REVISIONS LTR DESCRIPTION DATE (vn-mo-pa) | APPROVED A Change to table I, parameter t C: Removed programming owR requirements. Editorial changee throughout. 1989 SEP 11 M faye REV SHEET REV SHEET REV STATUS REV ALATA) AL ALA ALATA IA TA [ATA JA OF SH FETS SHEET 1f2e3h4 ds] e6l7 [| af 9 fiofi | igs frais PMIC WA EPARED BY 4 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDIZED j c MILITARY at J MICROCIRCUITS, DIGITAL, CMOS 2K X 8 ONE APPROVERBY TIME PROGRAMMABLE REGISTERED PROM, DRAWING , MONOLITHIC SILICON THIS DRAWING IS AVAILABLE ron USE BY ALL DEPARTMENTS DRAWING A#PROVAL DATE SIZE CAGE CODE te AGENCIES OF THE 13 JANUARY 1989 A 67268 5962-88735 DEPARTMENT OF DEFENSE REVISION LEVEL AMSC NIA A SHEET 1 OF 15 ESC FORM 193 # U.S. GOVERNMENT PRINTING OFFICE: 1967 748-129/60911 5962-E1417 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.1. SCOPE 1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". 1.2 Part number. The complete part number shall be as shown in the following example: 5962-88735 01 L X fp 1 | | | 1 | | | | | | Drawing number Device type Case outline Lead finish per (1.2.1) (1.2.2) MIL-M-38510 1.2.1 Device types. The device types shall identify the circuit function as follows: Device type Generic number Circuit function Setup time ol See 6.6 2K x 8 registered PROM 45 ns 02 See 6.6 2K x 8 registered PROM 35 ns 03 See 6.6 2K x 8 registered PROM 35 ns 04 See 6.6 2X x 8 registered PROM: 25 ns 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows: 7 Outline letter Case outline K F-6 (24-lead, 0.640" x 0.420" x 0,090", maximum), flat package L D-9 (24-lead, 1.280" x 0.310" x 0.200"), dual-in-line package 3 C-4 (28-terminal, 0.460" x 0.460" x 0.100", maximum), square chip carrier package 1.3 Absolute maximum ratings. 1/ Supply voltage range (Vcc) - > - - ----- ee -0.5 V de to +7 V dc DC voltage applied to outputs in high Z state --- -0.5 V de to +7 V de DC program vol tage (Vpp): Device types 01 and 02 - - ------------ 14.0 V de Device types 03 and 04 - ------------- 13.0 V de DC input voltage - - - --------------- -3.0 de to +7 V dc Maximum power dissipation (Pp) 2/- ------+-+-- 1.0.W : Storage temperature range - ~----------- ~65 C to +150 C Lead temperature (soldering, 10 seconds) - - - - - - +300C Junction temperature (Tj) 3/ - -+----+----- +150C Thermal resistance, junction-to-case (@jc) - - - - - See MIL-M-38510, appendix C 1.4 Recommended operating conditions. Supply voltage range (Vcc) - - - - ---- eo oe +4.5 V de to +5.5 V de Case operating temperature (Ic) ---------- -55C to +125C 17 Unless otherwise specified, all voltages are referenced to ground. 2/ Must withstand the added Pp due to short circuit test; e.g., Ios. 3/ Maximum junction temperature may be increased to +175 C during burn-in and steady-state life. STANDARDIZED A MILITARY DRAWING 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 9 DESC FORM 1 93A t U. S. GOVERNMENT PRINTING OFFICE: 1968550-547 SEP 872. APPLICABLE DOCUMENTS 2.1 Government specification, standard, and bulletin. Unless otherwise specified, the following specification, standard, and bulletin of the fssue Tisted in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, forma part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M- 38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMD's). (Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cTtd herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-853, provTsTons for the use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specifted Tn MIL-M-38510 and herein. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth tables. 3.2.2.1 Unprogrammed devices. The truth table for unprogrammed devices for contracts involving no altered Ttem araning shall be as specified on figure 2. When required in groups A, B, or C inspection (see 4.3), the devices shall be programmed by the manufacturer prior to test ina checkerboard or similar pattern (a minimum of 50 percent of the total number of bits programmed) or to any altered item drawing pattern which includes at least 25 percent of the total number of bits programmed. 3.2.2.2 Programmed devices. The requirements for supplying progranmed devices are not part of this drawing. 3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. STANDARDIZED SIZE MILITARY DRAWING A 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 3 DESC FORM 193A SEP 87 w U. 8. GOVERNMENT PRINTING OFFICE: 19B8549-904TABLE I. Electrical performance characteristics. | | | | I | Conditions | | | | | Test | Symbol | -55C < Tc < +125C | Group A | Devicel__ Limits | Unit | | GNB Zo Y |subgroups| types T | | | 4 45 V< Vcc < 5.5 | | Min | Max | {unless Otherwise specified| | | Input leakage current fe Vin = 5.5 and GND 1, 2,3] Al) +10 | nA iv] | Output leakage current |Io | Voyr = 5.5 and GND 1,2,3] Al +40 uA | output disabled | | Operating supply current] Icc | E/Es = Vyq_, INIT = Vin 1,2, 3] All | |} 120 | m (active) | | addtesses cycling. between | | | | | { OV and3 V; f = 1 |__| rn I | Input low voltage 2/ [Vii | Vec = 4.5 V and 5.5 V 1,2,3{ All 0.81 Vv 1 | | Input high voltage 2/ [Viv Voc = 4.5 and 5.5 V 1, 2, 3 All 2.0 v Output voltage low Vv Iq, = 16 mA, Vpy = 2-0 | 1, 2, 3 All 0.4, V P 9 You | Wk S atstys vit 0:8 V | | ! | | Output voltage high Vou logy = -4.mA, Vig = 2-0V 11,2, 3] Al 2.4| Vv pod yO Daisy, vp = 0.8 V | | | q . | Output short circuit IIgs Vo = GND 1,2, 3] All -20 | -90 mA current 3/ 4/ | | | | Input capacitance 4/ Cin = 1.0 MHz,1jy = OV | 4 All 5 pF = Tc = *25C, | T see 4,3,1c | T | Output capacitance 4/ [Coyy Veco = 5.5 [Vout = 0 | 8 1 1 Address setup to clock |tsa | See figures 3 and 4 19, 10, 11| Ol 45 | ns nap | Loe 03 35 | | | * | I | 04 25 | | 19 10, 11} 01 Address hold from clock 10 01,02, 0 ns nist he | 1 | | See footnotes at end of table. STANDARDIZED MILITARY DRAWING | 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION: LEVEL | SHEET DAYTON, OHIO 45404 A 4 DESC FORM 193A SEP 87 * U.S, GOVERNMENT PRINTING OFFICE: 1986-540-804TABLE I. Etectrical performance characteristics - Continued. I | | l I | | | Conditions | i | | Test | Symbol | -55C < Tc < +126C | Group A | Devicel Limits | Unit | | GND = 0 V |subgroups| types | i | 14 ice Senoo yf < 5.5 V | | | Min | Max | | luntess otherwise specified| | | { | | [ | qT | | | Clock high to valid Itcg iSee figures 3 and 4 19, 10, 111 ol | 25 | ns output i i \ | | | ! | 02,03 | {15 | | | | i o4 | i 12 | r | | | [ [ | | | | { 01,02, | \ | Clock pulse width 4/ |teuc 19, 10, 11) 03 7 20 | ns ~ TO TT i i | 104 | 15 I | [ | | i I | | { { | | 01,02, 1 i | (Es) Setup to gyock | ses | 19, 10, ui 03. | 15 j | ns ee eee wees | | | { 04 | i2 | | | | i I | [ T (Es) Hold from clock tyes | 19, 10, 111 01,02,) 5 | | ns Righ 4/ | | | | 03704"| | | | | I | | | | | [ T T I | i elay from INIT to validl tp] i 19, 10, 11] O01 ji | 35 | ns output 4/ I | i | ] I | | { | | 02,03, | | | I | | i oa | | 20 | I i T [ i I | i i { | 01,02, i | INIT recovery to clock |tp; | 19, 10, 11/ 03 | 20 | | ons high 4/ | | | [ I T T | | | 104 it 15 | { | [ i I i | INIT pulse width 4/ | tewt ! 19. 10, HI Sn | i ons ~ a a ee ! ! ! ! 02,03 | 20 | l ~~ . 7 | | { | Oo | 15 | | I | T I [ I | Valid output from clock [tcgs | 19, 10, 11. Oh | 30 | ns high 4/ 5/ | { | rs rr as 2 ! ! 02,03 | i 20 | rs rs ro | i | | 4 | { 15 | i I | I i I ] Inactive output from Ityzc | 19, lo, 11] o1 | {| 30 | ns clock high 4/ 5/ 6/ | | | | | | | 02,03 | | 20 | | i | | | { | 04 | | 15 | See footnotes at end of table. STANDARDIZED A MILITARY DRAWING 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 5 DESC FORM 193A SEP 87 # U. S. GOVERNMENT PRINTING OFFICE: 1988549-904TABLE I. Electrical performance characteristics - Continued. I | I | 1 | | | Conditions | | | Test | Symbol | -55C < Tc < +125C | Group A | Device] _ Limits _| Unit | | GND = 0 V |subgroups| types | | | 14.5 V < Veco < 5.5 | | | Min | Max | junless Otherwise specified! | | | | { | | | | 1 | Valid output from E low | DOE | See figures 3 and 4 |. 10, a oi {30 | ns ~ | ! 02,03 | | 20 | es ee eee 0 | | | 4d 15 | T | T | I Inactive output from | tuz7e | 19, 10, 11]_ 01 | 30. | as E high 4/ 6/ 7/ | | | | | ~ | | | | 02,03 | 20 | | | | | T | | ! | 04 15 | 1/ For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this measurement. 2/ These are absolute voltages with respect to device ground pin and include all overshoots due to system or tester noise. 3/ For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds. 4/ This parameter tested initially and after any design or process changes which could affect this parameter, therefore, shall be guaranteed to the limits specified in tabte I. 5/ Applies only when the synchronous (Es) function is used. . G/ Transition is measured at steady-state high level -500 mV or steady-state low level +500 m on the output from the 1.5 V level on the input with loads shown on figure 3, circuit B. 7/ Applies only when the asynchronous (E) function is used. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements, The electrical test requirements shall be the subgroups specified in table [T. The electrical test for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein}. The part shall be marked with the part number listed in 1.2 herein. In addition, the manufacturer's part number may also be marked as listed in MIL-BUL-103 (see 6.6 herein). 3.6 Processing options. Since the PROM is an unprogrammed memory capable of being programmed by either the manufacturer or the user to result in a wide variety of PROM configurations, two processing options are provided for selection in the contract, using an altered item drawing. 3.6.1 Unprogrammed PROM delivered to the user. All testing shall be verified through group A testing as defined in 4.3.1. It is recommended that users perform subgroups 7 and 9 after programming to verify specific prograin configuration. STANDARDIZED A 5962-88736 MILITARY DRAWING - DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 6 DESC FORM 193A SEP 87 # U. S, GOVERNMENT PRINTING OFFICE: 1968-550-547I | | | Device | 01-04 | { types | | T | Ty | | Case | KL | 3 J | outlines | | | T T ] | Terminal | Terminal | {number | symbol | T T I | | 1 | Az { nc | | 2 | Ag I Ay | | 3 | Ag 1 Ag { | 4 1 Aq 1 Ag | | 5 1 A3 | Ag | | 6 ! Ao | A3 | | 7 | Ay | Ap | | 8 | Ag | Ay | | 9 | 09 1 Ag | { 10 | 01 | NC | } 1 10 | Qo | |} 12 | GND 1 04 I | 13 | 03 10, | | 14 = | 04 | GND | | 15 | 0g | NC I | 16 | 06 1 03 | | 7 | 07 | 04 | | 18 | cP 105 | | 19 E/Es | 06 | 20 | INIT [07 | f 21 | Aig | nc | | 22 | Ag | cp} 23 | Ag E/Es | | 24 | | INIT | | 25 |S Tao | { 26 i --- | Ag | eee 28 --- Y | | pe | FIGURE 1. Terminal connections. STANDARDIZED SIZE MILITARY DRAWING A 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 7 DESC FORM 193A SEP 87 % U. 8. GOVERNMENT PRINTING OFFICE: 1988549-904T | | | | Pin function \ | q { | T i [ I I {Mode | Read or output disable (See [cP | E/Es | INIT [See | Outputs | | | inote | i | Inote | | a me Ek | I | Ao | Ag | | LX | { | i | | | i { | { { T | T I | [ | [ { | Other [See |PGM | VFY [Vpp See | Outputs | | | inote | | | inote | | i | 174 | | 17 | | | i lAg | i i \Ag | | { \ IARI | | 1Ay | { | i { | | { | i | qT | i | { I | [Read (see notes 2 and 3) {xX |X ae IWyyH 1X [Data out | { | i { | | | | i | | | I [Output disable (see nute 5) xX |X [YrH Vin | X High Z | | | { { q : i | | | I {Program (see notes 1 ind 4) X erp rue iVpp |X [Data in | | | i | { i l | | | | [ | | IProgram verify (see nites 1 and 4) LX igup Wipe \Vpp |X [Data out | | | | | { | i | | \ i | i | | | [Program inhibit (see 1otes 1 and 4) |X [ryp UWrup \Vpp |X jHigh Z | | i | | | | \ | | | i I | | [ | lIntelligent program (see notes 1 and 4) | X iypp Tryp \V\pp |X (Data in | | | | | | \ { | I ! | | [ | [Program sync enable (see note 4) Wrup iYiep (Yaa \Ypp \Vpp [High Z | i | | { | | I | | | I | I {Program initial byte see note 4) Wiip iqep Uqup i\Vpp |\Vpp [Data in | | i { | i \ | [ | i | | i | | iBlank check ones {see notes 1, 4, and 6)! X !Vpp iViip IVipp | X Ones | | | i | | | \ | T | i | { I I | [Blank check zeros (see notes 1, 4, |X Vpp iyyp \Virp IX [Zeros i { and 6) i | [ | \ NOTES: 1. = don't care, but not to exceed Vpp, Vyyp = 3-0 , Vi_p = 0-4 V. 2. During read operation, the output latches are loaded on a Q" to L" transition of CP. 3. In the synchronous mode, pin Es must be low prior to the "Oo" to "1" transition on CP that loads the register. 4. During programming and verification, all unspecified pins to be at Vyi,p- 5. In the synchronous mode, pin Ex must be high prior to the "Oo" to "L" transition on CP that loads the register. 6. This parameter not applicable to device types 03 and 04. 7. See 6.6. FIGURE 2. Truth table. STANDARD'ZED A MILITARY DRAWING 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 8 DESC FORM 193A SEP 87 x U. S. GOVERNMENT PRINTING OFFICE: 1988549-9042500, 5V OUTPUT ] 50 pF 1672 SEE = NOTE3 + CIRCUIT A NOTES: 2. Circuit B #s for ty7 and tyzp. 3. Minimum, including jig and scope. FIGURE 3. 5yo mee L CIRCUIT B Qutput load circuits. ALL_INPUT PULSES 2502 5 1 1672, SEE NOTE 3 = B 1. Circuit A is for all switching characteristics except ty7c and tyzp. 3.0 V 90% 90% 9, a, GND 1IO% - 10% <5 ns <5 ns FIGURE 4. Switching waveforms. STANDARDIZED A MILITARY DRAWING 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A g DESC FORM 193A SEP 87 ve U. S. GOVERNMENT PRINTING OFFICE: 1988549-9047 +1 sin fe] t =F c PF AMI : Eat keel lial Pe my Pm! ee tR | z tpwi NOTES: 1. Ensure that adequate decoupling capacitance is employed across the device Vcc and ground terminals, Multiple capacitors are recommended, including a 0.1 uF or larger capacitor and a 0.01 uF or smaller capacitor, placed as close to the device terminals as possible. Inadequate decoupling may result in large variations of power supply voltage, creating erroneous function or transient performance failures. 2. Do not leave any input disconnected (floating) during any tests. 3. Do not attempt to perform threshold tests under ac conditions. Large amplitude fast ground current transients normally occur as the device outputs discharge the load capacitances. These transients flowing through the parasitic inductance between the device ground pin and the test system ground can create significant reductions in observable input noise immunity. 4. Output levels are measured at 1.5 Y reference levels. 5. Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on output from the 1.5 V level on inputs with load shown on figure 3. 6. Tests are performed with rise and fall times of 5 ns or less. 7. See above waveform for tyzc and ty7r. 8. All device test loads shiata be located within two inches of device outputs. FIGURE 4, Switching waveforms - Continued. STANDARDIZED A MILITARY DRAWING 5962-88738 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 10 DESC FORM 193A ve U. S. GOVERNMENT PRINTING OFFICE: 1968549-904 SEP 873.6.2 3.9.1 section a. method assurance provisions herein, including the requirements of the altered item drawing shall be satisfied by the manufacturer prior to delivery. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be Tisted as an approved source of supply in MIL~BUL-103 (see 6.6). The certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-STD-883 (see 3,1 herein} and the requirements herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) sha e provided with each lot of microcircuits delivered to this drawing. 3.9 Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 (See 3.I herein). to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection, Sampling and inspection procedures shall be in accordance with 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with criteria shall apply. Manufacturer-programmed PROM delivered to the user. All testing requirements and quality Verification and review. DESC, DESC's agent, and the acquiring activity retain the option 0 ~M- to the extent specified in MIL-STD-883 (see 3.1 herein). Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C or D using the circuit submitted with the certificate of compliance (see 3.7 herein). (2) Ta = +125C, minimum. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. -SID- including groups A, B, C, and D inspections. The following additional STANDARDIZED SIZE MILITARY DRAWING A 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 7 DESC FORM 193A SEP 87 & U.S, GOVERNMENT PRINTING OFFICE: 1988550-5474.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (Cyy and Coyy measurements) shall be measured only for the initial test and after process or design changes which may affect capacitance. Sample size is 15 devices with no failures, and all input and output terminals tested. d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of group A, subgroups 9, 10, and 11. (1) (2) A sample shall be selected to satisfy programmability requirements prior to performing subgroup 9. Twelve devices shall be submitted to programming (see 3.2.2.1). If more than two devices fail to program, the Tot shall be rejected. At the manufacturer's option, the sample may be increased to 24 total devices with no more than four total device failures allowable. Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be increased to 20 total devices with no more than four total device failures allowable. TABLE II. Electrical test requirements. 1/ 2/ 3/ 4/ Subgroups (per method 5005, table I) MIL-STD-883 test requirements | | | + | I electrical parameters (method 5005) ] t | | | | T } | Interim electrical parameters --- | (method 5004) | T t | | Final electrical test parameters | 1*,2,3,7*,8 | | (method 5004) (for unprogrammed!| | | devices) | | | T } | Final electrical test parameters | 1*,2,3,7*, | | (method 5004) (for programmed | 3,9 | | devices) | | T T l | Group A test requirements { 1,2,3,4**,7, | | (method 5005) | 8,9,10,11 { T yy I | Groups C and D end-point 2,3,7,8 | | | | 1/ * PDA applies to subgroups 1 and 7. 2/ ** See 4.3.1: 3/ Any subgroups at the same temperature may be combined when using a multifunction tester. 4/ For all electrical tests, the device shall be ~ programmed te the pattern specified. MALFTARY DRAWING A 5962-88735 DEFEMEE ELECTRONICS SUPPLY CENTER RRVBION LEVEL oeeT DAY TOR, OHIQ 45444 A iz. DESC FORM 193A 2 U. . GOVERNMENT PRINTING OFFICE: 1988550-547 SEP 874.3.2 Groups C and D inspections. a. End-point electrical parameters shal] be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C or D using the circuit submitted with the certificate of compliance (see 3.7 herein). (2) Ty = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specificatTons do not exist and qualified military devices that will perform the required function are not available for GEM application. When a military specification exists and the product covered by this drawing has been qualified for listing on QPL-38510, the device specified herein will be Inactivated and will not be used for new design. The QPL-38510 product shall be the preferred item for all applications. 6.2 Replaceability. Microcircuits covered by this drawing wil? replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-481 using DD Form 1693, Engineering Change Proposal (Short Form). 6.4 Record of users. Military and industrial users shail inform Defense Electronics Supply Center when a system application requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DESC-ECS, telephone (513) 296-6022. 6.5 Comments. Comments on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or telephone 513-296-5375. STANDARDIZED SIZE MILITARY DRAWING A 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A B DESC FORM 193A U. S. GOVERNMENT PRINTING OFFICE: 19B8-550-547 SEP 876.6 Approved sources of supply. Approved sources of supply are listed in MIL-BUL-103. Additional sources will be added to MIL-BUL-103 as they become available. The vendors listed in MIL-BUL-103 have agreed to this drawing and a certificate of compliance (see 3.7 herein) has been submitted to and accepted DESC-ECS. purposes only and are current only to the date of the last action of this document. The approved sources of supply listed below are for information | T Vendor | Vendor | Replacement I | Military drawing [| CAGE | ~~ similar part Imilitary specification | part number number | vendor 1/ 2/ 3/ | part number | | ~ I | ] ] | J | 5962-8873501LX | 65786 | CY7C245-45DMB | I | | 66579 | WS57C45-45KMB | | | I | J l | 5962-8873501KX | 65786 | Y7C245-45KMB | | | 1 66579 | S57C45-45HMB | | | ] I t | | 5962-88735013X | 65786 | CY7C245-45LMB | { | f 66579 | WS57C45-45ZMB I | | | I I I | 5962-8873502LX | 65786 {| CY7C245-35DMB | | | | 66579 | WS57C45-35KMB | | | ] J | ] | 5962-887 3502KX [ 65786 | CY7C245-35KMB | ] | 1 66579 | WS57C45-35HMB | | | I | | l | 5962-887 35023X 1 65786 | CyY7C245-35LMB | | I 1 66579 | WS57C45-352MB I I I ] | T T | 5962-887 3503LX | 65786 | CY7C245A-35DMB | | | 1 66579 | WS57C45-35KMB | | | I I T y | 5962-887 3503KX | 65786 | CY7C245A-35KMB | | | | 66579 | WS57C45-35HMB I | | T | | | 1 5962-88735033X | 65786 | CY7C245A-35LMB | | | | 66579 | WS57C45-35ZMB ! | | I T ] | | 5962-8873504LX | 65786 | CY7C245A-25DMB { | | } 66579 | WS57C45-25KMB ! | ] I ] | | | 5962-887 3504KX | 65786 | CY7C245A-25KMB | | | | 66579 | wWS57C45-25HMB | | To I | | | | 5962-88735043X 1 65786 | CY7C245A-25LMB | | I {| 66579 | WS57C45-25ZMB | | 1/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 2/ Ag for device types 01 through 04 for vendor CAGE 66579. Ap for dvice types 01 and 02; A3 for device types 03 and 04 vendor CAGE 65786 (see figure 2). 3/ Ay for device types 01 through 04 for vendor CAGE 66579, Ay for device types 01 and 02; Ag for device types G3 and 04 for vendor CAGE 65786 (see figure 2). STANDARDIZED "" MILITARY DRAWING 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL. SHEET DAYTON, OHIO 45444 A 14 DESC FORM 193A SEP 87 tr U.S. GOVERNMENT PRINTING OFFICE: 1988-550-547Vendor CAGE Vendor name number and address 65786 Cypress Semiconductor, Corporation 3901 North First Street San Jose, CA 95134 66579 Waferscale Integration, Incorporated 47280 Kato Road Fremont, CA 94538 STANDARDIZED A MILITARY DRAWING 5962-88735 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 15 DESC FORM 193A SEP 87 % U.S. GOVERNMENT PRINTING OFFICE: 198B5SS0-547