MICROCIRCUIT DATA SHEET Original Creation Date: 06/23/98 Last Update Date: 10/14/98 Last Major Revision Date: 09/30/98 MN11C91-X REV 1A0 High Speed Prescaler General Description NOTE: THIS DEVICE IS NOT INTENDED FOR NEW DESIGNS! The 11C91 is a high-speed prescaler designed specifically for communication and instrumentation applications. The 11C91 will divide by 5 or 6. The division ratio is controlled by the Mode Control. The divide by 5 or 6 capability allows the use of pulse swallowing techniques to control high-speed counting modulos by lower-speed circuits. The 11C91 may be used with either ECL or TTL power supplies. In addition to the ECL outputs Q and Q, the 11C91 contains an ECL-to-TTL converter and a TTL output. The TTL output operates from the same VCC and VEE levels as the counter, but a separate pin is used for the TTL circuit VEE. This minimizes noise coupling when the TTL output switches and also allows power consumption to be reduced by leaving the separate VEE pin open if the TTL output is not used. To facilitate capacitive coupling of the clock signal, a 400 ohm resistor (VREF) is connected internally to the VBB reference. Connecting this resistor to the Clock Pulse input (CP) automatically centers the input about the switching threshold. Maximum frequency operation is achieved with a 50% duty cycle. Each of the Mode Control inputs is connected to an internal 2k ohm resistor with the other end uncommitted (RM1 and RM2). An M input can be driven from a TTL circuit operating from the same VCC by connecting the free end of the associated 2k ohm resistor to VCCA. When an M input is driven from the ECL circuit, the 2k ohm resistor can be left open or, if required, can be connected to VEE to act as a pull-down resistor. Industry Part Number NS Part Numbers 11C91 11C91DMQB Prime Die KC91 Processing Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 MIL-STD-883, Method 5004 Quality Conformance Inspection MIL-STD-883, Method 5005 1 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 MICROCIRCUIT DATA SHEET MN11C91-X REV 1A0 Features - THIS DEVICE IS NOT INTENDED FOR NEW DESIGNS! 2 MICROCIRCUIT DATA SHEET MN11C91-X REV 1A0 (Absolute Maximum Ratings) (Note 1) Storage Temperature (Tstg) -65 C to +150 C Maximum Junction Temperature (Tj) +175 C Vee Pin Potential to Ground Pin -7.0V to GND Input Voltage (DC) VEE to GND Output Current (DC Output HIGH) -50mA Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Recommended Operating Conditions Case Temperature (Tc) -55 C to +125 C Supply Voltage (Vee) -5.7V to -4.7V Supply Voltage (VCC) VCC = VCCA GND 3 MICROCIRCUIT DATA SHEET MN11C91-X REV 1A0 Electrical Characteristics DC PARAMETERS - ECL OPERATION (The following conditions apply to all the following parameters, unless otherwise specified.) DC: VEE = -5.2V, VCC=VCCA=GND, TC = -55C to +125C SYMBOL IIH PARAMETER Input HIGH Current CONDITIONS NOTES VEE = -5.2V, VM = VIH PINNAME MIN MAX UNIT SUBGROUPS 2, 4 M1, M2 250 uA 1 2, 4 CP, MS 400 uA 1 uA 1 IIL Input LOW Current VEE = -5.2V, VM = VIL 2, 4 INPUTS 0.5 VOH Output HIGH Voltage VEE = -5.2V, VIL, VIH, LOADING 100 OHMS TO -2.0V 1, 3 OUTPUTS -980 -820 mV 1 1, 3 OUTPUTS -910 -670 mV 2 1, 3 OUTPUTS -1100 -900 mV 3 VOL Output LOW Voltage VEE = -5.2V, VIL, VIH, LOADING: 100 Ohms to -2.0V 1, 3 OUTPUTS -1820 -1620 mV 1, 2, 3 VREF Reference Voltage VEE = -5.2V, IREF = -10uA 2, 4 VREF -1550 -1150 mV 1 VIH Input HIGH Voltage VEE = -5.2V 7 INPUTS -1100 -810 mV 1 7 INPUTS -980 -690 mV 2 7 INPUTS -1195 -910 mV 3 7 INPUTS -1850 -1480 mV 1 7 INPUTS -1800 -1430 mV 2 7 INPUTS -1890 -1520 mV 3 1, 3 VEE -46 -110 mA 1 1, 3 VEE -46 -118 mA 2, 3 -5.0 mA 1, 2, 3 -80 mA 1, 2, 3 V 1, 2, 3 V 1, 2, 3 V 1, 2, 3 V 1, 2, 3 VIL IEE Input LOW Voltage Power Supply Current VEE = -5.2V VEE = -5.2V, Inputs Open DC PARAMETERS - TTL OPERATION (The following conditions apply to all the following parameters, unless otherwise specified.) DC: VCC = 5.0V, VEE = 0.0V, TC = -55C TO +125C IIL Input Low Current VCC = 5.5V, VIL = 0.4V 1, 3 INPUTS ISC Output Short Circuit Current VCC = 5.5V, VM = 0.0V 1, 3 QTTL -20 VOH Output High Voltage VCC = 5.0V, VIL, VIH, IOH = -640uA 1, 3 QTTL 2.3 VOL Output Low Voltage VCC = 5.0V, VIL, VIH, IOL = 20mA 1, 3 QTTL VIH Input High Voltage VCC = 5.0V 7 INPUTS VIL Input Low Voltage VCC = 5.0V 7 INPUTS 4 0.5 4.1 3.3 MICROCIRCUIT DATA SHEET MN11C91-X REV 1A0 Electrical Characteristics AC PARAMETERS - ECL OPERATION (The following conditions apply to all the following parameters, unless otherwise specified.) AC: VEE = -5.2V, VCC=VCCA= 0.0V, TC = -55C TO +125C, LOADING: 100 OHMS TO -2.0V SYMBOL PARAMETER CONDITIONS NOTES PINNAME MIN MAX UNIT SUBGROUPS tpLH tpHL Propagation Delay VEE = -5.2V, VM = 50% 5 CP to Q 1.3 3.0 ns 9 tpLH Propagation Delay VEE = -5.2V, VM = 50% 5 MS TO Q 6.0 ns 9 ttLH ttHL Output Transition Time VEE = -5.2V, VM = 20% to 80% or 80% to 20% 5 OUTPUTS 2.0 ns 9 ts(H/L) Setup time High or Low VEE = -5.2V 5 M to CP 4.0 ns 9 th(H/L) Hold time High or Low VEE = -5.2V 5 M to CP 0.0 ns 9 FMAX Maximum Clock Frequency VEE = -5.2V 5 CP MHz 9 14.0 ns 9 17.0 ns 9 600 AC PARAMETERS - TTL OPERATION (The following conditions apply to all the following parameters, unless otherwise specified.) AC: VCC = 5.0V, VEE = 0.0V, TC = -55C TO +125C, LOADING: HIGH IMPEDANCE tpLH tpHL Propagation Delay VCC = 5.0V, VM = 50% 5 CP to QTTL tpLH Propagation Delay VCC = 5.0V, VM = 50% 5 MS to QTTL ts(H/L) Setup Time High or Low VCC = 5.0V 5 M to CP 4.0 ns 9 th(H/L) Hold Time High or Low VCC = 5.0V 5 M to CP 0.0 ns 9 FMAX Maximum Clock Frequency VCC = 5.0V 5 CP MHz 9 Note 1: Note 2: Note 3: Note Note Note Note 4: 5: 6: 7: 6.0 600 Screen tested 100% on each device at -55 C, +25 C and +125 C temperature, subgroups 1, 2, 3, 7 & 8. Screen tested 100% on each device at +25C temperature only, subgroup 1. Sample tested (Method 5005, Table 1) on each MFG. lot at -55C, +25C and +125C temperature, subgroups 1, 2, 3, 7 & 8. Sample tested, (Method 5005, Table 1) at +25C temperature only, subgroup 1. Guaranteed at +25 C temperature only, subgroup 9. Sample tested at +25C temperature only, 2% LTPD. Guaranteed by applying specific input condition and testing VOH/VOL. 5 MICROCIRCUIT DATA SHEET MN11C91-X REV 1A0 Revision History Rev ECN # 0A0 M0002934 10/14/98 Rel Date Originator Donald B. Miller Initial MDS Release. Archive Table 1 rev 0.0 Release MDS MN11C91-X rev 0A0. Changes 1A0 M0003024 10/14/98 Donald B. Miller Revision change from 0A0 to 1A0: On page 5, "AC parameters - ECL operation" section, change the FMAX note from 6 "Sample tested at +25C temperature only, 2% LTPD" to note 5 "Guaranteed at +25C temperature only, subgroup 9". 6