PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 1 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
-
76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
CONNECTOR SERIES:
76871
76870 (STANDARD)
76894 (LOW-PROFILE)
76871 SERIES
76894 SERIES 76870 SERIES
TABLE OF CONTENTS
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 2 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
-
76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
1.0 SCOPE ...................................................................................................................................................................... 3
2.0 PRODUCT DESCRIPTIO ................................................................................................................................... 3
2.1 PRODUCT NAME AND SERIES NUMBER(S) ............................................................................................................... 3
2.2 DIMENSION, MATERIALS, PLATING AND MARKINGS ............................................................................................... 3
2.3 SAFETY AGENCY APPROVALS ................................................................................................................................. 3
2.4 PIN ASSIGNMENTS .................................................................................................................................................. 3
2.5 ADDITIONAL GENERAL SPECIFICATIONS ................................................................................................................ 3
3.0 APPLICABLE DOCUMETS AD SPECIFICATIOS .................................................................................. 3
3.1 MOLEX DOCUMENTS ..................................................................................................................................................... 3
3.2 INDUSTRY DOCUMENTS ................................................................................................................................................ 4
4.0 QUALIFICATIO .................................................................................................................................................. 4
5.0 RATIGS ................................................................................................................................................................. 4
5.1 VOLTAGE ................................................................................................................................................................ 4
5.2 CURRENT ................................................................................................................................................................ 4
5.3 TEMPERATURE ....................................................................................................................................................... 4
5.4 DURABILITY ........................................................................................................................................................... 4
6.0 PERFORMACE (MECHAICAL & EVIROMETAL) .......................................................................... 5
6.1 TEST GROUP 1 ......................................................................................................................................................... 5
6.2 TEST GROUP 2 ......................................................................................................................................................... 6
6.3 TEST GROUP 3 ......................................................................................................................................................... 7
6.4 TEST GROUP 4 ......................................................................................................................................................... 8
TEST GROUP 4 (CONTINUED) .............................................................................................................................................. 9
6.5 TEST GROUP 7 ....................................................................................................................................................... 10
6.6 MECHANICAL TEST GROUP 1 ................................................................................................................................ 11
6.7 MECHANICAL TEST GROUP 2 ................................................................................................................................ 11
6.8 MECHANICAL TEST GROUP 3 ................................................................................................................................ 12
6.9 MECHANICAL TEST GROUP 4 ................................................................................................................................ 12
6.10 MECHANICAL TEST GROUP 5 ................................................................................................................................ 13
6.11 MECHANICAL TEST GROUP 6 ................................................................................................................................ 13
7.0 PACKAGIG ........................................................................................................................................................ 14
8.1 CONNECTOR ......................................................................................................................................................... 14
8.2 PLUG AND CABLE ASSEMBLY ............................................................................................................................... 14
8.0 GAGES AD FIXTURES .................................................................................................................................... 15
9.0 OTHER IFORMATIO .................................................................................................................................... 16
10.1 INVERTED SMT APPLICATION ............................................................................................................................... 16
10.2 PCB REQUIREMENTS ............................................................................................................................................. 16
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 3 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
1.0 SCOPE
This Product Specification covers the QSFP – Stacked 2X1,2X3 Connector Series
2.0 PRODUCT DESCRIPTION
2.1 PRODUCT NAME AND SERIES NUMBER(S)
Product Name: QSFP - Stacked Connector Family
Connector Series: 76870, 76871, 76894
2.2 DIMENSION, MATERIALS, PLATING AND MARKINGS
See the appropriate sales drawing for information on dimensions, materials, plating, marking,
and footprint patterns.
2.3 SAFETY AGENCY APPROVALS
UL file: E29179
2.4 PIN ASSIGNMENTS
Refer to appropriate sales drawing of the specific part number for the correct pin assignment.
2.5 ADDITIONAL GENERAL SPECIFICATIONS
MATERIALS:
• Cage: Nickel Silver - Unplated
• EMI Springs: Phos-Bronze – Nickel plated
• Air-Vents/EMI Shields: Die-cast Alloy – Nickel plated
• Light-pipes (if used): Polycarbonate
• Signal-Connector Housing: Thermoplastic, 94V-0
• Signal Terminals: Copper Alloy - Hard Gold plated over Nickel
2.6 MATING CONNECTORS
Plug & Cable Series: 74547, 74763, 111048
3.0 APPLICABLE DOCUMENTS AND SPECIFICATIONS
3.1 MOLEX DOCUMENTS
AS-76870-001 Application Specification
PK-76870-001 Packaging Specification
PS-45499-002 Cosmetic Specification
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 4 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
3.2 INDUSTRY DOCUMENTS
EIA 364 Series Electrical Connector Test Procedures Including Environmental Classifications
with Test Procedures
EIA 364-1000 Environmental Test Methodology for Assessing the Performance of
Connectors and Sockets Used in Business Office Applications
4.0 QUALIFICATION
Laboratory condition and sample selection are in accordance with EIA 364
5.0 RATINGS
5.1 VOLTAGE
30 Volts AC (RMS)/DC Max.
5.2 CURRENT
0.5 Amps Max.
5.3 TEMPERATURE
Operating: -40ºC to +85ºC
Non-operating: -55°C to +105°C
5.4 DURABILITY
PL2 #15 – Performance Level 1 – 0.76 µm Au – 250 cycles, 10 year Life (FMG)
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 5 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.0 PERFORMANCE (MECHANICAL & ENVIRONMENTAL)
6.1 TEST GROUP 1
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated baseline
N/A
2 Durability
(precondition)
EIA-364-09; perform plug &
unplug cycles: 20
No evidence of physical
damage PASS
3 Temperature
Life
EIA-364-17, method A, Test
Condition 3 at 105°±2°C:
120 hours
Mated None
4
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
5 Reseating Manually unplug & plug the
connector, 3 cycles
No evidence of physical
damage PASS
6
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 6 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.2 TEST GROUP 2
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated baseline
N/A
2 Durability
(precondition)
EIA-364-09; perform plug &
unplug cycles: 20
No evidence of physical
damage PASS
3 Thermal Shock
EIA-364-32, test condition I
(10 cycles):
120 hours
Mated None
4
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
5
Cyclic
Temperature
& Humidity
EIA-364-31
Cycle connectors between
25º ± 3ºC at 80% RH and 65
º± 3 ºC at 50% RH (24
cycles) Ramp times should
be 0.5 hour and dwell should
be 1.0 hour.
Mated
None
6
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
7 Reseating Manually unplug & plug the
connector, 3 cycles
No evidence of physical
damage PASS
8
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 7 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.3 TEST GROUP 3
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated baseline
N/A
2 Durability
(precondition)
EIA-364-09; perform plug &
unplug cycles: 20
No evidence of physical
damage PASS
3
Temperature
Life
(precondition)
EIA-364-17, method A, Test
Condition 3 at 105°±2°C
72 hours
Mated None
4
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
5 Mechanical
Vibration
EIA-364-28
test condition VII
test condition letter D
15 minutes in each of 3
mutually perpendicular
directions.
Both mating halves rigidly
fixed to not contribute to
relative motion of one contact
against another.
Mated
Discontinuity < 1 µsec
No evidence of physical
damage
PASS
7
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 8 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
-
76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.4 TEST GROUP 4
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated baseline
N/A
2 Durability
(precondition)
EIA-364-09; perform plug &
unplug cycles: 20
No evidence of physical
damage PASS
3
Temperature
Life
(precondition)
EIA-364-17, method A, Test
Condition 3 at 105°±2°C
72 hours
Mated None
4
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
5 Mixed Flowing
Gas
EIA-364-35
class IIA, Option 1A & 1B
test condition VII
14 days
See Note None
6
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
Note:
1. Expose ½ of the specimens unmated for 2/3 of the test duration. Mate the specimen to
the same one used during preconditioning temperature life. Expose for the duration of
the test.
2. Characterize porosity & plating thickness before test sequence.
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 9 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
TEST GROUP 4 (CONTINUED)
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
7 Thermal
Disturbance
Cycle connectors 10 times
between 15º ± 3ºC at 80%
RH and 85 º± 3 ºC at 50%
RH. Ramps should be a
minimum of 2°C per minute
and dwell times should
insure
that the contacts reach the
temperature extremes for a
minimum of 5 minutes.
Mated
None
8
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
9 Reseating Manually unplug & plug the
connector, 3 cycles
No evidence of physical
damage PASS
10
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 10 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.5 TEST GROUP 7
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Dielectric
Withstanding
Voltage
EIA-364-20; apply a voltage
of 300 VDC for 1 minute
between adjacent terminals
and between adjacent
terminals and ground.
Mated No disruptive discharge
No leakage current in
excess of 5mA
PASS
2
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated baseline
N/A
3 Durability EIA-364-09; perform plug &
unplug cycles: 250
No evidence of physical
damage PASS
4
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
5
Dielectric
Withstanding
Voltage
EIA-364-20; apply a voltage
of 300 VDC for 1 minute
between adjacent terminals
and between adjacent
terminals and ground.
Mated No disruptive discharge
No leakage current in
excess of 5mA
PASS
Note:
1. Separate sets of test specimens will be used to access dielectric withstanding voltage
and the change in low level contact resistance.
2. Dielectric withstanding voltage testing will use different contacts than those used for
low level contact resistance testing.
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 11 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
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76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.6 MECHANICAL TEST GROUP 1
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Temperature
Rise
(via current
cycling)
Measure the temperature rise
at the rated current after 96
hours.
(45 minutes ON and 15
minutes OFF).
Fixture as required.
Mated
Temperature Rise:
+30°C maximum
0.3 A min. with < 30°C
Temperature Rise
6.7 MECHANICAL TEST GROUP 2
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Connector
Mate Forces
(Module only)
Mate connector at a rate of 25
mm per min. Mate 2.5 N / contact pair MAX
insertion force 0.5-0.75 N / force
2
Connector
Un-mate
Forces
(Module only)
Un-mate connector at a rate
of 25 mm per min. Un-mate 0.5 N / contact pair MAX
withdrawal force 0.25-0.35
N / contact pair
3 Plug Mate
Forces
Mate connector at a rate of 25
mm per min. Mate 2.5 N / contact pair
plus 50 N MAX
62 N – 82 N
4 De-Latch Plug
(Axial Load)
Mate connector and place
axial load on latch pull to de-
latch plug
Un-mate 0.5 N / contact pair
plus 20 N MAX
18 N – 24 N
5 Latch Pull
(Axial Load)
Place axial load on plug pull
with 6.35 mm diameter pin Mate 25 N MIN No physical damage
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 12 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
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001
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HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.8 MECHANICAL TEST GROUP 3
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Terminal
Retention
Force
Axial pullout force on the
terminal in the housing at a
rate of 25 mm (1 in) per min.
4.5 N
MINIMUM retention force
6.2 N MINIMUM
2 Normal Force Apply a perpendicular force. 0.49 N, (50 grams)
MINIMUM normal force
0.49 N, (50 grams)
MINIMUM normal force
6.9 MECHANICAL TEST GROUP 4
ITEM
TEST TEST PROCEDURE CONDITION REQUIREMENT ACTUAL
1 Latitudinal
Load
Mate connector and load plug
with latitudinal load until open
circuit. See section 9.
Mated 75 N MIN 90 N
(no open circuit)
2 Longitudinal
Load
Mate connector and load plug
with longitudinal load until
open circuit. See section 9.
Mated 75 N MIN 90 N
(no open circuit)
3
Cable Pullout
Force
(Axial Load)
Mate plug to connector and
apply an axial pullout force on
the wire at a rate of 25 mm
per min.
Mated 100 N MIN 133 N – 142 N
4
Cable Pullout
Force
(Right Angle
Load)
Mate plug to connector and
apply an right angle pullout
force on the wire at a rate of
25 mm per min.
Mated 75 N MIN 125 N – 145 N
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
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EC No:
UCP2012-2334 13 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
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001
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TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
6.10 MECHANICAL TEST GROUP 5
ITEM
TEST
TEST
PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated baseline
N/A
2 Wire Flex
Flex cable 180° for 20 cycles.
Test per EIA 364-41 test
cond. I:
24 AWG – with X = 40 mm
26 AWG – with X = 30 mm
28 AWG – with X = 30 mm
Mated
10 mΩ MAX
(change from initial)
No physical damage
20 cycles, no physical
damage
3
Low Level
Contact
Resistance
EIA-364-23; apply a
maximum voltage of 20 mV
and a current of 100 mA.
Mated <10 mΩ ∆ max <10 mΩ ∆ max
6.11 MECHANICAL TEST GROUP 6
ITEM
TEST
TEST PROCEDURE
CONDITION
REQUIREMENT
ACTUAL
1
Compliant Pin
Insertion into
PCB
Apply an axial insertion force
on the terminal at a rate of
25± 6 mm/min.
35 N (7.9 LBF) MAX. 1330 N MAX.
2
Compliant Pin
Extraction into
PCB
Apply an axial extraction force
on the terminal at a rate of
25± 6 mm/min
9 N
(2 lbf) MAX. retention
force per pin 342 N MIN.
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
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EC No:
UCP2012-2334 14 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
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001
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HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
7.0 PACKAGING
8.1 CONNECTOR
8.1.1 Product shall be packaged in Trays with Lids placed in Cartons, per the packaging
specification as called out on the applicable assembly print.
8.1.2 Packaging shall meet the requirements of and be tested per the packaging specification as
called out on the applicable assembly print.
8.2 PLUG AND CABLE ASSEMBLY
8.2.1 Product shall be packaged to protect against damage during handling, transit and storage.
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE:
PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No: UCP2012-2334
15
of
17
DATE: 2012 / 01 / 25
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001
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HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
8.0 GAGES AND FIXTURES
Test setup for latitudinal and longitudinal load testing and shell retention testing. Probe is about 6mm
in diameter with a full radius nose. The probe is to be placed 20mm from the front edge of the
receptacle and located at the centerline of the plug. Apply load to plug at a rate of 25mm per minute.
Test setup for peel and shear testing. Apply load to plug at a rate of 25mm per minute.
QSFP
39.00
LOAD LOAD
PCB
PLUG
PROBE
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
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EC No:
UCP2012-2334 16 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
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TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
9.0 OTHER INFORMATION
10.1 INVERTED SMT APPLICATION
See AS-75586-001 Application Specification for inverted SMT application.
10.2 PCB REQUIREMENTS
The compliant pin shall be capable of being inserted one time.
The PCB hole shall be capable of retaining the compliant pin for a maximum of three
insertions. The removal of the compliant pin from the PCB shall not damage the PCB hole
beyond the point to be able to retain a compliant pin (that has not been inserted into a PCB).
0.370 mm Compliant Pin Drilled Hole Size: 0.457 mm (# 77 Drill)
1.050 mm Cage Tail Drilled Hole Size: 1.092 mm (# 57 Drill)
COMPLIANT PIN-HOLE DETAIL
PRODUCT SPECIFICATION
QSFP+ STACKED CONNECTORS
REVISION: ECR/ECN INFORMATION: TITLE: PRODUCT SPECIFICATION
STACKED QSFP+ CONNECTORS
SHEET No.
D
EC No:
UCP2012-2334 17 of 17
DATE:
2012 / 01 / 25
DOCUMENT NUMBER: CREATED / REVISED BY: CHECKED BY: APPROVED BY:
PS
-
76870
-
001
S. BOGIEL/JGONZALEZ
HAVERY M. BANAKIS
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC
CAGE TAIL HOLE DETAIL
Note:
Depending upon the plating finish and plating process, a larger drill diameter may be used to achieve
the finished hole specification.
