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© 2001
MOS INTEGRATED CIRCUIT
µ
µµ
µ
PD
44164084, 44164184, 44164364
18M-BIT CMOS SYNCHRONOUS FAST SRAM
DOUBLE DATA RATE
4-WORD BURST OPERATION
Document No. M15822EJ1V0DS00 (1st edition)
Date Published October 2001 NS CP(K)
Printed in Japan
PRELIMINARY DATA SHEET
Description
The
µ
PD44164084 is a 2,097,152-word by 8-bit, the
µ
PD44164184 is a 1,048,576-word by 18-bit and the
µ
PD44164364
is a 524,288-word by 36-bit synchronous double data rate static RAM fabricated with advanced CMOS technology using
full CMOS six-transistor memory cell.
The
µ
PD44164084 and
µ
PD44164184 integrates unique s ynchro nous peripheral circuitry and a burst counter. All
input registers controlled by an input clock pair (K and /K) and are latched on the positive edge of K and /K.
These products are suitable for applications which require synchronous operation, high speed, low voltage, high density
and wide bit configuration.
These products are packaged in 16 5-pin PLASTIC FBGA package.
Features
• 1.8 ± 0.1 V power supply and HSTL I/O
• DLL circuitry for wide output data valid window and future frequency scaling
• Pipelined double data rate operation
• Common data input/output bus
• Four-tick burst for reduced address frequency
• Two input clocks (K and /K) for precise DDR timing at clock rising edges only
• Two output clocks (C and /C) for precise flight time
and clock skew matching-clock and data delivere d togeth er to receiving device
• Internally self-timed write control
• Clock-stop capability with
µ
s restart
• User programmable impedence output
• Fast clock cycle time : 3.0 ns (333 MHz), 3.3 ns (300 MHz), 4.0 ns (250 MHz) , 5.0 ns (200 MHz) , 6.0 ns (167 MHz)
• Simple control logic for easy depth expansion
• JTAG boundary scan
2Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Ordering Information
Part number Cycle Clock Organization Core Supply I/O Package
Time Frequency (word x bit) Voltage Interface
ns MHz V
µ
PD44164084Fx-E30-EQx 3.0 333 2 M x 8-bit 1.8 ± 0.1 HSTL 165-pin PLASTIC
µ
PD44164084Fx-E33-EQx 3.3 300 FBGA (13 x 15)
µ
PD44164084Fx-E40-EQx 4.0 250
µ
PD44164084Fx-E50-EQx 5.0 200
µ
PD44164084Fx-E60-EQx 6.0 167
µ
PD44164184Fx-E30-EQx 3.0 333 1 M x 18-bit
µ
PD44164184Fx-E33-EQx 3.3 300
µ
PD44164184Fx-E40-EQx 4.0 250
µ
PD44164184Fx-E50-EQx 5.0 200
µ
PD44164184Fx-E60-EQx 6.0 167
µ
PD44164364Fx-E30-EQ x 3.0 333 512 K x 36-bit
µ
PD44164364Fx-E33-EQx 3.3 300
µ
PD44164364Fx-E40-EQx 4.0 250
µ
PD44164364Fx-E50-EQx 5.0 200
µ
PD44164364Fx-E60-EQx 6.0 167
Remark "Fx" and "EQx" of part number are package specifications. However, these are not available.
3
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Pin Configuration (Marking Side)
/××× indicates active low signal.
165-pin PL ASTIC FBGA (13 x 15)
(Top View)
[
µ
µµ
µ
PD44164084Fx]
1234567891011
A/CQ VSS Ax R, /W /NW1 /K NC /LD Ax VSS CQ
B NC NC NC Ax NC K /NW0 Ax NC NC DQ3
CNC NC NC V
SS Ax NC Ax VSS NC NC NC
DNC NC NC V
SS VSS VSS VSS VSS NC NC NC
ENC NC DQ4V
DDQV
SS VSS VSS VDDQNC NCDQ2
FNC NC NCV
DDQV
DD VSS VDD VDDQNC NC NC
GNC NC DQ5V
DDQV
DD VSS VDD VDDQNC NC NC
H/DLL V
REF VDDQV
DDQV
DD VSS VDD VDDQV
DDQV
REF ZQ
JNC NC NCV
DDQV
DD VSS VDD VDDQNCDQ1NC
KNC NC NC V
DDQV
DD VSS VDD VDDQNC NC NC
LNC DQ6 NCV
DDQV
SS VSS VSS VDDQNC NCDQ0
MNC NC NC V
SS VSS VSS VSS VSS NC NC NC
NNC NC NC V
SS Ax Ax Ax VSS NC NC NC
P NC NC DQ7 Ax Ax C Ax Ax NC NC NC
RTDOTCKAxAxAx/CAxAxAxTMSTDI
Ax : Address inputs TMS : IEEE 1149.1 Test input
DQ0 to DQ7 : Data inputs / outputs TDI : IEEE 1149.1 Test input
/LD : Synchronous load TCK : IEEE 1149.1 Clock input
R , /W : Read Write input TDO : IEEE 1149.1 Test output
/NW0, /NW1 : Nybble Write data select CQ ,/CQ : Echo clock
K, /K : Input clock VREF : HSTL input reference input
C, /C : Output clock VDD : Power Supply
ZQ : Output impedance matching VDDQ : Power Supply
/DLL : DLL disable VSS : Ground
NC : No connection
Remark Refer to Package Drawing for 1-pin inde x mark.
4Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
165-pin PL ASTIC FBGA (13 x 15)
(Top View)
[
µ
µµ
µ
PD44164184Fx]
1234567891011
A/CQ V
SS Ax R, /W /BW1 /K NC /LD Ax VSS CQ
B NC DQ9 NC Ax NC K /BW0 Ax NC NC DQ8
CNC NC NC V
SS Ax A0 A1 VSS NC DQ7 NC
DNC NCDQ10V
SS VSS VSS VSS VSS NC NC NC
ENC NCDQ11V
DDQV
SS VSS VSS VDDQNC NCDQ6
FNCDQ12NCV
DDQV
DD VSS VDD VDDQNC NCDQ5
GNC NC DQ13V
DDQV
DD VSS VDD VDDQNC NC NC
H/DLL V
REF VDDQV
DDQV
DD VSS VDD VDDQV
DDQV
REF ZQ
JNC NC NCV
DDQV
DD VSS VDD VDDQNCDQ4NC
KNC NCDQ14V
DDQV
DD VSS VDD VDDQNC NCDQ3
LNCDQ15NCV
DDQV
SS VSS VSS VDDQNC NCDQ2
MNC NC NC V
SS VSS VSS VSS VSS NC DQ1 NC
NNC NCDQ16V
SS Ax Ax Ax VSS NC NC NC
P NC NC DQ17 Ax Ax C Ax Ax NC NC DQ0
RTDOTCKAxAxAx/CAxAxAxTMSTDI
A0 to Ax : Address inputs TMS : IEEE 1149.1 Test input
DQ0 to DQ17 : Data inputs / outputs TDI : IEEE 1149.1 Test input
/LD : Synchronous load TCK : IEEE 1149.1 Clock input
R , /W : Read Write input TDO : IEEE 1149.1 Test output
/BW0, /BW1 : Byte Write data select CQ ,/CQ : Echo clock
K, /K : Input clock VREF : HSTL input reference input
C, /C : Output clock VDD : Power Supply
ZQ : Output impedance matching VDDQ : Power Supply
/DLL : DLL disable VSS : Ground
NC : No connection
Remark Refer to Package Drawing for 1-pin inde x mark.
5
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
165-pin PL ASTIC FBGA (13 x 15)
(Top View)
[
µ
µµ
µ
PD44164364Fx]
1234567891011
A/CQ V
SS NC R, /W /BW2 /K /BW1 /LD Ax VSS CQ
B NC DQ27 DQ18 Ax /BW3 K /BW0 Ax NC NC DQ8
CNC NCDQ28V
SS Ax A0 A1 VSS NC DQ17 DQ7
D NC DQ29 DQ19 VSS VSS VSS VSS VSS NC NC DQ16
ENC NCDQ20V
DDQV
SS VSS VSS VDDQ NC DQ15 DQ6
F NC DQ30 DQ21 VDDQV
DD VSS VDD VDDQNC NCDQ5
G NC DQ31 DQ22 VDDQV
DD VSS VDD VDDQNC NCDQ14
H/DLL V
REF VDDQV
DDQV
DD VSS VDD VDDQV
DDQV
REF ZQ
JNC NCDQ32V
DDQV
DD VSS VDD VDDQ NC DQ13 DQ4
KNC NCDQ23V
DDQV
DD VSS VDD VDDQ NC DQ12 DQ3
L NC DQ33 DQ24 VDDQV
SS VSS VSS VDDQNC NCDQ2
MNC NC DQ34V
SS VSS VSS VSS VSS NC DQ11 DQ1
N NC DQ35 DQ25 VSS Ax Ax Ax VSS NC NC DQ10
P NC NC DQ26 Ax Ax C Ax Ax NC DQ9 DQ0
RTDOTCKAxAxAx/CAxAxAxTMSTDI
A0 to Ax : Address inputs TMS : IEEE 1149.1 Test input
DQ0 to DQ35 : Data inputs / outputs TDI : IEEE 1149.1 Test input
/LD : Synchronous load TCK : IEEE 1149.1 Clock input
R , /W : Read Write input TDO : IEEE 1149.1 Test output
/BW0 to /BW3 : Byte Write data select CQ ,/CQ : Echo clock
K, /K : Input clock VREF : HSTL input reference input
C, /C : Output clock VDD : Power Supply
ZQ : Output impedance matching VDDQ : Power Supply
/DLL : DLL disable VSS : Ground
NC : No connection
Remark Refer to Package Drawing for 1-pin inde x mark.
6Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Pin Identification
Symbol Description
A0
A1
Ax
Synchronous Address Inputs: These inputs are registered and must meet the setup and hold times around the
rising edge of K. Balls 9A, 3A, 10A, and 2A are reserved for the next higher-order address inputs on future
devices. All transactions operate on a burst of four words (two clock period of bus activity). A0 and A1 are used
as the lowest two address bits for BURST READ and BURST WRITE operations permitting a random burst
start address on x18 and x36 devices. These inputs are ignored when device is deselected or once BURST
operation is in progress.
/LD Synchronous Load: This input is brought LOW when a bus cycle sequence is to be defined. This definition
includes address and read/write direction. All transactions operate on a burst of 4 data (two clock periods of bus
activity).
R , /W Synchronous Read/Write Input: When /LD is LOW , this input designates the access type (READ when /R,W is
HIGH, WRITE when /R,W is LOW) for the loaded address. /R,W must meet the setup and hold times around
the rising edge of K.
/NWx
/BWx Synchronous Byte Writes (Nybble Writes on x8): When LOW these inputs cause their respective byte or nybble
to be registered and written during WRITE cycles. These signals must meet setup and hold times around the
rising edges of K and /K for each of the two rising edges comprising the WRITE cycle. See pin assignment
figures for signal to data relationships.
K , /K Input Clock: This input clock pair registers address and control inputs on the rising edge of K, and registers data
on the rising edge of K and the rising edge of /K. /K is ideally 180 degrees out of phase with K. All synchronous
inputs must meet setup and hold times around the clock rising edges.
C , /C Output Clock: This clock pair provides a user controlled means of tuning device output data. The rising edge of
C is used as the output timing reference for first and third output data. The rising edge of /C is used as the
output reference for second and fourth output data. Ideally, /C is 180 degrees out of phase with C. C and /C
may be tied HIGH to force the use of K and /K as the output reference clocks instead of having to provide C and
/C clocks. If tied HIGH, C and /C must remain HIGH and not be toggled during device operation.
/DLL DLL Disable: When LOW, this input causes the DLL to be bypassed for stable low frequency operation.
ZQ Output Impedance Matching Input: This input is used to tune the device outputs to the system data bus
impedance. DQ and CQ output impedance are set to 0.2 x RQ, where RQ is a resistor from this bump to
ground. Alternately, this pin can be connected directly to VDD, which enables the minimum impedance mode.
This pin cannot be connected directly to GND or left unconnected.
TMS
TDI IEEE 1149.1 Test Inputs: 1.8V I/O levels. These balls may be left Not Connected if the JTAG function is not
used in the circuit.
TCK IEEE 1149.1 Clock Input: 1.8V I/O levels. This pin must be tied to VSS if the JTAG function is not used in the
circuit.
VREF HSTL Input Reference Voltage: Nominally VDDQ/2. Provides a reference voltage for the input buffers.
DQ0 to DQxx Synchronous Data IOs: Input data must meet setup and hold times around the rising edges of K and /K. Output
data is synchronized to the respective C and /C data clocks or to K and /K if C and /C are tied to HIGH.
x8 device uses DQ0-DQ7. Remaining signals are NC.
x18 device uses DQ0-DQ17. Remaining signals are NC.
x36 device uses DQ0-DQ35. Remaining signals are NC.
NC signals are read in the JTAG scan chain as the logic level applied to the ball site.
CQ, /CQ Synchronous Echo Clock Outputs. The rising edges of these outputs are tightly matched to the synchrono us
data outputs and can be used as a data valid indication. These signals run freely and do not stop when Q
tristates.
TDO IEEE 1149.1 Test Output: 1.8V I/O level.
VDD Power Supply: 1.8V nominal. See DC Electrical Characteristics and Operating Conditions for range.
VDDQ Power Supply: Isolated Output Buffer Supply. Nominally 1.5V. 1.8V is also permissible. See DC Electrical
Characteristics and Operating Conditions for range.
VSS Power Supply: Ground
NC No Connect: These signals are internally connected and appear in the JTAG scan chain as the logic level
applied to the ball sites. These signals may be connected to ground to improve package heat dissipation.
7
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Block Diagram
2 : 1
MUX
0
1
/A0'
A0'
/A0'
A0'
0
1
Input
Register
E
/K
R, /W
Input
Register
E
Write address
Register
E
/K
R, /W
Register
E
Output control
Logic
/C C
Address
Register
E
/LD
Address
A0'' A0'''
Compare
Output Buffer
ZQ
DQ
Output Enable
Register
C
Burst
Logic
D1
D0 Q1
Q0
A1A0
CLK
A0'A1'
WRITE Register
Memory
Array
WRITE Driver
Sense Amps
Output Register
A0'
CLK C
E
A0'''
R
/W
Burst Sequence
Linear Burst Sequence Table
Ax A1 A0 Ax A1 A0 Ax A1 A0 Ax A1 A0
External Address X 0 0 X 0 1 X 1 0 X 1 1
1st Internal Burst Address X 0 1 X 1 0 X 1 1 X 0 0
2nd Internal Burst Address X 1 0 X 1 1 X 0 0 X 0 1
3rd Internal Burst Address X 1 1 X 0 0 X 0 1 X 1 0
8Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Truth Table
Operation /LD R, /W CLK DQ
WRITE cycle L L L → H Data in
Load address, input write data on two Input data D(A1) D(A2) D(A3) D(A4)
consecutive K and /K rising edge Input clock K(t+1) ↑/K(t+1) ↑K(t+2) ↑/K(t+2) ↑
READ cycle L H L → H Data out
Load address, read data on two Output data Q(A1) Q(A2) Q(A3) Q(A4)
consecutive C and /C rising edge Output clock /C(t+1) ↑C(t+2) ↑/C(t+2) ↑C(t+3) ↑
NOP (No operation) H X L → HHi-Z
STANDBY(Clock stopped) X X Stopped Previous state
Remarks 1. H : High level , L : Lo w level , × : don’t care, ↑ : rising edge.
2. Data inputs are registered at K and /K rising edges. Data outputs are delivered at C and /C rising edges
except if C and /C are HIGH then Data outputs ar e delivered at K and /K rising edges.
3. All control inputs in the truth table must meet setup/hold times around the rising edge (LOW to HIGH) of
K. All control inputs are registered during the risi ng edge of K.
4. This device contains circuitry that will ensure the outp uts will be in High-Z during power-up.
5. Refer to state diagram and timing diagrams for clarificatio n.
6. A1 refers to the address input during a WRITE or READ cycle. A2,A3 and A4 refer to the next internal
burst address in accordance with the linear burst sequence.
7. It is recommended that K = /K = C = /C when clock is stopped. This is not essential but permits most
rapid restart by overcoming transmission line charging symmetrically.
9
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Byte Write Operation
[
µ
µµ
µ
PD44164084]
Operation K /K /NW0 /NW1
Write D0-7 L → H –00
–L → H0 0
Write D0-3 L → H –01
–L → H0 1
Write D4-7 L → H –10
–L → H1 0
Write nothing L → H –11
–L → H1 1
Remark H : High level , L : Low level , → : rising edge.
[
µ
µµ
µ
PD44164184]
Operation K /K /BW0 /BW1
Write D0-17 L → H –00
–L → H0 0
Write D0-8 L → H –01
–L → H0 1
Write D9-17 L → H –10
–L → H1 0
Write nothing L → H –11
–L → H1 1
Remark H : High level , L : Low level , → : rising edge.
[
µ
µµ
µ
PD44164364]
Operation K /K /BW0 /BW1 /BW2 /BW3
Write D0-35 L → H –0000
–L → H0000
Write D0-8 L → H –0111
–L → H0111
Write D9-17 L → H –1011
–L → H1011
Write D18-26 L → H –1101
–L → H1101
Write D27-35 L → H –1110
–L → H1110
Write nothing L → H –1111
–L → H1111
Remark H : High level , L : Low level , → : rising edge.
10 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Bus Cycle State Diagram
READ DOUBLE
Count = Count + 2 WRITE DOUBLE
COUNT = Count + 2
Power UP
Write
NOP
Supply voltage provided
LOAD NEW
ADDRESS
Count = 0
NOP
ADVANCE ADDRESS
BY TWO ADVANCE ADDRESS
BY TWO
Load, Count = 4
Read
Load, Count = 4
Always Count = 2 Always Count = 2
Load
NOP,
Count = 4
NOP,
Count = 4
Remarks 1. A0 and A 1 are internally advanced i n accord ance with the burst order table.
Bus cycle is terminated after burst count = 4.
2. State transitions: L = (/LD = LOW); /L = (/LD = HIGH); R = (/R,W = HIGH); W = (/R,W = LOW).
3. State machine control timing sequence is controlled by K.
11
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Electrical Specifications
Absolute Maximum Ratings
Parameter Symbol Conditions MIN. TYP. MAX. Unit
Supply volt age VDD –0.5 +2.9 V
Output supply voltage VDDQ –0.5 VDD V
Input volt age VIN –0.5 VDD + 0.5 (2.9 V MAX.) V
Input / Output voltage VI/O –0.5 VDDQ + 0.5 (2.9 V MAX.) V
Junction temperature Tj+125 °C
Storage temperature Tstg –55 +125 °C
Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended DC Operating Conditions (T j = 20 to 110 °
°°
°C)
Parameter Symbol Conditions MIN. TYP. MAX. Unit Note
Supply volt age VDD 1.7 1.9 V
Output supply voltage VDDQ1.4V
DD V
High level input voltage VIH VREF + 0.1 VDDQ + 0.3 V 1
Low level input voltage VIL –0.3 VREF – 0.1 V 1
Clock input voltage VIN –0.3 VDDQ + 0.3 V 1
Reference voltage VREF 0.68 0.95 V
Note1. Overshoot: VIH (A C) ≤ VDD + 0.7 V for t ≤ tKHKH/2
Undershoot: VIL (AC) ≥ – 0.5V for t ≤ tKHKH/2
Power-up: VIH ≤ VDDQ + 0.3V and VDD ≤ 1.7V and VDDQ ≤ 1.4V for t ≤ 200 ms
During normal operation, VDDQ must not exceed VDD.
Control input signals may not have pulse widths less than tKHKL(MIN) or operate at cycle rates
less than tKHKH (MIN).
Capacitance (TA = 25 °
°°
°C, f = 1MHz)
Parameter Symbol Test conditions MIN. TYP. MAX. Unit
Input capacitance CIN VIN = 0 V 4 5 p F
Input / Output capacitance CI/O VI/O = 0 V 6 7 p F
Clock Input capac itance Cclk Vclk = 0 V 5 6 pF
Remark These parameters are periodically sampled and not 100% tested.
12 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
DC Characteristics (Tj = 20 to 110°C, VDD = 1.8 ± 0.1 V)
Parameter Symbol Test condition MIN. TYP. MAX. Unit Note
x8, x18 x36
Input leakage current ILI –2 – +2
µ
A
I/O leakage current ILO –2 – +2
µ
A
Operating supply current IDD VIN ≤ VIL or VIN ≥ VIH, –E30 390 520 mA
(Read Write cycle) II/O = 0 mA –E33 355 475
Cycle = MAX. –E40 300 400
–E50 250 300
–E60 215 285
Standby supply current ISB1 VIN ≤ VIL or VIN ≥ VIH, –E30 255 265 mA
(NOP) II/O = 0 mA –E33 235 245
Cycle = MAX. –E40 200 210
–E50 170 180
–E60 150 160
High level output voltage VOH(Low) |IOH| ≤ 0.1 mA VDDQ – 0.2 – VDDQV3,4
VOH Note1 VDDQ/2–0.08 – VDDQ/2+0.08 V 3,4
Low level output voltage VOL(Low) IOL ≤ 0.1 mA VSS – 0.2 V 3,4
VOL Note2 VDDQ/2–0.08 – VDDQ/2+0.08 V 3,4
Notes 1. Outputs are impedance-controlled. | IOH | = (VDDQ/2)/(RQ/5) for values of 175 Ω ≤ RQ ≤ 350 Ω.
2. Outputs are impedance-controlled. I OL = (VDDQ/2)/(RQ/5) for values of 175 Ω ≤ RQ ≤ 350 Ω.
3. AC load current is higher than the shown DC values. AC I/O curves are available upon request.
4. HSTL outputs meet JEDEC HSTL Class I and Class II standards.
13
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
AC Characteristics (Tj = 20 °
°°
°C to 110 °
°°
°C, VDD = 1.8 ± 0.1 V)
AC Test Conditions
Input waveform (Rise / Fall time ≤
≤≤
≤ 0.3 ns)
0.75 V 0.75 V
Test Points
1.25 V
0.25 V
Output waveform
V
DD
Q / 2 V
DD
Q / 2
Test Points
Output load condition
Figure 1. External load at test
V
DD
Q / 2
0.75 V 50 Ω
Z
O
= 50 Ω
250 Ω
SRAM
V
REF
ZQ
Remark CL includes capacitances of the probe and jig, and stray capacitances.
14 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Read an d Write Cycle
Parameter Symbol -E30 -E33 -E40 -E50 -E60 Unit Note
(333 MHz) (300 MHz) (250 MHz) (200 MHz) (167 MHz)
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
Clock
Average Clock cycle time (K, /K, C, /C) TKHKH 3.0 3.6 3.3 4.0 4.0 5.0 5.0 6.0 6.0 7.5 ns
Clock phase jitter (K, /K, C, /C) TKC var –0.08–0.08–0.10–0.13–0.15
ns
Clock HIGH time (K, /K, C, /C) TKHKL 1.20 – 1.32 – 1.6 – 2.0 – 2.4 – ns
Clock LOW time (K, /K, C, /C) TKLKH 1.20 – 1.32 – 1.6 – 2.0 – 2.4 – ns
Clock to /clock (K to /K., C→/C.) TKH /KH 1.35 1.65 1.49 1.82 1.8 2.2 2.2 2.75 2.7 3.3 ns
Clock to data clock (K→C., /K→/C.) TKHCH 0 1.30 0 1.45 0 1.8 0 2.3 0 2.8 ns
DLL lock time (K,C) TKC lock 1,024 – 1,024 – 1,024 – 1,024 – 1,024 – Cycle 2
K static to DLL reset TKC reset 30–30–30–30–30–ns
Output Times
C, /C HIGH to output valid TCHQV –0.27–0.29–0.35–0.38–0.40
ns
C, /C HIGH to output hold TCHQX – 0.27 – – 0.29 – – 0.35 – – 0.38 – – 0.40 – ns
C, /C HIGH to echo clock valid TCHCQV –0.25–0.27–0.33–0.36–0.38
ns
C, /C HIGH to echo clock hold TCHCQX – 0.25 – – 0.27 – – 0.33 – – 0.36 – – 0.38 – ns
CQ, /CQ HIGH to output valid TCQHQV –0.27–0.29–0.35–0.38–0.40
ns
CQ, /CQ HIGH to output hold TCQHQX – 0.27 – – 0.29 – – 0.35 – – 0.38 – – 0.40 – ns
C HIGH to output High-Z TCHQZ –0.27–0.29–0.35–0.38–0.40
ns
C HIGH to output Low-Z TCHQX1 – 0.27 – – 0.29 – – 0.35 – – 0.38 – – 0.40 – ns
Setup Times
Address valid to K rising edge TAVKH 0.4 – 0.4 – 0.4 – 0.6 – 0.7 – ns 1
Control inputs valid to K rising edge TIVKH 0.4 – 0.4 – 0.4 – 0.6 – 0.7 – ns 1
Data-in valid to K, /K rising edge TDVKH 0.4 – 0.4 – 0.4 – 0.6 – 0.7 – ns 1
Hold Times
K rising edge to address hold TKHAX 0.4 – 0.4 – 0.4 – 0.6 – 0.7 – ns 1
K rising edge to control inputs hold TKHIX 0.4 – 0.4 – 0.4 – 0.6 – 0.7 – ns 1
K, /K rising edge to data-in hold TKHDX 0.4 – 0.4 – 0.4 – 0.6 – 0.7 – ns 1
Notes 1. This is a synchronous devic e. All addresses, data and control lines must meet the spec ified setup
and hold times for all latching clock edges.
2. VDD slew rate must be less than 0.1 V DC per 50 ns for DLL lock retention.
DLL lock time begins once VDD and input clock are stable.
Remarks 1. This parameter is sampled.
2. Test conditions as specified with the output loading as shown in AC Test Conditions
unless otherwise noted.
3. Control input signals may not be operated with pulse widths less than TKHKL (MIN).
4. If C, /C are tied HIGH, K, /K become the references for C, /C timing parameters.
15
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Read and Write Timing
TKHKH
TAVKH TKHAX
Q01 Q03
K
/LD
Address
DQ
Q02
/K
2 4 6 8 10 12 131357911
R, /W
Qx2
Q04 Q12Q11 Q14Q13 D21 D23D22 D24 D32D31 D34D33 Q41
TKH/KH
TIVKH
CQ
/CQ
C
/C
TKHCH TKHCH TCHQX1
TCHQV TCHQV
TCHQX TCHQX
TCQHQX
TCQHQV TCHQZ
TKHKLTKLKH TKHKH TKH/KH
TDVKH
TKHDX
TDVKH
TKHDX
NOP READ
(burst of 4) READ
(burst of 4) NOP NOP WRITE
(burst of 4) WRITE
(burst of 4) READ
(burst of 4)
TKHKL TKLKH
TKHIX
TKLKH
TCHCQV
TCHCQV
TCHCQX
TCHCQX
A0 A1 A2 A4A3
Remarks 1. Q01 refers to output from address A0.
Q02 refers to output from the next internal burst address following A0,etc.
2. Outputs are disable (High-Z) one clock cycle after a NOP.
3. The second NOP cycle is not necessary for correct device operation;
however, at high clock frequencies it may be required to prevent bus contention.
16 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
JTAG Specification
These products support a limited set of JTAG functions as in IEEE standard 1149.1.
Test Access Port (TAP) Pins
Pin name Pin assignments Description
TCK 2R Test Clock Input. All input are captured on the rising edge of TCK and all outputs
propagate from the falling edge of TCK.
TMS 10R Test Mode Select. This is the command input for the TAP controller state machine.
TDI 11R Test Data Input. This is the input side of the serial registers placed between TDI and
TDO. The register placed between TDI and TDO is deter-mined by the state of the TAP
controller state machine and the instruction that is currently loaded in the TAP instruction.
TDO 1R Test Data Output. Output changes in response to the falling edge of TCK. This is the
output side of the serial registers placed between TDI and TDO.
Remark The device does not have TRST (TAP reset). T he T est-Logic Reset state is entered while TMS is held high
for five rising edges of TCK. The TAP controller state is also reset on the SRAM POWER-UP.
JTAG DC Characteristics (20 °
°°
°C ≤
≤≤
≤ Tj ≤
≤≤
≤ 110 °
°°
°C, 1.7 V ≤
≤≤
≤ VDD ≤
≤≤
≤ 1.9 V, unless otherwise not ed )
Parameter Symbol Conditions MIN. TYP. MAX. Unit Note
JTAG Input leakage current ILI 0 V ≤ VIN ≤ VDD –5.0 – +5.0
µ
A
JTAG I/O leakage current ILO 0 V ≤ VIN ≤ VDDQ , –5.0 – +5.0
µ
A
Outputs disabled
JTAG input high voltage VIH 1.3 – VDD+0.3 V
JTAG input low voltage VIL –0.3 – +0.5 V
JTAG output high voltage VOH1 | IOHC | = 100
µ
A1.6––V
VOH2 | IOHT | = 2 mA 1.4 – – V
JTAG output low voltage VOL1 IOLC = 100
µ
A––0.2V
VOL2 IOLT = 2 mA – – 0.4 V
17
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
JTAG AC Test Conditions
Input waveform (Rise / Fall time ≤
≤≤
≤ 1 ns)
0.9 V 0.9 V
Test Points
1.8 V
0 V
Output waveform
0.9 V 0.9 V
Test Points
Output load
Figure 2. External load at test
TDO Z
O
= 50 Ω
V
TT
= 0.9 V
20 pF
50 Ω
18 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
JTAG AC Characteristics (Tj = 5 to 110 °
°°
°C)
Parameter Symbol Conditions MIN. TYP. MAX. Unit Note
Clock
Clock cycle time tTHTH 100 – – ns
Clock frequency fTF ––10MHz
Clock high time tTHTL 40 – – ns
Clock low time tTLTH 40 – – ns
Output time
TCK low to TDO unknown tTLOX 0––ns
TCK low to TDO valid tTLOV – – 20 ns
TDI valid to TCK high tDVTH 10 – – ns
TCK high to TDI invalid tTHDX 10 – – ns
Setup time
TMS setup time tMVTH 10 – – ns
Capture setup time tCS 10 – – ns
Hold time
TDI hold time tTHMX 10 – – ns
Capture hold time tCH 10 – – ns
JTAG Timing Diagram
19
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Scan Register Definition (1)
Register name Description
Instruction register The instruction register holds the instructions that are executed by the TAP controller when it is
moved into the run-test/idle or the various data register state. The register can be loaded when it is
placed between the TDI and TDO pins. The instruction register is automatically preloaded with the
IDCODE instruction at power-up whenever the controller is placed in test-logic-reset state.
Bypass register The bypass register is a single bit register that can be placed between TDI and TDO. It allows serial
test data to be passed through the RAMs TAP to another device in the scan chain with as little delay
as possible.
ID register The ID Register is a 32 bit register that is loaded with a device and vendor specific 32 bit code when
the controller is put in capture-DR state with the IDCODE command loaded in the instruction register.
The register is then placed between the TDI and TDO pins when the controller is moved into shift-DR
state.
Boundary register The boundary register, under the control of the TAP controller, is loaded with the contents of the
RAMs I/O ring when the controller is in capture-DR state and then is placed between the TDI and
TDO pins when the controller is moved to shift-DR state. Several TAP instructions can be used to
activate the boundary register.
The Scan Exit Order tables describe which device bump connects to each boundary register
location. The first column defines the bit’s position in the boundary register. The shift register bit
nearest TDO (i.e., first to be shifted out) is defined as bit 1. The second column is the name of the
input or I/O at the bump and the third column is the bump number.
Scan Register Definition (2)
Register name Unit
Instruction register 3 bit
Bypass register 1 bit
ID register 32 bit
Boundary register 107 bit
ID Register Definition
Part number Organization ID [31:28] vendor revision no. ID [27:12] part no. ID [11:1] vendor ID no. ID [0] fix bit
µ
PD44164084 2M x 8 XXXX 0000 0000 0001 0101 00000010000 1
µ
PD44164184 1M x 18 XXXX 0000 0000 0001 0110 00000010000 1
µ
PD44164364 512K x 36 XXXX 0000 0000 0001 0111 00000010000 1
20 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
SCAN Exit Order
Bit Signal name Bump Bit Signal name Bump Bit Signal name Bump
no. x8 x18 x36 ID no. x8 x18 x36 ID no. x8 x18 x36 ID
1 /C 6R 37 NC NC NC 10D 73 NC NC NC 2C
2 C 6P 38 NC NC NC 9E 74 DQ4 DQ11 DQ20 3E
3 Ax 6N 39 NC DQ7 DQ17 10C 75 NC NC DQ29 2D
4 Ax 7P 40 NC NC DQ16 11D 76 NC NC NC 2E
5 Ax 7N 41NCNCNC9C 77NCNCNC1E
6 Ax 7R 42 NC NC NC 9D 78 NC DQ12 DQ30 2F
7 Ax 8R 43 DQ3 DQ8 DQ8 11B 79 NC NC DQ21 3F
8 Ax 8P 44 NC NC DQ7 11C 80 NC NC NC 1G
9 Ax 9R 45NCNCNC9B 81NCNCNC1F
10 NC DQ0 DQ0 11P 46 NC NC NC 10B 82 DQ5 DQ13 DQ22 3G
11 NC NC DQ9 10P 47 CQ 11A 83 NC NC DQ31 2G
12 NC NC NC 10N 48 NC 10A 84 NC NC NC 1J
13 NC NC NC 9P 49 Ax 9A 85 NC NC NC 2J
14 NC DQ1 DQ11 10M 50 Ax 8B 86 NC DQ14 DQ23 3K
15 NC NC DQ10 11N 51 Ax A1 A1 7C 87 NC NC DQ32 3J
16 NC NC NC 9M 52 NC A0 A0 6C 88 NC NC NC 2K
17 NC NC NC 9N 53 /LD 8A 89 NC NC NC 1K
18 DQ0 DQ2 DQ2 11L 54 NC NC /BW1 7A 90 DQ6 DQ15 DQ33 2L
19 NC NC DQ1 11M 55 /NW0 /BW0 /BW0 7B 91 NC NC DQ24 3L
20 NC NC NC 9L 56 K 6B 92 NC NC NC 1M
21 NC NC NC 10L 57 /K 6A 93 NC NC NC 1L
22 NC DQ3 DQ3 11K 58 NC NC /BW3 5B 94 NC DQ16 DQ25 3N
23 NC NC DQ12 10K 59 /NW1 /BW1 /BW2 5A 95 NC NC DQ34 3M
24 NC NC NC 9J 60 R, /W 4A 96 NC NC NC 1N
25 NC NC NC 9K 61 Ax 5C 97 NC NC NC 2M
26 DQ1 DQ4 DQ13 10J 62 Ax 4B 98 DQ7 DQ17 DQ26 3P
27 NC NC DQ4 11J 63 Ax Ax NC 3A 99 NC NC DQ35 2N
28 ZQ 11H 64 NC 2A 100 NC NC NC 2P
29 NC NC NC 10G 65 /CQ 1A 101 NC NC NC 1P
30 NC NC NC 9G 66 NC DQ9 DQ27 2B 102 Ax 3R
31 NC DQ5 DQ5 11F 67 NC NC DQ18 3B 103 Ax 4R
32 NC NC DQ14 11G 68 NC NC NC 1C 104 Ax 4P
33 NC NC NC 9F 69 NC NC NC 1B 105 Ax 5P
34 NC NC NC 10F 70 NC DQ10 DQ19 3D 106 Ax 5N
35 DQ2 DQ6 DQ6 11E 71 NC NC DQ28 3C 107 Ax 5R
36 NC NC DQ15 10E 72 NC NC NC 1D
21
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
JTAG Instructions
Instructions Description
EXTEST EXTEST is an IEEE 1149.1 mandatory public instruction. It is to be executed whenever the instruction
register, whatever length it may be in the device, is loaded with all logic 0s. EXTEST is not implemented
in this device. Therefore this device is not 1149.1 compliant. Nevertheless, this RAMs TAP does
respond to an all zeros instruction, as follows. With the EXTEST (000) instruction loaded in the
instruction register the RAM responds just as it does in response to the SAMPLE instruction, except the
RAM output are forced to Hi-Z any time the instruction is loaded.
IDCODE The IDCODE instruction causes the ID ROM to be loaded into the ID register when the controller is in
capture-DR mode and places the ID register between the TDI and TDO pins in shift-DR mode. The
IDCODE instruction is the default instruction loaded in at power up and any time the controller is placed
in the test-logic-reset state.
BYPASS The BYPASS instruction is loaded in the instruction register when the bypass register is placed between
TDI and TDO. This occurs when the TAP controller is moved to the shift-DR state. This allows the
board level scan path to be shortened to facilitate testing of other devices in the scan path.
SAMPLE SAMPLE is a Standard 1149.1 mandatory public instruction. When the SAMPLE instruction is loaded in
the instruction register, moving the TAP controller into the capture-DR state loads the data in the RAMs
input and I/O buffers into the boundary scan register. Because the RAM clock(s) are independent from
the TAP clock (TCK) it is possible for the TAP to attempt to capture the I/O ring contents while the input
buffers are in transition (i.e., in a metastable state). Although allowing the TAP to SAMPLE metastable
input will not harm the device, repeatable results cannot be expected. RAM input signals must be
stabilized for long enough to meet the TAPs input data capture setup plus hold time (tCS plus tCH). The
RAMs clock inputs need not be paused for any other TAP operation except capturing the I/O ring
contents into the boundary scan register. Moving the controller to shift-DR state then places the
boundary scan register between the TDI and TDO pins. This functionality is not Standard 1149.1
compliant.
SAMPLE-Z If the SAMPLE-Z instruction is loaded in the instruction register, all RAM outputs are forced to an inactive
drive state (Hi-Z) and the boundary register is connected between TDI and TDO when the TAP controller
is moved to the shift-DR state.
JTAG Instruction Coding
IR2 IR1 IR0 Instruction Note
0 0 0 EXTEST 1
0 0 1 IDCODE
0 1 0 SAMPLE-Z 1
0 1 1 RESERVED
1 0 0 SAMPLE
1 0 1 RESERVED
1 1 0 RESERVED
1 1 1 BYPASS
Note 1. TRISTATE all data drivers and CAPTURE the pad values into a SERIAL SCAN LATCH.
22 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
TAP Controller State Diagram
Disabling the Test Access Port
It is possible to use this device without utilizing the TAP. To disable the TAP Controller without interfering with normal
operation of the device, TCK must be tied to VSS to preclude mid level inputs.
TDI and TMS are designe d so an undriven input will produce a response id entical to the application of a logic 1, and
may be left unconnected. But they may also be tied to VDD through a 1k resistor.
TDO should be left unconnected.
23
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Test Logic Operation (Instruction Scan)
TCK
Controller
state
TDI
TMS
TDO
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Exit2-IR
Shift-IR
Exit1-IR
Update-IR
Run-Test/Idle
IDCODE
Instruction
Register state New Instruction
Output Inactive
Output from Instruction Register Output from Instruction Register
24 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Test Logic Operation (Data Scan)
TCK
Controller
state
TDI
TMS
TDO
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Shift-DR
Exit1-DR
Update-DR
Test-Logic-Reset
Instruction
Instruction
Register state IDCODE
Output Inactive
Output from Instruction Register Output from Instruction Register
Run-Test/Idle
Select-DR-Scan
Select-IR-Scan
25
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Package Drawing
TBD
26 Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
Recommended Soldering Condition
Please consult with our sales offices for soldering conditions of these products.
Type of Surface Mount Devices
µ
PD44164084Fx : 165-pin PLASTIC FB GA (13 x 15)
µ
PD44164184Fx : 165-pin PLASTIC FB GA (13 x 15)
µ
PD44164364Fx : 165-pin PLASTIC FB GA (13 x 15)
27
Preliminary Data Sheet M15822EJ1V0DS
µ
µµ
µ
PD44164084, 44164184, 44164364
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2 HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to V
DD
or GND with a resistor, if it is considered to have a possibility of
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3 STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
µ
µµ
µ
PD44164084, 44164184, 44164364
M8E 00. 4
The information in this document is current as of October, 2001. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
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and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
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systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
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to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
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