Features
•Fast Read Access Time – 70 ns
•5-volt Only Reprogramming
•Sector Program Operation
– Single Cycle Reprogram (Erase and Program)
– 512 Sectors (128 Bytes/Sector)
– Internal Address and Data Latches for 128 Bytes
•Internal Program Control and Timer
•Hardware and Software Data Protection
•Fast Sector Program Cycle Time – 10 ms
•DATA Polling for End of Program Detection
•Low Power Dissipation
– 50 mA Active Current
– 300 µA CMOS Standby Current
•Typical Endurance > 10,000 Cycles
•Single 5V ± 10% Supply
•CMOS and TTL Compatible Inputs and Outputs
•Green (Pb/Halide-free) Packaging Option
1. Description
The AT29C512 is a 5-volt only in-system Flash programmable and erasable read only
memory (PEROM). Its 512K of memory is organized as 65,536 words by 8 bits. Man-
ufactured with Atmel’s advanced nonvolatile CMOS technology, the device offers
access times to 70 ns with power dissipation of just 275 mW over the industrial tem-
perature range. When the device is deselected, the CMOS standby current is less
than 300µA. The device endurance is such that any sector can typically be written to
in excess of 10,000 times.
To allow for simple in-system reprogrammability, the AT29C512 does not require high
input voltages for programming. Five-volt-only commands determine the operation of
the device. Reading data out of the device is similar to reading from an EPROM.
Reprogramming the AT29C512 is performed on a sector basis; 128 bytes of data are
loaded into the device and then simultaneously programmed.
During a reprogram cycle, the address locations and 128 bytes of data are internally
latched, freeing the address and data bus for other operations. Following the initiation
of a program cycle, the device will automatically erase the sector and then program
the latched data using an internal control timer. The end of a program cycle can be
detected by DATA polling of I/O7. Once the end of a program cycle has been
detected, a new access for a read or program can begin.
512K (64K x 8)
5-volt Only
Flash Memory
AT29C512
0456i–FLASH–9/08
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0456i–FLASH–9/08
AT29C512
2. Pin Configurations
2.1 32-lead PLCC Top View
2.2 32-lead TSOP (Type 1) Top View
Pin Name Function
A0 - A15 Addresses
CE Chip Enable
OE Output Enable
WE Write Enable
I/O0 - I/O7 Data Inputs/Outputs
NC No Connect
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
A14
A13
A8
A9
A11
OE
A10
CE
I/O7
4
3
2
1
32
31
30
14
15
16
17
18
19
20
I/O1
I/O2
GND
I/O3
I/O4
I/O5
I/O6
A12
A15
NC
NC
VCC
WE
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A11
A9
A8
A13
A14
NC
WE
VCC
NC
NC
A15
A12
A7
A6
A5
A4
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
A3
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0456i–FLASH–9/08
AT29C512
3. Block Diagram
4. Device Operation
4.1 Read
The AT29C512 is accessed like an EPROM. When CE and OE are low and WE is high, the data
stored at the memory location determined by the address pins is asserted on the outputs. The
outputs are put in the high impedance state whenever CEorOE is high. This dual-line control
gives designers flexibility in preventing bus contention.
4.2 Byte Load
Byte loads are used to enter the 128 bytes of a sector to be programmed or the software codes
for data protection. A byte load is performed by applying a low pulse on the WE or CE input with
CEorWE low (respectively) and OE high. The address is latched on the falling edge of CEor
WE, whichever occurs last. The data is latched by the first rising edge of CE or WE.
4.3 Program
The device is reprogrammed on a sector basis. If a byte of data within a sector is to be changed,
data for the entire sector must be loaded into the device. Any byte that is not loaded during the
programming of its sector will be indeterminate. Once the bytes of a sector are loaded into the
device, they are simultaneously programmed during the internal programming period. After the
first data byte has been loaded into the device, successive bytes are entered in the same man-
ner. Each new byte to be programmed must have its high-to-low transition on WE (or CE) within
150 µs of the low-to-high transition of WE(orCE) of the preceding byte. If a high-to-low transi-
tion is not detected within 150 µs of the last low-to-high transition, the load period will end and
the internal programming period will start. A7 to A15 specify the sector address. The sector
address must be valid during each high-to-low transition of WE (or CE). A0 to A6 specify the
byte address within the sector. The bytes may be loaded in any order; sequential loading is not
required. Once a programming operation has been initiated, and for the duration of tWC, a read
operation will effectively be a polling operation.
4
0456i–FLASH–9/08
AT29C512
4.4 Software Data Protection
A software controlled data protection feature is available on the AT29C512. Once the software
protection is enabled a software algorithm must be issued to the device before a program may
be performed. The software protection feature may be enabled or disabled by the user; when
shipped from Atmel, the software data protection feature is disabled. To enable the software
data protection, a series of three program commands to specific addresses with specific data
must be performed. After the software data protection is enabled the same three program com-
mands must begin each program cycle in order for the programs to occur. All software program
commands must obey the sector program timing specifications. Once set, the software data pro-
tection feature remains active unless its disable command is issued. Power transitions will not
reset the software data protection feature; however, the software feature will guard against inad-
vertent program cycles during power transitions.
Once set, software data protection will remain active unless the disable command sequence is
issued.
After setting SDP, any attempt to write to the device without the 3-byte command sequence will
start the internal write timers. No data will be written to the device; however, for the duration of
tWC, a read operation will effectively be a polling operation.
After the software data protection’s 3-byte command code is given, a byte load is performed by
applying a low pulse on the WE or CE input with CE or WE low (respectively) and OE high. The
address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by
the first rising edge of CE or WE. The 128 bytes of data must be loaded into each sector by the
same procedure as outlined in the program section under device operation.
4.5 Hardware Data Protection
Hardware features protect against inadvertent programs to the AT29C512 in the following ways:
(a) VCC sense – if VCC is below 3.8V (typical), the program function is inhibited; (b) VCC power on
delay – once VCC has reached the VCC sense level, the device will automatically time out 5 ms
(typical) before programming; (c) Program inhibit – holding any one of OE low, CE high or WE
high inhibits program cycles; and (d) Noise filter – pulses of less than 15 ns (typical) on the WE
or CE inputs will not initiate a program cycle.
4.6 Product Identification
The product identification mode identifies the device and manufacturer as Atmel. It may be
accessed by hardware or software operation. The hardware operation mode can be used by an
external programmer to identify the correct programming algorithm for the Atmel product. In
addition, users may wish to use the software product identification mode to identify the part (i.e.,
using the device code), and have the system software use the appropriate sector size for pro-
gram operations. In this manner, the user can have a common board design for 256K to 4-
megabit densities and, with each density’s sector size in a memory map, have the system soft-
ware apply the appropriate sector size.
For details, see Operating Modes (for hardware operation) or Software Product Identification.
The manufacturer and device code is the same for both modes.
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0456i–FLASH–9/08
AT29C512
4.7 DATA Polling
The AT29C512 features DATA polling to indicate the end of a program cycle. During a program
cycle an attempted read of the last byte loaded will result in the complement of the loaded data
on I/O7. Once the program cycle has been completed, true data is valid on all outputs and the
next cycle may begin. DATA polling may begin at any time during the program cycle.
4.8 Toggle Bit
In addition to DATA polling the AT29C512 provides another method for determining the end of a
program or erase cycle. During a program or erase operation, successive attempts to read data
from the device will result in I/O6 toggling between one and zero. Once the program cycle has
completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin
at any time during a program cycle.
4.9 Optional Chip Erase Mode
The entire device can be erased by using a 6-byte software code. Please see Software Chip
Erase application note for details.
5. Absolute Maximum Ratings*
Temperature Under Bias ............................... -55C to +125C*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Storage Temperature..................................... -65C to +150C
All Input Voltages
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to VCC + 0.6V
Voltage on OE
with Respect to Ground ...................................-0.6V to +13.5V
6
0456i–FLASH–9/08
AT29C512
Notes: 1. X can be VIL or VIH.
2. Refer to AC Programming Waveforms.
3. VH= 12.0V ± 0.5V.
4. Manufacturer Code: 1F, Device Code: 5D.
5. See details under Software Product Identification Entry/Exit.
6. DC and AC Operating Range
AT29C512-70 AT29C512-90
Operating
Temperature (Case) Industrial -40C-85C -40C-85C
VCC Power Supply 5V±5% 5V± 10%
7. Operating Modes
Mode CE OE WE Ai I/O
Read VIL VIL VIH Ai DOUT
Program(2) VIL VIH VIL Ai DIN
5V Chip Erase VIL VIH VIL Ai
Standby/Write Inhibit VIH X(1) X X High Z
Program Inhibit X X VIH
Program Inhibit X VIL X
Output Disable X VIH X High Z
Product Identification
Hardware VIL VIL VIH
A1 - A15 = VIL,A9=V
H,(3) A0 = VIL Manufacturer Code(4)
A1-A15 = VIL,A9=V
H,(3) A0 = VIH Device Code(4)
Software(5) A0 = VIL Manufacturer Code(4)
A0 = VIH Device Code(4)
8. DC Characteristics
Symbol Parameter Condition Min Max Units
ILI Input Load Current VIN =0VtoV
CC 10 µA
ILO Output Leakage Current VI/O =0VtoV
CC 10 µA
ISB1 VCC Standby Current CMOS CE = VCC - 0.3V to VCC 300 µA
ISB2 VCC Standby Current TTL CE = 2.0V to VCC 3mA
ICC VCC Active Current f = 5 MHz; IOUT =0mA 50 mA
VIL Input Low Voltage 0.8 V
VIH Input High Voltage 2.0 V
VOL Output Low Voltage IOL = 2.1 mA 0.45 V
VOH1 Output High Voltage IOH = -400 µA 2.4 V
VOH2 Output High Voltage CMOS IOH = -100 µA; VCC = 4.5V 4.2 V
7
0456i–FLASH–9/08
AT29C512
10. AC Read Waveforms(1)(2)(3)(4)
Notes: 1. CE may be delayed up to tACC -t
CE after the address transition without impact on tACC.
2. OE may be delayed up to tCE -t
OE after the falling edge of CE without impact on tCE or by tACC -t
OE after an address change
without impact on tACC.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
9. AC Read Characteristics
Symbol Parameter
AT29C512-70 AT29C512-90
UnitsMin Max Min Max
tACC Address to Output Delay 70 90 ns
tCE(1) CE to Output Delay 70 90 ns
tOE(2) OE to Output Delay 0 35 0 40 ns
tDF(3)(4) CE or OE to Output Float 0 10 0 25 ns
tOH
Output Hold from OE, CE or Address,
whichever occurred first 00ns
8
0456i–FLASH–9/08
AT29C512
11. Input Test Waveforms and Measurement Level
12. Output Test Load
Note: 1. This parameter is characterized and is not 100% tested.
tR,t
F<5ns
OUTPUT
PIN
5.0V
30pF
1.8K
1.3K
OUTPUT
PIN
5.0V
100pF
1.8K
1.3K
70 ns 90/120/150 ns
13. Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol Typ Max Units Conditions
CIN 4 6 pF VIN =0V
COUT 812pFV
OUT =0V
9
0456i–FLASH–9/08
AT29C512
15. AC Byte Load Waveforms
15.1 WE Controlled
15.2 CE Controlled
14. AC Byte Load Characteristics
Symbol Parameter Min Max Units
tAS,t
OES Address, OE Set-up Time 0 ns
tAH Address Hold Time 50 ns
tCS Chip Select Set-up Time 0 ns
tCH Chip Select Hold Time 0 ns
tWP Write Pulse Width (WE or CE) 90 ns
tDS Data Set-up Time 35 ns
tDH,t
OEH Data, OE Hold Time 0 ns
tWPH Write Pulse Width High 100 ns
tDH
t
DS
tAS tAH
tWP
CE
ADDRESS
DATA IN
OE tOES tOEH
WE
tCS
tCH
tWPH
tDH
tDS
tAS tAH
tWP
WE
ADDRESS
DATA IN
OE tOES tOEH
CE
tCS
tCH
tWPH
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0456i–FLASH–9/08
AT29C512
17. Program Cycle Waveforms(1)(2)(3)
Notes: 1. A7 through A15 must specify the sector address during each high-to-low transition of WE (or CE).
2. OE must be high when WE and CE are both low.
3. All bytes that are not loaded within the sector being programmed will be indeterminate.
16. Program Cycle Characteristics
Symbol Parameter Min Max Units
tWC Write Cycle Time 10 ms
tAS Address Set-up Time 0 ns
tAH Address Hold Time 50 ns
tDS Data Set-up Time 35 ns
tDH Data Hold Time 0 ns
tWP Write Pulse Width 90 ns
tBLC Byte Load Cycle Time 150 µs
tWPH Write Pulse Width High 100 ns
A0-A6
A7-A5
127
126
11
0456i–FLASH–9/08
AT29C512
18. Software Data Protection
Enable Algorithm(1)
Notes: 1. Data Format: I/O7 - I/O0 (Hex);Address Format: A14
- A0 (Hex).
2. Data Protect state will be activated at end of program
cycle.
3. Data Protect state will be deactivated at end of pro-
gram period.
4. 128 bytes of data MUST BE loaded.
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
LOAD DATA
TO
SECTOR (128 BYTES)
(4)
WRITES ENABLED
ENTER DATA
PROTECT STATE
(2)
19. Software Data Protection
Disable Algorithm(1)
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 80
TO
ADDRESS 5555
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 20
TO
ADDRESS 5555
LOAD DATA
TO
SECTOR (128 BYTES)
(4)
EXIT DATA
PROTECT STATE
(3)
20. Software Protected Program Cycle Waveform(1)(2)(3)
Notes: 1. A7 through A15 must specify the sector address during each high-to-low transition of WE (or CE) after the software code has
been entered.
2. OE must be high when WE and CE are both low.
3. All bytes that are not loaded within the sector being programmed will be indeterminate.
OE
(1)
CE
WE
DATA
(3)
BYTE 0 BYTE 126 BYTE 127
tDH
tBLC
tDS
tWP
tWPH
tAH
A0-A6
A7-A15
(2)
t
WC
5555 2AAA 5555
AA 55 A0
t
AS
SECTOR ADDRESS
BYTE ADDRESS
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0456i–FLASH–9/08
AT29C512
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in AC Read Characteristics.
22. Data Polling Waveforms
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in AC Read Characteristics.
24. Toggle Bit Waveforms(1)(2)(3)
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
21. Data Polling Characteristics(1)
Symbol Parameter Min Typ Max Units
tDH Data Hold Time 10 ns
tOEH OE Hold Time 10 ns
tOE OE to Output Delay(2) ns
tWR Write Recovery Time 0 ns
23. Toggle Bit Characteristics(1)
Symbol Parameter Min Typ Max Units
tDH Data Hold Time 10 ns
tOEH OE Hold Time 10 ns
tOE OE to Output Delay(2) ns
tOEHP OE High Pulse 150 ns
tWR Write Recovery Time 0 ns
WE
CE
OE
I/O6(2)
tOEH
HIGH Z
tDH tOE tWR
13
0456i–FLASH–9/08
AT29C512
25. Software Product Identification Entry(1)
26. Software Product Identification Exit(1)
Notes: 1. Data Format: I/O7 - I/O0 (Hex); Address Format: A14 - A0 (Hex).
2. A1 - A15 = VIL. Manufacturer Code is read for A0 = VIL; Device Code is read for A0 = VIH.
3. The device does not remain in identification mode if powered down.
4. The device returns to standard operation mode.
5. Manufacturer Code is 1F. The Device Code is 5D.
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 90
TO
ADDRESS 5555
PAUSE 10 mS ENTER PRODUCT
IDENTIFICATION
MODE(2)(3)(5)
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA F0
TO
ADDRESS 5555
PAUSE 10 mS EXIT PRODUCT
IDENTIFICATION
MODE
(4)
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0456i–FLASH–9/08
AT29C512
27. Normalized ICC Graphs
NORMALI ED SUPPLY CURRENT
vs. TEMPERATURE
TEMPERATURE (C)
-55
1.4
1.3
1.2
1.1
1.0
0.8
0.9
-25 5 35 65 95 125
N
O
R
M
A
L
I
E
D
I
C
C
NORMALI ED SUPPLY CURRENT
vs. ADDRESS FREQUENCY
FREQUENCY (MHz)
0
1.1
1.0
0.9
0.8
0.7 1234567
N
O
R
M
A
L
I
E
D
I
C
C
V
CC
=5V
T = 25C
NORMALI ED SUPPLY CURRENT
vs. SUPPLY VOLTAGE
SUPPLY VOLTAGE (V)
4.50
1.4
1.2
1.0
0.8
0.6
4.75 5.00 5.25 5.50
N
O
R
M
A
L
I
E
D
I
C
C
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0456i–FLASH–9/08
AT29C512
28. Ordering Information
28.1 Green Package Option (Pb/Halide-free)
tACC
(ns)
ICC (mA)
Ordering Code Package Operation RangeActive Standby
70 50 03 AT29C512-70JU
AT29C512-70TU
32J
32T Industrial
(-40to 85C)
90 50 0.3 AT29C512-90JU
AT29C512-90TU
32J
32T
Package Type
32J 32-lead, Plastic J-leaded Chip Carrier (PLCC)
32T 32-lead, Thin Small Outline Package (TSOP)
16
0456i–FLASH–9/08
AT29C512
29. Packaging Information
29.1 32J – PLCC
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
R
TITLE
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC) B
32J
10/04/01
1.14(0.045) X 45 PIN NO. 1
IDENTIFIER
1.14(0.045) X 45
0.51(0.020)MAX
0.318(0.0125)
0.191(0.0075)
A2
45 MAX (3X)
A
A1
B1 E2
B
e
E1 E
D1
D
D2
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes: 1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010 (0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004 (0.102 mm) maximum.
A 3.175 – 3.556
A1 1.524 – 2.413
A2 0.381 – –
D 12.319 – 12.573
D1 11.354 – 11.506 Note 2
D2 9.906 – 10.922
E 14.859 – 15.113
E1 13.894 – 14.046 Note 2
E2 12.471 – 13.487
B 0.660 – 0.813
B1 0.330 – 0.533
e 1.270 TYP
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0456i–FLASH–9/08
AT29C512
29.2 32T – TSOP
2325 Orchard Parkway
San Jose, CA 95131
TITLE DRAWING NO.
R
REV.
32T, 32-lead (8 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP) B
32T
10/18/01
PIN 1
D1 D
Pin 1 Identifier
b
e
EA
A1
A2
0º ~ 8º c
L
GAGE PLANE
SEATING PLANE
L1
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
Notes: 1. This package conforms to JEDEC reference MO-142, Variation BD.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
A – – 1.20
A1 0.05 – 0.15
A2 0.95 1.00 1.05
D 19.80 20.00 20.20
D1 18.30 18.40 18.50 Note 2
E 7.90 8.00 8.10 Note 2
L 0.50 0.60 0.70
L1 0.25 BASIC
b 0.17 0.22 0.27
c 0.10 – 0.21
e 0.50 BASIC
0456i–FLASH–9/08
Headquarters International
Atmel Corporation
2325 Orchard Parkway
San Jose, CA 95131
USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
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Chuo-ku, Tokyo 104-0033
Japan
Tel: (81) 3-3523-3551
Fax: (81) 3-3523-7581
Product Contact
Web Site
www.atmel.com
Technical Support
Flash@atmel.com
Sales Contact
www.atmel.com/contacts
Literature Requests
www.atmel.com/literature
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