1. General description
The PX1011B is a high-performance, low-power, single-lane PCI Express electrical
PHYsical layer (PHY) that handles the low level PCI Express protocol and signaling. The
PX1011B PCI Express PHY is compliant to the PCI Express Base Specification,
Rev. 1.0a, and Rev. 1.1. The PX1011B includes features such as Clock and Data
Recovery (CDR), data serialization and de-serialization, 8b/10b encoding, analog buffers,
elastic buffer and receiver detection, and provides superior performance to the Media
Access Control (MAC) layer devices.
The PX1011B is a 2.5 Gbit/s PCI Express PHY with 8-bit data PXPIPE interface. Its
PXPIPE interface is a superset of the PHY Interface for the PCI Express (PIPE)
specification, enhanced and adapted for off-chip applications with the introduction of a
source synchronous clock for tr ansmit a nd receive dat a. The 8-bit da t a inte rface opera tes
at 250 MHz with SSTL_2 signaling. The SSTL_2 signaling is compatible with the I/O
interfaces available in FPGA products.
The PX1011B PCI Express PHY supports advanced power management functions.
The PX1011BI is for the industrial temperature range (40 C to +85 C).
Automotive AEC-Q100 compliant version PX1011B-EL1/Q900 is available.
2. Features and benefits
2.1 PCI Express interface
Compliant to PCI Express Base Specification 1.1
Single PCI Express 2.5 Gbit/s lane
Data and clock recovery from serial stream
Serializer and De-serializer (SerDes)
Receiver detection
8b/10b coding and decoding, elastic buffer and word alignment
Supports loopback
Supports direct disparity control for use in transmitting compliance pattern
Supports lane polarity inversion
Low jitter and Bit Error Rate (BER)
2.2 PHY/MAC interface
Based on Intel PHY Interface for PCI Express architecture v1.0 (PIPE)
Adapted for off-chip with additional synchronous clock signals (PXPIPE)
8-bit parallel data interface for transmit and receive at 250 MHz
2.5 V SSTL_2 class I signaling
PX1011B
PCI Express stand-alone X1 PHY
Rev. 6 — 27 June 2011 Product data sheet
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Product data sheet Rev. 6 — 27 June 2011 2 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
2.3 JTAG interface
JTAG (IEEE 1149.1) boundary scan interface
Built-In Self Test (BIST) controller tests SerDes and I/O blocks at speed
3.3 V CMOS signaling
2.4 Power management
Dissipates < 300 mW in L0 normal mode
Support power management of L0, L0s and L1
2.5 Clock
100 MHz external refe re nc e cl oc k w ith 300 ppm tolerance
Supports spread spectrum clock to reduce EMI
On-chip reference clock termination
2.6 Miscellaneous
LFBGA81 leaded or lead-free packages
Operating am b ien t tem p er ature
Commercial: 0 C to +70 C
Industrial: 40 C to +85 C
ESD protection voltage for Human Body Model (HBM): 2000 V
3. Quick reference data
Table 1. Quick reference data
Symbol Parameter Conditions Min Typ Max Unit
VDDD1 digital supply voltage 1 for JTAG I/O 3.0 3.3 3.6 V
VDDD2 digital supply voltage 2 for SSTL_2 I/O 2.3 2.5 2.7 V
VDDD3 digital supply voltage 3 for core 1.15 1.2 1.3 V
VDD supply voltage for high-speed
serial I/O and PVT 1.15 1.2 1.3 V
VDDA1 analog supply voltage 1 for serializer 1.15 1.2 1.3 V
VDDA2 analog supply voltage 2 for serializer 3.0 3.3 3.6 V
fclk(ref) reference clock frequency 99.97 100 100.03 MHz
Tamb ambient temp era t ure operating
commercial 0 - +70 C
industrial 40 - +85 C
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Product data sheet Rev. 6 — 27 June 2011 3 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
4. Ordering information
[1] PX1011B-EL1/Q900 is AEC-Q100 compliant. Contact i2c.support@nxp.com for PPAP.
5. Marking
[1] Industrial temperature range.
Table 2. Ordering information
Type number Solder process Package
Name Description Version
PX1011B-EL1/G Pb-free (SnAgCu
solder ball compound) LFBGA81 plastic low profile fine-pitch ball grid array
package; 81 balls; body 9 9 1.05 mm SOT643-1
PX1011B-EL1/N SnPb solder ball
compound LFBGA81 plastic low profile fine-pitch ball gri d arra y
package; 81 balls; body 9 9 1.05 mm SOT643-1
PX1011BI-EL1/G Pb-free (SnAgCu
solder ball compound) LFBGA81 plastic low profile fine-pitch ball grid array
package; 81 balls; body 9 9 1.05 mm SOT643-1
PX1011B-EL1/Q900[1] Pb-free (SnAgCu
solder ball compound) LFBGA81 plastic low profile fine-pitch ball grid array
package; 81 balls; body 9 9 1.05 mm SOT643-1
Table 3. Leaded package marking
Line Marking Description
A PX1011B-EL1/N full basic type number
B xxxxxxx diffusion lot number
C 2PNyyww manufacturing code:
2 = diffusion site
P = assembly site
N = leaded
yy = year code
ww = week code
Table 4. Lead-free package marking
Line Marking Description
A PX1011B-EL1/G
PX1011BI-EL1/G[1]
PX1011B-EL1/Q[1]
full basic type number
B xxxxxxx diffusion lot number
C 2PGyyww manufacturing code:
2 = diffusion site
P = assembly site
G = lead-free
yy = year code
ww = week code
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Product data sheet Rev. 6 — 27 June 2011 4 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
6. Block diagram
Fig 1. Block diagram
8
10
002aac211
Ln_TxData0
TX I/O REFCLK I/O
REFCLK_P
REGISTER
PCI Express PHY
PCI Express MAC
Ln_TxData1
RESET_N
RXDATA[7:0]
TXDATA[7:0]
TXCLK RXCLK
8b/10b
ENCODE
10b/8b
DECODE
REFCLK_NTX_P TX_N
RX I/O
RX_P
bit stream at 2.5 Gbit/s
RX_N
ELASTIC
BUFFER
K28.5
DETECTION
CLOCK RECOVERY
CIRCUIT PLL
CLK
GENERATOR
250 MHz
clock
PARALLEL
TO
SERIAL SERIAL
TO
PARALLEL
DATA
RECOVERY
CIRCUIT
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Product data sheet Rev. 6 — 27 June 2011 5 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
7. Pinning information
7.1 Pinning
Fig 2. Pin configuration for LFBGA81
002aad017
Transparent top view
J
H
G
F
E
D
B
C
A
246 981357
ball A1
index area
PX1011B-EL1/G
PX1011B-EL1/N
PX1011BI-EL1/G
PX1011B-EL1/Q900
Transparent top view.
Fig 3. Ball mapping
1
A
002aad018
VSS RXIDLE RXDATA6 RXDATA4 RXDATA3 RXDATA1 RXDATAK RXCLK RXSTATUS0
23456789
BREFCLK_P VSS RXDATA7 RXDATA5 VSS RXDATA2 RXDATA0 VSS RXSTATUS1
CREFCLK_N VSS VDDD2 VSS VDDD2 VSS VDDD2 RXVALID RXSTATUS2
DVSS VSS VDD VDDA2 VDDA1 PVT VSS PHYSTATUS TXDATA0
ERX_P VSS VDDD1 TMS VDDD1 VDDD3 VDDD2 VSS TXDATA1
FRX_N VSS TCK TRST_N VDDD3 VDDD3 VSS TXDATA3 TXDATA2
GVSS VSS TDI VSS VDDD2 VSS VDDD2 TXDATA5 TXDATA4
HTX_P VSS TDO TXIDLE VSS PWRDWN0 RXDET_
LOOPB VSS TXDATA6
JTX_N VREFS RESET_N RXPOL TXCOMP PWRDWN1 TXDATAK TXCLK TXDATA7
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Product data sheet Rev. 6 — 27 June 2011 6 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
7.2 Pin description
The PHY input and output pins are described in Table 5 to Table 12. Note that input and
output is defined from the perspective of the PHY. Thus a signal on a pin described as an
output is driven by the PHY a nd a sign al on a pin described as an input is received by the
PHY. A basic description of each pin is provided.
Table 5. PCI Express serial data lines
Symbol Pin Type Signaling Description
RX_P E1 input PCIe I/O differential input receive pair with 50
on-chip termination
RX_N F1 input PCIe I/O
TX_P H1 output PCIe I/O differential output transmit pair with
50 on-chip termination
TX_N J1 output PCIe I/O
Table 6. PXPIPE interface transmit dat a signals
Symbol Pin Type Signaling Description
TXDATA[7:0] J9, H9, G8, G9,
F8, F9, E9, D9 input SSTL_2 8-bit transmit data input from the MAC
to the PHY
TXDATAK J7 input SSTL_2 selection input for the symbols of
transmit data; LOW = data byte;
HIGH = control byte
Table 7. PXPIPE interface receive data signals
Symbol Pin Type Signaling Description
RXDATA[7:0] B3 , A3, B4, A4,
A5, B6, A6, B7 output SSTL_2 8-bit receive data output from the PHY
to the MAC
RXDATAK A7 output SSTL_2 selection output for the symbols of
receive data; LOW = data byte;
HIGH = control byte
Table 8. PXPIPE interface command signals
Symbol Pin Type Signaling Description
RXDET_ LOOPB H7 input SSTL_2 used to tell the PHY to begin a receiver
detection operation or to begin loopback;
LOW = reset state
TXIDLE H4 input SSTL_2 forces TX output to electrical idle. TXIDLE
should be asserted while in power states P0s
and P1.
TXCOMP J5 input SSTL_2 used when transmitting the complia nce
pattern; HIGH-level sets the running disparity
to negative
RXPOL J4 input SSTL_2 signals the PHY to perform a polarity inversion
on the receive data; LOW = PHY does no
polarity inversion; HIGH = PHY does polarity
inversion
RESET_N J3 input SSTL_2 PHY reset input; active LOW
PWRDWN0 H6 input SSTL_2 transceiver power-up and power-down inputs
(see Table 13); 0x2 = reset st ate
PWRDWN1 J6 input SSTL_2
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Product data sheet Rev. 6 — 27 June 2011 7 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
Table 9. PXPIPE interface status signals
Symbol Pin Type Signaling Description
RXVALID C8 output SSTL_2 indicates symbol lock and valid data on
RX_DATA and RX_DATAK
PHYSTA TUS D8 output SSTL_2 used to communicate completion of several PHY
functions including power management state
transitions and receiver detection
RXIDLE A2 output SSTL_2 indicates receiver detection of an ele ctrical idle;
this is an asynchronous signal
RXSTATUS0 A9 output S STL_2 encodes receiver status and error codes for the
received data stream and receiver detection (see
Table 15)
RXSTATUS1 B9 output SSTL_2
RXSTATUS2 C9 output SSTL_2
Table 10. Clock and refer ence signals
Symbol Pin Type Signaling Description
TXCLK J8 input SSTL_2 source synchronous 250 MHz transmit clock
input from MAC. All input data and signals to the
PHY are synchronized to this clock.
RXCLK A8 output SSTL_2 source synchronous 250 MHz clock output for
received data and status signals bound for the
MAC.
REFCLK_P B1 input P CIe I/O 100 MHz reference clock input. This is the
spread spectrum source clock for PCI Express.
Differential pair input with 50 on-chip
termination.
REFCLK_N C1 input PCIe I/O
PVT D6 - analog I/O input or output to create a compensation signal
internally that will adjust the I/O pads
characteristics as PVT drifts. Connect to VDD
through a 49.9 resistor.
VREFS J2 input reference voltage input for SSTL_2 class I
signaling. Connect to 1.25 V.
Table 11. 3.3 V JTAG signals
Symbol Pin Type Signaling Description
TMS E4 input 3.3 V CMOS test mode select input
TRST_N F4 input 3.3 V CMOS test reset input for the JTAG interface;
active LOW
TCK F3 input 3.3 V CMOS test clock input for the JTAG interface
TDI G3 input 3.3 V CMOS test data input
TDO H3 output 3.3 V CMOS test data output
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Product data sheet Rev. 6 — 27 June 2011 8 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
8. Functional description
The main function of the PHY is to convert digital data into electrical signals and vice
versa. The PCI Express PHY handles the low level PCI Express protocol and signaling.
The PX1011B PCI Express PHY consists of the Physical Coding Sub-layer (PCS), a
Serializer and De-serializer (SerDes) and a set of I/Os (pads). The PCI Express PHY
handles the low level PCI Express protocol and signaling. This includes features such as
Clock and Data Recover y (CDR), data serializatio n and de-serialization, 8b/10b encodin g,
analog buffers, elastic buffer and receiver detection.
The PXPIPE interface between the MAC and PX1011B is a superset of the PHY Interface
for the PCI Express (PIPE) specification. The following feature have been added:
Source synchronous clocks for RX and TX data to simplify timing closure.
The 8-bit data width PXPIPE interface operates at 250 MHz with SSTL_2 class I
signaling. PX1011B does not integrate SSTL_2 termination resistors inside the IC.
The PCI Express link consists of a differential input pair and a differential output p air. The
data rate of these signals is 2.5 Gbit/s.
8.1 Receiving data
Incoming data enters the chip at the RX interface. The receiver converts these signals
from small amplitude differential signals into rail-to-rail digital signals. The carrier detect
circuit detects whether data is present on the line and passes this information through to
the SerDes and PCS.
If a valid stream of data is present the Clock and Data Recovery unit (CDR) first recovers
the clock from the data and then uses this cl o ck for re -timing the d ata (i.e., recovering the
data).
Table 12. PCI Express PHY power supplies
Symbol Pin Type Signaling Description
VDDA1 D5 power 1.2 V analog power supply for serializ er and
de-serializer
VDDA2 D4 power 3.3 V analog power suppl y for serializer and
de-serializer
VDDD1 E3, E5 power 3.3 V power supply for JTAG I/O
VDDD2 C3, C5, C7, E7,
G5, G7 power 2.5 V pow er su pp l y for SSTL_ 2 I/ O
VDDD3 E6, F5, F6 power 1.2 V power supply for core
VDD D3 power 1.2 V power supply for high-speed serial
PCI Express I/O pads and PVT
VSS A1, B2, B5, B8,
C2, C4, C6, D1,
D2, D7, E2, E8,
F2, F7, G1, G2,
G4, G6, H2, H5,
H8
ground ground
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Product data sheet Rev. 6 — 27 June 2011 9 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
The de-serializer or Serial-to-Parallel converter (S2P) de-serializes this data into 10-bits
parallel data.
Since the S2P has no knowledge about the data, the word alignment is still random. This
is fixed in the digital domain by the PCS block. It first detects a 10-bit comma character
(K28.5) from the random data stream and aligns the bits. Then it converts the 10-bit raw
data into 8-bit words using 8b/10b decoding. An elastic buffer and FIFO brings the
resulting data to the right clock domain, which is the RX source synchronous clock
domain.
8.2 Transmitting data
When the PHY transmits, it receives 8-bit data from the MAC. This data is encoded using
an 8b/10b encoding algorithm. The 2 bits overhead of the 8b/10b encoding ensures the
serial data will be DC-balanced and has a sufficient 0-to-1 and 1-to-0 transition density for
clock recovery at the receiver si de .
The serializer or Parallel-to-Serial converter (P2S) serializes the 10 bits data into serial
data streams. These data streams are latched into the transmitter, where they are
converted into small amplitude differential signals. The transmitter has built-in
de-emphasis for a larger eye opening at the receiver side.
The PLL has a sufficiently high bandwidth to handle a 100 MHz reference clock with a
30 kHz to 33 kHz spread spectrum .
8.3 Clocking
There are three clock signals used by the PX1011B:
REFCLK is a 100 MHz external reference clock that the PHY uses to generate the
250 MHz data clock and the internal bi t rate clock. This clock may have
30 kHz to 33 kHz spread spectrum modulation.
TXCLK is a reference clock that the PHY uses to clock the TXDATA and command.
This source synchronous clock is provided by the MAC. The PHY expects that the
rising edge of TXCLK is center ed to the data . The TXCLK has to be synchronous with
RXCLK.
RXCLK is a source synchronous clock provided by the PHY. The RXDATA and status
signals are synchronous to this clo ck. The PHY aligns the rising edge of RXCLK to the
center of the data. RXCLK may be used by the MAC to clock its internal logic.
8.4 Reset
The PHY must be held in reset until power and REFCLK are stable. It takes the PHY
64 s maximum to stabilize its internal clocks. RXCLK frequency is the same as REFCLK
frequency, 100 MHz, during this time. The PHY de-asserts PHYSTATUS when internal
clocks are stable.
The PIPE specification recommends that while RESET_N is asserted, the MAC should
have RXDET_LOOPB de-asserted, TXIDLE asserted, TXCOMP de-asserted, RXPOL
de-asserted and power state P1. The MAC can also assert a reset if it receives a physical
layer reset packet.
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Product data sheet Rev. 6 — 27 June 2011 10 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
8.5 Power management
The power managemen t signals a llow th e PHY to manag e p ower co nsump tion. Th e PHY
meets all timing constraints provided in the PCI Express base specification regarding
clock recovery and link training for the various power states.
Four power states are defined: P0, P0s, P1 and P2. P0 state is the normal operational
state for the PHY. When directed from P0 to a lower power state, the PHY can
immediately take whatever power saving measures are appropriate.
In states P0, P0s and P1, the PHY keeps internal clocks operational. For all state
transitions between these three states, the PHY indicates successful transition into the
designated power state by a single cycle assertion of PHYSTATUS. For all power state
transitions, the MAC must not begin any operational sequences or further power state
transitions until the PHY has indicated that the initial state transition is completed. T XIDLE
should be asserted while in power states P0s and P1.
P0 state: All internal clo cks in the PHY are op erational. P0 is the only st ate where the
PHY transmits and receives PCI Express signaling. P0 is the appropriate PHY power
management state for most states in the Link Training and Status State Machine
(LTSSM). Exceptions are listed for each lower power PHY state (P0s, P1 and P2).
P0s state: The MAC will move the PHY to this state only when the transmit channel is
idle.
While the PHY is in either P0 or P0s power states, if the re ceiver is detecti ng an electr ical
idle, the receiver portion of the PHY can take appropriate power saving measures. Note
that the PHY is capable of obtaining bit and symbol lock within the PHY-specified time
(N_FTS with or without common clock) upon resumption of signaling on the receive
channel. This requirem ent only a pp lies if the re ce ive r had p revio usly been bit an d symbo l
locked while in P0 or P0s states.
P1 state: Selected internal clocks in the PHY are turned off. The MAC will move the
PHY to this state only when both transmit and receive channels are idle. The PHY
indicates a successful entry into P1 (by asserting PHYSTATUS). P1 should be used
for the disabled state, all detect states, and L1.idle state of the Link Training and
Status State Machine (LTSSM).
P2 state: PHY will enter P1 instead.
Fig 4. Reset
002aac172
RXCLK
RESET_N
PHYSTATUS
100 MHz 250 MHz
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Product data sheet Rev. 6 — 27 June 2011 11 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
[1] TXIDLE = 0
[2] TXIDLE = 1
8.6 Receiver detect
When the PHY is in the P1 state, it can be instructed to perform a receiver detection
operation to determine if th ere is a re ce iver at the other end of the link. Basic operation of
receiver detection is that the MAC requests the PHY to do a receiver detect sequence by
asserting RXDET_LOOPB. When the PHY has completed the receiver detect sequence,
it drives the RXSTATUS signals to the value of 011b if a receiver is present, an d to 000b if
there is no receiver. Then the PHY will assert PHYSTATUS to indicate the completion of
receiver detect operation. The MAC uses the rising edge of PHYSTATUS to sample the
RXSTATUS signals and then de-asserts RXDET_LOOPB. A few cycles after the
RXDET_LOOPB de-asserts, the PHYSTATUS is also de-asserted.
8.7 Loopback
The PHY supports an internal loopback from the PCI Express receiver to the transmitter
with the following characteristics.
The PHY retransmits each 10-bit data and control symbol exactly as received, without
applying scrambling or descrambling or disparity corrections, with the following rules:
If a received 10-bit symbol is determined to be an invalid 10-bit code (i.e., no legal
translation to a control or data value possible), the PHY still retransmits the symbol
exactly as it was receive d.
If a SKP ordered set retransmission requires adding a SKP symbol to accommodate
timing tolerance correction, any disparity can be chosen for the SKP symbol.
Table 13. Summary of power management state
PWRDWN[1:0] Power management state Transmitter Receiver TX PLL RXCLK RX PLL/CDR
00b P0, normal operation on[1] on on on on
01b P0s, power saving state idle[2] idle on on on
10b P1, lower power state idle[2] idle on on off
11b illegal, PHY will enter P1 - - - - -
Fig 5. Receiver detect - receive r present
002aac173
RXCLK
000b
10b
011b 000b
PHYSTATUS
RXSTATUS2,
RXSTATUS1,
RXSTATUS0
TXCLK
RXDET_LOOPB
PWRDWN1,
PWRDWN0
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Product data sheet Rev. 6 — 27 June 2011 12 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
The PHY continues to provide the received data on the PXPIPE interface, behaving
exactly like norma l data receptio n.
The PHY transitions from normal transmission of data from the PXPIPE interface to
looping back the received data at a symbol boundary.
The PHY begins to loopback data when the MAC asserts RXDET_LOOPB while doing
normal data transmission. The PHY stops transmitting data from the PXPIPE interface,
and begins to loopback received symbols. While doing loopback, the PHY continu es to
present received data on the PXPIPE interface.
The PHY stops looping back received data when the MAC de-asserts RXDET_LOOPB.
Transmission of data on the par allel interface begins immediately.
The timing diagram of Figure 6 shows example timing for beginning loopback. In this
example, the receiver is receiving a repeating stream of bytes, Rx-a through Rx- z.
Similarly, the MAC is causing the PHY to transmit a repeating stream of bytes Tx-a
through Tx-z. When the MAC asserts RXDET_LOOPB to the PHY, the PHY begins to
loopback the received data to the differential TX_P and TX_N lines.
The timing diagram of Figure 7 shows an example of switching from loopback mode to
normal mode. As soon as the MAC detects an electrical idle ordered-set, the MAC
de-asserts RXDET_LOOPB, asserts TXIDLE and changes the POWERDOWN signals to
state P1.
Fig 6. Loopback start
RXDET_LOOPB
002aac174
RXCLK
TXCLK
Rx-c Rx-d Rx-e Rx-f Rx-g
Tx-m Tx-n Tx-o Tx-p Tx-q
Tx-m Tx-n Rx-e
TX_P, TX_N
RXDATA[7:0]
TXDATA[7:0]
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Product data sheet Rev. 6 — 27 June 2011 13 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
8.8 Electrical idle
The PCI Express Base Specification requires that devices send an Electrical Idle
ordered-set before TX goes to the electrical idle state.
The timing diagram of Figure 8 shows an example of timing for entering electrical idle.
Fig 7. Loopback end
RXDET_LOOPB
001aac785
RXCLK
RXDATA[7:0]
TXIDLE
TX_P, TX_N
TXCLK
COM IDL Junk
Looped back RX data Junk
includes electrical idle
ordered set
Fig 8. Electrical Idle
TXIDLE
002aac175
TXCLK
TXDATA[7:0]
TXDATAK
ScZero COM IDL
active (ends with Electrical Idle ordered-set)TX_P, TX_N
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Product data sheet Rev. 6 — 27 June 2011 14 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
Table 14 summarizes the function of some PXPIPE control signals.
8.9 Clock tolerance compensation
The PHY receiver contains an elastic buffer used to compensate for differences in
frequencies between bit rates at the two ends of a link. The elastic buffer is capable of
holding at least seven symbols to handle worst case differences (600 ppm) in frequency
and worst case intervals between SKP ordered-sets. The PHY is responsible for inserting
or removing SKP symbols in the received data stream to avoid elastic buffer overflow or
underflow. The PHY monitors the receive data stream, and when a Skip ordered-set is
received, the PHY can add or remove one SKP symbol from each SKP ordered-set as
appropriate to manage its elastic buffer. Whenever a SKP symbol is added or removed,
the PHY will signal this to the MAC using the RXSTATUS signals. These signals have a
non-zero value for one clock cycle and indicate whether a SKP symbol was added or
removed from the received SKP ordered-set. RXSTATUS should be asserted during the
clock cycle when the COM symbol of the SKP ordered-set is moved across the parallel
interface. If the removal of a SKP symbol causes no SKP symbols to be transferred
across the parallel interface, then RXSTATUS is asserted at the same time that the COM
symbol (that was part of the received skip ordered-set) is transmitted across the parallel
interface.
Figure 9 shows a sequence where the PHY inserted a SKP symbol in the data stream.
Figure 10 shows a sequence where the PHY removed a SKP symbol from a SKP
ordered-set.
Table 14. Control signals function summary
PWRDWN[1:0] RXDET_LOOPB TXIDLE Function description
P0: 00b 0 0 normal operation
0 1 transmitter in idle
1 0 loopback mode
1 1 illegal
P0s: 01b X 0 illegal
1 transmitter in idle
P1: 10b X 0 illegal
0 1 transmitter in idle
1 1 receiver detect
Fig 9. Clock correction - insert a SKP
001aac779
RXCLK
active COM SKP
000b 001b 000b
SKP active
RXVALID
RXDATA[7:0]
RXSTATUS2,
RXSTATUS1,
RXSTATUS0
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PCI Express stand-alone X1 PHY
8.10 Error detection
The PHY is responsible for detecting receive errors of several types. These errors are
signaled to the MAC layer using the receiver status signals RXSTATUS.
Because of higher level error detection mechanisms (like CRC) built into the data link
layer of PCI Express, there is no need to specifically identify symbols with errors.
However, timing information about when the error occurred in the data stream is
important. When a receive error occurs, the appropriate error code is asserted for one
clock cycle at the po int close st to wher e the erro r actually occurred .
There are four error conditions that can be encod ed on the RXSTATUS signals. If more
than one error sh ould happen to occur on a received byte, the err ors are signaled with the
priority shown below.
1. 8b/10b decode err or
2. Elastic buffer overflow
3. Elastic buffer underflow
4. Disparity error
Fig 10. Clock correction - remove a SKP
002aac176
RXCLK
active COM SKP
000b 010b 000b
active
RXVALID
RXDATA[7:0]
RXSTATUS2,
RXSTATUS1,
RXSTATUS0
Table 15. Function table PXPIPE status interface signals
Operating mode Output pin
RXSTATUS2 RXSTATUS1 RXSTATUS0
Received data OK L L L
One SKP added L L H
One SKP removed L H L
Receiver detected L H H
8b/10b decode error H L L
Elastic buffer overflow H L H
Elastic buffer underflow H H L
Receive disparity error H H H
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PCI Express stand-alone X1 PHY
8.10.1 8b/10b decode errors
For a detected 8b/10b decode error, the PHY places an EDB (EnD Bad) symbol in the
data str eam in place of the bad byte, an d encodes RXSTATUS with a decode error during
the clock cycle when the effected byte is transferred across the parallel interface. In
Figure 11 the receiver is receiving a stream of bytes Rx-a through Rx-z, and byte Rx-c has
an 8b/10b decode error. In place of that byte, the PHY places an EDB on the parallel
interface, and sets RXSTATUS to the 8b/10b decode error code. Note that a byte that
cannot be decoded may also have bad disparity, but the 8b/10b error has precedence.
8.10.2 Disparity errors
For a detected disparity error, the PHY asserts RXSTATUS with the disparity error co de
during the clock cycle when the effected byte is transferred across the parallel interface. In
Figure 12 the rece iver de tected a disp ar ity error on Rx- c dat a byte, and ind icates this with
the assertion of RXSTATUS.
8.10.3 Elastic buffer
For elastic buf fer errors, an un derflow is signaled during the clock cycle when the spurious
symbol is moved across the parallel interface. The symbol moved across the interface is
the EDB symbol. In the timing diagram Figure 13, the PHY is receiving a repeating set of
symbols Rx-a through Rx-z. The elastic buffer underflow causing the EDB symbol to be
inserted betw ee n th e Rx- c and Rx-d sy mbo ls. The PHY drives RXSTATUS to indicate
buffer underflow during the clock cycle when the EDB is presented on the parallel
interface.
Fig 11. 8b/10b decode errors
Fig 12. Disparity errors
001aac781
RXCLK
Rx-a Rx-b Rx-c
000b 111b 000b
Rx-d Rx-e
RXVALID
RXDATA[7:0]
RXSTATUS2,
RXSTATUS1,
RXSTATUS0
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PCI Express stand-alone X1 PHY
For an elastic buffer overflow, the overflow is signaled during the clock cycle where the
dropped symbol would have appeared in the data stream. In the timing diagram of
Figure 14, the PHY is receiving a r epeating set of symbols Rx-a thr ough Rx-z. Th e ela stic
buffer ove rflows causing the symbol Rx-d to be discarded. The PHY drives RXSTATUS to
indicate buffer overflow during the clock cycle when Rx-d would have appeared on the
parallel interface.
8.11 Polarity inversion
To support lane polarity inversion, the PHY inverts received data when RXPOL is
asserted. The PHY be gin s da ta inversion with in 20 symb o ls after RXPOL is asse rt ed .
Fig 13. E l as tic buf fer underflow
Fig 14. E l as tic buf fer ov erflow
001aac782
RXCLK
Rx-a Rx-b Rx-c
000b 110b 000b
EDB Rx-d
RXVALID
RXDATA[7:0]
RXSTATUS2,
RXSTATUS1,
RXSTATUS0
001aac783
RXCLK
Rx-a Rx-b Rx-c
000b 101b 000b
Rx-e Rx-f
RXVALID
RXDATA[7:0]
RXSTATUS2,
RXSTATUS1,
RXSTATUS0
Fig 15. Polarity inversion
001aac786
RXCLK
D21.5 D21.5 D10.2 D10.2
RXPOL
RXVALID
RXDATA[7:0]
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PCI Express stand-alone X1 PHY
8.12 Setting negative disparity
To set the running disparity to negative, the MAC asserts TXCOMP for one clock cycle
that matches with the data that is to be transmitted with negative dispa rity.
8.13 JTAG boundary scan interface
Joint Test Action Group (JTAG) or IEEE 1149.1 is a standard, specifying how to control
and monitor the pin s of co mp lia nt de vic es on a printed-circuit board. This standard is
commonly known as ‘JTAG Boundary Scan’.
This stand ard defines a 5-pin serial protocol for accessing and controlling the signal levels
on the pins of a digit al circuit, an d has some extensions for testing the internal circuitry on
the chip itself, which is beyond the scope of this data sheet.
Access to the JTAG interface is provided to the customer for the sole purpose of using
boundary scan for interconnect test verification between other compliant devices that ma y
reside on the board. Using JTAG for purposes other than boundary scan may produce
undesired effects.
The JTAG interface is a 3.3 V CMOS signaling. JTAG TRST_N must be asserted LOW for
normal device operation. If JTAG is not planned to be used, it is recommended to
pull down TRST_N to VSS.
Fig 16. Setting negati ve dis parity
002aac177
TXCLK
data K28.5 K28.5
valid data K28.5K28.5+
K28.5 K28.5
TX_P, TX_N
TXCOMP
TXDATA[7:0]
byte transmitted
with negative disparity
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PCI Express stand-alone X1 PHY
9. Limiting values
[1] Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model -
Component level; Electrostatic Discharge Association, Rome, NY, USA.
[2] Charged Device Model: ANSI/EOS/ESD-S5.3.1-1999, standard for ESD sensitivity testing, Charged Device
Model - component level; Electrostatic Discharge Association, Rome, NY, USA.
10. Thermal characteristics
[1] Significant variations can be expected due to system variables, such as adjacent devices, or actual air flow
across the package.
Table 16. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VDDD1 digital supply voltage 1 for JTAG I/O 0.5 +4.6 V
VDDD2 digital supply voltage 2 for SSTL_2 I/O 0.5 +3.75 V
VDDD3 digital supply voltage 3 for core 0.5 +1.7 V
VDD supply voltage for high-speed
serial I/O and PVT 0.5 +1.7 V
VDDA1 analog supply voltage 1 for serial izer 0.5 +1.7 V
VDDA2 analog supply voltage 2 for serial izer 0.5 +4.6 V
VESD electrostatic discharge voltage HBM [1] - 2000 V
CDM [2] -500V
Tstg storage temperature 55 +150 C
Tjjunction temperature 55 +125 C
Tamb ambient temperature operating
commercial 0 +70 C
industrial 40 +85 C
Table 17. Thermal characteristics
Symbol Parameter Conditions Typ Unit
Rth(j-a) thermal resistance from junction to ambient in free air [1] 44 K/W
Rth(j-c) thermal resistance from junction to case in free air [1] 10 K/W
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PCI Express stand-alone X1 PHY
11. Characteristics
Table 18 . PCI Express PHY characteristics
Symbol Parameter Conditions Min Typ Max Unit
Supplies
VDDD1 digital supply voltage 1 for JTAG I/O 3.0 3.3 3.6 V
VDDD2 digital supply voltage 2 for SSTL_2 I/O 2.3 2.5 2.7 V
VDDD3 digital supply voltage 3 for core 1.15 1.2 1.3 V
VDD supply voltage for high-speed serial I/O
and PVT 1.15 1.2 1.3 V
VDDA1 analog supply voltage 1 for serializer 1.15 1.2 1.3 V
VDDA2 analog supply voltage 2 for serializer 3.0 3.3 3.6 V
IDDD1 digital supply current 1 for JTAG I/O 0.1 1 2 mA
IDDD2 digital supply current 2 for SSTL_2; no load - 24 35 mA
IDDD3 digital supply current 3 for core 5 10 15 mA
IDD supply current for high-speed serial I/O
and PVT 15 20 30 mA
IDDA1 analog supply current 1 for serializer 15 20 31 mA
IDDA2 analog supply current 2 for serializer 7 10 15 mA
Receiver
UI unit interval 399.88 400 400.12 ps
VRX_DIFFp-p differential input peak-to-peak voltage 0.205 - 1 .2 V
tRX_MAX_JITTER maximum receiver jitter time - - 0.6 UI
VIDLE_DET_DIFFp-p electrical idle detect threshold 65 - 205 mV
ZRX_DC DC input impedance 40 50 60
ZRX_HIGH_IMP_DC powered-down DC input impedance 200 - - k
RLRX_DIFF differential return loss 15 - - dB
RLRX_CM common mode return loss 6 - - dB
tlock(CDR)(ref) CDR lock time (reference loo p) - - 50 s
tlock(CDR)(data) CDR lock time (data loop) - - 2.5 s
tRX_latency receiver latency 1 clock cycle is 4 ns 6 - 13 clock
cycle
Referenc e clock
fclk(ref) reference clock frequency 99.97 100 100.03 MHz
fmod(clk)(ref) reference clock modulation frequency
range 0.5 - +0 %
fmod(clk)(ref) reference clock modulation frequency 30 - 33 kHz
VIH(se)REFCLK REFCLK single-end HIGH-level input
voltage - 0.7 1.15 V
VIL(se)REFCLK REFCLK single-end LOW-level input
voltage 0.3 0 - V
ZC-DC clock source DC impedance 40 50 6 0
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NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
dV/dt rate of change of voltage at rising edge;
measured from 150 mV
to +150 mV on the
differential waveform;
Figure 17
0.6 - 4.0 V/ns
at falling edge;
measured from +150 mV
to 150 mV on the
differential waveform;
Figure 17
0.6 - 4.0 V/ns
VIH differential input HIGH voltage +150 - - mV
VIL differential input LOW voltage - - 150 mV
REFCLK duty cycle on pin REFCLK on pin REFCLK_N and
pin REFCLK_P 40 - 60 %
Transmitter
UI unit interval 399.88 400 400.12 ps
VTX_DIFFp-p differential peak-to-peak output
voltage 0.8 - 1.2 V
tTX_EYE_m-mJITTER maximum time between the jitter
median and maximum deviation from
the median
-3550ps
tTX_JITTER_MAX maximum transmitter jitter time - 60 100 ps
VTX_DE_RATIO de-emphasized differential output
voltage ratio 3.0 - 4.0 dB
tTX_RISE D+/D TX output rise time 50 75 - ps
tTX_FALL D+/D TX output fall time 50 75 - ps
VTX_CM_ACp RMS AC peak common mode output
voltage --20mV
VCM_DC_ACT_IDLE absolute delta of DC common mode
voltage during L0 and electrical idle 0- 100mV
VCM_DC_LINE absolute del ta of DC common mode
voltage between D+ and D
0- 25mV
VTX_CM_DC TX DC common mode voltage 0 - 3.6 V
ITX_SHORT TX short-circuit current limit - 20 90 mA
RLTX_DIFF differential return loss 12 - - dB
RLTX_CM common mode return loss 6 - - dB
ZTX_DC transmitter DC impedance 40 50 6 0
CTX AC coupling capacitor 75 100 200 nF
tlock(PLL) PLL lock time - - 50 s
tTX_latency transmitter latency 1 clock cycle is 4 ns 4 - 9 clock
cycle
tP0s_exit_latency P0s state exit latency - - 2.5 s
tP1_exit_latency P1 state exit latency - - 64 s
tRESET-PHYSTATUS RESET_N HIGH to PHYST A TUS LOW
time --64s
Table 18 . PCI Express PHY characteristics …continued
Symbol Parameter Conditions Min Typ Max Unit
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Product data sheet Rev. 6 — 27 June 2011 22 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
[1] Reference voltage for SSTL_2 class I I/O.
Fig 17. Differential measurement points
dV/dt
at rising edge dV/dt
at falling edge
002aad694
V
IH
= +150 mV
0.0 V
V
IL
= 150 mV
REFCLK+
minus
REFCLK
Table 19. PXPIPE characteristics
Symbol Parameter Conditions Min Typ Max Unit
fRXCLK RXCLK frequency 249.925 250 250.075 MHz
fTXCLK TXCLK frequency 249.925 250 250.075 MHz
VVREFS voltage on pin VREFS [1] 1.13 1.25 1.38 V
VOH(SSTL2) SSTL_2 HIGH-level output voltage AC VTT +0.61 - - V
VOL(SSTL2) SSTL_2 LOW-level output voltage AC - - VTT 0.61 V
VIH(SSTL2) SSTL_2 HIGH-level input voltage AC Vref +0.31 - - V
VIL(SSTL2) SSTL_2 LOW-level input voltage AC - - Vref 0.31 V
Input signals; measured with respect to TXCLK
tsu(TX)(PXPIPE) set-up time of PXPIPE input signal see Figure 18 500 - - ps
th(TX)(PXPIPE) hold time of PXPIPE input signal see Figure 18 500 - - ps
Output signals; measured with resp ect to RXCLK
tsu(RX)(PXPIPE) set-up time of PXPIPE output signal see Figure 18 1500 - - ps
th(RX)(PXPIPE) hold time of PXPIPE output signal see Figure 18 1500 - - ps
Fig 18. Definition of PXPIPE timing
PXPIPE
INPUT
TXCLK
PXPIPE
OUTPUT
RXCLK
th(RX)(PXPIPE)
tsu(RX)(PXPIPE)
th(TX)(PXPIPE)
tsu(TX)(PXPIPE)
002aac316
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NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
Tamb = 25 C; nominal VDD
Fig 19. Transition eye
Tamb = 25 C; nominal VDD
Fig 20. Non transition eye
0.2
0.6
0.5
0.4
0.3
0.2
0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.1 0
differential
signal
(V)
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
unit intervals
1.1 1.2
001aac789
0.2
0.6
0.5
0.4
0.3
0.2
0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.1 0
differential
signal
(V)
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
unit intervals
1.1 1.2
001aac790
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Product data sheet Rev. 6 — 27 June 2011 24 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
12. Package outline
Fig 21. Package outline SOT643-1 (LFBGA81)
ball A1
index area
0.8
A1bA2
UNIT Dye
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
00-11-01
02-03-28
IEC JEDEC JEITA
mm 1.6 0.4
0.3 1.20
0.95 9.1
8.9
y1
9.1
8.9
0.5
0.4 0.12 0.1
e1
6.4
e2
6.4
DIMENSIONS (mm are the original dimensions)
SOT643-1 MO-205 - - -
E
0.15
v
0.08
w
0 5 10 mm
scale
SOT643-1
LFBGA81: plastic low profile fine-pitch ball grid array package; 81 balls; body 9 x 9 x 1.05 mm
A
max.
AA2A1
detail X
y
y1C
X
D
E
C
A
B
C
D
E
F
H
G
J
246 981357
BA
ball A1
index area
e
e
e1
b
e2
AC
CB
vM
wM
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NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
13. Soldering of SMD packages
This text provides a very brief insight into a complex technology. A more in-depth account
of soldering ICs can be found in Application Note AN10365 “Surface mount reflow
soldering description”.
13.1 Introduction to soldering
Soldering is one of the most common methods through which packages are attached to
Printed Circuit Boards (PCBs), to form electrical circuits. The soldered joint provides both
the mechanical and the electrical connection. There is no single soldering method that is
ideal for all IC packages. Wave soldering is often preferred when through-hole and
Surface Mount Devices (SMDs) are mixed on one printed wiring board; however, it is not
suitable for fine pitch SMDs. Reflow soldering is ideal for the small pitches and high
densities that come with increased miniaturization.
13.2 Wave and reflow soldering
W ave soldering is a joinin g technology in which the joint s are made by solder coming from
a standing wave of liquid solder. The wave soldering process is suitable for th e following:
Through-hole components
Leaded or leadless SMDs, which are glued to the surface of the printed circuit board
Not all SMDs can be wave soldered. Packages with solder balls, and some leadless
packages which have solder lands underneath the body, cannot be wave soldered. Also,
leaded SMDs with leads having a pitch smaller than ~0.6 mm cannot be wave soldered,
due to an increased probability of bridging.
The reflow soldering process involves applying solder paste to a board, followed by
component placement and exposure to a temperature profile. Leaded packages,
packages with solder balls, and leadless packages are all reflow solderable.
Key characteristics in both wave and reflow soldering are:
Board specifications, including the board finish, solder masks and vias
Package footprints, including solder thieves and orientation
The moisture sensitivity level of the packages
Package placement
Inspection and repair
Lead-free soldering versus SnPb soldering
13.3 Wave soldering
Key characteristics in wave soldering are:
Process issues, such as application of adhesive and flux, clinching of leads, board
transport, the solder wave parameters, and the time during which components are
exposed to the wave
Solder bath specifications, including temperature and impurities
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PCI Express stand-alone X1 PHY
13.4 Reflow soldering
Key characteristics in reflow soldering are:
Lead-free ve rsus SnPb soldering; note th at a lead-free reflow process usua lly leads to
higher minimum peak temperatures (see Figure 22) than a SnPb process, thus
reducing the process window
Solder paste printing issues including smearing, release, and adjusting the process
window for a mix of large and small components on one board
Reflow temperature profile; this profile includes preheat, reflow (in which the board is
heated to the peak temperature) and cooling down. It is imperative that the peak
temperature is high enoug h for the solder to make reliable solder joint s (a solder paste
characteristic). In addition, the peak temperature must be low enough that the
packages and/or boards are not damaged. The peak temperature of the package
depends on package thickness and volume and is classified in acco rdance with
Table 20 and 21
Moisture sensitivity precautions, as indicated on the packing, must be respected at all
times.
Studies have shown that small packages reach higher temperatures during reflow
soldering, see Figure 22.
Table 20. SnPb eutectic process (from J-STD-020C)
Package thickness (mm) Package reflow temperature (C)
Volume (mm3)
< 350 350
< 2.5 235 220
2.5 220 220
Table 21. Lead-free process (from J-STD-020C)
Package thickness (mm) Package reflow temperature (C)
Volume (mm3)
< 350 350 to 2000 > 2000
< 1.6 260 260 260
1.6 to 2.5 260 250 245
> 2.5 250 245 245
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PCI Express stand-alone X1 PHY
For further information on temperature profiles, refer to Application Note AN10365
“Surface mount reflow soldering description”.
14. Appendix
14.1 Errata added 2009-09-01
The PX1011B (types PX1011B-EL1/G, PX1011BI-EL1/G, PX1011B-EL1/N and
PX1011B-EL1/Q900) is reported to sporadically produce communication failures in Intel
DX58S0-based systems in which the PCIe transmitter has full Active Power State
Management (ASPM) capability, and particularly when L0s mode is supported.
When the PCIe transmitter goes idle (enters L0s) for the purpose of power saving and
then returns to normal mode (exits L0s and enters L0), the PX1011B receiver PLL may
randomly fail to lock, preventing it from pr operly inte rpreting the da t a being transmitted on
the link. As a result the PX1011B may send symbols to the link device that it cannot
recognize.
This is a L0s exit failure which may prevent the system from recovering and could cause
the PCIe protocol to eventually fail and the link to go down. If this occurs, the PX1011B
stays in the exit failur e state indefinitely. The receiver can only be re-initiated by a pplying a
hard reset to the PHY, returning it to normal mode.
You are strongly advised to disable the L0s mode whenever the PX1011B is used.
MSL: Moisture Sensitivity Level
Fig 22. Temperature profiles for large and small components
001aac844
temperature
time
minimum peak temperature
= minimum soldering temperature
maximum peak temperature
= MSL limit, damage level
peak
temperature
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PCI Express stand-alone X1 PHY
15. Abbreviations
16. References
[1] PCI Express Base SpecificationRev. 1.0a - PCISIG
[2] PHY Interface for the PCI Express Architecture (PIPE) Specification Version
1.00 — Intel Corporation
Table 22. Abbreviations
Acronym Description
BER Bit Error Rate
BIST Built-In Self Test
CMOS Complementary Metal-Oxide Semiconductor
CRC Cyclic Redundancy Check
EMI ElectroMagnetic Interference
ESD ElectroStatic Discharge
FPGA Field Programmable Gate Array
LTSSM Link Training and S tatus State Machine
MAC Media Access Control
P2S Parallel to Serial
PCI Peripheral Component Interconnect
PCS Physica l Coding Sub-layer
PHY PHYsical layer
PLL Phase-Locked Loop
PIPE PHY Interface for the PCI Express
PVT Process Voltage Temperature
S2P Serial to Paralle l
SerDes Serializer and De-serializer
SKP SKiP
SSTL_2 Stub Series Terminated Logic for 2.5 Volts
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PCI Express stand-alone X1 PHY
17. Revision history
Table 23. Revision history
Document ID Release date Dat a sheet status Change notice Supersedes
PX1011B v.6 20110627 Product data sheet - PX1011B v.5
Modifications: Section 1 “General description, third paragraph: added last sentence
PX1011B v.5 20110418 Product data sheet - PX1011B v.4
Modifications: Table 2 “Ordering information”:
Added type number PX1011B-EL1/Q900
Added Table note [1] and cross-reference at PX1011B-EL1/Q900
Table 4 “Lead-free package marking”: added marki ng PX1011B-EL1/Q
Figure 2 “Pin configuration for LFBGA81”: added type number PX1011B-EL1/Q900
Table 18 “PCI Express PHY characteristics”:
sub-section “Supplies”, IDD, supply current: Max value chan ged from “28 mA” to “30 mA”
sub-section “Supplies”, IDDA1, an alog supply current 1: Max value changed from “28 mA” to
“31 mA”
sub-section “Recei ver”, VRX_DIFFp-p, differential input peak-to-peak voltage: Min value changed
from “0.175 V” to “0.205 V”
sub-section “Recei ver”, VIDLE_DET_DIFFp-p, electrical idle detect threshold: Max value changed
from “175 mV” to “205 mV”
Section 14.1 “Errata added 2009-09-01”: added type number PX1011B-EL1/Q900 to first sentence
PX1011B v.4 20090904 Product data sheet - PX1011B v. 3
Modifications: Section 14: Errata information adde d
PX1011B v.3 20081020 Product data sheet - PX1011B v. 2
Modifications: Added type number PX1011B-EL1/N (affects Section 2.6 “Miscellaneous”, Table 2 “Ordering
information”, (new) Table 3 “Leaded package marking”, Figure 2 “Pin configuration for LFBGA81”)
PX1011B v.2 20080319 Product data sheet - PX1011B v. 1
PX1011B v.1 20080213 Objective data sheet - -
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18. Legal information
18.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is docume nt may have cha nged since this docume nt was publis hed and ma y dif fer in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
18.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not be rel ied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall pre vail.
Product specificatio nThe information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
18.3 Disclaimers
Limited warr a nty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidenta l ,
punitive, special or consequ ential damages (including - wit hout limitatio n - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconduct ors’ aggregate and cumulat ive liability toward s
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suit able for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in perso nal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liab ility for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty tha t such application s will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for the custome r’s applications and
products planned, as well as fo r the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
NXP Semiconductors does not accept any liabil ity related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for th e customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by cu stomer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress rating s only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanent ly and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individua l agreement. In case an individual
agreement is concluded only the ter ms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly object s to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing i n this document may be interpreted or
construed as an of fer t o sell product s that is open for accept ance or t he grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contains data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specificat ion.
Product [short] dat a sheet Production This document contains the product specification.
PX1011B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 6 — 27 June 2011 31 of 32
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization fro m national authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automoti ve qualified,
the product is not suitable for automotive use. It i s neit her qua lified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automot ive specifications and standard s, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from custome r design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ pro duct specifications.
18.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respect i ve ow ners.
19. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
NXP Semiconductors PX1011B
PCI Express stand-alone X1 PHY
© NXP B.V. 2011. All rights reserved.
For more information, please visit: http://www.nxp.co m
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 27 June 2011
Document identifier: PX1011B
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
20. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1
2.1 PCI Express interface. . . . . . . . . . . . . . . . . . . . 1
2.2 PHY/MAC interface . . . . . . . . . . . . . . . . . . . . . 1
2.3 JTAG interface . . . . . . . . . . . . . . . . . . . . . . . . . 2
2.4 Power management . . . . . . . . . . . . . . . . . . . . . 2
2.5 Clock. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
2.6 Miscellaneous. . . . . . . . . . . . . . . . . . . . . . . . . . 2
3 Quick reference data . . . . . . . . . . . . . . . . . . . . . 2
4 Ordering information. . . . . . . . . . . . . . . . . . . . . 3
5 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
6 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 4
7 Pinning information. . . . . . . . . . . . . . . . . . . . . . 5
7.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
7.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 6
8 Functional description . . . . . . . . . . . . . . . . . . . 8
8.1 Receiving data . . . . . . . . . . . . . . . . . . . . . . . . . 8
8.2 Transmitting data . . . . . . . . . . . . . . . . . . . . . . . 9
8.3 Clocking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
8.4 Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
8.5 Power management . . . . . . . . . . . . . . . . . . . . 10
8.6 Receiver detect. . . . . . . . . . . . . . . . . . . . . . . . 11
8.7 Loopback . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
8.8 Electrical idle . . . . . . . . . . . . . . . . . . . . . . . . . 13
8.9 Clock tolerance compensation . . . . . . . . . . . . 14
8.10 Error detection . . . . . . . . . . . . . . . . . . . . . . . . 15
8.10.1 8b/10b decode errors . . . . . . . . . . . . . . . . . . . 16
8.10.2 Disparity errors. . . . . . . . . . . . . . . . . . . . . . . . 16
8.10.3 Elastic buffer. . . . . . . . . . . . . . . . . . . . . . . . . . 16
8.11 Polarity inversion . . . . . . . . . . . . . . . . . . . . . . 17
8.12 Setting negative disparity . . . . . . . . . . . . . . . . 18
8.13 JTAG boundary scan interface . . . . . . . . . . . . 18
9 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 19
10 Thermal characteristics . . . . . . . . . . . . . . . . . 19
11 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . 20
12 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 24
13 Soldering of SMD packages . . . . . . . . . . . . . . 25
13.1 Introduction to soldering. . . . . . . . . . . . . . . . . 25
13.2 Wave and reflow soldering . . . . . . . . . . . . . . . 25
13.3 Wave soldering. . . . . . . . . . . . . . . . . . . . . . . . 25
13.4 Reflow soldering. . . . . . . . . . . . . . . . . . . . . . . 26
14 Appendix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
14.1 Errata added 2009-09-01 . . . . . . . . . . . . . . . . 27
15 Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 28
16 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
17 Revision history . . . . . . . . . . . . . . . . . . . . . . . 29
18 Legal information . . . . . . . . . . . . . . . . . . . . . . 30
18.1 Data sheet status. . . . . . . . . . . . . . . . . . . . . . 30
18.2 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
18.3 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 30
18.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 31
19 Contact information . . . . . . . . . . . . . . . . . . . . 31
20 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32