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Blackfin
Embedded Processor
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Rev. B Document Feedback
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FEATURES
Up to 400 MHz high performance Blackfin processor
Two 16-bit MACs, two 40-bit ALUs, four 8-bit video ALUs,
40-bit shifter
RISC-like register and instruction model for ease of
programming and compiler-friendly support
Advanced debug, trace, and performance monitoring
Accepts a range of supply voltages for internal and I/O opera-
tions. See Operating Conditions on Page 26
Internal 32M bit flash (available on ADSP-BF504F and
ADSP-BF506F processors)
Internal ADC (available on ADSP-BF506F processor)
Off-chip voltage regulator interface
88-lead (12 mm × 12 mm) LFCSP package for ADSP-BF504
and ADSP-BF504F processors
120-lead (14 mm × 14 mm) LQFP package for ADSP-BF506F
processor
MEMORY
68K bytes of L1 SRAM (processor core-accessible) memory
(See Table 1 on Page 3 for L1 and L3 memory size details)
External (interface-accessible) memory controller with glue-
less support for internal 32M bit flash and boot ROM
Flexible booting options from internal flash and SPI memory
or from host devices including SPI, PPI, and UART
Memory management unit providing memory protection
PERIPHERALS
Two 32-bit up/down counters with rotary support
Eight 32-bit timers/counters with PWM support
Two 3-phase 16-bit center-based PWM units
2 dual-channel, full-duplex synchronous serial ports
(SPORTs), supporting eight stereo I
2
S channels
2 serial peripheral interface (SPI) compatible ports
2 UARTs with IrDA support
Parallel peripheral interface (PPI), supporting ITU-R 656
video data formats
Removable storage interface (RSI) controller for MMC, SD,
SDIO, and CE-ATA
Internal ADC with 12 channels, 12 bits, and up to 2 MSPS
ADC controller module (ACM), providing a glueless interface
between Blackfin processor and internal or external ADC
Controller Area Network (CAN) controller
2-wire interface (TWI) controller
12 peripheral DMAs
2 memory-to-memory DMA channels
Event handler with 52 interrupt inputs
35 general-purpose I/Os (GPIOs), with programmable
hysteresis
Debug/JTAG interface
On-chip PLL capable of frequency multiplication
Figure 1. Processor Block Diagram
SPORT1–0
VOLTAGE REGULATOR INTERFACE
GPIO
PORT F
PORT G
PORT H
JTAG TEST AND EMULATION
PERIPHERAL
ACCESS BUS
PWM 1–0
WATCHDOG TIMER
SPI1–0
RSI
ACM
PPI
CAN
COUNTER1–0
TWI
BOOT
ROM
DMA
ACCESS
BUS
INTERRUPT
CONTROLLER
DMA
CONTROLLER
L1 DATA
MEMORY
L1 INSTRUCTION
MEMORY
16
DCB
EAB
MEMORY PORT
FLASH CONTROL
B
UART1–0
DEB
32M BIT
FLASH
TIMER7–0
ADC
Rev. B | Page 2 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
TABLE OF CONTENTS
Features ................................................................. 1
Memory ................................................................ 1
Peripherals ............................................................. 1
General Description ................................................. 3
Portable Low-Power Architecture ............................. 3
System Integration ................................................ 3
Processor Peripherals ............................................. 3
Blackfin Processor Core .......................................... 4
Memory Architecture ............................................ 5
Flash Memory ...................................................... 9
DMA Controllers .................................................. 9
Watchdog Timer .................................................. 9
Timers ............................................................... 9
Up/Down Counters and Thumbwheel Interfaces ........ 10
3-Phase PWM Units ............................................ 10
Serial Ports ........................................................ 10
Serial Peripheral Interface (SPI) Ports ...................... 11
UART Ports (UARTs) .......................................... 11
Parallel Peripheral Interface (PPI) ........................... 11
RSI Interface ...................................................... 12
Controller Area Network (CAN) Interface ................ 12
TWI Controller Interface ...................................... 13
Ports ................................................................ 13
Dynamic Power Management ................................ 13
ADSP-BF50x Voltage Regulation ............................ 15
Clock Signals ..................................................... 15
Booting Modes ................................................... 16
Instruction Set Description ................................... 17
Development Tools ............................................. 17
ADC and ACM Interface ...................................... 18
Internal ADC ..................................................... 20
ADC Application Hints ........................................ 21
Additional Information ........................................ 21
Related Signal Chains ........................................... 21
Signal Descriptions ................................................. 22
Specifications ........................................................ 26
Operating Conditions ........................................... 26
Electrical Characteristics ....................................... 28
ProcessorAbsolute Maximum Ratings ................... 31
ESD Sensitivity ................................................... 32
Package Information ............................................ 32
ProcessorTiming Specifications ........................... 33
ProcessorOutput Drive Currents .......................... 50
ProcessorTest Conditions ................................... 51
ProcessorEnvironmental Conditions ..................... 53
FlashSpecifications .............................................. 54
Flash—Program and Erase Times and Endurance
Cycles ............................................................ 54
FlashAbsolute Maximum Ratings ......................... 54
ADCSpecifications ............................................... 55
ADCOperating Conditions ................................. 55
ADCTiming Specifications ................................. 58
ADCAbsolute Maximum Ratings ......................... 58
ADCTypical Performance Characteristics .............. 59
ADCTerminology ............................................ 61
ADCTheory of Operation ................................... 62
ADCModes of Operation ................................... 68
ADCSerial Interface .......................................... 71
120-Lead LQFP Lead Assignment ............................... 73
88-Lead LFCSP Lead Assignment ............................... 76
Outline Dimensions ................................................ 79
Automotive Products .............................................. 81
Ordering Guide ..................................................... 81
REVISION HISTORY
04/14—Rev. A to Rev. B
Updated Development Tools .................................... 17
Corrected RCKFE bit setting and description in
Table 9, The SPORTx Receive Configuration 1 Register
(SPORTx_RCR1) ................................................... 19
Updated footnote 6 in Operating Conditions ................ 26
Updated Table 18 with revised data for
Static CurrentIDD-DEEPSLEEP (mA) ..................... 30
Revised package diagram (Figure 93) to include U-Groove in
Outline Dimensions ................................................ 79
Package thickness changed from 0.75/0.80/0.85 to
0.75/0.85/0.90 in Figure 94 in Outline Dimensions ......... 79
Rev. B | Page 3 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
GENERAL DESCRIPTION
The ADSP-BF50x processors are members of the Blackfin
®
fam-
ily of products, incorporating the Analog Devices/Intel Micro
Signal Architecture (MSA). Blackfin processors combine a dual-
MAC state-of-the-art signal processing engine, the advantages
of a clean, orthogonal RISC-like microprocessor instruction set,
and single-instruction, multiple-data (SIMD) multimedia capa-
bilities into a single instruction-set architecture.
The ADSP-BF50x processors are completely code compatible
with other Blackfin processors. ADSP-BF50x processors offer
performance up to 400 MHz and reduced static power con-
sumption. Differences with respect to peripheral combinations
are shown in Table 1.
By integrating a rich set of industry-leading system peripherals
and memory, Blackfin processors are the platform of choice for
next-generation applications that require RISC-like program-
mability, multimedia support, and leading-edge signal
processing in one integrated package.
PORTABLE LOW-POWER ARCHITECTURE
Blackfin processors provide world-class power management
and performance. They are produced with a low power and low
voltage design methodology and feature on-chip dynamic
power management, which provides the ability to vary both the
voltage and frequency of operation to significantly lower overall
power consumption. This capability can result in a substantial
reduction in power consumption, compared with just varying
the frequency of operation. This allows longer battery life for
portable appliances.
SYSTEM INTEGRATION
The ADSP-BF50x processors are highly integrated system-on-a-
chip solutions for the next generation of embedded industrial,
instrumentation, and power/motion control applications. By
combining industry-standard interfaces with a high perfor-
mance signal processing core, cost-effective applications can be
developed quickly, without the need for costly external compo-
nents. The system peripherals include a watchdog timer; two
32-bit up/down counters with rotary support; eight 32-bit tim-
ers/counters with PWM support; six pairs of 3-phase 16-bit
center-based PWM units; two dual-channel, full-duplex syn-
chronous serial ports (SPORTs); two serial peripheral interface
(SPI) compatible ports; two UARTs with IrDA
®
support; a par-
allel peripheral interface (PPI); a removable storage interface
(RSI) controller; an internal ADC with 12 channels, 12 bits, up
to 2 MSPS, and ACM controller; a controller area network
(CAN) controller; a 2-wire interface (TWI) controller; and an
internal 32M bit flash.
PROCESSOR PERIPHERALS
The ADSP-BF50x processors contain a rich set of peripherals
connected to the core via several high-bandwidth buses, provid-
ing flexibility in system configuration as well as excellent overall
system performance (see the block diagram on Page 1). These
Blackfin processors contain high-speed serial and parallel ports,
an interrupt controller for flexible management of interrupts
from the on-chip peripherals or external sources, and power
management control functions to tailor the performance and
power characteristics of the processor and system to many
application scenarios.
The SPORT, SPI, UART, PPI, and RSI peripherals are sup-
ported by a flexible DMA structure. There are also separate
memory DMA channels dedicated to data transfers between the
processor’s various memory spaces, including boot ROM and
internal 32M bit synchronous burst flash. Multiple on-chip
buses running at up to 100 MHz provide enough bandwidth to
keep the processor core running along with activity on all of the
on-chip and external peripherals.
The ADSP-BF50x processors include an interface to an off-chip
voltage regulator in support of the processor’s dynamic power
management capability.
Table 1. Processor Comparison
Feature
ADSP-BF504
ADSP-BF504F
ADSP-BF506F
Up/Down/Rotary Counters 2 2 2
Timer/Counters with PWM 8 8 8
3-Phase PWM Units 2 2 2
SPORTs 2 2 2
SPIs 2 2 2
UARTs 2 2 2
Parallel Peripheral Interface 1 1 1
Removable Storage Interface 1 1 1
CAN 1 1 1
TWI 1 1 1
Internal 32M Bit Flash 1 1
ADC Control Module (ACM) 1 1 1
Internal ADC 1
GPIOs 35 35 35
Memory (bytes)
L1 Instruction SRAM 16K 16K 16K
L1 Instruction SRAM/Cache 16K 16K 16K
L1 Data SRAM 16K 16K 16K
L1 Data SRAM/Cache 16K 16K 16K
L1 Scratchpad 4K 4K 4K
L3 Boot ROM 4K 4K 4K
Maximum Speed Grade
1
1
For valid clock combinations, see Table 14, Table 15, Table 16, and Table 24.
400 MHz
Maximum System Clock Speed 100 MHz
Package Options 88-Lead
LFCSP
88-Lead
LFCSP
120-Lead
LQFP
Rev. B | Page 4 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
BLACKFIN PROCESSOR CORE
As shown in Figure 2, the Blackfin processor core contains two
16-bit multipliers, two 40-bit accumulators, two 40-bit ALUs,
four video ALUs, and a 40-bit shifter. The computation units
process 8-, 16-, or 32-bit data from the register file.
The compute register file contains eight 32-bit registers. When
performing compute operations on 16-bit operand data, the
register file operates as 16 independent 16-bit registers. All
operands for compute operations come from the multiported
register file and instruction constant fields.
Each MAC can perform a 16-bit by 16-bit multiply in each
cycle, accumulating the results into the 40-bit accumulators.
Signed and unsigned formats, rounding, and saturation
are supported.
The ALUs perform a traditional set of arithmetic and logical
operations on 16-bit or 32-bit data. In addition, many special
instructions are included to accelerate various signal processing
tasks. These include bit operations such as field extract and pop-
ulation count, modulo 2
32
multiply, divide primitives, saturation
and rounding, and sign/exponent detection. The set of video
instructions include byte alignment and packing operations,
16-bit and 8-bit adds with clipping, 8-bit average operations,
and 8-bit subtract/absolute value/accumulate (SAA) operations.
Also provided are the compare/select and vector search
instructions.
For certain instructions, two 16-bit ALU operations can be per-
formed simultaneously on register pairs (a 16-bit high half and
16-bit low half of a compute register). If the second ALU is used,
quad 16-bit operations are possible.
The 40-bit shifter can perform shifts and rotates and is used
to support normalization, field extract, and field deposit
instructions.
The program sequencer controls the flow of instruction execu-
tion, including instruction alignment and decoding. For
program flow control, the sequencer supports PC relative and
indirect conditional jumps (with static branch prediction), and
subroutine calls. Hardware is provided to support zero-over-
head looping. The architecture is fully interlocked, meaning that
the programmer need not manage the pipeline when executing
instructions with data dependencies.
The address arithmetic unit provides two addresses for simulta-
neous dual fetches from memory. It contains a multiported
register file consisting of four sets of 32-bit index, modify,
length, and base registers (for circular buffering), and eight
additional 32-bit pointer registers (for C-style indexed stack
manipulation).
Figure 2. Blackfin Processor Core
SEQUENCER
ALIGN
DECODE
LOOP BUFFER
16 16
8888
40 40
A0 A1
BARREL
SHIFTER
DATA ARITHMETIC UNIT
CONTROL
UNIT
R7.H
R6.H
R5.H
R4.H
R3.H
R2.H
R1.H
R0.H
R7.L
R6.L
R5.L
R4.L
R3.L
R2.L
R1.L
R0.L
ASTAT
40 40
32 32
32
32
32
32
32LD0
LD1
SD
DAG0
DAG1
ADDRESS ARITHMETIC UNIT
I3
I2
I1
I0
L3
L2
L1
L0
B3
B2
B1
B0
M3
M2
M1
M0
SP
FP
P5
P4
P3
P2
P1
P0
DA1
DA0
32
32
32
PREG
RAB
32
TO MEMORY
Rev. B | Page 5 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Blackfin processors support a modified Harvard architecture in
combination with a hierarchical memory structure. Level 1 (L1)
memories are those that typically operate at the full processor
speed with little or no latency. At the L1 level, the instruction
memory holds instructions only. The data memory holds data,
and a dedicated scratchpad data memory stores stack and local
variable information.
In addition, multiple L1 memory blocks are provided, offering a
configurable mix of SRAM and cache. The memory manage-
ment unit (MMU) provides memory protection for individual
tasks that may be operating on the core and can protect system
registers from unintended access.
The architecture provides three modes of operation: user mode,
supervisor mode, and emulation mode. User mode has
restricted access to certain system resources, thus providing a
protected software environment, while supervisor mode has
unrestricted access to the system and core resources.
The Blackfin processor instruction set has been optimized so
that 16-bit opcodes represent the most frequently used instruc-
tions, resulting in excellent compiled code density. Complex
DSP instructions are encoded into 32-bit opcodes, representing
fully featured multifunction instructions. Blackfin processors
support a limited multi-issue capability, where a 32-bit instruc-
tion can be issued in parallel with two 16-bit instructions,
allowing the programmer to use many of the core resources in a
single instruction cycle.
The Blackfin processor assembly language uses an algebraic syn-
tax for ease of coding and readability. The architecture has been
optimized for use in conjunction with the C/C++ compiler,
resulting in fast and efficient software implementations.
MEMORY ARCHITECTURE
The Blackfin processor views memory as a single unified
4G byte address space, using 32-bit addresses. All resources,
including internal memory, external memory, and I/O control
registers, occupy separate sections of this common address
space. The memory portions of this address space are arranged
in a hierarchical structure to provide a good cost/performance
balance of some very fast, low latency core-accessible memory
as cache or SRAM and to provide larger, lower cost and perfor-
mance interface-accessible memory systems. See Figure 3.
The core-accessible L1 memory system is the highest perfor-
mance memory available to the Blackfin processor. The
interface-accessible memory system, accessed through the
external bus interface unit (EBIU), provides access to the inter-
nal flash memory and boot ROM.
The memory DMA controller provides high bandwidth data
movement capability. It can perform block transfers of code
or data between the internal memory and the external
memory spaces.
Internal (Core-Accessible) Memory
The processor has three blocks of core-accessible memory,
providing high-bandwidth access to the core.
The first block is the L1 instruction memory, consisting of
32K bytes SRAM, of which 16K bytes can be configured as a
four-way set-associative cache. This memory is accessed at full
processor speed.
The second core-accessible memory block is the L1 data mem-
ory, consisting of 32K bytes of SRAM, of which 16K bytes may
be configured as cache. This memory block is accessed at full
processor speed.
The third memory block is 4K bytes of scratchpad SRAM, which
runs at the same speed as the L1 memories, but this memory is
only accessible as data SRAM and cannot be configured as cache
memory.
External (Interface-Accessible) Memory
External memory is accessed via the EBIU memory port. This
16-bit interface provides a glueless connection to the internal
flash memory and boot ROM. Internal flash memory ships from
the factory in an erased state except for Block 0 of the parameter
bank. Block 0 of the Flash memory parameter bank ships from
the factory in an unknown state. An erase operation should be
performed prior to programming this block.
I/O Memory Space
The processor does not define a separate I/O space. All
resources are mapped through the flat 32-bit address space.
On-chip I/O devices have their control registers mapped into
memory-mapped registers (MMRs) at addresses near the top of
the 4G byte address space. These are separated into two smaller
blocks. One contains the control MMRs for all core functions,
and the other contains the registers needed for setup and con-
trol of the on-chip peripherals outside of the core. The MMRs
are accessible only in supervisor and emulation modes and
appear as reserved space to on-chip peripherals.
Figure 3. Internal/External Memory Map
INTERNAL
(CORE-ACCESSIBLE)
MEMORY MAP
EXTERNAL
(INTERFACE-ACCESSIBLE)
MEMORY MAP
0x0000 0000
0x2000 0000
0x2040 0000
0xEF00 0000
0xEF00 1000
0xFF80 0000
0xFF80 4000
0xFF80 8000
0xFFA0 0000
0xFFA0 4000
0xFFA0 8000
0xFFA1 4000
0xFFB0 0000
0xFFB0 1000
0xFFC0 0000
0xFFE0 0000
0xFFFF FFFF
SYNC FLASH (32M BITS) *
RESERVED
RESERVED
BOOT ROM (4K BYTES)
L1 DATA BANK A SRAM (16K BYTES)
RESERVED
L1 DATA BANK A SRAM/CACHE (16K BYTES)
RESERVED
L1 INSTRUCTION SRAM/CACHE (16K BYTES)
RESERVED
L1 INSTRUCTION BANK A SRAM (16K BYTES)
RESERVED
INTERNAL SCRATCHPAD RAM (4K BYTES)
RESERVED
SYSTEM MEMORY MAPPED REGISTERS
CORE MEMORY MAPPED REGISTERS
* AVAILABLE ON PARTS WITH SYNC FLASH (F)
Rev. B | Page 6 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Booting
The processor contains a small on-chip boot kernel, which con-
figures the appropriate peripheral for booting. If the processor is
configured to boot from boot ROM memory space, the proces-
sor starts executing from the on-chip boot ROM. For more
information, see Booting Modes on Page 16.
Event Handling
The event controller on the processor handles all asynchronous
and synchronous events to the processor. The processor pro-
vides event handling that supports both nesting and
prioritization. Nesting allows multiple event service routines to
be active simultaneously. Prioritization ensures that servicing of
a higher priority event takes precedence over servicing of a
lower priority event. The controller provides support for five
different types of events:
Emulation—An emulation event causes the processor to
enter emulation mode, allowing command and control of
the processor via the JTAG interface.
Reset—This event resets the processor.
Nonmaskable Interrupt (NMI)—The NMI event can be
generated either by the software watchdog timer, by the
NMI input signal to the processor, or by software. The
NMI event is frequently used as a power-down indicator to
initiate an orderly shutdown of the system.
Exceptions—Events that occur synchronously to program
flow (in other words, the exception is taken before the
instruction is allowed to complete). Conditions such as
data alignment violations and undefined instructions cause
exceptions.
Interrupts—Events that occur asynchronously to program
flow. They are caused by input signals, timers, and other
peripherals, as well as by an explicit software instruction.
Each event type has an associated register to hold the return
address and an associated return-from-event instruction. When
an event is triggered, an interrupt service routine (ISR) must
save the state of the processor to the supervisor stack.
The processor event controller consists of two stages: the core
event controller (CEC) and the system interrupt controller
(SIC). The core event controller works with the system interrupt
controller to prioritize and control all system events. Conceptu-
ally, interrupts from the peripherals enter into the SIC and are
then routed directly into the general-purpose interrupts of the
CEC.
Core Event Controller (CEC)
The CEC supports nine general-purpose interrupts (IVG15–7),
in addition to the dedicated interrupt and exception events. Of
these general-purpose interrupts, the two lowest-priority
interrupts (IVG15–14) are recommended to be reserved for
software interrupt handlers, leaving seven prioritized interrupt
inputs to support the peripherals of the processor. Table 2
describes the inputs to the CEC, identifies their names in the
event vector table (EVT), and lists their priorities.
System Interrupt Controller (SIC)
The system interrupt controller provides the mapping and
routing of events from the many peripheral interrupt sources to
the prioritized general-purpose interrupt inputs of the CEC.
Although the processor provides a default mapping, the user
can alter the mappings and priorities of interrupt events by
writing the appropriate values into the interrupt assignment
registers (SIC_IARx). Table 3 describes the inputs into the SIC
and the default mappings into the CEC.
Table 2. Core Event Controller (CEC)
Priority
(0 is Highest) Event Class EVT Entry
0Emulation/Test ControlEMU
1 Reset RST
2 Nonmaskable Interrupt NMI
3Exception EVX
4 Reserved
5 Hardware Error IVHW
6 Core Timer IVTMR
7 General-Purpose Interrupt 7 IVG7
8 General-Purpose Interrupt 8 IVG8
9 General-Purpose Interrupt 9 IVG9
10 General-Purpose Interrupt 10 IVG10
11 General-Purpose Interrupt 11 IVG11
12 General-Purpose Interrupt 12 IVG12
13 General-Purpose Interrupt 13 IVG13
14 General-Purpose Interrupt 14 IVG14
15 General-Purpose Interrupt 15 IVG15
Rev. B | Page 7 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 3. System Interrupt Controller (SIC)
Peripheral Interrupt Source
General-Purpose
Interrupt (at Reset)
Peripheral
Interrupt ID
Default Core
Interrupt ID SIC Registers
PLL Wakeup Interrupt IVG7 0 0 IAR0 IMASK0, ISR0, IWR0
DMA Error (generic) IVG7 1 0 IAR0 IMASK0, ISR0, IWR0
PPI Status IVG7 2 0 IAR0 IMASK0, ISR0, IWR0
SPORT0 Status IVG7 3 0 IAR0 IMASK0, ISR0, IWR0
SPORT1 Status IVG7 4 0 IAR0 IMASK0, ISR0, IWR0
UART0 Status IVG7 5 0 IAR0 IMASK0, ISR0, IWR0
UART1 Status IVG7 6 0 IAR0 IMASK0, ISR0, IWR0
SPI0 Status IVG7 7 0 IAR0 IMASK0, ISR0, IWR0
SPI1 Status IVG7 8 0 IAR1 IMASK0, ISR0, IWR0
CAN Status IVG7 9 0 IAR1 IMASK0, ISR0, IWR0
RSI Mask 0 Interrupt IVG7 10 0 IAR1 IMASK0, ISR0, IWR0
Reserved 11 IAR1 IMASK0, ISR0, IWR0
CNT0 Interrupt IVG8 12 1 IAR1 IMASK0, ISR0, IWR0
CNT1 Interrupt IVG8 13 1 IAR1 IMASK0, ISR0, IWR0
DMA Channel 0 (PPI Rx/Tx) IVG9 14 2 IAR1 IMASK0, ISR0, IWR0
DMA Channel 1 (RSI Rx/Tx) IVG9 15 2 IAR1 IMASK0, ISR0, IWR0
DMA Channel 2 (SPORT0 Rx) IVG9 16 2 IAR2 IMASK0, ISR0, IWR0
DMA Channel 3 (SPORT0 Tx) IVG9 17 2 IAR2 IMASK0, ISR0, IWR0
DMA Channel 4 (SPORT1 Rx) IVG9 18 2 IAR2 IMASK0, ISR0, IWR0
DMA Channel 5 (SPORT1 Tx) IVG9 19 2 IAR2 IMASK0, ISR0, IWR0
DMA Channel 6 (SPI0 Rx/Tx) IVG10 20 3 IAR2 IMASK0, ISR0, IWR0
DMA Channel 7 (SPI1 Rx/Tx) IVG10 21 3 IAR2 IMASK0, ISR0, IWR0
DMA Channel 8 (UART0 Rx) IVG10 22 3 IAR2 IMASK0, ISR0, IWR0
DMA Channel 9 (UART0 Tx) IVG10 23 3 IAR2 IMASK0, ISR0, IWR0
DMA Channel 10 (UART1 Rx) IVG10 24 3 IAR3 IMASK0, ISR0, IWR0
DMA Channel 11 (UART1 Tx) IVG10 25 3 IAR3 IMASK0, ISR0, IWR0
CAN Receive IVG11 26 4 IAR3 IMASK0, ISR0, IWR0
CAN Transmit IVG11 27 4 IAR3 IMASK0, ISR0, IWR0
TWI IVG11 28 4 IAR3 IMASK0, ISR0, IWR0
Port F Interrupt A IVG11 29 4 IAR3 IMASK0, ISR0, IWR0
Port F Interrupt B IVG11 30 4 IAR3 IMASK0, ISR0, IWR0
Reserved 31 IAR3 IMASK0, ISR0, IWR0
Timer 0 IVG12 32 5 IAR4 IMASK1, ISR1, IWR1
Timer 1 IVG12 33 5 IAR4 IMASK1, ISR1, IWR1
Timer 2 IVG12 34 5 IAR4 IMASK1, ISR1, IWR1
Timer 3 IVG12 35 5 IAR4 IMASK1, ISR1, IWR1
Timer 4 IVG12 36 5 IAR4 IMASK1, ISR1, IWR1
Timer 5 IVG12 37 5 IAR4 IMASK1, ISR1, IWR1
Timer 6 IVG12 38 5 IAR4 IMASK1, ISR1, IWR1
Timer 7 IVG12 39 5 IAR4 IMASK1, ISR1, IWR1
Port G Interrupt A IVG12 40 5 IAR5 IMASK1, ISR1, IWR1
Port G Interrupt B IVG12 41 5 IAR5 IMASK1, ISR1, IWR1
MDMA Stream 0 IVG13 42 6 IAR5 IMASK1, ISR1, IWR1
Rev. B | Page 8 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Event Control
The processor provides a very flexible mechanism to control the
processing of events. In the CEC, three registers are used to
coordinate and control events. Each register is 16 bits wide.
CEC interrupt latch register (ILAT)—Indicates when
events have been latched. The appropriate bit is set when
the processor has latched the event and is cleared when the
event has been accepted into the system. This register is
updated automatically by the controller, but it may be writ-
ten only when its corresponding IMASK bit is cleared.
CEC interrupt mask register (IMASK)—Controls the
masking and unmasking of individual events. When a bit is
set in the IMASK register, that event is unmasked and is
processed by the CEC when asserted. A cleared bit in the
IMASK register masks the event, preventing the processor
from servicing the event even though the event may be
latched in the ILAT register. This register may be read or
written while in supervisor mode. (Note that general-
purpose interrupts can be globally enabled and disabled
with the STI and CLI instructions, respectively.)
CEC interrupt pending register (IPEND)—The IPEND
register keeps track of all nested events. A set bit in the
IPEND register indicates the event is currently active or
nested at some level. This register is updated automatically
by the controller but may be read while in supervisor mode.
The SIC allows further control of event processing by providing
three pairs of 32-bit interrupt control and status registers. Each
register contains a bit, corresponding to each of the peripheral
interrupt events shown in Table 3 on Page 7.
SIC interrupt mask registers (SIC_IMASKx)—Control the
masking and unmasking of each peripheral interrupt event.
When a bit is set in these registers, the corresponding
peripheral event is unmasked and is forwarded to the CEC
when asserted. A cleared bit in these registers masks the
corresponding peripheral event, preventing the event from
propagating to the CEC.
SIC interrupt status registers (SIC_ISRx)—As multiple
peripherals can be mapped to a single event, these registers
allow the software to determine which peripheral event
source triggered the interrupt. A set bit indicates that the
peripheral is asserting the interrupt, and a cleared bit indi-
cates that the peripheral is not asserting the event.
SIC interrupt wakeup enable registers (SIC_IWRx)—By
enabling the corresponding bit in these registers, a periph-
eral can be configured to wake up the processor should the
core be idled or in sleep mode when the event is generated.
For more information, see Dynamic Power Management
on Page 13.
Because multiple interrupt sources can map to a single general-
purpose interrupt, multiple pulse assertions can occur simulta-
neously, before or during interrupt processing for an interrupt
event already detected on this interrupt input. The IPEND reg-
ister contents are monitored by the SIC as the interrupt
acknowledgement.
The appropriate ILAT register bit is set when an interrupt rising
edge is detected (detection requires two core clock cycles). The
bit is cleared when the respective IPEND register bit is set. The
IPEND bit indicates that the event has entered into the proces-
sor pipeline. At this point the CEC recognizes and queues the
next rising edge event on the corresponding event input. The
minimum latency from the rising edge transition of the general-
purpose interrupt to the IPEND output asserted is three core
clock cycles; however, the latency can be much higher, depend-
ing on the activity within and the state of the processor.
MDMA Stream 1 IVG13 43 6 IAR5 IMASK1, ISR1, IWR1
Software Watchdog Timer IVG13 44 6 IAR5 IMASK1, ISR1, IWR1
Port H Interrupt A IVG13 45 6 IAR5 IMASK1, ISR1, IWR1
Port H Interrupt B IVG13 46 6 IAR5 IMASK1, ISR1, IWR1
ACM Status Interrupt IVG7 47 0 IAR5 IMASK1, ISR1, IWR1
ACM Interrupt IVG10 48 3 IAR6 IMASK1, ISR1, IWR1
Reserved 49 IAR6 IMASK1, ISR1, IWR1
Reserved 50 IAR6 IMASK1, ISR1, IWR1
PWM0 Trip Interrupt IVG10 51 3 IAR6 IMASK1, ISR1, IWR1
PWM0 Sync Interrupt IVG10 52 3 IAR6 IMASK1, ISR1, IWR1
PWM1 Trip Interrupt IVG10 53 3 IAR6 IMASK1, ISR1, IWR1
PWM1 Sync Interrupt IVG10 54 3 IAR6 IMASK1, ISR1, IWR1
RSI Mask 1 Interrupt IVG10 55 3 IAR6 IMASK1, ISR1, IWR1
Reserved 56 through 63 IMASK1, ISR1, IWR1
Table 3. System Interrupt Controller (SIC) (Continued)
Peripheral Interrupt Source
General-Purpose
Interrupt (at Reset)
Peripheral
Interrupt ID
Default Core
Interrupt ID SIC Registers
Rev. B | Page 9 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
FLASH MEMORY
The ADSP-BF504F and ADSP-BF506F processors include an
on-chip 32M bit (×16, multiple bank, burst) Flash memory. The
features of this memory include:
Synchronous/asynchronous read
Synchronous burst read mode: 50 MHz
Asynchronous/synchronous read mode
Random access times: 70 ns
Synchronous burst read suspend
Memory blocks
Multiple bank memory array: 4M bit banks
Parameter blocks (top location)
•Dual operations
Program erase in one bank while read in others
No delay between read and write operations
Block locking
All blocks locked at power-up
Any combination of blocks can be locked or locked
down
•Security
128-bit user programmable OTP cells
64-bit unique device number
Common Flash interface (CFI)
100,000 program/erase cycles per block
Flash memory ships from the factory in an erased state except
for block 0 of the parameter bank. Block 0 of the Flash memory
parameter bank ships from the factory in an unknown state. An
erase operation should be performed prior to programming this
block.
DMA CONTROLLERS
The processor has multiple, independent DMA channels that
support automated data transfers with minimal overhead for
the processor core. DMA transfers can occur between the pro-
cessor’s internal memories and any of its DMA-capable
peripherals. Additionally, DMA transfers can be accomplished
between any of the DMA-capable peripherals and external
devices connected to the external memory interface. DMA-
capable peripherals include the SPORTs, SPI ports, UARTs,
RSI, and PPI. Each individual DMA-capable peripheral has at
least one dedicated DMA channel.
The processor DMA controller supports both one-dimensional
(1-D) and two-dimensional (2-D) DMA transfers. DMA trans-
fer initialization can be implemented from registers or from sets
of parameters called descriptor blocks.
The 2-D DMA capability supports arbitrary row and column
sizes up to 64K elements by 64K elements, and arbitrary row
and column step sizes up to ±32K elements. Furthermore, the
column step size can be less than the row step size, allowing
implementation of interleaved data streams. This feature is
especially useful in video applications where data can be de-
interleaved on the fly.
Examples of DMA types supported by the processor DMA con-
troller include:
A single, linear buffer that stops upon completion
A circular, auto-refreshing buffer that interrupts on each
full or fractionally full buffer
1-D or 2-D DMA using a linked list of descriptors
2-D DMA using an array of descriptors, specifying only the
base DMA address within a common page
In addition to the dedicated peripheral DMA channels, there are
two memory DMA channels, which are provided for transfers
between the various memories of the processor system with
minimal processor intervention. Memory DMA transfers can be
controlled by a very flexible descriptor-based methodology or
by a standard register-based autobuffer mechanism.
WATCHDOG TIMER
The processor includes a 32-bit timer that can be used to imple-
ment a software watchdog function. A software watchdog can
improve system availability by forcing the processor to a known
state through generation of a core and system reset, nonmas-
kable interrupt (NMI), or general-purpose interrupt, if the
timer expires before being reset by software. The programmer
initializes the count value of the timer, enables the appropriate
interrupt, then enables the timer. Thereafter, the software must
reload the counter before it counts to zero from the pro-
grammed value. This protects the system from remaining in an
unknown state where software, which would normally reset the
timer, has stopped running due to an external noise condition
or software error.
If configured to generate a reset, the watchdog timer resets both
the core and the processor peripherals. After a reset, software
can determine whether the watchdog was the source of the
hardware reset by interrogating a status bit in the watchdog
timer control register.
The timer is clocked by the system clock (SCLK) at a maximum
frequency of f
SCLK
.
TIMERS
There are nine general-purpose programmable timer units in
the processors. Eight timers have an external pin that can be
configured either as a pulse width modulator (PWM) or timer
output, as an input to clock the timer, or as a mechanism for
measuring pulse widths and periods of external events. These
timers can be synchronized to an external clock input to the sev-
eral other associated PF pins, to an external clock input to the
PPI_CLK input pin, or to the internal SCLK.
The timer units can be used in conjunction with the two UARTs
to measure the width of the pulses in the data stream to provide
a software auto-baud detect function for the respective serial
channels.
Rev. B | Page 10 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
The timers can generate interrupts to the processor core provid-
ing periodic events for synchronization, either to the system
clock or to a count of external signals.
In addition to the eight general-purpose programmable timers,
a ninth timer is also provided. This extra timer is clocked by the
internal processor clock and is typically used as a system tick
clock for generation of operating system periodic interrupts.
UP/DOWN COUNTERS AND
THUMBWHEEL INTERFACES
Two 32-bit up/down counters are provided that can sense 2-bit
quadrature or binary codes as typically emitted by industrial
drives or manual thumbwheels. The counters can also operate
in general-purpose up/down count modes. Then, count direc-
tion is either controlled by a level-sensitive input pin or by two
edge detectors.
A third counter input can provide flexible zero marker support
and can alternatively be used to input the push-button signal of
thumb wheels. All three pins have a programmable debouncing
circuit.
Internal signals forwarded to each timer unit enable these tim-
ers to measure the intervals between count events. Boundary
registers enable auto-zero operation or simple system warning
by interrupts when programmable count values are exceeded.
3-PHASE PWM UNITS
The two/dual 3-phase PWM generation units each feature:
16-bit center-based PWM generation unit
•Programmable PWM pulse width
Single/double update modes
Programmable dead time and switching frequency
Twos-complement implementation which permits smooth
transition to full ON and full OFF states
Possibility to synchronize the PWM generation to either
externally-generated or internally-generated synchroniza-
tion pulses
Special provisions for BDCM operation (crossover and
output enable functions)
Wide variety of special switched reluctance (SR) operating
modes
Output polarity and clock gating control
Dedicated asynchronous PWM shutdown signal
Each PWM block integrates a flexible and programmable
3-phase PWM waveform generator that can be programmed
to generate the required switching patterns to drive a 3-phase
voltage source inverter for ac induction motor (ACIM) or
permanent magnet synchronous motor (PMSM) control. In
addition, the PWM block contains special functions that
considerably simplify the generation of the required PWM
switching patterns for control of the electronically commutated
motor (ECM) or brushless dc motor (BDCM). Software can
enable a special mode for switched reluctance motors (SRM).
The six PWM output signals (per PWM unit) consist of three
high-side drive signals (PWMx_AH, PWMx_BH, and PWMx-
_CH) and three low-side drive signals (PWMx_AL, PWMx_BL,
and PWMx_CL). The polarity of the generated PWM signal can
be set with software, so that either active HI or active LO PWM
patterns can be produced.
The switching frequency of the generated PWM pattern is pro-
grammable using the 16-bit PWM_TM register. The PWM
generator can operate in single update mode or double update
mode. In single update mode, the duty cycle values are pro-
grammable only once per PWM period, so that the resultant
PWM patterns are symmetrical about the midpoint of the PWM
period. In the double update mode, a second updating of the
PWM registers is implemented at the midpoint of the PWM
period. In this mode, it is possible to produce asymmetrical
PWM patterns that produce lower harmonic distortion in
3-phase PWM inverters.
Pulses synchronous to the switching frequency can be generated
internally and output on the PWMx_SYNC pin. The PWM unit
can also accept externally generated synchronization pulses
through PWMx_SYNC.
Each PWM unit features a dedicated asynchronous shutdown
pin, PWMx_TRIP, which (when brought low) instantaneously
places all six PWM outputs in the OFF state.
SERIAL PORTS
The processors incorporate two dual-channel synchronous
serial ports (SPORT0 and SPORT1) for serial and multiproces-
sor communications. The SPORTs support the following
features:
•I
2
S capable operation.
Bidirectional operation—Each SPORT has two sets of inde-
pendent transmit and receive pins, enabling eight channels
of I
2
S stereo audio.
Buffered (8-deep) transmit and receive ports—Each port
has a data register for transferring data words to and from
other processor components and shift registers for shifting
data in and out of the data registers.
Clocking—Each transmit and receive port can either use an
external serial clock or generate its own, in frequencies
ranging from (f
SCLK
/131,070) Hz to (f
SCLK
/2) Hz.
Word length—Each SPORT supports serial data words
from 3 to 32 bits in length, transferred most significant bit
first or least significant bit first.
Framing—Each transmit and receive port can run with or
without frame sync signals for each data word. Frame sync
signals can be generated internally or externally, active high
or low, and with either of two pulse widths and early or late
frame sync.
Companding in hardware—Each SPORT can perform
A-law or μ-law companding according to ITU recommen-
dation G.711. Companding can be selected on the transmit
and/or receive channel of the SPORT without
additional latencies.
Rev. B | Page 11 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
DMA operations with single-cycle overhead—Each SPORT
can automatically receive and transmit multiple buffers of
memory data. The processor can link or chain sequences of
DMA transfers between a SPORT and memory.
Interrupts—Each transmit and receive port generates an
interrupt upon completing the transfer of a data word or
after transferring an entire data buffer, or buffers,
through DMA.
Multichannel capability—Each SPORT supports 128 chan-
nels out of a 1024-channel window and is compatible with
the H.100, H.110, MVIP-90, and HMVIP standards.
SERIAL PERIPHERAL INTERFACE (SPI) PORTS
The ADSP-BF50x processors have two SPI-compatible ports
that enable the processor to communicate with multiple SPI-
compatible devices.
The SPI interface uses three pins for transferring data: two data
pins MOSI (Master Output-Slave Input) and MISO (Master
Input-Slave Output) and a clock pin, serial clock (SCK). An SPI
chip select input pin (SPIx_SS) lets other SPI devices select the
processor, and three SPI chip select output pins (SPIx_SEL3–1)
let the processor select other SPI devices. The SPI select pins are
reconfigured general-purpose I/O pins. Using these pins, the
SPI port provides a full-duplex, synchronous serial interface,
which supports both master/slave modes and multimaster
environments.
The SPI port’s baud rate and clock phase/polarities are
programmable, and it has an integrated DMA channel,
configurable to support transmit or receive data streams. The
SPI’s DMA channel can only service unidirectional accesses at
any given time.
The SPI port’s clock rate is calculated as:
Where the 16-bit SPI_BAUD register contains a value of 2
to 65,535.
During transfers, the SPI port simultaneously transmits and
receives by serially shifting data in and out on its two serial data
lines. The serial clock line synchronizes the shifting and sam-
pling of data on the two serial data lines.
UART PORTS (UARTS)
The ADSP-BF50x Blackfin processors provide two full-duplex
universal asynchronous receiver/transmitter (UART) ports.
Each UART port provides a simplified UART interface to other
peripherals or hosts, enabling full-duplex, DMA-supported,
asynchronous transfers of serial data. A UART port includes
support for five to eight data bits; one or two stop bits; and
none, even, or odd parity. Each UART port supports two modes
of operation:
PIO (programmed I/O). The processor sends or receives
data by writing or reading I/O-mapped UART registers.
The data is double-buffered on both transmit and receive.
DMA (direct memory access). The DMA controller trans-
fers both transmit and receive data. This reduces the
number and frequency of interrupts required to transfer
data to and from memory. Each UART has two dedicated
DMA channels, one for transmit and one for receive. These
DMA channels have lower default priority than most DMA
channels because of their relatively low service rates. Flexi-
ble interrupt timing options are available on the transmit
side.
Each UART port’s baud rate, serial data format, error code gen-
eration and status, and interrupts are programmable:
Supporting bit rates ranging from (f
SCLK
/1,048,576) to
(f
SCLK
) bits per second.
Supporting data formats from 7 to 12 bits per frame.
Both transmit and receive operations can be configured to
generate maskable interrupts to the processor.
The UART port’s clock rate is calculated as
Where the 16-bit UART divisor comes from the UARTx_DLH
register (most significant 8 bits) and UARTx_DLL register (least
significant eight bits), and the EDBO is a bit in the
UARTx_GCTL register.
In conjunction with the general-purpose timer functions, auto-
baud detection is supported.
The UARTs feature a pair of UAx_RTS (request to send) and
UAx_CTS (clear to send) signals for hardware flow purposes.
The transmitter hardware is automatically prevented from
sending further data when the UAx_CTS input is de-asserted.
The receiver can automatically de-assert its UAx_RTS output
when the enhanced receive FIFO exceeds a certain high-water
level. The capabilities of the UARTs are further extended with
support for the Infrared Data Association (IrDA®) Serial Infra-
red Physical Layer Link Specification (SIR) protocol.
PARALLEL PERIPHERAL INTERFACE (PPI)
The processor provides a parallel peripheral interface (PPI) that
can connect directly to parallel A/D and D/A converters, video
encoders and decoders, and other general-purpose peripherals.
The PPI consists of a dedicated input clock pin, up to three
frame synchronization pins, and up to 16 data pins. The input
clock supports parallel data rates up to half the system clock rate
and the synchronization signals can be configured as either
inputs or outputs.
SPI Clock Rate fSCLK
2 SPI_BAUD
------------------------------------
=
UART Clock Rate fSCLK
16 1EDBO
UART_Divisor
------------------------------------------------------------------------
=
Rev. B | Page 12 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
The PPI supports a variety of general-purpose and ITU-R 656
modes of operation. In general-purpose mode, the PPI provides
half-duplex, bidirectional data transfer with up to 16 bits of
data. Up to three frame synchronization signals are also pro-
vided. In ITU-R 656 mode, the PPI provides half-duplex
bidirectional transfer of 8- or 10-bit video data. Additionally,
on-chip decode of embedded start-of-line (SOL) and start-of-
field (SOF) preamble packets is supported.
General-Purpose Mode Descriptions
The general-purpose modes of the PPI are intended to suit a
wide variety of data capture and transmission applications.
Three distinct submodes are supported:
Input mode—Frame syncs and data are inputs into the PPI.
Frame capture mode—Frame syncs are outputs from the
PPI, but data are inputs.
Output mode—Frame syncs and data are outputs from the
PPI.
Input Mode
Input mode is intended for ADC applications, as well as video
communication with hardware signaling. In its simplest form,
PPI_FS1 is an external frame sync input that controls when to
read data. The PPI_DELAY MMR allows for a delay (in PPI_-
CLK cycles) between reception of this frame sync and the
initiation of data reads. The number of input data samples is
user programmable and defined by the contents of the
PPI_COUNT register. The PPI supports 8-bit and 10-bit
through 16-bit data, programmable in the PPI_CONTROL
register.
Frame Capture Mode
Frame capture mode allows the video source(s) to act as a slave
(for frame capture for example). The ADSP-BF50x processors
control when to read from the video source(s). PPI_FS1 is an
HSYNC output and PPI_FS2 is a VSYNC output.
Output Mode
Output mode is used for transmitting video or other data with
up to three output frame syncs. Typically, a single frame sync is
appropriate for data converter applications, whereas two or
three frame syncs could be used for sending video with hard-
ware signaling.
ITU-R 656 Mode Descriptions
The ITU-R 656 modes of the PPI are intended to suit a wide
variety of video capture, processing, and transmission applica-
tions. Three distinct submodes are supported:
Active video only mode
Vertical blanking only mode
Entire field mode
Active Video Mode
Active video only mode is used when only the active video por-
tion of a field is of interest and not any of the blanking intervals.
The PPI does not read in any data between the end of active
video (EAV) and start of active video (SAV) preamble symbols,
or any data present during the vertical blanking intervals. In this
mode, the control byte sequences are not stored to memory;
they are filtered by the PPI. After synchronizing to the start of
Field 1, the PPI ignores incoming samples until it sees an SAV
code. The user specifies the number of active video lines per
frame (in PPI_COUNT register).
Vertical Blanking Interval Mode
In this mode, the PPI only transfers vertical blanking interval
(VBI) data.
Entire Field Mode
In this mode, the entire incoming bit stream is read in through
the PPI. This includes active video, control preamble sequences,
and ancillary data that may be embedded in horizontal and ver-
tical blanking intervals. Data transfer starts immediately after
synchronization to Field 1. Data is transferred to or from the
synchronous channels through eight DMA engines that work
autonomously from the processor core.
RSI INTERFACE
The removable storage interface (RSI) controller acts as the host
interface for multimedia cards (MMC), secure digital memory
cards (SD), secure digital input/output cards (SDIO), and CE-
ATA hard disk drives. The following list describes the main fea-
tures of the RSI controller.
Support for a single MMC, SD memory, SDIO card or CE-
ATA hard disk drive
Support for 1-bit and 4-bit SD modes
Support for 1-bit, 4-bit, and 8-bit MMC modes
Support for 4-bit and 8-bit CE-ATA hard disk drives
A ten-signal external interface with clock, command, and
up to eight data lines
Card detection using one of the data signals
Card interface clock generation from SCLK
SDIO interrupt and read wait features
CE-ATA command completion signal recognition and
disable
CONTROLLER AREA NETWORK (CAN) INTERFACE
The ADSP-BF50x processors provide a CAN controller that is a
communication controller implementing the Controller Area
Network (CAN) V2.0B protocol. This protocol is an asynchro-
nous communications protocol used in both industrial and
automotive control systems. CAN is well suited for control
applications due to its capability to communicate reliably over a
network since the protocol incorporates CRC checking, message
error tracking, and fault node confinement.
The CAN controller is based on a 32-entry mailbox RAM and
supports both the standard and extended identifier (ID) mes-
sage formats specified in the CAN protocol specification,
revision 2.0, part B.
Rev. B | Page 13 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Each mailbox consists of eight 16-bit data words. The data is
divided into fields, which includes a message identifier, a time
stamp, a byte count, up to 8 bytes of data, and several control
bits. Each node monitors the messages being passed on the net-
work. If the identifier in the transmitted message matches an
identifier in one of its mailboxes, the module knows that the
message was meant for it, passes the data into its appropriate
mailbox, and signals the processor of message arrival with an
interrupt.
The CAN controller can wake up the processor from sleep mode
upon generation of a wake-up event, such that the processor can
be maintained in a low-power mode during idle conditions.
Additionally, a CAN wake-up event can wake up the on-chip
internal voltage regulator from the powered-down
hibernate state.
The electrical characteristics of each network connection are
very stringent. Therefore, the CAN interface is typically divided
into two parts: a controller and a transceiver. This allows a sin-
gle controller to support different drivers and CAN networks.
The ADSP-BF50x CAN module represents the controller part of
the interface. This module’s network I/O is a single transmit
output and a single receive input, which connect to a line
transceiver.
The CAN clock is derived from the processor system clock
(SCLK) through a programmable divider and therefore does not
require an additional crystal.
TWI CONTROLLER INTERFACE
The processors include a 2-wire interface (TWI) module for
providing a simple exchange method of control data between
multiple devices. The TWI is compatible with the widely used
I
2
C
®
bus standard. The TWI module offers the capabilities of
simultaneous master and slave operation, support for both 7-bit
addressing and multimedia data arbitration. The TWI interface
utilizes two pins for transferring clock (SCL) and data (SDA)
and supports the protocol at speeds up to 400K bits/sec. The
TWI interface pins are compatible with 5 V logic levels.
Additionally, the TWI module is fully compatible with serial
camera control bus (SCCB) functionality for easier control of
various CMOS camera sensor devices.
PORTS
Because of the rich set of peripherals, the processor groups the
many peripheral signals to three ports—Port F, Port G, and
Port H. Most of the associated pins are shared by multiple sig-
nals. The ports function as multiplexer controls.
General-Purpose I/O (GPIO)
The processor has 35 bidirectional, general-purpose I/O (GPIO)
pins allocated across three separate GPIO modules—PORTFIO,
PORTGIO, and PORTHIO, associated with Port F, Port G, and
Port H, respectively. Each GPIO-capable pin shares functional-
ity with other processor peripherals via a multiplexing scheme;
however, the GPIO functionality is the default state of the device
upon power-up. Neither GPIO output nor input drivers are
active by default. Each general-purpose port pin can be individ-
ually controlled by manipulation of the port control, status, and
interrupt registers:
GPIO direction control register – Specifies the direction of
each individual GPIO pin as input or output.
GPIO control and status registers – The processor employs
a “write one to modify” mechanism that allows any combi-
nation of individual GPIO pins to be modified in a single
instruction, without affecting the level of any other GPIO
pins. Four control registers are provided. One register is
written in order to set pin values, one register is written in
order to clear pin values, one register is written in order to
toggle pin values, and one register is written in order to
specify a pin value. Reading the GPIO status register allows
software to interrogate the sense of the pins.
GPIO interrupt mask registers – The two GPIO interrupt
mask registers allow each individual GPIO pin to function
as an interrupt to the processor. Similar to the two GPIO
control registers that are used to set and clear individual
pin values, one GPIO interrupt mask register sets bits to
enable interrupt function, and the other GPIO interrupt
mask register clears bits to disable interrupt function.
GPIO pins defined as inputs can be configured to generate
hardware interrupts, while output pins can be triggered by
software interrupts.
GPIO interrupt sensitivity registers – The two GPIO inter-
rupt sensitivity registers specify whether individual pins are
level- or edge-sensitive and specify—if edge-sensitive—
whether just the rising edge or both the rising and falling
edges of the signal are significant. One register selects the
type of sensitivity, and one register selects which edges are
significant for edge-sensitivity.
DYNAMIC POWER MANAGEMENT
The processor provides five operating modes, each with a differ-
ent performance/power profile. In addition, dynamic power
management provides the control functions to dynamically alter
the processor core supply voltage, further reducing power dissi-
pation. When configured for a 0 volt core supply voltage, the
processor enters the hibernate state. Control of clocking to each
of the processor peripherals also reduces power consumption.
See Table 4 for a summary of the power settings for each mode.
Full-On Operating Mode—Maximum Performance
In the full-on mode, the PLL is enabled and is not bypassed,
providing capability for maximum operational frequency. This
is the power-up default execution state in which maximum per-
formance can be achieved. The processor core and all enabled
peripherals run at full speed.
Active Operating Mode—Moderate Dynamic Power
Savings
In the active mode, the PLL is enabled but bypassed. Because the
PLL is bypassed, the processor’s core clock (CCLK) and system
clock (SCLK) run at the input clock (CLKIN) frequency. DMA
access is available to appropriately configured L1 memories.
Rev. B | Page 14 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
In the active mode, it is possible to disable the control input to
the PLL by setting the PLL_OFF bit in the PLL control register.
This register can be accessed with a user-callable routine in the
on-chip ROM called bfrom_SysControl(). If disabled, the PLL
control input must be re-enabled before transitioning to the
full-on or sleep modes.
For more information about PLL controls, see the “Dynamic
Power Management” chapter in the ADSP-BF50x Blackfin Pro-
cessor Hardware Reference.
Sleep Operating Mode—High Dynamic Power Savings
The sleep mode reduces dynamic power dissipation by disabling
the clock to the processor core (CCLK). The PLL and system
clock (SCLK), however, continue to operate in this mode. Typi-
cally, an external event wakes up the processor. When in the
sleep mode, asserting a wakeup enabled in the SIC_IWRx regis-
ters causes the processor to sense the value of the BYPASS bit in
the PLL control register (PLL_CTL). If BYPASS is disabled, the
processor transitions to the full on mode. If BYPASS is enabled,
the processor transitions to the active mode.
DMA accesses to L1 memory are not supported in sleep mode.
Deep Sleep Operating Mode—Maximum Dynamic Power
Savings
The deep sleep mode maximizes dynamic power savings by dis-
abling the clocks to the processor core (CCLK) and to all
synchronous peripherals (SCLK). Asynchronous peripherals
may still be running but cannot access internal resources or
external memory. This powered-down mode can only be exited
by assertion of the reset pin (RESET). Assertion of RESET while
in deep sleep mode causes the processor to transition to the full
on mode.
Hibernate State—Maximum Static Power Savings
The hibernate state maximizes static power savings by disabling
the voltage and clocks to the processor core (CCLK) and to all of
the peripherals (SCLK). This setting sets the internal power sup-
ply voltage (V
DDINT
) to 0 V to provide the lowest static power
dissipation. Any critical information stored internally (for
example, memory contents, register contents, and other infor-
mation) must be written to a non-volatile storage device prior to
removing power if the processor state is to be preserved.
Writing 0 to the HIBERNATE bit causes EXT_WAKE to transi-
tion low, which can be used to signal an external voltage
regulator to shut down.
Since V
DDEXT
can still be supplied in this mode, all of the exter-
nal pins three-state, unless otherwise specified. This allows
other devices that may be connected to the processor to still
have power applied without drawing unwanted current.
The processor can be woken up by asserting the RESET pin. All
hibernate wakeup events initiate the hardware reset sequence.
Individual sources are enabled by the VR_CTL register. The
EXT_WAKE signal indicates the occurrence of a wakeup event.
As long as V
DDEXT
is applied, the VR_CTL register maintains its
state during hibernation. All other internal registers and memo-
ries, however, lose their content in the hibernate state.
Power Savings
As shown in Table 5, the processor supports three different
power domains, which maximizes flexibility while maintaining
compliance with industry standards and conventions. By isolat-
ing the internal logic of the processor into its own power
domain, separate from other I/O, the processor can take advan-
tage of dynamic power management without affecting the other
I/O devices. There are no sequencing requirements for the vari-
ous power domains, but all domains must be powered
according to the appropriate Specifications table for processor
operating conditions; even if the feature/peripheral is not used.
The dynamic power management feature of the processor
allows both the processor’s input voltage (V
DDINT
) and clock fre-
quency (f
CCLK
) to be dynamically controlled.
The power dissipated by a processor is largely a function of its
clock frequency and the square of the operating voltage. For
example, reducing the clock frequency by 25% results in a 25%
reduction in dynamic power dissipation, while reducing the
voltage by 25% reduces dynamic power dissipation by more
than 40%. Further, these power savings are additive, in that if
the clock frequency and supply voltage are both reduced, the
power savings can be dramatic, as shown in the following
equations.
Table 4. Power Settings
Mode/State PLL
PLL
Bypassed
Core
Clock
(CCLK)
System
Clock
(SCLK)
Core
Power
Full On Enabled No Enabled Enabled On
Active Enabled/
Disabled
Yes Enabled Enabled On
Sleep Enabled Disabled Enabled On
Deep Sleep Disabled Disabled Disabled On
Hibernate Disabled Disabled Disabled Off
Table 5. Power Domains
Power Domain Power Supply
All internal logic, except Memory V
DDINT
Flash Memory V
DDFLASH
All other I/O V
DDEXT
ADC digital supply
1
(Logic, I/O)
1
On ADSP-BF506F processor only.
DV
DD
, V
DRIVE
ADC analog supply
1
AV
DD
Power Savings Factor
fCCLKRED
fCCLKNOM
-------------------------- VDDINTRED
VDDINTNOM
--------------------------------


2
TRED
TNOM
---------------
=
% Power Savings 1 Power Savings Factor100%=
Rev. B | Page 15 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
where the variables in the equations are:
f
CCLKNOM
is the nominal core clock frequency
f
CCLKRED
is the reduced core clock frequency
V
DDINTNOM
is the nominal internal supply voltage
V
DDINTRED
is the reduced internal supply voltage
T
NOM
is the duration running at f
CCLKNOM
T
RED
is the duration running at f
CCLKRED
ADSP-BF50x VOLTAGE REGULATION
The ADSP-BF50x processors require an external voltage regula-
tor to power the V
DDINT
domain. To reduce standby power
consumption, the external voltage regulator can be signaled
through EXT_WAKE to remove power from the processor core.
This signal is high-true for power-up and may be connected
directly to the low-true shut-down input of many common
regulators.
While in the hibernate state, all external supplies (V
DDEXT
,
V
DDFLASH
) can still be applied, eliminating the need for external
buffers. The external voltage regulator can be activated from
this power down state by asserting the RESET pin, which then
initiates a boot sequence. EXT_WAKE indicates a wakeup to
the external voltage regulator.
The power good (PG) input signal allows the processor to start
only after the internal voltage has reached a chosen level. In this
way, the startup time of the external regulator is detected after
hibernation. For a complete description of the power good
functionality, refer to the ADSP-BF50x Blackfin Processor Hard-
ware Reference.
CLOCK SIGNALS
The processor can be clocked by an external crystal, a sine wave
input, or a buffered, shaped clock derived from an external
clock oscillator.
If an external clock is used, it should be a TTL-compatible signal
and must not be halted, changed, or operated below the speci-
fied frequency during normal operation. This signal is
connected to the processor’s CLKIN pin. When an external
clock is used, the XTAL pin must be left unconnected.
Alternatively, because the processor includes an on-chip oscilla-
tor circuit, an external crystal may be used. For fundamental
frequency operation, use the circuit shown in Figure 4. A paral-
lel-resonant, fundamental frequency, microprocessor-grade
crystal is connected across the CLKIN and XTAL pins. The on-
chip resistance between CLKIN and the XTAL pin is in the
500 k range. Further parallel resistors are typically not recom-
mended. The two capacitors and the series resistor shown in
Figure 4 fine tune phase and amplitude of the sine frequency.
The capacitor and resistor values shown in Figure 4 are typical
values only. The capacitor values are dependent upon the crystal
manufacturers’ load capacitance recommendations and the PCB
physical layout. The resistor value depends on the drive level
specified by the crystal manufacturer. The user should verify the
customized values based on careful investigations on multiple
devices over temperature range.
A third-overtone crystal can be used for frequencies above
25 MHz. The circuit is then modified to ensure crystal operation
only at the third overtone by adding a tuned inductor circuit as
shown in Figure 4. A design procedure for third-overtone oper-
ation is discussed in detail in (EE-168) Using Third Overtone
Crystals with the ADSP-218x DSP on the Analog Devices web-
site (www.analog.com)—use site search on “EE-168.”
The Blackfin core runs at a different clock rate than the on-chip
peripherals. As shown in Figure 5, the core clock (CCLK) and
system peripheral clock (SCLK) are derived from the input
clock (CLKIN) signal. An on-chip PLL is capable of multiplying
the CLKIN signal by a programmable multiplication factor
(bounded by specified minimum and maximum VCO frequen-
cies). The default multiplier is 6×, but it can be modified by a
software instruction sequence.
On-the-fly frequency changes can be effected by simply writing
to the PLL_DIV register. The maximum allowed CCLK and
SCLK rates depend on the applied voltages V
DDINT
and V
DDEXT
;
the VCO is always permitted to run up to the CCLK frequency
specified by the part’s speed grade. The EXTCLK pin can be
configured to output either the SCLK frequency or the input
buffered CLKIN frequency, called CLKBUF. When configured
to output SCLK (CLKOUT), the EXTCLK pin acts as a refer-
ence signal in many timing specifications. While active by
default, it can be disabled using the EBIU_AMGCTL register.
Figure 4. External Crystal Connections
CLKIN
CLKOUT (SCLK)
XTAL
SELECT
CLKBUF
TO PLL CIRCUITRY
FOR OVERTONE
OPERATION ONLY:
NOTE: VALUES MARKED WITH * MUST BE CUSTOMIZED, DEPENDING
ON THE CRYSTAL AND LAYOUT. PLEASE ANALYZE CAREFULLY. FOR
FREQUENCIES ABOVE 33 MHz, THE SUGGESTED CAPACITOR VALUE
OF 18 pF SHOULD BE TREATED AS A MAXIMUM, AND THE SUGGESTED
RESISTOR VALUE SHOULD BE REDUCED TO 0 .
18 pF *
EN
18 pF *
330 *
Blackfin Processor
560
EXTCLK
EN
Rev. B | Page 16 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
All on-chip peripherals are clocked by the system clock (SCLK).
The system clock frequency is programmable by means of the
SSEL3–0 bits of the PLL_DIV register. The values programmed
into the SSEL fields define a divide ratio between the PLL output
(VCO) and the system clock. SCLK divider values are 1 through
15. Table 6 illustrates typical system clock ratios.
Note that the divisor ratio must be chosen to limit the system
clock frequency to its maximum of f
SCLK
. The SSEL value can be
changed dynamically without any PLL lock latencies by writing
the appropriate values to the PLL divisor register (PLL_DIV).
The core clock (CCLK) frequency can also be dynamically
changed by means of the CSEL1–0 bits of the PLL_DIV register.
Supported CCLK divider ratios are 1, 2, 4, and 8, as shown in
Table 7. This programmable core clock capability is useful for
fast core frequency modifications.
The maximum CCLK frequency both depends on the part’s
speed grade and depends on the applied V
DDINT
voltage. See
Table 14 for details. The maximal system clock rate (SCLK)
depends on the applied V
DDINT
and V
DDEXT
voltages (see
Table 16).
BOOTING MODES
The processor has several mechanisms (listed in Table 8) for
automatically loading internal and external memory after a
reset. The boot mode is defined by the BMODE input pins dedi-
cated to this purpose. There are two categories of boot modes.
In master boot modes, the processor actively loads data from
parallel or serial memories. In slave boot modes, the processor
receives data from external host devices.
The boot modes listed in Table 8 provide a number of mecha-
nisms for automatically loading the processor’s internal and
external memories after a reset. By default, all boot modes use
the slowest meaningful configuration settings. Default settings
can be altered via the initialization code feature at boot time.
Some boot modes require a boot host wait (HWAIT) signal,
which is a GPIO output signal that is driven and toggled by the
boot kernel at boot time. If pulled high through an external pull-
up resistor, the HWAIT signal behaves active high and will be
driven low when the processor is ready for data. Conversely,
when pulled low, HWAIT is driven high when the processor is
ready for data. When the boot sequence completes, the HWAIT
pin can be used for other purposes. The BMODE pins of the
reset configuration register, sampled during power-on resets
and software-initiated resets, implement the modes shown in
Table 8.
IDLE State / No Boot (BMODE = 0x0)—In this mode, the
boot kernel transitions the processor into Idle state. The
processor can then be controlled through JTAG for recov-
ery, debug, or other functions.
Boot from stacked parallel flash in 16-bit asynchronous
mode (BMODE = 0x1)—In this mode, conservative timing
parameters are used to communicate with the flash device.
The boot kernel communicates with the flash device
asynchronously.
Boot from stacked parallel flash in 16-bit synchronous
mode (BMODE = 0x2)—In this mode, fast timing parame-
ters are used to communicate with the flash device. The
boot kernel configures the flash device for synchronous
burst communication and boots from the flash
synchronously.
Figure 5. Frequency Modification Methods
Table 6. Example System Clock Ratios
Signal Name
SSEL3–0
Divider Ratio
VCO/SCLK
Example Frequency Ratios
(MHz)
VCO SCLK
0001 1:1 50 50
0110 6:1 300 50
1010 10:1 400 40
Table 7. Core Clock Ratios
Signal Name
CSEL1–0
Divider Ratio
VCO/CCLK
Example Frequency Ratios
(MHz)
VCO CCLK
00 1:1 300 300
01 2:1 300 150
10 4:1 400 100
11 8:1 200 25
PLL
0.5uto 64u
÷1to15
÷1,2,4,8
VCO
CLKIN
“FINE” ADJUSTMENT
REQUIRES PLL SEQUENCING
“COARSE” ADJUSTMENT
ON-THE-FLY
CCLK
SCLK
SCLK dCCLK
Table 8. Booting Modes
BMODE20 Description
000 Idle/No Boot
001 Boot from internal parallel flash in async mode
1
1
This boot mode applies to ADSP-BF504F and ADSP-BF506F processors only.
010 Boot from internal parallel flash in sync mode
1
011 Boot through SPI0 master from SPI memory
100 Boot through SPI0 slave from host device
101 Boot through PPI from host
110 Reserved
111 Boot through UART0 slave from host device
Rev. B | Page 17 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Boot from serial SPI memory, EEPROM or flash
(BMODE = 0x3)—8-, 16-, 24-, or 32-bit addressable
devices are supported. The processor uses the PF13 GPIO
pin to select a single SPI EEPROM/flash device (connected
to the SPI0 interface) and submits a read command and
successive address bytes (0x00) until a valid 8-, 16-, 24-, or
32-bit addressable device is detected. Pull-up resistors are
required on the SPI0_SEL1 and MISO pins. By default, a
value of 0x85 is written to the SPI_BAUD register.
Boot from SPI host device (BMODE = 0x4)—The proces-
sor operates in SPI slave mode and is configured to receive
the bytes of the LDR file from an SPI host (master) agent.
The HWAIT signal must be interrogated by the host before
every transmitted byte. A pull-up resistor is required on the
SPI0_SS input. A pull-down on the serial clock (SCK) may
improve signal quality and booting robustness.
Boot from PPI host device (BMODE = 0x5)—The proces-
sor operates in PPI slave mode and is configured to receive
the bytes of the LDR file from a PPI host (master) agent.
Boot from UART0 host on Port G (BMODE = 0x7)—
Using an autobaud handshake sequence, a boot-stream for-
matted program is downloaded by the host. The host
selects a bit rate within the UART clocking capabilities.
When performing the autobaud detection, the UART
expects an “@” (0x40) character (eight bits data, one start
bit, one stop bit, no parity bit) on the UA0_RX pin to deter-
mine the bit rate. The UART then replies with an
acknowledgement composed of 4 bytes (0xBF, the value of
UART0_DLL, the value of UART0_DLH, then 0x00). The
host can then download the boot stream. The processor
deasserts the UA0_RTS output to hold off the host;
UA0_CTS functionality is not enabled at boot time.
For each of the boot modes, a 16 byte header is first read from
an external memory device. The header specifies the number of
bytes to be transferred and the memory destination address.
Multiple memory blocks may be loaded by any boot sequence.
Once all blocks are loaded, program execution commences from
the address stored in the EVT1 register.
The boot kernel differentiates between a regular hardware reset
and a wakeup-from-hibernate event to speed up booting in the
later case. Bits 6-4 in the system reset configuration (SYSCR)
register can be used to bypass the pre-boot routine and/or boot
kernel in case of a software reset. They can also be used to simu-
late a wakeup-from-hibernate boot in the software reset case.
The boot process can be further customized by “initialization
code. This is a piece of code that is loaded and executed prior to
the regular application boot. Typically, this is used to speed up
booting by managing the PLL, clock frequencies, wait states, or
serial bit rates.
The boot ROM also features C-callable functions that can be
called by the user application at run time. This enables second-
stage boot or boot management schemes to be implemented
with ease.
INSTRUCTION SET DESCRIPTION
The Blackfin processor family assembly language instruction set
employs an algebraic syntax designed for ease of coding and
readability. The instructions have been specifically tuned to
provide a flexible, densely encoded instruction set that compiles
to a very small final memory size. The instruction set also
provides fully featured multifunction instructions that allow the
programmer to use many of the processor core resources in a
single instruction. Coupled with many features more often seen
on microcontrollers, this instruction set is very efficient when
compiling C and C++ source code. In addition, the architecture
supports both user (algorithm/application code) and supervisor
(O/S kernel, device drivers, debuggers, ISRs) modes of opera-
tion, allowing multiple levels of access to core processor
resources.
The assembly language, which takes advantage of the proces-
sor’s unique architecture, offers the following advantages:
Seamlessly integrated DSP/MCU features are optimized for
both 8-bit and 16-bit operations.
A multi-issue load/store modified-Harvard architecture,
which supports two 16-bit MAC or four 8-bit ALU + two
load/store + two pointer updates per cycle.
All registers, I/O, and memory are mapped into a unified
4G byte memory space, providing a simplified program-
ming model.
Microcontroller features, such as arbitrary bit and bit-field
manipulation, insertion, and extraction; integer operations
on 8-, 16-, and 32-bit data-types; and separate user and
supervisor stack pointers.
Code density enhancements, which include intermixing of
16-bit and 32-bit instructions (no mode switching, no code
segregation). Frequently used instructions are encoded
in 16 bits.
DEVELOPMENT TOOLS
Analog Devices supports its processors with a complete line of
software and hardware development tools, including integrated
development environments (which include CrossCore
®
Embed-
ded Studio and/or VisualDSP++
®
), evaluation products,
emulators, and a wide variety of software add-ins.
Integrated Development Environments (IDEs)
For C/C++ software writing and editing, code generation, and
debug support, Analog Devices offers two IDEs.
The newest IDE, CrossCore Embedded Studio, is based on the
Eclipse
TM
framework. Supporting most Analog Devices proces-
sor families, it is the IDE of choice for future processors,
including multicore devices. CrossCore Embedded Studio
seamlessly integrates available software add-ins to support real
time operating systems, file systems, TCP/IP stacks, USB stacks,
algorithmic software modules, and evaluation hardware board
support packages. For more information visit
www.analog.com/cces.
Rev. B | Page 18 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
The other Analog Devices IDE, VisualDSP++, supports proces-
sor families introduced prior to the release of CrossCore
Embedded Studio. This IDE includes the Analog Devices VDK
real time operating system and an open source TCP/IP stack.
For more information visit www.analog.com/visualdsp. Note
that VisualDSP++ will not support future Analog Devices
processors.
EZ-KIT Lite Evaluation Board
For processor evaluation, Analog Devices provides wide range
of EZ-KIT Lite
®
evaluation boards. Including the processor and
key peripherals, the evaluation board also supports on-chip
emulation capabilities and other evaluation and development
features. Also available are various EZ-Extenders
®
, which are
daughter cards delivering additional specialized functionality,
including audio and video processing. For more information
visit www.analog.com and search on “ezkit” or “ezextender”.
EZ-KIT Lite Evaluation Kits
For a cost-effective way to learn more about developing with
Analog Devices processors, Analog Devices offer a range of EZ-
KIT Lite evaluation kits. Each evaluation kit includes an EZ-KIT
Lite evaluation board, directions for downloading an evaluation
version of the available IDE(s), a USB cable, and a power supply.
The USB controller on the EZ-KIT Lite board connects to the
USB port of the user’s PC, enabling the chosen IDE evaluation
suite to emulate the on-board processor in-circuit. This permits
the customer to download, execute, and debug programs for the
EZ-KIT Lite system. It also supports in-circuit programming of
the on-board Flash device to store user-specific boot code,
enabling standalone operation. With the full version of Cross-
Core Embedded Studio or VisualDSP++ installed (sold
separately), engineers can develop software for supported EZ-
KITs or any custom system utilizing supported Analog Devices
processors.
Software Add-Ins for CrossCore Embedded Studio
Analog Devices offers software add-ins which seamlessly inte-
grate with CrossCore Embedded Studio to extend its capabilities
and reduce development time. Add-ins include board support
packages for evaluation hardware, various middleware pack-
ages, and algorithmic modules. Documentation, help,
configuration dialogs, and coding examples present in these
add-ins are viewable through the CrossCore Embedded Studio
IDE once the add-in is installed.
Board Support Packages for Evaluation Hardware
Software support for the EZ-KIT Lite evaluation boards and EZ-
Extender daughter cards is provided by software add-ins called
Board Support Packages (BSPs). The BSPs contain the required
drivers, pertinent release notes, and select example code for the
given evaluation hardware. A download link for a specific BSP is
located on the web page for the associated EZ-KIT or EZ-
Extender product. The link is found in the Product Download
area of the product web page.
Middleware Packages
Analog Devices separately offers middleware add-ins such as
real time operating systems, file systems, USB stacks, and
TCP/IP stacks. For more information see the following web
pages:
www.analog.com/ucos3
www.analog.com/ucfs
www.analog.com/ucusbd
www.analog.com/lwip
Algorithmic Modules
To speed development, Analog Devices offers add-ins that per-
form popular audio and video processing algorithms. These are
available for use with both CrossCore Embedded Studio and
VisualDSP++. For more information visit www.analog.com and
search on “Blackfin software modules” or “SHARC software
modules”.
Designing an Emulator-Compatible DSP Board (Target)
For embedded system test and debug, Analog Devices provides
a family of emulators. On each JTAG DSP, Analog Devices sup-
plies an IEEE 1149.1 JTAG Test Access Port (TAP). In-circuit
emulation is facilitated by use of this JTAG interface. The emu-
lator accesses the processor’s internal features via the
processor’s TAP, allowing the developer to load code, set break-
points, and view variables, memory, and registers. The
processor must be halted to send data and commands, but once
an operation is completed by the emulator, the DSP system is set
to run at full speed with no impact on system timing. The emu-
lators require the target board to include a header that supports
connection of the DSP’s JTAG port to the emulator.
For details on target board design issues including mechanical
layout, single processor connections, signal buffering, signal ter-
mination, and emulator pod logic, see the EE-68: Analog Devices
JTAG Emulation Technical Reference on the Analog Devices
website (www.analog.com)—use site search on “EE-68.” This
document is updated regularly to keep pace with improvements
to emulator support.
ADC AND ACM INTERFACE
This section describes the ADC and ACM interface. System
designers should also consult the ADSP-BF50x Blackfin Proces-
sor Hardware Reference for additional information.
The ADC control module (ACM) provides an interface that
synchronizes the controls between the processor and the inter-
nal analog-to-digital converter (ADC) module. The ACM is
available on the ADSP-BF504, ADSP-BF504F, and
ADSP-BF506F processors, and the ADC is available on the
ADSP-BF506F processor only. The analog-to-digital conver-
sions are initiated by the processor, based on external or
internal events.
The ACM allows for flexible scheduling of sampling instants
and provides precise sampling signals to the ADC.
Rev. B | Page 19 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
The ACM synchronizes the ADC conversion process; generat-
ing the ADC controls, the ADC conversion start signal, and
other signals. The actual data acquisition from the ADC is done
by the SPORT peripherals.
The serial interface on the ADC allows the part to be directly
connected to the ADSP-BF504, ADSP-BF504F, and
ADSP-BF506F processors using serial interface protocols.
Figure 6 shows how to connect an external ADC to the ACM
and one of the two SPORTs on the ADSP-BF504 or
ADSP-BF504F processors.
The ADC is integrated into the ADSP-BF506F product. Figure 7
shows how to connect the internal ADC to the ACM and to one
of the two SPORTs on the ADSP-BF506F processor.
The ADSP-BF504, ADSP-BF504F, and ADSP-BF506F proces-
sors interface directly to the ADC without any glue logic
required. The availability of secondary receive registers on the
serial ports of the Blackfin processors means only one serial port
is necessary to read from both D
OUT
pins simultaneously.
Figure 7 (ADC (Internal), ACM, and SPORT Connections)
shows both D
OUT
A and D
OUT
B of the ADC connected to one of
the processor’s serial ports. The SPORTx Receive Configuration
1 register and SPORTx Receive Configuration 2 register should
be set up as outlined in Table 9 (The SPORTx Receive Configu-
ration 1 Register (SPORTx_RCR1)) and Table 10 (The SPORTx
Receive Configuration 2 Register (SPORTx_RCR2)).
Figure 6. ADC (External), ACM, and SPORT Connections
Figure 7. ADC (Internal), ACM, and SPORT Connections
Table 9. The SPORTx Receive Configuration 1 Register
(SPORTx_RCR1)
Setting Description
RCKFE = 0 Sample data with falling edge of RSCLK
LRFS = 1 Active low frame signal
RFSR = 1 Frame every word
IRFS = 0 External RFS used
RLSBIT = 0 Receive MSB first
RDTYPE = 00 Zero fill
IRCLK = 0 External receive clock
RSPEN = 1 Receive enabled
TFSR = RFSR = 1
Rev. B | Page 20 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
NOTE: The SPORT must be enabled with the following set-
tings: external clock, external frame sync, and active low frame
sync.
To implement the power-down modes, SLEN should be set to
1001 to issue an 8-bit SCLK burst. A Blackfin driver for the
ADC is available to download at www.analog.com.
INTERNAL ADC
An ADC is integrated into the ADSP-BF506F product. All ADC
signals are connected out to package pins to enable maximum
interconnect flexibility in mixed signal applications.
The internal ADC is a dual, 12-bit, high speed, low power, suc-
cessive approximation ADC that operates from a single 2.7 V to
5.25 V power supply and features throughput rates up to
2 MSPS. The device contains two ADCs, each preceded by a
3-channel multiplexer, and a low noise, wide bandwidth track-
and-hold amplifier that can handle input frequencies in excess
of 30 MHz.
Figure 8 shows the functional block diagram of the internal
ADC. The ADC features include:
Dual 12-bit, 3-channel ADC
Throughput rate: up to 2 MSPS
Specified for DV
DD
and AV
DD
of 2.7 V to 5.25 V
Pin-configurable analog inputs
12-channel single-ended inputs
or
6-channel fully differential inputs
or
6-channel pseudo differential inputs
Accurate on-chip voltage reference: 2.5 V
Dual conversion with read 437.5 ns, 32 MHz ADSCLK
High speed serial interface
SPI-/QSPI
TM
-/MICROWIRE
TM
-/DSP-compatible
•Low power shutdown mode
The conversion process and data acquisition use standard con-
trol inputs allowing easy interfacing to microprocessors or
DSPs. The input signal is sampled on the falling edge of CS; con-
version is also initiated at this point. The conversion time is
determined by the ADSCLK frequency. There are no pipelined
delays associated with the part.
The internal ADC uses advanced design techniques to achieve
very low power dissipation at high throughput rates. The part
also offers flexible power/throughput rate management when
operating in normal mode as the quiescent current consump-
tion is so low.
The analog input range for the part can be selected to be a 0 V to
V
REF
(or 2 × V
REF
) range, with either straight binary or twos
complement output coding. The internal ADC has an on-chip
2.5 V reference that can be overdriven when an external refer-
ence is preferred.
Additional highlights of the internal ADC include:
Two complete ADC functions allow simultaneous sam-
pling and conversion of two channels—Each ADC has
three fully/pseudo differential pairs, or six single-ended
channels, as programmed. The conversion result of both
channels is simultaneously available on separate data lines,
or in succession on one data line if only one serial connec-
tion is available.
High throughput with low power consumption
The internal ADC offers both a standard 0 V to V
REF
input
range and a 2 × V
REF
input range.
No pipeline delay—The part features two standard succes-
sive approximation ADCs with accurate control of the
sampling instant via a CS input and once off conversion
control.
Table 10. The SPORTx Receive Configuration 2 Register
(SPORTx_RCR2)
Setting Description
RXSE = 1 Secondary side enabled
SLEN = 1111 16-bit data-word (or may be set to 1101 for
14-bit data-word)
Figure 8. ADC (Internal) Functional Block Diagram
Rev. B | Page 21 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADC APPLICATION HINTS
The following sections provide application hints for using the
ADC.
Grounding and Layout Considerations
The analog and digital supplies to the ADC are independent and
separately pinned out to minimize coupling between the analog
and digital sections of the device. The printed circuit board
(PCB) that houses the ADC should be designed so that the ana-
log and digital sections are separated and confined to certain
areas of the board. This design facilitates the use of ground
planes that can be easily separated.
To provide optimum shielding for ground planes, a minimum
etch technique is generally best. All AGND pins should be sunk
in the AGND plane. Digital and analog ground planes should be
joined in only one place. If the ADC is in a system where multi-
ple devices require an AGND to DGND connection, the
connection should still be made at one point only, a star ground
point that should be established as close as possible to the
ground pins on the ADC.
Avoid running digital lines under the device as this couples
noise onto the die. Avoid running digital lines in the area of the
AGND pad as this couples noise onto the ADC die and into the
AGND plane. The power supply lines to the ADC should use as
large a trace as possible to provide low impedance paths and
reduce the effects of glitches on the power supply line.
To avoid radiating noise to other sections of the board, fast
switching signals, such as clocks, should be shielded with digital
ground, and clock signals should never run near the analog
inputs. Avoid crossover of digital and analog signals. To reduce
the effects of feed through within the board, traces on opposite
sides of the board should run at right angles to each other.
Good decoupling is also important. All analog supplies should
be decoupled with 10 μF tantalum capacitors in parallel with
0.1 μF capacitors to GND. To achieve the best results from these
decoupling components, they must be placed as close as possible
to the device, ideally right up against the device. The 0.1 μF
capacitors should have low effective series resistance (ESR) and
effective series inductance (ESI), such as the common ceramic
types or surface-mount types. These low ESR and ESI capacitors
provide a low impedance path to ground at high frequencies to
handle transient currents due to internal logic switching.
ADDITIONAL INFORMATION
The following publications that describe the ADSP-BF50x pro-
cessors (and related processors) can be ordered from any
Analog Devices sales office or accessed electronically on our
website:
Getting Started With Blackfin Processors
ADSP-BF50x Blackfin Processor Hardware Reference (vol-
umes 1 and 2)
Blackfin Processor Programming Reference
ADSP-BF50x Blackfin Processor Anomaly List
RELATED SIGNAL CHAINS
A signal chain is a series of signal-conditioning electronic com-
ponents that receive input (data acquired from sampling either
real-time phenomena or from stored data) in tandem, with the
output of one portion of the chain supplying input to the next.
Signal chains are often used in signal processing applications to
gather and process data or to apply system controls based on
analysis of real-time phenomena. For more information about
this term and related topics, see the “signal chain” entry in
Wikipedia or the Glossary of EE Terms on the Analog Devices
website.
Analog Devices eases signal processing system development by
providing signal processing components that are designed to
work together well. A tool for viewing relationships between
specific applications and related components is available on the
www.analog.com website.
The Application Signal Chains page in the Circuits from the
Lab
TM
site (http:\\www.analog.com\signalchains) provides:
Graphical circuit block diagram presentation of signal
chains for a variety of circuit types and applications
Drill down links for components in each chain to selection
guides and application information
Reference designs applying best practice design techniques
Rev. B | Page 22 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
SIGNAL DESCRIPTIONS
Signal definitions for the ADSP-BF50x processors are listed in
Table 11. All pins for the ADC (ADSP-BF506F processor only)
are listed in Table 12.
In order to maintain maximum function and reduce package
size and pin count, some pins have multiple, multiplexed func-
tions. In cases where pin function is reconfigurable, the default
state is shown in plain text, while the alternate functions are
shown in italics.
During and immediately after reset, all processor signals (not
ADC signals) are three-stated with the following exceptions:
EXT_WAKE is driven high and XTAL is driven in conjunction
with CLKIN to create a crystal oscillator circuit. During
hibernate, all signals are three-stated with the following excep-
tions: EXT_WAKE is driven low and XTAL is driven to a solid
logic level.
During and immediately after reset, all I/O pins have their input
buffers disabled until enabled by user software with the excep-
tion of the pins that need pull-ups or pull-downs, as noted in
Table 11.
Adding a parallel termination to CLKOUT may prove useful in
further enhancing signal integrity. Be sure to verify over-
shoot/undershoot and signal integrity specifications on actual
hardware.
Table 11. Processor—Signal Descriptions
Signal Name Type Function
Driver
Type
Port F: GPIO and Multiplexed Peripherals
PF0/TSCLK0/UA0_RX/TMR6/CUD0 I/O GPIO/SPORT0TXSerialCLK/UART0RX/Timer6/Count Up Dir 0 C
PF1/RSCLK0/UA0_TX/TMR5/CDG0 I/O GPIO/SPORT0RX SerialCLK/UART0TX/Timer5/Count Down Dir0 C
PF2/DT0PRI/PWM0_BH/PPI_D8/CZM0 I/O GPIO/SPORT0TXPriData/PWM0Drive B Hi/PPIData8/Counter Zero Marker 0 C
PF3/TFS0/PWM0_BL/PPI_D9/CDG0 I/O GPIO/SPORT0TXFrameSync/PWM0Drive B Lo/PPIData9/Count Down Dir0 C
PF4/RFS0/PWM0_CH/PPI_D10/TACLK0 I/O GPIO/SPORT0RXFrameSync/PWM0Drive C Hi/PPIData10/AltTimerCLK0 C
PF5/DR0PRI/PWM0_CL/PPI_D11/TACLK1 I/O GPIO/SPORT0PriRX Data/PWM0Drive C Lo/PPIData11/AltTimerCLK1 C
PF6/UA1_TX/PWM0_TRIP/PPI_D12 I/O GPIO/UART1TX/PWM0TRIP/PPIData12 C
PF7/UA1_RX/PWM0_SYNC/PPI_D13/TACI3 I/O GPIO/UART1RX/PWM0SYNC/PPIData13/AltCaptureIn3 C
PF8/UA1_RTS/DT0SEC/PPI_D7 I/O GPIO/UART1 RTS/SPORT0 TX Sec Data/PPI Data 7 C
PF9/UA1_CTS/DR0SEC/PPI_D6/CZM0 I/O GPIO/UART1CTS/SPORT0 Sec RX Data/PPIData6/Counter Zero Marker0 C
PF10/SPI0_SCK/TMR2/PPI_D5 I/O GPIO/SPI0SCK/Timer2/PPIData 5 C
PF11/SPI0_MISO/PWM0_TRIP/PPI_D4/TACLK2 I/O GPIO/SPI0 MISO/PWM0 TRIP/PPI Data 4/Alt Timer CLK 2 C
PF12/SPI0_MOSI/PWM0_SYNC/PPI_D3 I/O GPIO/SPI0 MOSI/ PWM0 SYNC/PPI Data 3 C
PF13/SPI0_SEL1/TMR3/PPI_D2/SPI0_SS I/O GPIO/SPI0 Slave Select 1/Timer3/PPI Data 2/SPI0 Slave Select In C
PF14/SPI0_SEL2/PWM0_AH/PPI_D1 I/O GPIO/SPI0 Slave Select 2/PWM0 AH/PPI Data 1 C
PF15/SPI0_SEL3/PWM0_AL/PPI_D0 I/O GPIO/SPI0 Slave Select 3/PWM0 AL/PPI Data 0 C
Port G: GPIO and Multiplexed Peripherals
PG0/SPI1_SEL3/TMRCLK/PPI_CLK/UA1_RX/TACI4 I/O GPIO/SPI1 Slave Select 3/Timer CLK/PPI Clock/UART1 RX/Alt Capture In 4 C
PG1/SPI1_SEL2/PPI_FS3/CAN_RX/TACI5 I/O GPIO/SPI1 Slave Select 2/PPI FS3/CAN RX/Alt Capture In 5 C
PG2/SPI1_SEL1/TMR4/CAN_TX/SPI1_SS I/O GPIO/SPI1 Slave Select 1/Timer4/CAN TX/SPI1 Slave Select In C
PG3/HWAIT/SPI1_SCK/DT1SEC/UA1_TX I/O GPIO/HWAIT/SPI1 SCK/SPORT1 TX Sec Data/UART1 TX C
PG4/SPI1_MOSI/DR1SEC/PWM1_SYNC/TACLK6 I/O GPIO/SPI1 MOSI/SPORT1 Sec RX Data/PWM1 SYNC/Alt Timer CLK 6 C
PG5/SPI1_MISO/TMR7/PWM1_TRIP I/O GPIO/SPI1MISO/Timer7/PWM1 TRIP C
PG6/ACM_SGLDIFF/SD_D3/PWM1_AH I/O GPIO/ADCCMSGL DIFF/SDData 3/PWM1Drive A Hi C
PG7/ACM_RANGE/SD_D2/PWM1_AL I/O GPIO/ADC CM RANGE/SD Data 2/PWM1 Drive A Lo C
PG8/DR1SEC/SD_D1/PWM1_BH I/O GPIO/SPORT1 Sec RX Data/SDData1/PWM1Drive B Hi C
PG9/DR1PRI/SD_D0/PWM1_BL I/O GPIO/SPORT1PriRX Data/SDData 0/PWM1Drive B Lo C
PG10/RFS1/SD_CMD/PWM1_CH/TACI6 I/O GPIO/SPORT1RX FrameSync/SDCMD/PWM1 Drive C Hi/AltCaptureIn6 C
PG11/RSCLK1/SD_CLK/PWM1_CL/TACLK7 I/O GPIO/SPORT1 RX Serial CLK/SD CLK/PWM1 Drive C Lo/Alt Timer CLK 7 C
PG12/UA0_RX/SD_D4/PPI_D15/TACI2 I/O GPIO/UART0RX/SDData4/PPIData 15/AltCaptureIn2 C
PG13/UA0_TX/SD_D5/PPI_D14/CZM1 I/O GPIO/UART0TX/SDData5/PPIData14/Counter Zero Marker 1 C
Rev. B | Page 23 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
PG14/UA0_RTS/SD_D6/TMR0/PPI_FS1/CUD1 I/O GPIO/UART0 RTS/SD Data 6/Timer0/PPI FS1/Count Up Dir 1 C
PG15/UA0_CTS/SD_D7/TMR1/PPI_FS2/CDG1 I/O GPIO/UART0 CTS/SD Data 7/Timer1/PPI FS2/Count Down Dir 1 C
Port H: GPIO and Multiplexed Peripherals
PH0/ACM_A2/DT1PRI/SPI0_SEL3/WAKEUP I/O GPIO/ADCCM A2/SPORT1TXPri Data/SPI0SlaveSelect 3/Wake-up Input C
PH1/ACM_A1/TFS1/SPI1_SEL3/TACLK3 I/O GPIO/ADCCMA1/SPORT1TX FrameSync/SPI1SlaveSelect3/AltTimerCLK3 C
PH2/ACM_A0/TSCLK1/SPI1_SEL2/TACI7 I/O GPIO/ADC CM A0/SPORT1 TX Serial CLK/SPI1 Slave Select 2/Alt Capture In 7 C
TWI (2-Wire Interface) Port
SCL I/O
5V
TWI Serial Clock (This signal is an open-drain output and requires a pull-up
resistor. Consult version 2.1 of the I
2
C specification for the proper resistor
value.)
D
SDA I/O
5V
TWI Serial Data (This signal is an open-drain output and requires a pull-up
resistor. Consult version 2.1 of the I
2
C specification for the proper resistor
value.)
D
JTAG Port
TCK I JTAG CLK
TDO O JTAG Serial Data Out C
TDI I JTAG Serial Data In
TMS I JTAG Mode Select
TRST I JTAG Reset
(This signal should be pulled low if the JTAG port is not used.)
EMU O Emulation Output C
Clock
CLKIN I CLK/Crystal In
XTAL O Crystal Output
EXTCLK O Clock Output B
Mode Controls
RESET IReset
NMI I Nonmaskable Interrupt
(This signal should be pulled high when not used.)
BMODE2–0 I Boot Mode Strap 2-0
ADSP-BF50x Voltage Regulation I/F
EXT_WAKE O Wake up Indication C
PG I Power Good
Power Supplies ALL SUPPLIES MUST BE POWERED
See Operating Conditions on Page 26.
V
DDEXT
PI/OPowerSupply
V
DDINT
P Internal Power Supply
V
DDFLASH
P Flash Memory Power Supply
GND G Ground for All Supplies
Table 11. Processor—Signal Descriptions (Continued)
Signal Name Type Function
Driver
Type
Rev. B | Page 24 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 12. ADC—Signal Descriptions (ADSP-BF506F Processor Only)
Signal Name Type Function
DGND G Digital Ground. This is the ground reference point for all digital circuitry on the internal ADC. Both DGND
pins should connect to the DGND plane of a system. The DGND and AGND voltages should ideally be
at the same potential and must not be more than 0.3 V apart, even on a transient basis.
REF SELECT I Internal/External Reference Selection. Logic input. If this pin is tied to DGND, the on-chip 2.5 V reference
is used as the reference source for both ADC A and ADC B. In addition, Pin D
CAP
A and Pin D
CAP
B must be
tied to decoupling capacitors. If the REF SELECT pin is tied to a logic high, an external reference can be
supplied to the internal ADC through the D
CAP
A and/or D
CAP
B pins.
AV
DD
P Analog Supply Voltage, 2.7 V to 5.25 V. This is the only supply voltage for all analog circuitry on the
internal ADC. The AV
DD
and DV
DD
voltages should ideally be at the same potential and must not be more
than 0.3 V apart, even on a transient basis. This supply should be decoupled to AGND.
D
CAP
A, D
CAP
B (V
REF
) I Decoupling Capacitor Pins. Decoupling capacitors (470 nF recommended) are connected to these pins
to decouple the reference buffer for each respective ADC. Provided the output is buffered, the on-chip
reference can be taken from these pins and applied externally to the rest of a system. The range of the
external reference is dependent on the analog input range selected.
AGND G Analog Ground. Ground reference point for all analog circuitry on the internal ADC. All analog input
signals and any external reference signal should be referred to this AGND voltage. All three of these
AGND pins should connect to the AGND plane of a system. The AGND and DGND voltages ideally should
be at the same potential and must not be more than 0.3 V apart, even on a transient basis.
V
A1
to V
A6
I Analog Inputs of ADC A. These may be programmed as six single-ended channels or three true differ-
ential analog input channel pairs. See Table 53 (Analog Input Type and Channel Selection).
V
B1
to V
B6
I Analog Inputs of ADC B. These may be programmed as six single-ended channels or three true differ-
ential analog input channel pairs. See Table 53 (Analog Input Type and Channel Selection).
RANGE I Analog Input Range Selection. Logic input. The polarity on this pin determines the input range of the
analog input channels. If this pin is tied to a logic low, the analog input range is 0 V to V
REF
. If this pin is
tied to a logic high when CS goes low, the analog input range is 2 × V
REF
. For details, see Table 53 (Analog
Input Type and Channel Selection).
SGL/DIFF I Logic Input. This pin selects whether the analog inputs are configured as differential pairs or single
ended. A logic low selects differential operation while a logic high selects single-ended operation. For
details, see Table 53 (Analog Input Type and Channel Selection).
A0 to A2 I Multiplexer Select. Logic inputs. These inputs are used to select the pair of channels to be simultane-
ously converted, such as Channel 1 of both ADC A and ADC B, Channel 2 of both ADC A and ADC B, and
so on. The pair of channels selected may be two single-ended channels or two differential pairs. The
logic states of these pins need to be set up prior to the acquisition time and subsequent falling edge
of CS to correctly set up the multiplexer for that conversion. For further details, see Table 53 (Analog
Input Type and Channel Selection).
CS I Chip Select. Active low logic input. This input provides the dual function of initiating conversions on
the internal ADC and framing the serial data transfer. When connecting CS to a processor signal that is
three-stated during reset and/or hibernate, adding a pull-up resistor may prove useful to avoid random
ADC operation.
ADSCLK I Serial Clock. Logic input. A serial clock input provides the ADSCLK for accessing the data from the
internal ADC. This clock is also used as the clock source for the conversion process.
Rev. B | Page 25 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
D
OUT
A, D
OUT
B O Serial Data Outputs. The data output is supplied to each pin as a serial data stream. The bits are clocked
out on the falling edge of the ADSCLK input and 14 ADSCLKs are required to access the data. The data
simultaneously appears on both pins from the simultaneous conversions of both ADCs. The data stream
consists of two leading zeros followed by the 12 bits of conversion data. The data is provided MSB first.
If CS is held low for 16 ADSCLK cycles rather than 14, then two trailing zeros will appear after the 12 bits
of data. If CS is held low for a further 16 ADSCLK cycles on either D
OUT
A or D
OUT
B, the data from the other
ADC follows on the D
OUT
pin. This allows data from a simultaneous conversion on both ADCs to be
gathered in serial format on either D
OUT
A or D
OUT
B using only one serial port. For more information, see
the ADC—Serial Interface section.
V
DRIVE
P Logic Power Supply Input. The voltage supplied at this pin determines at what voltage the digital I/O
interface operates. This pin should be decoupled to DGND. The voltage at this pin may be different than
that at AV
DD
and DV
DD
but should never exceed either by more than 0.3 V.
DV
DD
P Digital Supply Voltage, 2.7 V to 5.25 V. This is the supply voltage for all digital circuitry on the internal
ADC. The DV
DD
and AV
DD
voltages should ideally be at the same potential and must not be more than
0.3 V apart even on a transient basis. This supply should be decoupled to DGND.
Table 12. ADC—Signal Descriptions (ADSP-BF506F Processor Only) (Continued)
Signal Name Type Function
Rev. B | Page 26 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
SPECIFICATIONS
Specifications are subject to change without notice.
OPERATING CONDITIONS
Table 13 shows settings for TWI_DT in the NONGPIO_DRIVE
register. Set this register prior to using the TWI port.
Parameter Conditions Min Nominal Max Unit
V
DDINT
Internal Supply Voltage Industrial Models 1.14 1.47 V
Internal Supply Voltage Commercial Models 1.10 1.47 V
Internal Supply Voltage Automotive Models 1.33 1.47 V
V
DDEXT1, 2
1
Must remain powered (even if the associated function is not used).
2
1.8 V and 2.5 V I/O are supported only on ADSP-BF504 nonautomotive models. All ADSP-BF50x flash and automotive models support 3.3 V I/O only.
External Supply Voltage 1.8 V I/O, ADSP-BF504, Nonautomotive
and Non Flash Models
1.7 1.8 1.9 V
External Supply Voltage 2.5 V I/O, ADSP-BF504, Nonautomotive
and Non Flash Models
2.25 2.5 2.75 V
External Supply Voltage 3.3 V I/O, ADSP-BF50x, All Models 2.7 3.3 3.6 V
V
DDFLASH1,
3
3
For ADSP-BF504, V
DDFLASH
pins should be connected to GND.
Flash Memory Supply Voltage 1.7 1.8 2.0 V
V
IH
High Level Input Voltage
4, 5
4
Parameter value applies to all input and bidirectional pins, except SDA and SCL.
5
Bidirectional pins (PF15–0, PG15–0, PH15–0) and input pins (TCK, TDI, TMS, TRST, CLKIN, RESET, NMI, and BMODE2–0) of the ADSP-BF50x processors are 2.5 V
tolerant (always accept up to 2.7 V maximum V
IH
). Voltage compliance (on outputs, V
OH
) is limited by the V
DDEXT
supply voltage.
V
DDEXT
= 1.90 V 1.2 V
High Level Input Voltage
4, 6
6
Bidirectional pins (PF15–0, PG15–0, PH2–0) and input pins (TCK, TDI, TMS, TRST, CLKIN, RESET, NMI, and BMODE2–0) of the ADSP-BF50x processors are 3.3 V tolerant
(always accept up to 3.6 V maximum V
IH
). Voltage compliance (on outputs, V
OH
) is limited by the V
DDEXT
supply voltage.
V
DDEXT
= 2.75 V 1.7 V
High Level Input Voltage
4, 6
V
DDEXT
= 3.6 V 2.0 V
V
IHTWI
High Level Input Voltage
5
V
DDEXT
= 1.90 V/2.75 V/3.6 V 0.7 × V
BUSTWI7, 8
7
The V
IHTWI
min and max value vary with the selection in the TWI_DT field of the NONGPIO_DRIVE register. See V
BUSTWI
min and max values in Table 13.
8
SDA and SCL are pulled up to V
BUSTWI
. See Table 13.
V
BUSTWI7, 8
V
V
IL
Low Level Input Voltage
4, 5
V
DDEXT
= 1.7 V 0.6 V
Low Level Input Voltage
4, 6
V
DDEXT
= 2.25 V 0.7 V
Low Level Input Voltage
4, 6
V
DDEXT
= 3.0 V 0.8 V
V
ILTWI
Low Level Input Voltage
5
V
DDEXT
= minimum 0.3 × V
BUSTWI8
V
T
J
Junction Temperature 88-Lead LFCSP @ T
AMBIENT
= –40°C to +85°C 40 +105 °C
Junction Temperature 88-Lead LFCSP @ T
AMBIENT
= 0°C to +70°C 0 +90 °C
Junction Temperature 120-Lead LQFP @ T
AMBIENT
= –40°C to +85°C –40 +105 °C
Junction Temperature 120-Lead LQFP @ T
AMBIENT
= 0°C to +70°C 0 +90 °C
Junction Temperature 88-Lead LFCSP @ T
AMBIENT
= –40°C to +105°C –40 +125 °C
Table 13. TWI_DT Field Selections and V
DDEXT
/V
BUSTWI
TWI_DT V
DDEXT
Nominal V
BUSTWI
Minimum V
BUSTWI
Nominal V
BUSTWI
Maximum Unit
000 (default) 3.3 2.97 3.3 3.63 V
001 1.8 1.7 1.8 1.98 V
010 2.5 2.97 3.3 3.63 V
011 1.8 2.97 3.3 3.63 V
100 3.3 4.5 5 5.5 V
101 1.8 2.25 2.5 2.75 V
110 2.5 2.25 2.5 2.75 V
111 (reserved)—————
Rev. B | Page 27 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADSP-BF50x Clock Related Operating Conditions
Table 14 describes the core clock timing requirements for the
ADSP-BF50x processors. Take care in selecting MSEL, SSEL,
and CSEL ratios so as not to exceed the maximum core clock
and system clock (see Table 16). Table 15 describes phase-
locked loop operating conditions.
Table 14. Core Clock (CCLK) Requirements—ADSP-BF50x Processors—All Speed Grades
Parameter Min V
DDINT
Nom V
DDINT
Max CCLK
Frequency Unit
f
CCLK
Core Clock Frequency (All Models) 1.33 V 1.400 V 400 MHz
Core Clock Frequency (Industrial/Commercial Models) 1.16 V 1.225 V 300 MHz
Core Clock Frequency (Industrial Models Only) 1.14 V 1.200 V 200 MHz
Core Clock Frequency (Commercial Models Only) 1.10 V 1.150 V 200 MHz
Table 15. Phase-Locked Loop Operating Conditions
Parameter Min Max Unit
f
VCO
Voltage Controlled Oscillator (VCO) Frequency
(Commercial/Industrial Models)
72 Instruction Rate
1
MHz
Voltage Controlled Oscillator (VCO) Frequency
(Automotive Models)
84 Instruction Rate
1
MHz
1
For more information, see Ordering Guide on Page 81.
Table 16. Maximum SCLK Conditions for ADSP-BF50x Processors
Parameter V
DDEXT
= 1.8 V/2.5 V/3.3 V Nominal Unit
f
SCLK
CLKOUT/SCLK Frequency (V
DDINT
1.16 V) 100 MHz
CLKOUT/SCLK Frequency (V
DDINT
1.16 V) 80 MHz
Rev. B | Page 28 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ELECTRICAL CHARACTERISTICS
Parameter Test Conditions Min Typical Max Unit
V
OH
High Level Output Voltage V
DDEXT
= 1.7 V, I
OH
= –0.5 mA 1.35 V
High Level Output Voltage V
DDEXT
= 2.25 V, I
OH
= –0.5 mA 2.0 V
High Level Output Voltage V
DDEXT
= 3.0 V, I
OH
= –0.5 mA 2.4 V
V
OL
Low Level Output Voltage V
DDEXT
= 1.7 V/2.25 V/3.0 V,
I
OL
= 2.0 mA
0.4 V
I
IH
High Level Input Current
1
V
DDEXT
=3.6 V, V
IN
= 3.6 V 10.0 μA
I
IL
Low Level Input Current
1
V
DDEXT
=3.6 V, V
IN
= 0 V 10.0 μA
I
IHP
High Level Input Current JTAG
2
V
DDEXT
= 3.6 V, V
IN
= 3.6 V 75.0 μA
I
OZH
Three-State Leakage Current
3
V
DDEXT
= 3.6 V, V
IN
= 3.6 V 10.0 μA
I
OZHTWI
Three-State Leakage Current
4
V
DDEXT
=3.0 V, V
IN
= 5.5 V 10.0 μA
I
OZL
Three-State Leakage Current
3
V
DDEXT
= 3.6 V, V
IN
= 0 V 10.0 μA
C
IN
Input Capacitance
5,6
f
IN
= 1 MHz, T
AMBIENT
= 25°C,
V
IN
=2.5V
58 pF
C
INTWI
Input Capacitance
4,6
f
IN
= 1 MHz, T
AMBIENT
= 25°C,
V
IN
=2.5V
10 pF
I
DDDEEPSLEEP7
V
DDINT
Current in Deep Sleep Mode V
DDINT
= 1.2 V, f
CCLK
= 0 MHz,
f
SCLK
=0MHz, T
J
= 25°C,
ASF = 0.00
1.85 mA
I
DDSLEEP
V
DDINT
Current in Sleep Mode V
DDINT
= 1.2 V, f
SCLK
= 25 MHz,
T
J
= 25°C
2.1 mA
I
DD-IDLE
V
DDINT
Current in Idle V
DDINT
= 1.2 V, f
CCLK
= 50 MHz,
T
J
= 25°C, ASF = 0.42
18 mA
I
DD-TYP
V
DDINT
Current V
DDINT
= 1.40 V, f
CCLK
= 400 MHz,
T
J
= 25°C, ASF = 1.00
104 mA
V
DDINT
Current V
DDINT
= 1.225 V, f
CCLK
= 300 MHz,
T
J
= 25°C, ASF = 1.00
69 mA
V
DDINT
Current V
DDINT
= 1.2 V, f
CCLK
= 200 MHz,
T
J
= 25°C, ASF = 1.00
51 mA
I
DDHIBERNATE8
Hibernate State Current V
DDEXT
=3.30V,
V
DDFLASH
=1.8 V, T
J
= 25°C,
CLKIN = 0 MHz (V
DDINT
= 0 V)
40 A
I
DDSLEEP9
V
DDINIT
Current in Sleep Mode f
CCLK
= 0 MHz, f
SCLK
 0 MHz Table 18 +
(.16 × V
DDINT
× f
SCLK
)
mA
10
I
DDDEEPSLEEP9
V
DDINT
Current in Deep Sleep Mode f
CCLK
= 0 MHz, f
SCLK
= 0 MHz Table 18 mA
I
DDINT9
V
DDINT
Current f
CCLK
 0 MHz, f
SCLK
0 MHz Table 18 +
(Table 19 × ASF) +
(.16 × V
DDINT
× f
SCLK
)
mA
I
DDFLASH1
Flash Memory Supply Current 1
— Asynchronous Read (5 MHz
NORCLK
11
)
10 20 mA
Flash Memory Supply Current 1
— Synchronous Read (50 MHz
NORCLK
11
)
4 Word 18 20 mA
8 Word 20 22 mA
16 Word 25 27 mA
Continuous 28 30 mA
Rev. B | Page 29 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
I
DDFLASH2
Flash Memory Supply Current 2
— Reset/Powerdown
15 50 μA
I
DDFLASH3
Flash Memory Supply Current 3
— Standby
15 50 μA
I
DDFLASH4
Flash Memory Supply Current 4
— Automatic Standby
15 50 μA
I
DDFLASH5
Flash Memory Supply Current 5
— Program
15 40 mA
Flash Memory Supply Current 5
— Erase
15 40 mA
I
DDFLASH6
Flash Memory Supply Current 6
— Dual Operations
Program/Erase in one bank,
asynchronous read in
another bank
25 60 mA
Program/Erase in one bank,
synchronous read in another
bank
43 70 mA
I
DDFLASH7
Flash Memory Supply Current 7
— Program/Erase Suspended
(Standby)
15 50 μA
1
Applies to input pins.
2
Applies to JTAG input pins (TCK, TDI, TMS, TRST).
3
Applies to three-statable pins.
4
Applies to bidirectional pins SCL and SDA.
5
Applies to all signal pins, except SCL and SDA.
6
Guaranteed, but not tested.
7
See the ADSP-BF50x Blackfin Processor Hardware Reference Manual for definition of sleep, deep sleep, and hibernate operating modes.
8
Applies to V
DDEXT
supply only. Clock inputs are tied high or low.
9
Guaranteed maximum specifications.
10
Unit for V
DDINT
is V (Volts). Unit for f
SCLK
is MHz. Example: 1.4 V, 75 MHz would be 0.16 × 1.4 × 75 = 16.8 mA adder.
11
See the ADSP-BF50x Blackfin Processor Hardware Reference Manual for definition of NORCLK.
Parameter Test Conditions Min Typical Max Unit
Rev. B | Page 30 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Total Power Dissipation
Total power dissipation has two components:
1. Static, including leakage current
2. Dynamic, due to transistor switching characteristics
Many operating conditions can also affect power dissipation,
including temperature, voltage, operating frequency, and pro-
cessor activity. Electrical Characteristics on Page 28 shows the
current dissipation for internal circuitry (V
DDINT
). I
DDDEEPSLEEP
specifies static power dissipation as a function of voltage
(V
DDINT
) and temperature (see Table 18), and I
DDINT
specifies the
total power specification for the listed test conditions, including
the dynamic component as a function of voltage (V
DDINT
) and
frequency (Table 19).
There are two parts to the dynamic component. The first part is
due to transistor switching in the core clock (CCLK) domain.
This part is subject to an Activity Scaling Factor (ASF) which
represents application code running on the processor core and
L1 memories (Table 17).
The ASF is combined with the CCLK Frequency and V
DDINT
dependent data in Table 19 to calculate this part. The second
part is due to transistor switching in the system clock (SCLK)
domain, which is included in the I
DDINT
specification equation.
Table 17. Activity Scaling Factors (ASF)
1
1
See Estimating Power for ASDP-BF534/BF536/BF537 Blackfin Processors
(EE-297). The power vector information also applies to the ADSP-BF50x
processors.
I
DDINT
Power Vector Activity Scaling Factor (ASF)
I
DD-PEAK
1.27
I
DD-HIGH
1.24
I
DD-TYP
1.00
I
DD-APP
0.85
I
DD-NOP
0.71
I
DD-IDLE
0.42
Table 18. Static Current—I
DD-DEEPSLEEP
(mA)
T
J
(°C)
1
Voltage (V
DDINT
)
1
1.10 V 1.15 V 1.20 V 1.25 V 1.30 V 1.35 V 1.40 V 1.45 V 1.50 V
–40 0.20 0.23 0.26 0.29 0.31 0.34 0.37 0.40 0.43
–20 0.30 0.34 0.38 0.43 0.47 0.51 0.55 0.59 0.63
0 0.50 0.57 0.63 0.70 0.77 0.83 0.90 0.97 1.03
25 0.90 1.03 1.17 1.30 1.43 1.57 1.70 1.83 1.97
40 1.30 1.50 1.70 1.90 2.10 2.30 2.50 2.70 2.90
55 2.00 2.30 2.60 2.90 3.20 3.50 3.80 4.10 4.40
70 3.00 3.47 3.93 4.40 4.87 5.33 5.80 6.27 6.73
85 4.60 5.23 5.87 6.50 7.13 7.77 8.40 9.03 9.67
100 6.80 7.67 8.53 9.40 10.27 11.13 12.00 12.87 13.73
105 7.80 8.77 9.73 10.70 11.67 12.63 13.60 14.57 15.53
125 12.50 14.00 15.50 17.00 18.50 20.00 21.50 23.00 24.50
1
Valid frequency and voltage ranges are model-specific. See Operating Conditions on Page 26.
Table 19. Dynamic Current in CCLK Domain (mA, with ASF = 1.0)
1
f
CCLK
(MHz)
2
Voltage (V
DDINT
)
2
1.10 V 1.15 V 1.20 V 1.25 V 1.30 V 1.35 V 1.40 V 1.45 V 1.50 V
400 N/A N/A N/A N/A 84.46 88.30 92.39 96.35 100.49
350 N/A N/A N/A N/A 74.30 77.93 81.39 84.94 88.61
300 N/A N/A 58.58 61.46 64.49 67.59 70.71 73.76 77.04
250 43.76 46.22 48.64 51.09 53.61 56.19 58.93 61.56 64.22
200 35.26 37.37 39.29 41.33 43.40 45.54 47.79 49.88 52.18
150 26.71 28.38 29.87 31.46 33.09 34.83 36.56 38.22 39.95
100 18.04 19.20 20.25 21.46 22.61 23.83 25.13 26.39 27.72
1
The values are not guaranteed as standalone maximum specifications. They must be combined with static current per the equations of Electrical Characteristics on Page 28.
2
Valid frequency and voltage ranges are model-specific. See Operating Conditions on Page 26 and ADSP-BF50x Clock Related Operating Conditions on Page 27.
Rev. B | Page 31 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
PROCESSOR—ABSOLUTE MAXIMUM RATINGS
Stresses greater than those listed in Table 20 may cause perma-
nent damage to the device. These are stress ratings only.
Functional operation of the device at these or any other condi-
tions greater than those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device
reliability.
Table 22 specifies the maximum total source/sink (I
OH
/I
OL
) cur-
rent for a group of pins. Permanent damage can occur if this
value is exceeded. To understand this specification, if pins PG5,
PG6, PG7, PG8, and PG9 from group 5 in the Total Current Pin
Groups table, each were sourcing or sinking 2 mA each, the
total current for those pins would be 10 mA. This would allow
up to 66 mA total that could be sourced or sunk by the remain-
ing pins in the group without damaging the device. For a list of
all groups and their pins, see the Total Current Pin Groups
table. Note that the V
OL
and V
OL
specifications have separate
per-pin maximum current requirements, see the Electrical
Characteristics table.
Table 20. Absolute Maximum Ratings
Parameter Rating
Internal Supply Voltage (V
DDINT
)–0.3 V to +1.5 V
External (I/O) Supply Voltage (V
DDEXT
)–0.3 V to +3.8 V
Input Voltage
1, 2
1
Applies to 100% transient duty cycle. For other duty cycles see Table 21.
2
Applies only when V
DDEXT
is within specifications. When V
DDEXT
is outside speci-
fications, the range is V
DDEXT
± 0.2 V.
–0.5 V to +3.6 V
Input Voltage
1, 2, 3
3
Applies to pins SCL and SDA.
–0.5 V to +5.5 V
Output Voltage Swing 0.5 V to
V
DDEXT
+0.5 V
I
OH
/I
OL
Current per Pin Group
4
4
For more information, see description preceding Table 22.
76 mA (max)
Storage Temperature Range 65°C to +150°C
Junction Temperature While Biased
(Nonautomotive Models)
+110°C
Junction Temperature While Biased
(Automotive Models)
+125°C
Table 21. Maximum Duty Cycle for Input Transient Voltage
1
1
Applies to all signal pins with the exception of CLKIN, XTAL, EXT_WAKE.
V
IN
Min (V)
2
2
The individual values cannot be combined for analysis of a single instance of
overshoot or undershoot. The worst case observed value must fall within one of
the voltages specified, and the total duration of the overshoot or undershoot
(exceeding the 100% case) must be less than or equal to the corresponding duty
cycle.
V
IN
Max (V)
2
Maximum Duty Cycle
3
3
Duty cycle refers to the percentage of time the signal exceeds the value for the
100% case. The is equivalent to the measured duration of a single instance of
overshoot or undershoot as a percentage of the period of occurrence.
–0.50 +3.80 100%
–0.70 +4.00 40%
–0.80 +4.10 25%
–0.90 +4.20 15%
–1.00 +4.30 10%
Table 22. Total Current Pin Groups
Group Pins in Group
1PF10, PF11
2 PF12, PF13, PF14, PF15
3PG0
4 PG1, PG2, PG3, PG4
5 PG5, PG6, PG7, PG8, PG9, PG10, PG11
6 PG12, PG13, PG14, PG15, SDA, SCL
7EMU
, EXT_WAKE, PG
8 PF0, PF1, PH0, PH1, PH2
9EXTCLK
10 PF2, PF3, PF4, PF5, PF6, PF7, PF8, PF9
Rev. B | Page 32 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ESD SENSITIVITY PACKAGE INFORMATION
The information presented in Figure 9 and Table 23 provides
details about the package branding for the ADSP-BF50x
processors.
ESD (electrostatic discharge) sensitive device.
Charged devices and circuit boards can discharge
without detection. Although this product features
patented or proprietary circuitry, damage may occur
on devices subjected to high energy ESD. Therefore,
proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.
Figure 9. Product Information on Package
Table 23. Package Brand Information
1
1
Nonautomotive only. For branding information specific to Automotive
products, contact Analog Devices Inc.
Brand Key Field Description
ADSP-BF50x Product Name
2
2
See product names in the Ordering Guide on Page 81.
t Temperature Range
pp Package Type
Z RoHS Compliant Designation
ccc See Ordering Guide
vvvvvv.x Assembly Lot Code
n.n Silicon Revision
# RoHS Compliance Designator
yyww Date Code
vvvvvv.x n.n
tppZccc
ADSP-BF50x
a
#yyww country_of_origin
B
Rev. B | Page 33 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
PROCESSOR—TIMING SPECIFICATIONS
Specifications subject to change without notice.
Clock and Reset Timing
Table 24 and Figure 10 describe clock and reset operations. Per
the CCLK and SCLK timing specifications in Table 14 to
Table 16, combinations of CLKIN and clock multipliers must
not select core/peripheral clocks in excess of the processor’s
speed grade. Table 25 and Figure 11 describe clock out timing.
Table 24. Clock and Reset Timing
Parameter Min Max Unit
Timing Requirements
f
CKIN
CLKIN Frequency
1, 2, 3, 4
(Commercial/Industrial Models) 12 50 MHz
CLKIN Frequency
1, 2, 3, 4
(Automotive Models) 14 50 MHz
t
CKINL
CLKIN Low Pulse
1
10 ns
t
CKINH
CLKIN High Pulse
1
10 ns
t
WRST
RESET Asserted Pulse Width Low
5
11 × t
CKIN
ns
Switching Characteristic
t
BUFDLAY
CLKIN to CLKBUF
6
Delay 11 ns
1
Applies to PLL bypass mode and PLL non bypass mode.
2
Combinations of the CLKIN frequency and the PLL clock multiplier must not exceed the allowed f
VCO
, f
CCLK
, and f
SCLK
settings discussed in Table 14 on Page 27 through
Table 16 on Page 27.
3
The t
CKIN
period (see Figure 10) equals 1/f
CKIN
.
4
If the DF bit in the PLL_CTL register is set, the minimum f
CKIN
specification is 24 MHz for commercial/industrial models and 28 MHz for automotive models.
5
Applies after power-up sequence is complete. See Table 26 and Figure 12 for power-up reset timing.
6
The ADSP-BF504/ADSP-BF504F/ ADSP-BF506F processor does not have a dedicated CLKBUF pin. Rather, the EXTCLK pin may be programmed to serve as CLKBUF or
CLKOUT. This parameter applies when EXTCLK is programmed to output CLKBUF.
Figure 10. Clock and Reset Timing
CLKIN
tWRST
tCKIN
tCKINL tCKINH
tBUFDLAY
tBUFDLAY
RESET
CLKBUF
Rev. B | Page 34 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 25. Clock Out Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Switching Characteristics
t
SCLK
CLKOUT
1
Period
2,3
10 10 ns
t
SCLKH
CLKOUT
1
Width High 44ns
t
SCLKL
CLKOUT
1
Width Low 44ns
1
The ADSP-BF504/ADSP-BF504F/ADSP-BF506F processor does not have a dedicated CLKOUT pin. Rather, the EXTCLK pin may be programmed to serve as CLKBUF or
CLKOUT. This parameter applies when EXTCLK is programmed to output CLKOUT.
2
The t
SCLK
value is the inverse of the f
SCLK
specification. Reduced supply voltages affect the best-case value of 10 ns listed here.
3
The t
SCLK
value does not account for the effects of jitter.
Figure 11. Clock Out Timing
tSCLKL tSCLKH
tSCLK
CLKOUT
Table 26. Power-Up Reset Timing
Parameter Min Max Unit
Timing Requirement
t
RST
_
IN
_
PWR
RESET Deasserted after the V
DDINT
, V
DDEXT
, V
DDFLASH
, and CLKIN Pins are Stable and
Within Specification
3500 × t
CKIN
ns
In Figure 12, V
DD_SUPPLIES
is V
DDINT
, V
DDEXT
, and V
DDFLASH
.
Figure 12. Power-Up Reset Timing
RESET
tRST_IN_PWR
CLKIN
VDD_SUPPLIES
Rev. B | Page 35 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Parallel Peripheral Interface Timing
Table 27 and Figure 14 on Page 35, Figure 20 on Page 40, and
Figure 22 on Page 41 describe parallel peripheral interface
operations.
Table 27. Parallel Peripheral Interface Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
PCLKW
PPI_CLK Width
1
t
SCLK
–1.5 t
SCLK
–1.5 ns
t
PCLK
PPI_CLK Period
1
2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
Timing Requirements—GP Input and Frame Capture Modes
t
PSUD
External Frame Sync Startup Delay
2
4 × t
PCLK
4 × t
PCLK
ns
t
SFSPE
External Frame Sync Setup Before PPI_CLK
(Nonsampling Edge for Rx, Sampling Edge for Tx)
6.7 6.7 ns
t
HFSPE
External Frame Sync Hold After PPI_CLK 1.5 1.5 ns
t
SDRPE
Receive Data Setup Before PPI_CLK 4.1 3.5 ns
t
HDRPE
Receive Data Hold After PPI_CLK 2 1.6 ns
Switching Characteristics—GP Output and Frame Capture Modes
t
DFSPE
Internal Frame Sync Delay After PPI_CLK 8.7 8.0 ns
t
HOFSPE
Internal Frame Sync Hold After PPI_CLK 1.7 1.7 ns
t
DDTPE
Transmit Data Delay After PPI_CLK 8.7 8.0 ns
t
HDTPE
Transmit Data Hold After PPI_CLK 2.3 1.9 ns
1
PPI_CLK frequency cannot exceed f
SCLK
/2
2
The PPI port is fully enabled 4 PPI clock cycles after the PAB write to the PPI port enable bit. Only after the PPI port is fully enabled are external frame syncs and data words
guaranteed to be received correctly by the PPI peripheral.
Figure 13. PPI with External Frame Sync Timing
Figure 14. PPI GP Rx Mode with External Frame Sync Timing
PPI_CLK
PPI_FS1/2
tPSUD
tPCLK
tSFSPE
DATA SAMPLED /
FRAME SYNC SAMPLED
DATA SAMPLED /
FRAME SYNC SAMPLED
PPI_DATA
PPI_CLK
PPI_FS1/2
tHFSPE
tHDRPE
tSDRPE
tPCLKW
Rev. B | Page 36 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 15. PPI GP Tx Mode with External Frame Sync Timing
Figure 16. PPI GP Rx Mode with Internal Frame Sync Timing
Figure 17. PPI GP Tx Mode with Internal Frame Sync Timing
tHDTPE
tSFSPE
DATA DRIVEN /
FRAME SYNC SAMPLED
PPI_DATA
PPI_CLK
PPI_FS1/2
tHFSPE
tDDTPE
tPCLK
tPCLKW
tHDRPE
tSDRPE
tHOFSPE
FRAME SYNC
DRIVEN
DATA
SAMPLED
PPI_DATA
PPI_CLK
PPI_FS1/2
tDFSPE
tPCLK
tPCLKW
tHOFSPE
FRAME SYNC
DRIVEN
DATA
DRIVEN
PPI_DATA
PPI_CLK
PPI_FS1/2
tDFSPE
tDDTPE tHDTPE
tPCLK
tPCLKW
DATA
DRIVEN
Rev. B | Page 37 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
RSI Controller Timing
Table 28 and Figure 18 describe RSI Controller Timing.
Table 29 and Figure 19 describe RSI controller (high speed)
timing.
Table 28. RSI Controller Timing
Parameter Min Max Unit
Timing Requirements
t
ISU
Input Setup Time 5.75 ns
t
IH
Input Hold Time 2 ns
Switching Characteristics
f
PP1
Clock Frequency Data Transfer Mode 0 25 MHz
f
OD
Clock Frequency Identification Mode 100
2
400 kHz
t
WL
Clock Low Time 10 ns
t
WH
Clock High Time 10 ns
t
TLH
Clock Rise Time 10 ns
t
THL
Clock Fall Time 10 ns
t
ODLY
Output Delay Time During Data Transfer Mode 14 ns
t
ODLY
Output Delay Time During Identification Mode 50 ns
1
t
PP
= 1/f
PP
.
2
Specification can be 0 kHz, which means to stop the clock. The given minimum frequency range is for cases where a continuous clock is required.
Figure 18. RSI Controller Timing
SD_CLK
INPUT
OUTPUT
tISU
NOTES:
1 INPUT INCLUDES SD_Dx AND SD_CMD SIGNALS.
2 OUTPUT INCLUDES SD_Dx AND SD_CMD SIGNALS.
tTHL tTLH
tWL tWH
tPP
tIH
tODLY
VOH (MIN)
VOL (MAX)
Rev. B | Page 38 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 29. RSI Controller Timing (High Speed Mode)
Parameter Min Max Unit
Timing Requirements
t
ISU
Input Setup Time 5.75 ns
t
IH
Input Hold Time 2 ns
Switching Characteristics
f
PP1
Clock Frequency Data Transfer Mode 0 50 MHz
t
WL
Clock Low Time 7 ns
t
WH
Clock High Time 7 ns
t
TLH
Clock Rise Time 3ns
t
THL
Clock Fall Time 3ns
t
ODLY
Output Delay Time During Data Transfer Mode 2.5 ns
t
OH
Output Hold Time 2.5 ns
1
t
PP
= 1/f
PP
.
Figure 19. RSI Controller Timing (High-Speed Mode)
SD_CLK
INPUT
OUTPUT
tISU
NOTES:
1 INPUT INCLUDES SD_Dx AND SD_CMD SIGNALS.
2 OUTPUT INCLUDES SD_Dx AND SD_CMD SIGNALS.
tTHL tTLH
tWL tWH
tPP
tIH
tODLY tOH
VOH (MIN)
VOL (MAX)
Rev. B | Page 39 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Serial Ports
Table 30 through Table 33 on Page 41 and Figure 20 on Page 40
through Figure 22 on Page 41 describe serial port operations.
Table 30. Serial Ports—External Clock
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
SFSE
TFSx/RFSx Setup Before TSCLKx/RSCLKx
1
3.0 3.0 ns
t
HFSE
TFSx/RFSx Hold After TSCLKx/RSCLKx
1
3.0 3.0 ns
t
SDRE
Receive Data Setup Before RSCLKx
1,2
3.0 3.0 ns
t
HDRE
Receive Data Hold After RSCLKx
1,2
3.5 3.0 ns
t
SCLKEW
TSCLKx/RSCLKx Width 4.5 4.5 ns
t
SCLKE
TSCLKx/RSCLKx Period 2 × t
SCLK
2 × t
SCLK
ns
Switching Characteristics
t
DFSE
TFSx/RFSx Delay After TSCLKx/RSCLKx
(Internally Generated TFSx/RFSx)
3
10.0 10.0 ns
t
HOFSE
TFSx/RFSx Hold After TSCLKx/RSCLKx
(Internally Generated TFSx/RFSx)
3
0.0 0.0 ns
t
DDTE
Transmit Data Delay After TSCLKx
3
11.0 10.0 ns
t
HDTE
Transmit Data Hold After TSCLKx
3
0.0 0.0 ns
1
Referenced to sample edge.
2
When SPORT is used in conjunction with the ACM, refer to the timing requirements in Table 41 (ACM Timing).
3
Referenced to drive edge.
Table 31. Serial Ports—Internal Clock
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
SFSI
TFSx/RFSx Setup Before TSCLKx/RSCLKx
1
11.0 9.6 ns
t
HFSI
TFSx/RFSx Hold After TSCLKx/RSCLKx
1
–1.5 –1.5 ns
t
SDRI
Receive Data Setup Before RSCLKx
1,2
11.5 10.0 ns
t
HDRI
Receive Data Hold After RSCLKx
1,2
–1.5 –1.5 ns
Switching Characteristics
t
SCLKIW
TSCLKx/RSCLKx Width 7.0 8.0 ns
t
DFSI
TFSx/RFSx Delay After TSCLKx/RSCLKx
(Internally Generated TFSx/RFSx)
3
4.0 3.0 ns
t
HOFSI
TFSx/RFSx Hold After TSCLKx/RSCLKx
(Internally Generated TFSx/RFSx)
3
–2.0 –1.0 ns
t
DDTI
Transmit Data Delay After TSCLKx
3
4.0 3.0 ns
t
HDTI
Transmit Data Hold After TSCLKx
3
–1.8 –1.5 ns
1
Referenced to sample edge.
2
When SPORT is used in conjunction with the ACM, refer to the timing requirements in Table 41 (ACM Timing).
3
Referenced to drive edge.
Rev. B | Page 40 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 20. Serial Ports
Table 32. Serial Ports—Enable and Three-State
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Switching Characteristics
t
DTENE
Data Enable Delay from External TSCLKx
1
0.0 0.0 ns
t
DDTTE
Data Disable Delay from External TSCLKx
1
t
SCLK
+1 t
SCLK
+1 ns
t
DTENI
Data Enable Delay from Internal TSCLKx
1
–2.0 –2.0 ns
t
DDTTI
Data Disable Delay from Internal TSCLKx
1
t
SCLK
+1 t
SCLK
+1 ns
1
Referenced to drive edge.
Figure 21. Serial Ports — Enable and Three-State
tSDRI
RSCLKx
DRx
DRIVE EDGE
tHDRI
tSFSI tHFSI
tDFSI
tHOFSI
tSCLKIW
DATA RECEIVE—INTERNAL CLOCK
tSDRE
DATA RECEIVE—EXTERNAL CLOCK
RSCLKx
DRx
tHDRE
tSFSE tHFSE
tDFSE
tSCLKEW
tHOFSE
tDDTI
tHDTI
TSCLKx
TFSx
(INPUT)
DTx
tSFSI tHFSI
tSCLKIW
tDFSI
tHOFSI
DATA TRANSMIT—INTERNAL CLOCK
tDDTE
tHDTE
TSCLKx
DTx
tSFSE
tDFSE
tSCLKEW
tHOFSE
DATA TRANSMIT—EXTERNAL CLOCK
SAMPLE EDGE
DRIVE EDGE SAMPLE EDGE DRIVE EDGE SAMPLE EDGE
DRIVE EDGE SAMPLE EDGE
tSCLKE
tSCLKE
tHFSE
TFSx
(OUTPUT)
TFSx
(INPUT)
TFSx
(OUTPUT)
RFSx
(INPUT)
RFSx
(OUTPUT)
RFSx
(INPUT)
RFSx
(OUTPUT)
TSCLKx
DTx
DRIVE EDGE
tDDTTE/I
tDTENE/I
DRIVE EDGE
Rev. B | Page 41 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 33. Serial Ports — External Late Frame Sync
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Switching Characteristics
t
DDTLFSE
Data Delay from Late External TFSx
or External RFSx in Multi-channel Mode With MFD = 0
1, 2
12.0 10.0 ns
t
DTENLFSE
Data Enable from External RFSx in Multi-channel Mode With
MFD = 0
1, 2
0.0 0.0 ns
1
When in multi-channel mode, TFSx enable and TFSx valid follow t
DTENLFSE
and t
DDTLFSE
.
2
If external RFSx/TFSx setup to RSCLKx/TSCLKx > t
SCLKE
/2 then t
DDTTE/I
and t
DTENE/I
apply, otherwise t
DDTLFSE
and t
DTENLFSE
apply.
Figure 22. Serial Ports — External Late Frame Sync
RSCLKx
RFSx
DTx
DRIVE
EDGE
DRIVE
EDGE
SAMPLE
EDGE
EXTERNAL RFSx IN MULTI-CHANNEL MODE
1ST BIT
tDTENLFSE
tDDTLFSE
TSCLKx
TFSx
DTx
DRIVE
EDGE
DRIVE
EDGE
SAMPLE
EDGE
LATE EXTERNAL TFSx
1ST BIT
tDDTLFSE
Rev. B | Page 42 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Serial Peripheral Interface (SPI) Port—Master Timing
Table 34 and Figure 23 describe SPI port master operations.
Table 34. Serial Peripheral Interface (SPI) Port—Master Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
SSPIDM
Data Input Valid to SCK Edge (Data Input Setup) 11.6 9.6 ns
t
HSPIDM
SCK Sampling Edge to Data Input Invalid –1.5 –1.5 ns
Switching Characteristics
t
SDSCIM
SPISELx low to First SCK Edge 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SPICHM
Serial Clock High Period 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SPICLM
Serial Clock Low Period 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SPICLK
Serial Clock Period 4 × t
SCLK
–1.5 4 × t
SCLK
–1.5 ns
t
HDSM
Last SCK Edge to SPISELx High 2 × t
SCLK
–2.0 2 × t
SCLK
–1.5 ns
t
SPITDM
Sequential Transfer Delay 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
DDSPIDM
SCK Edge to Data Out Valid (Data Out Delay) 0606ns
t
HDSPIDM
SCK Edge to Data Out Invalid (Data Out Hold) –1.0 –1.0 ns
Figure 23. Serial Peripheral Interface (SPI) Port—Master Timing
tSDSCIM tSPICLK tHDSM tSPITDM
tSPICLM tSPICHM
tHDSPIDM
tHSPIDM
tSSPIDM
SPIxSELy
(OUTPUT)
SPIxSCK
(OUTPUT)
SPIxMOSI
(OUTPUT)
SPIxMISO
(INPUT)
SPIxMOSI
(OUTPUT)
SPIxMISO
(INPUT)
CPHA = 1
CPHA = 0
tDDSPIDM
tHSPIDM
tSSPIDM
tHDSPIDM
tDDSPIDM
Rev. B | Page 43 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Serial Peripheral Interface (SPI) Port—Slave Timing
Table 35 and Figure 24 describe SPI port slave operations.
Table 35. Serial Peripheral Interface (SPI) Port—Slave Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
SPICHS
Serial Clock High Period 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SPICLS
Serial Clock Low Period 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SPICLK
Serial Clock Period 4 × t
SCLK
4 × t
SCLK
ns
t
HDS
Last SCK Edge to SPISS Not Asserted 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SPITDS
Sequential Transfer Delay 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SDSCI
SPISS Assertion to First SCK Edge 2 × t
SCLK
–1.5 2 × t
SCLK
–1.5 ns
t
SSPID
Data Input Valid to SCK Edge (Data Input Setup) 1.6 1.6 ns
t
HSPID
SCK Sampling Edge to Data Input Invalid 2.0 1.6 ns
Switching Characteristics
t
DSOE
SPISS Assertion to Data Out Active 0 12.0 0 10.3 ns
t
DSDHI
SPISS Deassertion to Data High Impedance 0 11.0 0 9.0 ns
t
DDSPID
SCK Edge to Data Out Valid (Data Out Delay) 10 10 ns
t
HDSPID
SCK Edge to Data Out Invalid (Data Out Hold) 0 0 ns
Figure 24. Serial Peripheral Interface (SPI) Port—Slave Timing
tSPICLK tHDS tSPITDS
tSDSCI tSPICLS tSPICHS
tDSOE tDDSPID
tDDSPID tDSDHI
tHDSPID
tSSPID
tDSDHI
tHDSPID
tDSOE
tHSPID
tSSPID
tDDSPID
SPIxSS
(INPUT)
SPIxSCK
(INPUT)
SPIxMISO
(OUTPUT)
SPIxMOSI
(INPUT)
SPIxMISO
(OUTPUT)
SPIxMOSI
(INPUT)
CPHA = 1
CPHA = 0
tHSPID
Rev. B | Page 44 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Universal Asynchronous Receiver-Transmitter
(UART) Ports—Receive and Transmit Timing
The UART ports receive and transmit operations are described
in the ADSP-BF50x Hardware Reference Manual.
General-Purpose Port Timing
Table 36 and Figure 25 describe general-purpose
port operations.
Table 36. General-Purpose Port Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirement
t
WFI
General-Purpose Port Pin Input Pulse Width t
SCLK
+ 1 t
SCLK
+ 1 ns
Switching Characteristic
t
GPOD
General-Purpose Port Pin Output Delay from CLKOUT High 0 11.0 0 8.9 ns
Figure 25. General-Purpose Port Timing
CLKOUT
GPIO OUTPUT
GPIO INPUT
tWFI
tGPOD
Rev. B | Page 45 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Timer Cycle Timing
Table 37 and Figure 26 describe timer expired operations. The
input signal is asynchronous in “width capture mode” and
“external clock mode” and has an absolute maximum input fre-
quency of (f
SCLK
/2) MHz.
Table 37. Timer Cycle Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
WL
Timer Pulse Width Input Low
(Measured In SCLK Cycles)
1
1 × t
SCLK
1 × t
SCLK
ns
t
WH
Timer Pulse Width Input High
(Measured In SCLK Cycles)
1
1 × t
SCLK
1 × t
SCLK
ns
t
TIS
Timer Input Setup Time Before CLKOUT Low
2
10 8 ns
t
TIH
Timer Input Hold Time After CLKOUT Low
2
–2 –2 ns
Switching Characteristics
t
HTO
Timer Pulse Width Output
(Measured In SCLK Cycles)
1 × t
SCLK
– 2.0 (2
32
–1) × t
SCLK
1 × t
SCLK
– 1.5 (2
32
–1) × t
SCLK
ns
t
TOD
Timer Output Update Delay After CLKOUT High 6 6 ns
1
The minimum pulse widths apply for TMRx signals in width capture and external clock modes. They also apply to the PG0 or PPI_CLK signals in PWM output mode.
2
Either a valid setup and hold time or a valid pulse width is sufficient. There is no need to resynchronize programmable flag inputs.
Figure 26. Timer Cycle Timing
CLKOUT
TMRx OUTPUT
TMRx INPUT
tTIS tTIH
tWH,tWL
tTOD
tHTO
Rev. B | Page 46 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Timer Clock Timing
Table 38 and Figure 27 describe timer clock timing.
Up/Down Counter/Rotary Encoder Timing
Table 38. Timer Clock Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Switching Characteristic
t
TODP
Timer Output Update Delay After PPI_CLK High 12.0 12.0 ns
Figure 27. Timer Clock Timing
Table 39. Up/Down Counter/Rotary Encoder Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
WCOUNT
Up/Down Counter/Rotary Encoder Input Pulse Width t
SCLK
+ 1 t
SCLK
+ 1 ns
t
CIS
Counter Input Setup Time Before CLKOUT High
1
1
Either a valid setup and hold time or a valid pulse width is sufficient. There is no need to resynchronize counter inputs.
9.0 7.0 ns
t
CIH
Counter Input Hold Time After CLKOUT High
1
00ns
Figure 28. Up/Down Counter/Rotary Encoder Timing
PPI_CLK
TMRx OUTPUT
tTODP
CLKOUT
CUD/CDG/CZM
tCIS
tCIH
tWCOUNT
Rev. B | Page 47 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Pulse Width Modulator (PWM) Timing
Table 40 and Figure 29 describe PWM operations.
Table 40. PWM Timing
Parameter Min Max Unit
Timing Requirement
t
ES
External Sync Pulse Width 2 × t
SCLK
+ 1 ns
Switching Characteristics
t
DODIS
Output
1
Inactive (OFF) After Trip Input 12 ns
t
DOE
Output
1
Delay After External Sync
2
2 × t
SCLK
5 × t
SCLK
+ 13 ns
t
OD
Output
1
Delay After Falling Edge of CLKOUT 5 ns
1
PWM outputs are: PWMx_AH, PWMx_AL, PWMx_BH, PWMx_BL, PWMx_CH, and PWMx_CL.
2
When the external sync signal is synchronous to the peripheral clock, it takes fewer clock cycles for the output to appear compared to when the external sync signal is
asynchronous to the peripheral clock. For more information, see the ADSP-BF50x Blackfin Processor Hardware Reference.
Figure 29. PWM Timing
PWMx_TRIP
PWMx_SYNC
(AS INPUT)
tES
tDOE
OUTPUT
tOD
tDODIS
CLKOUT
Rev. B | Page 48 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADC Controller Module (ACM) Timing
Table 41 and Figure 30 describe ACM operations.
Note that the ACM clock (ACLK) frequency in MHz is set by
the following equation (in which ACMCKDIV ranges from
0 to 255).
fACLK
fSCLK
2ACMCKDIV2+
--------------------------------------------------------
=
tACLK
1
fACLK
--------------
=
Table 41. ACM Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
SDR
SPORT DRxPRI/DRxSEC Setup Before ACLK 8.0 7.0 ns
t
HDR
SPORT DRxPRI/DRxSEC Hold After ACLK 0 0 ns
Switching Characteristics
t
DO
ACM Controls (ACM_A[2:0], ACM_RANGE, ACM_SGLDIFF) Delay
After Falling Edge of CLKOUT
8.4 8.4 ns
t
DACLK
ACLK Delay After Falling Edge of CLKOUT 4.5 4.5 ns
t
DCS
CS Active Edge Delay After Falling Edge of CLKOUT 5.6 5.3 ns
t
DCSACLK
The Delay Between the Active Edge of CS and the First Edge of
ACLK
t
ACLK
– 5 t
ACLK
– 5 ns
Figure 30. ACM Timing
CS
tDCSACLK
ACLK
ACM
CONTROLS
DRxPRI/
DRxSEC
CLKOUT
tDCS
tDACLK
tDO
tSDR tHDR
Rev. B | Page 49 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
JTAG Test And Emulation Port Timing
Table 42 and Figure 31 describe JTAG port operations.
Table 42. JTAG Port Timing
Parameter
V
DDEXT
= 1.8 V V
DDEXT
= 2.5 V/3.3 V
Min Max Min Max Unit
Timing Requirements
t
TCK
TCK Period 20 20 ns
t
STAP
TDI, TMS Setup Before TCK High 4 4 ns
t
HTAP
TDI, TMS Hold After TCK High 4 4 ns
t
SSYS
System Inputs Setup Before TCK High
1
44ns
t
STWI
TWI System Inputs Setup Before TCK High
2
n/a 5 ns
t
HSYS
System Inputs Hold After TCK High
1
55ns
t
TRSTW
TRST Pulse Width
3
(measured in TCK cycles) 4 4 TCK
Switching Characteristics
t
DTDO
TDO Delay from TCK Low 10 10 ns
t
DSYS
System Outputs Delay After TCK Low
4
12 12 ns
1
Applies to System Inputs = PF15–0, PG15–0, PH2–0, NMI, BMODE3–0, RESET.
2
Applies to TWI System Inputs = SCL, SDA. For SDA and SCL system inputs, the system design must comply with V
DDEXT
and VBUSTWI voltages specified for the default
TWI_DT (000) setting in Table 13.
3
50 MHz Maximum.
4
System Outputs = EXTCLK, SCL, SDA, PF15–0, PG15–0, PH2–0.
Figure 31. JTAG Port Timing
TCK
TMS
TDI
TDO
SYSTEM
INPUTS
SYSTEM
OUTPUTS
tTCK
tSTAP tHTAP
tDTDO
tSSYS tHSYS
tDSYS
tSTWI
Rev. B | Page 50 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
PROCESSOR—OUTPUT DRIVE CURRENTS
Figure 32 through Figure 40 show typical current-voltage char-
acteristics for the output drivers of the ADSP-BF50xF
processors.
The curves represent the current drive capability of the output
drivers. See Table 11 on Page 22 for information about which
driver type corresponds to a particular pin.
Figure 32. Driver Type B Current (3.3 V V
DDEXT
)
Figure 33. Driver Type B Current (2.5 V V
DDEXT
)
Figure 34. Driver Type B Current (1.8 V V
DDEXT
)
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
240
120
80
–240
–120
–40
VOL
VOH
VDDEXT = 3.6V @ – 55
°
C
VDDEXT = 3.3V @ 25
°
C
–80
–200
40
160 VDDEXT = 3.0V @ 125
°
C
–160
200
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2.0 2.5
160
120
40
–160
–40
VOL
VOH
VDDEXT = 2.75V @ – 55
°
C
VDDEXT = 2.5V @ 25
°
C
80
–80
VDDEXT = 2.25V @ 125
°
C
–120
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5
80
60
40
–60
–20
VOL
VOH
VDDEXT = 1.9V @ – 55
°
C
VDDEXT = 1.8V @ 25
°
C
–40
20
VDDEXT = 1.7V @ 155
°
C
–80
Figure 35. Driver Type C Current (3.3 V V
DDEXT
)
Figure 36. Drive Type C Current (2.5 V V
DDEXT
)
Figure 37. Driver Type C Current (1.8 V V
DDEXT
)
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
100
60
40
–100
–60
–20
VOL
VOH
VDDEXT = 3.6V @ – 55
°
C
VDDEXT = 3.3V @ 25
°
C
–40
–80
20
80 VDDEXT = 3.0V @ 125
°
C
120
–120
2.5
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2.0
80
40
20
–80
–20
VOL
VOH
VDDEXT = 2.75V @ – 55
°
C
VDDEXT = 2.5V @ 25
°
C
–40
VDDEXT = 2.25V @ 125
°
C
–60
60
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5
50
40
30
–50
–40
–10
VOL
VOH
VDDEXT = 1.9V @ – 55
°
C
VDDEXT = 1.8V @ 25
°
C
–20
10
VDDEXT = 1.7V @ 125
°
C
20
–30
Rev. B | Page 51 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
PROCESSOR—TEST CONDITIONS
All timing parameters appearing in this data sheet were mea-
sured under the conditions described in this section. Figure 41
shows the measurement point for AC measurements (except
output enable/disable). The measurement point V
MEAS
is V
DDEXT
/2
for V
DDEXT
(nominal) = 1.8 V/2.5 V/3.3 V.
Output Enable Time Measurement
Output pins are considered to be enabled when they have made
a transition from a high impedance state to the point when they
start driving.
The output enable time t
ENA
is the interval from the point when a
reference signal reaches a high or low voltage level to the point
when the output starts driving as shown on the right side of
Figure 42.
The time t
ENA
_
MEASURED
is the interval, from when the reference sig-
nal switches, to when the output voltage reaches V
TRIP
(high) or
V
TRIP
(low). For V
DDEXT
(nominal) = 1.8 V, V
TRIP
(high) is 1.05 V,
and V
TRIP
(low) is 0.75 V. For V
DDEXT
(nominal) = 2.5 V, V
TRIP
(high) is 1.5 V and V
TRIP
(low) is 1.0 V. For V
DDEXT
(nominal) =
3.3 V, V
TRIP
(high) is 1.9 V, and V
TRIP
(low) is 1.4 V. Time t
TRIP
is
the interval from when the output starts driving to when the
output reaches the V
TRIP
(high) or V
TRIP
(low) trip voltage.
Time t
ENA
is calculated as shown in the equation:
If multiple pins are enabled, the measurement value is that of
the first pin to start driving.
Figure 38. Driver Type D Current (3.3 V V
DDEXT
)
Figure 39. Driver Type D Current (2.5 V V
DDEXT
)
Figure 40. Driver Type D Current (1.8 V V
DDEXT
)
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
–40
–10
VOL
VDDEXT = 3.6V @ – 55
°
C
VDDEXT = 3.3V @ 25
°
C
–20
–30
VDDEXT = 3.0V @ 125
°
C
–50
–60
0
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2.0 2.5
–35
–25
–10
VOL
VDDEXT = 2.75V @ – 55
°
C
VDDEXT = 2.5V @ 25
°
C
–15
VDDEXT = 2.25V @ 125
°
C
–20
–5
–30
SOURCE CURRENT (mA)
SOURCE VOLTAGE (V)
0 0.5 1.0 1.5 2
0
–16
–12
VOL
VDDEXT = 1.9V @ – 55
°
C
VDDEXT = 1.8V @ 25
°
C
–14
VDDEXT = 1.7V @ 125
°
C
–2
–4
–8
–6
–10
Figure 41. Voltage Reference Levels for AC
Measurements (Except Output Enable/Disable)
Figure 42. Output Enable/Disable
INPUT
OR
OUTPUT
V
MEAS
V
MEAS
REFERENCE
SIGNAL
tDIS
OUTPUT STARTS DRIVING
VOH (MEASURED) V
VOL (MEASURED) + V
tDIS_MEASURED
VOH
(MEASURED)
VOL
(MEASURED)
VTRIP(HIGH)
VOH(MEASURED
)
VOL(MEASURED)
HIGH IMPEDANCE STATE
OUTPUT STOPS DRIVING
tENA
tDECAY
tENA_MEASURED
tTRIP
VTRIP(LOW)
tENA tENA_MEASURED tTRIP
=
Rev. B | Page 52 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Output Disable Time Measurement
Output pins are considered to be disabled when they stop driv-
ing, go into a high impedance state, and start to decay from their
output high or low voltage. The output disable time t
DIS
is the
difference between t
DIS
_
MEASURED
and t
DECAY
as shown on the left side
of Figure 42.
The time for the voltage on the bus to decay by V is dependent
on the capacitive load C
L
and the load current I
L
. This decay time
can be approximated by the equation:
The time t
DECAY
is calculated with test loads C
L
and I
L
, and with
V equal to 0.25 V for V
DDEXT
(nominal) = 2.5 V/3.3 V and
0.15 V for V
DDEXT
(nominal) = 1.8 V.
The time t
DIS
_
MEASURED
is the interval from when the reference sig-
nal switches, to when the output voltage decays V from the
measured output high or output low voltage.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate t
DECAY
using the equation given above. Choose V
to be the difference between the processor’s output voltage and
the input threshold for the device requiring the hold time. C
L
is
the total bus capacitance (per data line), and I
L
is the total leak-
age or three-state current (per data line). The hold time will be
t
DECAY
plus the various output disable times as specified in the
Processor—Timing Specifications on Page 33.
Capacitive Loading
Output delays and holds are based on standard capacitive loads
of an average of 6 pF on all pins (see Figure 43). V
LOAD
is equal
to (V
DDEXT
) /2. The graphs of Figure 44 through Figure 49 show
how output rise time varies with capacitance. The delay and
hold specifications given should be derated by a factor derived
from these figures. The graphs in these figures may not be linear
outside the ranges shown.
Figure 43. Equivalent Device Loading for AC Measurements
(Includes All Fixtures)
tDIS tDIS_MEASURED tDECAY
=
tDECAY CLVIL
=
T1
ZO = 50:(impedance)
TD = 4.04 r 1.18 ns
2pF
TESTER PIN ELECTRONICS
50:
0.5pF
70:
400:
45:
4pF
NOTES:
THE WORST CASE TRANSMISSION LINE DELAY IS SHOWN AND CAN BE USED
FOR THE OUTPUT TIMING ANALYSIS TO REFELECT THE TRANSMISSION LINE
EFFECT AND MUST BE CONSIDERED. THE TRANSMISSION LINE (TD), IS FOR
LOAD ONLY AND DOES NOT AFFECT THE DATA SHEET TIMING SPECIFICATIONS.
ANALOG DEVICES RECOMMENDS USING THE IBIS MODEL TIMING FOR A GIVEN
SYSTEM REQUIREMENT. IF NECESSARY, A SYSTEM MAY INCORPORATE
EXTERNAL DRIVERS TO COMPENSATE FOR ANY TIMING DIFFERENCES.
V
LOAD
DUT
OUTPUT
50:
Figure 44. Driver Type B Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (1.8 V V
DDEXT
)
Figure 45. Driver Type B Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (2.5 V V
DDEXT
)
Figure 46. Driver Type B Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (3.3 V V
DDEXT
)
4
RISE AND FALL TIME (ns)
LOAD CAPACITANCE (pF)
0 50 100 150 250
9
7
0
1
3
6
200
tRISE
tFALL
tRISE = 1.8V @ 25
°
C
tFALL = 1.8V @ 25
°
C
2
5
8
4
RISE AND FALL TIME (ns)
LOAD CAPACITANCE (pF)
0 50 100 150 250
7
6
0
1
2
5
200
tRISE
tFALL
3
tRISE = 2.5V @ 25
°
C
tFALL = 2.5V @ 25
°
C
3
RISE AND FALL TIME (ns)
LOAD CAPACITANCE (pF)
0 50 100 150 250
6
5
0
1
2
4
200
tRISE
tFALL
tRISE = 3.3V @ 25
°
C
tFALL = 3.3V @ 25
°
C
Rev. B | Page 53 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
PROCESSOR—ENVIRONMENTAL CONDITIONS
To determine the junction temperature on the application
printed circuit board use:
where: T
J
= junction temperature (°C).
T
CASE
= case temperature (°C) measured by customer at top cen-
ter of package.
JT
= from Table 43 and Table 44.
P
D
= power dissipation (see Total Power Dissipation on Page 30
for the method to calculate P
D
).
Values of
JA
are provided for package comparison and printed
circuit board design considerations.
JA
can be used for a first
order approximation of T
J
by the equation:
where T
A
= ambient temperature (°C).
Values of
JC
are provided for package comparison and printed
circuit board design considerations when an external heat sink
is required.
Values of
JB
are provided for package comparison and printed
circuit board design considerations.
In Table 43 and Table 44, airflow measurements comply with
JEDEC standards JESD51-2 and JESD51-6, and the junction-to-
board measurement complies with JESD51-8. The junction-to-
case measurement complies with MIL-STD-883 (Method
1012.1). All measurements use a 2S2P JEDEC test board.
Figure 47. Driver Type C Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (1.8 V V
DDEXT
)
Figure 48. Driver Type C Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (2.5 V V
DDEXT
)
Figure 49. Driver Type C Typical Rise and Fall Times (10%–90%) vs.
Load Capacitance (3.3 V V
DDEXT
)
15
RISE AND FALL TIME (ns)
LOAD CAPACITANCE (pF)
0 50 100 150 250
25
20
0
5
10
200
tRISE
tFALL
tRISE = 1.8V @ 25
°
C
tFALL = 1.8V @ 25
°
C
8
RISE AND FALL TIME (ns)
LOAD CAPACITANCE (pF)
0 50 100 150 250
16
12
0
2
4
10
200
t
RISE
t
FALL
6
14
t
RISE
= 2.5V @ 25
°
C
t
FALL
= 2.5V @ 25
°
C
6
RISE AND FALL TIME (ns)
LOAD CAPACITANCE (pF)
0 50 100 150 250
14
12
0
2
4
8
200
tRISE
tFALL
tRISE = 3.3V @ 25
°
C
tFALL = 3.3V @ 25
°
C
10
Table 43. Thermal Characteristics (88-Lead LFCSP)
Parameter Condition Typical Unit
JA
0 linear m/s air flow 26.2 °C/W
JMA
1 linear m/s air flow 23.7 °C/W
JMA
2 linear m/s air flow 22.9 °C/W
JB
16.0 °C/W
JC
9.8 °C/W
JT
0 linear m/s air flow 0.21 °C/W
JT
1 linear m/s air flow 0.36 °C/W
JT
2 linear m/s air flow 0.43 °C/W
Table 44. Thermal Characteristics (120-Lead LQFP)
Parameter Condition Typical Unit
JA
0 linear m/s air flow 26.9 °C/W
JMA
1 linear m/s air flow 24.2 °C/W
JMA
2 linear m/s air flow 23.3 °C/W
JB
16.4 °C/W
JC
12.7 °C/W
JT
0 linear m/s air flow 0.50 °C/W
JT
1 linear m/s air flow 0.77 °C/W
JT
2 linear m/s air flow 1.02 °C/W
TJTCASE JT PD
+=
TJTAJA PD
+=
Rev. B | Page 54 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
FLASH—SPECIFICATIONS
Specifications subject to change without notice.
FLASH—PROGRAM AND ERASE TIMES AND ENDURANCE CYCLES
The program and erase times and the number of program/ erase
cycles per block are shown in Table 45. Exact erase times may
change depending on the memory array condition. The best
case is when all the bits in the block or bank are at ‘0’
(pre programmed). The worst case is when all the bits in the
block or bank are at ‘1’ (not pre programmed). Usually, the
system overhead is negligible with respect to the erase time.
FLASH—ABSOLUTE MAXIMUM RATINGS
Table 46 shows the ADC absolute maximum ratings.
Table 45. Program/Erase Times and Endurance Cycles
Parameter Condition Typical
Typical
After 100k
Write/Erase
Cycles Max Unit
Erase Parameter Block (4K word)
1
0.31 2.5s
Erase Main Block (32K word)—preprogrammed 0.8 3 4 s
Erase Main Block (32K word)—not preprogrammed 1 4 s
Program
2
Word 12 12 100 s
Program
2
Parameter Block (4K word) 40 ms
Program
2
Main Block (32K word) 300 ms
Suspend Latency Program 5 10 s
Suspend Latency Erase 5 20 s
Program/Erase Cycles (per Block) Main Blocks 100,000 Cycles
Program/Erase Cycles (per Block) Parameter Blocks 100,000 Cycles
1
The difference between pre programmed and not pre programmed is not significant (< 30 ms).
2
Values are liable to change with the external system-level overhead (command sequence and Status Register polling execution).
Table 46. Flash Absolute Maximum Ratings
Parameter Rating
Junction Temperature While Biased See Table 20 on
Page 31
Storage Temperature Range See Table 20 on
Page 31
Flash Memory Supply Voltage (V
DDFLASH
) –0.2 V to +2.45 V
Rev. B | Page 55 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADC—SPECIFICATIONS
Specifications are subject to change without notice.
ADC—OPERATING CONDITIONS
Parameter Conditions Min Nominal Max Unit
V
DD1
(AV
DD
, DV
DD
, V
DRIVE
)
1
Throughout the ADC sections of this data sheet, V
DD
refers to both AV
DD
and DV
DD
.
f
ADSCLK
= 24 MHz, f
S
up to 1.5 MSPS,
internal or external reference = 2.5 V ± 1%
unless otherwise noted
2.7 3.6 V
f
ADSCLK
= 25 MHz, f
S
up to 1.56 MSPS,
internal or external reference = 2.5 V ± 1%
unless otherwise noted
3.0 3.6 V
f
ADSCLK
= 32 MHz, f
S
up to 2.0 MSPS,
internal or external reference = 2.5 V ± 1%
unless otherwise noted
4.75 (AV
DD
, DV
DD
)
2.7 (V
DRIVE
)
5.25 (AV
DD
, DV
DD
)
5.25 (V
DRIVE
)
V
V
T
J
Junction Temperature 120-Lead LQFP @ T
AMBIENT
= –40°C to +85°C –40 +105 °C
Table 47. Operating Conditions (Analog, Voltage Reference, and Logic I/O)
Parameter Specification Unit Test Conditions/Comments
ANALOG INPUT
1
Single-Ended Input Range 0 V to V
REF
V RANGE= low
0 V to 2 × V
REF
VRANGE = high
Pseudo Differential Input Range: V
IN+
– V
IN–2
0 V to V
REF
V RANGE = low
2 × V
REF
VRANGE = high
Fully Differential Input Range: V
IN+
and V
IN–
V
CM
± V
REF
/2 V V
CM
= common-mode voltage
3
= V
REF
/2, RANGE = low
V
CM
± V
REF
VV
CM
= V
REF
, RANGE = high
DC Leakage Current ±1 μA max V
A1
to V
A6
, V
B1
to V
B6
Input Capacitance
4
45 pF typ When in track
10 pF typ When in hold
INTERNAL VOLTAGE REFERENCE (OUTPUT)
5
Reference Output Voltage 2.5 ± 0.4% V @ 25°C, AV
DD
= 2.7 V to 5.25 V
Long-Term Stability
4
150 ppm typ For 1000 hours
Output Voltage Thermal Hysteresis
6
50 ppm typ
D
CAP
A, D
CAP
B Output Impedance
4
10 typ
Reference Temperature Coefficient
4
60 max, 20 typ ppm/°C
V
REF
Noise
4
20 μV rms typ
EXTERNAL VOLTAGE REFERENCE (INPUT)
5
Reference Input Voltage Range
7
0.1 to AV
DD
V See ADC—Typical Performance Characteristics
DC Leakage Current
7
±2 μA max
Input Capacitance
4
25 pF typ
DIGITAL LOGIC INPUTS
Input High Voltage, V
INH
2.8 V min
Input Low Voltage, V
INL
0.4 V max
Input Current, I
IN
±15 nA typ V
IN
= 0 V or V
DRIVE
Input Capacitance, C
IN4
5 pF typ
Rev. B | Page 56 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
DIGITAL LOGIC OUTPUTS
Output High Voltage, V
OH
V
DRIVE
– 0.2 V min No DC load (I
OH
= 0 mA)
Output Low Voltage, V
OL
0.4 V max No DC load (I
OL
= 0 mA)
Floating State Leakage Current ±1 μA max V
IN
= 0 V or V
DRIVE
Floating State Output Capacitance
4
7 pF typ
Output Coding
8
Straight (natural) binary
twos complement
1
V
IN–
or V
IN+
must remain within GND/V
DD
.
2
V
IN–
= 0 V for specified performance. For full input range on V
IN–
pin, see Figure 74 and Figure 75.
3
For full common-mode range, see Figure 70 and Figure 71.
4
Sample tested during initial release to ensure compliance.
5
Relates to Pin D
CAP
A or Pin D
CAP
B (V
REF
).
6
See ADC—Terminology on Page 61.
7
External voltage reference applied to Pins D
CAP
A, Pin D
CAP
B (V
REF
).
8
See Table 52 and Table 53.
Table 48. Operating Conditions (ADC Performance/Accuracy)
Parameter Specification Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio (SNR) 71 dB min f
IN
= 14 kHz sine wave; differential mode
69 dB min f
IN
= 14 kHz sine wave; single-ended and
pseudo differential modes
Signal-to-(Noise + Distortion) Ratio (SINAD)
1
70 dB min f
IN
= 14 kHz sine wave; differential mode
68 dB min f
IN
= 14 kHz sine wave; single-ended and
pseudo differential modes
Total Harmonic Distortion (THD)
1
–77 dB max f
IN
= 14 kHz sine wave; differential mode
–73 dB max f
IN
= 14 kHz sine wave; single-ended and
pseudo differential modes
Spurious-Free Dynamic Range (SFDR)
1
–75 dB max f
IN
= 50 kHz sine wave
Intermodulation Distortion (IMD)
1,2
f
a
= 30 kHz, fb = 50 kHz
Second-Order Terms –88 dB typ
Third-Order Terms –88 dB typ
Channel-to-Channel Isolation –88 dB typ
SAMPLE AND HOLD
Aperture Delay
2
11 ns max
Aperture Jitter
2
50 ps typ
Aperture Delay Matching
2
200 ps max
Full Power Bandwidth 33/26 MHz typ @ 3 dB, AV
DD
, DV
DD
= 5 V/AV
DD
, DV
DD
= 3 V
3.5/3 MHz typ @ 0.1 dB, AV
DD
, DV
DD
= 5 V/AV
DD
, DV
DD
= 3 V
Table 47. Operating Conditions (Analog, Voltage Reference, and Logic I/O) (Continued)
Parameter Specification Unit Test Conditions/Comments
Rev. B | Page 57 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
DC ACCURACY
Resolution 12 Bits
Integral Nonlinearity (INL)
1
±1 LSB max ±0.7 LSB typ; differential mode
±1.5 LSB max ±0.9 LSB typ; single-ended and pseudo
differential modes
Differential Nonlinearity (DNL)
1,
3
±0.99 LSB max Differential mode
–0.99/+1.5 LSB max Single-ended and pseudo differential modes
Straight Natural Binary Output Coding
Offset Error
1,2
±7 LSB max
Offset Error Match
1,2
±2 LSB typ
Gain Error
1,2
±2.5 LSB max
Gain Error Match
1,2
±0.5 LSB typ
Twos Complement Output Coding
Positive Gain Error
1,2
±2 LSB max
Positive Gain Error Match
1,2
±0.5 LSB typ
Zero Code Error
1,2
±5 LSB max
Zero Code Error Match
1,2
±1 LSB typ
Negative Gain Error
1,2
±2 LSB max
Negative Gain Error Match
1,2
±0.5 LSB typ
CONVERSION RATE
Conversion Time 14 ADSCLK cycles 437.5 ns with ADSCLK = 32 MHz
Track-and-Hold Acquisition Time
2
90 ns max Full-scale step input; AV
DD
, DV
DD
= 5 V
110 ns max Full-scale step input; AV
DD
, DV
DD
= 3 V
Throughput Rate 2 MSPS max
1
See ADC—Terminology on Page 61.
2
Sample tested during initial release to ensure compliance.
3
Guaranteed no missed codes to 12 bits.
Table 49. Operating Conditions (Power
1
)
Parameter Specification Unit Test Conditions/Comments
POWER SUPPLY REQUIREMENTS
V
DD
2.7/5.25 V min/V max
V
DRIVE
2.7/5.25 V min/V max
I
DD
Digital Logic Inputs = 0 V or V
DRIVE
Normal Mode (Static) 2.3 mA max V
DD
= 5.25 V
Operational
f
S
= 2 MSPS 6.4 mA max V
DD
= 5.25 V; 5.7 mA typ
f
S
= 1.5 MSPS 4 mA max V
DD
= 3.6 V; 3.4 mA typ
Partial Power-Down Mode 500 μA max Static
Full Power-Down Mode (V
DD
)2.8 μA maxStatic
POWER DISSIPATION
Normal Mode (Operational) 33.6 mW max V
DD
= 5.25 V
Partial Power-Down (Static) 2.625 mW max V
DD
= 5.25 V
Full Power-Down (Static) 14.7 μW max V
DD
= 5.25 V
1
In this table, V
DD
refers to both AV
DD
and DV
DD
.
Table 48. Operating Conditions (ADC Performance/Accuracy) (Continued)
Parameter Specification Unit Test Conditions/Comments
Rev. B | Page 58 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADC—TIMING SPECIFICATIONS
ADC—ABSOLUTE MAXIMUM RATINGS
Stresses above those listed in Table 51 may cause permanent
damage to the device. This is a stress rating only; functional
operation of the device at these or any other conditions above
those indicated in the operational section of this specification is
not implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
Table 50. Serial Data Interface
1
1
See Figure 87 on Page 72 and Figure 88 on Page 72.
Parameter Specification Unit Test Conditions / Comments
f
ADSCLK2
2
Minimum ADSCLK for specified performance; with slower ADSCLK frequencies, performance specifications apply typically.
1/32 MHz min/max
t
CONVERT
14 × t
ADSCLK
ns max t
ADSCLK
= 1/f
ADSCLK
437.5 ns max f
ADSCLK
= 32 MHz, f
SAMPLE
= 2 MSPS; AV
DD
, DV
DD
= 5 V
560.0 ns max f
ADSCLK
= 25 MHz, f
SAMPLE
= 1.56 MSPS; AV
DD
, DV
DD
= 3 V
583.3 ns max f
ADSCLK
= 24 MHz, f
SAMPLE
= 1.5 MSPS; AV
DD
, DV
DD
= 2.7 V
t
QUIET
30 ns min Minimum time between end of serial read and next falling edge of CS
t
2
18/23 ns min CS to ADSCLK setup time; V
DD
= 5 V/3 V
t
3
15 ns max Delay from CS until D
OUT
A and D
OUT
B are three-state disabled
t
43
3
The time required for the output to cross 0.4 V or 2.4 V.
27/36 ns max Data access time after ADSCLK falling edge, V
DD
= 5 V/3 V
t
5
0.45 t
ADSCLK
ns min ADSCLK low pulse width
t
6
0.45 t
ADSCLK
ns min ADSCLK high pulse width
t
7
5/10 ns min ADSCLK to data valid hold time, V
DD
= 5 V/3 V
t
8
15 ns max CS rising edge to D
OUT
A, D
OUT
B, high impedance
t
9
30 ns min CS rising edge to falling edge pulse width
t
10
5/35 ns min/max ADSCLK falling edge to D
OUT
A, D
OUT
B, high impedance
Table 51. Absolute Maximum Ratings
Parameter Rating
AV
DD
, DV
DD
to AGND 0.3 V to +7 V
DV
DD
to DGND –0.3 V to +7 V
V
DRIVE
to DGND –0.3 V to DV
DD
V
DRIVE
to AGND –0.3 V to AV
DD
AV
DD
to DV
DD
–0.3 V to +0.3 V
AGND to DGND –0.3 V to +0.3 V
Analog Input Voltage to AGND –0.3 V to AV
DD
+ 0.3 V
Digital Input Voltage to DGND –0.3 V to +7 V
Digital Output Voltage to GND –0.3 V to V
DRIVE
+ 0.3 V
V
REF
to AGND 0.3 V to AV
DD
+ 0.3 V
Input Current to Any ADC Pin
Except Supplies
1
1
Transient currents of up to 100 mA will not cause latch up.
±10 mA
Storage Temperature Range See Table 20 on Page 31
Junction Temperature Under Bias See Table 20 on Page 31
Rev. B | Page 59 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADC—TYPICAL PERFORMANCE CHARACTERISTICS
T
A
= 25°C, unless otherwise noted.
Figure 50. PSRR vs. Supply Ripple Frequency Without Supply Decoupling
Figure 51. Channel-to-Channel Isolation
Figure 52. SINAD vs. Analog Input Frequency for Various Supply Voltages
SUPPLY RIPPLE FREQUENCY (kHz)
20000 200 400 600 800 1000 1200 1400 1600 1800
PSRR (dB)
–60
–70
–80
–90
–100
–110
–120
100mV p-p SINE WAVE ON AVDD
NO DECOUPLING
SINGLE-ENDED MODE
EXTERNAL REFERENCE
INTERNAL REFERENCE
NOISE FREQUENCY (kHz)
10000 100 200 300 400 500 600 800700 900
ISOLATION (dB)
–50
–55
–60
–65
–70
–75
–90
–95
–80
–85
–100
V
DD
= 5V
INPUT FREQUENCY (kHz)
30000 1000 2000500 1500 2500
SINAD (dB)
74
72
68
70
66
62
64
60
VDD = 5V
DIFFERENTIAL MODE
VDD = 3V
DIFFERENTIAL MODE
RANGE = 0 TO VREF
Figure 53. Typical FFT
Figure 54. Typical DNL
Figure 55. Typical INL
FREQUENCY (kHz)
10000 100 200 300 400 500 600 700 800 900
(dB)
–10
–30
–50
–70
–90
–110
4096 POINT FFT
VDD = 5V, VDRIVE = 3V
FSAMPLE = 2MSPS
FIN = 52kHz
SINAD = 71.4dB
THD = –84.42dB
DIFFERENTIAL MODE
CODE
40000 1000 2000 3000 3500500 1500 2500
DNL ERROR (LSB)
1.0
0.6
0.8
0.2
0.4
–0.2
0
–0.6
–0.8
–0.4
–1.0
VDD = 5V, VDRIVE = 3V
DIFFERENTIAL MODE
CODE
40000 500 1000 1500 2000 2500 3000 3500
INL ERROR (LSB)
1.0
0.8
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
V
DD
= 5V, V
DRIVE
= 3V
DIFFERENTIAL MODE
Rev. B | Page 60 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 56. Linearity Error vs. V
REF
Figure 57. Effective Number of Bits vs. V
REF
Figure 58. V
REF
vs. Reference Output Current Drive
VREF (V)
2.50 0.5 1.0 1.5 2.0
LINEARITY ERROR (LSB)
1.0
0.6
0.8
0.2
0.4
–0.2
0
–0.6
–0.4
–1.0
–0.8
VDD = 3V/5V
DIFFERENTIAL MODE
POSITIVE INL
POSITIVE DNL
NEGATIVE DNL
NEGATIVE INL
VREF (V)
5.00 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
EFFECTIVE NUMBER OF BITS
12.0
11.0
11.5
10.0
10.5
9.0
9.5
8.0
7.5
8.5
7.0
VDD = 5V
DIFFERENTIAL MODE
VDD = 3V
DIFFERENTIAL MODE
VDD = 3V
SINGLE-ENDED MODE
VDD = 5V
SINGLE-ENDED MODE
CURRENT LOAD (PA)
2000 20 40 60 80 100 120 140 160 180
V
REF
(V)
2.5010
2.5000
2.5005
2.4995
2.4990
2.4985
2.4980
Figure 59. Histogram of Codes for 10k Samples in Differential Mode
Figure 60. Histogram of Codes for 10k Samples in Single-Ended Mode
Figure 61. CMRR vs. Common-Mode Ripple Frequency
CODE
2046 2047 20492048 2050
NO. OF OCCURRENCES
10000
8000
9000
6000
7000
4000
5000
2000
1000
3000
0
10000
CODES
DIFFERENTIAL
MODE
INTERNAL
REFERENCE
CODE
2046 2047 2048 2049 2050
NO. OF OCCURRENCES
10000
9000
8000
7000
6000
5000
4000
3000
2000
1000
0
9984
CODES
SINGLE-ENDED
MODE
INTERNAL
REFERENCE
5 CODES 11 CODES
RIPPLE FREQUENCY (kHz)
12000 200 400 600 800 1000
CMRR (dB)
–60
–65
–70
–75
–80
–85
–95
–90
–100
DIFFERENTIAL MODE
VDD = 3V/5V
Rev. B | Page 61 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
ADC—TERMINOLOGY
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the mea-
sured and the ideal 1 LSB change between any two adjacent
codes in the ADC.
Integral Nonlinearity (INL)
Integral nonlinearity is the maximum deviation from a
straight line passing through the endpoints of the ADC trans-
fer function. The endpoints of the transfer function are zero
scale with a single (1) LSB point below the first code transi-
tion, and full scale with a 1 LSB point above the last code
transition.
Offset Error
Offset error applies to straight binary output coding. It is the
deviation of the first code transition (00...000) to
(00 . . . 001) from the ideal (AGND + 1 LSB).
Offset Error Match
Offset error match is the difference in offset error across all 12
channels.
Gain Error
Gain error applies to straight binary output coding. It is the
deviation of the last code transition (111 . . . 110) to
(111 . . . 111) from the ideal (V
REF
1 LSB) after the offset error
is adjusted out. Gain error does not include reference error.
Gain Error Match
Gain error match is the difference in gain error across all 12
channels.
Positive Gain Error
This applies when using twos complement output coding
with, for example, the 2 × V
REF
input range as –V
REF
to +V
REF
biased about the V
REF
point. It is the deviation of the last code
transition (011…110) to (011…111) from the ideal
(+V
REF
1 LSB) after the zero code error is adjusted out.
Positive Gain Error Match
This is the difference in positive gain error across all 12
channels.
Zero Code Error
Zero code error applies when using twos complement output
coding with, for example, the 2 × V
REF
input range as –V
REF
to
+V
REF
biased about the V
REF
point. It is the deviation of the
mid-scale transition (all 0s to all 1s) from the ideal V
IN
voltage
(V
REF
).
Zero Code Error Match
Zero code error match refers to the difference in zero code
error across all 12 channels.
Negative Gain Error
This applies when using twos complement output coding
option, in particular the 2 × V
REF
input range as –V
REF
to
+V
REF
biased about the V
REF
point. It is the deviation of the
first code transition (100…000) to (100…001) from the ideal
(that is, –V
REF
+ 1 LSB) after the zero code error is adjusted
out.
Negative Gain Error Match
This is the difference in negative gain error across all 12
channels.
Track-and-Hold Acquisition Time
The track-and-hold amplifier returns to track mode after the
end of conversion. Track-and-hold acquisition time is the
time required for the output of the track-and-hold amplifier
to reach its final value, within ±1/2 LSB, after the end of
conversion.
Signal-to-(Noise + Distortion) Ratio (SINAD)
This ratio is the measured ratio of signal-to-(noise + distor-
tion) at the output of the ADC. The signal is the rms
amplitude of the fundamental. Noise is the sum of all non-
fundamental signals up to half the sampling frequency (f
S
/2),
excluding dc. The ratio is dependent on the number of quan-
tization levels in the digitalization process; the more levels,
the smaller the quantization noise. The theoretical signal-to-
(noise + distortion) ratio for an ideal N-bit converter with a
sine wave input is given by:
Signal-to-(Noise + Distortion) = (6.02N + 1.76) dB
Therefore, for a 12-bit converter, theoretical SINAD is 74 dB.
Total Harmonic Distortion (THD)
Total harmonic distortion is the ratio of the rms sum of har-
monics to the fundamental. For the ADC, it is defined as:
where:
V
1
is the rms amplitude of the fundamental.
V
2
, V
3
, V
4
, V
5
, and V
6
are the rms amplitudes of the second
through the sixth harmonics.
Effective Number of Bits (ENOB)
This is a figure of merit which characterizes the dynamic per-
formance of the ADC at a specified input frequency and
sampling rate. ENOB is expressed in bits. For a full scale sinu-
soidal input, ENOB is defined as:
ENOB = (SINAD – 1.76)/6.02
Peak Harmonic or Spurious Noise (SFDR)
Peak harmonic, or spurious noise, is defined as the ratio of
the rms value of the next largest component in the ADC out-
put spectrum (up to f
S
/2, excluding dc) to the rms value of the
fundamental. Normally, the value of this specification is
determined by the largest harmonic in the spectrum, but for
ADCs where the harmonics are buried in the noise floor, it is
a noise peak.
Channel-to-Channel Isolation
Channel-to-channel isolation is a measure of the level of
crosstalk between channels. It is measured by applying a full-
scale (2 × V
REF
when V
DD
= 5 V, V
REF
when V
DD
= 3 V),
10 kHz sine wave signal to all un-selected input channels and
1
2
6
2
5
2
4
2
3
2
2
log20)( V
VVVVV
dBTHD
Rev. B | Page 62 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
determining how much that signal is attenuated in the
selected channel with a 50 kHz signal (0 V to V
REF
). The result
obtained is the worst-case across all 12 channels for the ADC.
Intermodulation Distortion (IMD)
With inputs consisting of sine waves at two frequencies, fa
and fb, any active device with non-linearities create distortion
products at sum, and difference frequencies of mfa ± nfb
where m, n = 0, 1, 2, 3, and so on. Intermodulation distortion
terms are those for which neither m nor n are equal to zero.
For example, the second-order terms include (fa + fb) and
(fa fb), while the third-order terms include (2fa + fb),
(2fa fb), (fa + 2fb), and (fa 2fb).
The ADC is tested using the CCIF standard where two input
frequencies near the top end of the input bandwidth are used.
In this case, the second-order terms are usually distanced in
frequency from the original sine waves, while the third-order
terms are usually at a frequency close to the input frequencies.
As a result, the second-order and third-order terms are speci-
fied separately. The calculation of the inter-modulation
distortion is as per the THD specification, where it is the ratio
of the rms sum of the individual distortion products to the
rms amplitude of the sum of the fundamentals expressed in
dBs.
Common-Mode Rejection Ratio (CMRR)
CMRR is defined as the ratio of the power in the ADC output
at full-scale frequency, f, to the power of a 100 mV p-p sine
wave applied to the common-mode voltage of V
IN+
and V
IN
of
frequency f
S
as:
CMRR (dB) = 10 log(Pf/Pf
S
)
where:
Pf is the power at frequency f in the ADC output.
Pf
S
is the power at frequency f
S
in the ADC output.
Power Supply Rejection Ratio (PSRR)
Variations in power supply affect the full-scale transition but
not the converter’s linearity. PSRR is the maximum change in
the full-scale transition point due to a change in power supply
voltage from the nominal value (see Figure 50 (PSRR vs. Sup-
ply Ripple Frequency Without Supply Decoupling).
Thermal Hysteresis
Thermal hysteresis is defined as the absolute maximum
change of reference output voltage (V
REF
) after the device is
cycled through temperature from either:
T_HYS+ = +25°C to T
MAX
to +25°C
or
T_HYS = +25°C to T
MIN
to +25°C
It is expressed in ppm by:
where:
V
REF
(25°C) is V
REF
at 25°C.
V
REF
(T_HYS) is the maximum change of V
REF
at
T_HYS+ or T_HYS.
ADC—THEORY OF OPERATION
The following sections describe the ADC theory of operation.
Circuit Information
The ADC is a fast, micropower, dual, 12-bit, single-supply,
ADC that operates from a 2.7 V to a 5.25 V supply. When oper-
ated from a 5 V supply, the ADC is capable of throughput rates
of up to 2 MSPS when provided with a 32 MHz clock, and a
throughput rate of up to 1.5 MSPS at 3 V.
The ADC contains two on-chip, differential track-and-hold
amplifiers, two successive approximation ADCs, and a serial
interface with two separate data output pins.
The serial clock input accesses data from the part but also pro-
vides the clock source for each successive approximation ADC.
The analog input range for the part can be selected to be a 0 V to
V
REF
input or a 2 × V
REF
input, configured with either single-
ended or differential analog inputs. The ADC has an on-chip
2.5 V reference that can be overdriven when an external refer-
ence is preferred. If the internal reference is to be used elsewhere
in a system, then the output needs to buffered first.
The ADC also features power-down options to allow power sav-
ing between conversions. The power-down feature is
implemented via the standard serial interface, as described in
the ADC—Modes of Operation section.
Converter Operation
The ADC has two successive approximation ADCs, each based
around two capacitive DACs. Figure 62 (ADC Acquisition
Phase) and Figure 63 (ADC Conversion Phase) show simplified
schematics of one of these ADCs in acquisition and conversion
phase, respectively. The ADC is comprised of control logic, a
SAR, and two capacitive DACs. In Figure 62 (ADC Acquisition
Phase) (the acquisition phase), SW3 is closed, SW1 and SW2 are
in Position A, the comparator is held in a balanced condition,
and the sampling capacitor arrays acquire the differential signal
on the input.
6
10
)C25(
)_()C25(
)(
REF
REFREF
HYS V
HYSTVV
ppmV
Figure 62. ADC Acquisition Phase
CAPACITIVE
DAC
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
SW3
SW1
A
A
B
B
SW2
C
S
C
S
V
IN+
V
IN–
V
REF
Rev. B | Page 63 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
When the ADC starts a conversion (see Figure 63 (ADC Con-
version Phase)), SW3 opens and SW1 and SW2 move to
Position B, causing the comparator to become unbalanced. Both
inputs are disconnected once the conversion begins. The con-
trol logic and the charge redistribution DACs are used to add
and subtract fixed amounts of charge from the sampling capaci-
tor arrays to bring the comparator back into a balanced
condition. When the comparator is rebalanced, the conversion
is complete. The control logic generates the ADC output code.
The output impedances of the sources driving the V
IN+
and V
IN–
pins must be matched; otherwise, the two inputs will have dif-
ferent settling times, resulting in errors.
Analog Input Structure
Figure 64 (Equivalent Analog Input Circuit, Conversion
Phase—Switches Open, Track Phase—Switches Closed) shows
the equivalent circuit of the analog input structure of the ADC
in differential/pseudo differential mode. In single-ended mode,
V
IN
is internally tied to AGND. The four diodes provide ESD
protection for the analog inputs. Care must be taken to ensure
that the analog input signals never exceed the supply rails by
more than 300 mV. This causes these diodes to become for-
ward-biased and starts conducting into the substrate. These
diodes can conduct up to 10 mA without causing irreversible
damage to the part.
The C1 capacitors in Figure 64 (Equivalent Analog Input Cir-
cuit, Conversion Phase—Switches Open, Track Phase—
Switches Closed) are typically 4 pF and can primarily be
attributed to pin capacitance. The resistors are lumped compo-
nents made up of the on resistance of the switches. The value of
these resistors is typically about 100 . The C2 capacitors are
the ADC’s sampling capacitors with a capacitance of 45 pF
typically.
For ac applications, removing high frequency components from
the analog input signal is recommended by the use of an RC
low-pass filter on the relevant analog input pins with optimum
values of 47 and 10 pF. In applications where harmonic dis-
tortion and signal-to-noise ratio are critical, the analog input
should be driven from a low impedance source. Large source
impedances significantly affect the ac performance of the ADC
and may necessitate the use of an input buffer amplifier. The
choice of the op amp is a function of the particular application.
When no amplifier is used to drive the analog input, the source
impedance should be limited to low values. The maximum
source impedance depends on the amount of THD that can be
tolerated.
The THD increases as the source impedance increases and per-
formance degrades. Figure 65 (THD vs. Analog Input
Frequency for Various Source Impedances, Single-Ended Mode
shows a graph of the THD vs. the analog input signal frequency
for different source impedances in single-ended mode, while
Figure 66 (THD vs. Analog Input Frequency for Various Source
Impedances, Differential Mode) shows the THD vs. the analog
input signal frequency for different source impedances in differ-
ential mode.
Figure 67 (THD vs. Analog Input Frequency for Various Supply
Voltages) shows a graph of the THD vs. the analog input fre-
quency for various supplies while sampling at 2 MSPS. In this
case, the source impedance is 47 .
Figure 63. ADC Conversion Phase
Figure 64. Equivalent Analog Input Circuit,
Conversion Phase—Switches Open, Track Phase—Switches Closed
CAPACITIVE
DAC
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
SW3
SW1
A
A
B
B
SW2
CS
CS
VIN+
VIN–
VREF
V
DD
C1
D
D
V
IN+
R1 C2
V
DD
C1
D
D
V
IN–
R1 C2
Figure 65. THD vs. Analog Input Frequency for Various
Source Impedances, Single-Ended Mode
INPUT FREQUENCY (kHz)
6000 200100 400300 500
THD (dB)
–50
–60
–55
–65
–70
–75
–80
–85
–90
FSAMPLE = 1.5MSPS
VDD = 3V
RANGE = 0V TO VREF
RSOURCE = 300
RSOURCE = 0
RSOURCE = 10
RSOURCE = 47
RSOURCE = 100
Rev. B | Page 64 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Analog Inputs
The ADC has a total of 12 analog inputs. Each on-board ADC
has six analog inputs that can be configured as six single-ended
channels, three pseudo differential channels, or three fully dif-
ferential channels. These may be selected as described in the
Analog Input Selection section.
Single-Ended Mode
The ADC can have a total of 12 single-ended analog input chan-
nels. In applications where the signal source has high
impedance, it is recommended to buffer the analog input
before applying it to the ADC. The analog input range can be
programmed to be either 0 to V
REF
or 0 to 2 × V
REF
.
If the analog input signal to be sampled is bipolar, the internal
reference of the ADC can be used to externally bias up this sig-
nal to make it correctly formatted for the ADC. Figure 68 shows
a typical connection diagram when operating the ADC in sin-
gle-ended mode.
Differential Mode
The ADC can have a total of six differential analog input pairs.
Differential signals have some benefits over single-ended sig-
nals, including noise immunity based on the device’s common-
mode rejection and improvements in distortion performance.
Figure 69 (Differential Input Definition) defines the fully differ-
ential analog input of the ADC.
The amplitude of the differential signal is the difference between
the signals applied to the V
IN+
and V
IN–
pins in each differential
pair (V
IN+
V
IN–
). V
IN+
and V
IN–
should be simultaneously driven
by two signals each of amplitude V
REF
(or 2 × V
REF
, depending
on the range chosen) that are 180° out of phase. The amplitude
of the differential signal is, therefore (assuming the 0 to V
REF
range is selected) –V
REF
to +V
REF
peak-to-peak (2 × V
REF
),
regardless of the common mode (CM).
The common mode is the average of the two signals
(V
IN+
+ V
IN–
)/2
and is, therefore, the voltage on which the two inputs are
centered.
This results in the span of each input being CM ± V
REF
/2. This
voltage has to be set up externally and its range varies with the
reference value, V
REF
. As the value of V
REF
increases, the
common-mode range decreases. When driving the inputs with
an amplifier, the actual common-mode range is determined by
the amplifier’s output voltage swing.
Figure 70 (Input Common-Mode Range vs. VREF (0 to VREF
Range, VDD = 5 V)) and Figure 71 (Input Common-Mode
Range vs. VREF (2 × VREF Range, VDD = 5 V)) show how the
common-mode range typically varies with V
REF
for a 5 V power
Figure 66. THD vs. Analog Input Frequency for
Various Source Impedances, Differential Mode
Figure 67. THD vs. Analog Input Frequency for Various Supply Voltages
INPUT FREQUENCY (kHz)
600 700 800 900 10000 200100 400300 500
THD (dB)
–60
–65
–70
–75
–80
–85
–90
F
SAMPLE
= 1.5MSPS
V
DD
= 3V
RANGE = 0V TO V
REF
R
SOURCE
= 300
R
SOURCE
= 0
R
SOURCE
= 10
R
SOURCE
= 47
R
SOURCE
= 100
INPUT FREQUENCY (kHz)
600 700 800 900 10000 200100 400300 500
THD (dB)
–50
–60
–55
–65
–70
–75
–80
–85
–90
V
DD
= 3V
SINGLE-ENDED MODE
V
DD
= 5V
SINGLE-ENDED MODE
V
DD
= 3V
DIFFERENTIAL MODE
V
DD
= 5V
DIFFERENTIAL MODE
F
SAMPLE
= 1.5MSPS/2MSPS
V
DD
= 3V/5V
RANGE = 0 TO V
REF
Figure 68. Single-Ended Mode Connection Diagram
Figure 69. Differential Input Definition
VIN
0V
+1.25V
–1.25V
VREF
(DCAPA/DCAPB)
VA1 ADC1
VB6
R
R
3R
R
0V
+2.5V
0.47μF
1ADDITIONAL PINS OMITTED FOR CLARITY.
VIN+
ADC1
VIN–
VREF p-p
VREF p-p
COMMON
MODE
VOLTAGE
1ADDITIONAL PINS OMITTED FOR CLARITY.
Rev. B | Page 65 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
supply using the 0 to V
REF
range or 2 × V
REF
range, respectively.
The common mode must be in this range to guarantee the func-
tionality of the ADC.
When a conversion takes place, the common mode is rejected,
resulting in a virtually noise free signal of amplitude –V
REF
to
+V
REF
corresponding to the digital codes of 0 to 4096. If the 2 ×
V
REF
range is used, then the input signal amplitude extends from
– 2 V
REF
to +2 V
REF
after conversion.
Driving Differential Inputs
Differential operation requires that V
IN+
and V
IN–
be simultane-
ously driven with two equal signals that are 180° out of phase.
The common mode must be set up externally. The common-
mode range is determined by V
REF
, the power supply, and the
particular amplifier used to drive the analog inputs. Differential
modes of operation with either an ac or dc input provide the
best THD performance over a wide frequency range. Because
not all applications have a signal preconditioned for differential
operation, there is often a need to perform single-ended-to-dif-
ferential conversion.
Using an Op Amp Pair
An op amp pair can be used to directly couple a differential sig-
nal to one of the analog input pairs of the ADC. The circuit
configurations illustrated in Figure 72 (Dual Op Amp Circuit to
Convert a Single-Ended Unipolar Signal Into a Differential Sig-
nal) and Figure 73 (Dual Op Amp Circuit to Convert a Single-
Ended Bipolar Signal into a Differential Unipolar Signal) show
how a dual op amp can be used to convert a single-ended signal
into a differential signal for both a bipolar and unipolar input
signal, respectively.
The voltage applied to Point A sets up the common-mode volt-
age. In both diagrams, it is connected in some way to the
reference, but any value in the common-mode range can be
input here to set up the common mode. The AD8022 is a suit-
able dual op amp that can be used in this configuration to
provide differential drive to the ADC.
Take care when choosing the op amp; the selection depends on
the required power supply and system performance objectives.
The driver circuits in Figure 72 (Dual Op Amp Circuit to Con-
vert a Single-Ended Unipolar Signal Into a Differential Signal)
and Figure 73 (Dual Op Amp Circuit to Convert a Single-Ended
Bipolar Signal into a Differential Unipolar Signal) are optimized
for dc coupling applications requiring best distortion
performance.
The circuit configuration shown in Figure 72 (Dual Op Amp
Circuit to Convert a Single-Ended Unipolar Signal Into a Differ-
ential Signal) converts a unipolar, single-ended signal into a
differential signal.
The differential op amp driver circuit shown in Figure 73 (Dual
Op Amp Circuit to Convert a Single-Ended Bipolar Signal into a
Differential Unipolar Signal) is configured to convert and level
shift a single-ended, ground-referenced (bipolar) signal to a dif-
ferential signal centered at the V
REF
level of the ADC.
Pseudo Differential Mode
The ADC can have a total of six pseudo differential pairs. In this
mode, V
IN+
is connected to the signal source that must have an
amplitude of V
REF
(or 2 × V
REF
, depending on the range chosen)
Figure 70. Input Common-Mode Range vs. V
REF
(0 to V
REF
Range, V
DD
= 5 V)
Figure 71. Input Common-Mode Range vs. V
REF
(2 × V
REF
Range, V
DD
= 5 V)
V
REF
(V)
5.00 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
COMMON-MODE RANGE (V)
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
T
A
= 25°C
V
REF (V)
2.50 0.5 1.0 1.5 2.0
COMMON-MODE RANGE (V)
5.0
4.0
4.5
3.0
3.5
2.0
2.5
0.5
1.0
1.5
0
TA = 25°C
Figure 72. Dual Op Amp Circuit to Convert a Single-Ended Unipolar Signal
Into a Differential Signal
GND
2 × VREF p–p
27
27
V+
V–
V+
V–
VREF
2.5V
3.75V
1.25V
2.5V
3.75V
1.25V VREF
(DCAPA/DCAPB)
VIN+ ADC1
VIN–
440
220
0.47μF
1ADDITIONAL PINS OMITTED FOR CLARITY.
220
220
10k
A
Rev. B | Page 66 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
to make use of the full dynamic range of the part. A dc input is
applied to the V
IN–
pin. The voltage applied to this input pro-
vides an offset from ground or a pseudo ground for the V
IN+
input. The benefit of pseudo differential inputs is that they sepa-
rate the analog input signal ground from the ADC’s ground
allowing dc common-mode voltages to be cancelled.
The typical voltage range for the V
IN–
pin, while in pseudo dif-
ferential mode, is shown in Figure 74 (V
IN–
Input Voltage Range
vs. V
REF
in Pseudo Differential Mode with V
DD
= 3 V) and
Figure 75 (V
IN–
Input Voltage Range vs. V
REF
in Pseudo Differ-
ential Mode with V
DD
= 5 V). Figure 76 (Pseudo Differential
Mode Connection Diagram) shows a connection diagram for
pseudo differential mode.
Analog Input Selection
The analog inputs of the ADC can be configured as single-
ended or true differential via the SGL/DIFF logic pin, as shown
in Figure 77 (Selecting Differential or Single-Ended Configura-
tion). If this pin is tied to a logic low, the analog input channels
to each on-chip ADC are set up as three true differential pairs. If
this pin is at logic high, the analog input channels to each on-
chip ADC are set up as six single-ended analog inputs. The
required logic level on this pin needs to be established prior to
the acquisition time and remain unchanged during the conver-
sion time until the track-and-hold has returned to track. The
track-and-hold returns to track on the 13
th
rising edge of
ADSCLK after the CS falling edge (see Figure 87 (Serial Inter-
face Timing Diagram)). If the level on this pin is changed, it will
be recognized by the ADC; therefore, it is necessary to keep the
same logic level during acquisition and conversion to avoid cor-
rupting the conversion in progress.
For example, in Figure 77 (Selecting Differential or Single-
Ended Configuration) the SGL/DIFF pin is set at logic high for
the duration of both the acquisition and conversion times so the
analog inputs are configured as single ended for that conversion
(Sampling Point A). The logic level of the SGL/DIFF changed to
low after the track-and-hold returned to track and prior to the
Figure 73. Dual Op Amp Circuit to Convert a Single-Ended Bipolar Signal
into a Differential Unipolar Signal
Figure 74. V
IN–
Input Voltage Range vs. V
REF
in
Pseudo Differential Mode with V
DD
= 3 V
20k
220k
2 × VREF p–p
27
27
V+
V–
V+
V–
GND
2.5V
3.75V
1.25V
2.5V
3.75V
1.25V
VIN+ ADC1
VIN–
440
220
0.47μF
1ADDITIONAL PINS OMITTED FOR CLARITY.
220
220
10k
A
VREF
(DCAPA/DCAPB)
VREF (V)
3.00 0.5 1.0 1.5 2.0 2.5
VIN– (V)
1.0
0.8
0.4
0.6
0.2
–0.2
0
–0.4
TA = 25°C
Figure 75. V
IN–
Input Voltage Range vs. V
REF
in
Pseudo Differential Mode with V
DD
= 5 V
Figure 76. Pseudo Differential Mode Connection Diagram
VREF (V)
5.00 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
VIN– (V)
2.5
2.0
1.5
1.0
0.5
0
–0.5
TA = 25°C
DC INPUT
VOLTAGE
VREF
p–p
VREF (DCAPA/DCAPB)
VIN+
ADC1
VIN–
0.47μF
1ADDITIONAL PINS OMITTED FOR CLARITY.
Rev. B | Page 67 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
required acquisition time for the next sampling instant at Point
B; therefore, the analog inputs are configured as differential for
that conversion.
The channels used for simultaneous conversions are selected via
the multiplexer address input pins, A0 to A2. The logic states of
these pins also need to be established prior to the acquisition
time; however, they may change during the conversion time
provided the mode is not changed. If the mode is changed from
fully differential to pseudo differential, for example, then the
acquisition time would start again from this point. The selected
input channels are decoded as shown in Table 53 (Analog Input
Type and Channel Selection).
The analog input range of the ADC can be selected as 0 V to
V
REF
or 0 V to 2 × V
REF
via the RANGE pin. This selection is
made in a similar fashion to that of the SGL/DIFF pin by setting
the logic state of the RANGE pin a time t
acq
prior to the falling
edge of CS. Subsequent to this, the logic level on this pin can be
altered after the third falling edge of ADSCLK. If this pin is tied
to a logic low, the analog input range selected is 0 V to V
REF
. If
this pin is tied to a logic high, the analog input range selected is
0 V to 2 × V
REF
.
Output Coding
The ADC output coding is set to either twos complement or
straight binary, depending on which analog input configuration
is selected for a conversion. Table 52 (ADC Output Coding)
shows which output coding scheme is used for each possible
analog input configuration.
Transfer Functions
The designed code transitions occur at successive integer LSB
values (1 LSB, 2 LSB, and so on). In single-ended mode, the LSB
size is V
REF
/4096 when the 0 V to V
REF
range is used, and the LSB
size is 2 × V
REF
/4096 when the 0 V to 2 × V
REF
range is used. In
differential mode, the LSB size is 2 × V
REF
/4096 when the 0 V to
V
REF
range is used, and the LSB size is 4 × V
REF
/4096 when the 0
V to 2 × V
REF
range is used. The ideal transfer characteristic for
the ADC when straight binary coding is output is shown in
Figure 78 (Straight Binary Transfer Characteristic), and the
ideal transfer characteristic for the ADC when twos comple-
ment coding is output is shown in Figure 79 (Twos
Complement Transfer Characteristic with VREF ± VREF Input
Range) (this is shown with the 2 × V
REF
range).
Figure 77. Selecting Differential or Single-Ended Configuration
ADSCLK
CS
114 141
A
SGL/DIFF
B
tACQ
Table 52. ADC Output Coding
SGL/DIFF RANGE Output Coding
0 (Differential Input) 0 (0 V to V
REF
) Twos complement
0 (Differential Input) 1 (0 V to 2 × V
REF
) Twos complement
1 (Single-Ended Input) 0 (0 V to V
REF
) Straight binary
1 (Single-Ended Input) 1 (0 V to2 × V
REF
) Twos complement
0 (Pseudo-Differential Input) 0 (0 V to V
REF
) Straight binary
0 (Pseudo-Differential Input) 1 (0 V to 2 × V
REF
) Twos complement
Table 53. Analog Input Type and Channel Selection
ADC A ADC B
SGL/DIFF A2 A1 A0 V
IN+
V
IN–
V
IN+
V
IN–
Comment
1000V
A1
AGND V
B1
AGND Single ended
1001V
A2
AGND V
B2
AGND Single ended
1010V
A3
AGND V
B3
AGND Single ended
1011V
A4
AGND V
B4
AGND Single ended
1100V
A5
AGND V
B5
AGND Single ended
1101V
A6
AGND V
B6
AGND Single ended
0000V
A1
V
A2
V
B1
V
B2
Fully differential
0001V
A1
V
A2
V
B1
V
B2
Pseudo differential
0010V
A3
V
A4
V
B3
V
B4
Fully differential
0011V
A3
V
A4
V
B3
V
B4
Pseudo differential
0100V
A5
V
A6
V
B5
V
B6
Fully differential
0101V
A5
V
A6
V
B5
V
B6
Pseudo differential
Rev. B | Page 68 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Serial Interface Voltage Drive
The ADC also has a V
DRIVE
feature to control the voltage at
which the serial interface operates. V
DRIVE
allows the ADC to
easily interface to both 3 V and 5 V processors. For example, if
the ADC was operated with a AV
DD
/DV
DD
of 5 V, the V
DRIVE
pin
could be powered from a 3 V supply, best ADC performance
low voltage digital processors. Therefore, the ADC could be
used with the 2 × V
REF
input range, with a AV
DD
/DV
DD
of 5 V
while still being able to serial interface to 3 V digital I/O parts.
ADC—MODES OF OPERATION
The mode of operation of the ADC is selected by controlling the
(logic) state of the CS signal during a conversion. There are
three possible modes of operation: normal mode, partial power-
down mode, and full power-down mode. After a conversion is
initiated, the point at which CS is pulled high determines which
power-down mode, if any, the device enters. Similarly, if already
in a power-down mode, CS can control whether the device
returns to normal operation or remains in power-down. These
modes of operation are designed to provide flexible power man-
agement options. These options can be chosen to optimize the
power dissipation/throughput rate ratio for differing applica-
tion requirements.
Normal Mode
This mode is intended for applications needing fastest through-
put rates because the user does not have to worry about any
power-up times with the ADC remaining fully powered at all
times. Figure 80 (Normal Mode Operation) shows the general
diagram of the operation of the ADC in this mode.
The conversion is initiated on the falling edge of CS, as
described in the ADC—Serial Interface section. To ensure that
the part remains fully powered up at all times, CS must remain
low until at least 10 ADSCLK falling edges have elapsed after the
falling edge of CS. If CS is brought high any time after the 10
th
ADSCLK falling edge but before the 14
th
ADSCLK falling edge,
the part remains powered up, but the conversion is terminated
and D
OUT
A and D
OUT
B go back into three-state. Fourteen serial
clock cycles are required to complete the conversion and access
the conversion result. The D
OUT
line does not return to three-
state after 14 ADSCLK cycles have elapsed, but instead does so
when CS is brought high again. If CS is left low for another 2
ADSCLK cycles (for example, if only a 16 ADSCLK burst is
available), two trailing zeros are clocked out after the data. If CS
is left low for a further 14 (or16) ADSCLK cycles, the result
from the other ADC on board is also accessed on the same D
OUT
line, as shown in Figure 88 (Reading Data from Both ADCs on
One DOUT Line with 32 ADSCLKs). See the ADC—Serial
Interface section.
Once 32 ADSCLK cycles have elapsed, the D
OUT
line returns to
three-state on the 32
nd
ADSCLK falling edge. If CS is brought
high prior to this, the D
OUT
line returns to three-state at that
point. Therefore, CS may idle low after 32 ADSCLK cycles until
it is brought high again sometime prior to the next conversion
(effectively idling CS low), if so desired, because the bus still
returns to three-state upon completion of the dual result read.
Once a data transfer is complete and D
OUT
A and D
OUT
B have
returned to three-state, another conversion can be initiated after
the quiet time, t
QUIET
, has elapsed by bringing CS low again
(assuming the required acquisition time is allowed).
Partial Power-Down Mode
This mode is intended for use in applications where slower
throughput rates are required. Either the ADC is powered down
between each conversion, or a series of conversions may be per-
formed at a high throughput rate, and the ADC is then powered
Figure 78. Straight Binary Transfer Characteristic
Figure 79. Twos Complement Transfer Characteristic with
V
REF
± V
REF
Input Range
000...000
111...111
1LSB = VREF/4096
1LSB VREF – 1LSB
ANALOG INPUT
ADC CODE
0V
000...001
000...010
111...110
111...000
011...111
NOTE
1. VREF IS EITHER VREF OR 2 × VREF.
100...000
011...111
1LSB = 2 uVREF/4096
+VREF – 1 LSB–VREF + 1LSB VREF – 1LSB
ANALOG INPUT
ADC CODE
100...001
100...010
011...110
000...001
000...000
111...111
Figure 80. Normal Mode Operation
Rev. B | Page 69 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
down for a relatively long duration between these bursts of sev-
eral conversions. When the ADC is in partial power-down, all
analog circuitry is powered down except for the on-chip refer-
ence and reference buffer.
To enter partial power-down mode, the conversion process
must be interrupted by bringing CS high anywhere after the sec-
ond falling edge of ADSCLK and before the 10
th
falling edge of
ADSCLK, as shown in Figure 81 (Entering Partial Power-Down
Mode). Once CS is brought high in this window of ADSCLKs,
the part enters partial power-down, the conversion that was ini-
tiated by the falling edge of CS is terminated, and D
OUT
A and
D
OUT
B go back into three-state. If CS is brought high before the
second ADSCLK falling edge, the part remains in normal mode
and does not power down. This avoids accidental power-down
due to glitches on the CS line.
To exit this mode of operation and power up the ADC again, a
dummy conversion is performed. On the falling edge of CS, the
device begins to power up and continues to power up as long as
CS is held low until after the falling edge of the 10
th
ADSCLK.
The device is fully powered up after approximately 1 μs has
elapsed, and valid data results from the next conversion, as
shown in Figure 82 (Exiting Partial Power-Down Mode). If CS
is brought high before the second falling edge of ADSCLK, the
ADC again goes into partial power-down. This avoids acciden-
tal power-up due to glitches on the CS line. Although the device
may begin to power up on the falling edge of CS, it powers down
again on the rising edge of CS. If the ADC is already in partial
power-down mode and CS is brought high between the second
and 10
th
falling edges of ADSCLK, the device enters full power-
down mode.
Full Power-Down Mode
This mode is intended for use in applications where throughput
rates slower than those in the partial power-down mode are
required, as power-up from a full power-down takes substan-
tially longer than that from partial power-down. This mode is
more suited to applications where a series of conversions per-
formed at a relatively high throughput rate are followed by a
long period of inactivity and thus power-down. When the ADC
is in full power-down, all analog circuitry is powered down. Full
power-down is entered in a similar way as partial power-down,
except the timing sequence shown in Figure 81 (Entering Partial
Power-Down Mode) must be executed twice. The conversion
process must be interrupted in a similar fashion by bringing CS
high anywhere after the second falling edge of ADSCLK and
before the 10
th
falling edge of ADSCLK. The device enters par-
tial power-down at this point. To reach full power-down, the
next conversion cycle must be interrupted in the same way, as
shown in Figure 83 (Entering Full Power-Down Mode). Once
CS is brought high in this window of ADSCLKs, the part com-
pletely powers down.
Note that it is not necessary to complete the 14 ADSCLKs once
CS is brought high to enter a power-down mode.
To exit full power-down and power up the ADC, a dummy con-
version is performed, as when powering up from partial power-
down. On the falling edge of CS, the device begins to power up
and continues to power up, as long as CS is held low until after
the falling edge of the 10
th
ADSCLK. The required power-up
time must elapse before a conversion can be initiated, as shown
in Figure 84 (Exiting Full Power-Down Mode). See the Power-
Up Times section for the power-up times associated with the
ADC.
Figure 81. Entering Partial Power-Down Mode
ADSCLK
THREE-STATE
CS
D
OUT
A
D
OUT
B
114102
Figure 82. Exiting Partial Power-Down Mode
ADSCLK
CS
D
OUT
A
D
OUT
BINVALID DATA VALID DATA
11014 141
THE PART BEGINS
TO POWER UP.
THE PART IS FULLY
POWERED UP; SEE
POWER-UP TIMES
SECTION.
tPOWER-UP1
Rev. B | Page 70 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Power-Up Times
As described in detail, the ADC has two power-down modes,
partial power-down and full power-down. This section deals
with the power-up time required when coming out of either of
these modes. It should be noted that the power-up times, as
explained in this section, apply with the recommended capaci-
tors in place on the D
CAP
A and D
CAP
B pins.
To power up from full power-down, approximately 1.5 ms
should be allowed from the falling edge of CS, shown as
t
POWER-UP2
in Figure 84 (Exiting Full Power-Down Mode). Pow-
ering up from partial power-down requires much less time. The
power-up time from partial power-down is typically 1 μs; how-
ever, if using the internal reference, then the ADC must be in
partial power-down for at least 67 μs in order for this power-up
time to apply.
When power supplies are first applied to the ADC, the ADC
may power up in either of the power-down modes or normal
mode. Because of this, it is best to allow a dummy cycle to elapse
to ensure the part is fully powered up before attempting a valid
conversion. Likewise, if it is intended to keep the part in the par-
tial power-down mode immediately after the supplies are
applied, then two dummy cycles must be initiated. The first
dummy cycle must hold CS low until after the 10
th
ADSCLK
falling edge (see Figure 80 (Normal Mode Operation)); in the
second cycle, CS must be brought high before the 10
th
ADSCLK
edge but after the second ADSCLK falling edge (see Figure 81
(Entering Partial Power-Down Mode)). Alternatively, if it is
intended to place the part in full power-down mode when the
supplies are applied, then three dummy cycles must be initiated.
The first dummy cycle must hold CS low until after the 10
th
ADSCLK falling edge (see Figure 80 (Normal Mode Opera-
tion)); the second and third dummy cycles place the part in full
power-down (see Figure 83 (Entering Full Power-Down
Mode)).
Once supplies are applied to the ADC, enough time must be
allowed for any external reference to power up and charge the
various reference buffer decoupling capacitors to their final
values.
Power vs. Throughput Rate
The power consumption of the ADC varies with the throughput
rate. When using very slow throughput rates and as fast an
ADSCLK frequency as possible, the various power-down
options can be used to make significant power savings. How-
ever, the ADC quiescent current is low enough that even
without using the power-down options, there is a noticeable
variation in power consumption with sampling rate. This is true
whether a fixed ADSCLK value is used or if it is scaled with the
sampling rate. Figure 85 (Power vs. Throughput in Normal
Mode with VDD = 3 V) and Figure 86 (Power vs. Throughput
in Normal Mode with VDD = 5 V) show plots of power vs. the
throughput rate when operating in normal mode for a fixed
Figure 83. Entering Full Power-Down Mode
Figure 84. Exiting Full Power-Down Mode
THREE-STATE
110142
ADSCLK
CS
DOUTA
DOUTB
THREE-STATE
110142
INVALID DATAINVALID DATA
THE PART BEGINS
TO POWER UP.
THE PART ENTERS
PARTIAL POWER DOWN.
THE PART ENTERS
FULL POWER DOWN.
ADSCLK
DOUTA
DOUTBINVALID DATA VALID DATA
110 14 14
1
THE PART BEGINS
TO POWER UP.
THE PART IS FULLY POWERED UP,
SEE POWER-UP TIMES SECTION.
tPOWER-UP2
CS
Rev. B | Page 71 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
maximum ADSCLK frequency and an ADSCLK frequency that
scales with the sampling rate with V
DD
= 3 V and V
DD
= 5 V,
respectively. In all cases, the internal reference was used.
ADC—SERIAL INTERFACE
Figure 87 (Serial Interface Timing Diagram) shows the detailed
timing diagram for serial interfacing to the ADC. The serial
clock provides the conversion clock and controls the transfer of
information from the ADC during conversion.
The CS signal initiates the data transfer and conversion process.
The falling edge of CS puts the track-and-hold into hold mode,
at which point the analog input is sampled and the bus is taken
out of three-state. The conversion is also initiated at this point
and requires a minimum of 14 ADSCLKs to complete. Once 13
ADSCLK falling edges have elapsed, the track-and-hold goes
back into track on the next ADSCLK rising edge, as shown in
Figure 87 (Serial Interface Timing Diagram) at Point B. If a 16
ADSCLK transfer is used, then two trailing zeros appear after
the final LSB. On the rising edge of CS, the conversion is termi-
nated and D
OUT
A and D
OUT
B go back into three-state. If CS is
not brought high but is instead held low for a further 14 (or 16)
ADSCLK cycles on D
OUT
A, the data from Conversion B is out-
put on D
OUT
A (followed by two trailing zeros).
Likewise, if CS is held low for a further 14 (or 16) ADSCLK
cycles on D
OUT
B, the data from Conversion A is output on
D
OUT
B.
This is illustrated in Figure 88 (Reading Data from Both ADCs
on One DOUT Line with 32 ADSCLKs) where the case for
D
OUT
A is shown. In this case, the D
OUT
line in use goes back into
three-state on the 32
nd
ADSCLK falling edge or the rising edge
of CS, whichever occurs first.
A minimum of 14 serial clock cycles are required to perform the
conversion process and to access data from one conversion on
either data line of the ADC. CS going low provides the leading
zero to be read in by the microcontroller or DSP. The remaining
data is then clocked out by subsequent ADSCLK falling edges,
beginning with a second leading zero. Thus, the first falling
clock edge on the serial clock has the leading zero provided and
also clocks out the second leading zero. The 12-bit result then
follows with the final bit in the data transfer valid on the 14
th
falling edge, having being clocked out on the previous (13
th
) fall-
ing edge. In applications with a slower ADSCLK, it may be
possible to read in data on each ADSCLK rising edge depending
on the ADSCLK frequency. The first rising edge of ADSCLK
after the CS falling edge would have the second leading zero
provided, and the 13
th
rising ADSCLK edge would have DB0
provided.
Note that with fast ADSCLK values, and thus short ADSCLK
periods, in order to allow adequately for t
2
, an ADSCLK rising
edge may occur before the first ADSCLK falling edge. This ris-
ing edge of ADSCLK may be ignored for the purposes of the
timing descriptions in this section. If a falling edge of ADSCLK
is coincident with the falling edge of CS, then this falling edge of
ADSCLK is not acknowledged by the ADC, and the next falling
edge of ADSCLK will be the first registered after the falling edge
of CS.
Figure 85. Power vs. Throughput in Normal Mode with V
DD
= 3 V
Figure 86. Power vs. Throughput in Normal Mode with V
DD
= 5 V
THROUGHPUT (kSPS)
14000 200 400 600 800 1000 1200
POWER (mW)
10.0
9.5
9.0
8.5
8.0
7.5
7.0
6.5
6.0
5.5
5.0
24MHz ADSCLK
VARIABLE ADSCLK
TA = 25°C
THROUGHPUT (kSPS)
20000 200 400 600 800 1000 1200 1400 1600 1800
POWER (mW)
30
28
26
24
22
20
18
16
14
12
10
32MHz ADSCLK
VARIABLE ADSCLK
T
A
= 25°C
Rev. B | Page 72 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 87. Serial Interface Timing Diagram
Figure 88. Reading Data from Both ADCs on One D
OUT
Line with 32 ADSCLKs
CS
ADSCLK 1513
DOUTA
DOUTB
2 LEADING ZEROS
THREE-
STATE
t4
234
t5
t3
tQUIET
t2
THREE-STATE
DB11 DB10 DB2 DB0
t6
t7t8
0
0DB1
B
DB9 DB8
t9
CS
ADSCLK
1515
D
OUT
ATHREE-
STATE
t4
234 16
t5
t3
t2
THREE-
STATE
t6
t7
14
ZERO0 ZERO DB11
B
17
2 LEADING ZEROS
t10
32
DB11
A
2 LEADING
ZEROS
DB10
A
DB9
A
ZEROZERO ZERO
2 TRAILING ZEROS
ZERO ZERO
2 TRAILING ZEROS
Rev. B | Page 73 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
120-LEAD LQFP LEAD ASSIGNMENT
Table 54 lists the LQFP leads by signal mnemonic. Table 55 on
Page 74 lists the LQFP leads by lead number.
Table 54. 120-Lead LQFP Lead Assignment (Alphabetical by Signal)
Signal Lead No. Signal Lead No. Signal Lead No. Signal Lead No.
A0 100 NC 72 PG11 46 V
B5
88
A1 98 NMI 11 PG12 47 V
B6
87
A2 97 PF0 118 PG13 48 V
DDEXT
1
AGND 73 PF1 119 PG14 49 V
DDEXT
6
AGND 78 PF2 2 PG15 50 V
DDEXT
15
AGND 79 PF3 4 PH0 113 V
DDEXT
20
AGND 82 PF4 3 PH1 115 V
DDEXT
23
AGND 93 PF5 5 PH2 114 V
DDEXT
26
AGND 99 PF6 7 RANGE 95 V
DDEXT
30
AV
DD
76 PF7 8 REF_SELECT 75 V
DDEXT
41
BMODE0 58 PF8 9 RESET 12 V
DDEXT
51
BMODE1 57 PF9 10 SCL 55 V
DDEXT
59
BMODE2 56 PF10 14 ADSCLK 102 V
DDEXT
62
CLKIN 110 PF11 16 SDA 54 V
DDEXT
64
CS 101 PF12 18 SGL/DIFF 96 V
DDEXT
66
D
CAP
A 77 PF13 19 TCK 34 V
DDEXT
67
D
CAP
B 94 PF14 21 TDI 33 V
DDEXT
112
DGND 74 PF15 22 TDO 36 V
DDEXT
116
DGND 104 PG 71 TMS 35 V
DDFLASH
25
D
OUT
A 105 PG0 27 TRST 37 V
DDFLASH
63
D
OUT
B 103 PG1 28 V
A1
80 V
DDFLASH
69
DV
DD
107 PG2 29 V
A2
81 V
DDINT
24
EMU 68 PG3 31 V
A3
83 V
DDINT
42
EXT_WAKE 70 PG4 32 V
A4
84 V
DDINT
52
EXTCLK 120 PG5 38 V
A5
85 V
DDINT
53
GND 13 PG6 39 V
A6
86 V
DDINT
61
GND 17 PG7 40 V
B1
92 V
DDINT
65
GND 108 PG8 43 V
B2
91 V
DDINT
117
GND 109 PG9 44 V
B3
90 V
DRIVE
106
NC 60 PG10 45 V
B4
89 XTAL 111
GND 121
*
AGND 122
**
* Pin no. 121 is the GND supply (see Figure 89 and Figure 90) for the processor (4.6mm × 6.17mm); this pad must connect to GND.
** Pin no. 122 is the AGND supply (see Figure 89 and Figure 90) for the ADC (2.81mm × 2.81mm); this pad must connect to AGND.
Rev. B | Page 74 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 55. 120-Lead LQFP Lead Assignment (Numerical by Lead Number)
Lead No. Signal Lead No. Signal Lead No. Signal Lead No. Signal
1V
DDEXT
31 PG3 61 V
DDINT
91 V
B2
2 PF2 32 PG4 62 V
DDEXT
92 V
B1
3PF4 33TDI 63V
DDFLASH
93 AGND
4PF3 34TCK 64V
DDEXT
94 D
CAP
B
5 PF5 35 TMS 65 V
DDINT
95 RANGE
6V
DDEXT
36 TDO 66 V
DDEXT
96 SGL/DIFF
7PF6 37TRST67 V
DDEXT
97 A2
8 PF7 38 PG5 68 EMU 98 A1
9 PF8 39 PG6 69 V
DDFLASH
99 AGND
10 PF9 40 PG7 70 EXT_WAKE 100 A0
11 NMI 41 V
DDEXT
71 PG 101 CS
12 RESET 42 V
DDINT
72 NC 102 ADSCLK
13 GND 43 PG8 73 AGND 103 D
OUT
B
14 PF10 44 PG9 74 DGND 104 DGND
15 V
DDEXT
45 PG10 75 REF_SELECT 105 D
OUT
A
16 PF11 46 PG11 76 AV
DD
106 V
DRIVE
17 GND 47 PG12 77 D
CAP
A107 DV
DD
18 PF12 48 PG13 78 AGND 108 GND
19 PF13 49 PG14 79 AGND 109 GND
20 V
DDEXT
50 PG15 80 V
A1
110 CLKIN
21 PF14 51 V
DDEXT
81 V
A2
111 XTAL
22 PF15 52 V
DDINT
82 AGND 112 V
DDEXT
23 V
DDEXT
53 V
DDINT
83 V
A3
113 PH0
24 V
DDINT
54 SDA 84 V
A4
114 PH2
25 V
DDFLASH
55 SCL 85 V
A5
115 PH1
26 V
DDEXT
56 BMODE2 86 V
A6
116 V
DDEXT
27 PG0 57 BMODE1 87 V
B6
117 V
DDINT
28 PG1 58 BMODE0 88 V
B5
118 PF0
29 PG2 59 V
DDEXT
89 V
B4
119 PF1
30 V
DDEXT
60 NC 90 V
B3
120 EXTCLK
121
*
GND
122
**
AGND
* Pin no. 121 is the GND supply (see Figure 89 and Figure 90) for the processor (4.6mm × 6.17mm); this pad must connect to GND.
** Pin no. 122 is the AGND supply (see Figure 89 and Figure 90) for the ADC (2.81mm × 2.81mm); this pad must connect to AGND.
Rev. B | Page 75 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 89 shows the top view of the 120-lead LQFP package lead
configuration.
Figure 90 shows the bottom view of the 120-lead LQFP package
lead configuration.
Figure 89. 120-Lead LQFP Package Lead Configuration (Top View)
PIN 1
PIN 30
PIN 90
PIN 61
PIN 120 PIN 91
PIN 31 PIN 60
PIN 1
120-LEAD LQFP
TOP VIEW
INDICATOR
Figure 90. 120-Lead LQFP Package Lead Configuration (Bottom View)
PIN 30
PIN 1
PIN 61
PIN 90
PIN 31 PIN 60
PIN 120 PIN 91
120-LEAD LQFP
GND
AGND
PAD
PAD
(PIN 121)
(PIN 122)
BOTTOM VIEW
Rev. B | Page 76 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
88-LEAD LFCSP LEAD ASSIGNMENT
Table 56 lists the LFCSP leads by signal mnemonic. Table 57 on
Page 77 lists the LFCSP by lead number.
Table 56. 88-Lead LFCSP Lead Assignment (Alphabetical by Signal)
Signal Lead No. Signal Lead No. Signal Lead No. Signal Lead No.
BMODE0 51 PF4 82 PG9 34 V
DDEXT
20
BMODE1 50 PF5 83 PG10 35 V
DDEXT
31
BMODE2 49 PF6 85 PG11 36 V
DDEXT
41
CLKIN 68 PF7 86 PG12 37 V
DDEXT
52
EMU 60 PF8 87 PG13 38 V
DDEXT
54
EXT_WAKE 62 PF9 88 PG14 39 V
DDEXT
56
EXTCLK 78 PF10 4 PG15 40 V
DDEXT
58
GND 3 PF11 6 PH0 71 V
DDEXT
59
GND 7 PF12 8 PH1 72 V
DDEXT
70
GND 67 PF13 9 PH2 73 V
DDEXT
74
NC 45 PF14 11 RESET 2V
DDEXT
79
NC 46 PF15 12 SCL 44 V
DDEXT
84
NC 47 PG 63 SDA 43 V
DDFLASH
15
NC 48 PG0 17 TCK 24 V
DDFLASH
55
NC 64 PG1 18 TDI 23 V
DDFLASH
61
NC 65 PG2 19 TDO 27 V
DDINT
14
NC 66 PG3 21 TMS 25 V
DDINT
32
NMI 1 PG4 22 TRST 26 V
DDINT
42
PF0 76 PG5 28 V
DDEXT
5V
DDINT
53
PF1 77 PG6 29 V
DDEXT
10 V
DDINT
57
PF2 80 PG7 30 V
DDEXT
13 V
DDINT
75
PF3 81 PG8 33 V
DDEXT
16 XTAL 69
GND 89
*
* Pin no. 89 is the GND supply (see Figure 92) for the processor; this pad must connect to GND.
Rev. B | Page 77 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Table 57. 88-Lead LFCSP Lead Assignment (Numerical by Lead Number)
Lead No. Signal Lead No. Signal Lead No. Signal Lead No. Signal
1NMI
23 TDI 45 NC 67 GND
2RESET
24 TCK 46 NC 68 CLKIN
3 GND 25 TMS 47 NC 69 XTAL
4 PF10 26 TRST 48 NC 70 V
DDEXT
5V
DDEXT
27 TDO 49 BMODE2 71 PH0
6 PF11 28 PG5 50 BMODE1 72 PH1
7 GND 29 PG6 51 BMODE0 73 PH2
8 PF12 30 PG7 52 V
DDEXT
74 V
DDEXT
9 PF13 31 V
DDEXT
53 V
DDINT
75 V
DDINT
10 V
DDEXT
32 V
DDINT
54 V
DDEXT
76 PF0
11 PF14 33 PG8 55 V
DDFLASH
77 PF1
12 PF15 34 PG9 56 V
DDEXT
78 EXTCLK
13 V
DDEXT
35 PG10 57 V
DDINT
79 V
DDEXT
14 V
DDINT
36 PG11 58 V
DDEXT
80 PF2
15 V
DDFLASH
37 PG12 59 V
DDEXT
81 PF3
16 V
DDEXT
38 PG13 60 EMU 82 PF4
17 PG0 39 PG14 61 V
DDFLASH
83 PF5
18 PG1 40 PG15 62 EXT_WAKE 84 V
DDEXT
19 PG2 41 V
DDEXT
63 PG 85 PF6
20 V
DDEXT
42 V
DDINT
64 NC 86 PF7
21 PG3 43 SDA 65 NC 87 PF8
22 PG4 44 SCL 66 NC 88 PF9
89
*
GND
* Pin no. 89 is the GND supply (see Figure 92) for the processor; this pad must connect to GND.
Rev. B | Page 78 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 91 shows the top view of the LFCSP pin configuration.
Figure 92 shows the bottom view of the LFCSP lead
configuration.
Figure 91. 88-Lead LFCSP Lead Configuration (Top View)
PIN 1
PIN 22
PIN 66
PIN 45
PIN 88 PIN 67
PIN 23PIN 44
PIN 1
88-LEAD LFCSP
TOP VIEW
INDICATOR
Figure 92. 88-Lead LFCSP Lead Configuration (Bottom View)
PIN 66
PIN 45
PIN 1
PIN 22
PIN 67 PIN 88
PIN 46 PIN 23
PIN 1
88-LEAD LFCSP
GND PAD
(PIN 89)
BOTTOM VIEW
INDICATOR
Rev. B | Page 79 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
OUTLINE DIMENSIONS
Dimensions in Figure 93 (for the 120-lead LQFP) and in
Figure 94 (for the 88-lead LFCSP) are shown in millimeters.
Figure 93. 120-Lead Low Profile Quad Flat Package, Exposed Pad [LQFP_EP]
1
(SW-120-2)
Dimensions shown in millimeters
1
For information relating to the SW-120-2 package’s exposed pad, see the table endnote on Page 74.
31
91
61
90
120
30
1
60
BOTTOM VIEW
(PINS UP)
EXPOSED PAD
EXPOSED
PAD
0.77 REF
2.945 REF
SQ
4.60 REF
1.915
2.81 REF
SQ
2.41 REF
SQ
3.75 REF
1.53
6.17
REF
5.37
REF
COMPLIANT TO JEDEC STANDARDS MS-026-BEE-HD
1.45
1.40
1.35
0.15
0.10
0.05
TOP VIEW
(PINS DOWN)
91
190
31
30
60
61
120
0.23
0.18
0.13
0.40
BSC
LEAD PITCH
1.60
MAX
16.20
16.00 SQ
15.80 14.10
14.00 SQ
13.90
VIEW A
PIN 1
0.08 MAX
COPLANARITY
VIEW A
ROTATED 90
°
CCW
SEATING
PLANE
12°
0.20
0.15
0.09
0.75
0.60
0.45
1.00 REF
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
Rev. B | Page 80 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Figure 94. 88-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
1
12 x 12 mm Body, Very Thin Quad
(CP-88-5)
Dimensions shown in millimeters
1
For information relating to the CP-88-5 package’s exposed pad, see the table endnote on Page 76.
*COMPLIANT TO JEDEC STANDARDS MO-220-VRRD
EXCEPT FOR MINIMUM THICKNESS AND LEAD COUNT.
1
22
66
45
23
44
88
67
0.50
0.40
0.30
0.30
0.23
0.18
10.50
REF
0.60 MAX
0.60
MAX
6.70
REF SQ
0.50
BSC
0.138~0.194 REF
12° MAX
SEATING
PLANE
TOP VIEW
EXPOSED PAD
BOTTOM VIEW
0.70
0.65
0.60 0.045
0.025
0.005
PIN 1
INDICATOR
12.10
12.00 SQ
11.90
11.85
11.75 SQ
11.65
PIN 1
INDICATOR
*0.90
0.85
0.75
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
COPLANARITY
0.08
Rev. B | Page 81 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
AUTOMOTIVE PRODUCTS
The ADBF504W model is available with controlled manufactur-
ing to support the quality and reliability requirements of
automotive applications. Note that these automotive models
may have specifications that differ from the commercial models
and designers should review the Specifications section of this
data sheet carefully. Only the automotive grade products shown
in Table 58 are available for use in automotive applications.
Contact your local ADI account representative for specific
product ordering information and to obtain the specific Auto-
motive Reliability reports for these models.
ORDERING GUIDE
Table 58. Automotive Products
Automotive Models
1,2
Temperature
Range
3
Processor Instruction Rate
(Maximum)
Flash
Memory
Package
Description
Package
Option
ADBF504WYCPZ4XX –40ºC to +105ºC 400 MHz N/A 88-Lead LFCSP_VQ CP-88-5
1
Z = RoHS compliant part.
2
The use of xx designates silicon revision.
3
Referenced temperature is ambient temperature. The ambient temperature is not a specification. Please see Operating Conditions on Page 26 for junction temperature (T
J
)
specification which is the only temperature specification.
Model
1,2
1
Z = RoHS compliant part.
2
For feature comparison between ADSP-BF504, ADSP-BF504F, and ADSP-BF506F processors, see the Processor Comparison in Table 1 on Page 3.
Temperature
Range
3,4
3
Referenced temperature is ambient temperature. The ambient temperature is not a specification. Please see Operating Conditions on Page 26 for junction temperature (T
J
)
specification which is the only temperature specification.
4
Temperature range 0°C to +70°C is classified as commercial, and temperature range –40°C to +85°C is classified as industrial.
Processor Instruction Rate
(Maximum)
Flash
Memory
Package
Description
Package
Option
ADSP-BF504BCPZ-3F –40°C to +85°C 300 MHz 32M bit 88-Lead LFCSP_VQ CP-88-5
ADSP-BF504BCPZ-4 –40°C to +85°C 400 MHz N/A 88-Lead LFCSP_VQ CP-88-5
ADSP-BF504BCPZ-4F –40°C to +85°C 400 MHz 32M bit 88-Lead LFCSP_VQ CP-88-5
ADSP-BF504KCPZ-3F 0°C to +70°C 300 MHz 32M bit 88-Lead LFCSP_VQ CP-88-5
ADSP-BF504KCPZ-4 0°C to +70°C 400 MHz N/A 88-Lead LFCSP_VQ CP-88-5
ADSP-BF504KCPZ-4F 0°C to +70°C 400 MHz 32M bit 88-Lead LFCSP_VQ CP-88-5
ADSP-BF506BSWZ-3F –40°C to +85°C 300 MHz 32M bit 120-Lead LQFP_EP SW-120-2
ADSP-BF506BSWZ-4F –40°C to +85°C 400 MHz 32M bit 120-Lead LQFP_EP SW-120-2
ADSP-BF506KSWZ-3F 0°C to +70°C 300 MHz 32M bit 120-Lead LQFP_EP SW-120-2
ADSP-BF506KSWZ-4F 0°C to +70°C 400 MHz 32M bit 120-Lead LQFP_EP SW-120-2
Rev. B | Page 82 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Rev. B | Page 83 of 84 | April 2014
ADSP-BF504/ADSP-BF504F/ADSP-BF506F
Rev. B | Page 84 of 84 | April 2014
©2014 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D08560-0-4/14(B)
ADSP-BF504/ADSP-BF504F/ADSP-BF506F