Features
•Fast read access time – 70ns
•Low-power CMOS operation
– 100µA max standby
– 30mA max active at 5MHz
•JEDEC standard packages
– 32-lead PDIP
– 32-lead PLCC
•5V 10% supply
•High-reliability CMOS technology
– 2000V ESD protection
– 200mA latchup immunity
•Rapid programming algorithm – 100µs/byte (typical)
•CMOS- and TTL-compatible inputs and outputs
•Industrial temperature range
•Green (Pb/halide-free) packaging option
1. Description
The Atmel® AT27C040 is a low-power, high-performance, 4,194,304-bit, one-time pro-
grammable, read-only memory (OTP EPROM) organized as 512K by 8 bits. The
AT27C040 requires only one 5V power supply in normal read mode operation. Any byte
can be accessed in less than 70ns, eliminating the need for speed reducing WAIT states on
high-performance microprocessor systems.
The Atmel scaled CMOS technology provides low active power consumption and fast pro-
gramming. Power consumption is typically 8mA in active mode and less than 10µA in
standby mode.
The AT27C040 is available in a choice of industry standard, JEDEC-approved, one-time pro-
grammable (OTP) PDIP and PLCC packages. The device features two-line control (CE, OE)
to eliminate bus contention in high-speed systems.
The AT27C040 has additional features to ensure high quality and efficient production use.
The rapid programming algorithm reduces the time required to program the part and guar-
antees reliable programming. Programming time is typically only 100µs/byte. The
integrated product identification code electronically identifies the device and manufacturer.
This feature is used by industry standard programming equipment to select the proper pro-
gramming algorithms and voltages.
4Mb (512K x 8)
One-time
Programmable,
Read-only Memory
Atmel AT27C040
0189H–EPROM–4/11
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0189H–EPROM–4/11
Atmel AT27C040
2. Pin configurations
3. Switching considerations
Switching between active and standby conditions via the chip enable pin may produce transient voltage excursions. Unless
accommodated by the system design, these transients may exceed datasheet limits, resulting in device non-conformance.
At a minimum, a 0.1F, high-frequency, low inherent inductance, ceramic capacitor should be utilized for each device. This
capacitor should be connected between the VCC and ground terminals of the device, as close to the device as possible.
Additionally, to stabilize the supply voltage level on printed circuit boards with large EPROM arrays, a 4.7 µF bulk
electrolytic capacitor should be utilized, again connected between the VCC and Ground terminals. This capacitor should be
positioned as close as possible to the point where the power supply is connected to the array.
Figure 3-1. Block diagram
Pin name Function
A0 - A18 Addresses
O0 - O7 Outputs
CE Chip enable
OE Output enable 5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A7
A6
A5
A4
A3
A2
A1
A0
O0
A14
A13
A8
A9
A11
OE
A10
CE
07
4
3
2
1
32
31
30
14
15
16
17
18
19
20
01
02
GND
03
04
05
06
A12
A15
A16
VPP
VCC
PGM
A17
32-lead PLCC
Top view
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VPP
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
GND
V
A
A
A
A
A
A
A
O
A
C
0
7
0
6
0
5
0
4
0
3
32-lead PDIP
Top view
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0189H–EPROM–4/11
Atmel AT27C040
4. Absolute maximum ratings*
5. DC and AC characteristics
Table 5-1. Operating modes
Notes: 1. X can be VIL or VIH.
2. Refer to programming characteristics.
3. VH = 12.0 ± 0.5V.
4. Two identifier bytes may be selected. All Ai inputs are held low (VIL), except A9, which is set to VH, and A0, which is tog-
gled low (VIL) to select the manufacturer’s identification byte and high (VIH) to select the device code byte.
Table 5-2. DC and AC operating conditions for read operation
Temperature under bias . . . . . . . . . . . . . .-55°C to +125°C *NOTICE: Stresses beyond those listed under “Absolute
maximum ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other
conditions beyond those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended
periods may affect device reliability.
Storage temperature . . . . . . . . . . . . . . . . .-65°C to +150°C
Voltage on any pin with
respect to ground . . . . . . . . . . . . . . . . . . . . . . -2.0V to +7.0V
Voltage on A9 with
respect to ground . . . . . . . . . . . . . . . . . . . .-2.0V to +14.0V
VPP supply voltage with
respect to ground . . . . . . . . . . . . . . . . . . . . .-2.0V to +14.0V
Mode/Pin CE OE Ai VPP Outputs
Read VIL VIL Ai X(1) DOUT
Output disable X VIH X X High Z
Standby VIH X X X High Z
Rapid program(2) VIL VIH Ai VPP DIN
PGM verify X VIL Ai VPP DOUT
PGM inhibit VIH VIH XV
PP High Z
Product identification(4) VIL VIL
A9 = VH(3)
A0 = VIH or VIL
A1 - A18 = VIL
X Identification code
Atmel AT27C040-70 Atmel AT27C040-90
Industrial operating temperature (case) -40°C - 85°C -40°C - 85°C
VCC power supply 5V 10% 5V 10%
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0189H–EPROM–4/11
Atmel AT27C040
Table 5-3. DC and operating characteristics for read operation
Notes: 1. VCC must be applied simultaneously with or before VPP, and removed simultaneously with or after VPP.
2. VPP may be connected directly to VCC, except during programming. The supply current would then be the sum of ICC and
IPP.
Table 5-4. AC characteristics for read operation
Note: 1. See AC waveforms for read operation.
Symbol Parameter Condition Min Max Units
ILI Input load current VIN = 0V to VCC 1µA
ILO Output leakage current VOUT = 0V to VCC 5µA
IPP1(2) VPP(1) read/standby current VPP = VCC 10 µA
ISB VCC1(1) standby current
ISB1 (CMOS), CE = VCC 0.3V 100 µA
ISB2 (TTL), CE = 2.0 to VCC + 0.5V 1 mA
ICC VCC active current f = 5MHz, IOUT = 0mA, CE = VIL 30 mA
VIL Input low voltage -0.6 0.8 V
VIH Input high voltage 2.0 VCC + 0.5 V
VOL Output low voltage IOL = 2.1mA 0.4 V
VOH Output high voltage IOH = -400µA 2.4 V
Symbol Parameter Condition
Atmel AT27C040
Units
-70 -90
Min Max Min Max
tACC(1) Address to output delay CE = OE
= VIL
70 90 ns
tCE(1) CE to output delay OE = VIL 70 90 ns
tOE(1) OE to output delay CE = VIL 30 35 ns
tDF(1) OE or CE high to output float. Whichever occurred first 20 20 ns
tOH Output hold from address, CE or OE. Whichever occurred first 0 0 ns
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0189H–EPROM–4/11
Atmel AT27C040
Figure 5-1. AC waveforms for read operation(1)
Notes: 1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE.
3. OE may be delayed up to tACC - tOE after the address is valid without impact on tACC.
4. This parameter is only sampled, and is not 100% tested.
5. Output float is defined as the point when data is no longer driven.
Figure 5-2. Input test waveforms and measurement levels
Figure 5-3. Output test load
OUTPUT
PIN
1.3V
(1N914)
3.3K
CL
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0189H–EPROM–4/11
Atmel AT27C040
Table 5-5. Pin capacitance
Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
Figure 5-4. Programming waveforms(1)
Notes: 1. The input timing reference is 0.8V for VIL and 2.0V for VIH.
2. tOE and tDFP are characteristics of the device, but must be accommodated by the programmer.
3. When programming the Atmel AT27C040, a 0.1µF capacitor is required across VPP and ground to suppress spurious volt-
age transients.
f = 1MHz, T = 25°C
(1)
Symbol Typ Max Units Conditions
CIN 4 8 pF VIN = 0V
COUT 812pFV
OUT = 0V
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0189H–EPROM–4/11
Atmel AT27C040
Table 5-6. DC programming characteristics
Table 5-7. AC programming characteristics
Notes: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously with or after VPP.
2. This parameter is only sampled, and is not 100% tested. Output float is defined as the point where data is no longer driven.
See timing diagram.
3. Program pulse width tolerance is 100µs 5%.
Table 5-8. The Atmel AT27C040 integrated product identification code
TA = 25 ± 5°C, VCC = 6.5 ± 0.25V, VPP = 13.0 ± 0.25V
Symbol Parameter Test conditions
Limits
UnitsMin Max
ILI Input load current VIN = VIL, VIH 10 µA
VIL Input low level -0.6 0.8 V
VIH Input high level 2.0 VCC + 0.7 V
VOL Output low voltage IOL = 2.1mA 0.4 V
VOH Output high voltage IOH = -400µA 2.4 V
ICC2 VCC supply current (program and verify) 40 mA
IPP2 VPP supply current CE = VIL 20 mA
VID A9 product identification voltage 11.5 12.5 V
TA = 25 5°C, VCC = 6.5 0.25V, VPP = 13.0 0.25V
Symbol Parameter Test Conditions(1)
Limits
UnitsMin Max
tAS Address setup time
Input rise and fall times:
(10% to 90%) 20ns
Input pulse levels:
0.45V to 2.4V
Input timing reference level:
0.8V to 2.0V
Output timing reference level:
0.8V to 2.0V
2µs
tOES OE setup time 2 µs
tDS Data setup time 2 µs
tAH Address hold time 0 µs
tDH Data hold time 2 µs
tDFP OE high to output float delay(2) 0 130 ns
tVPS VPP setup time 2 µs
tVCS VCC setup time 2 µs
tPW CE program pulse width(3) 95 105 µs
tOE Data valid from OE(2) 150 ns
tPRT VPP pulse rise time during programming 50 ns
Codes
Pins
Hex dataA0 O7 O6 O5 O4 O3 O2 O1 O0
Manufacturer 0 00011110 1E
Device type 1 00001011 0B
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0189H–EPROM–4/11
Atmel AT27C040
6. Rapid programming algorithm
A 100µs CE pulse width is used to program. The address is set to the first location. VCC is raised to 6.5V and VPP is raised to
13.0V. Each address is first programmed with one 100µs CE pulse without verification. Then a verification/reprogramming
loop is executed for each address. In the event a byte fails to pass verification, up to 10 successive 100µs pulses are
applied with a verification after each pulse. If the byte fails to verify after 10 pulses have been applied, the part is
considered failed. After the byte verifies properly, the next address is selected until all have been checked. VPP is then
lowered to 5.0V and VCC to 5.0V. All bytes are read again and compared with the original data to determine if the device
passes or fails.
Figure 6-1. Rapid programming algorithm
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0189H–EPROM–4/11
Atmel AT27C040
7. Ordering Information
Green package option (Pb/halide-free)
tACC (ns)
ICC (mA)
Atmel ordering code Package Lead finish Operation rangeActive Standby
70 30 0.1 AT27C040-70JU
AT27C040-70PU
32J
32P6
Matte tin
Matte Tin
Industrial
(-40C to 85C)
90 30 0.1 AT27C040-90JU
AT27C040-90PU
32J
32P6
Matte tin
Matte tin
Industrial
(-40C to 85C)
Package type
32J 32-lead, plastic, J-leaded chip carrier (PLCC)
32P6 32-lead, 0.600" wide, plastic, dual inline package (PDIP)
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0189H–EPROM–4/11
Atmel AT27C040
8. Package information
32J – PLCC
DRAWING NO. REV.
TITLE
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC) B
32J
10/04/01
1.14(0.045) X 45° PIN NO. 1
IDENTIFIER
1.14(0.045) X 45°
0.51(0.020)MAX
0.318(0.0125)
0.191(0.0075)
A2
45° MAX (3X)
A
A1
B1 E2
B
e
E1 E
D1
D
D2
COMMON DIMENSIONS
(Unit of measure = mm)
SYMBOL MIN NOM MAX NOTE
Package Drawing Contact:
packagedrawings@atmel.com
Notes: 1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.10mm) maximum.
A 3.175 – 3.556
A1 1.524 – 2.413
A2 0.381 – –
D 12.319 – 12.573
D1 11.354 – 11.506 Note 2
D2 9.906 – 10.922
E 14.859 – 15.113
E1 13.894 – 14.046 Note 2
E2 12.471 – 13.487
B 0.660 – 0.813
B1 0.330 – 0.533
e 1.270 TYP
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0189H–EPROM–4/11
Atmel AT27C040
32P6 – PDIP
TITLE DRAWING NO. REV.
Package Drawing Contact:
packagedrawings@atmel.com
32P6, 32-lead (0.600"/15.24mm wide) Plastic Dual
Inline Package (PDIP) B
32P6
09/28/01
PIN
1
E1
A1
B
REF
E
B1
C
L
SEATING PLANE
A
0º ~ 15º
D
e
eB
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A – – 4.826
A1 0.381 – –
D 41.783 – 42.291 Note 1
E 15.240 – 15.875
E1 13.462 – 13.970 Note 1
B 0.356 – 0.559
B1 1.041 – 1.651
L 3.048 – 3.556
C 0.203 – 0.381
eB 15.494 – 17.526
e 2.540 TYP
Note: 1. Dimensions D and E1 do not include mold Flash or Protrusion.
Mold Flash or Protrusion shall not exceed 0.25mm (0.010").
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0189H–EPROM–4/11
Atmel AT27C040
9. Revision history
Doc. Rev. Date Comments
0189I 04/2011 Remove TSOP package
Add lead finish to ordering information
0189H 12/2007
Atmel Corporation
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USA
Tel: (+1) (408) 441-0311
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www.atmel.com
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JAPAN
Tel: (+81) (3) 3523-3551
Fax: (+81) (3) 3523-7581
© 2011 Atmel Corporation. All rights reserved. / Rev.: 0189H–EPROM–4/11
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