2
Silicon Flip Chip
PIN Diode
Rev. V1
MA4FCP300
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ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology
Solutions is considering for development. Performance is based on target specifications,
simulated results, and/or prototype measurements. Commitment to develop is not guaranteed.
PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology
Solutions has under development. Performance is based on engineering tests. Specifications
are typical. Mechanical outline has been fixed. Engineering samples and/or test data may be
available. Commitment to produce in volume is not guaranteed.
Electrical Specifications @ TA = +25°C
Parameters @ Conditions Symbol Units Min. Typ. Max.
Total Capacitance @ -10V, 1MHz1 C
T pF 0.04
0.08
Total Capacitance @ -10V, 1GHz1,3 C
T pF 0.025
Series Resistance @ +50mA2,3, 100MHz RS Ω 2.1 2.8
Series Resistance @ +50mA2,3, 1GHz RS Ω 2.6
Forward Voltage @ +100mA VF V 1.1 1.5
Reverse Voltage @ -10μA VR V | -70 | | -100 |
Reverse Current @ -40V IR μA | - 10 |
50 – 90 % Lifetime @ + 10mA / - 6mA TL ns 140
Steady State Thermal Resistance4 θ ° C/W 450
1. Total capacitance is equivalent to the sum of junction capacitance Cj and parasitic capacitance, Cp.
2. Series resistance RS is equivalent to the total diode series resistance including the junction resistance Rj.
3. Rs and Cp measured on an HP4291A with die mounted in an ODS-186 package.
4. Steady-State Thermal Resistance measured with die mounted in an ODS-186 package.
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Assembly Procedures
The following precautions should be observed to avoid
damaging these devices.
Cleanliness
These devices should be handled in a clean environment. Do
not attempt to clean die after installation.
ESD
These devices very susceptible to ESD and are rated Class 0
(0-199V) per HBM MIL-STD-883, method 3015.7 [C =
100pF ±10%, R = 1.5kΩ ±1%]. Even though tested die pass
100V ESD, they must be handled in a static-free
environment.
General Handling
The protective polymer coating on the active areas of these
devices provides scratch protection, particularly for the metal
airbridge that contacts the anode. Die can be handled with
tweezers or vacuum pickups and are suitable for use with
automatic pick-and-place equipment.
Mounting Techniques
These devices were designed for insertion onto hard or
soft substrates with the junction side down. They can be
mounted with electrically conductive epoxy or with a
low temperature solder preform. The die can also be
assembled with the junction side up, and wire or ribbon
bonds made to the pads.
Solder Die Attach using Electrically
Conductive Ag Epoxy and Solder
These chips are designed to be inserted onto hard or soft
substrates with the junction side down. They should be
mounted onto silkscreened circuits using Electrically
Conductive Ag Epoxy, approximately 1-2 mils in
thickness and cured at approximately 90°C to 150 °C per
manufacturer’s schedule. For extended cure times > 30
minutes, temperatures must be below 200 °C.
Sn Rich Solders ( > 30 % by Weight ) are not
recommended due to the Tungsten Metallization scheme
beneath the gold contacts. Indalloy or 80 Au/20 Sn
Solders are acceptable. Maximum soldering temperature
must be < 300 °C for < 10 seconds.