1/10July 2002
STD30NF06L
N-CHANNEL 60V - 0.022- 35A DPAK/IPAK
STripFET™ PO WE R MOSF ET
(1 ) ISD 38A, di/dt 400A/µs, VDD V(BR)DSS, Tj TJMAX.
TYPICAL RDS(on) = 0.022
EXCE PTIONAL dv/d t CAPABILITY
LOGIC LEVEL GATE DRIVE
ADD SUFFIX “T4” FOR ORDERING IN TAPE &
REEL
ADD SUFFIX “-1” FOR ORDERING IN IPAK
CHARACTERIZATION ORIENTED FOR
AUTOMOTIVE APPLICATIONS
DESCRIPTION
This Power Mosfet is the latest development of
STMicroelectronics unique “Single Feature
Size™” strip-based process. The resulting tran-
sistor shows extremely high packing density for
low on-resistance, rugged avalance characteris-
tics and less critical alignment steps therefore a re-
markable manufacturing reproducibility.
APPLICATIONS
HIGH-EFFICIENCY DC-DC CONVERTERS
MOTOR CONTROL, AUDIO AMPLIFIERS
DC-DC & DC-AC C ONVERTERS
AUTOMOTIVE
ABSOLUTE MAXIMUM RATINGS
() Pulse width limited by safe operating area
TYPE VDSS RDS(on) ID
STD30NF06L 60 V <0.02835 A
Symbol Parameter Value Unit
VDS Drain-source Voltage (VGS = 0) 60 V
VDGR Drain-gate Voltage (RGS = 20 k)60 V
VGS Gate- source Voltage ± 20 V
IDDrain Current (continuous) at TC = 25°C 35 A
IDDrain Current (continuous) at TC = 100°C 25 A
IDM (
l
)Drain Current (pulsed) 140 A
PTOT Total Dissipation at TC = 25°C 70 W
Derating Factor 0.46 W/°C
dv/dt (1) Peak Diode Recovery voltage slope 25 V/ns
Tstg Storage Temperature – 55 to 175 °C
TjOperating Junction Temperature
DPAK
3
2
113
IPAK
INTERNAL SCHEMATIC DIAGRAM
STD30NF06L
2/10
THE RMA L D ATA
AVALANCHE CHARACTERISTICS
ELECTRICAL CHARACT ERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
ON (1)
DYNAMIC
Rthj-case Thermal Resistance Junction-case Max 2.14 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 100 °C/W
TlMaximum Lead Temperature For Soldering Purpose 275 °C
Symbol Paramet er Max Value Unit
IAR Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max) 35 A
EAS Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V) 150 mJ
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V(BR)DSS Drain-source
Breakdown Voltage ID = 250 µA, VGS = 0 60 V
IDSS Zero Gate Voltage
Drain Current (VGS = 0) VDS = Max Rating A
V
DS = Max Rating, TC = 125 °C 10 µA
IGSS Gate-body Leakage
Current (VDS = 0) VGS = ± 20 V ±100 nA
Symbol Parameter Test Conditions Min. Typ. Max. Unit
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 µA 1 1.7 2.5 V
RDS(on) Static Drain-source On
Resistance VGS = 5 V, ID = 18 A 0.025 0.03
VGS = 10 V, ID = 18 A 0.022 0.028
Symbol Parameter Test Conditions Min. Typ. Max. Unit
gfs (1) Forward Transconductance VDS > =15 V , ID=15 A 25 S
Ciss Input Capacitance VDS = 25 V, f = 1 MHz, VGS = 0 1600 pF
Coss Output Capacitance 215 pF
Crss Reverse Transfer
Capacitance 60 pF
3/10
STD30NF06L
ELECTRICAL CHARACT ERISTICS (CONTINUED)
SWITCHIN G ON
SWITCHIN G OFF
SOURCE DRAIN DIODE
Note: 1. Pul sed: Pulse duration = 300 µs , duty cycl e 1.5 % .
2. Pulse width li m i ted by saf e operat i ng area.
Symbol Parameter Test Conditions Min. Typ. Max. Unit
td(on) Turn-on Delay Time VDD = 30 V, ID = 18 A
RG= 4.7 VGS = 4.5 V
(see test circuit, Figure 3)
30 ns
trRise Time 105 ns
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 48 V, ID = 38 A,
VGS = 5 V 23
7
10
31 nC
nC
nC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
td(off)
tfTurn-off-Delay Time
Fall Time VDD = 30 V, ID = 18 A,
RG=4.7Ω, VGS = 4.5 V
(see test circuit, Figure 3)
65
25 ns
ns
Symbol Parameter Test Conditions Min. Typ. Max. Unit
ISD Source-drain Current 35 A
ISDM (2) Source-drain Current (pulsed) 140 A
VSD (1) Forward On Voltage ISD = 35 A, VGS = 0 1.5 V
trr
Qrr
IRRM
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 38 A, di/dt = 100 A/µs,
VDD = 15 V, Tj = 150°C
(see test circuit, Figure 5)
70
140
4
ns
nC
A
Normalized Thermal ImpedenceSafe Op erating Area
STD30NF06L
4/10
Output Characteri stics
Gate Charge vs Gate-so urc e Voltage
Transco nductan ce Static Drain-so urce On Resistance
Transfer Characteri stics
Capacitance Va ria tions
5/10
STD30NF06L
Norma lized Gate Thresh ol d Voltage vs
Temperature
Norma lized Drain-Sou rce Breakdow n vs
Temperature Source-drain Diode Forward Characteristics
Normalized On Resistance vs Temp eratu re
STD30NF06L
6/10
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
Fig. 2: Unclamped Induc tive WaveformFig. 1: Unclamped Induc tive Load Test Circuit
Fig. 3: Switching Tim es Test Circuit For
Resis tive Load
7/10
STD30NF06L
DIM. mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 2.2 2.4 0.086 0.094
A1 0.9 1.1 0.035 0.043
A3 0.7 1.3 0.027 0.051
B 0.64 0.9 0.025 0.031
B2 5.2 5.4 0.204 0.212
B3 0.85 0.033
B5 0.3 0.012
B6 0.95 0.037
C 0.45 0.6 0.017 0.023
C2 0.48 0.6 0.019 0.023
D 6 6.2 0.236 0.244
E 6.4 6.6 0.252 0.260
G 4.4 4.6 0.173 0.181
H 15.9 16.3 0.626 0.641
L 9 9.4 0.354 0.370
L1 0.8 1.2 0.031 0.047
L2 0.8 1 0.031 0.039
A
C2
C
A3
H
A1
DL
L2
L1
1 3
= =
B3
B
B6
B2
E
G
= =
= =
B5
2
TO-251 (I PA K) ME CH ANI CAL DAT A
0068771-E
STD30NF06L
8/10
DIM. mm inch
MIN. TYP. MAX. MIN. TYP. MAX.
A 2.20 2.40 0.087 0.094
A1 0.90 1.10 0.035 0.043
A2 0.03 0.23 0.001 0.009
B 0.64 0.90 0.025 0.035
B2 5.20 5.40 0.204 0.213
C 0.45 0.60 0.018 0.024
C2 0.48 0.60 0.019 0.024
D 6.00 6.20 0.236 0.244
E 6.40 6.60 0.252 0.260
G 4.40 4.60 0.173 0.181
H 9.35 10.10 0.368 0.398
L2 0.8 0.031
L4 0.60 1.00 0.024 0.039
V2 0
o
8
o
0
o
0
o
P032P_B
TO-252 (DPAK) MECHANICAL DATA
STD30NF06L
9/10
TAPE AND REEL SHIPMENT (suffix ”T4”)*
TUBE SHIPMENT (no suffix)*
DPA K FOOTPRINT
DIM. mm inch
MIN. MAX. MIN. MAX.
A 330 12.992
B1.5 0.059
C 12.8 13.2 0.504 0.520
D 20.2 0.795
G 16.4 18.4 0.645 0.724
N 50 1.968
T 22.4 0.881
BASE QTY BULK QTY
2500 2500
REEL MECHANICAL DATA
DIM. mm inch
MIN. MAX. MIN. MAX.
A0 6.8 7 0.267 0.275
B0 10.4 10.6 0.409 0.417
B1 12.1 0.476
D 1.5 1.6 0.059 0.063
D1 1.5 0.059
E1.65 1.85 0.065 0.073
F 7.4 7.6 0.291 0.299
K0 2.55 2.75 0.100 0.108
P0 3.9 4.1 0.153 0.161
P1 7.9 8.1 0.311 0.319
P2 1.9 2.1 0.075 0.082
R40 1.574
W 15.7 16.3 0.618 0.641
TAP E MECHANICAL DATA
All dimensions
are in millime ters
All dimensions are in millimeters
STD30NF06L
10/10
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no respons ibilit y for the
consequences of use o f su ch informat ion nor for any infri ngement of p atents or other rights of third parties w hich may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectron ics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
prev iously supplied. STMic ro electro nics produ cts ar e not auth orized f or use as critica l compone nts in life support dev ices or
systems without express written approval of STMicroelectronics.
© The ST logo is a registered trademark of STMicroelectronics
© 2002 STMicroelectronics - Printed in Italy - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malays ia - Malta - Morocco
Singapore - Spain - Sweden - Switzerland - United Ki ngdom - United States.
© http://www.st.com