Philips Semiconductors Product specification
74F00Quad 2-input NAND gate
October 4, 1990 3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL PARAMETER RATING UNIT
VCC Supply voltage –0.5 to +7.0 V
VIN Input voltage –0.5 to +7.0 V
IIN Input current –30 to +5 mA
VOUT Voltage applied to output in high output state –0.5 to VCC V
IOUT Current applied to output in low output state 40 mA
Tamb Operating free air temperature range Commercial range 0 to +70 °C
Industrial range –40 to +85 °C
Tstg Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS UNIT
MIN NOM MAX
VCC Supply voltage 4.5 5.0 5.5 V
VIH High-level input voltage 2.0 V
VIL Low-level input voltage 0.8 V
IIk Input clamp current –18 mA
IOH High-level output current –1 mA
IOL Low-level output current 20 mA
Tamb Operating free air temperature range Commercial range 0 +70 °C
Industrial range –40 +85 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL PARAMETER TEST CONDITIONS1LIMITS UNIT
MIN TYP2MAX
VOH High-level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 V
VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V
VOL Low-level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.30 0.50 V
VIH = MIN, IOl = MAX ±5%VCC 0.30 0.50 V
VIK Input clamp voltage VCC = MIN, II = IIK -0.73 -1.2 V
IIInput current at maximum input
voltage VCC = MAX, VI = 7.0V 100 µA
IIH High-level input current VCC = MAX, VI = 2.7V 20 µA
IIL Low-level input current VCC = MAX, VI = 0.5V -0.6 mA
IOS Short-circuit output current3VCC = MAX -60 -150 mA
ICC Supply current (total) ICCH VCC = MAX VIN = GND 1.9 2.8 mA
ICCL VCC = MAX VIN = 4.5V 6.8 10.2 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.