2
RF Device Data
NXP Semiconductors
AFM907N
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain--Source Voltage VDSS –0.5, +30 Vdc
Gate--Source Voltage VGS –6.0, +12 Vdc
Operating Voltage VDD 0to12.5 Vdc
Storage Temperature Range Tstg –65 to +150 C
Case Operating Temperature Range TC–40 to +150 C
Operating Junction Temperature (1,2) TJ–40 to +150 C
Total Device Dissipation @ TC=25C
Derate above 25C
PD65.7
0.52
W
W/C
Table 2. Thermal Characteristics
Characteristic Symbol Value (2,3) Unit
Thermal Resistance, Junction to Case
Case Temperature 79C, 7.4 W CW, 7.5 Vdc, IDQ = 100 mA, 520 MHz
RJC 1.9 C/W
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22--A114) 1C, passes 1000 V
Charge Device Model (per JESD22--C101) C3, passes 2000 V
Table 4. Moisture Sensitivity Level
Test Methodology Rating Package Peak Temperature Unit
Per JESD22--A113, IPC/JEDEC J--STD--020 3260 C
Table 5. Electrical Characteristics (TA=25C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(VDS =30Vdc,V
GS =0Vdc)
IDSS — — 10 Adc
Zero Gate Voltage Drain Leakage Current
(VDS =7.5Vdc,V
GS =0Vdc)
IDSS — — 2 Adc
Gate--Source Leakage Current
(VGS =5Vdc,V
DS =0Vdc)
IGSS — — 1 nAdc
On Characteristics
Gate Threshold Voltage
(VDS =10Vdc,I
D=110Adc)
VGS(th) 1.6 2.1 2.6 Vdc
Drain--Source On--Voltage
(VGS =10Vdc,I
D=1.1Adc)
VDS(on) —0.12 —Vdc
Forward Transconductance
(VDS =7.5Vdc,I
D=3Adc)
gfs —9.8 — S
Dynamic Characteristics
Reverse Transfer Capacitance
(VDS =7.5Vdc30 mV(rms)ac @ 1 MHz, VGS =0Vdc)
Crss —2.4 —pF
Output Capacitance
(VDS =7.5Vdc30 mV(rms)ac @ 1 MHz, VGS =0Vdc)
Coss —55.2 —pF
Input Capacitance
(VDS =7.5Vdc,V
GS =0Vdc30 mV(rms)ac @ 1 MHz)
Ciss —95.7 —pF
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.nxp.com/RF/calculators.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.
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