Si4356
4 Rev 1.2
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter Symbol Test Condition Min Typ Max Unit
Ambient Temperature TA— –40 25 85 C
Supply Voltage VDD —1.8—3.6V
I/O Drive Voltage VGPIO —1.8—3.6V
Table 2. DC Characteristics*
Parameter Symbol Test Condition Min Typ Max Unit
Standby Mode Current IStandby Configuration retained, all other functions OFF — 50 — nA
RX Mode Current IRX ——12—mA
*Note: All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section of "1.1. Definition of Test Conditions" on page 8.
Table 3. Receiver Electrical Characteristics1
Parameter Symbol Test Condition Min Typ Max Unit
Frequency Range FRANGE Only frequencies listed in Table 9
supported
315 — 917 MHz
Sensitivity2PFSK BER < 0.1%, 2.4 kbps, (G)FSK,
Configuration = FSK1 (See Section 3.)
—–113—dBm
PFSK BER < 0.1%, 2.4 kbps, (G)FSK,
Configuration = FSK6 (See Section 3.)
–104 dBm
POOK BER < 0.1%, 2.4 kbps, OOK,
Configuration = OOK6 (See Section 3.)
—–111—dBm
RX Channel Bandwidth3BW — 100 — 535 kHz
BER Variation vs Power
Level3
PRX_RES Up to +5 dBm Input Level — 0 0.1 ppm
Notes:
1. Test conditions and max limits are listed in section “1.1. Definition of Test Conditions”.
2. Sensitivity measured at 434 MHz using a PN9 modulated input signal. Received signal is filtered, deglitched, and
retimed using an external RC filter (R = 1 k, C = 47 nF) and MCU.
3. Guaranteed by qualification. Qualification test conditions are listed in section “1.1. Definition of Test Conditions”.