© 1999 Fairchild Semiconductor Corporation DS009973 www .fairchildsemi.com
November 1988
Revised October 1999
74AC573 • 74ACT573 Octal Latch with 3-STATE Outputs
74AC573 • 74ACT573
Octal Latch with 3-STATE Outputs
General Descript ion
The 74AC5 73 and 74A CT 57 3 ar e hi g h-s pee d octal latch es
with buffered common Latch Enable (LE) and buffered
common Output Enable (OE) inputs.
The 74AC573 and 74ACT573 are functionally identical to
the 74AC373 and 74ACT373 but with inputs and outputs
on opposite sides.
Features
ICC and IOZ reduced by 50%
Inputs and outputs on op posite sides of package allow-
ing easy interface with microprocessors
Useful as input or output port for microprocessors
Functionally identical to 74AC373 and 74ACT373
3-STATE outputs for bus interfacing
Outputs source/sink 24 mA
74ACT573 has TTL-compatible inputs
Ordering Code:
Device a ls o av ailable in Tape and R eel. Spec ify by appending s uffix let te r “X” to the or dering co de.
Logic Symbols
IEEE/IEC
Connection Diagram
Pin Descriptions
FACT is a tradem ark of F airchild Semicon ductor C orporation.
Order Number Package Number Package Description
74AC573SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS--013, 0.300” Wide Body
74AC573SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74AC573MTC MTC20 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
74AC573PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
74ACT573SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS--013, 0.300” Wide Body
74ACT573SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74ACT573MTC MTC20 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
74ACT573PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Pin Names Description
D0–D7Data Inputs
LE Latch Enable Input
OE 3-STATE Output Enable Input
O0–O73-STATE Latch Outputs
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74AC573 • 74ACT573
Functional Description
The 74 AC573 and 74ACT 573 co ntain e ight D -type latches
with 3- STATE output bu ffers. When the Latch Enable (LE)
input is HI GH, data on th e Dn inputs enters the latch es. In
this c ondition the latches are t ransparent, i.e., a latch out-
put will change state each time its D-type input changes.
When LE is LOW the latches store the information that was
present on the D-type inputs a setup time preceding the
HIGH-to-LOW transition of LE. The 3-STATE buffers are
controlled by the Output Enable (OE) input. When OE is
LOW, the buffers are ena bled. When OE is HIGH the buff-
ers are in the high impedance mode but this does not inter-
fere with entering new data into the latches.
Truth Table
H = HIGH Voltage
L = LOW Voltage
Z = High Impedance
X = Immateri al
O0 = Previo us O0 bef ore HIGH -to-LOW t ransition of Latch Enable
Logic Diagram
Pleas e note that this diagram is provided only for t he underst anding o f lo gic operat ions and sh ould not be us ed to estim ate propa gation delays.
Inputs Outputs
OE LE D On
LHH H
LHL L
LLX O
0
HXX Z
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74AC573 • 74ACT573
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, with-
out exception, to ensure that the system design is reliable over its power
supply, tempera ture, and output /input lo ading variabl es. Fair child do es not
recomm end operation of FACT circ uit s outside da t abook specificat ions.
DC Electrical Characteristics for AC
Note 2: All outpu ts loaded; t hreshol ds on input as s oc iated with outpu t un der test.
Note 3: IIN and ICC @ 3.0V are guarant eed to be les s t han or equal to the re s pective lim it @ 5. 5V VCC.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Supply Voltage (VCC)0.5 V to +7.0V
DC Input Diode Current (IIK)
VI = 0.5V 20 mA
VI = VCC + 0.5V +20 mA
DC Input Voltage (VI)0.5V to VCC + 0.5V
DC Output Diode Current (IOK)
VO = 0.5V 20 mA
VO = VCC + 0.5V +20 mA
DC Output Voltage (VO)0.5V to VCC + 0.5V
DC Output Source
or Sink Current (IO)±50 mA
DC VCC or Ground Current
per Output Pin (ICC or IGND)±50 mA
Storage Temperature (TSTG)65°C to +150°C
Junction Temperature (TJ)
(PDIP) 140°C
Supply Voltage (VCC)
AC 2.0V to 6.0V
ACT 4.5V to 5.5V
Input Voltage (VI)0V to V
CC
Output Voltage (VO)0V to V
CC
Operating Temperature (TA)40°C to +85°C
Minimum Input Edge Rate (V/t)
AC Devices
VIN from 30% to 70% of VCC
VCC @ 3.0V, 4.5V, 5.5V 125 mV/ns
ACT Devices
VIN from 0.8V to 2.0V
VCC @ 4.5V, 5.5V 125 mV/ns
Symbol Parameter VCC TA = +25°CT
A = 40°C to +85°CUnits Conditions
(V) Typ Guaranteed Limits
VIH Minimum HIGH Level 3.0 1.5 2.1 2.1 VVOUT = 0.1V
Input Voltage 4.5 2.25 3.15 3.15 or VCC 0.1V
5.5 2.75 3.85 3.85
VIL Maximum LOW Level 3.0 1.5 0.9 0.9 VVOUT = 0.1V
Input Voltage 4.5 2.25 1.35 1.35 or VCC 0.1V
5.5 2.75 1.65 1.65
VOH Minimum HIGH Level 3.0 2.99 2.9 2.9 VIOUT = 50 µA
Output Voltage 4.5 4.49 4.4 4.4
5.5 5.49 5.4 5.4
V
VIN = VIL or VIH
3.0 2.56 2.46 IOH = 12 mA
4.5 3.86 3.76 IOH = 24 mA
5.5 4.86 4.76 IOH = 24 mA (Note 2)
VOL Maximum LOW Level 3.0 0.002 0.1 0.1 VI
OUT = 50 µAOutput Voltage 4.5 0.001 0.1 0.1
5.5 0.001 0.1 0.1
V
VIN = VIL or VIH
3.0 0.36 0.44 IOL = 12 mA
4.5 0.36 0.44 IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 2)
IIN (Note 3) Maximum Input Leakage Current 5.5 ±0.1 ±1.0 µAV
I = VCC, GND
IOLD Minimum Dynamic 5.5 75 mA VOLD = 1.65V Max
IOHD Output Current (Note 4) 5.5 75 mA VOHD = 3.85V Min
ICC Maximum Quiescent 5.5 4.0 40.0 µAV
IN = VCC or GND
(Note 3) Supply Current
IOZ Maxim um 3-STATE 5.5 ±0.25 ±2.5 µAVI (OE) = VIL, VIH
Leakage Current VI = VCC, GND
VO = VCC, GND
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74AC573 • 74ACT573
AC Electrical Characteristics for AC
Note 5: Voltage Range 5.0 is 5.0V ± 0.5V
Voltage Range 3. 3 is 3. 3V ± 0.3V
AC Operating Requirements for AC
Note 6: Voltage Range 5. 0 is 5. 0V ± 0.5V
Voltage Range 3. 3 is 3. 3V ± 0.3V
VCC TA = +25°CT
A = 40°C to +85°C
Symbol Parameter (V) CL = 50 pF CL = 50 pF Units
(Note 5) Min Typ Max Min Max
tPHL Propagation Delay 3.3 0.5 8.5 10.5 2.5 11.0 ns
tPLH Dn to On5.0 1.5 5.5 7.0 1.5 7.5
tPLH Propagation Delay 3.3 2.5 8.5 12.0 2.5 12.5 ns
tPHL LE to On5.0 2.0 6.0 8.0 2.0 8.5
tPZL Output Enable Time 3.3 2.5 8.5 13.0 2.5 13.5 ns
tPZH 5.0 1.5 6.0 8.5 1.5 9.0
tPHZ Output Disable Time 3.3 1.0 9.0 14.5 1.0 15.0 ns
tPLZ 5.0 1.0 6.0 9.5 1.0 10.0
VCC TA = +25°CT
A = 40°C to +85°C
Symbol Parameter (V) CL = 50 pF CL = 50 pF Units
(Note 6) Typ Guaranteed Minimum
tSSetup Time, HIGH or LOW 3.3 0 3.0 3.0 ns
Dn to LE 5.0 0 3.0 3.0
tHHold Time, HIGH or LOW 3.3 0 1.5 1.5 ns
Dn to LE 5.0 0 1.5 1.5
tWLE Pulse Width, HIGH 3.3 2.0 4.0 4.0 ns
5.0 2.0 4.0 4.0
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74AC573 • 74ACT573
DC Electrical Characteristics for ACT
Note 7: All outpu ts loaded; t hreshol ds on input as s oc iated with outpu t un der test.
Note 8: Maximum test duration 2.0 ms, one output loaded at a time.
AC Electrical Characteristics for ACT
Note 9: Voltage Range 5. 0 is 5. 0V ± 0.5 V
Symbol Parameter VCC TA = +25°CT
A = 40°C to +85°CUnits Conditions
(V) Typ Guaranteed Limits
VIH Minimum HIGH Level 4.5 1.5 2.0 2.0 VVOUT = 0.1V
Input Voltage 5.5 1.5 2.0 2.0 or VCC 0.1V
VIL Maximum LOW Level 4.5 1.5 0.8 0.8 VVOUT = 0.1V
Input Voltage 5.5 1.5 0.8 or VCC 0.1V
VOH Minimum HIGH Level 4.5 4.49 4.4 4.4 VI
OUT = 50 µA
Output Voltage 5.5 5.49 5.4 5.4 VIN = VIL or VIH
4.5 3.86 3.76 V IOH = 24 mA
5.5 4.86 4.76 IOH = 24 mA (Note 7)
VOL Maximum LOW Level 4.5 0.001 0.1 0.1 VI
OUT = 50 µA
Output Voltage 5.5 0.001 0.1 0.1 VIN = VIL or VIH
4.5 0.36 0.44 V IOL = 24 mA
5.5 0.36 0.44 IOL = 24 mA (Note 7)
IIN Maximum Input 5.5 ±0.1 ±1.0 µAV
I = VCC, GND
Leakage Current
IOZ Maximum 3-STATE 5.5 ±0.25 ±2.5 µAVI = VIL, VIH
Leakage Current VO = VCC, GND
ICCT Maximum 5.5 0.6 1.5 mA VI = VCC 2.1V
ICC/Input
IOLD Minimum Dynamic 5.5 75 mA VOLD = 1.65V Max
IOHD Output Current (Note 8) 5.5 75 mA VOHD = 3.85V Min
ICC Maximum Quiescent 5.5 4.0 40.0 µAV
IN = VCC or GND
Supply Curre nt
VCC TA = +25°CT
A = 40°C to +85°C
Symbol Parameter (V) CL = 50 pF CL = 50 pF Units
(Note 9) Min Typ Max Min Max
tPLH Propagation Delay 5.0 2.5 6.0 10.5 2.0 12.0 ns
tPHL Dn to On
tPLH Propagation Delay 5.0 3.0 6.0 10.5 2.5 12.0 ns
LE to On
tPHL Propagation Delay 5.0 2.5 5.5 9.5 2.0 10.5 ns
LE to On
tPZH Output Enable Time 5.0 2.0 5.5 10.0 1.5 11.0 ns
tPZL Output Enable Time 5.0 1.5 5.5 9.5 1.5 10.5 ns
tPHZ Output Disable Time 5.0 2.5 6.5 11.0 1.5 12.5 ns
tPLZ Output Disable Time 5.0 1.5 5.0 8.5 1.0 9.5 ns
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74AC573 • 74ACT573
AC Operating Requirements for ACT
Note 10: Voltage Range 5.0 is 5.0V ± 0.5V
Capacitance
VCC TA = +25°CT
A = 40°C to +85°C
Symbol Parameter (V) CL = 50 pF CL = 50 pF Units
(Note 10) Typ Guaranteed Minimum
tSSetup Time, HIGH or LOW 5.0 1.5 3.0 3.5 ns
Dn to LE
tHHold Time, HIGH or LOW 5.0 1.5 0 0 ns
Dn to LE
tWLE Pulse Width, HIGH 5.0 2.0 3.5 4.0 ns
Symbol Parameter Typ Units Conditions
CIN Input Capacitance 5.0 pF VCC = OPEN
CPD Power Dissipation Capacitance for AC 25.0 pF VCC = 5.0V
for ACT 42.0
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74AC573 • 74ACT573
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
Package Number M20B
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74AC573 • 74ACT573
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Sma ll Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
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74AC573 • 74ACT573
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Packag e Num be r MTC 20
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74AC573 • 74ACT573 Octal Latch with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Package Number N20A
Fairchild does no t assume any responsibility for use of any circuitry de scribed, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life suppor t de vices o r systems a re devices or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical compon ent i n any compon ent of a life su pport
device or system whose failure to perform can be rea-
sonabl y ex pect ed to ca use the fa i lure of the life su pp ort
device or system, or to affect its safety or effectiveness.
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