DC Electrical Characteristics: (VCC = 5V ±5%, TA = 0° to +70°C unless otherwise specified)
Parameter Symbol Test Conditions Min Typ Max Unit
Input Current Iin Note 3 –5.0 –nA
Input High Voltage VIH 2.2 –VCC V
Input Low Voltage VIL –0.3 –0.65 V
Output High Voltage VOH IOH = –1mA 2.4 – – V
Output Low Voltage VOL IOL = 2mA – – 0.4 V
Output Leakage Current ILO CE1 = 2.2V, VOL = 0V to VCC, Note 3 – – ±1.0 µA
Operating Current ICC1 Vin = VCC, except CE1 ≤ 0.65V,
Outputs open –9.0 22 mA
ICC2 Vin = 2.2V, except CE1 ≤ 0.65V,
Outputs open –13 27 mA
Standby Current ICCL CE2 ≤ 0.2V, Note 3, Note 4 – – 10 µA
Note 2. Typical values are TA = +25°C and nominal voltage.
Note 3. Current through all inputs and outputs included in ICCL measurement.
Note 4. Low current state is for CE2 = 0 only.
Capacitance:
Parameter Symbol Test Conditions Min Typ Max Unit
Input Capacitance Cin Vin = 0V –4.0 8.0 pF
Output Capacitance Cout Vout = 0V –8.0 12.0 pF
Note 2. Typical values are TA = +25°C and nominal voltage.
Low VCC Retention Characteristics: (TA = 0° to +70°C unless otherwise specified)
Parameter Symbol Test Conditions Min Typ Max Unit
VCC for Data Retention VDR 2.0 – – V
Data Retention Current ICCDR1 CE2 ≤ 0.2V, VDR = 2V –0.14 10 µA
Chip Deselect to Data Retention Time tCDR 0– – ns
Operation Recovery Time tRNote 5 tRC – – ns
Note 2. Typical values are TA = +25°C and nominal voltage.
Note 5. tRC = Read Cycle Time.
AC Operating Conditions and Characteristics: (Full operating voltage and temperature unless
otherwise specified)
AC Test Conditions: Condition Value
Input Pulse Levels +0.65V to 2.2V
Input Rise and Fall Times 20ns
Output Load –1 TTL Gate and CL = 100pF
Timing Measurement Reference Level 1.5V