
IXZ308N120
Z-MOS RF Power MOSFET
VDSS = 1200 V
ID25 = 8.0 A
RDS(on) = 2.1 Ω
PDC = 880 W
Symbol Test Conditions Maximum Rat-
ings
VDSS TJ = 25°C to 150°C 1200 V
VDGR TJ = 25°C to 150°C; RGS = 1 MΩ 1200 V
VGS Continuous ±20 V
VGSM Transient ±30 V
ID25 Tc = 25°C 8 A
IDM Tc = 25°C, pulse width limited by TJM 40 A
IAR Tc = 25°C 8 A
EAR Tc = 25°C TBD mJ
dv/dt IS ≤ IDM, di/dt ≤ 100A/µs, VDD ≤ VDSS,
Tj ≤ 150°C, RG = 0.2Ω
5 V/ns
IS = 0 >200 V/ns
PDC 880 W
PDHS Tc = 25°C, Derate 4.4W/°C above 25°C 440 W
PDAMB Tc = 25°C 3.0 W
RthJC 0.17 C/W
RthJHS 0.34 C/W
min. typ. max.
VDSS VGS = 0 V, ID = 4 ma 1200 V
VGS(th) VDS = VGS, ID = 250µΑ 3.5 6.5 V
IGSS VGS = ±20 VDC, VDS = 0 ±100 nA
RDS(on) VGS = 20 V, ID = 0.5ID25
Pulse test, t ≤ 300µS, duty cycle d ≤ 2%
2.1
Ω
gfs VDS = 50 V, ID = 0.5ID25, pulse test 10.1 S
TJ -55 +175 °C
TJM 175 °C
Tstg -55 + 175 °C
TL 1.6mm(0.063 in) from case for 10 s 300 °C
Weight 3.5 g
IDSS VDS = 0.8VDSS TJ = 25C
VGS=0 TJ =125C 50
1
µA
mA
Features
• Isolated Substrate
− high isolation voltage (>2500V)
− excellent thermal transfer
− Increased temperature and power
cycling capability
• IXYS advanced Z-MOS process
• Low gate charge and capacitances
− easier to drive
− faster switching
• Low RDS(on)
• Very low insertion inductance (<2nH)
• No beryllium oxide (BeO) or other
hazardous materials
Advantages
• Optimized for RF and high speed
• Easy to mount—no insulators needed
• High power density
N-Channel Enhancement Mode Linear 175MHz RF MOSFET
Lo Capacitance Z-MOSTM MOSFET Process
Optimized for Linear Operation
Ideal for Class AB & C, Broadcast & Communications Applications
DRAIN
SG1 SG2
GATE
SD1 SD2
N-Channel Enhancement Mode Switch Mode RF MOSFET
Low Capacitance Z-MOSTM MOSFET Process
Optimized for RF Operation
Ideal for Class C, D, & E Applications