2
RF Device Data
Freescale Semiconductor, Inc.
AFT26H250W03SR6 AFT26H250--24SR6
Table 1. Maximum Ratings
Rating Symbol Value Unit
Drain--Source Voltage VDSS --0.5, +65 Vdc
Gate--Source Voltage VGS --6.0, +10 Vdc
Operating Voltage VDD 32, +0 Vdc
Storage Temperature Range Tstg --65 to +150 C
Case Operating Temperature Range AFT26H250W03S
AFT26H250--24S
TC--40 to +125
--40 to +150
C
Operating Junction Temperature Range (1,2) TJ--40 to +225 C
CW Operation @ TC=25C
Derate above 25C
CW 294
1.7
W
W/C
Table 2. Thermal Characteristics
Characteristic Symbol Value (2,3) Unit
Thermal Resistance, Junction to Case
Case Temperature 78C, 50 W--CDMA, 28 Vdc, IDQA = 700 mA, VGSB = 0.4 Vdc, 2590 MHz
RJC 0.42 C/W
Table 3. ESD Protection Characteristics
Test Methodology Class
Human Body Model (per JESD22--A114) 2
Machine Model (per EIA/JESD22--A115) B
Charge Device Model (per JESD22--C101) IV
Table 4. Electrical Characteristics (TA=25C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
Off Characteristics
Zero Gate Voltage Drain Leakage Current AFT26H250W03S (4,5)
(VDS =65Vdc,V
GS = 0 Vdc) AFT26H250--24S (6)
IDSS — — 10 Adc
Zero Gate Voltage Drain Leakage Current AFT26H250W03S (4,5)
(VDS =28Vdc,V
GS = 0 Vdc) AFT26H250--24S (6)
IDSS —
—
—
—
5
1
Adc
Gate--Source Leakage Current AFT26H250W03S (4,5)
(VGS =5Vdc,V
DS = 0 Vdc) AFT26H250--24S (6)
IGSS — — 1 Adc
On Characteristics -- Side A (Carrier)
Gate Threshold Voltage AFT26H250W03S (4,6)
(VDS =10Vdc,I
D= 140 Adc) AFT26H250--24S (6)
VGS(th) 0.8 1.2 1.6 Vdc
Gate Quiescent Voltage AFT26H250W03S (4,6)
(VDD =28Vdc,I
DA = 700 mAdc, AFT26H250--24S (6)
Measured in Functional Test)
VGS(Q) 1.4 1.8 2.2 Vdc
Drain--Source On--Voltage AFT26H250W03S (4,6)
(VGS =6Vdc,I
D= 1.4 Adc) AFT26H250--24S (6)
VDS(on) 0.1 0.15 0.3 Vdc
On Characteristics -- Side B (Peaking)
Gate Threshold Voltage AFT26H250W03S (4,6)
(VDS =10Vdc,I
D= 200 Adc) AFT26H250--24S (6)
VGS(th) 0.8 1.2 1.6 Vdc
Drain--Source On--Voltage AFT26H250W03S (4,6)
(VGS =6Vdc,I
D= 2.0 Adc) AFT26H250--24S (6)
VDS(on) 0.1 0.15 0.3 Vdc
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
4. VDDA and VDDB must be tied together and powered by a single DC power supply.
5. Side A and Side B are tied together for these measurements.
6. Each side of device measure separately.
(continued)