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In keeping with our ongoing policy of product evolvement and improvement, the above specification is subject to change without notice.
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1. The centre frequency, fC, is measured at the minimum IL point with the resonator in the 50Ω test system.
2. Unless noted otherwise, case temperature TC = +25°C±2°C.
3. Frequency aging is the change in fC with time and is specified at +65°C or less. Aging may exceed the
specification for prolonged temperatures above +65°C. Typically, aging is greatest the first year after
manufacture, decreasing in subsequent years.
4. Turnover temperature, T0, is the temperature of maximum (or turnover) frequency, f0. The nominal frequency at
any case temperature, TC, may be calculated from: f = f0 [1 - FTC (T0 - TC)2].
5. This equivalent RLC model approximates resonator performance near the resonant frequency and is provided
for reference only. The capacitance C0 is the measured static (non-motional) capacitance between Pin1 and
Pin2. The measurement includes case parasitic capacitance.
6. Derived mathematically from one or more of the following directly measured parameters: fC, IL, 3 dB bandwidth,
fC versus TC, and C0.
7. The specifications of this device are based on the test circuit shown above and subject to change or
obsolescence without notice.
8. Typically, equipment utilizing this device requires emissions testing and government approval, which is the
responsibility of the equipment manufacturer.
9. Our liability is only assumed for the Surface Acoustic Wave (SAW) component(s) per se, not for applications,
processes and circuits implemented within components or assemblies.
Issue : 1 C1
Date : SEPT 04