www.irf.com2
IRF7805
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Pulse width ≤ 300 µs; duty cycle ≤ 2%.
When mounted on 1 inch square copper board, t < 10 sec.
Typ = measured - Qoss
Rθ is measured at TJ of approximately 90°C.
Devices are 100% tested to these parameters.
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. T
p. Max. Units
BVDSS
ra
n-to-
ource
rea
own
o
ta
e
30 ––– ––– V
RDS(on)
tat
c
ra
n-to-
ource
n-
es
stance
––– 9.2 11 mΩ
VGS(th)
ate
res
o
o
ta
e
1.0 ––– 3.0 V
IDSS Drain-to-Source Leakage Current ––– ––– 70
––– ––– 10
––– ––– 150
IGSS Gate-to-Source Forward Leakage ––– ––– 100
Gate-to-Source Reverse Leakage ––– ––– -100
Qg
ota
ate
ar
e
––– 22 31
Qgs1 Pre-Vth Gate-to-Source Charge ––– 3.7 –––
Qgs2 Post-Vth Gate-to-Source Charge ––– 1.4 –––
Qgd Gate-to-Drain Charge ––– 6.8 –––
Qsw Switch Char
e (Qgs2 + Qgd)
h
––– 8.2 11.5
Qoss
utput
ar
e
––– 3.0 3.6 nC
RGGate Resistance 0.5 ––– 1.7 Ω
td(on) Turn-On Delay Time ––– 16 –––
trRise Time ––– 20 –––
td(off) Turn-Off Delay Time ––– 38 –––
tfFall Time ––– 16 –––
Diode Characteristics
Parameter Min. T
p. Max. Units
ISContinuous Source Current 2.5
(Body Diode)
c
ISM Pulsed Source Current
(Body Diode)
VSD
o
e
orwar
o
ta
e
––– ––– 1.2 V
Qrr
everse
ecover
ar
e
88
Qrr(s) Reverse Recovery Charge 55
w
t
ara
e
c
ott
–––
106
ns
nC
nA
––– –––
––– –––
–––
––– –––
µA
nC
ns
A
VDS = 16V, VGS = 0V, IS = 7.0A
VDS = 16V, VGS = 0V, IS = 7.0A
ID = 7.0A
VDS = VGS, ID = 250µA
RG= 2Ω
VDS = 24V, VGS = 0V, TJ = 100°C
VDS = 24V, VGS = 0V
di/dt = 700A/µs
di/dt = 700A/µs (with 10BQ040)
TJ = 25°C, IS = 7.0A, VGS = 0V
showing the
integral reverse
p-n junction diode.
MOSFET symbol
VDS = 16V, VGS = 0V
VDD = 16V, VGS = 4.5V
e
ID = 7.0A
Conditions
Resistive Load
Conditions
VGS = 0V, ID = 250µA
VGS = 4.5V, ID = 7.0A
d
VDS = 16V
VGS = 12V
VGS = -12V
VGS = 5.0V
VDS = 30V, VGS = 0V