GENERAL RELEASE DOCUMENT
CONSULT FACTORY FOR CURRENT REVISION
REVISIONS
REVISION
DESCRIPTION
APPROVED
DATE
-
Initial release
Luis Vargas
5/28/2008
A
Updated part numbers
Luis Vargas
1/9/09
SPECIFICATION CONTROL DRAWING
Q-TECH CORPORATION
10150 W. JEFFERSON BLVD.
CULVER CITY, CA 90232-3510
PREPARED BY:
Luis Vargas
DATE
6/5/08
LOW PROFILE 32 PIN FLAT PACK HYBRID CRYSTAL
OSCILLATOR, TCXO, CLASS S,
Standard Design For Sine Wave up to 225 MHz
UNLESS OTHERWISE
SPECIFIED, DIMENSIONS
ARE IN INCHES.
TOLERANCES:
3 PLACE DECIMAL = .005
2 PLACE DECIMAL = .02
1 PLACE DECIMAL = .1
FRACTIONS = ± 1/16
ANGLES = 2 DEGREES
CHECKED BY:
QUALITY
DATE
DRAWING NO.:
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REVISION
A
RELEASED BY:
DOCUMENT CONTROL
APPROVED BY:
ENGINEERING
DATE
SCALE
NONE
SIZE
A
CAGE CODE
51774
SHEET 1 of 7
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
-50 -45 -40 -35 -30 -25 -20 -15 -10 -5 0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90
temp, deg C
freq error, PPM
Example 1 of Temperature Stability
Example 2 of Temperature Stability
50MHz TCXO ,Vcc=12v,+25ºC
9/17/08
-180
-170
-160
-150
-140
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
1 10 100 1000 10000 100000
Frequenc
y
Offset, HZ
L(f), dB
c
0
0.05
0.1
0.15
0.2
0.25
0.3
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
frequency drift, PPM
elapsed time, days
Aging Data
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
Sheet 2 of 7
A
1.0 SCOPE
This specification establishes the detail requirements for low profile hybrid, hermetically sealed, Sine-
Wave output temperature compensated crystal oscillators (TCXO) for use in space flight missions.
2.0 APPLICABLE DOCUMENTS
The following documents of the latest issue form a part of this drawing to the extent specified herein.
2.1 Specifications and Standards
SPECIFICATIONS
MILITARY
MIL-S-19500
Semiconductor Devices, General Specification For
MIL-PRF-55310
Crystal Oscillators, General Specification For
MIL-PRF-38535
Integrated Circuits, (Microcircuits) Manufacturing, General Specification For
MIL-PRF-38534
Hybrid Microcircuits, General Specification For
STANDARDS
MILITARY
MIL-STD-202
Test Methods for Electronic and Electrical Component Parts
MIL-STD-883
Test Methods and Procedures for Microelectronics
MIL-STD-1686
Electrostatic Discharge Control Program for Protection of Electrical and Electronics
Parts, Assemblies and Equipment.
2.2 Conflicting Requirements
In the event of conflict between requirements of this specification and other requirements of the
applicable detail drawing, the precedence in which requirements shall govern, in descending order, is
as follows:
a) Applicable Customer purchase order.
b) Applicable detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.
2.3 Customer Purchase Order Special Requirements
Additional special requirements shall be specified in the applicable Customer purchase order when
additional requirements or modifications specified herein are needed for compliance to special
program or product line requirements.
3.0 PERFORMANCE REQUIREMENTS
3.1 General Definition
The TCXO is a high reliability signal generator that provides a sine-wave output. The TCXO has been
designed to operate in a spaceflight environment with an expected lifetime in excess of 15 years.
Lifetime is defined as the sum of operational and storage environments.
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
Sheet 3 of 7
A
3.1.1 Electrical Characteristics
PARAMETER
SYMBOL
CONDITIONS
VALUE
UNIT
Frequency Nom.
Fo
-
See part number
generation table
MHz
Supply voltage, Nom.
Vs
Vs±5%
See part number
generation table
V
Input Current, max.
Is
Vs, nom. / Ta=+25°C
30
50
mA
Freq. stability vs.
temperature
(including ±5% Load
Change and ±5% Input
Voltage change)
Δf/fc (Ta)
Contact factory for other options
available
See part number
generation table
ppm
Electrical Frequency
Adjustment Min.
(when specified)
Δf/fo
(ΔVcc)
±5 PPM Two options:
1) via an external select-at-test
resistor connected from Pin 1 to
Ground
2) Via External tuning voltage
±5.0
See part number
generation table
ppm
Aging Max
Δf/fo
over 10 year (first year ≤ 1 ppm)
±5.0
ppm
Freq. stability vs.
Vacuum
Δf/fo
Met by design, not tested
±0.2
ppm
Short term stability
Δf/fc(Δt)
Δt=1sec. (Allan variance)
0.001
ppm
RF Output
Contact factory for other options
available
30 to 75
3rd
75.1 to 225
3rd X
MHz
Output level Min.
Sine Class S, 100 krads (Si) total dose
Min
See part number
generation table
dBm
Harmonics Max.
-20
-20
dBc
Sub-harmonics Max.
N/A
-20
dBc
Phase noise @ freq.
offset
£ (Δf)
£ (Δf)
£ (Δf)
£ (Δf)
£ (Δf)
Δf=10Hz
Δf=100Hz
Δf=1kHz
Δf=10kHz
Δf=100kHz
-80
-110
-135
-145
-145
Contact
factory for
options
available
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
Spurious
Under static conditions. Met by
design, not tested.
-70
dBc
3.2 Absolute Maximum Rating
Supply Voltage
0 to +16.5 VDC
DC Input Current
50 mA maximum
Storage Temperature range
-62°C to +125°C
Lead Temperature (Soldering, 10 seconds)
300°C
3.2.1 Physical Characteristics
3.2.1.1 Dimensions - The TCXO outline dimensions and terminal connections shall be as shown in Figure 1
herein.
3.2.1.2 Weight - The TCXO shall weigh less than or equal to 25 grams.
3.2.1.3 Materials - The TCXO package body and lead finish shall be gold in accordance with MIL-PRF-38534.
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
Sheet 4 of 7
A
3.2.2 Environmental Conditions
Sine Vibration
MIL-STD-202, Method 204, TC “D”
Random Vibration
MIL-STD-202, Method 214 TC “I-K” (15 minutes per axis)
Shock
MIL-STD-202, Method 213, TC “F”
Acceleration
MIL-STD-883, Method 2001, TC “A”
Altitude
50,000 feet minimum to deep space
Radiation
Radiation testing is not performed, but these TCXOs have been acceptable for
use in environments up to 100K rads by analysis of the components used. Only
bipolar semiconductors are employed. A copy of the parts list and materials
can be provided for review.
The electronics used in the TCXO shall be single event latchup free.
Electrostatic Discharge Sensitivity
The TCXO supplied to this drawing shall be considered to be electrostatic
discharge sensitive and require further protection and shall use one of the
packaging requirements in accordance with MIL-PRF-38534, Category A,
Section 5.3.2.4 Transportability.
The TCXO shall be capable of being transported by air, ship or road when
packaged in a suitable container.
3.3 Design and Construction
The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the
oscillators shall meet the design and construction requirements of MIL-PRF-55310, except element
evaluation shall be as specified in 3.3.1.
Operation
Design, Construction &
Component Screen (see 3.3.2)
MIL-PRF-55310 Class S
Workmanship
M883, Method 2017 for Class S
Screening
MIL-PRF-55310 Class S
Non-Destruct Wire Bond Pull
100%, M883, Method 2023 (2.4 grams)
Internal Visual
MIL-STD-883, methods 2017 & 2032 condition K (class S). During the time
interval between final internal visual inspection and preparation for sealing,
hybrid crystal oscillators shall be stored in a dry, controlled environment as
defined in MIL-STD-883, method 2017 or in a vacuum bake oven.
Stabilization Bake
48 hrs minimum @ +150 C M883, Method 1008 TC B
Thermal Shock
M883, Method 1011, TC A
Temperature Cycling
M883, Method 1010, TC B
Constant Acceleration
M883, Method 2001, TC A (5000 gs, Y1 Axis only)
Seal Test (fine & gross)
100% Method 1014, (TC A1 for fine leak and TC C for gross leak)
PIND
M883, Method 2020, TC B
Electrical Test
Frequency, Output levels, Input Current@ +25 C
Burn-In (Powered with load)
+125 C for 240 hours
Electrical Test
Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical Specification
Radiographic
M883, Method 2012 class S
Group A
100%
Group B (30 day Aging @ +70 C)
100%
External visual
883 Method 2009
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
Sheet 5 of 7
A
3.3.1 All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF-
38534, Class K, with the following exceptions:
Active Elements
a) Visual inspection of silicon on sapphire microcircuits. Semicircular crack(s) or multiple adjacent
cracks, not in the active area, starting and terminating at the edge of the die are acceptable.
Attached (chip in place) sapphire is nonconductive material and shall not be considered as foreign
material and will be considered as nonconductive material for all inspection criteria.
b) Subgroup 4, Scanning Electron Microscope (SEM) inspection. The manufacturer may allow the die
distributor, at his option, to select two (2) dice from a waffle pack (containing a maximum quantity
of 100 die), visually inspect for the worst case metallization of the 2 dice, and take SEM photographs
of the worst case.
c) Subgroup 5 radiation tests. Subgroup 5 radiation tests are not required unless otherwise specified
in the detail purchase order.
3.3.2 Processes - Processes used for manufacturing the TCXO are selected on the basis of their ability to
meet the quality requirements for space High Reliability manufacturing. Travelers or Process Cards are
used in the manufacturing and testing of all of the TCXO Series, and might be available for customer
review. Copies of these Travelers can be provided with the TCXOs at time of shipment, if so specified
on the purchase order.
3.3.3 Interchangeability - Each TCXO shall be interchangeable without using a special selection process.
3.3.4 Product Marking - Each unit shall be permanently marked with the manufacturer's name or symbol,
part number, lot date code number, and serial number. The unit shall be marked with the outline of an
equilateral triangle near pin 1 to show that it contains devices which are sensitive to electrostatic
discharge.
3.4 Parts Program
Devices delivered to this specification represent the standardized Parts, Materials and Processes (PMP)
Program developed, implemented and certified for advanced applications and extended environments.
3.4.1 Quartz Crystal Resonator - The crystal resonator used shall be constructed using a 4 point mount
premium synthetic swept Quartz and procured to Q-TECH SCD. (For the Engineering models, non-
swept quartz may be used).
3.5 Traceability Requirements
Material, element and process traceability requirements shall be as specified by MIL-PRF-38534 for
Class K hybrids.
3.6 Data
3.6.1. Design Documentation - When required by the purchase order, design, topography, process and flow
charts for all assembly/inspection and test operation for devices to be supplied under this specification
on the initial procurement shall be established and shall be available in-plant for review by the procuring
activity upon request. This design documentation shall be sufficient to depict the physical and electrical
construction of the devices supplied under the specification and shall be traceable to the specific parts,
drawings or part type numbers to which it applies, and to the production lot(s) and inspection lot codes
under which devices are manufactured and tested so that revisions can be identified.
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
Sheet 6 of 7
A
3.6.2. Technical Data Package - When required by the purchase order, the following design documentation
and information is deliverable 30 days prior to the start of production. The Technical Data Package shall
consist of the following:
a) Assembly drawing(s).
b) All electrical schematics and drawings
not considered proprietary
.
c) The assembly and screening travelers to be used on-line to manufacture the devices supplied to
this specification.
d) Parts and materials list.
3.7 Test Report
A test report is supplied with each shipment of oscillators and includes the following information, as a
minimum:
a) A Certificate of Conformance to all specifications and purchase order requirements. As a minimum,
the Certificate of Conformance shall include the following information:
Purchase order number.
Applicable part number.
Manufacturer’s lot number.
Lot date code.
b) Parts and materials traceability information.
c) Certificate of crystal sweeping.
d) Manufacturing lot traveler.
e) Screening attributes and variables data as applicable.
f) Quality conformance inspection attributes and variables data as applicable.
g) Radiographic inspection negatives.
3.8 Engineering Models
Engineering Models are fit, form, and function representative of Flight Models and of commercial
construction using commercial parts of same generic type as Flight Models. Completed oscillators are
not screened.
NOTES:
This oscillator is offered to meet the specifications above and is not guaranteed to meet any other
requirements.
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
Sheet 7 of 7
A
1
16 17
32
1.015 MAX.
30X .050 ± .005
NON-ACCUMULATIVE
32X .015 ± .003
2X .750
.325 ± .025
2 PLACES
32X .010 ± .002
.200 MAX.
32X .072 ± .007
ESD SYMBOL
FOR PIN NO. 1
D/C S/N
Q-TECH USA
PART NUMBER
FREQUENCY
1.015 MAX.
TYP. REF.
4X R. 025 MAX.
2X .125 REF.
▀ PART NUMBER GENERATION
Engineering Models are designated by adding "E" in front of the part number.
Series
Output type and supply
voltage
Temperature Range
(°C)
Stability
Over
Temperature
Frequency
Range
(MHz)
External Tuning
4: SINE WAVE +3dBm …..5V
N: 0…+50.........
±1 ppm
10…225
X: No tuning
5: SINE WAVE +7dBm ….12V
P: 0…+70.........
±1 ppm
R: External resistor
6: SINE WAVE 7dBm ….,15V
Q: 0…+70.........
±2 ppm
V: External voltage
R: 0…+70..........
±5 ppm
U: -20…+70.......
±1 ppm
V: -20…+70.......
±2 ppm
W: -20…+70......
±5 ppm
X: -40…+85.......
±4 ppm
Y: -40…+85.......
±5 ppm
Z: -40…+85.......
±10 ppm
QT82: 32 Pin Flat Pack
(available from 10 to
225 MHz)
(See note 1 below)
1. Variations from standard specification are available, please contact factory.
EXAMPLE: QT825U-100.000000-R would be a HF TCXO, 32 pin SMD flat pack, sine-wave 12 volts, stability ±1 ppm
over -20…+70°C, @ 100 MHz with external tuning via external resistor.
FIGURE 1 INTERFACE CONTROL DRAWING
32 pin Flat-Pack
PIN NO.
DESIGNATION
1 - 3
NC
4
External Frequency Adjustment
(when specified)
5
Ground/Case
6 - 10
NC
11
Supply Voltage
12
RF Output
13
Supply Voltage
14 - 32
NC
NOTES:
• Dimensions are in inches.
• Lead numbers are for reference only and
are not marked on the unit.
• A triangle symbol is marked on the corner
of the package to indicate Pin 1
• All pins with NC function may not be
connected as external tie or connections
(Pins may be connected internally).
