INDUSTRIAL TEMPERATURE RANGE
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
1
IDT5T9070
NRND
INDUSTRIAL TEMPERATURE RANGE
2.5V SINGLE DATA RATE
1:10 CLOCK BUFFER
TERABUFFER™ JR.
DESCRIPTION:
The IDT5T9070 2.5V single data rate (SDR) clock buffer is a single-ended
input to ten single-ended outputs buffer built on advanced metal CMOS
technology. The SDR clock buffer fanout from a single input to ten single-ended
outputs reduces the loading on the preceding driver and provides an efficient
clock distribution network.
The IDT5T9070 has two output banks that can be asynchronously enabled/
disabled. Multiple power and grounds reduce noise.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2013 Integrated Device Technology, Inc. DSC-5960/20
FEATURES:
Optimized for 2.5V LVTTL
Guaranteed Low Skew < 125ps (max)
Very low duty cycle distortion < 300ps (max)
High speed propagation delay < 2ns. (max)
Up to 200MHz operation
Very low CMOS power levels
Hot insertable and over-voltage tolerant inputs
1:10 fanout buffer
2.5V VDD
Available in TSSOP package
NOT RECOMMENDED FOR NEW DESIGNS
FUNCTIONAL BLOCK DIAGRAM
APPLICATIONS:
Clock and signal distribution
GL
G1
A
G2
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
OUTPUT
CONTROL
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q8
Q9
Q10
NOT RECOMMENDED FOR NEW DESIGNS
MAY 2013
INDUSTRIAL TEMPERATURE RANGE
2
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
TSSOP
TOP VIEW
PIN CONFIGURATION
G2 VDD
GL GND
VDD VDD
VDD VDD
GND GND
GND GND
G1 GND
VDD VDD
Q2Q3
Q1Q4
GND GND
VDD VDD
GND Q5
AQ6
VDD VDD
GND GND
Q10 Q7
Q9Q8
VDD VDD
GND GND
GND GND
VDD VDD
VDD GND
NC NC
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
20
21
22
23
24
30
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
29
28
27
26
25
Symbol Description Max Unit
VDD Power Supply Voltage –0.5 to +3.6 V
VIInput Voltage –0.5 to +3.6 V
VOOutput Voltage –0.5 to VDD +0.5 V
TSTG Storage Temperature –65 to +165 °C
TJJunction Temperature 1 5 0 °C
ABSOLUTE MAXIMUM RATINGS(1)
NOTE:
1 . Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
Symbol Parameter Min Typ. Max. Unit
CIN Input Capacitance 6pF
CAPACITANCE(1) (TA = +25°C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
Symbol Description Min. Typ. Max. Unit
TAAmbient Operating Temperature 40 +25 +85 °C
VDD Internal Power Supply Voltage 2.3 2.5 2.7 V
RECOMMENDED OPERATING RANGE
INDUSTRIAL TEMPERATURE RANGE
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
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PIN DESCRIPTION
Symbol I/O Type Description
A I LVTTL Clock input
G1 I LVTTL Gate for outputs Q1 through Q5. When G1 is LOW, these outputs are enabled. When G1 is HIGH, these outputs are asynchro-
nously disabled to the level designated by GL(1).
G2 I LVTTL Gate for outputs Q6 through Q10. When G2 is LOW, these outputs are enabled. When G2 is HIGH, these outputs are asynchro-
nously disabled to the level designated by GL(1).
GL I LVTTL Specifies output disable level. If HIGH, the outputs disable HIGH. If LOW, the outputs disable LOW.
Qn O LVTTL Clock outputs
VDD PWR Power supply for the device core, inputs, and outputs
GND PWR Power supply return for power
NOTE:
1. Because the gate controls are asynchronous, runt pulses are possible. It is the user's responsibility to either time the gate control signals to minimize the possibility of runt
pulses or be able to tolerate them in down stream circuitry.
NOTES:
1. See RECOMMENDED OPERATING RANGE table.
2. Voltage required to maintain a logic HIGH.
3. Voltage required to maintain a logic LOW.
4. Typical values are at VDD = 2.5V, +25°C ambient.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (1)
Symbol Parameter Test Conditions Min. Typ.(4) Max Unit
IIH Input HIGH Current VDD = 2.7V VI = VDD/GND ±5 μA
IIL Input LOW Current VDD = 2.7V VI = GND/VDD ——±5
VIK Clamp Diode Voltage VDD = 2.3V, IIN = -18mA - 0.7 - 1.2 V
VIN DC Input Voltage - 0.3 +3.6 V
VIH DC Input HIGH(2) 1.7 V
VIL DC Input LOW(3) 0.7 V
VOH Output HIGH Voltage IOH = -12mA VDD - 0.4 V
IOH = -100μAVDD - 0.1 V
VOL Output LOW Voltage IOL = 12mA 0.4 V
IOL = 100μA 0.1 V
INDUSTRIAL TEMPERATURE RANGE
4
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions(1) Typ. Max Unit
IDDQ Quiescent VDD Power Supply Current VDD = Max., Reference Clock = LOW 1.5 2 mA
Outputs enabled, All outputs unloaded
IDDD Dynamic VDD Power Supply VDD = Max., VDD = Max., CL = 0p F 150 200 μA/MHz
Current per Output
ITOT Total Power VDD Supply Current VDD = 2.5V., FREFERENCE CLOCK = 100MHz, CL = 15pF 70 90 mA
VDD = 2.5V., FREFERENCE CLOCK = 200MHz, CL = 15pF 100 150
INPUT AC TEST CONDITIONS
Symbol Parameter Value Units
VIH Input HIGH Voltage VDD V
VIL Input LOW Voltage 0V
VTH Input Timing Measurement Reference Level(1) VDD/2 V
tR, tFInput Signal Edge Rate(2) 2 V/ns
NOTES:
1. A nominal 1.25V timing measurement reference level is specified to allow constant, repeatable results in an automatic test equipment (ATE) environment.
2. The input signal edge rate of 2V/ns or greater is to be maintained in the 10% to 90% range of the input waveform.
NOTE:
1. The termination resistors are excluded from these measurements.
AC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE(4)
Symbol Parameter Min. Typ. Max Unit
Skew Parameters
tSK(O) Same Device Output Pin-to-Pin Skew(1) ——125 ps
tSK(P) Pulse Skew(2) ——300 ps
tSK(PP) Part-to-Part Skew(3) ——300 ps
Propagation Delay
tPLH Propagation Delay A to Qn —— 2ns
tPHL
tROutput Rise Time (20% to 80%) 3 5 0 850 ps
tFOutput Fall Time (20% to 80%) 3 5 0 850 ps
fOFrequency Range ——200 MHz
Output Gate Enable/Disable Delay
tPGE Output Gate Enable to Qn ——3.5 ns
tPGD Output Gate Enable to Qn Driven to GL Designated Level —— 3ns
NOTES:
1. Skew measured between all outputs under identical input and output transitions and load conditions on any one device.
2 . Skew measured is the difference between propagation delay times tPHL and tPLH of any output under identical input and output transitions and load conditions on any one device.
3 . Skew measured is the magnitude of the difference in propagation times between any outputs of two devices, given identical transitions and load conditions at identical VDD levels
and temperature.
4. Guaranteed by design.
INDUSTRIAL TEMPERATURE RANGE
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
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Propagation and Skew Waveforms
NOTE: Pulse Skew is calculated using the following expression:
tSK(P) = | tPHL - tPLH |
where tPHL and tPLH are measured on the controlled edges of any one output from rising and falling edges of a single pulse. Please note that the tPHL and tPLH shown are not
valid measurements for this calculation because they are not taken from the same pulse.
A C TIMING WA VEFORMS
tPLH tPHL
tSK(O) tSK(O)
Qn
Qm
VOH
VTH
VOL
VOH
VTH
VOL
A
VIH
VTH
VIL
tWtW
1/fo
Gate Disable/Enable Runt Pulse Generation
NOTE:
As shown, it is possible to generate runt pulses on gate disable and enable of the outputs. It is the user's responsibility to time their Gx signals to avoid this problem.
tPLH
GL
Gx
Qn
VIH
VTH
VIL
VIH
VTH
VIL
VOH
VTH
VOL
tPGD tPGE
A
VIH
VTH
VIL
INDUSTRIAL TEMPERATURE RANGE
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IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
Test Circuit for Input/Output
INPUT/OUTPUT TEST CONDITIONS
VDD
D.U.T.
CL
VDD
R1
R2
QnA
Pulse
Generator
VIN 3 inch, ~50
Transm ission Line
VDD
R1
R2
TEST CIRCUIT AND CONDITIONS
Symbol VDD = 2.5V ± 0.2V Unit
VTH VDD / 2 V
R1 100 Ω
R2 100 Ω
CL15 pF
INDUSTRIAL TEMPERATURE RANGE
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
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ORDERING INFORMATION
IDT XXXXX Package
Device Type
5T9070 2.5V Single Data Rate 1:10 Clock Buffer
Tera buffer J r.
Thin Shrink Sm all Outline Package
TSSOP - Gr een
PA
PAG
XX Process
X
-40°C to +85°C (Industrial)
I
INDUSTRIAL TEMPERATURE RANGE
8
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
REVISION HISTORY
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INDUSTRIAL TEMPERATURE RANGE
IDT5T9070
2.5V SINGLE DATA RATE 1:10 CLOCK BUFFER TERABUFFER JR.
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We’ve Got Your Timing Solution.
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800-345-7015 (inside USA)
+408-284-8200 (outside USA)
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www.IDT.com/go/contactIDT
T ech Support
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+480-763-2056
DISCLAIMER Integrated Device Technology , Inc. (IDT) and its subsidiaries reserve the right to modify the products and/or specifications described herein at any time and at IDT’s sole discretion. All information
in this document, including descriptions of product features and performance, is subject to change without notice. Performance specifications and the operating parameters of the described products are determined
in the independent state and are not guaranteed to perform the same way when installed in customer products. The information contained herein is provided without representation or warranty of any kind, whether express
or implied, including, but not limited to, the suitability of IDT’s products for any p articular purpose, an implied warranty of merchantability , or non-infringement of the intellectual property rights of others. This document
is presented only as a guide and does not convey any license under intellectual property rights of IDT or any third parties.
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expected to significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT.
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their respective third party owners.
Copyright 2013. All rights reserved.
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