502-1166 Engineering Report 20Jul04 Rev O EC 0990-0981-04 Product Verification of AMP* Power Series 120 Connectors 1. INTRODUCTION 1.1. Purpose Testing was performed on AMP* Power Series 120 Double and Single Pole Connectors to verify performance of product subjected to a variety of electrical, mechanical and environmental tests including: crimp tensile, durability, low level contact resistance, contact retention, mating and unmating forces, temperature rise, UL 1977 Section 16, and CSA C22.2 No. 182.3-M1987. 1.2. Scope This report covers connectors tested under test reports CTL B034992-003, B034992-004, B034992005, B034992-006, B034992-007 and B034992-010. Testing was performed by the Engineering Assurance Product Test Laboratory. 2. DOUBLE POLE TESTING 2.1. Test Samples Test samples were representative of normal production lots. Samples identified with the following part numbers were used for test. Sample Group 1,2 1 3 8 9 1 1 Quantity Part Number Description CTL B034992-003 - Crimp Tensile 4 each 1604072-2 Reducing bushing crimped with 6 AWG wire 4 each 1445995 2 AWG contact CTL B034992-004 - Durability, Contact Retention, Temperature Rise 4 1445998-2 Housing with 2, 2 AWG contacts 10 1445998-2 Housing with 2, 4 AWG contacts 2 1445998-2 Housing with 2, 6 AWG contacts with wire 2 1445998-2 Housing with 2, 4 AWG contacts with wire CTL B034992-007 - Temperature Rise at Rated Current 6 1445994-2 Housing with 2, 2 AWG contacts CTL B034992-010 - Mating/Unmating Force 2 1445994-1 Housing loaded with 2, 120 ampere contacts Figure 1 (c)2004 Tyco Electronics Corporation Harrisburg, PA All International Rights Reserved * Trademark | Indicates change 1 of 7 LOC B 502-1166 2.2. Test Results A. CTL B034992-003 - Crimp Tensile Summary of crimp tensile results are shown in Figure 2. Samples were tensiled at a maximum rate of .5 inch per minute. Maximum force values recorded until wires pulled from contacts. Sample ID Maximum Load (lbs) Proof Load (lbs) 1 378.29 20.00 2 381.20 20.00 3 387.76 20.00 4 389.51 20.00 Figure 2 Crimp Tensile B. CTL B034992-004 - Durability, Contact Retention and Temperature Rise vs Current. 1. Sample Group 1 - Durability with Temperature Rise vs Current 2. Test Sequence: a. Initial temperature rise b. Durability, 10,000 mating cycles at maximum rate of 500 cycles per hour c. Final temperature rise 3. Temperature rise for Sample Group 1 was measured initially, and after 10,000 cycles of durability testing was performed. Thermocouples were soldered to the underside of the contact as close to the interface area as possible. Sample ID's 101, 102 Minimum /C 30 Amperes /C 60 Amperes Initial Final Initial Final 2.100 2.400 6.900 7.600 /C 90 Amperes Initial Final /C 120 Amperes Initial Final /C 150 Amperes Initial Final 14.600 15.800 25.300 25.300 40.200 38.500 Maximum 2.900 3.500 8.400 10.300 21.000 20.800 34.700 34.600 50.600 53.800 Average 2.550 2.850 7.750 8.738 16.650 17.950 28.300 29.150 43.275 44.700 Figure 3 Temperature Rise Rev O 2 of 7 502-1166 Figure 4 Final Temperature Rise vs Current 4. Sample Group 3 - Contact Retention Contact retention was performed at a maximum rate of .5 inch per minute. The force required to pull the contact from the housing was measured and recorded. See Figure 5. Sample Group 3 Data Contact Retention (lbs) Minimum 122.300 Maximum 146.000 Average 134.238 Figure 5 Contact Retention Rev O 3 of 7 502-1166 5. Sample Test Group 8 and 9 - Temperature Rise - 6AWG and 4AWG Temperature rise (Test Groups 8 and 9) was measured until a 30/C temperature rise value was sustained. Thermocouples were soldered to the underside of the contact as close to the interface area as possible. See Figures 6 and 7. )/C 20 Amperes Sample ID 801 )/C 40 Amperes )/C 60 Amperes )/C 80 Amperes Minimum 4.400 10.100 19.000 32.300 Maximum 4.700 10.900 20.700 34.200 Average 4.525 10.550 19.875 33.275 Figure 6 Sample Group 8, Temperature Rise, 6AWG Sample ID 901 )/C 20 Amperes )/C 40 Amperes )/C 60 Amperes )/C 80 Amperes )/C 100 Amperes )/C 120 Amperes Minimum 1.900 5.700 11.000 18.900 27.500 28.400 Maximum 2.200 5.900 11.400 19.500 28.600 41.300 Average 2.000 5.850 11.225 19.225 28.075 37.400 Figure 7 Sample Group 9, Temperature Rise, 4AWG C. CTL B034992-007 - Temperature Rise at Rated Current Six paired samples using 2 AWG wires were subjected to a temperature rise test for 4 hours with 100% of the contacts energized with a current of 115 amperes. Thermocouples were soldered to the underside of the contact as close to the interface area as possible. Ambient temperature was 25/C. See Figure 8. Sample ID's 101 -106 Actual (/C) Temperature Rise (/C) Minimum 46.5 21.5 Maximum 52.8 27.8 Average 49.35 24.35 Figure 8 Temperature Rise at Rated Current D. CTL B034992-010 - Mating and Unmating Force The force required to mate and unmate the samples after the initial, 5th and 10th cycles at a maximum rate of .5 inch per minute was measured and recorded. See Figure 9. Initial (lbs) 5th Cycle (lbs) 10th Cycle (lbs) Sample ID A-C Mating Unmating Mating Unmating Mating Unmating Minimum 16.66 17.7 17.53 16.11 18.73 18.07 Maximum 20.29 19.99 18.62 19.88 19.07 20.44 Average 18.49 18.52 17.98 17.48 18.93 19.13 Figure 9 Mating and Unmating Force Rev O 4 of 7 502-1166 3. SINGLE POLE TESTING 3.1. Test Samples Test samples were representative of normal production lots. Samples identified with the following part numbers were used for test. Sample Part Quantity Description Group Number CTL B034992-005 - Durability, Contact Retention, Mating/Unmating Force, Temperature Rise 1 4 1604002-2 Housing with 2 AWG contacts 3 10 1604002-2 Housing with 2 AWG contacts 4 20 1604002-2 Housing with 2 AWG contacts with wire 6 2 1604001-2 Housing with 6 AWG contacts with wire 7 2 1604001-2 Housing with 4 AWG contacts with wire CTL B034992-006 - Temperature Test 6 1604002-2 Housing with 2 AWG contacts in 1X2 configuration 1 6 1604002-2 Housing with 2 AWG contacts in 2X2 configuration Figure 10 3.2. Test Results A. CTL B034992-005 - Durability, Contact Retention, Mating/Unmating Force, and Temperature Rise vs Current 1. Sample Group 3 -Contact Retention Contact retention was performed at a maximum rate of 1 inch per minute. The force required to pull the contact from the housing was measured and recorded. See Figure 11. Sample Group 3 Data Contact Retention (lbs) Minimum 109.0 Maximum 139.3 Average 127.3 Figure 11 Contact Retention 2. Samples from Sample Group 4 were subjected to 5 mating/unmating cycles. The force required to mate and unmate the samples at a maximum rate of 1 inch per minute was measured and recorded. See Figure 12. Sample Group 4 Mating Force (lbs) Sample Group 4 Unmating Force (lbs) Minimum 7.25 Minimum 5.50 Maximum 9.82 Maximum 11.25 Average 8.18 Average 7.95 Figure 12 Mating/Unmating Force Rev O 5 of 7 502-1166 3. Sample Group 1 - Durability with Temperature Rise vs Current a. Test Sequence: (1) (2) (3) b. Sample ID's 101, 102 Initial temperature rRise Durability 10,000 mating cycles at maximum rate of 500 cycles per hour Final temperature rise Temperature rise for Sample Group 1 was measured initially, and after 10,000 cycles of durability testing was performed. Thermocouples were soldered to the underside of the contact as close to the interface area as possible. /C 30 Amperes /C 60 Amperes /C 90 Amperes Initial /C 120 Amperes Final Initial /C 140 Amperes Initial Final Initial Final Final Initial Final Minimum 3.200 2.400 8.600 6.900 16.700 13.800 29.200 23.300 32.700 31.300 Maximum 3.600 3.000 9.300 9.300 18.500 18.900 30.300 32.200 34.000 44.400 Average 3.375 2.725 8.925 8.075 17.575 16.325 29.750 27.700 33.350 37.850 Figure 13 Sample Group 1, Final Temperature Rise TEMPERATURE RISE vs. CURRENT - FINAL 40 37.9 30 T - RISE (Deg. C) 27.7 20 16.3 10 8.1 2.7 0 30 60 90 120 150 CURRENT (AMPERES) Figure 14 Sample Group 1, Final Temperature Rise Rev O 6 of 7 502-1166 4. Sample Test Groups 6 and 7 - Temperature Rise, 6AWG and 4AWG Temperature rise (Test Groups 6 and 7) was measured until a 30/C temperature rise value was sustained. Thermocouples were soldered to the underside of the contact as close to the interface area as possible. See Figures 15 and 16. Sample Group 6 )/C 30 Amperes )/C 50 Amperes )/C 70 Amperes )/C 80 Amperes )/C 90 Amperes Minimum 4.300 9.900 19.600 24.300 32.200 Maximum 4.300 10.000 19.600 24.400 32.200 Average 4.300 9.950 19.600 24.350 32.200 Figure 15 Sample Group 6, Temperature Rise, 6AWG Sample Group 7 )/C 30 Amperes )/C 50 Amperes )/C 70 Amperes )/C 90 Amperes )/C 110 Amperes Minimum 3.100 7.100 13.600 22.600 32.500 Maximum 3.400 7.100 13.800 22.800 32.700 Average 3.250 7.100 13.700 22.700 32.600 Figure 16 Sample Group 7, Temperature Rise, 4AWG B. CTL B034992-006 - Temperature Rise at Rated Current Six paired samples using 2 AWG wires, in connector configurations of 1x2 and 2x2, were subjected to a temperature rise test for 4 hours with 100% of the contacts energized with a current of 115 amperes. Thermocouples were soldered to the underside of the contact as close to the interface area as possible. Ambient temperature was 25/C. See Figure 17. Data Actual (/C) Temperature Rise (/C) 1X2 Configuration Actual (/C) Temperature Rise (/C) 2X2 Configuration Minimum 46.9 22.5 48.8 22.8 Maximum 53.1 28.7 55.8 29.8 Average 48.7 24.3 52.3 26.3 Figure 17 Temperature Rise at Rated Current, Single-Pole Rev O 7 of 7