PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS CONNECTOR SERIES: 76871 76870 (STANDARD) 76894 (LOW-PROFILE) 76871 SERIES 76894 SERIES 76870 SERIES TABLE OF CONTENTS REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 1 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 1.0 SCOPE ...................................................................................................................................................................... 3 2.0 PRODUCT DESCRIPTIO ................................................................................................................................... 3 2.1 2.2 2.3 2.4 2.5 3.0 PRODUCT NAME AND SERIES NUMBER(S) ............................................................................................................... 3 DIMENSION, MATERIALS, PLATING AND MARKINGS ............................................................................................... 3 SAFETY AGENCY APPROVALS ................................................................................................................................. 3 PIN ASSIGNMENTS .................................................................................................................................................. 3 ADDITIONAL GENERAL SPECIFICATIONS ................................................................................................................ 3 APPLICABLE DOCUMETS AD SPECIFICATIOS .................................................................................. 3 3.1 MOLEX DOCUMENTS ..................................................................................................................................................... 3 3.2 INDUSTRY DOCUMENTS ................................................................................................................................................ 4 4.0 QUALIFICATIO .................................................................................................................................................. 4 5.0 RATIGS ................................................................................................................................................................. 4 5.1 5.2 5.3 5.4 6.0 VOLTAGE ................................................................................................................................................................ 4 CURRENT ................................................................................................................................................................ 4 TEMPERATURE ....................................................................................................................................................... 4 DURABILITY ........................................................................................................................................................... 4 PERFORMACE (MECHAICAL & EVIROMETAL) .......................................................................... 5 6.1 6.2 6.3 6.4 TEST GROUP 1 ......................................................................................................................................................... 5 TEST GROUP 2 ......................................................................................................................................................... 6 TEST GROUP 3 ......................................................................................................................................................... 7 TEST GROUP 4 ......................................................................................................................................................... 8 TEST GROUP 4 (CONTINUED) .............................................................................................................................................. 9 6.5 TEST GROUP 7 ....................................................................................................................................................... 10 6.6 MECHANICAL TEST GROUP 1 ................................................................................................................................ 11 6.7 MECHANICAL TEST GROUP 2 ................................................................................................................................ 11 6.8 MECHANICAL TEST GROUP 3 ................................................................................................................................ 12 6.9 MECHANICAL TEST GROUP 4 ................................................................................................................................ 12 6.10 MECHANICAL TEST GROUP 5 ................................................................................................................................ 13 6.11 MECHANICAL TEST GROUP 6 ................................................................................................................................ 13 7.0 PACKAGIG ........................................................................................................................................................ 14 8.1 8.2 CONNECTOR ......................................................................................................................................................... 14 PLUG AND CABLE ASSEMBLY ............................................................................................................................... 14 8.0 GAGES AD FIXTURES .................................................................................................................................... 15 9.0 OTHER IFORMATIO .................................................................................................................................... 16 10.1 10.2 INVERTED SMT APPLICATION ............................................................................................................................... 16 PCB REQUIREMENTS ............................................................................................................................................. 16 REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 2 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 1.0 SCOPE This Product Specification covers the QSFP - Stacked 2X1,2X3 Connector Series 2.0 PRODUCT DESCRIPTION 2.1 PRODUCT NAME AND SERIES NUMBER(S) Product Name: Connector Series: QSFP - Stacked Connector Family 76870, 76871, 76894 2.2 DIMENSION, MATERIALS, PLATING AND MARKINGS See the appropriate sales drawing for information on dimensions, materials, plating, marking, and footprint patterns. 2.3 SAFETY AGENCY APPROVALS UL file: E29179 2.4 PIN ASSIGNMENTS Refer to appropriate sales drawing of the specific part number for the correct pin assignment. 2.5 ADDITIONAL GENERAL SPECIFICATIONS MATERIALS: * Cage: Nickel Silver - Unplated * EMI Springs: Phos-Bronze - Nickel plated * Air-Vents/EMI Shields: Die-cast Alloy - Nickel plated * Light-pipes (if used): Polycarbonate * Signal-Connector Housing: Thermoplastic, 94V-0 * Signal Terminals: Copper Alloy - Hard Gold plated over Nickel 2.6 MATING CONNECTORS Plug & Cable Series: 74547, 74763, 111048 3.0 APPLICABLE DOCUMENTS AND SPECIFICATIONS 3.1 MOLEX DOCUMENTS AS-76870-001 PK-76870-001 PS-45499-002 REVISION: D Application Specification Packaging Specification Cosmetic Specification ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 3 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 3.2 INDUSTRY DOCUMENTS EIA 364 Series EIA 364-1000 Electrical Connector Test Procedures Including Environmental Classifications with Test Procedures Environmental Test Methodology for Assessing the Performance of Connectors and Sockets Used in Business Office Applications 4.0 QUALIFICATION Laboratory condition and sample selection are in accordance with EIA 364 5.0 RATINGS 5.1 VOLTAGE 30 Volts AC (RMS)/DC Max. 5.2 CURRENT 0.5 Amps Max. 5.3 TEMPERATURE Operating: Non-operating: -40C to +85C -55C to +105C 5.4 DURABILITY PL2 #15 - Performance Level 1 - 0.76 m Au - 250 cycles, 10 year Life (FMG) REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 4 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.0 PERFORMANCE (MECHANICAL & ENVIRONMENTAL) 6.1 TEST GROUP 1 ITEM TEST 1 Low Level Contact Resistance 2 Durability (precondition) 3 Temperature Life EIA-364-17, method A, Test Condition 3 at 1052C: 120 hours Mated 4 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. Mated 5 Reseating Manually unplug & plug the connector, 3 cycles 6 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. REVISION: D TEST PROCEDURE EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. CONDITION Mated EIA-364-09; perform plug & unplug cycles: 20 ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 Mated REQUIREMENT ACTUAL baseline N/A No evidence of physical damage PASS None <10 m max <10 m max No evidence of physical damage PASS <10 m max <10 m max PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 5 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.2 TEST GROUP 2 ITEM TEST 1 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 2 Durability (precondition) EIA-364-09; perform plug & unplug cycles: 20 3 Thermal Shock 4 Low Level Contact Resistance TEST PROCEDURE Mated EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. Mated EIA-364-31 Cycle connectors between 25 3C at 80% RH and 65 3 C at 50% RH (24 cycles) Ramp times should be 0.5 hour and dwell should be 1.0 hour. 5 6 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 7 Reseating Manually unplug & plug the connector, 3 cycles 8 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. D Mated EIA-364-32, test condition I (10 cycles): 120 hours Cyclic Temperature & Humidity REVISION: CONDITION ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 REQUIREMENT ACTUAL baseline N/A No evidence of physical damage PASS None <10 m max <10 m max Mated None Mated Mated <10 m max <10 m max No evidence of physical damage PASS <10 m max <10 m max PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 6 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.3 TEST GROUP 3 ITEM TEST 1 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 2 Durability (precondition) EIA-364-09; perform plug & unplug cycles: 20 3 Temperature Life (precondition) EIA-364-17, method A, Test Condition 3 at 1052C 72 hours Mated None 4 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. Mated <10 m max 5 Mechanical Vibration EIA-364-28 test condition VII test condition letter D 15 minutes in each of 3 mutually perpendicular directions. Both mating halves rigidly fixed to not contribute to relative motion of one contact against another. 7 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. REVISION: D TEST PROCEDURE ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 CONDITION Mated REQUIREMENT ACTUAL baseline N/A No evidence of physical damage PASS <10 m max Mated Discontinuity < 1 sec No evidence of physical damage Mated <10 m max PASS <10 m max PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 7 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.4 TEST GROUP 4 ITEM TEST TEST PROCEDURE 1 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 2 Durability (precondition) EIA-364-09; perform plug & unplug cycles: 20 3 Temperature Life (precondition) EIA-364-17, method A, Test Condition 3 at 1052C 72 hours Mated None 4 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. Mated <10 m max 5 Mixed Flowing Gas 6 Low Level Contact Resistance EIA-364-35 class IIA, Option 1A & 1B test condition VII 14 days EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. CONDITION Mated See Note Mated REQUIREMENT ACTUAL baseline N/A No evidence of physical damage PASS <10 m max None <10 m max <10 m max Note: 1. Expose 1/2 of the specimens unmated for 2/3 of the test duration. Mate the specimen to the same one used during preconditioning temperature life. Expose for the duration of the test. 2. Characterize porosity & plating thickness before test sequence. REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 8 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS TEST GROUP 4 (CONTINUED) ITEM TEST TEST PROCEDURE CONDITION 7 Thermal Disturbance Cycle connectors 10 times between 15 3C at 80% RH and 85 3 C at 50% RH. Ramps should be a minimum of 2C per minute and dwell times should insure that the contacts reach the temperature extremes for a minimum of 5 minutes. 8 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 9 Reseating Manually unplug & plug the connector, 3 cycles 10 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 REQUIREMENT ACTUAL Mated None Mated Mated <10 m max <10 m max No evidence of physical damage PASS <10 m max <10 m max PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 9 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.5 TEST GROUP 7 ITEM TEST TEST PROCEDURE 1 Dielectric Withstanding Voltage EIA-364-20; apply a voltage of 300 VDC for 1 minute between adjacent terminals and between adjacent terminals and ground. 2 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 3 Durability EIA-364-09; perform plug & unplug cycles: 250 4 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. 5 Dielectric Withstanding Voltage EIA-364-20; apply a voltage of 300 VDC for 1 minute between adjacent terminals and between adjacent terminals and ground. CONDITION REQUIREMENT ACTUAL Mated No disruptive discharge No leakage current in excess of 5mA PASS baseline N/A No evidence of physical damage PASS Mated <10 m max <10 m max Mated No disruptive discharge No leakage current in excess of 5mA PASS Mated Note: 1. Separate sets of test specimens will be used to access dielectric withstanding voltage and the change in low level contact resistance. 2. Dielectric withstanding voltage testing will use different contacts than those used for low level contact resistance testing. REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 10 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.6 MECHANICAL TEST GROUP 1 ITEM TEST 1 Temperature Rise (via current cycling) TEST PROCEDURE CONDITION Measure the temperature rise at the rated current after 96 hours. (45 minutes ON and 15 minutes OFF). Fixture as required. REQUIREMENT ACTUAL Temperature Rise: +30C maximum 0.3 A min. with < 30C Temperature Rise CONDITION REQUIREMENT ACTUAL Mate 2.5 N / contact pair MAX insertion force 0.5-0.75 N / force Mated 6.7 MECHANICAL TEST GROUP 2 ITEM TEST 1 Connector Mate Forces (Module only) Mate connector at a rate of 25 mm per min. 2 Connector Un-mate Forces (Module only) Un-mate connector at a rate of 25 mm per min. 3 Plug Mate Forces 4 De-Latch Plug (Axial Load) 5 Latch Pull (Axial Load) REVISION: D TEST PROCEDURE Un-mate Mate connector at a rate of 25 mm per min. 0.5 N / contact pair MAX 0.25-0.35 N / contact pair withdrawal force Mate 2.5 N / contact pair plus 50 N MAX 62 N - 82 N Mate connector and place axial load on latch pull to delatch plug Un-mate 0.5 N / contact pair plus 20 N MAX 18 N - 24 N Place axial load on plug pull with 6.35 mm diameter pin Mate ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 25 N MIN No physical damage PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 11 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.8 MECHANICAL TEST GROUP 3 ITEM TEST 1 Terminal Retention Force 2 Normal Force TEST PROCEDURE CONDITION REQUIREMENT ACTUAL Axial pullout force on the terminal in the housing at a rate of 25 mm (1 in) per min. 4.5 N MINIMUM retention force 6.2 N MINIMUM Apply a perpendicular force. 0.49 N, (50 grams) MINIMUM normal force 0.49 N, (50 grams) MINIMUM normal force CONDITION REQUIREMENT ACTUAL 6.9 MECHANICAL TEST GROUP 4 ITEM TEST 1 Latitudinal Load Mate connector and load plug with latitudinal load until open circuit. See section 9. Mated 75 N MIN 90 N (no open circuit) 2 Longitudinal Load Mate connector and load plug with longitudinal load until open circuit. See section 9. Mated 75 N MIN 90 N (no open circuit) 3 Cable Pullout Force (Axial Load) Mate plug to connector and apply an axial pullout force on the wire at a rate of 25 mm per min. 100 N MIN 133 N - 142 N 4 Cable Pullout Force (Right Angle Load) Mate plug to connector and apply an right angle pullout force on the wire at a rate of 25 mm per min. 75 N MIN 125 N - 145 N REVISION: D TEST PROCEDURE ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 Mated Mated PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 12 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 6.10MECHANICAL TEST GROUP 5 ITEM TEST TEST PROCEDURE CONDITION REQUIREMENT ACTUAL 1 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. Mated baseline N/A 2 Wire Flex Flex cable 180 for 20 cycles. Test per EIA 364-41 test cond. I: 24 AWG - with X = 40 mm 26 AWG - with X = 30 mm 28 AWG - with X = 30 mm Mated 10 m MAX (change from initial) No physical damage 20 cycles, no physical damage 3 Low Level Contact Resistance EIA-364-23; apply a maximum voltage of 20 mV and a current of 100 mA. Mated <10 m max <10 m max CONDITION REQUIREMENT ACTUAL 35 N (7.9 LBF) MAX. 1330 N MAX. 9 N (2 lbf) MAX. retention force per pin 342 N MIN. 6.11MECHANICAL TEST GROUP 6 ITEM TEST 1 Compliant Pin Insertion into PCB 2 Compliant Pin Apply an axial extraction force Extraction into on the terminal at a rate of PCB 25 6 mm/min REVISION: D TEST PROCEDURE Apply an axial insertion force on the terminal at a rate of 25 6 mm/min. ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 13 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 7.0 PACKAGING 8.1 CONNECTOR 8.1.1 Product shall be packaged in Trays with Lids placed in Cartons, per the packaging specification as called out on the applicable assembly print. 8.1.2 Packaging shall meet the requirements of and be tested per the packaging specification as called out on the applicable assembly print. 8.2 PLUG AND CABLE ASSEMBLY 8.2.1 Product shall be packaged to protect against damage during handling, transit and storage. REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 14 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 8.0 GAGES AND FIXTURES Test setup for latitudinal and longitudinal load testing and shell retention testing. Probe is about 6mm in diameter with a full radius nose. The probe is to be placed 20mm from the front edge of the receptacle and located at the centerline of the plug. Apply load to plug at a rate of 25mm per minute. Test setup for peel and shear testing. Apply load to plug at a rate of 25mm per minute. PCB QSFP LOAD PLUG LOAD 39.00 PROBE REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 15 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS 9.0 OTHER INFORMATION 10.1INVERTED SMT APPLICATION See AS-75586-001 Application Specification for inverted SMT application. 10.2PCB REQUIREMENTS The compliant pin shall be capable of being inserted one time. The PCB hole shall be capable of retaining the compliant pin for a maximum of three insertions. The removal of the compliant pin from the PCB shall not damage the PCB hole beyond the point to be able to retain a compliant pin (that has not been inserted into a PCB). 0.370 mm Compliant Pin Drilled Hole Size: 1.050 mm Cage Tail Drilled Hole Size: 0.457 mm (# 77 Drill) 1.092 mm (# 57 Drill) COMPLIANT PIN-HOLE DETAIL REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 16 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC PRODUCT SPECIFICATION QSFP+ STACKED CONNECTORS CAGE TAIL HOLE DETAIL Note: Depending upon the plating finish and plating process, a larger drill diameter may be used to achieve the finished hole specification. REVISION: D ECR/ECN INFORMATION: TITLE: EC No: UCP2012-2334 DATE: 2012 / 01 / 25 DOCUMENT NUMBER: PS-76870-001 PRODUCT SPECIFICATION STACKED QSFP+ CONNECTORS SHEET No. 17 of 17 CREATED / REVISED BY: CHECKED BY: APPROVED BY: S. BOGIEL/JGONZALEZ HAVERY M. BANAKIS TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A](V.1).DOC