15/16
6) Notes on power ON/OFF
7) Noise countermeasures
Vcc noise (bypass capacitor)
POR circuit
LVCC circuit
. At power ON/OFF, set CS "L".
Good example
Bad example
GND
VCC
GND
VCC
VCC
CS
Fig.51 Timing at power ON/OFF
(Bad example) CS pin is pulled up to Vcc. (Good example) It is "L" at power ON/OFF.
Fig.52 Rise waveform diagram
tR
tOFF Vbot
VCC
0
Recommended conditions of tR, tOFF, Vbot
10ms or below
tRtOFF Vbot
100ms or below
0.3V or below
0.2V or below
10ms or higher
10ms or higher
1 Set CS = "L".
2 Turn on power so as to satisfy the recommended conditions of tR, tOFF, Vbot for POR circuit operation.
Cautions on use
When CS is "H", IC gets in input accept status (active). At power ON, set CS "L" to prevent malfunction from noise. (When CS is in "L"
status, all inputs are cancelled.) At power decline low power status may prevail. Therefore, at power OFF, set CS "L" to prevent malfunction
from noise.
In this case, CS becomes "H" (active status). EEPROM may
malfunction or have write error due to noises. This is true even
when CS input is High-Z.
Set 10ms or higher to recharge at power OFF.When power is turned
on without following the above condition, IC internal circuit may not
be reset.
This IC has a POR (Power On Reset) circuit as a mistake write countermeasure.After POR is activated, write disable status is active.
The POR circuit is active only when power is ON, and does not work when power is OFF. However, if CS is "H" at power ON/OFF, it may
enable write status due to noise.For secure actions, observe the following conditions:
LVCC (Vcc - Lockout) circuit prevents data rewrite action at low power, and prevents wrong write.
At LVCC voltage (Typ. = 1.9V) or below, it prevent data rewrite.
When noise or surge gets in the power source line, malfunction may occur. Therefore, it is recommended to attach a by pass capacitor
(0.1µF) between IC Vcc and GND to remove noise or surge. Attach it as close to the IC as possible.It is also recommended to attach a
bypass capacitor between board Vcc and GND.
SK noise
When the rise time (tR) of SK is long, and noise exists, malfunction may occur due to clock bit displacement. To avoid this, a Schmitt
trigger circuit is built into SK input. The hysteresis width of this circuit is set to about 0.2V (at Vcc = 5V). If noises exists at SK input, set
the noise amplitude to 0.2Vp-p or below.It is recommended to set the rise time (tR) of SK to 100ns or below. If the rise time is 100ns or
higher, take sufficient noise countermeasures. Set the clock rise and fall time as small as possible.
(1) Numbers and data in entries are representative design values and are not guaranteed values of the items.
(2) Although ROHM is confident that the example application circuit reflects the best possible recommendations, be sure to verify circuit
characteristics for your particular application. Modification of constants for other externally connected circuits may cause variations in
both static and transient characteristics for external components as well as this Rohm IC. Allow for sucircuit constants.
(3) Absolute maximum ratings Use of the IC in excess of absolute maximum ratings, such as the applied voltage or operating
temperature range (Topr), may result in IC damage. Assumptions should not be made regarding the state of the IC (short mode or open
mode) when such damage is suffered. A physical safety measure, such as a fuse, should be implemented when using the IC at times
where the absolute maximum ratings may be exceeded.
(4) GND potential Ensure a minimum GND pin potential in all operating conditions. Make sure that no pins are at a voltage below the
GND at any time, regardless of whether it is a transient signal or not.
(5) Heat design
In consideration of allowable loss in actual use condition, carry out heat design with sufficient margin.
(6) Short circuit between terminals and erroneous mounting Pay attention to the assembly direction of the ICs. Wrong mounting direction
or shorts between terminals, GND, or other components on the circuits, can damage the IC.
(7) Operation in strong electromagnetic field Using the ICs in a strong electromagnetic field can cause operation malfunction