin PGA and PLCC, and a 64-pin TQFP
Industrial temperature range (-40°C to +85°C) is available
for selected speeds
Functional Block Diagram
NOTES:
1. (MASTER): BUSY is output; (SLAVE): BUSY is input.
2. BUSY outputs and INT outputs are non-tri-stated push-pull.
2
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
2942 drw 02
12
13
14
15
16
17
18
INDEX
19
20
21
22
98765432168676665
27 28 29 30 31 32 33 34 35 36 37 38 39
V
CC
VCC
I/O1R
I/O2R
I/O3R
I/O4R
INTL
GND
A4L
A3L
A2L
A1L
A0L
A3R
A0R
A1R
A2R
I/O2L A5L
R/
WL
11
10
M/S
23
24
25
26 40 41 42 43
58
57
56
55
54
53
52
51
50
49
48
59
60
47
46
45
44
64 63 62 61
I/O3L
GND
I/O0R
VCC
A4R
BUSYL
GND
BUSYR
INTR
A
12R
I/O
7R
N/C
GND
OER
R/
WR
SEMR
CER
OEL
SEML
CEL
N/C
I/O
0L
I/O
1L
IDT70V06J
J68-1(4)
68-Pin PLCC
Top View(5)
I/O4L
I/O5L
I/O6L
I/O7L
I/O5R
I/O6R
N/C
A
12L
N/C
A
11R
A
10R
A
9R
A
8R
A
7R
A
6R
A
5R
A
11L
A
10L
A
9L
A
8L
A
7L
A
6L
A
13R
A
13L
Description
The IDT70V06 is a high-speed 16K x 8 Dual-Port Static RAM. The
IDT70V06 is designed to be used as a stand-alone 128K-bit Dual-Port
Static RAM or as a combination MASTER/SLAVE Dual-Port Static
RAM for 16-bit-or-more word systems. Using the IDT MASTER/
SLAVE Dual-Port Static RAM approach in 16-bit or wider memory
system applications results in full-speed, error-free operation without
the need for additional discrete logic.
This device provides two independent ports with separate control,
address, and I/O pins that permit independent, asynchronous access for
reads or writes to any location in memory. An automatic power down
feature controlled by CE permits the on-chip circuitry of each port to enter
a very low standby power mode.
Fabricated using IDT’s CMOS high-performance technology, these
devices typically operate on only 400mW of power.
The IDT70V06 is packaged in a ceramic 68-pin PGA and PLCC
and a 64-pin thin quad flatpack (TQFP).
Pin Configurations(1,2,3)
NOTES:
1. All VCC pins must be connected to power supply.
2. All GND pins must be connected to ground supply.
3. J68-1 package body is approximately .95 in x .95 in x .17 in
PN-64 package body is approximately 14mm x 14mm x 1.4mm.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part marking.
INDEX
70V06PF
PN-64(4)
64-Pin TQFP
Top View(5)
8
9
10
11
12
13
14
15
16
1
2
3
4
5
6
7
46
45
44
43
42
41
40
39
38
37
36
35
34
47
48
33
17
18
19
20
32
31
30
29
28
27
26
25
24
23
22
21
49
50
51
52
63
62
61
60
59
58
57
56
55
54
53
64
I/O2L
VCC
GND
GND
A4R
BUSYL
BUSYR
INTR
INTL
GND
M/S
OE
L
A5L
I/O1L
R/
W
L
CE
L
SEM
L
VCC
OE
R
CE
R
R/
W
R
SEM
R
A12R
GND
I/O3L
I/O4L
I/O5L
I/O6L
I/O7L
I/O0R
I/O1R
I/O2R
VCC
I/O3R
I/O4R
I/O5R
I/O6R
I/O7R
A11R
A10R
A9R
A8R
A7R
A6R
A5R
A3R
A2R
A1R
A0R
A0L
A1L
A2L
A3L
A4L
A6L
A7L
A8L
A9L
A10L
A11L
A12L
I/O0L
2942 drw 03
A13RA13L
,
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
3
Pin Names
NOTES:
1. All VCC pins must be connected to power supply.
2. All GND pins must be connected to ground supply.
3. Package body is approximately 1.18 in x 1.18 in x .16 in.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part marking.
Pin Configurations(1,2,3) (con't.)
2942drw04
51 50 48 46 44 42 40 38 36
53
55
57
59
61
63
65
67
68
66
1357911 13 15
20
22
24
26
28
30
32
35
IDT70V06G
G68-1(4)
68-Pin PGA
Top View(5)
ABCDEFGHJKL
47 45 43 41 34
21
23
25
27
29
31
33
2 4 6 8 10 12 14 16
18 19
17
56
58
60
62
64
11
10
09
08
07
06
05
04
03
02
01
52
54
49 39 37
A5L
INTL
N/C
SEMLCEL
VCC
OELR/WL
I/O0L N/C
GND GND
I/O0R
VCC N/C
OERR/WR
SEMRCER
GND BUSYR
BUSYLM/SINT
R
N/C
GND
A1R
INDEX
A4L A2L A0L A3R
A2R A4R A5R
A7R A6R
A9R A8R
A11R A10R
A12R
A0R
A7L A6L A3L A1L
A9L A8L
A11L A10L
A12L
VCC I/O2R I/O3R I/O5R I/O6R
I/O1R I/O4R I/O7R
I/O1L I/O2L I/O4L I/O7L
I/O3L I/O5L I/O6L
A13R
A13L
,
Left Port Right Port Names
CELCERChip Enable
R/WLR/WRRead/ Write Enable
OELOEROutp ut Enable
A0L - A13L A0R - A13R Address
I/O0L - I/ O7L I/O0R - I/ O7R Data Inp ut/ Outp ut
SEMLSEMRSemaphore Enable
INTLINTRInte rrup t F la g
BUSYLBUSYRBusy Flag
M/SMaster or Slave Select
VCC Power
GND Ground
2 9 42 tb l 01
4
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Truth Table I: Non-Contention Read/Write Control
Truth Table II: Semaphore Read/Write Control(1)
NOTE:
1. A0L A13L A0R A13R
NOTE:
1. There are eight semaphore flags written to via I/O0 and read from I/O0 - I/O7. These eight semaphores are addressed by A0 - A2.
Inputs(1) Outputs
Mode
CE R/WOE SEM I/O0-7
H X X H Hi gh-Z De s e le c te d : P ower-Down
LLXHDATA
IN Write to Me mory
LHLHDATA
OUT Read Memory
X X H X High-Z Outputs Disabled
2942 tbl 02
Inputs Outputs
Mode
CE R/WOE SEM I/O0-7
HHLLDATA
OUT Read Data in Semaphore Flag
HXLDATA
IN Write I/ O0 into Semaphore Flag
LXXL ____ Not All owed
2942 tbl 03
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
5
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (VCC = 3.3V ± 0.3V)
Recommended DC Operating
Conditions
Maximum Operating Temperature
and Supply Voltage(1)
Absolute Maximum Ratings(1)
Capacitance (TA = +25°C, f = 1.0MHz)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. VTERM must not exceed Vcc + 0.3V.
NOTE:
1. This is the parameter TA.
NOTES:
1. VIL> -1.5V for pulse width less than 10ns.
2. VTERM must not exceed VCC +0.3V.
NOTES:
1. This parameter is determined by device characterization but is not production
tested.
2. 3dV references the interpolated capacitance when the input and output signals
switch from 0V to 3V or from 3V to 0V.
Symbol Rating Commercial
& Industrial Unit
VTERM(2) Terminal Voltage
with Re s p ec t
to G ND
-0.5 to +4. 6 V
TBIAS Temperature
Und e r B ias -55 to + 125 oC
TSTG Storage
Temperature -55 to +125 oC
IOUT DC Outp u t
Current 50 mA
2942 tbl 04
Grade Amb ient Tem peratur e GND Vcc
Commercial 0OC to + 70OC0V3.3V
+ 0. 3V
Industrial -40OC to + 85OC0V3.3V
+ 0. 3V
2942 tbl 05
Symbol Parameter(1) Conditions Max. Unit
CIN Input Capacitance VIN = 3dV 9 pF
COUT Outp ut Cap acitance VOUT = 3dV 10 pF
2942 tbl 07
Symbol Parameter Min. Typ. Max. Unit
VCC Sup p ly Vo ltag e 3.0 3. 3 3.6 V
GND Ground 0 0 0 V
VIH Inp ut Hi gh Vol tag e 2. 0 ____ VCC+0.3(2) V
VIL Inp ut Lo w Vo ltag e -0. 5(1) ____ 0.8 V
2942 tbl 06
Symbol Parameter Test Conditi ons
70V06S 70V06L
UnitMin. Max. Min. Max.
|ILI| Input Le akag e Current(1) VCC = 3. 6V, VIN = 0V to VCC ___ 10 ___ A
|ILO| Outp ut Le ak age Curre nt VOUT = 0V to VCC ___ 10 ___ A
VOL Outp ut Lo w Voltag e IOL = +4mA ___ 0.4 ___ 0.4 V
VOH Outp ut Hig h Vol tag e IOH = -4mA 2.4 ___ 2.4 ___ V
2942 tbl 08
NOTE:
1. At Vcc < 2.0V input leakages are undefined.
6
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range(1) (VCC = 3.3V ± 0.3V)
NOTES:
1. 'X' in part number indicates power rating (S or L)
2. VCC = 3.3, TA = +25°C.
3. At f = f MAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC, and using AC Test Conditions of input levels of
GND to 3V.
4. f = 0 means no address or control lines change.
70V06X15
Com'l Only 70V06X20
Com'l
& Ind
70V06X25
Com'l
& Ind
Sym bol Param eter Test Conditi on Versio n Typ. (2) Max. Typ.(2) Max. Typ.(2) Max. Unit
ICC Dy nam ic O p e rating
Current
(Both Ports Active)
CE = VIL, Outputs Op en
SEM = VIH
f = fMAX(3)
COM'L S
L150
140 215
185 140
130 200
175 130
125 190
165 mA
IND S
L____
____
____
____ 140
130 225
195 130
125 210
180 mA
ISB1 Stand by Curre nt
(Bo th Po rts - TTL
Le ve l Inp uts)
CER = CEL = VIH
SEMR = SEML = VIH
f = fMAX(3)
COM'L S
L25
20 35
30 20
15 30
25 16
13 30
25 mA
IND S
L____
____
____
____ 20
15 45
40 16
13 45
40 mA
ISB2 Stand by Curre nt
(One Po rt - TTL
Le ve l Inp uts)
CEL or CE
R = VIH
Activ e Po rt Outputs Op en,
f=fMAX(3)
COM'L S
L85
80 120
110 80
75 110
100 75
72 110
95 mA
IND S
L____
____
____
____ 80
75 130
115 75
72 125
110 mA
ISB3 Full Standby Current
(Bo th Po rts -
CM OS L e v e l Inputs )
Bo th P orts CEL and
CER > VCC - 0. 2V,
VIN > VCC - 0. 2V o r
VIN < 0.2V , f = 0(4)
SEMR = SEML > VCC - 0. 2V
COM'L S
L1.0
0.2 5
2.5 1.0
0.2 5
2.5 1.0
0.2 5
2.5 mA
IND S
L____
____
____
____ 1.0
0.2 15
51.0
0.2 15
5mA
ISB4 Full Standby Current
(One Po rt -
CM OS L e v e l Inputs )
One Port CEL or
CER > VCC - 0. 2V
SEMR = SEML > VCC - 0. 2V
VIN > VCC - 0.2V o r VIN < 0.2V
Activ e Po rt Outputs Op en,
f = fMAX(3)
COM'L S
L85
80 125
105 80
75 115
100 75
70 105
90 mA
IND S
L____
____
____
____ 80
75 130
115 75
70 120
105 mA
2942 tbl 09a
70V06X35
Com'l
& Ind
70V06X55
Com'l
& Ind
Sym bol Param eter Test Cond ition Versi on Typ. (2) Max. Typ.(2) Max. Unit
ICC Dy namic Operating
Current
(Bo th P orts A c ti ve )
CE = VIL, Outputs Open
SEM = VIH
f = fMAX(3)
COM'L S
L120
115 180
155 120
115 180
155 mA
IND S
L120
115 200
170 120
115 200
170 mA
ISB1 Standb y Current
(Bo th Ports - TTL
Le ve l Inp uts)
CER = CEL = VIH
SEMR = SEML = VIH
f = fMAX(3)
COM'L S
L13
11 25
20 13
11 25
20 mA
IND S
L13
11 40
35 13
11 40
35 mA
ISB2 Standb y Current
(One P ort - TTL
Le ve l Inp uts)
CEL or CER = VIH
Activ e Po rt Outputs Ope n,
f=fMAX(3)
COM'L S
L70
65 100
90 70
65 100
90 mA
IND S
L70
65 120
105 70
65 120
105 mA
ISB3 Full Standb y Current
(Bo th Ports -
CM OS Le v e l Inp u ts )
Bo th P orts CEL and
CER > VCC - 0.2V,
VIN > VCC - 0. 2V o r
VIN < 0.2V , f = 0(4)
SEMR = SEML > VCC - 0. 2V
COM'L S
L1.0
0.2 5
2.5 1.0
0.2 5
2.5 mA
IND S
L1.0
0.2 15
51.0
0.2 15
5mA
ISB4 Full Standb y Current
(One P ort -
CM OS Le v e l Inp u ts )
One Port CEL or
CER > VCC - 0.2V
SEMR = SEML > VCC - 0. 2V
VIN > VCC - 0. 2 V or VIN < 0. 2V
Activ e Po rt Outputs Ope n,
f = fMAX(3)
COM'L S
L65
60 100
85 65
60 100
85 mA
IND S
L65
60 115
100 65
60 115
100 mA
2942 t b l 09b
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
7
AC Test Conditions
Timing of Power-Up Power-Down
Figure 2. Output Test Load
(For tLZ, tHZ, tWZ, tOW)
*Including scope and jig.
Figure 1. AC Output Test Load
In p ut P ul s e Le v e l s
In p u t R i s e/ F a l l Ti m es
Inp ut Tim ing Re fe rence Le v e l s
Ou tp ut Refe r e nc e L e ve l s
Outp ut Load
GND to 3. 0V
3ns Max .
1.5V
1.5V
Fi g ure s 1 and 2
2942 tbl 10 2942 drw 05
590
30pF
435
3.3V
DATAOUT
BUSY
INT
590
5pF*
435
3.3V
DATAOUT
,
CE
2942 drw 06
tPU
ICC
ISB
tPD
,
8
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range(4)
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed but not tested.
3. To access SRAM, CE = VIL, SEM = VIH.
4. 'X' in part number indicates power rating (S or L).
70V06X15
Com'l Only 70V06X20
Com'l
& I nd
70V06X25
Com'l
& I nd
UnitSymbol Parameter Min.Max.Min.Max.Min.Max.
READ CYCLE
tRC Re ad Cy cle Ti me 15 ____ 20 ____ 25 ____ ns
tAA Address Access Time ____ 15 ____ 20 ____ 25 ns
tACE Chip Enab le Acce ss Time(3) ____ 15 ____ 20 ____ 25 ns
tAOE Output Enable Access Time(3) ____ 10 ____ 12 ____ 13 ns
tOH Output Hold from Address Change 3 ____ 3____ 3____ ns
tLZ O u t pu t Low - Z Tim e(1,2) 3____ 3____ 3____ ns
tHZ Outp ut Hig h-Z Time (1,2) ____ 10 ____ 12 ____ 15 ns
tPU Chip E nab l e to P o we r Up Ti me(1,2) 0____ 0____ 0____ ns
tPD Chi p Dis able to Po wer Down Time (1,2) ____ 15 ____ 20 ____ 25 ns
tSOP Semaphore Flag Update Pulse (OE or SEM)10
____ 10 ____ 10 ____ ns
tSAA Semaphore Ad dress Access(3) ____ 15 ____ 20 ____ 25 ns
29 42 tb l 11 a
70V06X35
Com'l
& I nd
70V06X55
Com'l
& I nd
UnitSymbol Parameter Min. Max. Min. Max.
READ CYCLE
tRC Re ad Cy cle Ti me 35 ____ 55 ____ ns
tAA Address Access Time ____ 35 ____ 55 ns
tACE Chip Enab le Acce ss Time(3) ____ 35 ____ 55 ns
tAOE Output Enable Access Time(3) ____ 20 ____ 30 ns
tOH Output Hold from Address Change 3 ____ 3____ ns
tLZ O u t pu t Low - Z Tim e(1,2) 3____ 3____ ns
tHZ Outp ut Hig h-Z Time (1,2) ____ 15 ____ 25 ns
tPU Chip E nab l e to P o we r Up Ti me(1,2) 0____ 0____ ns
tPD Chi p Dis able to Po wer Down Time (1,2) ____ 35 ____ 50 ns
tSOP Semaphore Flag Update Pulse (OE or SEM)15
____ 15 ____ ns
tSAA Semaphore Ad dress Access(3) ____ 35 ____ 55 ns
2 942 tb l 11b
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
9
Waveform of Read Cycles(5)
NOTES:
1. Timing depends on which signal is asserted las OE or CE.
2. Timing depends on which signal is de-asserted first CE or OE.
3. tBDD delay is required only in cases where the opposite port is completing a write operation to the same address location. For simultaneous read operations BUSY has no
relation to valid output data.
4. Start of valid data depends on which timing becomes effective last tAOE, tACE, tAA or tBDD.
5. SEM = VIH.
tRC
R/W
CE
ADDR
tAA
OE
2942 drw 07
(4)
tACE(4)
tAOE(4)
(1)
tLZ tOH
(2)
tHZ
(3,4)
tBDD
DATAOUT
BUSYOUT
VALID DATA(4)
10
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(5)
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. This parameter is guaranteed but not tested.
3. To access SRAM, CE = VIL, SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. Either condition must be valid for the entire tEW time.
4. The specification for tDH must be met by the device supplying write data to the RAM under all operating conditions. Although tDH and tOW values will vary over voltage and
temperature, the actual tDH will always be smaller than the actual tOW.
5. 'X' in part number indicates power rating (S or L).
Symbol Parameter
70V06X15
Com'l Only 70V06X20
Com'l
& Ind
70V06X25
Com'l
& Ind
UnitMin. Max. Min. Max. Min. Max.
WRI TE CYCLE
tWC Write Cycle Time 15 ____ 20 ____ 25 ____ ns
tEW Chip Enable to End-of-Write(3) 12 ____ 15 ____ 20 ____ ns
tAW Address Valid to End-of-Write 12 ____ 15 ____ 20 ____ ns
tAS Address Set-up Time (3) 0____ 0____ 0____ ns
tWP Write Pulse Width 12 ____ 15 ____ 20 ____ ns
tWR Write Recovery Time 0 ____ 0____ 0____ ns
tDW Data Val id to E nd -o f-Wri te 10 ____ 15 ____ 15 ____ ns
tHZ Outp ut Hig h-Z Time (1,2) ____ 10 ____ 12 ____ 15 ns
tDH Data Hold Time (4) 0____ 0____ 0____ ns
tWZ Write Enab l e to Outp ut i n Hig h-Z(1,2) ____ 10 ____ 12 ____ 15 ns
tOW Outp ut Ac ti ve from End -o f-W ri te (1,2,4) 0____ 0____ 0____ ns
tSWRD SEM Flag Write to Re ad Tim e 5____ 5____ 5____ ns
tSPS SEM Flag Contention Window 5____ 5____ 5____ ns
2 942 tb l 12 a
Symbol Parameter
70V06X35
Com'l
& Ind
70V06X55
Com'l
& Ind
UnitMin. Max. Min. Max.
WRI TE CYCLE
tWC Write Cycle Time 35 ____ 55 ____ ns
tEW Chip Enable to End-of-Write(3) 30 ____ 45 ____ ns
tAW Address Valid to End-of-Write 30 ____ 45 ____ ns
tAS Address Set-up Time (3) 0____ 0____ ns
tWP Write Pulse Width 25 ____ 40 ____ ns
tWR Write Recovery Time 0 ____ 0____ ns
tDW Data Val id to E nd -o f-Wri te 15 ____ 30 ____ ns
tHZ Outp ut Hig h-Z Time (1,2) ____ 15 ____ 25 ns
tDH Data Hold Time (4) 0____ 0____ ns
tWZ Write Enab l e to Outp ut i n Hig h-Z(1,2) ____ 15 ____ 25 ns
tOW Outp ut Ac ti ve from End -o f-W ri te (1,2,4) 0____ 0____ ns
tSWRD SEM Flag Write to Re ad Tim e 5____ 5____ ns
tSPS SEM Flag Contention Window 5____ 5____ ns
2942 tbl 12b
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
11
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing(1,3,5,8)
Timing Waveform of Write Cycle No. 2, CE Controlled Timing(1,3,5,8)
NOTES:
1. R/W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of a LOW CE and a LOW R/W for memory array writing cycle.
3. tWR is measured from the earlier of CE or R/W (or SEM or R/W) going HIGH to the end of write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the CE or SEM LOW transition occurs simultaneously with or after the R/W low transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal is asserted last, CE, or R/W.
7. Timing depends on which enable signal is de-asserted first, CE, or R/W.
8. If OE is LOW during R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be placed on the
bus for the required tDW. If OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified tWP.
9. To access SRAM, CE = VIL and SEM = VIH. To access Semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition.
R/W
tWC
tHZ
tAW
tWR
tAS tWP
DATAOUT
(2)
tWZ
tDW tDH
tOW
OE
ADDRESS
DATAIN
CE or SEM
(6)
(4) (4)
(3)
2942 drw 08
(7)
(7)
(9)
2942 drw 09
tWC
tAS tWR
tDW tDH
ADDRESS
DATAIN
CE or SEM
R/W
tAW
tEW (3)
(2)
(6)
(9)
12
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Timing Waveform of Semaphore Read after Write Timing, Either Side(1)
NOTES:
1. CE = VIH for the duration of the above timing (both write and read cycle).
2. DATAOUT VALID represents all I/O's (I/O0 - I/O7) equal to the semaphore value.
Timing Waveform of Semaphore Write Contention(1,3,4)
SEM"A"
2942 drw 11
tSPS
MATCH
R/W"A"
MATCH
A0"A"-A2"A"
SIDE "A"
(2)
SEM"B"
R/W"B"
A0"B"-A2"B"
SIDE "B"
(2)
NOTES:
1. DOR = DOL = VIL, CER = CEL = VIH, Semaphore Flag is released from both sides (reads as ones from both sides) at cycle start.
2. A may be either left or right port. B is the opposite port from A.
3. This parameter is measured from R/WA or SEMA going HIGH to R/WB or SEMB going HIGH.
4. If tSPS is not satisfied, the semaphore will fall positively to one side or the other, but there is no guarantee which side will obtain the flag.
SEM
2942 drw 10
tAW tEW
tSOP
DATA0
VALID ADDRESS
tSAA
R/W
tWR
tOH
tACE
VALID ADDRESS
DATAIN VALID DATA OUT
tDW
tWP tDH
tAS
tSWRD tAOE
tSOP
Read Cycle
Write Cycle
A0-A2
OE
VALID(2)
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
13
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range(6)
NOTES:
1 . Port-to-port delay through SRAM cells from writing port to reading port, refer to "Timing Waveform of Read With BUSY (M/S = VIH) or "Timing Waveform of Write With
Port-To-Port Delay (M/S=VIL)".
2. To ensure that the earlier of the two ports wins.
3. tBDD is a calculated parameter and is the greater of 0, tWDD tWP (actual) or tDDD tDW (actual).
4. To ensure that the write cycle is inhibited during contention.
5. To ensure that a write cycle is completed after contention.
6. "X" is part numbers indicates power rating (S or L).
70V06X15
Com 'l Ony 70V06X20
Com'l
& Ind
70V06X25
Com'l
& Ind
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
BUSY TIMI NG (M/S = VIH)
tBAA BUSY Acce ss Time from Address Match ____ 15 ____ 20 ____ 20 ns
tBDA BUSY Disable Time fro m Address Not Matched ____ 15 ____ 20 ____ 20 ns
tBAC BUSY Acce ss Time fro m Chip Enable LOW ____ 15 ____ 20 ____ 20 ns
tBDC BUSY Disab l e Time fro m Chi p E nab l e HIGH ____ 15 ____ 17 ____ 17 ns
tAPS Arbitration Priority Set-up Time (2) 5____ 5____ 5____ ns
tBDD BUSY Disable to Valid Data(3) ____ 18 ____ 30 ____ 30 ns
tWH Write Hold Afte r BUSY(5) 12 ____ 15 ____ 17 ____ ns
BUSY TIMI NG (M/S = VIL)
tWB BUSY Inp ut to Wri te (4) 0____ 0____ 0____ ns
tWH Write Hold Afte r BUSY(5) 12 ____ 15 ____ 17 ____ ns
PORT -TO-P ORT DEL AY T I MI NG
tWDD Write P ulse to Data Delay(1) ____ 30 ____ 45 ____ 50 ns
tDDD Write Data Valid to Read Data Delay (1) ____ 25 ____ 35 ____ 35 ns
2 942 tb l 13 a
70V06X35
Com'l
& Ind
70V06X55
Com'l
& Ind
Symbol Parameter Min. Max. Min. Max. Unit
BUSY TIMI NG (M/S = VIH)
tBAA BUSY Acce ss Time from Address Match ____ 20 ____ 45 ns
tBDA BUSY Disable Time fro m Address Not Matched ____ 20 ____ 40 ns
tBAC BUSY Acce ss Time fro m Chip Enable LOW ____ 20 ____ 40 ns
tBDC BUSY Disab l e Time fro m Chi p E nab l e HIGH ____ 20 ____ 35 ns
tAPS Arbitration Priority Set-up Time (2) 5____ 5____ ns
tBDD BUSY Disable to Valid Data(3) ____ 35 ____ 40 ns
tWH Write Hold Afte r BUSY(5) 25 ____ 25 ____ ns
BUSY TIMI NG (M/S = VIL)
tWB BUSY Inp ut to Wri te (4) 0____ 0____ ns
tWH Write Hold Afte r BUSY(5) 25 ____ 25 ____ ns
PORT -TO-P ORT DEL AY T I MI NG
tWDD Write P ulse to Data Delay(1) ____ 60 ____ 80 ns
tDDD Write Data Valid to Read Data Delay (1) ____ 45 ____ 65 ns
2942 tbl 13b
14
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
2942 drw 12
tDW
tAPS
ADDR"A"
tWC
DATAOUT "B"
MATCH
tWP
R/W"A"
DATAIN "A"
ADDR"B"
tDH
VALID
(1)
MATCH
BUSY"B"
tBDA
VALID
tBDD
tDDD (3)
tWDD
tBAA
Timing Waveform of Write with Port-To-Port Read and BUSY(2,4,5)
(M/S = VIH)
NOTES:
1. To ensure that the earlier of the two ports wins. tAPS is ignored for M/S = VIL (SLAVE).
2. CEL = CER = VIL
3. OE = VIL for the reading port.
4. If M/S = VIL(slave) then BUSY is input. Then for this example BUSYA = VIH and BUSYB input is shown above.
5. All timing is the same for left and right port. Port "A" may be either left or right port. Port "B" is the port opposite from Port "A".
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
15
Timing Waveform of Write with BUSY
NOTES:
1. All timing is the same for left and right ports. Port A may be either the left or right port. Port B is the port opposite from A.
2. If tAPS is not satisfied, the BUSY signal will be asserted on one side or another but there is no guarantee on which side BUSY will be asserted.
Waveform of BUSY Arbitration Cycle Controlled by Address Match
Timing(1) (M/S = VIH)
Waveform of BUSY Arbitration Controlled by CE Timing(1) (M/S = VIH)
NOTES:
1. tWH must be met for both BUSY input (slave) output master.
2. BUSY is asserted on Port B Blocking R/WB, until BUSYB goes HIGH.
3. tWB is only for the slave version.
2942 drw 13
R/W"A"
BUSY"B"
tWP
tWB(3)
R/W"B"
tWH(1)
(2)
2942 drw 14
ADDR"A"
and "B" ADDRESSES MATCH
CE"A"
CE"B"
BUSY"B"
tAPS
tBAC tBDC
(2)
2942 drw 15
ADDR"A" ADDRESS "N"
ADDR"B"
BUSY"B"
tAPS
tBAA tBDA
(2)
MATCHING ADDRESS "N"
16
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Waveform of Interrupt Timing(1)
NOTES:
1. All timing is the same for left and right ports. Port A may be either the left or right port. Port B is the port opposite from A.
2. See Interrupt Truth Table III.
3. Timing depends on which enable signal (CE or R/W) is asserted last.
4. Timing depends on which enable signal (CE or R/W) is de-asserted first.
NOTE:
1. 'X' in part number indicates power rating (S or L).
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range(1)
70V06X15
Com'l Only 70V06X20
Com'l
& I nd
70V06X25
Com'l
& I nd
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
INTERRUPT TIMING
tAS Address Set-up Time 0 ____ 0____ 0____ ns
tWR Write Re co ve ry Tim e 0 ____ 0____ 0____ ns
tINS Inte rrupt Se t Time ____ 15 ____ 20 ____ 20 ns
tINR Inte rrupt Re se t Time ____ 15 ____ 20 ____ 20 ns
2 942 tb l 14a
2942 drw 16
ADDR"A" INTERRUPT SET ADDRESS
CE"A"
R/W"A"
tAS
tWC
tWR
(3) (4)
tINS(3)
INT"B"
(2)
70V06X35
Com'l
& I nd
70V06X55
Com'l
& I nd
Symbol Parameter Min. Max. Min. Max. Unit
INTERRUPT TIMING
tAS Address Set-up Time 0 ____ 0____ ns
tWR Write Re co ve ry Tim e 0 ____ 0____ ns
tINS Inte rrupt Se t Time ____ 25 ____ 40 ns
tINR Inte rrupt Re se t Time ____ 25 ____ 40 ns
2942 tbl 14b
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
17
Truth Table III  Interrupt Flag(1)
NOTES:
1. All timing is the same for left and right ports. Port A may be either the left or right port. Port B is the port opposite from A.
2. See Interrupt Truth Table III.
3. Timing depends on which enable signal (CE or R/W) is asserted last.
Waveform of Interrupt Timing(1) (con't.)
NOTES:
1. Assumes BUSYL = BUSYR = VIH.
2. If BUSYL = VIL, then no change.
3. If BUSYR = VIL, then no change.
2942 drw 17
ADDR"B" INTERRUPT CLEAR ADDRESS
CE"B"
OE"B"
tAS
tRC
(3)
tINR(3)
INT"B"
(2)
Left Port Right P ort
FunctionR/WLCE
LOELA13L-A0L INTLR/WRCE
ROERA13R-A0R INTR
L LX 3FFFXXXX X L
(2) S e t Ri g ht INTR Flag
XXX X XX L L 3FFF H
(3) Res e t Ri g ht INTR Flag
XXX X L
(3) LLX3FFEXSet Left INTL Flag
XLL3FFE H
(2) X X X X X Res et Le ft INTL Flag
2942 tbl 15
18
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Truth Table IV  Address BUSY
Arbitration
NOTES:
1. Pins BUSYL and BUSYR are both outputs when the part is configured as a master. Both are inputs when configured as a slave. BUSYX outputs on the IDT70V06 are push
pull, not open drain outputs. On slaves the BUSYX input internally inhibits writes.
2. L if the inputs to the opposite port were stable prior to the address and enable inputs of this port. H if the inputs to the opposite port became stable after the address and enable
inputs of this port. If tAPS is not met, either BUSYL or BUSYR = LOW will result. BUSYL and BUSYR outputs cannot be LOW simultaneously.
3. Writes to the left port are internally ignored when BUSYL outputs are driving LOW regardless of actual logic level on the pin. Writes to the right port are internally ignored when
BUSYR outputs are driving LOW regardless of actual logic level on the pin.
Truth Table V  Example of Semaphore Procurement Sequence(1,2,3)
NOTES:
1. This table denotes a sequence of events for only one of the eight semaphores on the IDT70V06.
2. There are eight semaphore flags written to via I/O0 and read from all I/O's (I/O0 - I/O7). These eight semaphores are addressed by A0 -A2.
3. CE = VIH, SEM = VIL to access the semaphores. Refer to the Semaphore Read/Write Control Truth Table.
Functional Description
The IDT70V06 provides two ports with separate control, address
and I/O pins that permit independent access for reads or writes to any
location in memory. The IDT70V06 has an automatic power down
feature controlled by CE. The CE controls on-chip power down circuitry
that permits the respective port to go into a standby mode when not
selected (CE = VIH). When a port is enabled, access to the entire
memory array is permitted.
Interrupts
If the user chooses the interrupt function, a memory location (mail
box or message center) is assigned to each port. The left port interrupt
flag (INTL) is set when the right port writes to memory location 3FFE
(HEX). The left port clears the interrupt by reading address location 3FFE.
Likewise, the right port interrupt flag (INTR) is set when the left port writes
to memory location 3FFF (HEX) and to clear the interrupt flag (INTR), the
right port must read the memory location 3FFF. The message (8 bits) at
3FFE or 3FFF is user-defined. If the interrupt function is not used, address
locations 3FFE and 3FFF are not used as mail boxes, but as part of the
random access memory. Refer to Truth Table III for the interrupt
operation.
Busy Logic
Busy Logic provides a hardware indication that both ports of the
SRAM have accessed the same location at the same time. It also
Inputs Outputs
Function
CELCERA13L-A0L
A13R-A0R BUSYL(1) BUSYR(1)
XXNO MATCH H H Normal
HX MATCH H H Normal
XH MATCH H H Normal
L L MATCH (2) (2) Write Inhi b it(3)
2 9 42 tb l 16
Functions D0 - D7 Left D0 - D7 Righ t Status
No Action 1 1 Semaphore free
Left Port Writes "0" to Semaphore 0 1 Left port has semaphore token
Right Port Writes "0" to Semaphore 0 1 No change. Right side has no write access to semaphore
Left Port Writes "1" to Semaphore 1 0 Right port obtains semaphore token
Left Port Writes "0" to Semaphore 1 0 No change. Left port has no write access to semaphore
Right Port Writes "1" to Semaphore 0 1 Left port obtains semaphore token
Left Port Writes "1" to Semaphore 1 1 Semaphore free
Right Port Writes "0" to Semaphore 1 0 Right port has semaphore token
Right Port Writes "1" to Semaphore 1 1 Semaphore free
Left Port Writes "0" to Semaphore 0 1 Left port has semaphore token
Left Port Writes "1" to Semaphore 1 1 Semaphore free
2942 tbl 17
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
19
Figure 3. Busy and chip enable routing for both width and depth expansion with IDT70V06 SRAMs.
enough for a BUSY flag to be output from the master before the actual write
pulse can be initiated with the R/W signal. Failure to observe this timing
can result in a glitched internal write inhibit signal and corrupted data in the
slave.
Semaphores
The IDT70V06 is an extremely fast Dual-Port 16K x 8 CMOS Static
RAM with an additional 8 address locations dedicated to binary
semaphore flags. These flags allow either processor on the left or right
side of the Dual-Port SRAM to claim a privilege over the other processor
for functions defined by the system designers software. As an ex-
ample, the semaphore can be used by one processor to inhibit the
other from accessing a portion of the Dual-Port SRAM or any other shared
resource.
The Dual-Port SRAM features a fast access time, and both ports
are completely independent of each other. This means that the activity
on the left port in no way slows the access time of the right port. Both
ports are identical in function to standard CMOS Static RAM and can
be read from, or written to, at the same time with the only possible
conflict arising from the simultaneous writing of, or a simultaneous
READ/WRITE of, a non-semaphore location. Semaphores are pro-
tected against such ambiguous situations and may be used by the
system program to avoid any conflicts in the non-semaphore portion
of the Dual-Port SRAM. These devices have an automatic power-
down feature controlled by CE, the Dual-Port SRAM enable, and SEM,
the semaphore enable. The CE and SEM pins control on-chip power
down circuitry that permits the respective port to go into standby mode
when not selected. This is the condition which is shown in Truth Table
I where CE and SEM are both HIGH.
Systems which can best use the IDT70V06 contain multiple
processors or controllers and are typically very high-speed systems
which are software controlled or software intensive. These systems
can benefit from a performance increase offered by the IDT70V06's
hardware semaphores, which provide a lockout mechanism without
requiring complex programming.
Software handshaking between processors offers the maximum in
system flexibility by permitting shared resources to be allocated in
varying configurations. The IDT70V06 does not use its semaphore flags
allows one of the two accesses to proceed and signals the other side that
the SRAM is busy. The BUSY pin can then be used to stall the access
until the operation on the other side is completed. If a write operation has
been attempted from the side that receives a BUSY indication, the write
signal is gated internally to prevent the write from proceeding.
The use of BUSY logic is not required or desirable for all applications.
In some cases it may be useful to logically OR the BUSY outputs together
and use any BUSY indication as an interrupt source to flag the event of an
illegal or illogical operation. If the write inhibit function of BUSY logic is not
desirable, the BUSY logic can be disabled by placing the part in slave mode
with the M/S pin. Once in slave mode the BUSY pin operates solely as
a pin. Normal operation can be programmed by tying the BUSY pins HIGH.
If desired, unintended write operations can be prevented to a port by tying
the BUSY pin for that port LOW.
The BUSY outputs on the IDT 70V06 RAM in master mode, are
push-pull type outputs and do not require pull up resistors to operate.
If these RAMs are being expanded in depth, then the busy indication
for the resulting array requires the use of an external AND gate.
Width Expansion with Busy Logic
Master/Slave Arrays
When expanding an IDT70V06 SRAM array in width while using
BUSY logic, one master part is used to decide which side of the SRAM array
will receive a BUSY indication, and to output that indication. Any number
of slaves to be addressed in the same address range as the master use
the BUSY signal as a write inhibit signal. Thus on the IDT70V06 RAM the
BUSY pin is an output if the part is used as a master (M/S pin = VIH), and
the BUSY pin is an input if the part used as a slave (M/S pin = VIL) as shown
in Figure 3.
If two or more master parts were used when expanding in width, a
split decision could result with one master indicating BUSY on one side
of the array and another master indicating BUSY on one other side of
the array. This would inhibit the write operations from one port for part
of a word and inhibit the write operations from the other port for part of
the other word.
The BUSY arbitration, on a master, is based on the chip enable and
address signals only. It ignores whether an access is a read or write.
In a master/slave array, both address and chip enable must be valid long
2942 drw 18
MASTER
Dual Port
SRAM
BUSY (L) BUSY (R)
CE
MASTER
Dual Port
SRAM
BUSY (L) BUSY (R)
CE
SLAVE
Dual Port
SRAM
BUSY (L) BUSY (R)
CE
SLAVE
Dual Port
SRAM
BUSY (L) BUSY (R)
CE
BUSY (L) BUSY (R)
DECODER
20
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
to control any resources through hardware, thus allowing the system
designer total flexibility in system architecture.
An advantage of using semaphores rather than the more common
methods of hardware arbitration is that wait states are never incurred
in either processor. This can prove to be a major advantage in very
high-speed systems.
How the Semaphore Flags Work
The semaphore logic is a set of eight latches which are indepen-
dent of the Dual-Port SRAM. These latches can be used to pass a flag,
or token, from one port to the other to indicate that a shared resource
is in use. The semaphores provide a hardware assist for a use
assignment method called Token Passing Allocation. In this method,
the state of a semaphore latch is used as a token indicating that a
shared resource is in use. If the left processor wants to use this
resource, it requests the token by setting the latch. This processor then
verifies its success in setting the latch by reading it. If it was successful,
it assumes control over the shared resource. If it was not successful
in setting the latch, it determines that the right side processor has set
the latch first, has the token and is using the shared resource. The left
processor can then either repeatedly request that semaphores status
or remove its request for that semaphore to perform another task and
occasionally attempt again to gain control of the token via the set and
test sequence. Once the right side has relinquished the token, the left
side should succeed in gaining control.
The semaphore flags are active LOW. A token is requested by
writing a zero into a semaphore latch and is released when the same
side writes a one to that latch.
The eight semaphore flags reside within the IDT70V06 in a
separate memory space from the Dual-Port SRAM. This address
space is accessed by placing a LOW input on the SEM pin (which
acts as a chip select for the semaphore flags) and using the other
control pins (Address, OE, and R/W) as they would be used in
accessing a standard Static RAM. Each of the flags has a unique
address which can be accessed by either side through address pins
A0 A2. When accessing the semaphores, none of the other address
pins has any effect.
When writing to a semaphore, only data pin D0 is used. If a low level
is written into an unused semaphore location, that flag will be set to a
zero on that side and a one on the other side (see Truth Table V). That
semaphore can now only be modified by the side showing the zero.
When a one is written into the same location from the same side, the
flag will be set to a one for both sides (unless a semaphore request
from the other side is pending) and then can be written to by both sides.
The fact that the side which is able to write a zero into a semaphore
subsequently locks out writes from the other side is what makes
semaphore flags useful in interprocessor communications. (A thor-
ough discussion on the use of this feature follows shortly.) A zero
written into the same location from the other side will be stored in the
semaphore request latch for that side until the semaphore is freed by
the first side.
When a semaphore flag is read, its value is spread into all data bits
so that a flag that is a one reads as a one in all data bits and a flag
containing a zero reads as all zeros. The read value is latched into one
sides output register when that side's semaphore select (SEM) and
output enable (OE) signals go active. This serves to disallow
the semaphore from changing state in the middle of a read cycle
due to a write cycle from the other side. Because of this latch, a repeated
read of a semaphore in a test loop must cause either signal (SEM or OE)
to go inactive or the output will never change.
A sequence WRITE/READ must be used by the semaphore in
order to guarantee that no system level contention will occur. A
processor requests access to shared resources by attempting to write
a zero into a semaphore location. If the semaphore is already in use,
the semaphore request latch will contain a zero, yet the semaphore
flag will appear as one, a fact which the processor will verify by the
subsequent read (see Table V). As an example, assume a processor
writes a zero to the left port at a free semaphore location. On a
subsequent read, the processor will verify that it has written success-
fully to that location and will assume control over the resource in
question. Meanwhile, if a processor on the right side attempts to write
a zero to the same semaphore flag it will fail, as will be verified by the
fact that a one will be read from that semaphore on the right side during
subsequent read. Had a sequence of READ/WRITE been used
instead, system contention problems could have occurred during the
gap between the read and write cycles.
It is important to note that a failed semaphore request must be
followed by either repeated reads or by writing a one into the same
location. The reason for this is easily understood by looking at the
simple logic diagram of the semaphore flag in Figure 4. Two sema-
phore request latches feed into a semaphore flag. Whichever latch is
first to present a zero to the semaphore flag will force its side of the
semaphore flag LOW and the other side HIGH. This condition will
continue until a one is written to the same semaphore request latch.
Should the other sides semaphore request latch have been written to
a zero in the meantime, the semaphore flag will flip over to the other
side as soon as a one is written into the first sides request latch. The
second sides flag will now stay LOW until its semaphore request latch
is written to a one. From this it is easy to understand that, if a
semaphore is requested and the processor which requested it no
longer needs the resource, the entire system can hang up until a one
is written into that semaphore request latch.
The critical case of semaphore timing is when both sides request
a single token by attempting to write a zero into it at the same time. The
semaphore logic is specially designed to resolve this problem. If
simultaneous requests are made, the logic guarantees that only one
side receives the token. If one side is earlier than the other in making
the request, the first side to make the request will receive the token. If
both requests arrive at the same time, the assignment will be arbitrarily
made to one port or the other.
One caution that should be noted when using semaphores is that
semaphores alone do not guarantee that access to a resource is
secure. As with any powerful programming technique, if semaphores
are misused or misinterpreted, a software error can easily happen.
Initialization of the semaphores is not automatic and must be
handled via the initialization program at power-up. Since any sema-
phore request flag which contains a zero must be reset to a one, all
semaphores on both sides should have a one written into them at
initialization from both sides to assure that they will be free when
needed.
6.42
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
21
Using SemaphoresSome Examples
Perhaps the simplest application of semaphores is their application as
resource markers for the IDT70V06s Dual-Port SRAM. Say the 16K x
8 SRAM was to be divided into two 8K x 8 blocks which were to be
dedicated at any one time to servicing either the left or right port. Semaphore
0 could be used to indicate the side which would control the lower section
of memory, and Semaphore 1 could be defined as the indicator for the
upper section of memory.
To take a resource, in this example the lower 8K of Dual-Port
SRAM, the processor on the left port could write and then read a zero in
to Semaphore 0. If this task were successfully completed (a zero was read
back rather than a one), the left processor would assume control of the
lower 8K. Meanwhile the right processor was attempting to gain control of
the resource after the left processor, it would read back a one in response
to the zero it had attempted to write into Semaphore 0. At this point, the
software could choose to try and gain control of the second 8K section by
writing, then reading a zero into Semaphore 1. If it succeeded in gaining
control, it would lock out the left side.
Once the left side was finished with its task, it would write a one to
Semaphore 0 and may then try to gain access to Semaphore 1. If
Semaphore 1 was still occupied by the right side, the left side could
undo its semaphore request and perform other tasks until it was able
to write, then read a zero into Semaphore 1. If the right processor
performs a similar task with Semaphore 0, this protocol would allow the
two processors to swap 8K blocks of Dual-Port SRAM with each other.
The blocks do not have to be any particular size and can even be
variable, depending upon the complexity of the software using the
semaphore flags. All eight semaphores could be used to divide the
D0
2942 drw 19
DQ
WRITE D0
D
QWRITE
SEMAPHORE
REQUEST FLIP FLOP SEMAPHORE
REQUEST FLIP FLOP
LPORT RPORT
SEMAPHORE
READ SEMAPHORE
READ
,
Figure 4. IDT70V06 Semaphore Logic
Dual-Port SRAM or other shared resources into eight parts. Semaphores
can even be assigned different meanings on different sides rather than
being given a common meaning as was shown in the example above.
Semaphores are a useful form of arbitration in systems like disk
interfaces where the CPU must be locked out of a section of memory
during a transfer and the I/O device cannot tolerate any wait states.
With the use of semaphores, once the two devices has determined
which memory area was off-limits to the CPU, both the CPU and the
I/O devices could access their assigned portions of memory continu-
ously without any wait states.
Semaphores are also useful in applications where no memory
WAIT state is available on one or both sides. Once a semaphore
handshake has been performed, both processors can access their
assigned SRAM segments at full speed.
Another application is in the area of complex data structures. In this
case, block arbitration is very important. For this application one
processor may be responsible for building and updating a data
structure. The other processor then reads and interprets that data
structure. If the interpreting processor reads an incomplete data
structure, a major error condition may exist. Therefore, some sort of
arbitration must be used between the two different processors. The
building processor arbitrates for the block, locks it and then is able to
go in and update the data structure. When the update is completed, the
data structure block is released. This allows the interpreting processor
to come back and read the complete data structure, thereby guaran-
teeing a consistent data structure.
22
IDT70V06S/L
High-Speed 16K x 8 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Ordering Information
2942 drw 20
A
Power
999
Speed
A
Package
A
Process/
Temperature
Range
Blank
I(1) Commercial (0°Cto+70
°C)
Industrial (-40°Cto+85
°C)
PF
G
J
64-pin TQFP (PN64-1)
68-pin PGA (G68-1)
68-pin PLCC (J68-1)
15
20
25
35
55
S
LStandard Power
Low Power
XXXXX
Device
Type
128K (16K x 8) 3.3V Dual-Port RAM70V06
IDT
Speed in Nanoseconds
Commercial Only
Commercial & Industrial
Commercial & Industrial
Commercial & Industrial
Commercial & Industrial
CORPORATE HEADQUARTERS for SALES: for Tech Support:
2975 Stender Way 800-345-7015 or 408-727-6166 831-754-4613
Santa Clara, CA 95054 fax: 408-492-8674 DualPortHelp@idt.com
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
Datasheet Document History
3/10/99: Initiated datasheet document history
Converted to new format
Cosmetic and typographical corrections
Page 2 and 3 Added additional notes to pin configurations
6/9/99: Changed drawing format
11/10/99: Replaced IDT logo
3/10/00: Added 15 & 20ns speed grades
Upgraded DC parameters
Added Industrial Temperature information
Changed ±200mV to 0mV