HAL62x
16 Micronas
5. Application Notes
5.1. Ambient Temperature
Due to the internal power dissipation, the temperature
on the silicon chip (junction temperature TJ) is higher
than the temperature outside the package (ambient tem-
perature TA).
TJ = TA + ∆T
At static conditions, the following equation is valid:
∆T = IDD * VDD * Rth
For typical values, use the typical parameters. For worst
case calculation, use the max. parameters for IDD and
Rth, and the max. value for VDD from the application.
For all sensors, the junction temperature range TJ is
specified. The maximum ambient temperature TAmax
can be calculated as:
TAmax = TJmax – ∆T
5.2. Start-up Behavior
Due to the active offset compensation, the sensors have
an initialization time (enable time ten(O)) after applying
the supply voltage. The parameter ten(O) is specified in
the Electrical Characteristics (see page 8).
During the initialization time, the output state is not de-
fined and the output can toggle. After ten(O), the output
will be low if the applied magnetic field B is above BON.
The output will be high if B is below BOFF.
For magnetic fields between BOFF and BON, the output
state of the HAL sensor after applying VDD will be either
low or high. In order to achieve a well-defined output
state, the applied magnetic field must be above BONmax,
respectively, below BOFFmin.
Micronas GmbH
Hans-Bunte-Strasse 19
D-79108 Freiburg (Germany)
P.O. Box 840
D-79008 Freiburg (Germany)
Tel. +49-761-517-0
Fax +49-761-517-2174
E-mail: docservice@micronas.com
Internet: www.micronas.com
Printed in Germany
by Systemdruck+V erlags-GmbH, Freiburg (02/2001)
Order No. 6251-504-2DS
5.3. EMC and ESD
For applications with disturbances on the supply line or
radiated disturbances, a series resistor and a capacitor
are recommended (see figure 4–9). The series resistor
and the capacitor should be placed as closely as pos-
sible to the sensor.
Applications with this arrangement passed the EMC
tests according to the product standards DIN 40839.
Note: The international standard ISO 7637 is similar to
the used product standard DIN 40839.
Please contact Micronas for the detailed investigation
reports with the EMC and ESD results.
OUT
GND
3
2
1V
DD
4.7 nF
VEMC
VP
RV
220 Ω
RL1.2 kΩ
20 pF
Fig. 4–9: Test circuit for EMC investigations
6. Data Sheet History
1. Final data sheet: “HAL621, HAL629, Hall Ef fect
Sensor Family”, Feb. 3, 2000, 6251-504-1DS.
First release of the final data sheet.
2. Final data sheet: “HAL621, HAL629, Hall Ef fect
Sensor Family”, Feb. 5, 2001, 6251-504-2DS.
Second release of the final data sheet. Major
changes:
–position of sensitive area in SOT-89B package
changed
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issue of this data sheet invalidates previous issues. Product availability
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tion form; the same applies to orders based on development samples
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