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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
32M-BIT [4M x 8 / 2M x 16] SINGLE VOLTAGE
3V ONLY FLASH MEMORY
FEATURES
GENERAL FEA TURES
4,194,304 x 8 / 2,097,152 x 16 switchable
Sector Structure
- 8K-Byte x 8 and 64K-Byte x 63
Extra 64K-Byte sector for security
- Features factory locked and identifiable, and cus-
tomer lockable
Twenty-Fo ur Sector Gro ups
- Provides sector group protect function to prevent pro-
gram or erase operation in the protected sector group
- Provides chip unprotect function to allow code chang-
ing
- Provides temporary sector group unprotect function
for code changing in previously protected sector groups
Single P ower Supply Operatio n
- 2.7 to 3.6 volt for read, erase, and program opera-
tions
Latch-up protected to 250mA from -1V to Vcc + 1V
Low Vcc write inhibit is equal to o r less than 1.4V
Compatible with JEDEC standard
- Pinout and software compatible to single power sup-
ply Flash
Fully compatible with KH29LV320A T/B device
PERFORMANCE
High Performance
- Fast access time: 70/90ns
- Fast pro gram time: 7us/word typical utilizing acceler-
ate function
- F ast er ase time: 0.9s/sector , 35s/chip (typical)
Low Power Consumption
- Low active read current: 10mA (typical) at 5MHz
- Low standby current: 200nA (typical)
Minimum 100,000 erase/program cycle
10 years data retentio n
SOFTWARE FEA TURES
Erase Suspend/ Erase Resume
- Suspends sector erase operation to read data from
or program data to another sector which is not being
erased
Status Reply
- Data# P olling & To ggle bits provide detectio n of pro-
gram and erase operation completion
Suppo rt Co mmo n Flash Interf ace (CFI)
HARDWARE FEATURES
Ready/Busy# (RY/BY#) Output
- Provides a hardware method of detecting program
and erase operation completion
Hardware Reset (RESET#) Input
- Provides a hardware method to reset the internal state
machine to read mode
WP#/ACC input pin
- Provides accelerated program capability
PACKAGE
48-Pin TSOP
All Pb-free devices are RoHS Compliant
GENERAL DESCRIPTION
The KH29LV320C T/B is a 32-mega bit Flash memory
organized as 4M bytes of 8 bits and 2M words of 16 bits.
MXIC's Flash memories offer the most cost-effective and
reliable read/write no n-v o latile random access memo ry.
The KH29LV320C T/B is pac kaged in 48-pin TSOP. It is
designed to be repro grammed and erased in system o r in
standard EPROM programmers.
The standard KH29LV320C T/B offers access time as
fast as 70ns, allowing operation of high-speed micropro-
cessors without wait states. To eliminate bus conten-
tion, the KH29L V320C T/B has separate chip enable (CE#)
and o utput enable (OE#) co ntrols.
MXIC's Flash memo ries augment EPROM functio nality
with in-circuit electrical erasure and pro gramming. The
KH29LV320C T/B uses a co mmand register to manage
this functio nality.
MXIC Flash techno logy reliably sto res memo ry contents
even after 100,000 erase and program cycles. The MXIC
cell is designed to optimize the erase and program
mechanisms. In additio n, the co mbination o f adv anced
tunnel oxide processing and low internal electr ic fields
for erase and pro gramming o peratio ns produces reliable
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
cycling. The KH29LV320C T/B uses a 2.7V to 3.6V VCC
supply to perform the High Reliability Erase and auto
Pro gram/Erase algo rithms.
The highest degree o f latch-up protection is achieved with
MXIC's pro prietary non-epi process. Latch-up protection
is pro ved for stresses up to 100 milliamperes o n address
and data pin fro m -1V to VCC + 1V.
AUTOMA TIC PROGRAMMING
The KH29LV320C T/B is byte/wo rd programmable using
the Automatic Programming algor ithm. The Automatic
Programming algorithm makes the exter nal system do
not need to have time out sequence nor to verify the
data pro grammed. The typical chip programming time at
room temperature of the KH29LV320C T/B is less than
36 seco nds.
AUTOMA TIC PROGRAMMING ALGORITHM
MXIC's Automatic Programming algorithm require the user
to o nly write pro gram set-up co mmands (including 2 un-
lo ck write cycle and A0H) and a program co mmand (pro-
gram data and address). The device auto matically times
the pro gramming pulse width, pro vides the program veri-
ficatio n, and co unts the number of sequences. A status
bit similar to Data# Polling and a status bit toggling be-
tween co nsecutiv e read cycles, pro vide f eedback to the
user as to the status o f the pro gramming o peratio n.
A UTOMATIC CHIP ERASE
The entire chip is bulk erased using 50 ms erase pulses
according to MXIC's Automatic Chip Erase algorithm.
Typical erasure at ro o m temperature is acco mplished in
less than 35 seconds. The Automatic Erase algor ithm
auto matically programs the entire array prio r to electrical
erase. The timing and verificatio n o f electrical erase are
co ntro lled internally within the device.
AUTOMA TIC SECTOR ERASE
The KH29LV320C T/B is sector(s) erasable using
MXIC's Auto Sector Erase algorithm. Sector erase
modes allow sectors of the array to be erased in one
erase cycle. The Automatic Sector Erase algorithm
automatically programs the specified sector(s) prior to
electrical erase. The timing and verification of electri-
cal erase are controlled internally within the device.
AUTOMA TIC ERASE ALGORITHM
MXIC's Automatic Erase algorithm requires the user to
write commands to the command register using stand-
ard microprocessor write timings. The device will auto-
matically pre-program and verify the entire arra y. Then
the device automatically times the erase pulse width,
pro vides the erase verificatio n, and counts the number of
sequences. A status bit toggling between consecutive
read cycles pro vides f eedback to the user as to the sta-
tus o f the programming o peratio n.
Register contents ser ve as inputs to an inter nal state-
machine which co ntro ls the erase and pro gramming cir-
cuitry. During write cycles, the co mmand register inter-
nally latches address and data needed f o r the pro gram-
ming and erase o perations. During a system write cycle,
addresses are latched o n the falling edge, and data are
latched o n the rising edge o f WE# .
MXIC's Flash technology combines years of EPROM
experience to pro duce the highest levels of quality , relia-
bility , and co st effectiveness. The KH29LV320C T/B elec-
trically erases all bits simultaneo usly using Fowler-Nord-
heim tunneling. The bytes/words are programmed by
using the EPROM pro gramming mechanism of hot elec-
tro n injection.
During a program cycle, the state-machine will control
the program sequences and command register will not
respond to any command set. During a Sector Erase
cycle, the command register will only respond to Erase
Suspend co mmand. After Erase Suspend is co mpleted,
the de vice sta ys in read mode. After the state machine
has completed its task, it will allow the command regis-
ter to respond to its full co mmand set.
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KH29LV320C T/B
PIN CONFIGURATION
48 TSOP
SYMBOL PIN NAME
A0~A20 Address Input
Q0~Q14 15 Data Inputs/Outputs
Q15/A-1 Q15(Data Input/Output, word mode)
A-1(LSB Address Input, byte mo de)
CE# Chip Enable Input
WE# Write Enable Input
OE# Output Enable Input
BYTE# Word/Byte Selectio n Input
RESET# Hardware Reset Pin, Active Low
R Y/BY# Read/Busy Output
VC C 3.0 volt-only single power supply
WP#/ACC Hardware Write Protect/Acceleration
Pin
GND Device Ground
N C Pin Not Connected Internally
PIN DESCRIPTION LOGIC SYMBOL
16 or 8
Q0-Q15
(A-1)
RY/BY#
A0-A20
CE#
OE#
WE#
RESET#
WP#/ACC
BYTE#
21
A15
A14
A13
A12
A11
A10
A9
A8
A19
A20
WE#
RESET#
NC
WP#/ACC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
A16
BYTE#
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
Q11
Q3
Q10
Q2
Q9
Q1
Q8
Q0
OE#
GND
CE#
A0
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
KH29LV320C T/B
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
BLOCK DIAGRAM
CONTROL
INPUT
LOGIC
PROGRAM/ERASE
HIGH V OLTAGE
WRITE
STATE
MACHINE
(WSM)
STATE
REGISTER
FLASH
ARRAY
X-DECODER
ADDRESS
LATCH
AND
BUFFER Y-PASS GATE
Y-DECODER
ARRAY
SOURCE
HV COMMAND
DATA
DECODER
COMMAND
DATA LATCH
I/O BUFFER
PGM
DATA
HV
PROGRAM
DATA LATCH
SENSE
AMPLIFIER
Q0-Q15/A-1
A0-A20
CE#
OE#
WE#
RESET#
BYTE#
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KH29LV320C T/B
Sector Sector Sector Address Sector Size (x8) (x16)
Group A20-A12 (Kbytes/Kwords) Address Range Address Range
1 SA0 000000xxx 64/32 000000h-00FFFFh 000000h-07FFFh
1 SA1 000001xxx 64/32 010000h-01FFFFh 008000h-0FFFFh
1 SA2 000010xxx 64/32 020000h-02FFFFh 010000h-17FFFh
1 SA3 000011xxx 64/32 030000h-03FFFFh 018000h-01FFFFh
2 SA4 000100xxx 64/32 040000h-04FFFFh 020000h-027FFFh
2 SA5 000101xxx 64/32 050000h-05FFFFh 028000h-02FFFFh
2 SA6 000110xxx 64/32 060000h-06FFFFh 030000h-037FFFh
2 SA7 000111xxx 64/32 070000h-07FFFFh 038000h-03FFFFh
3 SA8 001000xxx 64/32 080000h-08FFFFh 040000h-047FFFh
3 SA9 001001xxx 64/32 090000h-09FFFFh 048000h-04FFFFh
3 SA10 001010xxx 64/32 0A0000h-0AFFFFh 050000h-057FFFh
3 SA11 001011xxx 64/32 0B0000h-0BFFFFh 058000h-05FFFFh
4 SA12 001100xxx 64/32 0C0000h-0CFFFFh 060000h-067FFFh
4 SA13 001101xxx 64/32 0D0000h-0DFFFFh 068000h-06FFFFh
4 SA14 001110xxx 64/32 0E0000h-0EFFFFh 070000h-077FFFh
4 SA15 001111xxx 64/32 0F0000h-0FFFFFh 078000h-07FFFFh
5 SA16 010000xxx 64/32 100000h-10FFFFh 080000h-087FFFh
5 SA17 010001xxx 64/32 110000h-11FFFFh 088000h-08FFFFh
5 SA18 010010xxx 64/32 120000h-12FFFFh 090000h-097FFFh
5 SA19 010011xxx 64/32 130000h-13FFFFh 098000h-09FFFFh
6 SA20 010100xxx 64/32 140000h-14FFFFh 0A0000h-0A7FFFh
6 SA21 010101xxx 64/32 150000h-15FFFFh 0A8000h-0AFFFFh
6 SA22 010110xxx 64/32 160000h-16FFFFh 0B0000h-0B7FFFh
6 SA23 010111xxx 64/32 170000h-17FFFFh 0B8000h-0BFFFFh
7 SA24 011000xxx 64/32 180000h-18FFFFh 0C0000h-0C7FFFh
7 SA25 011001xxx 64/32 190000h-19FFFFh 0C8000h-0CFFFFh
7 SA26 011010xxx 64/32 1A0000h-1AFFFFh 0D0000h-0D7FFFh
7 SA27 011011xxx 64/32 1B0000h-1BFFFFh 0D8000h-0DFFFFh
8 SA28 011100xxx 64/32 1C0000h-1CFFFFh 0E0000h-0E7FFFh
8 SA29 011101xxx 64/32 1D0000h-1DFFFFh 0E8000h-0EFFFFh
8 SA30 011110xxx 64/32 1E0000h-1EFFFFh 0F0000h-0F7FFFh
8 SA31 011111xxx 64/32 1F0000h-1FFFFFh 0F8000h-0FFFFFh
9 SA32 100000xxx 64/32 200000h-20FFFFh 100000h-107FFFh
9 SA33 100001xxx 64/32 210000h-21FFFFh 108000h-10FFFFh
9 SA34 100010xxx 64/32 220000h-22FFFFh 110000h-117FFFh
9 SA35 100011xxx 64/32 230000h-23FFFFh 118000h-11FFFFh
10 SA36 100100xxx 64/32 240000h-24FFFFh 120000h-127FFFh
10 SA37 100101xxx 64/32 250000h-25FFFFh 128000h-12FFFFh
10 SA38 100110xxx 64/32 260000h-26FFFFh 130000h-137FFFh
10 SA39 100111xxx 64/32 270000h-27FFFFh 138000h-13FFFFh
T able 1.a: KH29L V320CT SECTOR GROUP ARCHITECTURE
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KH29LV320C T/B
Sector Sector Sector Address Sector Size (x8) (x16)
Group A20-A12 (Kbytes/Kwords) Address Range Address Range
11 SA40 101000xxx 64/32 280000h-28FFFFh 140000h-147FFFh
11 SA41 101001xxx 64/32 290000h-29FFFFh 148000h-14FFFFh
11 SA42 101010xxx 64/32 2A0000h-2AFFFFh 150000h-157FFFh
11 SA43 101011xxx 64/32 2B0000h-2BFFFFh 158000h-15FFFFh
12 SA44 101100xxx 64/32 2C0000h-2CFFFFh 160000h-147FFFh
12 SA45 101101xxx 64/32 2D0000h-2DFFFFh 168000h-14FFFFh
12 SA46 101110xxx 64/32 2E0000h-2EFFFFh 170000h-177FFFh
12 SA47 101111xxx 64/32 2F0000h-2FFFFFh 178000h-17FFFFh
13 SA48 110000xxx 64/32 300000h-30FFFFh 180000h-187FFFh
13 SA49 110001xxx 64/32 310000h-31FFFFh 188000h-18FFFFh
13 SA50 110010xxx 64/32 320000h-32FFFFh 190000h-197FFFh
13 SA51 110011xxx 64/32 330000h-33FFFFh 198000h-19FFFFh
14 SA52 110100xxx 64/32 340000h-34FFFFh 1A0000h-1A7FFFh
14 SA53 110101xxx 64/32 350000h-35FFFFh 1A8000h-1AFFFFh
14 SA54 110110xxx 64/32 360000h-36FFFFh 1B0000h-1B7FFFh
14 SA55 110111xxx 64/32 370000h-37FFFFh 1B8000h-1BFFFFh
15 SA56 111000xxx 64/32 380000h-38FFFFh 1C0000h-1C7FFFh
15 SA57 111001xxx 64/32 390000h-39FFFFh 1C8000h-1CFFFFh
15 SA58 111010xxx 64/32 3A0000h-3AFFFFh 1D0000h-1D7FFFh
15 SA59 111011xxx 64/32 3B0000h-3BFFFFh 1D8000h-1DFFFFh
16 SA60 111100xxx 64/32 3C0000h-3CFFFFh 1E0000h-1E7FFFh
16 SA61 111101xxx 64/32 3D0000h-3DFFFFh 1E8000h-1EFFFFh
16 SA62 111110xxx 64/32 3E0000h-3EFFFFh 1F0000h-1F7FFFh
17 SA63 111111000 8/4 3F0000h-3F1FFFh 1F8000h-1F8FFFh
18 SA64 111111001 8/4 3F2000h-3F3FFFh 1F9000h-1F9FFFh
19 SA65 111111010 8/4 3F4000h-3F5FFFh 1FA000h-1FAFFFh
20 SA66 111111011 8/4 3F6000h-3F7FFFh 1FB000h-1FBFFFh
21 SA67 111111100 8/4 3F8000h-3F9FFFh 1FC000h-1FCFFFh
22 SA68 111111101 8/4 3FA000h-3FBFFFh 1FD000h-1FDFFFh
23 SA69 111111110 8/4 3FC000h-3FDFFFh 1FE000h-1FEFFFh
24 SA70 111111111 8/4 3FE000h-3FFFFFh 1FF000h-1FFFFFh
T op Boot Security Sector Addresses
Sector Address Sector Size (x8) (x16)
A20~A12 (Kbytes/Kwords) Address Range Address Range
111111xxx 64/32 3F0000h-3FFFFFh 1F8000h-1FFFFFh
No te:The address range is A20:A-1 in byte mo de (BYTE#=VIL) o r A20:A0 in wo rd mo de (BYTE#=VIH)
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KH29LV320C T/B
Sector Sector Sector Address Sector Size (x8) (x16)
Group A20-A12 (Kbytes/Kwords) Address Range Address Range
1 SA0 000000000 8/4 000000h-001FFFh 000000h-000FFFh
2 SA1 000000001 8/4 002000h-003FFFh 001000h-001FFFh
3 SA2 000000010 8/4 004000h-005FFFh 002000h-002FFFh
4 SA3 000000011 8/4 006000h-007FFFh 003000h-003FFFh
5 SA4 000000100 8/4 008000h-009FFFh 004000h-004FFFh
6 SA5 000000101 8/4 00A000h-00BFFFh 005000h-005FFFh
7 SA6 000000110 8/4 00C000h-00DFFFh 006000h-006FFFh
8 SA7 000000111 8/4 00E000h-00FFFFh 007000h-007FFFh
9 SA8 000001xxx 64/32 010000h-01FFFFh 008000h-00FFFFh
9 SA9 000010xxx 64/32 020000h-02FFFFh 010000h-017FFFh
9 SA10 000011xxx 64/32 030000h-03FFFFh 018000h-01FFFFh
10 SA11 000100xxx 64/32 040000h-04FFFFh 020000h-027FFFh
10 SA12 000101xxx 64/32 050000h-05FFFFh 028000h-02FFFFh
10 SA13 000110xxx 64/32 060000h-06FFFFh 030000h-037FFFh
10 SA14 000111xxx 64/32 070000h-07FFFFh 038000h-03FFFFh
11 SA15 001000xxx 64/32 080000h-08FFFFh 040000h-047FFFh
11 SA16 001001xxx 64/32 090000h-09FFFFh 048000h-04FFFFh
11 SA17 001010xxx 64/32 0A0000h-0AFFFFh 050000h-057FFFh
11 SA18 001011xxx 64/32 0B0000h-0BFFFFh 058000h-05FFFFh
12 SA19 001100xxx 64/32 0C0000h-0CFFFFh 060000h-067FFFh
12 SA20 001101xxx 64/32 0D0000h-0DFFFFh 068000h-06FFFFh
12 SA21 001110xxx 64/32 0E0000h-0EFFFFh 070000h-077FFFh
12 SA22 001111xxx 64/32 0F0000h-0FFFFFh 078000h-07FFFFh
13 SA23 010000xxx 64/32 100000h-10FFFFh 080000h-087FFFh
13 SA24 010001xxx 64/32 110000h-11FFFFh 088000h-08FFFFh
13 SA25 010010xxx 64/32 120000h-12FFFFh 090000h-097FFFh
13 SA26 010011xxx 64/32 130000h-13FFFFh 098000h-09FFFFh
14 SA27 010100xxx 64/32 140000h-14FFFFh 0A0000h-0A7FFFh
14 SA28 010101xxx 64/32 150000h-15FFFFh 0A8000h-0AFFFFh
14 SA29 010110xxx 64/32 160000h-16FFFFh 0B0000h-0B7FFFh
14 SA30 010111xxx 64/32 170000h-17FFFFh 0B8000h-0BFFFFh
15 SA31 011000xxx 64/32 180000h-18FFFFh 0C0000h-0C7FFFh
15 SA32 011001xxx 64/32 190000h-19FFFFh 0C8000h-0CFFFFh
15 SA33 011010xxx 64/32 1A0000h-1AFFFFh 0D0000h-0D7FFFh
15 SA34 011011xxx 64/32 1B0000h-1BFFFFh 0D8000h-0DFFFFh
16 SA35 011100xxx 64/32 1C0000h-1CFFFFh 0E0000h-0E7FFFh
16 SA36 011101xxx 64/32 1D0000h-1DFFFFh 0E8000h-0EFFFFh
16 SA37 011110xxx 64/32 1E0000h-1EFFFFh 0F0000h-0F7FFFh
16 SA38 011111xxx 64/32 1F0000h-1FFFFFh 0F8000h-0FFFFFh
T able 1.b: KH29L V320CB SECTOR GROUP ARCHITECTURE
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KH29LV320C T/B
Sector Sector Sector Address Sector Size (x8) (x16)
Group A20-A12 (Kbytes/Kwords) Address Range Address Range
17 SA39 100000xxx 64/32 200000h-20FFFFh 100000h-107FFFh
17 SA40 100001xxx 64/32 210000h-21FFFFh 108000h-10FFFFh
17 SA41 100010xxx 64/32 220000h-22FFFFh 110000h-117FFFh
17 SA42 100011xxx 64/32 230000h-23FFFFh 118000h-11FFFFh
18 SA43 100100xxx 64/32 240000h-24FFFFh 120000h-127FFFh
18 SA44 100101xxx 64/32 250000h-25FFFFh 128000h-12FFFFh
18 SA45 100110xxx 64/32 260000h-26FFFFh 130000h-137FFFh
18 SA46 100111xxx 64/32 270000h-27FFFFh 138000h-13FFFFh
19 SA47 101000xxx 64/32 280000h-28FFFFh 140000h-147FFFh
19 SA48 101001xxx 64/32 290000h-29FFFFh 148000h-14FFFFh
19 SA49 101010xxx 64/32 2A0000h-2AFFFFh 150000h-157FFFh
19 SA50 101011xxx 64/32 2B0000h-2BFFFFh 158000h-15FFFFh
20 SA51 101100xxx 64/32 2C0000h-2CFFFFh 160000h-167FFFh
20 SA52 101101xxx 64/32 2D0000h-2DFFFFh 168000h-16FFFFh
20 SA53 101110xxx 64/32 2E0000h-2EFFFFh 170000h-177FFFh
20 SA54 101111xxx 64/32 2F0000h-2FFFFFh 178000h-17FFFFh
21 SA55 110000xxx 64/32 300000h-30FFFFh 180000h-187FFFh
21 SA56 110001xxx 64/32 310000h-31FFFFh 188000h-18FFFFh
21 SA57 110010xxx 64/32 320000h-32FFFFh 190000h-197FFFh
21 SA58 110011xxx 64/32 330000h-33FFFFh 198000h-19FFFFh
22 SA59 110100xxx 64/32 340000h-34FFFFh 1A0000h-1A7FFFh
22 SA60 110101xxx 64/32 350000h-35FFFFh 1A8000h-1AFFFFh
22 SA61 110110xxx 64/32 360000h-36FFFFh 1B0000h-1B7FFFh
22 SA62 110111xxx 64/32 370000h-37FFFFh 1B8000h-1BFFFFh
23 SA63 111000xxx 64/32 380000h-38FFFFh 1C0000h-1C7FFFh
23 SA64 111001xxx 64/32 390000h-39FFFFh 1C8000h-1CFFFFh
23 SA65 111010xxx 64/32 3A0000h-3AFFFFh 1D0000h-1D7FFFh
23 SA66 111011xxx 64/32 3B0000h-3BFFFFh 1D8000h-1DFFFFh
24 SA67 111100xxx 64/32 3C0000h-3CFFFFh 1E0000h-1E7FFFh
24 SA68 111101xxx 64/32 3D0000h-3DFFFFh 1E8000h-1EFFFFh
24 SA69 111110xxx 64/32 3E0000h-3EFFFFh 1F0000h-1F7FFFh
24 SA70 111111xxx 64/32 3F0000h-3FFFFFh 1F8000h-1FFFFFh
Bottom Boot Security Sector Addresses
Sector Address Sector Size (x8) (x16)
A20~A12 (Kbytes/Kwords) Address Range Address Range
111111xxx 64/32 000000h-00FFFFh 00000h-07FFFh
No te:The address range is A20:A-1 in byte mode (BYTE#=VIL) o r A20:A0 in wo rd mo de (BYTE#=VIH)
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KH29LV320C T/B
Operation CE# OE# WE# RE- WP#/ Addresses Q0~Q7 Q 8 ~ Q15
SET# A C C (Note 2) Byte#=VIH Byte#=VIL
Read L L H H L/H AIN DOUT DOUT Q8-A14
Write (No te 1) L H L H No te 3 AIN DIN DIN =High-Z
Accelerate L H L H VHH AIN DIN DIN Q15=A-1
Program
Standby VCC±X X VCC±H X High-Z High-Z High-Z
0.3V 0.3V
Output Disable L H H H L/H X High-Z High-Z High-Z
Reset X X X L L/H X High-Z High-Z High-Z
Sector Group L H L VID L/H Sector Addresses, DIN, DOUT X X
Protect (Note 2) A6=L, A1=H, A0=L
Chip Unprotect L H L VID No te 3 Secto r Addresses, DIN, DOUT XX
(N ote 2) A6=H, A1=H, A0=L
Temporary Sector X X X VID Note 3 AIN DIN DIN High-Z
Group Unprotect
Legend:
L=Lo gic LO W=VIL, H=Lo gic High=VIH, VID=12.0±0.5V, VHH=11.5-12.5V, X=Do n't Care, AIN=Address IN, DIN=Data IN,
DOUT=Data OUT
Notes:
1. When the WP#/ACC pin is at VHH, the device enters the accelerated program mode. See "Accelerated Program
Operatio ns" fo r more info rmatio n.
2. The secto r gro up protect and chip unpro tect functio ns may also be implemented via pro gramming equipment. See
the "Secto r Group Pro tection and Chip Unpro tection" section.
3. If WP#/ACC=VIL, the two o utermo st bo ot secto rs remain pro tected. If WP#/A CC=VIH, the two o utermost bo o t sector
protection depends on whether they were last pro tected o r unprotected using the method described in "Sector/Sector
Blo ck Protectio n and Unpro tectio n". If WP#/ACC=VHH, all sectors will be unpro tected.
4. DIN o r Do ut as required by co mmand sequence, data po lling, or sector protectio n algorithm.
5. Address are A20:A0 in wo rd mo de (BYTE#=VIH), A20:A-1 in b yte mo de (BYTE#=VIL).
T able 2. BUS OPERA TION--1
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KH29LV320C T/B
A20 A11 A8 A5
Operation CE# OE# WE# t o t o A 9 to A 6 t o A 1 A0 Q0 -Q 7 Q8-Q15
A12 A10 A7 A2
Read Silico n ID L L H X X VID X L X L L C2H X
Manufacturer Code
Read Silico n ID L L H X X VID X L X L H A7H 22h(word)
KH29LV320CT X (byte)
Read Silico n ID L L H X X VID X L X L H A8H 22h(word)
KH29LV320CB X (byte)
Secto r Pro tect L L H SA X VID X L X H L 01h(1), X
Verification or 00h
Security Sector L L H X X VID X L X H H 99h(2), X
Indicater Bit (Q7) o r 19h
BUS OPERA TION--2
Notes:
1.Code=00h means unprotected, o r code=01h pro tected.
2.Co de=99 means facto ry lo cked, o r co de=19h no t facto ry lo cked.
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KH29LV320C T/B
REQUIREMENTS FOR READING ARRAY DA T A
To read array data from the outputs, the system must
drive the CE# and OE# pins to VIL. CE# is the power
co ntrol and selects the device . OE# is the o utput co ntro l
and gates arra y data to the o utput pins . WE# should re-
main at VIH.
The internal state machine is set for reading arra y data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory co n-
tent occurs during the power transition. No co mmand is
necessary in this mode to obtain array data. Standard
micro processor read cycles that assert valid address on
the device address inputs produce valid data o n the de-
vice data outputs. The de vice remains enabled for read
access until the co mmand register co ntents are altered.
WRITE COMMANDS/COMMAND SEQUENCES
To program data to the device or erase secto rs of memory
, the system must driv e WE# and CE# to VIL, and OE#
to VIH.
An erase operation can erase one sector, multiple sec-
tors , o r the entire de vice . Tab le 1 indicates the address
space that each sector occupies. A "sector address"
co nsists o f the address bits required to uniquely select a
sector . Writing specific address and data commands or
sequences into the command register initiates device
operations. Table 3 defines the valid register command
sequences. Writing incorrect address and data values o r
writing them in the improper sequence resets the device
to reading array data. Section has details on erasing a
sector or the entire chip, o r suspending/resuming the erase
operation.
After the system writes the Automatic Select command
sequence, the device enters the Automatic Select mode.
The system can then read A uto matic Select co des from
the internal register (which is separate from the memory
array) on Q7-Q0. Standard read cycle timings apply in
this mode. Ref er to the Auto matic Select Mode and A u-
to matic Select Command Sequence sectio n for mo re in-
formation.
ICC2 in the DC Characteristics table represents the ac-
tive current specification for the write mode. The "AC
Characteristics" section contains timing specification table
and timing diagrams fo r write o perations.
ACCELERATED PROGRAM OPERA TION
The device offers accelerated pro gram operations through
the ACC function. If the system asserts VHH on WP#/
ACC pin, the device will provide the fast programming
time to user. This function is primarily intended to allow
f aster manuf acturing throughput during productio n. Re-
moving VHH fro m the WP#/ACC pin returns the device to
normal operation. Note that the WP#/ACC pin must not
be at VHH fo r o peratio ns o ther than accelerated pro gram-
ming, o r de vice damage ma y result.
ST ANDBY MODE
KH29LV320C T/B can be set into Standby mode with
two different approaches. One is using both CE# and
RESET# pins and the other one is using RESET pin only .
When using both pins of CE# and RESET#, a CMOS
Standby mode is achie ved with both pins held at VCC ±
0.3V. Under this conditio n, the current co nsumed is less
than 0.2uA (typ.). If both of the CE# and RESET# are
held at VIH, but not within the range of VCC ± 0.3V, the
de vice will still be in the standb y mode, but the standby
current will be larger. During Auto Algor ithm operation,
Vcc active current (ICC2) is required even CE# = "H"
until the o peratio n is co mpleted. The device can be read
with standard access time (tCE) from either of these
standby mo des.
When using only RESET#, a CMOS standby mode is
achieved with RESET# input held at Vss ± 0.3V, Under
this condition the current is consumed less than 1uA
(typ.). Once the RESET# pin is taken high, the device is
back to active without recovery delay.
In the standby mode the outputs are in the high imped-
ance state, independent o f the OE# input.
KH29LV320C T/B is capable to provide the Automatic
Standby Mode to restrain power consumption during read-
out of data. This mode can be used effectively with an
application requested low power consumption such as
handy terminals.
To active this mode, KH29LV320C T/B automatically
switch themselves to low power mode when KH29L V320C
T/B addresses remain stable during access time of
tACC+30ns. It is not necessary to control CE#, WE#,
and OE# o n the mode. Under the mo de, the current co n-
sumed is typically 0.2uA (CMOS level).
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KH29LV320C T/B
OUTPUT DISABLE
With the OE# input at a logic high level (VIH), output
fro m the devices are disabled. This will cause the o utput
pins to be in a high impedance state.
RESET# OPERA TION
The RESET# pin provides a hardware metho d of reset-
ting the device to reading array data. When the RESET#
pin is driven low for at least a period of tRP, the device
immediately terminates any operation in progress,
tristates all output pins, and ignores all read/write com-
mands for the duration o f the RESET# pulse. The device
also resets the internal state machine to reading array
data. The operation that was interrupted should be
reinitiated once the device is ready to accept another
co mmand sequence, to ensure data integrity
Current is reduced fo r the duration o f the RESET# pulse.
When RESET# is held at VSS±0.3V, the device draws
CMOS standby current (ICC4). If RESET# is held at VIL
but not within VSS±0.3V, the standby current will be
greater.
The RESET# pin may be tied to system reset circuitr y.
A system reset wo uld that also reset the Flash memo ry ,
enabling the system to read the boo t-up firm-ware fro m
the Flash memo ry .
If RESET# is asserted during a pro gram o r erase o pera-
tio n, the R Y/BY# pin remains a "0" (busy) until the inter-
nal reset o peratio n is co mplete, which requires a time o f
tREAD Y (during Embedded Algorithms). The system can
thus mo nitor R Y/BY# to determine whether the reset o p-
eration is complete . If RESET# is asserted when a pro-
gram or erase operatio n is no t e x ecuting (R Y/BY# pin is
"1"), the reset operation is completed within a time of
tREAD Y (no t during Embedded Algo rithms). The system
can read data tRH after the RESET# pin returns to VIH.
Refer to the AC Characteristics tables for RESET# pa-
rameters and to Figure 14 f o r the timing diagram.
SECTOR GROUP PROTECT OPERA TION
The KH29LV320C T/B features hardware sector group
protection. This feature will disable both program and
erase operations for these sector group protected. Sec-
to r pro tection can be implemented via two metho ds.
The primary metho d requires VID on the RESET# o nly.
This metho d can be implemented either in-system or via
pro gramming equipment. This method uses standard mi-
cro processo r bus cycle timing. Refer to Figure 13 f or tim-
ing diagram and Figure 14 illustrates the algorithm for the
sector group protection operatio n.
The alternate method intended only for programming
equipment, must fo rce VID o n address pin A9 and con-
trol pin OE#, (suggest VID = 12V) A6 = VIL and CE# =
VIL(see T able 2). Programming o f the pro tection circuitry
begins o n the falling edge o f the WE# pulse and is termi-
nated on the rising edge. Contact MXIC for details.
To verify pro gramming o f the protectio n circuitry , the pro-
gramming equipment must fo rce VID o n address pin A9 (
with CE# and OE# at VIL and WE# at VIH). When A1=1,
it will pro duce a logical "1" co de at device o utput Q0 for a
pro tected sector . Otherwise the device will produce 00H
f o r the unpro tected secto r . In this mo de, the addresses ,
except for A1, are don't care. Address locations with
A1= VIL are reserved to read manufacturer and device
codes.(Read Silicon ID)
It is also possible to determine if the group is protected
in the system by writing a Read Silicon ID command.
P erfo rming a read o peration with A1=VIH, it will produce
a lo gical "1" at Q0 f or the protected secto r.
CHIP UNPRO TECT OPERA TION
The KH29LV320C T/B also features the chip unpro tect
mode, so that all sectors are unprotected after chip
unprotect is completed to incorporate any changes in
the code. It is recommended to protect all sectors before
activating chip unprotect mode.
The primary metho d requires VID on the RESET# o nly.
This method can be implemented either in-system or via
programming equipment. This method uses standard
microprocessor bus cycle timing. Refer to Figure 13 for
timing diagram and Figure 14 illustrates the algorithm for
the sector group protection operation.
The alternate method intended only for programming
equipment, must fo rce VID o n address pin A9 and con-
trol pin OE#, (suggest VID = 12V) A6 = VIL and CE# =
VIL(see T able 2). Programming o f the pro tection circuitry
begins o n the falling edge o f the WE# pulse and is termi-
nated o n the rising edge. Co ntact MXIC f o r details.
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KH29LV320C T/B
It is also po ssible to determine if the chip is unpro tected
in the system by writing the Read Silicon ID command.
P erfo rming a read o peration with A1=VIH, it will pro duce
00H at data o utputs(Q0-Q7) fo r an unprotected secto r. It
is noted that all sectors are unprotected after the chip
unpro tect algo rithm is completed.
TEMPORARY SECTOR GROUP UNPROTECT OPERA-
TION
This feature allows tempo rary unpro tection o f previo usly
pro tected secto r to change data in-system. The Tempo-
rary Sector Unprotect mode is activated by setting the
RESET# pin to VID(11.5V -12.5V). During this mo de, fo r-
merly protected sectors can be programmed or erased
as un-protected secto r. Once VID is remove from the
RESET# pin, all the previously protected sectors are pro-
tected again.
WRITE PROTECT (WP#)
The write protect functio n provides a hardware method to
pro tect bo ot secto rs without using VID.
If the system asserts VIL on the WP#/ACC pin, the de-
vice disables pro gram and erase functions in the two "out-
ermost" 8 Kbyte boot sectors independently of whether
those sectors were protected or unprotected using the
metho d described in Secto r/Sector Gro up Protection and
Chip Unpro tection". The two o utermost 8 Kbyte boot sec-
to rs are the two sectors containing the lowest addresses
in a bottom-boot-configured device, or the two sectors
co ntaining the highest addresses in a top-boot-configured
device.
If the system asserts VIH on the WP#/A CC pin, the de-
vice re v e rts to whether the two outermo st 8K Byte boo t
secto rs were last set to be pro tected or unprotected. That
is, secto r pro tectio n or unpro tectio n fo r these two secto rs
depends on whether they w ere last protected or unpro-
tected using the method described in "Sector/Sector Group
Protection and Chip Unprotection".
Note that the WP#/ACC pin must not be left floating or
unconnected; inconsistent behavior of the device may
result.
AUTOMA TIC SELECT OPERA TION
Flash memories are intended for use in applications where
the lo cal CPU alters memo ry co ntents. As such, man u-
f acturer and device co des m ust be accessible while the
device resides in the target system. PROM program-
mers typically access signature codes by raising A9 to
a high voltage. How e ver , m ultiplexing high v o ltage onto
address lines is not generally desired system design prac-
tice.
KH29LV320C T/B pro vides hardw are method to access
the Automatic Select operatio n. This method requires VID
on A9 pin, VIL on CE#, OE#, A6, and A1 pins. When
applying VIL on A0 pin, the device will output MXIC's
manufacture code of C2H. When applying VIH o n A0 pin,
the device will output KH29LV320C T/B device code of
22A7h and 22A8h.
VERIFY SECTOR GROUP PROTECT ST A TUS OPERA-
TION
KH29LV320C T/B provides hardware method for sector
group protect status verify. This method requires VID on
A9 pin, VIH o n WE# and A1 pins , VIL o n CE#, OE#, A6,
and A0 pins, and sector address on A12 to A20 pins.
When the identified sector is protected, the device will
o utput 01H. When the identified secto r is no t protect, the
de vice will o utput 00H.
SECURITY SECTOR FLASH MEMOR Y REGION
The Security Sector (Security Sector) feature provides a
Flash memo ry region that enables permanent part iden-
tification through an Electronic Serial Number (ESN). The
Security Sector is 64 Kbytes (32 Kwords) in length, and
uses a Security Sector Indicator Bit (Q7) to indicate
whether or not the Security Sector is locked when shipped
from the factor y. This bit is per-manently set at the fac-
tory and cannot be changed, which prevents cloning of a
facto ry lo cked part. This ensures the security of the ESN
once the product is shipped to the field.
MXIC offers the device with the Security Sector either
factor y locked or customer lockable. The factory-locked
version is always protected when shipped from the fac-
tory, and has the Security on Silicon Sector (Security
Sector) Indicato r Bit permanently set to a "1". The cus-
to mer-lockable v ersion is shipped with the unpro tected,
allowing custo mers to utiliz e the that secto r in any man-
ner they cho o se. The customer-lo ckable v ersion has the
Security on Silico n Sector (Security Sector) Indicato r Bit
permanently set to a "0". Thus, the Security Secto r Indi-
cato r Bit prev ents customer-lockable de vices from being
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KH29LV320C T/B
used to replace de vices that are f actory lo c k ed.
The system accesses the Security Secto r through a com-
mand sequence (see "Enter Security Secto r/Exit Secu-
rity Secto r Command Sequence"). After the system has
written the Enter Security Secto r co mmand se-quence ,
it ma y read the Security Secto r by using the ad-dresses
normally o ccupied b y the bo o t sectors. This mo de of o p-
eratio n co ntinues until the system issues the Exit Secu-
rity Sector command sequence, o r until power is remo ved
from the device. On power-up, or following a hardware
reset, the device rever ts to sending commands to the
bo o t sectors.
Factory Locked: Security Sector Programmed and
Protected at the Factory
In a factory locked device, the Security Sector is pro-
tected when the device is shipped from the factory. The
Security Secto r cannot be modified in any w a y. The de-
vice is available preprogrammed with one of the follow-
ing:
A random, secure ESN o nly.
In devices that have an ESN, a Bottom Boot device will
have the 16-byte (8-word) ESN in the lowest address-
able memory area starting at 00000h and ending at
0000Fh (00007h). In the Top Boot device the starting
address of the ESN will be at the bottom of the lowest 8
Kbyte (4 Kword) boot sector starting at 3F0000h
(1F8000h) and ending at 3F000Fh (1F8007h).
Customer Lockable: Security Sector NOT Pro-
grammed or Protected at the Factory
If the security feature is not required, the Security Sec-
tor can be treated as an additional Flash memory space,
expanding the size of the available Flash array by 64
Kbytes (32 Kwords). The Security Sector can be read,
pro gr ammed, and erased as o ften as required. The Se-
curity Sector area can be protected using one of the
following procedures:
Write the three-cycle Enter Security Region command
sequence, and then follow the in-system sector group
protect algorithm as shown in Figure 14, except that
RESET# ma y be at either VIH o r VID. This allows in-sys-
tem protection o f the without raising an y de vice pin to a
high v oltage. No te that this method is only applicable to
the Security Secto r .
Write the three-cycle Enter Secur ity Region command
sequence, and then use the alternate method of sector
protection described in the "Sector/Sector Block Protec-
tion and Unprotection section.
Once the Security Sector is locked and verified, the sys-
tem must write the Exit Security Sector Region com-
mand sequence to return to reading and writing the re-
mainder o f the arr a y.
The Security Sector protection must be used with cau-
tion since, once protected, there is no procedure avail-
able for unprotecting the Security Sector area and none
of the bits in the Security Sector memory space can be
modified in any way.
DA T A PROTECTION
The KH29LV320C T/B is designed to offer protection
against accidental erasure or programming caused by
spurious system level signals that may exist during power
transition. During power up the device automatically re-
sets the state machine in the Read mode. In addition,
with its control register architecture, alteration of the
memory contents only occurs after successful comple-
tion of specific command sequences. The device also
inco rpo rates several features to prevent inadvertent write
cycles resulting from VCC power-up and power-down tran-
sition or system no ise .
LOW VCC WRITE INHIBIT
When VCC is less than VLKO the device does not ac-
cept any write cycles. This protects data during VCC
pow er-up and power-do wn. The command register and
all internal program/erase circuits are disabled, and the
de vice resets. Subsequent writes are igno red until VCC
is greater than VLKO. The system must pro vide the proper
signals to the control pins to prevent unintentional write
when VCC is greater than VLK O.
WRITE PULSE "GLITCH" PRO TECTION
Noise pulses of less than 5ns (typical) on OE#, CE# or
WE# will not initiate a write cycle.
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KH29LV320C T/B
LOGICAL INHIBIT
Writing is inhibited by holding any one of OE# = VIL, CE#
= VIH or WE# = VIH. To initiate a write cycle CE# and
WE# must be a logical zero while OE# is a lo gical one.
POWER-UP SEQUENCE
The KH29LV320C T/B powers up in the Read o nly mode.
In addition, the memory contents may only be altered
after successful co mpletio n o f the predefined co mmand
sequences.
POWER-UP WRITE INHIBIT
If WE#=CE#=VIL and OE#=VIH during power up, the
device do es no t accept co mmands o n the rising edge o f
WE#. The internal state machine is automatically reset
to the read mo de on power-up .
PO WER SUPPLY DECOUPLING
In order to reduce power switching effect, each device
should have a 0.1uF ceramic capacitor connected be-
tween its VCC and GND .
SOFTW ARE COMMAND DEFINITIONS
Device operations are selected by writing specific ad-
dress and data sequences into the command register.
Writing incorrect address and data values or writing them
in the improper sequence will reset the device to the
read mo de . Table 3 defines the v alid register co mmand
sequences. Note that the Erase Suspend (B0H) and
Erase Resume (30H) commands are valid only while the
Sector Erase operation is in progress. Either of the two
reset command sequences will reset the device (when
applicable).
All addresses are latched on the falling edge of WE# o r
CE#, whichever happens later. All data are latched on
rising edge of WE# o r CE#, whichever happens first.
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KH29LV320C T/B
First Bus Second Bus Third Bus Fourth Bus Fifth Bus Sixth Bus
Command Bus Cycle Cycle Cycle Cycle Cycle Cycle
Cycles Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read(Note 5) 1 RA RD
Reset(Note 4) 1 XXX F0
Automatic Select(Note 5)
Manufacturer ID Word 4 555 AA 2AA 55 555 90 X00 C2H
Byte 4 AAA AA 555 55 AAA 90 X00 C2H
Device ID Word 4 555 AA 2AA 55 555 90 X01 ID
Byte 4 AAA AA 555 55 AAA 90 X02
Security Sector Factory Word 4 555 AA 2AA 55 555 90 X03 99/19
Protect Verify (Note 6) Byte 4 AAA AA 555 55 AAA 90 X06
Sector Protect Verify Word 4 555 AA 2AA 55 555 90 (SA)X02 00/01
(Note 7) Byte 4 AAA AA 555 55 AAA 90 (SA)X04
Enter Security Sector Word 3 5 5 5 AA 2A A 5 5 555 88
Region Byte 3 AAA AA 555 55 AAA 88
Exit Security Sector Word 4 5 55 AA 2 A A 55 555 90 XXX 00
Byte 4 AAA AA 555 55 AAA 90 XXX 00
Program Word 4 555 AA 2AA 55 555 A0 PA PD
Byte 4 AAA AA 555 55 AAA A0 PA PD
Chip Erase Word 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10
Byte 6 AAA AA 555 55 AAA 80 AAA AA 555 55 AAA 10
Sector Erase Word 6 5 55 AA 2A A 5 5 5 55 8 0 5 5 5 AA 2A A 5 5 SA 3 0
Byte 6 AAA AA 555 55 AAA 80 AAA AA 555 55 SA 30
CFI Query (Note 8) Word 1 55 98
Byte 1 AA 98
Erase Suspend(Note 9) 1 SA B0
Erase Resume(Note 10) 1 SA 30
T ABLE 3. KH29L V320C T/B COMMAND DEFINITIONS
Legend:
X=Don't care
RA=Address of the memory location to be read.
RD=Data read from location RA dur ing read operation.
PA=Address of the memor y location to be programmed.
Addresses are latched on the falling edge of the WE# or CE#
pulse.
PD=Data to be pro grammed at location PA. Data is latched o n
the rising edge of WE# or CE# pulse.
SA=Address of the sector to be erased or verified. Address
bits A20-A12 uniquely select any sector.
ID=22A7h(Top), 22A8h(Bottom)
Notes:
1. See Table 1 for descriptions of bus operations.
2. All values are in hexadecimal.
3. Except when reading array or Automatic Select data, all bus cycles are write operation.
4. The Reset command is required to return to the read mode when the device is in the Automatic Select mode or if Q5 goes
high.
5. The four th cycle of the Automatic Select command sequence is a read cycle.
6. The data is 99h for factory locked and 19h for not factor y locked.
7. The data is 00h for an unprotected sector/sector block and 01h for a protected sector/sector block. In the third cycle of the
command sequence, address bit A20=0 to verify sectors 0~31, A20=1 to verify sectors 32~70 for Top Boot device.
8. Command is valid when device is ready to read array data or when device is in Automatic Select mode.
9. The system may read and program functions in non-erasing secto r s , or enter the Automatic Select mode, when in the erase
Suspend mode. The Erase Suspend command is valid only during a sector erase operation.
10.The Erase Resume command is valid only during the Erase Suspend mode.
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KH29LV320C T/B
READING ARRAY DA T A
The de vice is auto matically set to reading array data af-
ter device power-up. No commands are required to re-
trieve data. The device is also ready to read arr ay data
after completing an Automatic Program or Automatic
Erase algo rithm.
After the device accepts an Erase Suspend command,
the device enters the Erase Suspend mode. The sys-
tem can read array data using the standard read tim-
ings, except that if it reads at an address within erase-
suspended sectors, the device outputs status data. After
completing a programming operation in the Erase
Suspend mode, the system may once again read array
data with the same exception. See Erase Suspend/Erase
Resume Commands for more information on this mode.
The system must issue the reset command to re-en-
able the device for reading array data if Q5 goes high
during an active program or erase operation, or while in
the Automatic Select mode. See the "Reset Command"
section, next.
RESET COMMAND
Writing the reset co mmand to the de vice resets the de-
vice to reading array data. Address bits are don't care fo r
this co mmand.
The reset command may be written between the se-
quence cycles in an erase command sequence before
erasing begins. This resets the device to reading array
data. Once erasure begins, however, the device igno res
reset co mmands until the o peratio n is co mplete.
The reset command may be written between the se-
quence cycles in a pro gram co mmand sequence befo re
programming begins. This resets the device to reading
array data (also applies to programming in Erase Sus-
pend mode). Once programming begins, however, the
device ignores reset commands until the operation is
complete.
The reset command may be written between the se-
quence cycles in an Automatic Select command se-
quence. Once in the Automatic Select mode, the reset
co mmand must be written to return to reading array data
(also applies to Automatic Select during Erase Suspend).
If Q5 go es high during a program o r erase operation, writ-
ing the reset co mmand returns the device to reading ar-
ray data (also applies during Erase Suspend).
AUTOMA TIC SELECT COMMAND SEQUENCE
The Automatic Select co mmand sequence allows the ho st
system to access the manufacturer and device codes,
and determine whether o r not a sector is pro-tected. Tab le
2 shows the address and data requirements.
This method is an alternative to that shown in Table 3,
which is intended for EPROM programmers and requires
VID on address bit A9.
The Automatic Select command sequence is initiated
by writ-ing two unlock cycles, followed by the Automatic
Select command. The device then enters the Automatic
Select mode, and the system may read at any address
any number of times, without initiating another command
sequence. A read cycle at address XX00h retrieves the
manufacturer code. A read cycle at address XX01h in
word mode (or xx02h in byte mode) returns the device
code. A read cycle containing a sector address (SA) and
the address 02h on A7-A0 in word mode (or the address
04h on A6-A-1 in byte mode) returns 01h if that sector is
protected, or 00h if it is unprotected. Refer to Table 1 for
valid sector addresses.
The system must write the reset command to exit the
Automatic Select mode and return to reading array data.
ENTER SECURITY SECTOR & EXIT SECURITY SEC-
TOR COMMAND SEQUENCE
The Security Sector provides a secured area which con-
tains a random, sixteen-byte electronic serial
number.(ESN)
The system can access the Security Sector area by is-
suing the three-cycle "Enter Security Sector command
sequence. The device continues to access the security
section area until the system issues the four-cycle Exit
Security Sector command sequence. The Exit Security
Sector command sequence returns the device to normal
operation.
BYTE/WORD PROGRAM COMMAND SEQUENCE
The device programs one byte/word of data for each
program operation. The command sequence requires four
bus cycles, and is initiated by writing two unlock write
cycles, followed by the program set-up command. The
program address and data are written next, which in turn
initiate the Embedded Program algorithm. The system is
not required to provide further controls or timings. The
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KH29LV320C T/B
device automatically generates the program pulses and
verifies the programmed cell margin. Table 3 shows the
address and data requirements f or the byte/word program
command sequence.
When the Embedded Program algorithm is complete, the
device then returns to reading array data and addresses
are no longer latched. The system can determine the
status of the program operation by using Q7, Q6, or RY/
BY#. See "Write Operatio n Status" fo r info rmatio n on these
status bits.
Any commands written to the device during the Em-
bedded Program Algorithm are ignored. Note that a
hardware reset immediately terminates the programming
operation. The Byte/Word Program command sequence
should be reinitiated once the device has reset to reading
array data, to ensure data integrity.
Programming is allowed in any sequence and across
sector boundaries. A bit cannot be programmed from a
"0" back to a "1". Attempting to do so may cause the
device to set Q5 to "1", or cause the Data# Polling
Pins A0 A1 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Code (Hex)
Manufacture code VIL VIL 1 1 0 0 0 0 1 0 C2H
Device code for KH29LV320CT VIH VIL 1 0 1 0 0 1 1 1 22A7H
Device code for KH29LV320CB VIH VIL 1 0 1 0 1 0 0 0 22A8H
TABLE 4. SILICON ID CODE
AUTOMATIC CHIP/SECTOR ERASE COMMAND
The device does not require the system to preprogram
prio r to erase. The Automatic Erase algo rithm auto mati-
cally preprograms and verifies the entire memory for an
all zero data pattern prior to electrical erase. The system
is not required to provide any controls or timings during
these operations. Table 3 shows the address and data
requirements for the chip erase command sequence.
Any commands written to the chip during the Automatic
Erase algorithm are ignored. Note that a hard-ware reset
during the chip erase operation immediately terminates
the operation. The Chip Erase co mmand sequence should
algorithm to indicate the operation was successful.
However, a succeeding read will show that the data is
still "0". Only erase operations can convert a "0" to a
"1".
SETUP AUTOMA TIC CHIP/SECT OR ERASE
Chip erase is a six-bus cycle operation. There are two
"unlock" write cycles. These are f ollowed b y writing the
"set-up" co mmand 80H. Two mo re "unlo ck" write cycles
are then followed by the chip erase command 10H, or
the sector erase command 30H.
The KH29LV320C T/B contains a Silicon-ID-Read opera-
tion to supplement traditional PROM pro gramming meth-
o dolo gy . The operation is initiated by writing the read sili-
co n ID co mmand sequence into the co mmand register .
Following the command write, a read cycle with
A1=VIL,A0=VIL retrieves the manufacturer code of C2H.
A read cycle with A1=VIL, A0=VIH returns the device
co de of A7H/A8H fo r KH29L V320C T/B.
be reinitiated once the device has returned to reading
arra y data, to ensure data integrity.
The system can determine the status of the erase op-
eratio n by using Q7, Q6, Q2, or R Y/BY#. See "Write Op-
eratio n Status" fo r info rmatio n o n these status bits. When
the Automatic Erase algorithm is complete, the device
returns to reading array data and addresses are no longer
latched.
Figure 5 illustrates the algorithm for the erase opera-tion.
See the Erase/Program Operations tables in "AC Char-
acteristics" for parameters, and to Figure 4 for timing
diagrams.
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KH29LV320C T/B
SECTOR ERASE COMMANDS
The device does not require the system to entirely
pre-program prior to executing the Automatic Set-up
Sector Erase command and Automatic Sector Erase
command. Upon executing the Automatic Sector
Erase command, the device will automatically
program and verify the sector(s) memory for an all-
zero data pattern. The system is not required to
provide any control or timing during these operations.
When the sector(s) is automatically verified to
contain an all-zero pattern, a self-timed sector erase
and verify begin. The erase and verify operations are
complete when the data on Q7 is "1" and the data on
Q6 stops toggling for two consecutive read cycles, at
which time the device returns to the Read mode. The
system is not required to provide any control or timing
during these operations.
When using the Automatic Sector Erase algorithm,
note that the erase automatically terminates when
adequate erase margin has been achieved for the
memory array (no erase verification command is
required). Sector erase is a six-bus cycle operation.
There are two "unlock" write cycles. These are
followed by writing the set-up command 80H. Two
more "unlock" write cycles are then followed by the
sector erase command 30H. The sector address is
latched on the falling edge of WE# or CE#, whichever
happens later , while the command(data) is latched on
the rising edge of WE# or CE#, whichever happens
first. Sector addresses selected are loaded into
internal register on the sixth falling edge of WE# or
CE#, whichever happens later. Each successive
sector load cycle started by the falling edge of WE#
or CE#, whichever happens later must begin within
50us from the rising edge of the preceding WE# or
CE#, whichever happens first. Otherwise, the loading
period ends and internal auto sector erase cycle
starts. (Monitor Q3 to determine if the sector erase
timer window is still open, see section Q3, Sector
Erase Timer.) Any command other than Sector
Erase(30H) or Erase Suspend(B0H) during the time-
out period resets the device to read mode.
ERASE SUSPEND
This command only has meaning while the state ma-
chine is executing Automatic Sector Erase operation,
and therefore will only be responded dur ing Automatic
Secto r Erase operatio n. When the Erase Suspend co m-
mand is issued during the sector erase operation, the
de vice requires a maximum 20us to suspend the secto r
erase operation. However, When the Erase Suspend com-
mand is written during the secto r erase time-o ut, the de-
vice immediately terminates the time-out perio d and sus-
pends the erase o peratio n. After this co mmand has been
executed, the command register will initiate erase sus-
pend mo de. The state machine will return to read mo de
automatically after suspend is ready. At this time , state
machine o nly allows the co mmand register to respo nd to
the Erase Resume, program data to, or read data from
any secto r no t selected fo r erasure. The system can use
Q7, or Q6 and Q2 together, to deter mine if a sector is
actively erasing or is erase-suspended.
The system can determine the status of the program
operation using the Q7 or Q6 status bits, just as in the
standard program operation. After an erase-suspend pro-
gram operation is complete, the system can once again
read array data within no n-suspended blo cks.
ERASE RESUME
This co mmand will cause the command register to clear
the suspend state and return back to Sector Erase mode
but only if an Erase Suspend command was previously
issued. Erase Resume will not have any effect in all
other conditions. Another Erase Suspend command can
be written after the chip has resumed erasing.
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KH29LV320C T/B
T able 5. Write Operation Status
Notes:
1. P erf orming successive read operatio ns from the erase-suspended secto r will cause Q2 to toggle.
2. Performing successive read operations from any address will cause Q6 to toggle.
3. Reading the byte/word address being programmed while in the erase-suspend program mode will indicate logic "1"
at the Q2 bit.
How ever, successive reads from the erase-suspended secto r will cause Q2 to toggle.
WRITE OPERATION STATUS
The device provides several bits to deter mine the sta-
tus of a write operation: Q2, Q3, Q5, Q6, Q7, and RY /
BY#. Table 5 and the fo llowing subsectio ns describe the
functio ns of these bits. Q7, RY/BY#, and Q6 each o ffer a
metho d f o r determining whether a pro gram o r er ase o p-
eration is complete or in progress. These three bits are
discussed first.
Status Q7 Q6 Q5 Q3 Q2 RY/
Note1 Note2 BY#
Byte/Word Program in Auto Program Algorithm Q7 # Toggle 0 N/A No 0
Toggle
Auto Erase Algorithm 0 Toggle 0 1 Toggle 0
Erase Suspend Read 1 No 0 N/A Toggle 1
(Erase Suspended Sector) Toggle
In Progress Erase Suspended Mode Erase Suspend Read Data Data Data Data Data 1
(Non-Erase Suspended Sector)
Erase Suspend Program Q7# Toggle 0 N/A N/A 0
Byte/Word Program in Auto Program Algorithm Q7 # Toggle 1 N/A No 0
Toggle
Exceeded
Time Limits Auto Erase Algorithm 0 Toggle 1 1 Toggle 0
Erase Suspend Program Q7# Toggle 1 N/A N/A 0
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KH29LV320C T/B
Q7: Data# P olling
The Data# Polling bit, Q7, indicates to the host system
whether an Automatic Algorithm is in progress or com-
pleted, or whether the device is in Erase Suspend. Data#
P olling is valid after the rising edge o f the final WE# pulse
in the program or erase command sequence.
During the Automatic Program algorithm, the device out-
puts on Q7 the complement of the datum programmed
to Q7. This Q7 status also applies to programming dur-
ing Erase Suspend. When the Auto matic Pro gram algo-
rithm is complete, the device outputs the datum pro-
gr ammed to Q7. The system must provide the pro g ram
address to read valid status information on Q7. If a pro-
gram address falls within a pro tected secto r , Data# Po ll-
ing on Q7 is activ e for appro ximately 1 us , then the de-
vice returns to reading array data.
During the Auto matic Erase algorithm, Data# Polling pro-
duces a "0" o n Q7. When the Auto matic Erase algo rithm
is complete, or if the device enters the Erase Suspend
mo de, Data# Po lling produces a "1" on Q7. This is analo-
gous to the complement/true datum out-put described
for the Automatic Program algorithm: the erase function
changes all the bits in a sector to "1" prior to this, the
device outputs the "complement," or "0". The system must
pro vide an address within any o f the sectors selected fo r
erasure to read v alid status info rmation o n Q7.
After an erase command sequence is written, if all sec-
to rs selected f o r erasing are pro tected, Data# P olling o n
Q7 is active for approximately 100 us, then the device
returns to reading array data. If not all selected sectors
are protected, the Automatic Erase algorithm erases the
unprotected sectors, and ignores the selected sectors
that are protected.
When the system detects Q7 has changed from the
complement to true data, it can read valid data at Q7-Q0
on the following read cycles. This is because Q7 may
change asynchronously with Q0-Q6 while Output Enable
(OE#) is asserted low.
Q6:Toggle BIT I
Toggle Bit I on Q6 indicates whether an Automatic Pro-
gram or Erase algorithm is in progress or complete, or
whether the device has entered the Erase Suspend mode.
Toggle Bit I may be read at any address, and is valid
after the rising edge o f the final WE# or CE#, whichev er
happens first pulse in the command sequence (prior to
the program or erase operation), and during the sector
time-out.
During an Automatic Program or Erase algorithm opera-
tion, successive read cycles to any address cause Q6
to toggle. The system may use either OE# or CE# to
co ntro l the read cycles. When the operatio n is co mplete,
Q6 sto ps to ggling.
After an erase command sequence is written, if all sec-
tors selected for erasing are protected, Q6 toggles for
100us and returns to reading array data. If not all se-
lected sectors are protected, the Automatic Erase algo-
rithm erases the unprotected sectors, and ignores the
selected sectors that are protected.
The system can use Q6 and Q2 together to determine
whether a sector is actively erasing or is erase suspended.
When the device is actively erasing (that is, the Auto-
matic Erase algo rithm is in progress), Q6 to ggling. When
the device enters the Erase Suspend mode, Q6 stops
toggling. Howev er, the system must also use Q2 to de-
termine which sectors are erasing or erase-suspended.
Alternatively, the system can use Q7.
If a program address falls within a protected sector, Q6
toggles for approximately 2us after the program com-
mand sequence is written, then returns to reading array
data.
Q6 also toggles during the erase-suspend-program mode,
and stops toggling once the Automatic Program algo-
rithm is complete.
Table 5 shows the outputs for Toggle Bit I on Q6.
Q2:Toggle Bit II
The "To ggle Bit II" o n Q2, when used with Q6, indicates
whether a par ticular sector is actively erasing (that is,
the Automatic Erase algorithm is in process), or whether
that sector is erase-suspended. Toggle Bit II is valid
after the rising edge o f the final WE# o r CE#, whiche ver
happens first pulse in the command sequence.
Q2 toggles when the system reads at addresses within
those sectors that have been selected for erasure. (The
system may use either OE# or CE# to control the read
cycles.) But Q2 canno t distinguish whether the secto r is
actively erasing o r is erase-suspended. Q6, by co mpari-
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KH29LV320C T/B
so n, indicates whether the device is actively er asing, o r
is in Erase Suspend, but cannot distinguish which sec-
to rs are selected fo r er asure. Thus, both status bits are
required for sectors and mo de info rmation. Refer to Table
5 to co mpare o utputs f o r Q2 and Q6.
Reading T oggle Bits Q6/ Q2
Whenev er the system initially begins reading toggle bit
status, it must read Q7-Q0 at least twice in a row to
determine whether a toggle bit is to ggling. Typically , the
system would note and store the value of the toggle bit
after the first read. After the second read, the system
would compare the new value of the toggle bit with the
first. If the toggle bit is not toggling, the device has
co mpleted the program o r erase operatio n. The system
can read array data on Q7-Q0 on the following read cycle.
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the sys-
tem also should note whether the value of Q5 is high
(see the section on Q5). If it is, the system should then
determine again whether the toggle bit is toggling, since
the toggle bit may have stopped toggling just as Q5 went
high. If the toggle bit is no longer toggling, the device
has successfully completed the program or erase opera-
tion. If it is still toggling, the device did not complete the
operation successfully, and the system must write the
reset command to return to reading array data.
The remaining scenario is that system initially determines
that the toggle bit is toggling and Q5 has not gone high.
The system may continue to monitor the toggle bit and
Q5 through successive read cycles, determining the sta-
tus as described in the previo us paragraph. Alternatively ,
it may choose to perform other system tasks. In this
case, the system must start at the beginning of the al-
gorithm when it returns to determine the status of the
operation.
Q5:Program/Erase Timing
Q5 will indicate if the program o r erase time has exceeded
the specified limits(internal pulse count). Under these
co nditio ns Q5 will pro duce a "1". This time-o ut conditio n
indicates that the program or erase cycle was not suc-
cessfully completed. Data# Polling and Toggle Bit are
the o nly operating functio ns o f the device under this co n-
dition.
If this time-out condition occurs during sector erase op-
eration, it specifies that a particular secto r is bad and it
may not be reused. Howe ver , other secto rs are still func-
tional and may be used f or the program o r er ase opera-
tio n. The device must be reset to use o ther sectors. Write
the Reset command sequence to the device, and then
execute pro gram o r erase co mmand sequence. This al-
lows the system to co ntin ue to use the o ther active sec-
tors in the device.
If this time-out condition occurs during the chip erase
operation, it specifies that the entire chip is bad or com-
bination of sectors are bad.
If this time-out condition occurs during the byte/word pro-
gramming operation, it specifies that the entire sector
containing that byte/word is bad and this sector maynot
be reused, (other sectors are still functional and can be
reused).
The time-out condition may also appear if a user tries to
program a non blank location without erasing. In this
case the device locks out and never completes the Au-
tomatic Algorithm operation. Hence, the system never
reads a valid data on Q7 bit and Q6 never stops toggling.
Once the Device has exceeded timing limits, the Q5 bit
will indicate a "1". Please note that this is not a device
failure condition since the device was incorrectly used.
The Q5 failure condition may appear if the system tries
to program a "1" to a location that is previously pro-
grammed to "0". Only an erase operation can change a
"0" back to a "1". Under this condition, the device halts
the operation, and when the operation has exceeded the
timing limits, Q5 produces a "1".
Q3:Sector Erase Timer
After the co mpletio n o f the initial secto r erase co mmand
sequence, the sector erase time-out will begin. Q3 will
remain low until the time-out is co mplete. Data# P o lling
and T o ggle Bit are valid after the initial secto r erase com-
mand sequence.
If Data# Po lling or the Toggle Bit indicates the device has
been written with a valid erase command, Q3 may be
used to determine if the sector erase timer window is
still o pen. If Q3 is high ("1") the internally contro lled erase
cycle has begun; attempts to write subsequent commands
to the de vice will be ignored until the erase operatio n is
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KH29LV320C T/B
co mpleted as indicated by Data# P o lling o r Toggle Bit. If
Q3 is low ("0"), the device will accept additional sector
erase co mmands. To insure the command has been ac-
cepted, the system software should check the status of
Q3 prio r to and f o llowing each subsequent sector erase
co mmand. If Q3 w ere high o n the seco nd status check,
the co mmand ma y no t hav e been accepted.
If the time between additional erase commands from the
system can be less than 50us, the system need not to
mo nitor Q3.
RY/BY#:READY/BUSY# OUTPUT
The RY/BY# is a dedicated, open-drain output pin that
indicates whether an Embedded Algorithm is in progress
or complete. The RY/BY# status is valid after the rising
edge o f the final WE# pulse in the co mmand sequence.
Since RY/BY# is an o pen-dr ain o utput, se v eral RY/BY#
pins can be tied to gether in parallel with a pull-up resistor
to VCC .
If the output is low (Busy), the device is actively erasing
or programming. (This includes programming in the Erase
Suspend mode.) If the output is high (Ready), the device
is ready to read array data (includ-ing during the Erase
Suspend mode), or is in the standby mode.
QUERY COMMAND AND COMMON FLASH INTER-
F ACE (CFI) MODE
KH29L V320C T/B is capable o f operating in the CFI mode.
This mode all the host system to deter mine the manu-
facturer o f the device such as o perating parameters and
co nfiguratio n. Two commands are required in CFI mo de.
Query command of CFI mode is placed first, then the
Reset co mmand exits CFI mo de. These are described in
Table 3.
The single cycle Query command is valid only when the
device is in the Read mode, including Erase Suspend,
Standby mode, and Automatic Select mo de; howe v er , it
is ignored otherwise.
The Reset command exits from the CFI mode to the
Read mode, or Erase Suspend mode, or Automatic Se-
lect mo de. The command is valid o nly when the device is
in the CFI mo d e.
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KH29LV320C T/B
T able 6-1. CFI mode: Identification Data Values
(All values in these tables are in hexadecimal)
Description Address (h) Address (h) Data (h)
(Word Mode) (Byte Mode)
Query-unique ASCII string "QRY" 1 0 2 0 0051
11 22 0052
12 24 0059
Primary vendor command set and control interface ID code 1 3 2 6 0002
14 28 0000
Address for primary algorithm extended query table 1 5 2A 0040
16 2C 0000
Alternate vendor command set and control interface ID code (none) 1 7 2E 0000
18 30 0000
Address for secondary algorithm extended query table (none) 1 9 32 0000
1A 34 0000
T able 6-2. CFI Mode: System Interface Data V alues
Description Address (h) Address (h) Data (h)
(Word Mode) (Byte Mode)
VCC supply, minimum (2.7V) 1B 3 6 0027
VCC supply, maximum (3.6V) 1 C 3 8 0036
VPP supply, minimum (none) 1 D 3A 0000
VPP supply, maximum (none) 1E 3C 0000
Typical timeout for single word/byte write (2N us) 1F 3E 0004
Typical timeout for maximum size buffer write (2N us) (not supported) 2 0 4 0 0000
Typical timeout for individual sector erase (2N ms) 2 1 4 2 000A
Typical timeout for full chip erase (2N ms) 2 2 44 0000
Maximum timeout for single word/byte write times (2N X Typ) 23 4 6 0005
Maximum timeout for maximum size buffer write times (2N X Typ) 24 4 8 0000
Maximum timeout for individual sector erase times (2N X Typ) 2 5 4 A 0004
Maximum timeout for full chip erase times (not supported) 2 6 4C 0000
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T able 6-3. CFI Mode: Device Geometry Data V alues
Description Address (h) Address (h) Data (h)
(Word Mode) (Byte Mode)
Device size (2N bytes) 27 4E 0016
Flash device interface code (02=asynchronous x8/x16) 2 8 5 0 0002
29 52 0000
Maximum number of bytes in multi-byte write (not supported) 2A 5 4 0000
2B 56 0000
Number of erase sector regions 2 C 5 8 0002
Erase Sector Region 1 Information 2 D 5A 0007
[2E,2D] = # of same-size sectors in region 1-1 2E 5C 0000
[30, 2F] = sector size in multiples of 256-bytes 2F 5E 0020
30 60 0000
Erase Sector Region 2 Information 3 1 6 2 003E
32 64 0000
33 66 0000
34 68 0001
Erase Sector Region 3 Information 3 5 6A 0000
36 6C 0000
37 6E 0000
38 70 0000
Erase Sector Region 4 Information 3 9 7 2 0000
3A 74 0000
3B 76 0000
3C 78 0000
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T able 6-4. CFI Mode: Primary V endor-Specific Extended Query Data V alues
Description Address (h) Address (h) Data (h)
(Word Mode) (Byte Mode)
Query-unique ASCII string "PRI" 4 0 8 0 0050
41 82 0052
42 84 0049
Major version number, ASCII 4 3 8 6 0031
Minor version number, ASCII 4 4 8 8 0031
Address sensitive unlock (0=required, 1= not required) 4 5 8A 0000
Erase suspend (2= to read and write) 4 6 8 C 0002
Sector protect (N= # of sectors/group) 4 7 8E 0004
Temporary sector unprotect (1=supported) 48 90 0001
Sector protect/Chip unprotect scheme 49 92 0004
Simultaneous R/W operation (0=not supported) 4A 94 0000
Burst mode type (0=not supported) 4B 9 6 0000
Page mode type (0=not supported) 4 C 98 0000
ACC (Acceleration) Supply Minimum 4D 9A 00B5
(0=not supported, D7-D4:Volt, D3-D0:100mV
ACC (Acceleration) Supply Maximum 4E 9 C 00C5
(0=not supported, D7-D4:Volt, D3-D0:100mV
Top/Bottom Boot Sector Flag 4 F 9E 000X
02h=Bottom Boot Device, 03h=Top Boot Device
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ABSOLUTE MAXIMUM RATINGS
Storage T emperature
Plastic Packages . . . . . . . . . . . . . ..... -65oC to +150oC
Ambient T emperature
with Power Applied. . . . . . . . . . . . . .... -65oC to +125oC
Vo ltage with Respect to Gro und
VCC (Note 1) . . . . . . . . . . . . . . . . . -0.5 V to +4.0 V
A9, OE#, and
RESET# (Note 2) . . . . . . . . . . . ....-0.5 V to +12.5 V
All other pins (Note 1) . . . . . . . -0.5 V to VCC +0.5 V
Output Short Circuit Current (Note 3) . . . . . . 200 mA
Notes:
1. Minimum DC v oltage o n input or I/O pins is -0.5 V.
During voltage transitions, input or I/O pins may over-
shoot VSS to -2.0 V for periods of up to 20ns. Maxi-
mum DC voltage on input or I/O pins is VCC +0.5 V.
During voltage transitions, input or I/O pins may over-
shoot to VCC +2.0 V for periods up to 20 ns.
2. Minimum DC input v o ltage o n pins A9, OE#, and RE-
SET# is -0.5 V. Dur ing voltage transitions, A9, OE#,
and RESET# may o versho o t VSS to -2.0 V fo r perio ds
of up to 20 ns. Maximum DC input voltage on pin A9
is +12.5 V which may overshoo t to 14.0 V for perio ds
up to 20 ns.
3. No more than o ne output may be sho rted to ground at
a time. Duration of the short circuit should not be
greater than one second.
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device at these or any other conditions above those in-
dicated in the operational sections of this data sheet is
not implied. Exposure of the device to absolute maxi-
mum rating conditions for extended periods may affect
device reliability.
OPERA TING RATINGS
Commercial (C) Devices
Ambient Temperature (TA ). . . . . . . . . . . . 0 °C to +70°C
Industrial (I) Devices
Ambient Temperature (TA ). . . . . . . . . . -4 0°C to +85°C
VCC Supply Voltages
VCC for full voltage range. . . . . . . . . . . +2.7 V to 3.6 V
Operating ranges define tho se limits between which the
functio nality o f the de vice is guaranteed.
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KH29LV320C T/B
Notes:
1. On the WP#/ACC pin only, the maximum input load current when WP#/ACC = VIL is ± 5.0uA / VIH is ± 3.0uA.
2. Maxim um ICC specificatio ns are tested with VCC = VCC max.
3. The ICC current listed is typically is less than 2 mA/MHz, with OE# at VIH. Typical specifications are for VCC = 3.0V.
4. ICC active while Embedded Erase o r Embedded Pro gram is in pro gress.
5. A uto matic sleep mo de enab les the low power mode when addresses remain stable f o r tACC + 30 ns. Typical sleep
mo de current is 200 nA.
6. Not 100% tested.
DC CHARACTERISTICS VCC=2.7V~3.6V
Para- Description T est Conditions T A=0°°
°°
°C to 70°°
°°
°C T A=-40°°
°°
°C to 85°°
°°
°C
meter Min Typ Max Min Typ Max Unit
ILI Input Load Current VIN = VSS to VCC, ±1.0 ±1.0 uA
(Note 1) VCC = VCC max
ILIT A9 Input Load Current VCC = VCC max, 3 5 4 5 uA
A9=12.5V
ILO Output Leakage Current VOUT = VSS to VCC , ±1.0 ±1.0 uA
VCC = VCC max
ICC1 VCC Active Read Current CE#=VIL, 5 MHz 1 0 1 6 1 0 1 6 mA
(No tes 2, 3) OE#=VIH 1 MHz 2 4 2 4 mA
ICC2 VCC Active Write Current CE#=VIL , OE# = VIH, 15 30 15 30 mA
(No tes 2, 4, 6) WE#=VIL
ICC3 VCC Standby Current CE#, RESET#, 0.2 15 0.2 1 5 uA
(No te 2) WP#/ACC = VCC±0.3V
ICC4 VCC Reset Current (No te 2) RESET# = VSS ± 0.3V, 0.2 15 0.2 15 uA
WP#/ACC= VCC ± 0.3V
ICC5 Automatic Sleep Mode VIH = VCC ± 0.3V; 0.2 15 0.2 15 uA
(Notes 2,5) VIL = VSS ± 0.3V,
WP#/ACC=VCC±0.3V
IACC WP#/ACC Accelerated CE#=VIL, WP#/ACC pin 5 1 0 5 10 mA
Pro gram Current, Wo rd or Byte OE#=VIH VCC pin 1 5 3 0 15 3 0 mA
VIL Input Low V oltage -0.5 0.8 -0.5 0.8 V
VIH Input High V o ltage 0.7xVcc Vcc+0.3 0.7xVcc Vcc+0.3 V
VHH Voltage for WP#/ACC Sector VCC = 3.0 V ± 10% 11.5 12.5 11.5 12.5 V
Protect/Unprotect and
Program Acceleration
VID Voltage for Automatic Select VCC = 3.0 V ± 1 0% 11.5 12.5 11.5 12.5 V
and T emporary Sector
Unprotect
V OL Output Low V o ltage IOL=4.0mA, 0.45 0.45 V
VCC=VCC min
V OH1 Output High V o ltage IOH=-2.0mA, 0.85Vcc 0.85Vcc V
VCC=VCC min
VOH2 IOH=-100uA, Vcc-0.4 Vcc-0.4 V
VCC = VCC min
VLKO Low VCC Lock-Out V oltage 1.4 2.1 1.4 2.1 V
(Note 6)
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KH29LV320C T/B
SWITCHING TEST CIRCUITS TEST SPECIFICA TIONS
Test Condition 7 0 9 0 Unit
Output Load 1 TTL gate
Output Load Capacitance,CL 30 100 pF
(including jig capacitance)
Input Rise and F all Times 5 ns
Input Pulse Levels 0.0-3.0 V
Input timing measurement 1.5 V
reference levels
Output timing measurement 1.5 V
reference levels
1.5V 1.5V
Measurement Level
3.0V
0.0V OUTPUT
INPUT
SWITCHING TEST WAVEFORMS
DEVICE UNDER
TEST
DIODES=IN3064
OR EQUIVALENT
CL 6.2K ohm
1.6K ohm +3.3V
WAVEFORM INPUTS OUTPUTS
Steady
Changing from H to L
Changing from L to H
Do n't Care, Any Change P ermitted Changing, State Unknown
Does Not Apply Center Line is High Impedance State(High Z)
KEY TO SWITCHING WAVEFORMS
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KH29LV320C T/B
Symbol DESCRIPTION CONDITION 70 90 Unit
tACC Address to o utput dela y CE#=VIL MAX 70 90 ns
OE#=VIL
tCE Chip enable to o utput delay OE#=VIL MAX 70 9 0 ns
tOE Output enable to output delay MAX 40 4 0 ns
tDF OE# High to output flo at(Note1) MAX 30 3 0 ns
t OH Output hold time of from the rising edge of MI N 0 0 ns
Address, CE# o r OE# whiche ver happens first
t R C Read cycle time (Note 1) MI N 70 9 0 n s
t W C Write cycle time (Note 1) MIN 70 90 ns
tCWC Command write cycle time(Note 1) MIN 70 9 0 ns
tAS Address setup time MI N 0 0 ns
tAH Address hold time MIN 45 4 5 ns
tDS Data setup time MI N 45 4 5 ns
tDH Data hold time MIN 0 0 ns
tVCS VCC setup time(Note 1) MIN 50 5 0 ns
tCS Chip enable setup time MIN 0 0 ns
tCH Chip enable hold time MIN 0 0 ns
tOES Output enable setup time (Note 1) MIN 0 0 ns
tOEH Output enable hold time (Note 1) Read M IN 0 0 ns
Toggle & MIN 10 10 ns
Data# Polling
tWES WE# setup time MI N 0 0 ns
tWEH WE# ho ld time MIN 0 0 ns
tCEP CE# pulse width MIN 45 4 5 ns
tCEPH CE# pulse width high MIN 30 30 ns
tWP WE# pulse width MIN 35 3 5 ns
tWPH WE# pulse width high MI N 30 3 0 ns
tBUSY Pro gram/Erase v alid to R Y/BY# delay MAX 9 0 9 0 ns
tGHWL Read recovery time before write MIN 0 0 ns
tGHEL Read recovery time before write MIN 0 0 ns
tWHWH1 Programming operation BYTE TYP 9 9 us
WORD TYP 11 11 us
Accelerated programming operation word or TYP 7 7 us
byte
tWHWH2 Sector erase operation TYP 0.9 0.9 sec
tBAL Sector address hold time MAX 5 0 5 0 us
No tes: 1.Not 100% Tested
AC CHARACTERISTICS T A=-40° C to 85° C, VCC=2.7V~3.6V
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KH29LV320C T/B
Figure 1. COMMAND WRITE OPERA TION
Addresses
CE#
OE#
WE#
DIN
tDS
tAH
Data
tDH
tCS tCH
tCWC
tWPH
tWP
tOES
tAS
VCC 3V
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
ADD V alid
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KH29LV320C T/B
READ/RESET OPERATION
Figure 2. READ TIMING W A VEFORMS
Addresses
CE#
OE#
tACC
WE#
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VOH
VOL
HIGH Z HIGH Z
D ATA V alid
tOE
tOEH tDF
tCE
tRC
Outputs
tOH
ADD V alid
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KH29LV320C T/B
Figure 3. RESET# TIMING W AVEFORM
AC CHARACTERISTICS
Parameter Description Test Setup All Speed Options Unit
tREAD Y1 RESET# PIN Low (During Auto matic Algorithms) MAX 2 0 us
to Read o r Write (See No te)
tREAD Y2 RESET# PIN Low (NOT During Automatic MAX 500 ns
Algo rithms) to Read o r Write (See No te)
tRP1 RESET# Pulse Width (During Auto matic Algorithms) MIN 1 0 us
tRP2 RESET# Pulse Width (NOT During Automatic Algorithms) MIN 500 ns
tRH RESET# High Time Befo re Read(See No te) MIN 7 0 ns
tRB1 RY/BY# Reco very Time(to CE#, OE# go low) MIN 0 ns
tRB2 RY/BY# Recovery Time(to WE# go low) MIN 50 ns
Note:Not 100% tested
tRH
tRB1
tREADY1
tRP2
tRP1
tREADY2
RY/BY#
CE#, OE#
RESET#
Reset Timing NOT during Automatic Algorithms
Reset Timing during Automatic Algorithms
RY/BY#
CE#, OE#
tRB2
WE#
RESET#
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KH29LV320C T/B
ERASE/PROGRAM OPERATION
Figure 4. AUTOMA TIC CHIP ERASE TIMING W A VEFORM
tWC
Address
OE#
CE#
55h
2AAh SA
10h
In
Progress Complete
VA VA
Note:
SA=sector address(for Sector Erase), VA=Valid Address for reading status data(see "Write Operation Status").
tAS
tAH
555h for chip erase
tGHWL
tCH
tWP
tDS tDH
tWHWH2
Read Status Data Erase Command Sequence(last two cycle)
tBUSY tRB
tCS tWPH
tVCS
WE#
Data
RY/BY#
VCC
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KH29LV320C T/B
Figure 5. AUTOMA TIC CHIP ERASE ALGORITHM FLO WCHART
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data AAH Address 555H
Write Data 80H Address 555H
YES
Write Data 10H Address 555H
Write Data 55H Address 2AAH
DATA = FFh ?
YES
Auto Erase Completed
Data Poll
from system
No
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 6. A UTOMATIC SECTOR ERASE TIMING WA VEFORM
tWC
Address
OE#
CE#
55h
2AAh Sector
Address 1
Sector
Address 0
30h In
Progress Complete
VA VA
30h
Note:
SA=sector address(for Sector Erase), VA=Valid Address for reading status data(see "Write Operation Status").
Sector
Address n
tAS
tAH
tBAL
tGHWL
tCH
tWP
tDS tDH
tWHWH2
Read Status Data Erase Command Sequence(last two cycle)
tBUSY tRB
tCS tWPH
tVCS
WE#
Data
RY/BY#
VCC
30h
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KH29LV320C T/B
Figure 7. A UTOMATIC SECTOR ERASE ALGORITHM FLOWCHART
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data AAH Address 555H
Write Data 80H Address 555H
Write Data 30H Sector Address
Write Data 55H Address 2AAH
Auto Sector Erase Completed
Data Poll from System
YES
NO
Data=FFh?
Last Sector
to Erase ?
NO
YES
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KH29LV320C T/B
Figure 8. ERASE SUSPEND/RESUME FLOWCHART
START
Write Data B0H
Toggle Bit checking Q6
not toggled
ERASE SUSPEND
YES
NO
Write Data 30H
Continue Erase
Reading or
Programming End
Read Array or
Program
Another
Erase Suspend ? NO
YES
YES
NO
ERASE RESUME
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 9. AUTOMA TIC PROGRAM TIMING W A VEFORMS
Figure 10. Accelerated Program Timing Diagram
tWC
Address
OE#
CE#
A0h
555h PA
PD Status DOUT
PA PA
Note:
1.PA=Program Address, PD=Program Data, DOUT is the true data the program address
tAS
tAH
tGHWL
tCH
tWP
tDS tDH
tWHWH1
Read Status Data (last two cycle)Program Command Sequence(last two cycle)
tBUSY tRB
tCS tWPH
tVCS
WE#
Data
RY/BY#
VCC
WP#/ACC
tVHH
VHH (11.5V ~ 12.5V)
VIL or VIH VIL or VIH
tVHH
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 11. CE# CONTROLLED WRITE TIMING WA VEFORM
tWC
tWH
tGHEL
tWHWH1 or 2
tCP
Address
WE#
OE#
CE#
Data Q7
PA
Data# Polling
DOUT
RESET#
RY/BY#
Notes:
1. PA=Program Address, PD=Program Data, DOUT=Data Out, Q7=complement of data written to device.
2. Figure indicates the last two bus cycles of the command sequence.
tAH
tAS
PA for program
SA for sector erase
555 for chip erase
tRH
tDH
tDS
tWS
A0 for program
55 for erase
tCPH
tBUSY
PD for program
30 for sector erase
10 for chip erase
555 for program
2AA for erase
41
P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 12. A UTOMA TIC PROGRAMMING ALGORITHM FLOWCHART
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Program Data/Address
Write Data A0H Address 555H
YES
Verify Data OK ?
YES
Auto Program Completed
Data Poll
from system
Increment
Address
Last Address ?
No
No
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
SECTOR GROUP PROTECT/CHIP UNPROTECT
Figure 13. Sector Group Protect/Chip Unprotect Waveform (RESET# Control)
Note:
1. For sector group protect A6=0, A1=1, A0=0 ; for chip unprotect A6=1, A1=1, A0=0
Sector Group Protect: 150us
Chip Unprotect: 15ms
1us
VID
VIH
Data
SA, A6
A1, A0
CE#
WE#
OE#
Valid (note2)Valid (note2) Valid (note2)
Status
Sector Group Protect or Chip Unprotect
40h60h60h
Verify
RESET#
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 14. IN-SYSTEM SECTOR GROUP PRO TECT/CHIP UNPROTECT ALGORITHMS WITH RESET#=VID
START
PLSCNT=1
RESET#=VID
Wait 1us
Set up sector address
Sector Protect:
Write 60h to sector
address with
A6=0, A1=1, A0=0
Wait 150us
Verify Sector Protect:
Write 40h to sector
address with
A6=0, A1=1, A0=0
Read from
sector address
with
A6=0, A1=1, A0=0
Reset
PLSCNT=1
Remove VID from RESET#
Write reset command
Sector Protect
Algorithm
Chip Unprotect
Algorithm
Sector Protect complete Remove VID from RESET#
Write reset command
Chip Unprotect complete
Device failed
Temporary Sector
Unprotect Mode
Increment PLSCNT
Increment PLSCNT
First Write
Cycle=60h?
Set up first sector address
Protect all sectors:
The indicated portion of
the sector protect algorithm
must be performed
for all unprotected sectors
prior to issuing the first
sector unprotect address
Chip Unprotect:
Write 60h to sector
address with
A6=1, A1=1, A0=0
Time Out Timing (note 1)
Verify Sector Unprotect:
Write 40h to sector
address with
A6=1, A1=1, A0=0
Read from
sector address
with
A6=1, A1=1, A0=0
Data=01h?
PLSCNT=25?
Device failed
START
PLSCNT=1
RESET#=VID
Wait 1us
First Write
Cycle=60h?
All sectors
protected?
Data=00h?
PLSCNT=1000?
Last sector
verified?
Yes
Yes
Yes
No
No
No
Yes
Yes
Yes
YesYes
Yes
No
No
No
No
No
No
Protect another
sector?
Reset
PLSCNT=1
Temporary Sector
Unprotect Mode
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KH29LV320C T/B
Figure 15. TEMPORAR Y SECTOR GROUP UNPROTECT WA VEFORMS
T able 7. TEMPORARY SECT OR GROUP UNPROTECT
Parameter Std. Description Test Setup All Speed Options Unit
tVI DR VID Rise and F all Time (See No te) Mi n 5 0 0 ns
tRSP RESET# Setup Time for T emporary Sector Unprotect Min 4 us
Note:
Not 100% tested
RESET#
CE#
WE#
RY/BY#
tVIDR
12V
0 or 3V VIL or VIH
tRSP
tVIDR
Program or Erase Command Sequence
45
P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 16. TEMPORARY SECTOR GROUP UNPROTECT FLOWCHART
Start
RESET# = VID (Note 1)
Perform Erase or Program Operation
RESET# = VIH
Temporary Sector Unprotect Completed(Note 2)
Operation Completed
2. All previously protected sectors are protected again.
Notes : 1. All protected sectors are temporary unprotected. VID=11.5V~12.5V.
(if WP#/ACC=VIL, outermost boot sectors will remain protected)
46
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KH29LV320C T/B
Figure 17. SILICON ID READ TIMING W A VEFORM
tACC
tCE
tACC
tOE
tOH tOH
tDF
DATA OUT
C2H A7H (TOP boot)
A8H (Bottom boot)
VID
VIH
VIL
ADD
A9
ADD
CE#
A1
OE#
WE#
ADD
A0
DATA OUT
DATA
Q0-Q7
VCC 3V
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
47
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KH29LV320C T/B
WRITE OPERATION STATUS
Figure 18. D A T A# POLLING TIMING WA VEFORMS (DURING AUTOMA TIC ALGORITHMS)
Note:
VA=Valid address. Figure shows are first status cycle after command sequence, last status read cycle, and array data read cycle.
tDF
tCE
tCH
tOE
tOEH
tACC
tRC
tOH
Address
CE#
OE#
WE#
Q7
Q0-Q6
RY/BY#
tBUSY
Status Data Status Data
Status Data Complement True Valid Data
VAVA
High Z
High Z
Valid DataTrue
48
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KH29LV320C T/B
Figure 19. Data# P olling Algorithm
START
Read Q7~Q0
Add. = VA (1)
Yes
Yes
Yes
No
No
No
Q7 = Data ?
Q7 = Data ?
Q5 = 1 ?
Read Q7~Q0
Add. = VA
PASS
FAIL
(2)
Notes:
1. VA=valid address f o r pro g ramming o r er asure.
2. Q7 should be rechecked even Q5="1" because Q7 may change simultaneously with Q5.
49
P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 20. TOGGLE BIT TIMING WA VEFORMS (DURING AUTOMA TIC ALGORITHMS)
Note:
VA=Valid address; not required for Q6. Figure shows first two status cycle after command sequence, last status read cycle, and
array data read cycle.
tDF
tCE
tCH
tOE
tOEH
tACC
tRC
tOH
Address
CE#
OE#
WE#
Q6/Q2
RY/BY#
tBUSY
Valid Status
(first read)
Valid Status
(second read) (stops toggling)
Valid Data
VA VA
VA
VA
Valid Data
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KH29LV320C T/B
START
Read Q7~Q0
Read Q7~Q0
YES
NO
Toggle Bit Q6
=Toggle?
Q5=1?
YES
NO
(Note 1)
Read Q7~Q0 Twice (Note 1,2)
Toggle Bit Q6=
Toggle?
Program/Erase Operation Not
Complete, Write Reset Command
YES
Program/Erase Operation Complete
Figure 21. Toggle Bit Algorithm
Notes:
1. Read toggle bit twice to determine whether or not it is toggling.
2. Recheck toggle bit because it may stop toggling as Q5 changes to "1".
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
Figure 22. Q6 versus Q2
Note:
The system can use OE# or CE# to toggle Q2/Q6, Q2 toggles only when read at an address within an erase-suspended
WE#
Enter Embedded
Erasing Erase
Suspend Enter Erase
Suspend Program
Erase
Suspend
Program
Erase Suspend
Read
Erase Suspend
Read Erase
Erase
Resume
Erase
Complete
Erase
Q6
Q2
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KH29LV320C T/B
Figure 23. BYTE# TIMING W AVEFORM FOR READ OPERATIONS (BYTE# switching fr om byte mode to wor d
mode)
AC CHARACTERISTICS
WORD/BYTE CONFIGURA TION (BYTE#)
Parameter Description Speed Options Unit
JEDEC Std -70 -90
tELFL/tELFH CE# to BYTE# Switching Low or High Max 5 ns
tFLQZ BYTE# Switching Low to Output HIGH Z Max 2 5 30 ns
tFHQV BYTE# Switching High to Output Active Mi n 70 90 ns
tFHQV
tELFH
DOUT
(Q0-Q7) DOUT
(Q0-Q14)
VA DOUT
(Q15)
CE#
OE#
BYTE#
Q0~Q14
Q15/A-1
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KH29LV320C T/B
RECOMMENDED OPERATING CONDITIONS
At Device Power-Up
AC timing illustrated in Figure A is reco mmended fo r the supply v o ltages and the co ntro l signals at device po wer-up.
If the timing in the figure is igno red, the device may not o perate correctly.
Figure A. AC Timing at Device P ower-Up
Notes :
1. Sampled, no t 100% tested.
2. This specificatio n is applied f o r no t o nly the device po wer-up but also the no rmal o peratio ns.
Symbol Parameter Notes Min. Max. Unit
tVR VCC Rise Time 1 2 0 500000 us/V
tR Input Signal Rise Time 1, 2 2 0 us/V
tF Input Signal F all Time 1, 2 2 0 us/V
VCC
ADDRESS
CE#
WE#
OE#
DATA
tVR
tACC
tR or tF
tCE
tF
VCC(min)
GND
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VOH High Z
VOL
WP#/ACC VIH
VIL
Valid
Ouput
Valid
Address
tR or tF
tR
tOE
tF tR
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
MIN. MAX.
Input Voltage with respect to GND on all pins except I/O pins -1.0V 12.5V
Input Voltage with respect to GND on all I/O pins -1.0V VCC + 1.0V
VCC Current -100mA +100mA
Includes all pins except Vcc. Test conditions: Vcc = 3.0V, one pin at a time.
LIMITS
PARAMETER MIN. TYP.(2) MAX. UNITS
Sector Erase Time 0. 9 1 5 sec
Chip Erase Time 3 5 5 0 sec
Byte Programming Time 9 300 us
Word Program Time 1 1 360 us
Chip Programming Time Byte Mode 3 6 10 8 sec
Word Mode 24 72 sec
Accelerated Byte/Word Program Time 7 210 us
Erase/Program Cycles 100,000 Cycles
LATCH-UP CHARACTERISTICS
ERASE AND PROGRAMMING PERFORMANCE(1)
Note: 1.Not 100% Tested, Excludes external system le v el over head.
2.Typical values measured at 25°C,3.3V.
Parameter Symbol Parameter Description Test Set TYP MAX UNIT
CIN Input Capacitance VIN=0 6 7.5 pF
COUT Output Capacitance VOUT=0 8.5 1 2 pF
CIN2 Control Pin Capacitance VIN=0 7.5 9 pF
TSOP PIN CAPACITANCE
Notes:
1. Sampled, no t 100% tested.
2. T est conditions T A=25°C , f=1.0MHz
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
P ART NO. A CCESS OPERA TING ST ANDBY PA CKA GE Remark
TIME (ns) Current MAX. (mA) Current MAX. (uA)
KH29LV320CTTC-70 7 0 3 0 5 48 Pin TSOP
(Normal Type)
KH29LV320CBTC-70 7 0 3 0 5 48 Pin TSOP
(Normal Type)
KH29LV320CTTC-90 9 0 3 0 5 48 Pin TSOP
(Normal Type)
KH29LV320CBTC-90 9 0 3 0 5 48 Pin TSOP
(Normal Type)
KH29LV320CTTC-70G 70 30 5 48 Pin TSOP PB free
(Normal Type)
KH29LV320CBTC-70G 70 30 5 48 Pin TSOP PB free
(Normal Type)
KH29LV320CTTC-90G 90 30 5 48 Pin TSOP PB free
(Normal Type)
KH29LV320CBTC-90G 90 30 5 48 Pin TSOP PB free
(Normal Type)
ORDERING INFORMATION
56
P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
PART NAME DESCRIPTION
KH 29 LV 70C T T C G
OPTION:
G: Lead-free package
blank: normal
SPEED:
70: 70ns
90: 90ns
TEMPERATURE RANGE:
C: Commercial (0˚C to 70˚C)
PACKAGE:
T: TSOP
BOOT BLOCK TYPE:
T: Top Boot
B: Bottom Boot
REVISION:
C
DENSITY & MODE:
320: 32Mb, x8/x16 Boot Block
TYPE:
LV: 3V
DEVICE:
29:Flash
320
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
PACKAGE INFORMATION
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P/N:PM1251 REV. 1.1, DEC. 09, 2005
KH29LV320C T/B
REVISION HISTORY
Revision No. Description Page Date
1.1 1. Mo dified content error P33,53 DEC/09/2005
MACRONIX INTERNATIONAL CO., LTD .
Headquarters:
TEL:+886-3-578-6688
FAX:+886-3-563-2888
Europe Office :
TEL:+32-2-456-8020
FAX:+32-2-456-8021
Hong Kong Office :
TEL:+86-755-834-335-79
FAX:+86-755-834-380-78
Japan Office :
Kawasaki Office :
TEL:+81-44-246-9100
FAX:+81-44-246-9105
Osaka Office :
TEL:+81-6-4807-5460
FAX:+81-6-4807-5461
Singapore Office :
TEL:+65-6346-5505
FAX:+65-6348-8096
Taipei Office :
TEL:+886-2-2509-3300
FAX:+886-2-2509-2200
MACRONIX AMERICA, INC.
TEL:+1-408-262-8887
FAX:+1-408-262-8810
http : //www.macronix.com
MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.
KH29LV320C T/B