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FOD8333 Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Features Description Input LED Drive Facilitates Receiving Digitally The FOD8333 is an advanced 2.5 A output current IGBT drive optocoupler capable of driving medium-power IGBTs with ratings up to 1,200 V and 150 A. It is suited for fast-switching driving of power IGBTs and MOSFETs in motor-control inverter applications and high-performance power systems. The FOD8333 offers protection features necessary for preventing fault conditions that lead to destructive thermal runaway of IGBTs. Encoded Signals from PWM Output Optically Isolated Fault-Sensing Feedback Active Miller Clamp to Shut Off IGBT During High dv/dt without Negative Supply Voltage High Noise Immunity Characterized by Common Mode Rejection - 35 kV/s Minimum, VCM = 1500 VPEAK 2.5 A Peak Output Current Driving Capability for Medium Power IGBT - P-Channel MOSFETs at Output Stage Enable Output Voltage Swing Close to Supply Rail (Rail-to-Rail Output) - Wide Supply Voltage Range: 15 V to 30 V Integrated IGBT Protection - Desaturation Detection - "Soft" IGBT Turn-Off - Automatic Fault Reset after Fixed Mute Time, Typically 33 s - Under-Voltage Lockout (UVLO) with Hysteresis Fast Switching Speed Over Full Operating Temperature Range - 250 ns Maximum Propagation Delay - 100 ns Maximum Pulse Width Distortion Extended Industrial Temperate Range: - -40C to 100C Safety and Regulatory Approvals - UL1577, 4,243 VRMS for 1 Minute - DIN-EN/IEC60747-5-5: 1,414 VPEAK Working Insulation Voltage Rating 8,000 VPEAK Transient Isolation Voltage Rating The device utilizes Fairchild's proprietary Optoplanar(R) coplanar packaging technology and optimized IC design to achieve reliable high isolation and high noise immunity, characterized by high common-mode rejection and power supply rejection specifications. The device is housed in a wide-body, 16-pin, small-outline, plastic package. The gate-driver channel consists of an aluminum gallium arsenide (AlGaAs) light-emitting diode (LED) optically coupled to an integrated high-speed driver circuit with a low-RDS(ON) MOSFET output stage. The fault-sense channel consists of an AlGaAs LED optically coupled to an integrated high-speed feedback circuit for fault sensing. Related Resources FOD8316--2.5 A Output Current, IGBT Drive Optocoupler with Desaturation, Isolated Fault Sensing FOD8318--2.5 A Output Current, IGBT Drive Optocoupler with Active Miller Clamp, Desaturation Detection, and Isolated Fault Sensing FOD8332--Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, and Active Miller Clamp AN-3009--Standard Gate-Driver Optocouplers 8 mm Creepage and Clearance Distances Applications AC and Brushless DC Motor Drive Industrial Inverter Uninterruptible Power Supply Induction Heating Isolated IGBT/Power MOSFET Gate Drive (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset May 2014 UVLO (VDD - VE) LED DESAT Detected? FAULT(1) VO X Active X HIGH LOW On Not Active Yes LOW LOW Off X X HIGH LOW On Not Active No HIGH HIGH Note: 1. FAULT pin is connected to a pull-up resistor. Pin Configuration GND 1 16 VE VCC 2 15 VLED2+ FAULT 3 14 DESAT GND 4 13 VDD VLED1- 5 12 VSS VLED1+ 6 11 VO VLED1+ 7 10 VCLAMP VLED1- 8 9 VSS Figure 1. Pin Configuration Pin Definitions Pin # Name Description 1 GND Ground for Fault-Sense Optocoupler 2 VCC Positive Supply Voltage (3 V to 15 V) for Fault Sense Optocoupler 3 FAULT Fault-Sense Output 4 GND Ground for Fault-Sense Optocoupler 5 VLED1- LED1 Cathode 6 VLED1+ LED1 Anode 7 VLED1+ LED1 Anode 8 VLED1- LED1 Cathode 9 VSS Negative Output Supply Voltage 10 VCLAMP Clamp Supply Voltage 11 VO Gate-Drive Output Voltage 12 VSS Negative Output Supply Voltage 13 VDD Positive Output Supply Voltage 14 DESAT Desaturation Voltage Input 15 VLED2+ LED2 Anode (Do not connect. Leave floating.) 16 VE Output Supply Voltage/IGBT Emitter (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 2 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Truth Table GND 1 VCC 2 FAULT 3 DESAT VE 15 VLED2+ 14 DESAT 13 VDD 12 VSS 11 VO UVLO GND 4 VLED1- 5 VLED1+ 6 VLED1+ 7 SHIELD FAULT IC 8 DRIVER VLED1- LED2 16 10 SHIELD MILLER CLAMP 9 VCLAMP VSS OUTPUT IC Figure 2. Functional Block Diagram (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 3 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Block Diagram As per DIN EN/IEC 60747-5-5, this optocoupler is suitable for "safe electrical insulation" only within the safety limit data. Compliance with the safety ratings must be ensured by means of protective circuits. Symbol Parameter Min. Typ. Max. Unit Installation Classifications per DIN VDE 0110/1.89 Table 1 Rated Mains Voltage < 150 VRMS I-IV Rated Mains Voltage < 300 VRMS I-IV Rated Mains Voltage < 450 VRMS I-IV Rated Mains Voltage < 600 VRMS I-IV Rated Mains Voltage < 1000 VRMS I-III Climatic Classification 40/100/21 Pollution Degree (DIN VDE 0110/1.89) 2 CTI Comparative Tracking Index (DIN IEC 112/VDE 0303 Part 1) 175 VPR Input-to-Output Test Voltage, Method b, VIORM x 1.875 = VPR, 100% Production Test with tm = 1 s, Partial Discharge < 5 pC 2651 Vpeak Input-to-Output Test Voltage, Method a, VIORM x 1.6 = VPR, Type and Sample Test with tm = 10 s, Partial Discharge < 5 pC 2262 Vpeak VIORM Maximum Working Insulation Voltage 1414 Vpeak VIOTM Highest Allowable Over Voltage 8000 Vpeak External Creepage 8.0 mm External Clearance 8.0 mm Insulation Thickness 0.5 mm 150 C 100 mW 600 mW 109 Safety Limit Values - Maximum Values in Failure; TCase Case Temperature Safety Limit Values - Maximum Values in Failure; PS,INPUT Input Power Safety Limit Values - Maximum Values in Failure; PS,OUTPUT RIO Output Power Insulation Resistance at TS, VIO = 500 V (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 4 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Safety and Insulation Ratings Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. TA = 25C unless otherwise specified. Symbol Parameter Value Units TSTG Storage Temperature -40 to +125 C TOPR Operating Temperature -40 to +100 C TJ TSOL Junction Temperature -40 to +125 C Lead Solder Temperature (not certified for wave immersion) 260 for 10 s C 45 mW 600 mW Refer to reflow temperature profile on page 31 PDI PDO Input Power Dissipation(2)(3) Output Power Dissipation(3)(4) Gate Drive Channel IF(AVG) Average Input Current 25 mA IF(PEAK) Peak Transient Forward Current (Pulse Width < 1 s) 1.0 A IOH(PEAK) Peak Output High Current(5) 3.0 A IOL(PEAK) Peak Output Low Current(5) 3.0 A Reverse Input Voltage 5.0 V -0.5 to 15 V -0.5 to 35 - (VE - VSS) V VR Supply Voltage(6) VE - VSS Negative Output VDD - VE Positive Output Supply Voltage VO(PEAK) - VSS Gate Drive Output Voltage VDD - VSS VDESAT Desaturation Voltage IDESAT Desaturation Current VCLAMP - VSS ICLAMP tR(IN), tF(IN) -0.5 to 35 V -0.5 to 35 V VE to VE + 25 V Output Supply Voltage 60 mA -0.5 to 35 V Peaking Clamping Sinking Current 1.7 A Input Signal Rise and Fall Time 500 ns Active Miller Clamping Voltage Fault Sense Channel VCC Positive Input Supply Voltage -0.5 to 20 V VFAULT FAULT Output Voltage -0.5 to 20 V IFAULT FAULT Output Current 16.0 mA Notes: 2. No derating required across temperature range. 3. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected to conditions outside these ratings. 4. Derate linearly above 25C, free air temperature at a rate of 6.2 mW/C. 5. Maximum pulse width = 10 s. 6. This negative output supply voltage is optional. It is only needed when negative gate drive is implemented. (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 5 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Absolute Maximum Ratings The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings. Symbol Parameter TA Ambient Operating Temperature Min. Max. Unit -40 +100 C IF(ON) Input Current (ON) 7 16 mA VF(OFF) Input Voltage (OFF) -3.6 0.8 V 3 15 V Supply Voltage VCC VDD - VSS Total Output Supply Voltage 15 30 V VDD - VE Positive Output Supply Voltage(7) 15 30 - (VE - VSS) V VE - VSS Negative Output Supply Voltage 0 15 V tPW Input Pulse Width 500 ns Note: 7. During power up or down, ensure that both the input and output supply voltages reach the proper recommended operating voltages to avoid any momentary instability at the output state. Isolation Characteristics Apply over all recommended conditions; typical value is measured at TA = 25C. Symbol Parameter VISO Input-Output Isolation Voltage Conditions TA = 25C, Relative Humidity < 50%, t = 1.0 minute, II-O 10 A, 50 Hz Min. Typ. 4,243 Max. Units VRMS (8)(9)(10) RISO Isolation Resistance VI-O = 500 V(8) 1011 CISO Isolation Capacitance VI-O = 0 V, Frequency = 1.0 MHz(8) 1 pF Notes: 8. Device is considered a two-terminal device: pins 1 to 8 are shorted together and pins 9 to 16 are shorted together. 9. 4,243 VRMS for 1-minute duration is equivalent to 5,091 VRMS for 1-second duration. 10. The input-output isolation voltage is a dielectric voltage rating per UL1577. It should not be regarded as an input-output continuous voltage rating. For the continuous working voltage rating, refer to equipment-level safety specification or DIN EN/IEC 60747-5-5 Safety and Insulation Ratings Table on page 4. (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 6 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Recommended Operating Conditions Apply over all recommended conditions; typical value is measured at VCC = 5 V, VDD - VSS = 30 V, VE - VSS = 0 V, and TA = 25C; unless otherwise specified. Symbol Parameter Conditions Min. Typ. Max. Units Figure 1.10 1.45 1.80 V 5 Gate Drive Channel VF (VF/TA) Input Forward Voltage IF = 10 mA Temperature Coefficient of Forward Voltage -1.5 BVR Input Reverse Breakdown Voltage IR = 10 A CIN Input Capacitance f = 1 MHz, VF = 0 V 60 IFLH Threshold Input Current, Low to High IO = 0 mA, VO > 5 V 2.5 VFHL Threshold Input Voltage, High to Low IO = 0 mA, VO < 5 V 0.8 High Level Output Current VO = VDD - 3 V, IF = 10 mA -1.0 VO = VDD - 6 V, IF = 10 mA(11) -2.5 IOH IOL Low Level Output Current mV/C 5 VO = VSS + 3 V, IF = 0 mA 1 VO = VSS + 6 V, IF = 0 mA(12) 2.5 70 V pF 7.0 -2.5 mA 30 V 31 A 6, 10, 32 A 3 125 A 170 A 7, 11, 33 mA 34 V 8, 10, 35 IOLF Low Level Output Current During Fault Condition VO - VSS = 14 V VOH High Level Output Voltage IF = 10 mA, IO = -100 mA(13)(14)(15) VOL Low Level Output Voltage IF = 0 mA, IO = 100 mA 0.1 0.5 V 9, 11, 36 IDDH High Level Supply Current VO = Open, IO = 0 mA 2.5 5.0 mA 12, 13, 37 IDDL Low Level Supply Current VO = Open, IO = 0 mA 2.5 5.0 mA 12, 13, 38 VDD - 1.0 VDD - 0.2 IEL VE Low Level Supply Current -0.8 -0.5 mA 38 IEH VE High Level Supply Current -0.50 -0.25 mA 37 -0.33 -0.25 mA 14, 39 10 40 mA 39 40 ICHG Blanking Capacitor Charge Current VDESAT = 2 V(15)(16) IDSCHG Blanking Capacitor Discharge Current VDESAT = 7 V VUVLO+ Under-Voltage Lockout Threshold(14) IF = 10 mA, VO > 5 V 10.8 11.7 12.7 V IF = 10 mA, VO < 5 V 9.8 10.7 11.7 V VUVLOUVLOHYS VDESAT Under-Voltage Lockout Threshold Hysteresis DESAT Threshold(14) 1.0 VDD - VE > VULVO- 6.0 VCLAMP_THRES Clamping Threshold Voltage ICLAMPL Clamp Low Level Sinking VO = VSS + 2.5 V Current (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 -0.13 0.35 6.5 V 7.2 V 15, 39 2.0 V 41 1.10 A 16, 42 www.fairchildsemi.com 7 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Electrical Characteristics Apply over all recommended conditions; typical value is measured at VCC = 5 V, VDD - VSS = 30 V, VE - VSS = 0 V, and TA = 25C; unless otherwise specified. Symbol Parameter Conditions Min. Typ. Max. Units Figure 0.0004 2 A 43 150 200 A 44 0.02 0.50 A 45 mA 17, 46 Fault Feedback Channel ICCH FAULT High Level Supply IF2 = 0 mA, Current VFAULT = Open, VCC = 15 V ICCL FAULT Low Level Supply Current IF2 = 16 mA, VFAULT = Open, VCC = 15V IFAULTH FAULT Logic High Output VFAULT = VCC = 5.5 V Current IFAULTL FAULT Logic Low Output Current 1.1 VFAULT = 0.4 V, VCC = 5.5 V Notes: 11. Maximum pulse width = 10 s, maximum duty cycle = 0.2%. 12. Minimum pulse width = 4.99 ms, minimum duty cycle = 99.8%. 13. VOH is measured with the DC load current in this testing (maximum pulse width = 1 ms, maximum duty cycle = 20%). When driving capacitive loads, VOH approaches VDD as IOH approaches zero units. 14. Positive output supply voltage (VDD - VE) should be at least 15 V to ensure adequate margin in excess of the maximum under-voltage lockout threshold, VUVLO+, of 12.7 V. 15. When VDD - VE > VUVLO and the output state VO is allowed to go HIGH, the DESAT-detection feature is active and provides the primary source of IGBT protection. UVLO is needed to ensure DESAT detection is functional. 16. The blanking time, tBLANK, is adjustable by an external capacitor (CBLANK), where tBLANK = CBLANK x (VDESAT / ICHG). (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 8 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Electrical Characteristics (Continued) Apply over all recommended conditions; typical value is measured at VCC = 5 V, VDD - VSS = 30 V, VE - VSS = 0 V, and TA = 25C; unless otherwise specified. Symbol Parameter tPHL Propagation Delay to Logic Low Output(18) tPLH Propagation Delay to Logic High Output(19) PWD Pulse Width Distortion, | tPHL - tPLH|(20) PDD Skew Conditions Rg = 10 , Cg =10 nF, f = 10 kHz, Duty Cycle = 50%, IF = 10 mA, VDD - VSS = 30 V(17) Min. Typ. Max. Units Figure 100 135 250 ns 100 150 250 ns 18, 19, 20, 21, 47 15 100 ns 47 150 ns -150 Propagation Delay Difference Between Any Two Parts or Channels, ( tPHL - tPLH)(21) tR Output Rise Time (10% to 90%) 50 ns tF Output Fall Time (90% to 10%) 50 ns 0.25 s tDESAT(LOW) DESAT Sense to DESAT Low Propagation Delay(24) tDESAT(90%) DESAT Sense to 90% VO Delay(22) tDESAT(10%) DESAT Sense to 10% VO Delay(22) Rg = 10 , Cg = 10 nF, VDD - VSS = 30 V (CDESAT = 100pF, RF = 4.7 k, VCC = 5.5 V) tDESAT(FAULT) DESAT Sense to Low Level FAULT Signal Delay(23) tDESAT(MUTE) DESAT Input Mute 20 (25) VDD = 20 V in 1.0 ms Ramp 47 0.45 0.70 s 22, 48 2.8 4.0 s 23, 24, 25, 48 0.5 1.5 s 26, 48 33 45 s 48 4.0 s 49 4.0 s 2 s 28, 29, 49 tUVLO ON UVLO Turn-On Delay tUVLO OFF UVLO Turn-Off Delay(26) tGP Time-to-Good Power(27) VDD = 0 to 30 V in 10 s Ramp | CMH | Common Mode Transient Immunity at Output High TA = 25C, VCC = 5 V, VDD = 25 V, VSS = Ground, CF = 15 pF, RF = 4.7 k, VCM = 1500 VPEAK(28) 35 50 kV/s 51, 52 | CML | Common Mode Transient Immunity at Output Low TA = 25C, VCC = 5 V, VDD = 25 V, VSS = Ground, CF = 15 pF, RF = 4.7 k, VCM = 1500 VPEAK(29) 35 50 kV/s 50, 53 Notes: 17. This load condition approximates the gate load of a 1200 V / 150 A IGBT. 18. Propagation delay tPHL is measured from the 50% level on the falling edge of the input pulse to the 50% level of the falling edge of the VO signal. 19. Propagation delay tPLH is measured from the 50% level on the rising edge of the input pulse to the 50% level of the rising edge of the VO signal. 20. PWD is defined as | tPHL - tPLH | for any given device. 21. The difference between tPHL and tPLH between any two parts under same operating conditions with equal loads. 22. The length of time the DESAT threshold must be exceeded before VO begins to go LOW. This is supply voltage dependent. (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 9 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Switching Characteristics 24. The length of time the DESAT threshold must be exceeded before VO begins to go LOW and the FAULT output begins to go LOW. 25. The UVLO turn-on delay, tUVLO ON, is measured from the VUVLO+ threshold level of the rising edge of the output supply voltage (VDD) to the 5 V level of the rising edge of the VO signal. 26. The UVLO turn-off delay, tUVLO OFF, is measured from the VUVLO- threshold level of the falling edge of the output supply voltage (VDD) to the 5 V level of the falling edge of the VO signal. 27. The time to good power, tGP, is measured from the VUVLO+ threshold level of the rising edge of the output supply voltage (VDD) to the 5 V level of the rising edge of the VO signal. 28. Common-mode transient immunity at output HIGH state is the maximum tolerable negative dVCM / dt on the trailing edge of the common-mode pulse, VCM, to assure the output remains in HIGH state (i.e., VO > 15 V or VFAULT > 2 V). 29. Common-mode transient immunity at output LOW state is the maximum positive tolerable dVCM / dt on the leading edge of the common-mode pulse, VCM, to ensure the output remains in LOW state (i.e., VO < 1.0 V or VFAULT < 0.8 V). (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 10 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset 23. The time from DESAT threshold is exceeded until the FAULT output goes LOW. IF tR tF 90% 50% 10% VO tPLH tPHL Figure 3. tPLH, tPHL, tR, and tF Timing Diagram tDESAT(LOW) IF 6.5V 50% VDESAT tDESAT(10%) tBLANK 90% VO 10% tDESAT(90%) FAULT Automatic Reset after Mute Time 50% 50% tDESAT(FAULT) tDESAT(MUTE) Figure 4. Definitions for DESAT, VO and FAULT Timing Waveforms (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 11 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Timing Diagrams 7 IOH - HIGH LEVEL OUTPUT CURRENT (A) IF - INPUT FORWARD CURRENT (mA) 100.00 10.00 1.00 100C 0.10 0.01 0.8 1.0 25C -40C 1.2 1.4 1.6 6 5 4 VOH = VDD - 6 V 3 VOH = VDD - 3 V 2 1 -40 1.8 ILED1+ = 10 mA VDD - VSS = 30 V -20 0 VF - INPUT FORWARD VOLTAGE (V) Figure 5. Input Forward Current (IF) vs. Voltage (VF) VOH - VDD - HIGH LEVEL OUTPUT VOLTAGE (V) IOL - LOW LEVEL OUTPUT CURRENT (A) 6 VOL = VSS + 6 V 5 4 VOL = VSS + 3 V 3 2 ILED1+ = 0 A VDD - VSS = 30 V -20 0 20 40 60 80 100 80 100 -0.05 -0.10 -0.15 -0.20 -0.25 ILED1+ = 10 mA VDD - VSS = 30 V IOH = -100 mA -0.30 -40 -20 0 20 40 60 80 100 TA - TEMPERATURE (C) Figure 7. Low Level Output Current (IOL) vs. Temperature Figure 8. High Level Output Voltage (VOH - VDD) vs. Temperature 30.0 VOH - HIGH LEVEL OUTPUT VOLTAGE (V) 0.20 V OL - LOW LEVEL OUTPUT VOLTAGE (V) 60 0.00 TA - TEMPERATURE (C) 0.15 0.10 0.05 0 -40 40 Figure 6. High Level Output Current (IOH) vs. Temperature 7 1 -40 20 TA - TEMPERATURE (C) ILED1+ = 0 A VDD - VSS = 30 V IOL = 100 mA -20 29.5 TA = -40C 29.0 28.5 ILED1+ = 10 mA VDD - VSS = 30 V 28.0 0 20 40 60 80 0 100 0.2 0.4 0.6 0.8 1.0 IOH - HIGH LEVEL OUTPUT CURRENT (A) TA - TEMPERATURE (C) Figure 9. Low Level Output Voltage (VOL) vs. Temperature (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 25C 100C Figure 10. High Level Output Voltage (VOH) vs. High Level Output Current (IOH) www.fairchildsemi.com 12 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Typical Performance Characteristics p 3 25C 2 TA = 100C -40C 1 2.8 2.6 IDDL 2.4 0 0.5 1.0 1.5 2.0 IDDH 2.2 ILED1+ = 0 A (IDDL) / 10 mA (IDDH) VDD - VSS = 30 V VO = Open 0 2.0 -40 2.5 -20 0 40 60 80 100 Figure 12. Output Supply Current (IDD) vs. Temperature Figure 11. Low Level Output Voltage (VOL) vs. Low Level Output Current (IOL) 3.0 -0.15 ICHG - BLANKING CAPACITOR CHARGE CURRENT (mA) IDD - OUTPUT SUPPLY CURRENT (mA) 20 TA - TEMPERATURE (C) IOL - LOW LEVEL OUTPUT CURRENT (A) 2.5 IDDL IDDH 2.0 ILED1+ = 0 A (IDDL) / 10 mA (IDDH) VDD - VSS = 30 V VO = Open 1.5 15 20 25 -0.20 -0.25 ILED1+ = 10 mA VDD - VSS = 30 V VDESAT = 2V -0.30 -40 30 -20 0 VDD - OUTPUT SUPPLY VOLTAGE (V) 20 40 60 80 100 TA - TEMPERATURE (C) Figure 13. Output Supply Current (IDD) vs. Voltage (VDD) Figure 14. Blanking Capacitor Charge Current (ICHG) vs. Temperature 3.0 ICLAMPL - CLAMP LOW LEVEL SINKING CURRENT (A) 7.00 VDESAT - DESAT THRESHOLD (V) ( OH) 3.0 ILED1+ = 0 A VDD - VSS = 30 V IDD - OUTPUT SUPPLY CURRENT (mA) VOL - LOW LEVEL OUTPUT VOLTAGE (V) 4 g 6.75 6.50 6.25 ILED1+ = 10 mA VDD - VSS = 30 V 6.00 -40 -20 0 20 40 60 80 2.0 1.5 1.0 0.5 ILED1+ = 0 mA VDD - VSS = 30 V VCLAMP = VSS + 2.5V 0.0 -40 100 TA - TEMPERATURE (C) -20 0 20 40 60 80 100 TA - TEMPERATURE (C) Figure 15. DESAT Threshold (VDESAT) vs. Temperature (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 2.5 Figure 16. Clamp Low Level Sinking Current (ICLAMPL) vs. Temperature www.fairchildsemi.com 13 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Typical Performance Characteristics (Continued) 250 VCC = 5.5 V ILED2+ = 10 mA 100C 8 tP - PROPAGATION DELAY (ns) I FAULTL - FAULT LOGIC LOW OUTPUT CURRENT (mA) 10 25C 6 4 -40C 2 0 0 1 2 3 4 200 tPLH 150 tPHL 100 50 ILED1+ = 10 mA f = 10 kHz 50% Duty Cycle VDD - VSS = 30 V Rg = 10 , Cg = 10 nF 0 -40 5 0 60 80 100 tP - PROPAGATION DELAY (ns) 250 200 tPLH 150 tPHL 100 50 ILED1+ = 10 mA f = 10 kHz 50% Duty Cycle Rg = 10 , Cg = 10 nF 0 15 20 25 200 tPHL 100 ILED1+ = 10 mA f = 10 kHz 50% Duty Cycle VDD - VSS = 30 V Cg = 10 nF 50 0 30 tPLH 150 0 10 20 Figure 19. Propagation Delay (tP) vs. Supply Voltage (VDD) t DESAT(90%) - DESAT SENSE TO 90% V DELAY (s) O 200 tPLH tPHL 100 ILED1+ = 10 mA f = 10 kHz 50% Duty Cycle VDD - VSS = 30 V Rg = 10 50 0 10 20 30 40 50 C g - LOAD CAPACITANCE (nF) Figure 21. Propagation Delay (tP) vs. Load Capacitance (Cg) (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 40 50 Figure 20. Propagation Delay (tP) vs. Load Resistance (Rg) 250 150 30 R g - LOAD RESISTANCE () VDD - SUPPLY VOLTAGE (V) tP - PROPAGATION DELAY (ns) 40 Figure 18. Propagation Delay (tP) vs. Temperature 250 0 20 TA - TEMPERATURE (C) Figure 17. FAULT Logic Low Output Current (IFAULTL) vs. Voltage (VFAULTL) tP - PROPAGATION DELAY (ns) -20 V FAULTL - FAULT LOGIC LOW OUTPUT VOLTAGE (V) 1.0 0.8 0.6 VDD - VSS = 30 V 0.4 VDD - VSS = 15 V 0.2 VDD - VSS = 15 V / 30 V ILED1+ = 10 mA Rg = 10 , Cg = 10 nF 0.0 -40 -20 0 20 40 60 80 100 TA - TEMPERATURE (C) Figure 22. DESAT Sense to 90% VO Delay (tDESAT(90%)) vs. Temperature www.fairchildsemi.com 14 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Typical Performance Characteristics (Continued) t DESAT(10%) - DESAT SENSE TO 10% V DELAY (s) O t DESAT(10%) - DESAT SENSE TO 10% V DELAY (s) O 5 4 VDD - VSS = 30 V 3 2 VDD - VSS = 15 V 1 VDD - VSS = 15 V / 30 V ILED1+ = 10 mA Rg = 10 , Cg = 10 nF 0 -40 -20 0 20 40 60 80 100 TA - TEMPERATURE (C) 15 3 VDD - VSS = 30 V 2 VDD - VSS = 15 V 1 0 VDD - VSS = 15 V / 30 V ILED1+ = 10 mA Cg = 10 nF 10 10 VDD - VSS = 30 V 5 VDD - VSS = 15 V 0 10 20 30 20 40 50 VCC = 5.5 V VCC = 3.3 V 0.50 100C 0.45 100C 0.40 25C 0.35 -40C 25C 0.30 0.25 50 -40C 4 6 8 10 R F - FAULT LOAD RESISTANCE (k) Figure 26. DESAT Sense to Low Level Fault Signal Delay (tDESAT(FAULT)) vs. Fault Load Resistance (RF) Figure 25. DESAT Sense to 10% VO Delay (tDESAT(10%)) vs. Load Capacitance (Cg) 50 5 VDD - VSS = 15 V / 30 V ILED1+ = 10 mA Rg = 10 , Cg = 10 nF t GP - TIME TO GOOD POWER (s) t DESAT(MUTE) - DESAT INPUT MUTE (s) 40 VDD - VSS = 30 V C g - LOAD CAPACITANCE (nF) 40 30 20 10 0 -40 30 R g - LOAD RESISTANCE () 0.55 VDD - VSS = 15 V / 30 V ILED1+ = 10 mA Rg = 10 0 4 Figure 24. DESAT Sense to 10% VO Delay (tDESAT(10%)) vs. Load Resistance (Rg) t DESAT(FAULT) - DESAT SENSE TO LOW LEVEL FAULT SIGNAL DELAY (s) t DESAT(10%) - DESAT SENSE TO 10% VO DELAY (s) Figure 23. DESAT Sense to 10% VO Delay (tDESAT(10%)) vs. Temperature 5 -20 0 20 40 60 80 4 3 2 1 0 -40 100 TA - TEMPERATURE (C) -20 0 20 40 60 80 100 TA - TEMPERATURE (C) Figure 27. DESAT Input Mute (tDESAT(MUTE)) vs. Temperature (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 VDD - VSS = 30 V ILED1+ = 10 mA Figure 28. Time-to-Good Power (tGP) vs. Temperature www.fairchildsemi.com 15 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Typical Performance Characteristics (Continued) FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Typical Performance Characteristics (Continued) t GP - TIME TO GOOD POWER (s) 5 ILED1+ = 10 mA TA = 25C 4 3 2 1 0 15 20 25 30 VDD - OUTPUT SUPPLY VOLTAGE (V) Figure 29. Time-to-Good Power (tGP) vs. Output Supply Voltage (VDD) (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 16 FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 VLED1- VSS 12 0.1F 5 0.1F + - 10mA 0A 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VE 30V VO + - 0.1F Figure 30. Threshold Input Current Low-to-High (IFLH) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 0.1F 0.1F + - 2V 0V 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 + - VE 30V VO + - 0.1F Figure 31. Threshold Input Voltage High-to-Low (VFHL) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 0.1F VLED1- 5 Period = 5ms PW = 10s + - VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VIN 0.1F VSS 12 6 10mA 0.1F IOH 47F + - + - VO VE 30V 0.1F 47F + - RM Figure 32. High Level Output Current (IOH) Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 17 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 0.1F Period = 5ms PW = 4.99ms + VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VIN - + - IOL 6 10mA 0.1F VE 30V 0.1F + - 47F VO 0.1F 47F + - RM Figure 33. Low Level Output Current (IOL) Test Circuit FOD8333 VCC + - 0.1F 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 4.7k VFAULT VLED1+ VO 7 VLED1+ VCLAMP 10 8 VLED1- VSS 6 10mA VIN 11 100pF 0.1F VDESAT 0.1F + - IOLF VO 10 VE 30V + - 0.1F 10nF 9 RM Figure 34. Low Level Output Current During Fault Condition (IOLF) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 0.1F 0.1F + - 100mA 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VOH VE 30V + - 0.1F 10mA Figure 35. High Level Output Voltage (VOH) Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 18 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 0.1F 6 VLED1+ VO 11 0.1F + - 30V + - VOL VE 0.1F 100mA 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 Figure 36. Low Level Output Voltage (VOL) Test Circuit FOD8333 1 GND VE 2 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 VLED1- VSS 12 16 IEH 0.1F 5 0.1F IDDH + - VE 30V 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 + - 0.1F 10mA Figure 37. High Level Supply Current (IDDH), VE High Level Supply Current (IEH) Test Circuit FOD8333 1 GND VE 2 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 VLED1- VSS 12 16 IEL 0.1F 5 0.1F IDDL + - VE 30V 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 + - 0.1F Figure 38. Low Level Supply Current (IDDL), VE Low Level Supply Current (IEL) Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 19 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 4.7k + - 0.1F 8V + - VCC 1 0V 0.1F VDESAT ICHG IDSCHG 0.1F + - VE 30V 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 + - 0.1F 10mA Figure 39. DESAT Threshold (VDESAT), Blanking Capacitor Charge Current (ICHG), Blanking Capacitor Discharge Current (IDSCHG) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 0.1F 6 10mA 0.1F + - VO VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 + - 15V VE 0.1F 0V 0V VUVLO+ VUVLO- Figure 40. Under-Voltage Lockout Threshold (VUVLO+ / VUVLO-), Under-Voltage Lockout Threshold Hysteresis (UVLOHYS) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 VLED1+ VO 11 0.1F 6 0.1F + - + - 30V VE 0.1F 50 10mA 0A 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 5V VTCLAMP + - 0V Figure 41. Clamping Threshold Voltage (VCLAMP_THRES) Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 20 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 0.1F 0.1F + - VE 30V VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 6 + - ICLAMPL + - 0.1F 2.5V Figure 42. Clamp Low Level Sinking Current (ICLAMPL) Test Circuit FOD8333 ICCH 15V 0.1F + - 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VFAULT Figure 43. FAULT High Level Supply Current (ICCH) Test Circuit FOD8333 ICCL 15V 0.1F + - 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VFAULT 0.1F 16mA Figure 44. FAULT Low Level Supply Current (ICCL) Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 21 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 + - 5.5V GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 0.1F IFAULTH 5.5V 1 + - Figure 45. FAULT High Level Output Current (IFAULTH) Test Circuit FOD8333 5.5V + - 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 0.1F VFAULTL + 1.1mA - 10mA 0.1F Figure 46. FAULT Low Level Output Voltage (VFAULTL) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 VLED1- VSS 12 0.1F 5 6 VLED1+ VO 11 0.1F + - VO 10 10mA f = 10kHz DC = 50% 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 VIN VE 30V + - 0.1F 10nF RM Figure 47. Propagation Delay (tPLH, tPHL), Rise Time(tR), Fall Time (tF), Pulse Width Distortion (PWD) Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 22 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 VCC + - 0.1F 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 4.7k VFAULT VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 6 10mA VIN 100pF 0.1F VDESAT 0.1F + - VE 30V VO + - 10 0.1F 10nF RM Figure 48. DESAT Sense Delay (tDESAT(90%)), tDESAT(10%)), tDESAT(LOW)), DESAT Sense to Low Level FAULT Signal Delay (tDESAT(FAULT)), DESAT Input Mute (tDESAT(MUTE)) Test Circuit FOD8333 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 VSS 9 0.1F 10mA 8 VLED1- 0.1F + - VE 20V VO 0.1F tUVLO tr = tf = 1ms TGP tr = tf = 10s Figure 49. Under-Voltage Lockout Delay (tUVLO), Time-to-Good-Power (tGP) Test Circuit FOD8333 5V 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 4.7k + - 15pF or 1nF 0.1F 360 Scope 0.1F 10 25V + - 10nF VCM Figure 50. Common-Mode Low (CML) LED1-Off Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 23 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Test Circuits (Continued) FOD8333 5V 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 4.7k + - 15pF or 1nF 0.1F 360 Scope 25V 0.1F + - 10 10nF VCM Figure 51. Common-Mode High (CMH) LED1-On Test Circuit FOD8333 5V 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 Scope 4.7k + - 15pF or 1nF 0.1F 360 0.1F 10 25V + - 10nF VCM Figure 52. Common-Mode High (CMH) LED2-Off Test Circuit FOD8333 5V Scope + - 1 GND 2 VE 16 VCC VLED2+ 15 3 FAULT DESAT 14 4 GND VDD 13 5 VLED1- VSS 12 6 VLED1+ VO 11 7 VLED1+ VCLAMP 10 8 VLED1- VSS 9 4.7k 15pF or 1nF 0.1F 360 0.1F 10 25V + - 10nF VCM Figure 53. Common-Mode High (CML) LED2-On Test Circuit (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 24 - + 1 GND1 2 3 FOD8333 VE 16 VCC VLED2+ 15 FAULT DESAT 14 0.1F 0.1F RF +HVDC 4 GND VDD 13 5 VLED- VSS 12 6 VLED+ VO 11 10 7 VLED+ VCLAMP 8 VLED- VSS Q1 + VCE 0.1F RG - - + Micro Controller 100 CF RLED CBLANK DDESAT Q2 + 9 3-Phase AC VCE - -HVDC Figure 54. Recommended Application Circuit Functional Description The functional behavioral of FOD8333 is illustrated by the detailed internal schematic shown in Figure 55. Figure 55 and the timing diagrams explain the interaction and sequence of internal and external signals. 250A + - 14 VLED1+ 6, 7 VLED1- 16 Delay 5, 8 DESAT VDESAT VE UVLO Comparator - + 13 VDD VUVLO 11 VO 50x VCC FAULT 2 1x 9 3 1, 4 GND Pulse Generator VLED2+ + - 10 VSS VCLAMP 2V 25x Figure 55. Detailed Internal Behavioral Schematic (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 25 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Application Information Fault Condition Automatic Reset IF Blanking Time 6.5V VDESAT VO FAULT Figure 56. Operating Relationsip Among Desaturation Voltage (DESAT), Fault Output (FAULT), and Reset Conditions 1. LED Input and Operation Explanation (LED1) is greater than IFLH and the forward voltage VF is greater than VF(MIN). The timing relationship between the LED input and gate driver output is illustrated in Figure 3. When a fault is detected, the gate driver ouptut IC immediately enters "soft" turn-off mode, where the output voltage changes slowly from HIGH to LOW state. This also disables the gate control input on the gate driver IC side for a minimum mute time, tDESAT(MUTE), of 20 s. FOD8333 is an advanced IGBT gate-drive optocoupler capable of driving most 1200 V / 150 A IGBTs and power MOSFETs in motor control and inverter applications. The following section describes driving IGBT, but is also applicable to driving MOSFET. Adjust the VDD supply based on the gate threshold voltages. Critical protection features and controls are incorporated to simplify the design and improve reliability. The device includes an IGBT desaturation detection protection and a FAULT status output. The FAULT output, which is open-collector configuration, is latched to LOW state to report a fault status to the microcontroller. It is only reset or pulled back to HIGH automatically after the fixed mute time, tDESAT(MUTE). This highly integrated device consists of two highperformances AlGaAs LEDs and two integrated circuits. LED1 directly controls the isolated gate driver IC output, while the returned optical signal path is transmitted by LED2, which reports the fault status through the opencollector fault-sense IC output. The active Miller clamp function avoids the need of negative gate driving in most applications and allows the use of a simple bootstrap supply for the high-side driver. 2. Gate Driver Output The control LED input and the fault-sense IC output can be connected to a standard 3.3 V / 5 V DSP or microcontroller. The gate driver output can be connected to the gate of the power devices on the high-voltage side. A typical recommended application is shown in Figure 54. A typical shunt LED drive can be used to improve noise immunity. The LED is connected in parallel with the bipolar transistor switch, creating a current shunt drive. Common-mode transients from the load coupling via the package capacitance can be coupled into a low-impedance path, either the conducting LED or the on resistance of the conducting bipolar transistor, increasing its noise immunity. A pair of PMOS and NMOS make up the output driver stage, which facilitates close to rail-to-rail output swing. This feature allows tight control of gate voltage during on-state and short-circuit conditions. The output driver can typically sink 2.5 A and source 2.5 A at room temperature. Due to the low RDS(ON) of the MOSFETs, the power dissipation is lower than bipolartype driver output stages. The absolute maximum rating of the output peak current, IO(PEAK), is 3 A. Careful selection of the gate resistor, RG, is required to avoid violation of this rating. For charging and discharging, the RG value is approximated by: RG = VCC - VEE - VOL / IOL(PEAK) During normal operation, when no fault is detected, LED1 controls the gate driver output. VO is set to HIGH when the current flowing from the anode to the cathode (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 (1) www.fairchildsemi.com 26 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Normal Operation tBLANK = CBLANK x VDESAT / ICHG (2) With a recommended 100 pF DESAT capacitor, the nominal blanking time is: 100 pF x 6.5 V / 250 A = 2.6 s 4. Soft Turn-Off The soft turn-off feature ensures the safe shutdown of the IGBT under fault condition. The gate-driver voltage VO turns off the IGBT in a controlled slow manner. This reduces the voltage spike on the collector of the IGBT. Without this, the IGBT would see a heavy spike on the collector, resulting in a permanent damage to the device when it's turned off immediately. The VO is pulled to LOW slowly in 4 s. When VDD supply goes below VUVLO, which is the designated ULVO threshold at the comparator, VO is pulled to LOW state regardless of photodetector output. When VO is HIGH and desaturation is detected, VO turns off slowly as it is pulled LOW by the 1XNMOS device. The input to the fault-sense circuitry is latched to HIGH state and turns on the LED2. The fault-sense signal remains in HIGH state until LED1 is switched from LOW to HIGH. When VO goes below 2 V, the 50XNMOS device turns on, clamping the IGBT gate firmly to VSS. 5. Under-Voltage Lockout (UVLO) Under-Voltage detection prevents the application of insufficient gate voltage to the IGBT. This could be dangerous, as it would drive the IGBT out of saturation and into the linear operation where losses are very high and the IGBT quickly overheats. This feature ensures proper operation of the IGBTs. The output voltage, VO, remains LOW irregardless of the inputs, as long as the supply voltage, VDD - VE, is less than VUVLO+ during power up. When the supply voltage falls below VUVLO- , VO goes LOW, as illustrated in Figure 57. 3. Desaturation Protection, FAULT Output and FAULT RESET Desaturation detection protects the IGBT in short circuit by monitoring the collector-emitter voltage of the IGBT when it's turned on. When the DESAT pin voltage goes above the threshold voltage, a short-circuit condition is detected and the driver output stage executes a "soft" IGBT turn-off and is eventually driven LOW. This sequence is illustrated in Figure 56. The FAULT opencollector output is triggered active LOW to report a desaturation error. The gate driver output is muted for minimum of 20 s. All input LED signals are ignored during the mute period to allow the driver to completely soft shutdown the IGBT. The fault mechanism is reset automatically after the tDESAT(MUTE) (see Figure 56). During OFF state of the IGBT, or if VO is LOW, the fault sense circuitry is disabled to prevent false fault signals. 6. Active Miller Clamp Function An active Miller clamp feature allows the sinking of the Miller current to ground during a high-dV/dt situation. Instead of driving the IGBT gate to a negative supply voltage to increase the safety margin, the device has a dedicated VCLAMP pin to control the Miller current. During turn-off, the gate voltage of the IGBT is monitored and the VCLAMP output is activated when the gate voltage goes below 2 V (relative to VSS). The Miller clamp NMOS transistor is then turned on and provides a low resistive path for the Miller current, which helps prevent a self-turn-on due to the parasitic Miller capacitor in power switches. The clamp voltage is VSS + 2.5 V, typical for a Miller current up to 1100 mA. The DESAT comparator should be disabled for a short period (blanking time) before the IGBT turns on to allow the collector voltage to fall below the DESAT threshold. In this way, the VCLAMP function does not affect the turnoff characteristic. It helps to clamp the gate to the low level throughout the turn-off time. During turn-on, where the input of the driver is activated, the VCLAMP function is disabled or opened. This blanking period protects against false triggering of the DESAT while the IGBT is turning on. The blanking time is controlled by the internal DESAT charge current, the DESAT voltage threshold, and the external DESAT capacitor (capacitor between DESAT and VE pin). The nominal blanking time can be calculated using external (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 voltage www.fairchildsemi.com 27 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset capacitance (CBLANK), FAULT threshold (VDESAT), and DESAT charge current (ICHG): As shown in Figure 55, the gate driver output is influenced by signals from the photodetector circuitry, the UVLO comparator, and the DESAT signals. Under no-fault condition, normal operation resumes while the supply voltage is above the UVLO threshold and the output of the photodetector drives the MOSFETs of the output stage. The logic circuitry of the output stage ensures that the push-pull devices are never turned ON simultaneously. When the output of the photodetector is HIGH, output VO is pulled to HIGH state by turning on the PMOS. When the output of the photodetector is LOW, VO is pulled to LOW state by turning on the 50XNMOS. IF VUVLO+ VUVLO- VDD - VE tGP VO Figure 57. Time to Good Power 7. Time to Good Power 9. DESAT Pin Protection During fast power up (e.g. bootstrap power supply), the LED is off and the output of the gate driver should be in the LOW or OFF state. Sometimes, race conditions exist that cause the output to follow VDD until all of the circuits in the output IC stabilize. This condition can result in output transitions or transients that are coupled to the driven IGBT. These glitches can cause the high- and low-side IGBTs to conduct shoot-through current that can damage the power semiconductor devices. During turn off, especially with inductive load, a large instantaneous forward-voltage transient can appear on the freewheeling diode of the IGBT. A large negative voltage spike on the DESAT pin can result and draw substantial current out of the gate driver IC if there is not current-limiting resistor. To limit this current, a 100 to 1 k resistor should be inserted in series with the DESAT diode. The added resistance does not change the DESAT threshold or the DESAT blanking time. Fairchild has introduced a initial turn-on delay, called "time to good power." This delay, typically 2 s, is only present during the initial power-up of the device. If the LED is ON during the initial turn-on activation, low-tohigh transition at the output of the gate driver only occurs 2 s after the VDD power is applied. The DESAT diode protects the gate driver IC from high voltages when the IGBT is turning off, while allowing a forward ICHG current of 250 A to be conducted to sense the IGBT's saturated collector to emitter voltage when the IGBT is turned on. A fast-recovery diode, trr below 75 ns, with sufficient reverse-voltage rating, should be used. Fairchild offers many of these ultra-fast diodes/ rectifiers, such as ES1J-600V, with trr at 35 ns. 8. Dual Supply Operation - Negative Bias at VSS The IGBT's off-state noise immunity can be enhanced by providing a negative gate-to-emitter bias when the IGBT is in OFF state. This static off-state bias can be supplied by connecting a separate negative voltage source between the VE (pin 16) and VSS (pin 9 and pin 12). The primary ground reference is the IGBT's emitter connection, VE (pin 16). The under-voltage lockout threshold and desaturation voltage detection are referenced to the IGBT's emitter (VE) ground. If two diodes or more are used, the required maximum reverse voltage can be reduced by half or accordingly. This modifies the trigger level for a fault condition. The sum of the DESAT diode forward-voltage and the IGBT collector-emitter VCE voltage form the voltage at the DESAT pin. The trigger level for a fault condition given by: VCE@FAULT = VDESAT - n x VF where n is the number of the DESAT diodes. The negative voltage supply at VSS appears at the gate drive output, VO, when in LOW state. When the input drives the output HIGH, the output voltage, VO, has the potential of the VDD and VSS. Proper power supply bypass capacitors are added to provide paths for the instantaneous gate charging and discharging currents. The Schottky diode is recommended connected between VE and VSS to protect against a reverse voltage greater than 0.5 V. The VCLAMP (pin 10) should be connected to VSS when not in use. (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 (3) 10. Pull-Up Resistor on FAULT Pin The FAULT pin is an open-collector output and can be connected as wire-OR operation with other types of protection (e.g., over-temperature, over-voltage, overcurrent) to alert the microcontroller. Being an opencollector output, it requires a pull-up resistor to provide a normal high output voltage level. This resistor value must be properly considered based on various IC interface requirements. The sinking current capability is given by IFAULTL. www.fairchildsemi.com 28 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset IFLH A possible implementation is by a discrete NPN/PNP totem-pole configuration. These booster transistors should be fast switching and have sufficient current gain to deliver the desired peak output current. If larger gate drive capability is needed for large IGBT modules or parallel operation, an output booster stage may be added to driver for optimum performance. FOD8333 VE 16 VLED2+ 15 DESAT 14 VDD 13 VSS 12 VO 11 VCLAMP 10 0.1F CBLANK DDESAT 100 - + VSS 0.1F RG 9 - + Figure 58. Output Booster Stage for Increased Output Drive Current (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 29 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset 11. Increasing the Output Drive Current Using an External Booster Stage Part Number Package Packing Method FOD8333 SO 16-Pin Tube (50 units per tube) FOD8333R2 SO 16-Pin Tape and Reel (750 units per reel) FOD8333V SO 16-Pin, DIN EN/IEC 60747-5-5 Option Tube (50 units per tube) FOD8333R2V SO 16-Pin, DIN EN/IEC 60747-5-5 Option Tape and Reel (750 units per reel) All packages are lead free per JEDEC: J-STD-020B standard. Marking Information 1 2 8333 V J D X YYKK 4 6 5 3 8 7 Definitions 1 Fairchild logo 2 Device number, e.g., `8333' for FOD8333 3 DIN EN/IEC60747-5-5 Option (only appears on component ordered with this option) (pending approval) 4 Plant code, e.g., `D' 5 Alphabetical year code, e.g., `E' for 2014 6 Two-digit work week ranging from `01' to `53' 7 Lot traceability code 8 Package assembly code, e.g., `J' (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 www.fairchildsemi.com 30 FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Ordering Information FOD8333 -- Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset Reflow Profile Temperature (C) TP 260 240 TL 220 200 180 160 140 120 100 80 60 40 20 0 Max. Ramp-Up Rate = 3 C/s Max. Ramp-Down Rate = 6 C/s tP Tsmax tL Preheat Area Tsmin ts 120 240 360 Time 25 C to Peak Time (seconds) Figure 59. Relow Profile Profile Freature Pb-Free Assembly Profile Temperature Minimum (Tsmin) 150C Temperature Maximum (Tsmax) 200C Time (tS) from (Tsmin to Tsmax) 60-120 seconds Ramp-up Rate (tL to tP) 3C/second maximum Liquidous Temperature (TL) 217C Time (tL) Maintained Above (TL) 60-150 seconds Peak Body Package Temperature 260C +0C / -5C Time (tP) within 5C of 260C 30 seconds Ramp-Down Rate (TP to TL) 6C/second maximum Time 25C to Peak Temperature (c)2014 Fairchild Semiconductor Corporation FOD8333 Rev. 1.0.3 8 minutes maximum www.fairchildsemi.com 31 0.20 C A-B 1.27 TYP 2X 10.30 16 A 0.64 TYP 9 D 9 7.31 9.47 11.63 16 3.75 10.30 7.50 (2.16) 0.10 C D 2X 8 1 PIN ONE INDICATOR 0.33 C 2X 8 TIPS 1.27 0.51 (16X) 0.31 B 0.51 TYP 0.25 1 8 LAND PATTERN RECOMMENDATION C A-B D A 0.10 C 3.0 MAX 2.350.10 0.10 C 16X SEATING PLANE 0.300.15 C NOTES: UNLESS OTHERWISE SPECIFIED (1.42) (R0.17) (R0.17) GAUGE PLANE 0.25 0.19 8 0 0.25 SEATING PLANE 1.27 0.40 C SCALE: 3:1 A) DRAWING REFERS TO JEDEC MS-013, VARIATION AA. B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS ARE EXCLUSIVE OF BURRS, MOLD FLASH AND TIE BAR PROTRUSIONS D) DRAWING CONFORMS TO ASME Y14.5M-1994 E) LAND PATTERN STANDARD: SOIC127P1030X275-16N F) DRAWING FILE NAME: MKT-M16FREV2 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor's product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. 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