HIGH SPEED SWITCHING PNP SILICON BIPOLAR TRANSISTOR 2N4209C1A & 2N4209C1B * Hermetic Ceramic Surface Mount Package (SOT23 Compatible) * Silicon Planar Epitaxial PNP Transistor * High Speed low Saturation Switching * Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25C unless otherwise stated) VCBO VCEO VEBO IC PD TJ Tstg Collector - Base Voltage Collector - Emitter Voltage Emitter - Base Voltage Continuous Collector Current TA = 25C Total Power Dissipation at Derate Above 25C Junction Temperature Range Storage Temperature Range -15V -15V -4.5V -50mA 360mW 2.05mW/C -65 to +200C -65 to +200C THERMAL PROPERTIES Symbol Parameter Max Units RJA Thermal Resistance Junction to Ambient 250 C/W RJSP(IN) Thermal Resistance, Junction To Solder Pads TSP = 25C 160 C/W Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9422 Issue 3 Page 1 of 5 HIGH SPEED SWITCHING PNP SILICON BIPOLAR TRANSISTOR 2N4209C1A & 2N4209C1B ELECTRICAL CHARACTERISTICS (TA = 25C unless otherwise stated) Symbols (1) Parameters Test Conditions Min V(BR)CEO Collector-Emitter Breakdown Voltage IC = -3mA -15 V(BR)CES Collector-Emitter Breakdown Voltage IC = -100A -15 ICES Collector-Emitter Cut-Off Current IEBO Emitter Cut-Off Current ICBO Collector Cut-Off Current hFE (1) Forward-current transfer ratio (1) VCE(sat) VBE(sat) Collector-Emitter Saturation Voltage Base-Emitter Saturation Voltage Typ Max Units V -10 nA TA = 125C -5.0 A VEB = -4.5V -10 A VEB = -3.5V -10 nA VCB = -15V IE = 0 -10 A IC = -1.0mA VCE = -0.5V 35 IC = -10mA VCE = -0.3V 50 120 VCE = -1.0V 55 125 TA = -55C 25 IC = -50mA VCE = -1.0V 40 IC = -1.0mA IB = -0.1mA -0.07 -0.15 IC = -10mA IB = -1.0mA -0.12 -0.18 IC = -50mA IB = -5.0mA -0.29 -0.60 IC = -1.0mA IB = -0.1mA IC = -10mA IB = -1.0mA IC = -50mA IB = -5.0mA IC = -10mA VCE = -10V VCE = -10V IC = -10mA V -0.80 -0.70 -0.95 V -1.50 DYNAMIC CHARACTERISTICS | hfe | Small signal forward current transfer ratio Cobo Output Capacitance f = 1.0MHz VCB = -5.0V IE = 0 3.0 Cibo Input Capacitance f = 1.0MHz VBE = 0.5V IC = 0 3.5 ton Turn-On Time VCC = -3V IC = -10mA 15 toff Turn-Off Time td Turn-On Delay Time tr Rise Time f = 100MHz 8.5 20 IB = -1.0mA 10 pF ns 15 Notes (1) Pulse Width < 380s, Duty Cycle <2% Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9422 Issue 3 Page 2 of 5 HIGH SPEED SWITCHING PNP SILICON BIPOLAR TRANSISTOR 2N4209C1A & 2N4209C1B DC Current Gain 1000 hFE, DC Current Gain Voltage (V) "ON" " Voltage 2 1.8 1.6 1.4 1.2 1 0.8 0.6 TA = 25C 0.4 0.2 0 0.001 0.01 100 10 VCE = 1V 1 0.1 1 1 10 IC Collector Current (mA) VCESAT 25C 150C VBESAT Forward Current Transfer Ratio Capacitance (pF) TA = 25C 1 1 Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com 100C -55C 100 10 10 VR, Reverse Voltage (V) CIBO 75C 200C Forward Current Transfer Ratio 10 0.1 1000 IC, Collector Current (mA) Capacitance 0.01 100 COBO Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com VCE = 10V TA = 25C 1 1 10 100 IC, Collector Current (mA) |hfe| Document Number 9422 Issue 3 Page 3 of 5 HIGH SPEED SWITCHING PNP SILICON BIPOLAR TRANSISTOR 2N4209C1A & 2N4209C1B MECHANICAL DATA Dimensions in mm (Inches) R0.31 (0.012) 0.51 0.10 (0.02 0.004) See Package Variant Table 2 0.76 0.15 (0.03 0.006) R (0 0. .0 56 22 ) 2.54 0.13 (0.10 0.005) 4 3 1.02 0.10 (0.04 0.004) 1 1.91 0.10 (0.075 0.004) 0.31 (0.012) rad. 3.05 0.13 (0.12 0.005) 1.40 (0.055) max. LCC1 Underside View PACKAGE VARIANT TABLE Variant C1A C1B Pad 1 Base Base Pad 2 Emitter Emitter Pad 3 Collector Collector Pad 4 No Pad (3-Pins Only) Lid Contact * * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to be specified at order. Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9422 Issue 3 Page 4 of 5 HIGH SPEED SWITCHING PNP SILICON BIPOLAR TRANSISTOR SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type - See Electrical Characteristics Table Package Variant - See Mechanical Data Screening Level - See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts can be marked with approximately 8 characters on two lines and can include the cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All `Additional Options' are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 2N4209C1B part with package variant B, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 2N4209C1B-JQRS (Include quantity for flight parts) 2N4209C1B.GRPC (chargeable conformance option) 2N4209C1B.GCDE (charge for destructive parts) 2N4209C1B.GCDM (charge for destructive parts) 2N4209C1B.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries. High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9422 Issue 3 Page 5 of 5