5962R8958101VHA - ANALOG DEVICES

REVISIONS

LTR DESCRIPTION DATE (YR-MO-DA) APPROVED

A Added one vendor, CAGE 1ES66. Made change to table I and figure 1.

Editorial c hanges throughout 91-10-29 M. A. FRYE

Add device class V and radiation hardness requirem ents. Make change to

footnote six as specified in table I. Make change to groups C and D endpoints

as specified in tabl e IIA and add table IIB. Delete CAGE 07933. Replace

CAGE 06665 with CAGE 24355. - ro 00-05-31 R. MONNIN

Add device types 03 and 04. Make changes to 1.2.2 and to output voltage

noise test as specified in table I. - ro 01-02-06 R. MONNI N

D Add case outline H. - ro 02-04-15 R. MONNIN

E Drawing updated to reflect current requirements. -rrp 09-04-01 J. D. RODENBECK

F A dd device type 05 tested at low dose rate. Make change to paragraphs 1. 2.2,

1.5, and 3.2.3. Make changes to footnotes 2/ and 3/ as specified under

Table I. Removed figure 2. Make change to Table IIB and paragraph

4.4.4.1. -rrp

11-11-29 C. SAFFLE

G Make additions to footnotes 1/ and 4/ as specified under Table I.

Add paragraph 6.7 and figure 2. - ro 14-01-28 C. SAFFLE

THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

REV STATUS REV G G G G G G G G G G G

OF SHE ETS SHEET 1 2 3 4 5 6 7 8 9 10 11

PMIC N/A PREPARED BY

RICK O FF ICER

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

http://www.landandmaritime.dla.mil

STANDARD

MICROCIRCUIT

DRAWING

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

CHECKED BY

RAY MONNIN

APPRO V ED BY

MICHAEL A. FRYE

MICROCIRCUI T, LINEAR, P OSI TIV E 10-VOLT

ADJUSTABLE PRECI SIO N VOLTAGE

REFERENCE, MONOLITHIC SILICON

DRAWING APPROVAL DATE

89-07-17

AMSC N/A

REVISION LEVEL

G SIZE

A CAGE CODE

67268

5962-89581

SHEET 1 OF 11

DSCC FORM 2233

APR 97 5962-E107-14

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89581

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

G SHEET 2

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APR 97

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M)

and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or

Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

1.2 PIN. The PIN is as shown in the following examples.

For device class M and Q:

5962

89581

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

\ /

Drawing number

For device class V:

5962

89581

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

\ /

(see 1.2.3)

Drawing number

1.2.1 RHA des ign ator . Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are

marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, append ix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Dev ice ty pe(s). The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function Output volt age noi se

01 REF01A Precision reference +10-volt 30 µVP-P

adjustable output

02 REF01 Precision reference +10-volt 30 µVP-P

adjustable output

03 REF01A Precision reference +10-volt 150 µVP-P

adjustable output

04 REF01 Precision reference +10-volt 150 µVP-P

adjustable output

05 REF01A Radiation harde ned, 30 µVP-P

precision reference +10-volt

adjustable output

STANDARD

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SIZE

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COLUMBUS, OHIO 43218-3990

REVISION LEVEL

G SHEET 3

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APR 97

1.2.3 Dev ice cl as s designator. The device class designator is a single letter identifying the product assurance level as listed

below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q

designators will not be included in the PIN and will not be marked on the device.

Devi ce class Device requireme nts docume ntation

M Vendor self-certification to the r equir eme nts for M I L-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style

G MACY1-X8 8 Can

H GDFP1-F10 or CDFP2-F10 10 Flat pack

P GDIP1-T8 or CDI P 2-T8 8 Dual-in-line

2 CQCC1-N20 20 Square lead le ss chi p carrier

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

1.3 Absol ute maximum rating s. 1/

Input voltage (VIN) ....................................................................................... 40 V dc

Power dissipation (PD) ................................................................................ 500 mW 2/

Output short circuit duration ......................................................................... Indefinite

Storage temperature range .......................................................................... -65°C to +150°C

Lead temperature (soldering, 10 seconds) .................................................. +300°C

Junction temperature (TJ) ............................................................................ +150°C

Thermal resistance, junction-to-case (θJC) .................................................. See MIL-STD-1835

1.4 Recom mended operating cond itio ns.

Ambient operating temperature range (TA) ................................................. -55°C to +125°C

1.5 Radiation features:

Device type 01:

Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ............. 100 krads(Si) 3/

Device type 05:

Maximum total dose available (dose rate ≤ 10 mrads(Si)/s) .................... 50 krads(Si) 4/

________

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ Derate above +80°C, 7.1 mW/°C for case outline G. Derate above +75°C, 6.6 mW/°C for case outline P.

Derate above +72°C, 7.8 mW/°C for case outline 2. Derate above +85°C, 5.6 mW/°C for case outline H.

3/ For device type 01, this part may be dose rate sensitive in a space environment and may demonstrate enhanced low

dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in

MIL-STD-883, method 1019, condition A.

4/ For device type 05, radiation end point limits for the noted parameters are guaranteed for the conditions specified in

MIL-STD-883, method 1019, condition D.

STANDARD

MICROCIRCUIT DRAWING

SIZE

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DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

G SHEET 4

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APR 97

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitati on or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order

Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of prece den ce. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Radia tion ex posure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document

revision level control and shall be made available to the preparing and acquiring activity upon request.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

case operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be

marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be

in accordance with MIL-PRF-38535, append ix A.

3.5.1 Certificati on/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

STANDARD

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REVISION LEVEL

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TABLE I. Electrical performance characteristics.

Test

Symbol Conditions 1/ 2/ 3/

-55°C ≤ TA ≤ +125°C

unless otherw ise speci fied

Group A

subgroups

Device

type

Limits Unit

Min

Max

Quiescent su pply cur rent ISY No load

All

1.4

2,3

2.0

M,D,P,L,R

1.4

M,D,P,L

1.4

Output adjustment range ∆VTRIM RP = 10 kΩ, 4/

TA = +25°C

All

±3.0

Output voltage VOUT IL = 0 mA

01,03,

9.97

10.03

02,04

9.95

10.05

2,3

01,03,

9.955

10.045

02,04

9.905

10.095

M,D,P,L,R

9.94

10.06

M,D,P,L

9.94

10.06

Short circuit current

IOS VO = 0 V, TA = +25°C 4/

01,03,

+15

+60

Sink current IS TA = +25°C 4/

All

-0.3

Load regulation LD reg IL = 0 mA to 10 mA 5/ 6/

01,03,

0.008

%/mA

02,04

0.010

M,D,P,L,R

0.015

M,D,P,L

0.015

IL = 0 mA to 8 mA 5/ 6/

2,3

01,03,

0.012

02,04

0.015

Line regulation LN reg VIN = 13 V to 33 V 5/

All

0.01

%/V

2,3

0.015

M,D,P,L,R

0.03

M,D,P,L

0.03

Load current IL TA = +25°C 4/ 7/

All

2,3

Output voltage noi se enp-p 0.1 Hz to 10 Hz 4/

01,02,

µVp-p

03,04

150

See footnotes at end of table.

STANDARD

MICROCIRCUIT DRAWING

SIZE

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COLUMBUS, OHIO 43218-3990

REVISION LEVEL

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APR 97

TABLE I. Electrical performance characteristics – Continued.

Test

Symbol Conditions 1/ 2/ 3/

-55°C ≤ TA ≤ +125°C

unless otherw ise speci fied

Group A

subgroups

Device

type

Limits Unit

Min

Max

Output voltage

temperat ure coeff ic ient TCVO -55°C ≤ TA ≤ +125°C 4/ 8/

5,6

01,03,

±8.5

ppm/°C

02,04

±25

1/ VIN = 15 V, unless otherwise specified. No external components required.

2/ Device type 01 supplied to this drawing meets all levels M, D, P, L, and R of irradiation however this device is only tested at

the R level. Device type 05 supplied to this drawing meets all all levels P and L of irradiation however this device is only

tested at the L level. Pre and post irradiati on val ues are identical unless otherwise specified in table I. When performing

post irradiation electrical measurements for any RHA level, TA = +25°C.

3/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,

m ethod 1019, condition A for device type 01. Device type 05 has been tested at the low dose rate.

4/ Not tested post irradiation. Refer to section 6.7 Application notes for more external trim details.

5/ Line and load regulation specifications include the effect of self-heating.

6/ LDreg = (∆VOUT / ∆IOUT) / VOUT x 100 = % / mA.

7/ Minimum load current guaranteed by load regulation test.

8/ TCVO = ABS (( VMAX – VMIN ) / 10 V) x (1/180°C) x (106) where –55°C ≤ TA ≤ +125°C.

3.6 Certif i cate of compli an ce. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of

supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of

MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certif i cate of conform anc e. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to D LA Lan d and M arit ime -VA of change of

product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.

3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,

and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore

documentation shall be made available onshore at the option of the reviewer.

3.10 Microc ir c uit group assi gn ment for dev ice clas s M . Device class M devices covered by this drawing shall be in

microcircu it gr oup number 59 (see MIL-PRF-38535, appendix A).

STANDARD

MICROCIRCUIT DRAWING

SIZE

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DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

G SHEET 7

DSCC FORM 2234

APR 97

Device types 01, 02, 03, 04, and 05

Case outlines G and P H 2

Terminal

number

Terminal symbo l

1 NC NC NC

2 VIN VIN NC

3 NC NC NC

4 GND GND NC

5 TRIM TRIM VIN

6 VOUT VOUT NC

7 NC NC NC

8 NC NC NC

9 --- NC NC

10 --- NC GND

11 --- --- NC

12 --- --- TRIM

13 --- --- NC

14 --- --- NC

15 --- --- VOUT

16 --- --- NC

17 --- --- NC

18 --- --- NC

19 --- --- NC

20 --- --- NC

NC = No connection

FIGURE 1. Terminal connections.

STANDARD

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REVISION LEVEL

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4. VERIFICATION

4.1 Sampling an d inspection . For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in

accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015.

(2) TA = +125°C, minim um.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device

class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for

device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Gro up A inspe ctio n.

a. Tests shall be as specif ied in table IIA herein.

b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

STANDARD

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DLA LAND AND MARITIME

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REVISION LEVEL

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TABLE IIA. Electrical test requirements.

Test requirements Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(in accordance with

MIL-PRF-38535, table III)

Device

class M

Device

class Q

Device

class V

Interim electrical

parameter s (see 4.2)

1,2,3

Final electrical

parameter s (see 4.2)

1,2,3,4 1/

1,2,3,4,5,6 1/

Group A test

requirements (see 4.4)

1,2,3,4,5,6

Group C end-point electrical

parameter s (see 4.4)

1 2/

Group D end-point electrical

parameter s (see 4.4)

Group E end-point electri cal

parameter s (see 4.4)

1/ PDA applies to subgroup 1.

2/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall

be computed with reference to the previous endpoint electrical parameters.

TABLE IIB. Delta limits at (+25°C).

Parameter Device type End-point Delta Unit

Min Max Max

VOUT 01, 05 9.97 10.03 ±0.006 V

4.4.2 Gro up C inspec tion . The group C inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.2.1 Additional criteria for device class M. Steady-s tate life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall sp eci fy the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of

MIL-STD-883.

b. TA = +125°C, mi nim um.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

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4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test cir cu it shall sp ecif y th e

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of

MIL-STD-883.

4.4.3 Gro up D inspec tion . The group D inspection end-point electri cal parameters sha ll be as specified in table IIA herein.

4.4.4 Gro up E inspe ctio n. Group E inspection is required only for parts intended to be marked as radiation hardness assured

(see 3.5 herein).

a. End-point electrical parameters shall be as specified in table IIA herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hard nes s ass ured te sts as spe cif ied in MI L-PRF-38535, appendix A for the RHA level being tested. All device

classes must meet the postirradiation end-point electrical parameter limits as defined in table I at

TA = +25°C ±5°C, after exposure, to the subgroups specified in table II herein.

4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883

method 1019, condition A for device type 01 and condition D for device type 05 and as specified herein.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes

Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Inten ded use. Microcircuits conforming to this drawing are intended for use for Government micro circ uit app lic atio ns

(original equ ipm ent), des ign applicat ion s, and logi sti cs purpo ses.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-

prepared specification or drawing.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of user s. Military and industrial users should inform DLA Land and Maritime when a system application requires

configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and

this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic

devices (FSC 5962) sho uld co ntact DLA Land and Maritime-VA, telephone (614) 692-8108.

6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,

or telephone (614) 692-0540.

6.5 Abbreviations, symbols, and definitions. The abbreviatio ns, sy mbo ls, and defi nit ion s us ed herein ar e defin ed in

MIL-PRF-38535 and MIL-HDBK-1331.

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6.6 Sour ces of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in

MIL-HDBK-103 and QML-38535. The vend ors lis ted in QM L-38535 have submitted a certificate of compliance (see 3.6 herein)

to DLA Land and Maritime-VA and have agreed to this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in M IL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DLA Land and Maritime-VA.

6.7 Appli cat ion note s.

6.7.1 Normal configuration. No external components required.

6.7.2 External trim configuration. The device trim terminal can be used to adjust the output voltage over a 10 V ±300 mV

range. This feature allows the system designer to trim system errors by setting the reference to a voltage other tha n 10 V.

The output can also be set to exactly 10.000 V or to 10.240 V for binary applications.

Adjustment of the output does not significantly affect the temperature performance of the device. Normally, the temperature

coefficient change is 0.7 ppm/°C for 100 mV of output adjustment. See figure 2.

FIGURE 2. VOUT trim circuit .

−−−−−−−−−−−−−−

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 14-01-28

Approved sources of supply for SMD 5962-89581 are listed below for immediate acquisition information only and

shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QM L-38535 will be

revised to include the add it io n or deletio n of sour ces. The vendors listed below have agreed to this drawing and a

certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information

bulletin is superseded by the next dated revision of M IL-HDBK-103 and QML-38535. DLA Land and M aritim e

maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-8958101GA 3/ REF01AJ/883C

3/ REF01AH/883B

3/ REF01AT/883B

5962-8958101GC 3/ REF01AJ/883B

5962-8958101PA 24355 (2) REF01AZ/883C

3/ REF01AJ8/883B

3/ REF01AZ/883B

3/ REF01ADE/883B

5962-89581012A 3/ REF01ARC/883C

5962-89581012C 3/ REF01ARC/883B

5962-8958101VGA 24355 (4) REF01AJ/QMLV

5962-8958101VHA 24355 (4) REF01AL/QMLV

5962-8958101VPA 24355 (4) REF01AZ/QMLV

5962-8958101V2A 24355 (4) REF01ARC/QMLV

5962R8958101VGA 24355 (4) REF01AJ/QMLR

5962R8958101VHA 24355 (4) REF01AL/QMLR

5962R8958101VPA 24355 (4) REF01AZ/QMLR

5962R8958101V2A 24355 (4) RFEF01ARC/QMLR

5962-8958102GA 3/ REF01J/883C

3/ REF01T/883B

5962-8958102GC 3/ REF01J/883B

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STANDARD MICROCIRCUIT DRAWING BULLETIN – CONTINUED.

DATE: 14-01-28

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-8958102PA 3/ REF01Z/883C

3/ REF01Z/883B

3/ REF01DE/883B

5962-89581022A 3/ REF01RC/883C

5962-89581022C 3/ REF01RC/883B

5962-8958103GC 3/ REF01AJ/883B

5962-8958103PA 3/ REF01AZ/883B

5962-89581032C 3/ REF01ARC/883B

5962-8958104GC 3/ REF01J/883B

5962-8958104PA 3/ REF01Z/883B

5962-89581042C 3/ REF01RC/883B

5962L8958105VHA 24355 (4) REF01AL/QMLL

1/ The lead finish shown for each PIN representing a hermetic

package is the most readily available from the manufacturer

listed for that part. If the desired lead finish is not listed contact

the vendor to determine its availability.

2/ Caution. Do not use this number for item acquisition.

Items acquired to this number may not satisfy the performance

requireme nts of this drawing.

3/ Not available from an approved source of supply.

Vendor CAGE Vendor name

number and address

24355 Analog Devices (2)

RT 1 Industrial Park

PO Box 9106

Norwood, MA 02062

Point of contact: 804 Woburn Street

Wilmington, MA 01887-3462

24355 Analog Devices (4)

RT 1 Industrial Park

PO Box 9106

Norwood, MA 02062

Point of contact: 7910 Triad Center Drive

Greensboro, NC 27409-9605

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.

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