2
LP0701
Supertex inc. ● 1235 Bordeaux Drive, Sunnyvale, CA 94089 ● Tel: 408-222-8888 ● www.supertex.com
Thermal Characteristics
Package
ID
(continuous)†
(mA)
ID
(pulsed)†
(A)
Power Dissipation
@TC = 25OC
(W)
θjc
(OC/W)
θja
(OC/W)
IDR
(mA)
IDRM
†
(A)
8-Lead SOIC -700 -1.25 1.5‡83 104‡-700 -1.25
TO-92 -500 -1.25 1.0 125 170 -500 -1.25
Notes:
† ID (continuous) is limited by max rated Tj.
‡ Mounted on FR4 board, 25mm x 25mm x 1.57mm
Sym Parameter Min Typ Max Units Conditions
BVDSS Drain-to-source breakdown voltage -16.5 - - V VGS = 0V, ID = -1.0mA
VGS Gate threshold voltage -0.5 -0.7 -1.0 V VGS = VDS, ID = -1.0mA
ΔVGS(th) Change in VGS(th) with temperature - - -4.0 mV/OC VGS = VDS, ID = -1.0mA
IGSS Gate body leakage - - -100 nA VGS = ±10V, VDS = 0V
IDSS Zero gate voltage drain current
- - -100 nA VDS = -15V, VGS = 0V
- - -1.0 mA VDS = 0.8 Max Rating,
VGS = 0V, TA = 125OC
ID(ON) On-state drain current
- -0.4 -
A
VGS = VDS = -2.0V
-0.6 -1.0 - VGS = VDS = -3.0V
-1.25 -2.3 - VGS = VDS = -5.0V
RDS(ON)
Static drain-to-source on-state
resistance
- 2.0 4.0
Ω
VGS = -2.0V, ID = -50mA
- 1.7 2.0 VGS = -3.0V, ID = -150mA
- 1.3 1.5 VGS = -5.0V, ID = -300mA
ΔRDS(ON) Change in RDS(ON) with temperature - - 0.75 %/OC VGS = -5.0V, ID = -300mA
GFS Forward transconductance 500 700 - mmho VGS = -15V, ID = -1.0A
CISS Input capacitance - 120 250
pF
VGS = 0V,
VDS = -15V,
f = 1.0MHz
COSS Common source output capacitance - 100 125
CRSS Reverse transfer capacitance - 40 60
td(ON) Turn-on delay time - - 20
ns
VDD = -15V,
ID = -1.25A,
RGEN = 25Ω
trRise time - - 20
td(OFF) Turn-off delay time - - 30
tfFall time - - 30
VSD Diode forward voltage drop - -1.2 -1.5 V VGS = 0V, ISD = -500mA
Notes:
All D.C. parameters 100% tested at 25OC unless otherwise stated. (Pulse test: 300µs pulse, 2% duty cycle.)
All A.C. parameters sample tested.
1.
2.
Electrical Characteristics (TA = 25°C unless otherwise specified)
90%
10%
90% 90%
10%
10%
Pulse
Generator
VDD
RL
Output
D.U.T.
t(ON)
td(ON)
t(OFF)
td(OFF) tf
trINPUT
INPUT
OUTPUT
0V
VDD
RGEN
0V
-10V
Switching Waveforms and Test Circuit