TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
1 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
1.0 OBJECTIVE
This specification defines the performance, test, quality and reliability requirements of Crimp-to-Wire Mini-
PV (TM) receptacles and Mini-Latch housings.
2.0 SCOPE
This specification is applicable to the termination characteristics of the Crimp-to-Wire Mini-PV (TM) receptacles
and Mini-Latch housings which are designed for interconnection of discrete wires and
0.025 inch round or square pins.
These connectors provide only the receptacle half of the interconnection and are designed to mate with
single or double rows of pins, free standing or in headers, on 0.100, 0.125, 0.150 or 0.156 inch centers.
3.0 GENERAL
This document is composed of the following sections:
Paragraph Title
1.0 OBJECTIVE
2.0 SCOPE
3.0 GENERAL
4.0 APPLICABLE DOCUMENTS
5.0 REQUIREMENTS
5.1 Qualification
5.2 Material
5.3 Finish
5.4 Design and Construction
6.0 ELECTRICAL CHARACTERISTICS
7.0 MECHANICAL CHARACTERISTICS
8.0 ENVIRONMENTAL CONDITIONS
9.0 QUALITY ASSURANCE PROVISIONS
9.1 Equipment Calibration
9.2 Inspection Conditions
9.3 Sample Quantity and Description
9.4 Acceptance
9.5 Qualification Testing
9.6 Requalification Testing
TABLE VI QUALIFICATION TEST MATRIX
3.1 Banned/Restricted Substances
All product where the part number ends in “LF” meet the European Union directives and other
country regulations as described in GS-22-008. The part numbers that do not end in “LF” meet all
regulations except for Pb in SnPb plating, if available. Tin plated “LF” product has 100% tin plating
in the interface and has not been tested for whisker growth in all interconnect environments.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
2 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
3.2 Manufacturing Processability
This product is not designed to be exposed to manufacturing solder processes.
4.0 APPLICABLE DOCUMENTS
4.1 Specifications
4.1.1 Engineering drawings
4.1.2 Process drawings
4.1.3 MIL-G-45204: Electrodeposited Gold
4.1.4 MIL-W-16878: High Temperature Insulated Electrical Wire
4.2 Military Standards
4.2.1 MIL-STD-1344: Test Methods for Electrical Connectors
4.2.2 MIL-STD-202: Test Methods for Electronic and Electrical Component Parts.
4.3 Federal Specifications
4.3.1 QQ-N-290: Nickel Plating (Electrodeposited)
4.3.2 QQ-B-613: Leaded and Non-Leaded Brass
4.4 Other Standards and Specifications
4.4.1 UL94-V0: Flammability
4.4.2 ASTM B579: Electrodeposited Coatings of Tin-Lead Alloy
4.4.3 ASTM B122: Copper-Nickel-Tin Alloy, Copper-Nickel-Zinc Alloy (Nickel Silver), and Copper-
Nickel Alloy Plate, Sheet, Strip and Rolled Bar
4.4.4 ASTM B-194: Copper-Beryllium Alloy Plate, Sheet, Strip and Rolled Bar
4.4.5 ANSI/ASQC M-1: American National Standard for Calibration Systems
4.4.6 BUS-03-404: FCI Test Specification for Normal Force Measurements
4.4.7 BUS-03-302: FCI Test Specification for Sulfide Vapor Test
4.4.8 TA-75: FCI Latch Housing Mini-PV Crimp/Application Data
5.0 REQUIREMENTS
5.1 Qualification
Terminals furnished under this specification shall be capable of meeting the qualification test
requirements specified herein.
5.2 Material
The material for each component shall be as specified herein or equivalent.
5.2.1 Body. The contact body shall be Quarter-Hard Brass Alloy UNS C26000 in accordance with
QQ-B-613 or Quarter-Hard CuNi Alloy UNS 72500 in accordance with ASTM B122.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
3 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
5.2.2 Spring. The contact spring shall be Half-Hard, Beryllium Copper Alloy UNS C17200 in
accordance with ASTM B-194 heat treated to full hard condition.
5.2.3 Housing. The latch housings shall be of the material specified on the product
drawings.Materials shall have a flame retardant rating of UL94-V0.
5.2.4 Polarizing Plug. The plug shall be of the material specified on the product drawings.Materials
shall have a flame retardant rating of UL94-V0.
5.3 Finish
The finish for applicable components shall be as specified herein or equivalent.
5.3.1 Contact Body. As specified by the product drawings, the contact body shall be plated in the
contact area with the specified gold plating thickness per MIL-G-45204, Type II,Grade C over
50 microinches nickel per QQ-N-290,Class 2, or shall be plated with tin-lead in accordance
with ASTM B579. Lead free tin plating is also available, the material shall be hot dip tin coated
with a thickness of 100-160 micro inches.
5.3.2 Spring. The contact spring shall be plated with a flash of gold per MIL-G-45204, Type II, Grade C
over 50 microinches nickel per QQ-N-290, Class 2 or where specified on the product drawing with
tin-lead in accordance with ASTM B579. Lead free tin plating is also available, plated per GS-46-
001 (Confidential).
5.4 Design and Construction
Terminals and housings shall be of the design, construction and physical dimensions specified on
the applicable product drawing.
These crimp-to-wire terminals are designed to be either individually mated with pins without a
housing or inserted into a Mini-Latch or Rod Housing and connected to a header or bare pin field.
They are designed to crimp to discrete stranded 18 to 36 AWG wire. Hand tools and bench
mounted applicators are available for crimping terminals.
The terminals are available in a choice of spring thicknesses to provide several levels of contact
normal force.
5.5 Polarization/Keying/Latching.
Polarization and /or keying of the connector is accomplished through the use of individual polarizing
plugs inserted into selected contact positions. As an option, in some cases one or more housing
positions can be molded closed. In either case, the polarized position is rendered non-functional.
Special external polarization, keying and/or latching features are available depending on part
number and specific requirements.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
4 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
6.0 Electrical Characteristics
6.1 Current Rating - The maximum current rating of the connector is dependent on wire size and
housing/circuit geometry. Figure 1 shows typical graphs of the temperature rise as a function of
current for various wire sizes. Figure1A shows typical graphs of temperature rise as a function of
current for various wire sizes as they were tested in a dense pack (2x36 position) housing. Figure 2
shows temperature rise profiles based on current applied. Charts for Figure 1 and 2 show test results
of PV's that were tested in a single position housing except for 18 and 20 AWG. These are not
recommended for use in a Mini Latch housing.
6.2 Contact Resistance, Low Level - After environmental testing, the change in contact resistance of the
mated connector shall not exceed 2 milliohms when measured in accordance with MIL-STD-1344,
Method 3002. The following details shall apply:
a. Method of Connection - Attach current and voltage leads as shown in Figure 3
b. Test Voltage - 20 millivolts DC max open circuit.
c. Test Current - Not to exceed 100 milliamperes.
6.3 Crimp Resistance, Low Level - When properly crimped, the change in crimp resistance shall not exceed
1 milliohms for wire sizes 18-30 AWG. The change in crimp resistance for 32-36 AWG shall not exceed
2 milliohms. Crimp resistance shall be measured in accordance with MIL-STD-1344, Method 3002. The
following details shall apply:
a. Method of Connection - Attach current and voltage leads as shown in Figure 3A.
b. Test Voltage - 20 millivolts DC max open circuit.
c. Test Current - Not to exceed 100 milliamperes.
6.4 Insulation Resistance - The insulation resistance of unmated terminals, properly mounted in Mini-Latch
housings, shall not be less than 10,000 megohms ( 5000 megohms after exposure to the humidity
environment described below) when measured in accordance with MIL-STD-202,Method 302. The
following details shall apply:
a. Test Voltage - 500 volts DC
b. Electrification Time - 2 minutes
c. Points of Measurement - Between adjacent and opposing contacts.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
5 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
6 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
7 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
6.5 Dielectric Withstanding Voltage - There shall be no evidence of arc-over,insulation breakdown, or
excessive leakage current (> 1 milliampere) when the unmated connector is tested in accordance with
MIL-STD-1344, Method 3003. The following details shall apply:
a. Test Voltage - 1000 volts RMS, 60 Hz
b. Test Duration - 60 seconds
c. Test Condition - 1 (760 Torr - sea level)
d. Points of Measurement - between adjacent and opposing contacts.
6.6 Capacitance - The capacitance between adjacent or opposing contacts in an unmated connector shall
not exceed 0.5 picofarads when measured in accordance with MIL-STD-202, Method 305, at a
frequency of 100 kilohertz.
7.0 Mechanical Characteristics
7.1 Contact Retention - Each individual contact shall withstand an axial load of 4.0 pounds applied to the
terminating wire without dislodgement from the housing cavity.
7.2 Normal Force - The minimum contact normal forces shall be as shown in Table I when tested in
accordance with FCI Test Specification BUS-03-404, by the Probe Method ( par 3.2) at a deflection
equivalent to a 0.024" gauge pin. This requirement must be met before and after environmental
testing. (See Figure 4 ).
TABLE I - CONTACT NORMAL FORCE
Spring Thickness (Mils) Force (Grams)
3.5 150
4.8 375
5.8 575
6.5 700
7.3 Total Mating Force - The total force to mate the connectors with an appropriately populated header
consisting of properly configured 0.025 inch square pins (see Figure 6) shall be approximately the
value shown in Table II, for the selected spring thickness, times the number of contacts.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
8 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
9 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
10 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
TABLE II - MATING FORCES
Spring Thickness (Mils) Force (Grams)
3.5 150
4.8 300
5.8 525
6.5 725
7.4 Individual Contact Insertion Force - When measured using a maximum guage pin configured as shown
in Figure 5, the typical individual contact insertion force shall not be greater than the value shown in
Table III.
7.5 Individual Contact Withdrawal Force - After five insertions using a maximum guage pin configured as
shown in Figure 5, the typical individual contact withdrawal force shall not be less than the value shown
in Table III when measured using a minimum guage pin configured as shown in Figure 5.
TABLE III - CONTACT FORCES
Contact Force (Grams)
Spring Thickness (Mils) Insertion (Max) Withdrawal (Min)
3.5 240 45
4.8 450 75
5.8 700 130
6.5 1100 175
7.6 Durability - After 1000 mating/unmating cycles with 0.025 inch square pin standard Bergstik (R)
Headers, , the 15 u" gold contact (or heavier gold plating) terminals shall be again mated and then
subjected to a moist Hydrogen Sulfide atmosphere (approximately 3 ppm). After 48 hours of H2S per
BUS-03-302, the change in contact resistance shall not exceed 2 milliohms for any spring thickness.
7.7 Tensile Strength, Crimp - The force required to pull the properly crimped wire (per TA-75) from the
terminal shall not be less than the value specified in Table IV when tested in accordance with MIL-
STD-1344, Method 2003, at a cross-head parting speed of one inch per minute maximum.
TABLE IV - CRIMP TENSILE STRENGTH
Wire Size, AWG Strength, Lbs Wire Size, AWG Strength, Lbs
18 32.0 28 5.0
20 28.0 30 2.5
22 16.0 32 1.5
24 11.0 34 1.0
26 6.5 36 0.5
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
11 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
7.8 Probe Damage - After testing in accordance with MIL-STD-1344, Method 2006, the individual contact
withdrawal force shall not be less than the value specified in Table III (see paragraph 7.5). The
following details shall apply:
a. Moment - 0.125 inch pounds (A= 0.025)
b. Probe Depth - To reach apex of spring
c. Stress Point - Contact spring member only
8.0 Environmental Conditions
After exposure to the following environmental conditions in accordance with the specified test procedure and/or
details, the product shall show no physical damage and shall meet the electrical and mechanical requirements
per paragraphs 6.0 and 7.0 as specified in the Table VI test sequences.
8.1 Thermal Shock - MIL-STD-202, Method 107, Unmated.
a. Temperature Range - Between -55 and + 105 deg C
b. Time at Each Temperature - Per sample mass
c. Transfer Time - 5 minutes, maximum
d. Number of Cycles - 5
8.2 Humidity - MIL-STD-1344, Method 1002, Type I, Unmated. Measurements taken within one hour of
removal from humidity chamber.
a. Test Temperature - + 40 +/- 2 deg C.
b. Test Duration - 96 hour
c. Test Relative Humidity - 90-95%
d. Test Condition - B
8.3 High Temperature Life - MIL-STD-1344, Method 1005, Mated.
a. Test Temperature - 3 ( +85 +/- 3 deg C)
b. Test Duration - B (250 hours)
c. Operating Conditions - rated current (see paragraph 6.1, Figure 1A) through all contacts
d. Duty Cycle - 45 minutes ON, 15 minutes OFF
8.4 Shock - MIL-STD-1344, Method 2004, Test Condition A, Mated. During and after each shock, the
contacts shall evidence no discontinuity greater than one microsecond.
8.5 Vibration - MIL-STD-1344, Method 2005, Test Condition III, Mated. During vibration along each axis, the
contacts shall evidence no discontinuity greater than one microsecond.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
12 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
8.6 Flowers of Sulphur - Unmated.
a. Test Medium - Flowers of Sulphur
b. Test Relative Humidity - 80%
c. Test Temperature - + 65 +/- 5 deg C.
e. Test Duration - 240 hours.
f. Disturbance Prior to Electrical Test - 5 matings with male header.
8.7 Salt Spray - For 15 u" or greater gold plated terminals only. MIL-STD-1344, Method 1001, Test
Condition B, Mated and Unmated.
a. Test Atmosphere - 5% Salt Fog
9.0 QUALITY ASSURANCE PROVISIONS
9.1 Equipment Calibration
All test equipment and inspection facilities used in the performance of any test shall be maintained in a
calibration system in accordance with ISO 9001/9002 and ANSI/ASQC M-1.
9.2 Inspection Conditions
Unless otherwise specified herein, all inspections shall be performed under the following ambient
conditions:
a. Temperature - + 25 +/- 5 deg C.
b. Relative Humidity - 30% to 60%.
c. Barometric Pressure - Local ambient
9.3 Sample Quantity and Description
9.3.1 Connector - Ten (10) of the largest and seven (7) of the smallest population connectors shall be
subjected to the qualification inspection. A separate group of seventeen (17) connectors shall be
subjected to test for each combination of retention spring thickness, contact area plating, and
housing contact spacing.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
13 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
9.3.2 Contact - Sixty (60) contacts crimped to each size wire as specified in Table V shall be
subjected to the qualification inspection. A separate group of sixty (60) contacts shall be
subjected to test for each combination of contact area, plating and wire size.
TABLE V - CONTACT SAMPLES
Wire Size, AWG CRIMP HEIGHT
MINIMUM MAXIMUM
18 X
20 X
22 X
26 X
28 X
32 X
34 X
36 X
9.4 Preparation of Samples
9.4.1 Mating Headers - Seventeen (17) mating headers, ten of the largest and seven of the smallest
population, configured and conforming to the requirements of Figure 6 shall be prepared.
9.4.2 Receptacles
Sample
Numbe
r
Description
Quantity
Connector
Assemblie
s
Number o
f
Terminals
Tested
1 Individuals contacts crimped to each size wire as specified in table V. 0 30ea.
2 Individual contacts crimped each size wire as specified in table V. 0 30ea.
3 3 largest & 3 smallest populated connectors terminals crimped to wire 6 30*ea.
4 3 largest populated connector with terminals crimped without wires. 3 30
5 1 largest & 1 smallest populated connectors with terminals crimped to
dual wires 2 All
6 2 largest & 2 smallest populated connectors with terminals crimped to
dual wires 4 All
7 1 largest & 1 smallest populated connectors with terminals crimped to
dual wires. 2 All
*NOTE: Except all contacts used for total mating force.
*NOTE: Except use a total of 30 contacts for individuals contact insertion/withdrawal forces.
9.4.3 Stranded Wire - All stranded wire used in these qualification test samples shall conform to the
requirements of MIL-W-16878, Type B.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
14 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
9.5 Acceptance
9.5.1 Electrical and mechanical requirements placed on test samples as indicated in paragraphs 6.0
and 7.0 shall be established from test data using appropriate statistical techniques or shall
otherwise be customer specified,and all samples tested in accordance with this product
specification shall meet the stated requirements.
9.5.2 Failures attributed to equipment, test setup, or operator error shall not disqualify the product. If
product failure occurs, corrective action shall be taken and samples resubmitted for qualification.
9.6 Qualification Testing
Qualification testing shall be performed on sample units produced with equipment and procedures
normally used in production. The test sequence shall be as shown in Table VI.
9.7 Requalification Testing
If any of the following conditions occur, the responsible product engineer shall initiate requalification
testing consisting of all applicable parts of the qualification test matrix, Table VI.
a. A significant design change is made to the existing product which impacts the product form, fit or
function. Examples of significant changes shall include, but not be limited to, changes in the
plating material composition or thickness, contact force, contact surface geometry, contact base
material, or contact lubrication requirements.
b. A significant change is made to the manufacturing process which impacts the product form, fit or
function.
c. A significant event occurs during production or end use requiring corrective action to be taken
relative to the product design or manufacturing process.
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
15 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
TYPE PRODUCT SPECIFICATION NUMBER BUS-12-067
TITLE PAGE REVISION
16 of 16 K
AUTHORIZED BY DATE
Crimp-to Wire, Mini-PV™ Receptacles and Mini-Latch Housings
H.T. Brewbaker 31-May-06
CLASSIFICATION
UNRESTRICTED
Copyright FCI
Form E-3334
Rev E
GS-01-001
REVISION RECORD
REV PAGE DESCRIPTION EC# DATE
A 9 Change withdrawal forces from 100 to 75 V13467 05/13/86
B All 3.5.5 Realign sentence V13871 02/19/87
3.6.6 Added, .000015 Au & 1000 Cycles
3.7.2 Test Condition "A" change to "B"
3.5.3 Added L.L. Crimp Resistance to Table IX
3.5.6 Added Capacitance to Table IX
3.5.3 Added L.L. Crimp Resistance to Table XI
3.5.6 Added Capacitance to Table XI
C All V11789 05/25/91
D 1,3, 1.1 Add "Pin" V31896 11/02/93
6,8 3.3.2 Add "Over 50 m"..."
3.6.2 Add 5.8
3.6.3 Add 5.8
3.6.5 Add 5.8
E All Rewrite V51420 03/07/96
F 8 Add DIM. “D” to Figure 5 and change guardian V81285 07/22/98
G All Revised format to be consistent with V01904 07/31/00
GS-01-001, and change BERG, Dupont,
etc. references to FCI.
H 3 5.2.3 Changed V-1 or better to V-0 V20332 02/13/02
5.2.4 Changed V-1 or better to V-0
J 1, 3 Add sections 3.1 and 3.2, add LF information to section V05-1112 12/13/05
section 5.3.1 and 5.3.2.
K All Change logo V06-0526 05/31/06
PDM: Rev:K Released .STATUS: Printed: Nov 28, 2010
Mouser Electronics
Authorized Distributor
Click to View Pricing, Inventory, Delivery & Lifecycle Information:
FCI:
47649-000LF 65039-034LF 65039-026LF 78211-007LF 78211-015LF 78211-003LF 65039-030LF 65039-022LF
65039-020LF 78211-009LF 65039-036LF 65039-028LF 65039-032LF 65039-024LF 78211-005LF 78211-010LF
65039-031LF 65039-023LF 78211-006LF 78211-014LF 65039-019LF 65039-027LF 65039-035LF 65039-017LF
65039-033LF 65039-025LF 78211-004LF 78211-012LF 69176-030LF 65039-029LF 78211-008LF 65039-021LF
65043-030LF 67954-001LF 65043-034LF 65043-032LF 67954-002LF 65043-035LF 65043-031LF 48258-000LF
48239-000LF 48238-000LF 48248-000LF 65846-033LF 48049-000LF 48048-000LF 65043-033LF 65043-002LF
47213-000LF 47446-000LF 47648-000LF 48047-000LF 48241-000LF 48244-000LF 48247-000LF 48249-000LF
48253-000LF 48256-000LF 65039-002LF 65039-003LF 65039-004LF 65039-006LF 65039-007LF 65039-008LF
65039-009LF 65039-010LF 65039-011LF 65039-013LF 65039-014LF 65039-015LF 65039-016LF 65043-006LF
65043-008LF 65043-014LF 65846-013LF 65846-018LF 65846-021LF 65846-023LF 65846-025LF 65846-026LF
65846-027LF 65846-028LF 65846-029LF 65846-030LF 65846-031LF 65846-032LF 65846-034LF 65846-035LF
67954-003LF 75543-015LF 75543-017LF 48234-000LF 48232-000LF 48236-000LF 48237-000LF 48233-000LF
48235-000LF 48254-000LF 48250-000LF 48252-000LF
