ATC # 001-811 Rev. K 1/08
ATC 200 A Series
BX Ceramic
Multilayer Capacitors
• Case A Size • Capacitance Range
(.055" x .055") 510 pF to 0.01
µ
F
• Low ESR/ESL • Mid-K
• Rugged • High Reliability
Construction
ATC, the industry leader, offers new improved ESR/ESL performance
for the 200 A Ser ies Capacitors. This Series exhibits high volumetric
efficiency with superior IR characteristics. Ceramic construction pro-
vides a rugged, her metic package.
Typical functional applications: Bypass, Coupling and DC Blocking.
Typical circuit applications: Switching P ow er Supplies and High P o wer
Broadband Coupling.
ENVIRONMENTAL TESTS
ATC 200 A Ser ies Capacitors are designed and manufactured to
meet and exceed the requirements of EIA-198, MIL-PRF-55681 and
MIL-PRF-123.
THERMAL SHOCK:
MIL-STD-202, Method 107, Condition A.
MOISTURE RESISTANCE:
MIL-STD-202, Method 106.
LO W V OLTA GE HUMIDITY :
MIL-STD-202, Method 103, Condition A, with 1.5 Volts DC applied
while subjected to an environment of 85°C with 85% relative humidi-
ty for 240 hours min.
LIFE TEST:
MIL-STD-202, Method 108, for 2000 hours, at 125°C.
200% WVDC applied.
ELECTRICAL AND MECHANICAL
SPECIFICATIONS
DISSIPATION FACTOR (DF): 2.5% max. @ 1 KHz
TEMPERATURE COEFFICIENT OF CAPACITANCE (TCC):
±15% maximum (-55°C to +125°C)
INSULATION RESISTANCE (IR):
510 pF to 0.01 MFd:
104Megohms min. @ +25°C at rated WVDC.
103Megohms min. @ +125°C at rated WVDC.
WORKING V OLTA GE (WVDC):
See Capacitance Values Table, page 2.
DIELECTRIC WITHSTANDING V OL TA GE (D WV):
Case A: 250% of rated WVDC for 5 secs. (125 VDC)
AGING EFFECTS: 3% maximum per decade hour.
PIEZOELECTRIC EFFECTS: Negligible
DIELECTRIC ABSORPTION: 2% typical
OPERA TING TEMPERATURE RANGE:
From -55°C to +125°C (No derating of working voltage).
TERMINATION STYLES: Available in various surface mount
styles. See Mechanical Configurations, page 3.
TERMINAL STRENGTH: Ter minations for chips and pellets
withstand a pull of 5 lbs. min., 10 lbs. typical, for 5 seconds in direc-
tion per pendicular to the ter mination surface of the capacitor. Test
per MIL-STD-202, method 211.