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9. Reliability Test Items and Conditions
9-1. Failure Criteria
Items Symbols Test Conditions Criteria
Min. Max.
Forward Voltage Vf If = 65mA - Initial Value 1.1
Luminous Flux ΦV If = 65mA Initial Value 0.7 -
9-2. Reliability Tests
No Items Test Conditions Test Hours
/Cycles
1 Room Temperature Operating Life
(RTOL) Ta = 25℃, If = 200mA 1,000 Hours
2 Wet High Temperature Operating
Life (WHTOL) Ta = 60℃, RH = 90%, If = 200mA 1,000 Hours
3 High Temperature Operating Life
(HTOL) Ta = 85℃, If = 200mA 1,000 Hours
4 Low Temperature Operating Life
(LTOL) Ta = -40℃, If = 200mA 1,000 Hours
5 High Temperature Storage Life
(HTSL) Ta = 100℃ 1,000 Hours
6 Low Temperature Storage Life
(LTSL) Ta = -40℃ 1,000 Hours
7 Wet High Temperature Storage Life
(WHTSL) Ta = 85℃, RH = 85% 1,000 Hours
8 Thermal Shock
(TMSK) 100℃ ~ -40℃
Dwell : 15 min., Transfer : 10 sec. 100 Cycles
9 Moisture Sensitivity Level
(MSL) Tsld = 260℃
(Pre treatment 60℃,60%,168 hours) 3 Times
※ All samples are tested using LG Innotek Standard Metal PCB (25x25x1.6 mm3(L×W×H)) except MSL test .
※ All samples must pass each test item and all test items must be satisfied.