
xr
XRK49911
REV. 1.0.0
3.3V HIGH-SPEED (110 MHZ) PROGRAMMABLE SKEW CLOCK BUFFER
9
NOTES:
9. Test measurement levels for the XRK49911 are TTL levels (1.5V to 1.5V). Test conditions assume signal transition
times of 2 ns or less and output loading as shown in the AC Test Loads and Waveforms unless otherwise
specified.
10. SKEW is defined as the time between the earliest and the latest output transition among all outputs for which the
same tU delay has been selected when all are loaded with 30pF and terminated with 50
Ω
to VCC/2.
SWITCHING CHARACTERISTICS
OVER THE 3.3V + 10% OPERATING RANGE [2,9
]
SYMBOL DESCRIPTION
XRK49911-2 XRK49911-5 XRK49911-7
UNIT
MIN TYP MAX MIN TYP MAX MIN TYP MAX
tRPWH CLKIN Pulse Width HIGH 4 4 4 ns
tRPWL CLKIN Pulse Width LOW 4 4 4 ns
tuProgrammable Skew Unit See Table 1
tSKEWPR Zero Output Matched-Pair Skew
(Qx[1:0]) [10, 11]
0.05 0.2 0.1 0.25 0.1 0.25 ns
tSKEW0 Zero Output Skew (All Outputs) [10, 12] 0.1 0.25 0.25 0.5 0.3 0.75 ns
tSKEW1 Output Skew (Rise-Rise, Fall-Fall,
Same Class Outputs) [10, 13]
0.25 0.5 0.6 0.7 0.6 1ns
tSKEW2 Output Skew (Rise-Fall, Nominal-
Inverted, Divided-Divided) [10, 13]
0.3 10.5 1 1 1.5 ns
tSKEW3 Output Skew (Rise-Rise, Fall-Fall,
Different Class Outputs) [10, 13]
0.25 0.5 0.5 0.7 0.7 1.2 ns
tSKEW4 Output Skew (Rise-Fall, Nominal-
Divided, Divided-Inverted [10, 13]
0.5 0.9 0.5 11.2 1.7 ns
tDEV Device-to-Device Skew [14, 15] 0.75 1.25 1.65 ns
tPD Propagation Delay, CLKIN Rise to
FB_IN Rise
-0.25 00.25 -0.5 00.5 -0.7 00.7 ns
tODCV Output Duty Cycle Variation [16] -0.65 00.65 -1 0 1 -1.2 01.2 ns
tPWH Output HIGH Time Deviation from 50%
[17]
2.0 2.5 3ns
tPWL Output LOW Time Deviation from 50%
[17]
1.5 33.5 ns
tORISE Output Rise Time [17, 18] 0.15 11.2 0.15 11.5 0.15 1.5 2.5 ns
tOFALL Output Fall Time [17, 18] 0.15 11.2 0.15 11.5 0.15 1.5 2.5 ns
tLOCK PLL Lock Time [19] 0.5 0.5 0.5 ms
tJR Cycle-to-Cycle Output
Jitter
RMS [14] 25 25 25 ps
Peak-to-Peak
[14]
200 200 200