IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFERTM JR. IDT5T9070 NRND NOT RECOMMENDED FOR NEW DESIGNS DESCRIPTION: FEATURES: * * * * * * * * * * * The IDT5T9070 2.5V single data rate (SDR) clock buffer is a single-ended input to ten single-ended outputs buffer built on advanced metal CMOS technology. The SDR clock buffer fanout from a single input to ten single-ended outputs reduces the loading on the preceding driver and provides an efficient clock distribution network. The IDT5T9070 has two output banks that can be asynchronously enabled/ disabled. Multiple power and grounds reduce noise. Optimized for 2.5V LVTTL Guaranteed Low Skew < 125ps (max) Very low duty cycle distortion < 300ps (max) High speed propagation delay < 2ns. (max) Up to 200MHz operation Very low CMOS power levels Hot insertable and over-voltage tolerant inputs 1:10 fanout buffer 2.5V VDD Available in TSSOP package NOT RECOMMENDED FOR NEW DESIGNS APPLICATIONS: * Clock and signal distribution FUNCTIONAL BLOCK DIAGRAM GL G1 A G2 OU TPUT CON TROL Q1 OU TPUT CON TROL Q2 OU TPUT CON TROL Q3 OU TPUT CON TROL Q4 OU TPUT CON TROL Q5 OU TPUT CON TROL Q6 OU TPUT CON TROL Q7 OU TPUT CON TROL Q8 OU TPUT CON TROL Q9 OU TPUT CON TROL Q 10 The IDT logo is a registered trademark of Integrated Device Technology, Inc. INDUSTRIAL TEMPERATURE RANGE MAY 2013 1 (c) 2013 Integrated Device Technology, Inc. DSC-5960/20 IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE PIN CONFIGURATION ABSOLUTE MAXIMUM RATINGS(1) Symbol GL 1 48 Description Max Unit -0.5 to +3.6 V Input Voltage -0.5 to +3.6 V Output Voltage -0.5 to VDD +0.5 V VDD Power Supply Voltage GND VI VO TSTG Storage Temperature -65 to +165 C TJ Junction Temperature 150 C V DD 2 47 V DD V DD 3 46 V DD GND 4 45 GND GND 5 44 GND G1 6 43 GND V DD 7 42 V DD Q2 8 41 Q3 Q1 9 40 Q4 GND 10 39 GND V DD 11 38 V DD GND 12 37 Q5 A 13 36 Q6 V DD 14 35 V DD GND 15 34 GND Q 10 16 33 Q7 Q9 17 32 Q8 V DD 18 31 V DD G2 19 30 V DD GND 20 29 GND GND 21 28 GND V DD 22 27 V DD V DD 23 26 GND NC 24 25 NC NOTE: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. CAPACITANCE(1) (TA = +25C, F = 1.0MHz) Symbol CIN Parameter Min Typ. Max. Unit Input Capacitance -- 6 -- pF NOTE: 1. This parameter is measured at characterization but not tested. TSSOP TOP VIEW RECOMMENDED OPERATING RANGE Symbol TA VDD Description Ambient Operating Temperature Internal Power Supply Voltage Min. -40 2.3 2 Typ. +25 2.5 Max. +85 2.7 Unit C V IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE PIN DESCRIPTION Symbol A G1 I/O I I Type LVTTL LVTTL G2 I LVTTL GL Qn VDD I O LVTTL LVTTL PWR Description Clock input Gate for outputs Q1 through Q5. When G1 is LOW, these outputs are enabled. When G1 is HIGH, these outputs are asynchronously disabled to the level designated by GL(1). Gate for outputs Q6 through Q10. When G2 is LOW, these outputs are enabled. When G2 is HIGH, these outputs are asynchronously disabled to the level designated by GL(1). Specifies output disable level. If HIGH, the outputs disable HIGH. If LOW, the outputs disable LOW. Clock outputs Power supply for the device core, inputs, and outputs PWR Power supply return for power GND NOTE: 1. Because the gate controls are asynchronous, runt pulses are possible. It is the user's responsibility to either time the gate control signals to minimize the possibility of runt pulses or be able to tolerate them in down stream circuitry. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (1) Symbol IIH IIL VIK VIN VIH VIL VOH VOL Parameter Input HIGH Current Input LOW Current Clamp Diode Voltage DC Input Voltage DC Input HIGH(2) DC Input LOW(3) Output HIGH Voltage Output LOW Voltage Test Conditions VDD = 2.7V VI = VDD/GND VDD = 2.7V VI = GND/VDD VDD = 2.3V, IIN = -18mA IOH = -12mA IOH = -100A IOL = 12mA IOL = 100A NOTES: 1. See RECOMMENDED OPERATING RANGE table. 2. Voltage required to maintain a logic HIGH. 3. Voltage required to maintain a logic LOW. 4. Typical values are at VDD = 2.5V, +25C ambient. 3 Min. -- -- -- - 0.3 1.7 -- VDD - 0.4 VDD - 0.1 -- -- Typ.(4) -- -- - 0.7 Max 5 5 - 1.2 +3.6 -- 0.7 -- -- 0.4 0.1 Unit A V V V V V V V V IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE POWER SUPPLY CHARACTERISTICS Symbol IDDQ IDDD ITOT Parameter Quiescent VDD Power Supply Current Dynamic VDD Power Supply Current per Output Total Power VDD Supply Current Test Conditions(1) VDD = Max., Reference Clock = LOW Outputs enabled, All outputs unloaded VDD = Max., VDD = Max., CL = 0pF Typ. 1.5 Max 2 Unit mA 150 200 A/MHz VDD = 2.5V., FREFERENCE CLOCK = 100MHz, CL = 15pF VDD = 2.5V., FREFERENCE CLOCK = 200MHz, CL = 15pF 70 100 90 150 mA NOTE: 1. The termination resistors are excluded from these measurements. INPUT AC TEST CONDITIONS Symbol Parameter Value Units VIH Input HIGH Voltage VDD V VIL Input LOW Voltage 0 V VTH Input Timing Measurement Reference Level(1) tR, tF Input Signal Edge Rate(2) VDD/2 V 2 V/ns NOTES: 1. A nominal 1.25V timing measurement reference level is specified to allow constant, repeatable results in an automatic test equipment (ATE) environment. 2. The input signal edge rate of 2V/ns or greater is to be maintained in the 10% to 90% range of the input waveform. AC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE(4) Symbol Skew Parameters Parameter Min. Typ. Max Unit tSK(O) Same Device Output Pin-to-Pin Skew(1) -- -- 125 ps tSK(P) Pulse Skew -- -- 300 ps Part-to-Part Skew(3) -- -- 300 ps Propagation Delay A to Qn -- -- 2 ns Output Rise Time (20% to 80%) 350 -- 850 ps 350 -- -- -- 850 200 ps MHz tSK(PP) Propagation Delay tPLH (2) tPHL tR tF Output Fall Time (20% to 80%) Frequency Range fO Output Gate Enable/Disable Delay tPGE Output Gate Enable to Qn -- -- 3.5 ns tPGD Output Gate Enable to Qn Driven to GL Designated Level -- -- 3 ns NOTES: 1. Skew measured between all outputs under identical input and output transitions and load conditions on any one device. 2. Skew measured is the difference between propagation delay times tPHL and tPLH of any output under identical input and output transitions and load conditions on any one device. 3. Skew measured is the magnitude of the difference in propagation times between any outputs of two devices, given identical transitions and load conditions at identical VDD levels and temperature. 4. Guaranteed by design. 4 IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE AC TIMING WAVEFORMS 1/fo tW tW V IH V TH A V IL tPHL tPLH V OH V TH Qn V OL t SK(O) tSK(O) V OH V TH Qm V OL Propagation and Skew Waveforms NOTE: Pulse Skew is calculated using the following expression: tSK(P) = | tPHL - tPLH | where tPHL and tPLH are measured on the controlled edges of any one output from rising and falling edges of a single pulse. Please note that the tPHL and tPLH shown are not valid measurements for this calculation because they are not taken from the same pulse. V IH V TH A V IL V IH V TH GL V IL t PLH V IH V TH Gx V IL tPG E t PGD V OH Qn V TH V OL Gate Disable/Enable Runt Pulse Generation NOTE: As shown, it is possible to generate runt pulses on gate disable and enable of the outputs. It is the user's responsibility to time their Gx signals to avoid this problem. 5 IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE TEST CIRCUIT AND CONDITIONS V DD VDD V DD R1 Pulse Generator V IN R1 3 inch, ~50 Transmission Line D.U.T. A Qn R2 CL Test Circuit for Input/Output INPUT/OUTPUT TEST CONDITIONS Symbol VDD = 2.5V 0.2V Unit VTH VDD / 2 V R1 100 R2 100 CL 15 pF 6 R2 IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE ORDERING INFORMATION IDT XXXXX Device Type XX Package X Process I -40C to +85C (Industrial) PA PAG Thin Shrink Small Outline Package TSSOP - Green 5T9070 2.5V Single Data Rate 1:10 Clock Buffer Terabuffer Jr. 7 IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE REVISION HISTORY R ev A Table P ag e 1 Discription of Change Date NRND - Not Recommended for New Designs 5/5/13 8 IDT5T9070 2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR. INDUSTRIAL TEMPERATURE RANGE We've Got Your Timing Solution. 6024 Silver Creek Valley Road San Jose, CA 95138 Sales Tech Support 800-345-7015 (inside USA) +408-284-8200 (outside USA) Fax: 408-284-2775 www.IDT.com/go/contactIDT netcom@idt.com +480-763-2056 DISCLAIMER Integrated Device Technology, Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT's sole discretion. All information in this document, including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are determined in the independent state and are not guaranteed to perform the same way when installed in customer products. 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Other trademarks and service marks used herein, including protected names, logos and designs, are the property of IDT or their respective third party owners. Copyright 2013. All rights reserved. 9