2N4209C1A - Semelab - Datasheet.Live

HIGH SPEED SWITCHING PNP

SILICON BIPOLAR TRANSISTOR

Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.

Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However

Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to

verify that datasheets are current before placing an order.

Semelab Limited

Semelab LimitedSemelab Limited

Semelab Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9422

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 3

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Page 1 of 5

2N4209C1A & 2N4209C1B

• Hermetic Ceramic Surface Mount Package (SOT23 Compatible)

• Silicon Planar Epitaxial PNP Transistor

• High Speed low Saturation Switching

•

Space Level and High-Reliability Screening Options Available

ABSOLUTE MAXIMUM RATINGS

(TA = 25°C unless otherwise stated)

VCBO Collector – Base Voltage -15V

VCEO Collector – Emitter Voltage -15V

VEBO Emitter – Base Voltage -4.5V

IC Continuous Collector Current -50mA

PD Total Power Dissipation at TA = 25°C 360mW

Derate Above 25°C 2.05mW/°C

TJ Junction Temperature Range -65 to +200°C

Tstg Storage Temperature Range -65 to +200°C

THERMAL PROPERTIES

Symbol Parameter Max Units

RθJA Thermal Resistance Junction to Ambient 250 °C/W

RθJSP(IN) Thermal Resistance, Junction To Solder Pads TSP = 25°C 160 °C/W

HIGH SPEED SWITCHING PNP

SILICON BIPOLAR TRANSISTOR

2N4209C1A & 2N4209C1B

Semelab Limited

Semelab LimitedSemelab Limited

Semelab Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9422

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 3

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Website: http://www.semelab-tt.com

Page 2 of 5

ELECTRICAL CHARACTERISTICS

(TA = 25°C unless otherwise stated)

Symbols Parameters Test Conditions Min Typ Max Units

V(BR)CEO

(1)

Collector-Emitter Breakdown Voltage IC = -3mA -15

V(BR)CES Collector-Emitter Breakdown Voltage IC = -100µA -15

ICES Collector-Emitter Cut-Off Current VCE = -10V

-10 nA

TA = 125°C

-5.0 µA

IEBO

Emitter Cut-Off Current

VEB = -4.5V

-10 µA

VEB = -3.5V

-10 nA

ICBO Collector Cut-Off Current VCB = -15V IE = 0

-10 µA

hFE

(1)

Forward-current transfer ratio

IC = -1.0mA VCE = -0.5V 35

IC = -10mA VCE = -0.3V 50

120

IC = -10mA

VCE = -1.0V 55

125

TA = -55°C 25

IC = -50mA

VCE = -1.0V 40

VCE(sat)

(1)

Collector-Emitter Saturation Voltage

IC = -1.0mA IB = -0.1mA -0.07 -0.15

IC = -10mA IB = -1.0mA -0.12 -0.18

IC = -50mA IB = -5.0mA

-0.29 -0.60

VBE(sat) Base-Emitter Saturation Voltage

IC = -1.0mA IB = -0.1mA -0.80

IC = -10mA IB = -1.0mA -0.70 -0.95

IC = -50mA IB = -5.0mA -1.50

DYNAMIC CHARACTERISTICS

| hfe |

Small signal forward current

transfer ratio

IC = -10mA VCE = -10V

8.5

f = 100MHz

Cobo Output Capacitance f = 1.0MHz VCB = -5.0V IE = 0

3.0 pF

Cibo Input Capacitance f = 1.0MHz VBE = 0.5V IC = 0

3.5

ton Turn-On Time VCC = -3V IC = -10mA

toff Turn-Off Time

IB = -1.0mA

td Turn-On Delay Time

tr Rise Time

Notes

NotesNotes

Notes

(1) Pulse Width < 380µs, Duty Cycle <2%

HIGH SPEED SWITCHING PNP

SILICON BIPOLAR TRANSISTOR

2N4209C1A & 2N4209C1B

Semelab Limited

Semelab LimitedSemelab Limited

Semelab Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9422

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 3

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Page 3 of 5

0.2

0.4

0.6

0.8

1.2

1.4

1.6

1.8

0.001 0.01 0.1 1

Voltage (V)

ICCollector Current (mA)

"ON"

"Voltage

VCESAT VBESAT

100

1000

1 10 100 1000

hFE, DC Current Gain

IC, Collector Current (mA)

DC Current Gain

25°C 75°C 100°C

150°C 200°C -55°C

0.01 0.1 1 10

Capacitance (pF)

VR, Reverse Voltage (V)

Capacitance

CIBO COBO

100

1 10 100

Forward Current Transfer Ratio

IC, Collector Current (mA)

Forward Current Transfer Ratio

|hfe|

= 1V

VCE = 10V

= 25°C

HIGH SPEED SWITCHING PNP

SILICON BIPOLAR TRANSISTOR

2N4209C1A & 2N4209C1B

Semelab Limited

Semelab LimitedSemelab Limited

Semelab Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9422

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 3

Email: sales@semelab-tt.com

Website: http://www.semelab-tt.com

Page 4 of 5

MECHANICAL DATA

Dimensions in mm (Inches)

LCC1

Underside View

PACKAGE VARIANT TABLE

Variant Pad 1 Pad 2 Pad 3 Pad 4

C1A Base Emitter Collector No Pad (3-Pins Only)

C1B Base Emitter Collector Lid Contact *

* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep

dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to

be specified at order.

2 1

0.51 ± 0.10

(0.02 ± 0.004)

1.91 ± 0.10

(0.075 ± 0.004)

3.05 ± 0.13

(0.12 ± 0.005)

2.54 ± 0.13

(0.10 ± 0.005)

0.76 ± 0.15

(0.03 ± 0.006)

1.40

(0.055)

max.

0.31

(0.012)rad.

1.02 ± 0.10

(0.04 ± 0.004)

R0.56

(0.022)

R0.31

(0.012)

See

Package

Variant

Table

HIGH SPEED SWITCHING PNP

SILICON BIPOLAR TRANSISTOR

Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.

Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However

Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to

verify that datasheets are current before placing an order.

Semelab Limited

Semelab LimitedSemelab Limited

Semelab Limited

Coventry Road, Lutterworth, Leicestershire, LE17 4JB

Document Number 9422

Telephone +44 (0) 1455 556565

Fax +44 (0) 1455 552612

Issue 3

Email: sales@semelab-tt.com

Website: http://www.semelab-tt.com

Page 5 of 5

SCREENING OPTIONS

Space Level (JQRS/ESA) and High Reliability options are

available in accordance with the High Reliability and

Screening Options Handbook available for download from

the from the TT electronics Semelab web site.

ESA Quality Level Products are based on the testing

procedures specified in the generic ESCC 5000 and in the

corresponding part detail specifications.

Semelabs QR216 and QR217 processing specifications

(JQRS), in conjunction with the companies ISO 9001:2000

approval present a viable alternative to the American MIL-

PRF-19500 space level processing.

QR217 (Space Level Quality Conformance) is based on the

quality conformance inspection requirements of MIL-PRF-

19500 groups A (table V), B (table VIa), C (table VII) and

also ESA / ESCC 5000 (chart F4) lot validation tests.

QR216 (Space Level Screening) is based on the screening

requirements of MIL-PRF-19500 (table IV) and also ESA

/ESCC 5000 (chart F3).

JQRS parts are processed to the device data sheet and

screened to QR216 with conformance testing to Q217

groups A and B in accordance with MIL-STD-750 methods

and procedures.

Additional conformance options are available, for example

Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.

These are chargeable and must be specified at the order

stage (See Ordering Information). Minimum order

quantities may apply.

Alternative or additional customer specific conformance or

screening requirements would be considered. Contact

Semelab sales with enquires.

MARKING DETAILS

Parts can be marked with approximately 8 characters on

two lines and can include the cathode identification.

Typical marking would include part or specification number,

week of seal or serial number subject to available space and

legibility.

Customer specific marking requirements can be arranged at

the time of order.

Example Marking:

ORDERING INFORMATION

Part numbers are built up from Type, Package Variant, and

screening level. The part numbers are extended to include

the additional options as shown below.

Type – See Electrical Characteristics Table

Package Variant – See Mechanical Data

Screening Level – See Screening Options (ESA / JQRS)

Additional Options:

Customer Pre-Cap Visual Inspection .CVP

Customer Buy-Off visit .CVB

Data Pack .DA

Solderability Samples .SS

Scanning Electron Microscopy .SEM

Radiography (X-ray) .XRAY

Total Dose Radiation Test .RAD

MIL-PRF-19500 (QR217)

Group B charge .GRPB

Group B destructive mechanical samples .GBDM (12 pieces)

Group C charge .GRPC

Group C destructive electrical samples .GCDE (12 pieces)

Group C destructive mechanical samples .GCDM (6 pieces)

ESA/ESCC

Lot Validation Testing (subgroup 1) charge .LVT1

LVT1 destructive samples (environmental) .L1DE (15 pieces)

LVT1 destructive samples (mechanical) .L1DM (15 pieces)

Lot Validation Testing (subgroup 2) charge .LVT2

LVT2 endurance samples (electrical) .L2D (15 pieces)

Lot Validation Testing (subgroup 3) charge .LVT3

LVT3 destructive samples (mechanical) .L3D (5 pieces)

Additional Option Notes:

1) All ‘Additional Options’ are chargeable and must be specified at order stage.

2) When Group B,C or LVT is required, additional electrical and mechanical destructive

samples must be ordered

3) All destructive samples are marked the same as other production parts unless

otherwise requested.

Example ordering information:

The following example is for the 2N4209C1B part with

package variant B, JQRS screening, additional Group C

conformance testing and a Data pack.

Part Numbers:

2N4209C1B-JQRS

(Include quantity for flight parts)

2N4209C1B.GRPC

(chargeable conformance option)

2N4209C1B.GCDE

(charge for destructive parts)

2N4209C1B.GCDM

(charge for destructive parts)

2N4209C1B.DA

(charge for Data pack)

Customers with any specific requirements (e.g. marking or

screening) may be supplied with a similar alternative part

number (there is maximum 20 character limit to part

numbers). Contact Semelab sales with enquiries.

High Reliability and Screening Options Handbook link:

http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf