©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
RF1K49154
2A, 60V, 0.130 Ohm, Dual N-Channel,
LittleFET™ Power MOSFET
This D ual N-Chan nel pow er MOSFET i s manuf actu red using
the latest manufacturing process technology. This process,
which us es feature sizes approach ing those of LSI
integrated cir cuit s, gives opt imum uti lizat ion of silicon,
resulting in outstanding performance. It is designed for use
in applic atio ns such as switching regulators, switching
converters, motor drivers, relay drivers, and low voltage bus
switches. These devices can be operated directly from
integrated circuits.
Formerly developmental type TA49154.
Features
•2A, 60V
•r
DS(ON) = 0.130
Temperature Compensating PSPICE® Model
Peak Current vs Pu lse Width C urve
UIS Rating Curve
Related Literature
- TB334 “Guideli nes for Solde ring Surface Mount
Components to PC Boards”
Symbol
Packaging
JEDEC MS-012AA
Ordering Information
PART NUMBER PACKAGE BRAND
RF1K49154 MS-012AA RF1K49154
NOTE: When ordering, use the entire part number. For ordering in
tape and reel, add the suffix 96 to the part number , i.e., RF1K4915496. G1(2)
D1(8)
S1(1)
D1(7)
D2(6)
D2(5)
S2(3)
G2(4)
BRANDING DASH
1234
5
Data Sheet January 2002
©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
Absolute Maximum Ratings TA = 25oC, Unless Otherwise Specified RF1K49154 UNITS
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDSS 60 V
Drain to Gate Voltage (RGS = 20k, Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR 60 V
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VGS ±20 V
Drain Current Continuous (Pulse widt h = 5s) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .ID
Pulsed (Figure 5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM 2
Refer to Peak Current Curve A
Pulsed Avalanche Rating (Figure 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS Refer to UIS Curve
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PD
Derate Above 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
0.016 W
W/oC
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG -55 to 150 oC
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg 300
260
oC
oC
CAUTION: St resses above those l isted in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. TJ = 25oC to 125oC.
Electrical Specifications TA = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BVDSS ID = 250µA, VGS = 0V, (Figure 12) 60 - - V
Gate Threshold Voltage VGS(TH) VGS = VDS, ID = 250µA, (Figure 11) 2 - 4 V
Zero Gate Vo ltage Drain C urrent IDSS VDS = 55V, VGS = 0V - - 1 µA
VDS = 50V, VGS = 0V, TC = 150oC - - 250 µA
Gate to Source Leakage Current IGSS VGS = ±20V - - ±10 µA
Drain to Source On Resist ance rDS(ON) ID = 2A, VGS = 10V, (Figures 9, 10) - - 0.130
Turn-On Time tON VDD = 30V, ID 2A,
RL = 15, VGS = 10V,
RGS = 25
(Figure 14)
- - 50 ns
Turn-On De lay Time td(ON) -10-ns
Rise Time tr-25-ns
Turn-Off De lay Time td(OFF) -70-ns
Fall Time tf-35-ns
Turn-Off T ime tOFF - - 155 ns
Total Gate Charge Qg(TOT) VGS = 0V to 20V VDD = 48V,
ID = 2A,
RL = 24
(Figure 14)
-2632nC
Gate Charge at 10V Qg(10) VGS = 0V to 10V - 14 17 nC
Threshold Gate Charge Qg(TH) VGS = 0V to 2V - 0.8 1.0 nC
Input Capacitance CISS VDS = 25V, VGS = 0V,
f = 1MHz (Figure 13) - 340 - pF
Output Capacitance COSS - 140 - pF
Reverse Transfer Capacitance CRSS -40-pF
Thermal Resistance Junction to Ambient RθJA Pulse Width = 1s
Device Mounted on FR-4 Material - - 62.5 oC/W
Source to Drain Diode Specifications
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Source to D rain Diode Volt age VSD ISD = 2A - - 1.5 V
Reverse Recovery Time trr ISD = 2A, dISD/dt = 100A/µs--62ns
RF1K49154
©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
Typical Performance Curves TA = 25oC, Unless Otherwise Specified
FIGURE 1. NORMALIZED PO WER DISSIP ATION vs AMBIENT
TEMPERATURE FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
AM BIENT T EMP ERATURE
FIGURE 3. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
FIGURE 4. FORWARD BIAS SAFE OPERATING AREA FIGURE 5. PEAK CURRENT CAPABILITY
TA, AMBIENT TEMPERATURE (oC)
POWER DISSIPATION MULTIPLIER
00 25 50 75 100 15
0
0.2
0.4
0.6
0.8
1.0
1.2
125
1
0.5
025 50 75 100 125 15
0
2
1.5
I
D
, DRAIN CURRENT (A)
TA, AMBIENT TEMPERATURE (oC)
2.5
t, RECTANGULAR PULSE DURATION (s)
10-4 10-2 10-1 100101
0.01
0.1
10-3 102
PDM
t1t2
ZθJA, NORMALIZED
THERMAL IMPEDANCE
SINGLE PULSE
10-5 103
0.001
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJA x RθJA + TA
1
5DUTY CYCLE
0.5
0.2
0.1
0.05
0.01
0.02
DESCENDING ORDER
VDS, DRAIN TO SOURCE VO LTAGE (V)
110 20
0
0.1
10
20
0.1
1
ID, DRAIN CURRENT (A)
VDSS (MAX) = 60V
LIMITED B Y rDS(ON)
AREA MAY BE
OPERATION IN THIS
10ms
5ms
100
TJ = MAX RATED
TA = 25oC
t, PULSE WIDTH (s)
100
10
110-5 10-4 10-3 10-2 10-1 10010
1
I
DM
, PEAK CURRENT CAPABILITY (A)
THERMAL IMPEDANCE
MAY LIMIT CURRENT
IN THIS REGION
VGS = 10V
VGS = 20V TA = 25oC
I = I25 150 - TA
125
FOR TEMPERATURES
ABOVE 25oC DERATE PEAK
CURRENT AS FOLLOWS:
RF1K49154
©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
NOTE: Refer to Fairchild Application Notes AN9321 and AN9322.
FIGURE 6. UNCLAMPED INDUCTIVE SWITCHING CAPABILITY FIGURE 7. SATURATION CHARACTERISTICS
FIGURE 8. TRANSFER CHARACTERISTICS FIGURE 9. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
FIGU RE 10 . NORMALI ZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE FIGURE 11. NORMALIZED GATE THRESHOLD V OLT AGE vs
JUNCTION TEMPERATURE
Typical Performance Curves TA = 25oC, Unless Otherwise Specified (Continued)
11010
0
5
0.1
10
1
I
AS
, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCHE (ms)
STARTING TJ = 25oC
STARTING TJ = 150oC
tAV = (L )(IAS)/(1.3*RATED BVDSS - VDD)
If R = 0
If R 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1]
0
5
10
0 1.5 3.0 4.5 6.0 7
.5
15
20
I
D
, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 8V
VGS = 10V
VGS = 9V
VGS = 20V VGS = 7V
VGS = 5V
VGS = 6V
PULSE DURATION = 80µs
TA = 25oC
DUTY CYCLE = 0.5% MAX
04681
0
2
0
4
8
12
16
20
ID(ON), ON-STATE DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX 150oC
-55oC25oC
VDD = 15V
100
200
300
400
500
04
V
GS
, GATE TO SOURCE VOLTA GE (V )
r
DS(ON)
, ON-STATE RESISTANCE (m
)
2681
0
I
D
= 0.5A
I
D
= 4A
I
D
= 2A
I
D
= 1A
V
DD
= 15V
PULSE DURATION = 80
µ
s
DUTY CYCLE = 0.5% MAX
0
0.5
1
1.5
2
-80 -40 0 40 80 120 16
0
NORMALIZED ON RESISTANCE
TJ, JUNCTION TEMPERATURE (oC)
PULSE DURATION = 80µs
VGS = 10V, ID = 2A
DUTY CYCLE = 0.5% MAX
-80 -40 0 40 80 120 16
0
0.5
0.75
1
1.25
1.5
NORMALIZED GATE
THRESHOLD VO LTAGE
TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
RF1K49154
©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
FIGURE 12. NORMALIZED DRAIN T O SOURCE BREAKDO WN
VOLTAGE vs JUNCTION TEMPERATURE FIGURE 13. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
NOTE: Refer to Fairchild Application Notes AN7254 and AN7260.
FIGURE 14. NORMALIZED SWITCHING WAVEFORMS FOR CONSTANT GATE CURRENT
Test C i rcuits and Waveforms
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUIT FIGURE 16. UNCLAMPED ENERGY WAVEFORMS
Typical Performance Curves TA = 25oC, Unless Otherwise Specified (Continued)
1.5
1.25
1
0.75
0.5-80 -40 0 40 80 120 16
0
TJ, JUNCTION TEMPERATURE (oC)
NORMALIZED DRAIN TO SOURCE
BREAKDOWN VOLTAGE
ID = 250µA500
400
200
00 5 10 15 20 2
5
C, CAPACITANCE (pF)
CRSS
300
CISS
COSS
VDS, DRAIN TO SOURCE VOLTAGE (V)
100
VGS = 0V, f = 1MHz
CISS = CGS + CGD
CRSS = CGD
COSS = CDS + CGD
60
45
30
15
0
20IGREF()
IGACT()
----------------------t, TIME (µs) 80IGREF()
IGACT()
----------------------
10
7.5
5
2.5
0
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
VGS, GATE TO SOURCE VOLTAGE (V )
VDD = BVDSS
VDD = BVDSS
VDD = 0.75 BVDSS
VDD = 0.50 BVDSS
VDD = 0.25 BVDSS
PLATEAU VOLTAGES IN
DESCENDING ORDER:
RL = 30
IG(REF) = 0.26mA
VGS = 10V
tP
VGS
0.01
L
IAS
+
-
VDS
VDD
RG
DUT
VARY tP TO OBTAIN
REQUIRED PEAK IAS
0V
VDD
VDS
BVDSS
tP
IAS
tAV
0
RF1K49154
©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
FIGURE 17. SWITCHING TIME TEST CIRCUIT FIGURE 18. RESISTIVE SWITCHING WAVEFORMS
FIGURE 19. GATE CHARGE TEST CIRCUIT FIGURE 20. GATE CHARGE WAVEFORMS
Test C i rcuits and Waveforms (Continued)
VGS
RL
RGS
DUT
+
-VDD
VDS
VGS
tON
td(ON)
tr
90%
10%
VDS 90%
10%
tf
td(OFF)
tOFF
90%
50%
50%
10% PULSE WIDTH
VGS
0
0
RL
VGS +
-
VDS
VDD
DUT
Ig(REF)
VDD
Qg(TH)
VGS = 2V
Qg(10) OR Qg(5)
VGS = 5V FOR
Qg(TOT)
VGS = 20V
VDS
VGS
Ig(REF)
0
0
VGS = 1V FOR
L2 DEVICES
L2 DEVICES
VGS = 10V
VGS = 10V FO
R
L2 DEVICES
RF1K49154
©2002 Fairch ild Semicond uctor C orpo ration RF1K49154 Rev. B
PSPICE Ele ctrical Model
SUBCKT RF1K49154 2 1 3 ; rev 2/2/96
CA 12 8 3.5e -10
CB 15 14 3.7e-10
CIN 6 8 2.26e-10
DBODY 7 5 DBODYMOD
DBRE AK 5 11 DB REAK MOD
DPLCAP 10 5 DPLCAPMOD
EBREAK 11 7 17 18 63
EDS 14 8 5 8 1
EGS 13 8 6 8 1
ESG 6 10 6 8 1
EVTH R ES 6 21 19 8 1
EVTEMP 20 6 18 22 1
IT 8 17 1
LDRA IN 2 5 1e- 9
LGATE 1 9 1.4e-9
LSOURCE 3 7 3.1e-10
K1 LGATE LSOURCE 0. 131
MMED 16 6 8 8 MMEDMOD
MSTRO 16 6 8 8 MSTROMOD
MWEAK 16 21 8 8 MWEAKMOD
RBREAK 17 18 RBREAKMOD 1
RDRAIN 50 16 RDRAINMOD 7.0e-3
RGATE 9 20 1.9
RLDRAIN 2 5 10
RLGATE 1 9 14
RLSOURCE 3 7 3
RSLC1 5 51 RSLCMOD 1e-6
RSLC2 5 50 1e3
RSOURCE 8 7 RSOURCEMOD 5.6e-2
RVTHRES 22 8 RVTHRESMOD 1
RVTE M P 18 19 RVTE MPMOD 1
S1A 6 12 13 8 S1AMOD
S1B 13 12 13 8 S1BMOD
S2A 6 15 14 13 S2AMOD
S2B 13 15 14 13 S2BM O D
VBAT 22 1 9 DC 1
ESL C 51 50 VALUE={( V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*50),3))}
.MODEL DBOD YMOD D ( IS = 2.6e-13 RS = 2.34e-2 IKF = 5.5 N = 0 .995 TRS1 = 2.8e -3 TRS2 = 1.1e-5 CJO = 3.7e-10 TT = 3.5e-8 M = 0.46
+ XTI = 5.5)
.MODEL DBREAKMOD D (RS = 0. 5IKF = 0.1 N = 1 TRS1 = 3e- 3TRS2 = -5e-5)
.MODEL DPLCAPMOD D (CJO = 5.6e-1 0IS = 1e-3 0N = 10 M = 0.92)
.MODEL MMEDM OD NMOS (VTO = 3.25 KP = 1.8 IS = 1e-30 N = 10 T OX = 1 L = 1u W = 1u RG = 1.9)
.MODEL MSTROMOD NMOS (VTO = 3.68 KP = 13.5 IS = 1e-30 N = 10 TOX = 1 L = 1u W = 1u)
.MODEL MWEAKMOD NMOS (VTO = 2.83 KP = 0.03 IS = 1e-30 N = 10 TOX = 1 L = 1u W = 1u RG = 19 RS = 0.1)
.MODEL RBREAK MOD R ES (TC1 = 1. 08e- 3TC2 = 5e-7)
.MODEL RDRAINMOD RES (TC1 = 1.7e-2 TC2 = 1e-4)
.MODEL RSLCMOD RES (TC1 = 1e-9 TC2 = 1e-4)
.MODEL RSOURCEM OD RES (TC1 = 3.3e-3 TC2 = 1e-9)
.MODEL RVTHRESMOD RES (TC1 = -1.9e-3 TC2 = -4e-6)
.MODEL RVTEMPMO D RES (TC1 = -2.9e- 3TC2 = 2.2e-6)
.MODEL S1AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -7.1 VOFF= -4)
.MODEL S1BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -4 VOFF= -7.1)
.MODEL S2AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 0.01 VOFF= 1.9)
.MODEL S2AMOD VSWITCH ( R ON = 1e-5 ROFF = 0.1 VO N = 1.9 VOFF= 0 .01)
.ENDS
NOTE: For further discussion of the PSPICE model, consult A New PSPICE Sub-circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991.
18
22
+-
6
8
+
-
5
51
+
-
19
8
+-
17
18
6
8
+
-
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
814
13
MWEAK
EBREAK DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ESLC
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE EVTEMP
9
ESG
LGATE
RLGATE 20
+
-
+
-
+
-
6
RF1K49154
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Obsolete
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Formative or
In Design
First Production
Full Production
Not In Production
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