9 www.fairchildsemi.com
SCAN182245A
Absolute Maximum Ratings(Note 2) Recomm ended Operating
Conditions
Note 2: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3: Eith er v oltage lim it or c urrent limit is sufficie nt to protect inputs.
DC Electrical Characteristics
Note 4: Guaranteed not tested.
Storage Temperature −65°C to +150°C
Ambient Temperature under Bias −55°C to +125°C
Junction Temperature under Bias −55°C to +150°C
VCC Pin Potential to Ground Pin −0.5V to +7.0V
Input Voltage (Note 3) −0.5V to +7.0V
Input Curr en t (Note 3) −30 mA to +5.0 mA
Voltage Applied to Any Output
in the Disab led or
Power-Off State −0.5V to +5.5V
in the HIGH State −0.5V to VCC
Current Applied to Output
in LOW State (Max) Twi ce the Rated IOL (mA)
DC Latchup Source Current −500 mA
Over Voltage Latchup (I/O) 10V
ESD (HBM) Min. 2000V
Free Air Ambient Temperature −40°C to +85°C
Supply Voltage +4.5V to +5.5V
Minimum Input Edge Rate (∆V/∆t)
Data Input 50 mV/ns
Enable Input 20 mV/ns
Symbol Parameter VCC Min Typ Max Units Conditions
VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal
VIL Input LOW Voltage 0.8 V Recognized LOW Signal
VCD Input Clamp Diode Voltage Min −1.2 V IIN = −18 mA
VOH Output HIGH Voltage Min 2.5 V IOH = −3 mA
Min 2.0 V IOH = −32 mA
VOL Output LOW Voltage Min 0.8 V IOL = 15 mA
IIH Input HIGH Current All Others Max 5 µAV
IN = 2.7V (Note 4)
Max 5 µAV
IN = VCC
TMS, TDI Max 5 µAV
IN = VCC
IBVI Input HIGH Current Breakdown Test Max 7 µAV
IN = 7.0V
IBVIT Input HIGH Current Breakdown Test (I/O) Max 100 µAV
IN = 5.5V
IIL Input LOW Current All Others Max −5µAV
IN = 0.5V (Note 4)
Max −5µAV
IN = 0.0V
TMS, TDI Max −385 µAV
IN = 0.0V
VID Input Leakage Test 0.0 4.75 V IID = 1.9 µA
All Other Pins Grounded
IIH + IOZH Output Leakage Current Max 50 µAV
OUT = 2.7V
IIL + IOZL Output Leakage Current Max −50 µAV
OUT = 0.5V
IOZH Output Leakage Current Max 50 µAV
OUT = 2.7V
IOZL Output Leakage Current Max −50 µAV
OUT = 0.5V
IOS Output Short-Circuit Current Max −100 −275 mA VOUT = 0.0V
ICEX Output HIGH Leakage Current Max 50 µAV
OUT = VCC
IZZ Bus Drainage Test 0.0 100 µAV
OUT = 5.5V, All Others GND
ICCH Power Supply Current Max 250 µAV
OUT = VCC; TDI, TMS = VCC
Max 1.0 mA VOUT = VCC; TDI, TMS = GND
ICCL Power Supply Current Max mA VOUT = LOW; TDI, TMS = VCC
Max 65.8 mA VOUT = LOW; TDI, TMS = GND
ICCZ Power Supply Current Max 250 µA TDI, TMS = VCC
Max 1.0 mA TDI, TMS = GND
ICCT Additional ICC/Input All Other Inputs Max 2.9 mA VIN = VCC − 2.1V
TDI, TMS inputs Max 3 mA VIN = VCC − 2.1V
ICCD Dynamic ICC No Load Max 0.2 mA/ Outputs Open
MHz One Bit Toggling, 50% Duty Cycle