6000
5000
4000
3000
2000
1000
0
250
200
150
100
50
0
-50
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
IC (A), VGE (V)
Time (μs)
VCE (V)
Fig. 2 Example of a normal switch-on condition for an ABB SPT+ 1.7 kV IGBT chip.
The IGBT and diode chipsets offered in the full voltage range
from 1.2 kV to 6.5 kV are all available for solder mount-down
and wire bonding in modules, though the larger die may also
be supplied with metallization suitable for pressure assembly
(i.e. in press-packs). This brochure outlines the currently avai-
lable die types and their salient features.
Product Description
ABB produces IGBT and fast recovery diode dies in the vol-
tage range from 1.2 kV to 6.5 kV based on the well established
SPT™ (Soft Punch-Through) technology platform. SPT™
technology is characterised by very controlled (“soft”) switching
performances and high Safe Operating Areas (SOA) together
with positive temperature coefficients for reliable parallel
operation.
The newer generation of chips, known as SPT+, retains all the
features of SPT™ but allows a 20 – 30% reduction in VCE SAT,
depending on voltage class.
Fig. 2 shows the on-state curves of the newest 1.7 kV SPT+
IGBT chips at different temperatures. The typical on-state vol-
tage drop (VCE ON) at nominal current and Tj = 150°C is 3.1 V.
The SPT+ IGBT shows a positive temperature coefficient of
VCE ON, starting already at low currents, which enables a good
current sharing capability between the individual chips in the
module.
Very high SOA is illustrated in Fig.3 through SSCM (Switching
Self-Clamping Mode) by which a chip exceeds its turn-off
specification in terms of both current, voltage, stray inductance
and RG OFF MIN.
The SPT™ technology platform covers different chip manu-
facturing technologies to obtain different functionalities of the
chips, still preserving the high ruggedness and soft switching
throughout the whole platform which is the trademark of the
technology. The high voltage ( 2.5 kV) SPT+ chipset techno-
logy has the lowest VCE SAT (@ Tj max) in comparison with any
other IGBT technology on the market and by voltage class.
Configurations
Please be aware that on wafer level (wafer dies or sawn wafer
die) testing can only be performed at room temperature level.
Therefore for these configurations all values at high tempera-
ture can only be guaranteed on a statistical base. For 2.5 kV
and above dies are only sold in waffle packs as high tempera-
ture and high voltage performance becomes the predominant
product feature. These dies are tested for functionality at full
voltage at maximum rated temperature.
Fig. 3 Example of an extreme turn-off with an ABB SPTTM IGBT chip sustaining
both dynamic and static avalanche
4.5 kV SPT+ IGBT turn-off at 5.3 x nominal current:
VDC = 3600V, IC = 200A, 125°C, RG = 68Ω, Ls = 4μH, VSSCM = 5200V,
PPEAK = 1 MW/cm2
SSCM
Dynamic
Avalanche
VGE
VCE
IC= 5.3 x Inom
Nominal Current
7200
IC (A)
VCE (V)
6000
4800
3600
2400
1200
0
012345
125°C
150°C
25°C